CN104635076B - 接触式试验装置和环境试验方法 - Google Patents
接触式试验装置和环境试验方法 Download PDFInfo
- Publication number
- CN104635076B CN104635076B CN201410640375.4A CN201410640375A CN104635076B CN 104635076 B CN104635076 B CN 104635076B CN 201410640375 A CN201410640375 A CN 201410640375A CN 104635076 B CN104635076 B CN 104635076B
- Authority
- CN
- China
- Prior art keywords
- heating
- heating plate
- trier
- heater
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/20—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater
- H05B3/22—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
- G01R31/2875—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to heating
Landscapes
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Health & Medical Sciences (AREA)
- Computer Hardware Design (AREA)
- Toxicology (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Resistance Heating (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Control Of Resistance Heating (AREA)
- Devices For Use In Laboratory Experiments (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013235253A JP5871885B2 (ja) | 2013-11-13 | 2013-11-13 | 接触式試験装置及び環境試験方法 |
JP2013-235253 | 2013-11-13 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN104635076A CN104635076A (zh) | 2015-05-20 |
CN104635076B true CN104635076B (zh) | 2018-06-22 |
Family
ID=53042837
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201410640375.4A Active CN104635076B (zh) | 2013-11-13 | 2014-11-13 | 接触式试验装置和环境试验方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US10852348B2 (ja) |
JP (1) | JP5871885B2 (ja) |
KR (1) | KR101793894B1 (ja) |
CN (1) | CN104635076B (ja) |
TW (1) | TWI624662B (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102041208B1 (ko) * | 2015-11-12 | 2019-11-06 | 쿄세라 코포레이션 | 히터 |
CN108037398B (zh) * | 2018-01-16 | 2023-12-05 | 苏州精濑光电有限公司 | 一种显示模组老化测试装置及老化测试方法 |
EP3783375A1 (de) * | 2019-08-19 | 2021-02-24 | Dyconex AG | Heiss-e-test für unbestückte leiterplatten |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200621069A (en) * | 2004-11-15 | 2006-06-16 | Sumitomo Electric Industries | Semiconductor fabrication device heater and heating device equipped with the same |
TW200928354A (en) * | 2007-12-21 | 2009-07-01 | Iteq Corp | Apparatus for measurement of heat conductivity effect and method of using the same |
TW201039675A (en) * | 2009-04-30 | 2010-11-01 | Hon Hai Prec Ind Co Ltd | Planar heater |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3160510B2 (ja) * | 1995-11-14 | 2001-04-25 | シャープ株式会社 | 面状発熱体 |
US5759281A (en) * | 1997-06-30 | 1998-06-02 | Emcore Corporation | CVD reactor for uniform heating with radiant heating filaments |
US6888106B2 (en) * | 2000-04-07 | 2005-05-03 | Ibiden Co., Ltd. | Ceramic heater |
JP2002198302A (ja) * | 2000-12-27 | 2002-07-12 | Ibiden Co Ltd | 半導体製造・検査装置用ホットプレート |
JP2004200199A (ja) * | 2002-12-16 | 2004-07-15 | Oki Electric Ind Co Ltd | 放熱シート |
JP2004221166A (ja) * | 2003-01-10 | 2004-08-05 | Toshiba Matsushita Display Technology Co Ltd | 加熱装置 |
JP4298421B2 (ja) * | 2003-07-23 | 2009-07-22 | エスペック株式会社 | サーマルプレートおよび試験装置 |
JP4344682B2 (ja) * | 2004-12-02 | 2009-10-14 | エスペック株式会社 | 流体加熱装置、並びに、試験装置 |
US7901509B2 (en) * | 2006-09-19 | 2011-03-08 | Momentive Performance Materials Inc. | Heating apparatus with enhanced thermal uniformity and method for making thereof |
KR101672910B1 (ko) * | 2008-07-22 | 2016-11-04 | 에스펙 가부시키가이샤 | 결로량이 제어 가능한 환경 시험 장치 및 그 제어 방법 |
JP2011146368A (ja) * | 2009-12-15 | 2011-07-28 | Panasonic Corp | 面状採暖具の製造方法 |
TWM433047U (en) * | 2011-12-23 | 2012-07-01 | C Sun Mfg Ltd | Thin type heater of heating device |
TWM464342U (zh) * | 2013-05-15 | 2013-11-01 | Kuo-Wei Fan | 電熱裝置 |
-
2013
- 2013-11-13 JP JP2013235253A patent/JP5871885B2/ja active Active
-
2014
- 2014-09-03 TW TW103130453A patent/TWI624662B/zh active
- 2014-10-23 KR KR1020140144125A patent/KR101793894B1/ko active IP Right Grant
- 2014-11-07 US US14/535,837 patent/US10852348B2/en active Active
- 2014-11-13 CN CN201410640375.4A patent/CN104635076B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200621069A (en) * | 2004-11-15 | 2006-06-16 | Sumitomo Electric Industries | Semiconductor fabrication device heater and heating device equipped with the same |
TW200928354A (en) * | 2007-12-21 | 2009-07-01 | Iteq Corp | Apparatus for measurement of heat conductivity effect and method of using the same |
TW201039675A (en) * | 2009-04-30 | 2010-11-01 | Hon Hai Prec Ind Co Ltd | Planar heater |
Also Published As
Publication number | Publication date |
---|---|
CN104635076A (zh) | 2015-05-20 |
KR20150055545A (ko) | 2015-05-21 |
JP5871885B2 (ja) | 2016-03-01 |
KR101793894B1 (ko) | 2017-11-06 |
US20150129575A1 (en) | 2015-05-14 |
TWI624662B (zh) | 2018-05-21 |
JP2015094714A (ja) | 2015-05-18 |
TW201518712A (zh) | 2015-05-16 |
US10852348B2 (en) | 2020-12-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI276409B (en) | Hot air heater | |
CN104635076B (zh) | 接触式试验装置和环境试验方法 | |
CN108886838A (zh) | 红外线加热单元 | |
CN102811649B (zh) | 烹调器具和使用该烹调器具的加热装置 | |
KR102027465B1 (ko) | 다중 온도 자가조절형 면상발열체를 이용한 조리 용기 | |
WO2012144740A2 (ko) | 온도 자가조절형 면상발열체를 적용한 전기레인지 및 그 제조방법 | |
CN108925146A (zh) | 辐射装置以及使用辐射装置的处理装置 | |
KR101059958B1 (ko) | 전기 핫 플레이트 | |
JP2015094714A5 (ja) | ||
CN207721216U (zh) | 电子烟及其加热装置 | |
JP6931894B2 (ja) | 遠赤外線輻射シート、床暖房システムおよびドーム型温熱機器 | |
JPS58225592A (ja) | 面状発熱体 | |
US11828490B2 (en) | Ceramic heater for heating water in an appliance | |
CN209013724U (zh) | 热风隧道炉烘干装置中的平面加热板装置 | |
CN108508264A (zh) | 功率传感器 | |
US9097463B2 (en) | Housing for heating and use method of the same, heating jig and use method of the same, and operation method of heating device | |
JPS6124770B2 (ja) | ||
KR20140102552A (ko) | 다중 온도 자가조절형 면상발열체를 이용한 전기레인지 | |
KR20190033762A (ko) | 세라믹 히터 모듈 및 이를 포함하는 세라믹 히터 | |
KR100918492B1 (ko) | 원적외선 방폭 히터 | |
JPS6217976A (ja) | 遠赤外線放射体 | |
Gethers et al. | Lessons learned on closed cavity TPV system efficiency measurements | |
KR20120119068A (ko) | 온도 자가조절형 면상발열체를 적용한 반도체 제조용 가열장치 및 그 제조방법 | |
JPH0645056A (ja) | セラミックヒータ応用調理器 | |
JP3066524U (ja) | 天井輻射熱暖房装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |