CN104541500B - 采用ccd成像仪的时间延迟与积分扫描 - Google Patents

采用ccd成像仪的时间延迟与积分扫描 Download PDF

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Publication number
CN104541500B
CN104541500B CN201380042771.0A CN201380042771A CN104541500B CN 104541500 B CN104541500 B CN 104541500B CN 201380042771 A CN201380042771 A CN 201380042771A CN 104541500 B CN104541500 B CN 104541500B
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China
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focal plane
tdi
fpa
plane arrays
line number
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Chinese (zh)
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CN104541500A (zh
Inventor
M·帕克
J·米尔斯
A·帕巴拉
F·阿姆斯特朗
J·埃里克森
G·黑文加
C·泰勒
W·拉特德克
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Thorlabs Inc
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Thorlabs Inc
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/711—Time delay and integration [TDI] registers; TDI shift registers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/713—Transfer or readout registers; Split readout registers or multiple readout registers

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
CN201380042771.0A 2012-10-12 2013-10-11 采用ccd成像仪的时间延迟与积分扫描 Expired - Fee Related CN104541500B (zh)

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Application Number Priority Date Filing Date Title
CN201811179871.9A CN109547714B (zh) 2012-10-12 2013-10-11 采用ccd成像仪的时间延迟与积分扫描

Applications Claiming Priority (3)

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US201261713474P 2012-10-12 2012-10-12
US61/713,474 2012-10-12
PCT/US2013/064612 WO2014059318A1 (en) 2012-10-12 2013-10-11 Time delay and integration scanning using a ccd imager

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CN201811179871.9A Division CN109547714B (zh) 2012-10-12 2013-10-11 采用ccd成像仪的时间延迟与积分扫描

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CN104541500A CN104541500A (zh) 2015-04-22
CN104541500B true CN104541500B (zh) 2018-11-06

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CN201380042771.0A Expired - Fee Related CN104541500B (zh) 2012-10-12 2013-10-11 采用ccd成像仪的时间延迟与积分扫描
CN201811179871.9A Expired - Fee Related CN109547714B (zh) 2012-10-12 2013-10-11 采用ccd成像仪的时间延迟与积分扫描

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US (1) US9402042B2 (enExample)
EP (1) EP2907301B1 (enExample)
JP (1) JP6033452B2 (enExample)
CN (2) CN104541500B (enExample)
CA (1) CA2887001C (enExample)
WO (1) WO2014059318A1 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8947521B1 (en) * 2011-08-08 2015-02-03 Kla-Tencor Corporation Method for reducing aliasing in TDI based imaging
US9357145B2 (en) 2014-07-11 2016-05-31 Imperx, Inc. Area scan interline transfer CCD imaging device and apparatus with TDI scanning mode
US9891177B2 (en) * 2014-10-03 2018-02-13 Kla-Tencor Corporation TDI sensor in a darkfield system
US9374540B1 (en) * 2015-01-13 2016-06-21 Exelis, Inc. Multi-register bank enhanced digital time delay integration using CMOS ROIC
FR3031859B1 (fr) * 2015-01-16 2018-04-20 Areva Np Reconstitution de scene par assemblage d'images
US20160295149A1 (en) * 2015-04-03 2016-10-06 Thorlabs, Inc. Simultaneous multi-channel tdi imaging on a multi-tap imager
CN106534632B (zh) * 2016-11-03 2019-03-29 桂林电子科技大学 同步扫描成像系统
CN107659776A (zh) * 2017-09-27 2018-02-02 中国科学院长春光学精密机械与物理研究所 高分辨率卫星动态机动延长曝光时间方法
CN108037499B (zh) * 2017-10-30 2020-06-16 中国人民解放军92232部队 一种光电毫米波三坐标搜索跟踪装置及方法
CN108495065B (zh) * 2018-02-01 2020-11-06 中国科学院国家空间科学中心 一种帧转移型面阵ccd的驱动时序控制方法
CN108322681B (zh) * 2018-02-23 2020-08-14 长春长光辰芯光电技术有限公司 抑制图像失配的tdi感光器件及图像传感器
CN108449556B (zh) * 2018-03-16 2019-12-24 成都中信华瑞科技有限公司 跨行时延积分方法、装置及相机
WO2022054794A1 (ja) 2020-09-10 2022-03-17 株式会社ビームセンス Ｘ線透視装置
CN112672141B (zh) * 2020-12-16 2022-01-07 长光卫星技术有限公司 一种tdi ccd非感光区域漏光率检测系统及方法
EP4413410A4 (en) * 2021-10-04 2025-09-03 Ultima Genomics Inc ENHANCED RESOLUTION IMAGING
CN116866726B (zh) * 2023-09-01 2023-11-07 合肥埃科光电科技股份有限公司 Tdi相机积分方法、彩色tdi相机积分方法、tdi相机及介质

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2150039A1 (de) * 2008-07-28 2010-02-03 Basler AG Verfahren zur Bilderfassung von relativ bewegten Objekten
US8094902B2 (en) * 2000-05-03 2012-01-10 Aperio Technologies, Inc. Data management in a linear-array-based microscope slide scanner
CN102348965A (zh) * 2009-03-10 2012-02-08 皇家飞利浦电子股份有限公司 用于使用时间延迟和积分传感器进行成像的时域复用

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4922337B1 (en) * 1988-04-26 1994-05-03 Picker Int Inc Time delay and integration of images using a frame transfer ccd sensor
US5668887A (en) * 1992-05-29 1997-09-16 Eastman Kodak Company Coating density analyzer and method using non-synchronous TDI camera
US5428392A (en) * 1992-11-20 1995-06-27 Picker International, Inc. Strobing time-delayed and integration video camera system
JPH07162767A (ja) * 1993-12-09 1995-06-23 Fujitsu Ltd イメージセンサ
FR2743462B1 (fr) * 1996-01-04 1998-01-30 Commissariat Energie Atomique Dispositif de lecture de barrettes de detecteurs avec effet tdi
JP3819511B2 (ja) 1997-02-13 2006-09-13 富士写真フイルム株式会社 Ｃｃｄ撮像デバイスにおけるモニタ方法およびディジタルスチルカメラ
JP3371764B2 (ja) * 1997-06-27 2003-01-27 株式会社日立製作所 撮像方法及び装置
US7268814B1 (en) * 1999-10-05 2007-09-11 California Institute Of Technology Time-delayed-integration imaging with active pixel sensors
JP3643745B2 (ja) * 2000-02-21 2005-04-27 株式会社モリタ製作所 Ｘ線撮影用検出器及びｘ線撮影装置
US7009163B2 (en) * 2001-06-22 2006-03-07 Orbotech Ltd. High-sensitivity optical scanning using memory integration
US6933975B2 (en) * 2002-04-26 2005-08-23 Fairchild Imaging TDI imager with automatic speed optimization
JP4786207B2 (ja) * 2005-03-17 2011-10-05 浜松ホトニクス株式会社 顕微鏡システム
US7675561B2 (en) * 2006-09-28 2010-03-09 Cypress Semiconductor Corporation Time delayed integration CMOS image sensor with zero desynchronization
US8463078B2 (en) * 2007-08-23 2013-06-11 Lockheed Martin Corporation Multi-bank TDI approach for high-sensitivity scanners
JP2010539469A (ja) * 2007-09-16 2010-12-16 メイア ベン−レヴィ 周期パターン照明及びｔｄｉによる結像測定システム
GB0802478D0 (en) 2008-02-11 2008-03-19 Cmosis Nv Tiem delay integration in imaging device
JP4537467B2 (ja) * 2008-03-18 2010-09-01 アドバンスド・マスク・インスペクション・テクノロジー株式会社 試料検査装置及び試料検査方法
JP4968227B2 (ja) * 2008-10-03 2012-07-04 三菱電機株式会社 イメージセンサ及びその駆動方法
RU2403593C1 (ru) * 2010-01-21 2010-11-10 Общество с ограниченной ответственностью предприятие "МЕДТЕХ" Матричный рентгеновский приемник для сканирующего рентгеновского аппарата
US8451354B2 (en) * 2010-05-17 2013-05-28 Commissariat A L'energie Atomique Et Aux Energies Alternatives TDI image sensor in CMOS technology with high video capture rate
US8629387B2 (en) * 2010-07-07 2014-01-14 Raytheon Company Multi-layer sensor chip assembly and method for imaging generating image data with a frame-sum mode and a time-delay integration mode
EP3066823A4 (en) * 2013-11-06 2017-06-07 Thorlabs, Inc. Method for correcting images acquired via asynchronously triggered acquisition

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8094902B2 (en) * 2000-05-03 2012-01-10 Aperio Technologies, Inc. Data management in a linear-array-based microscope slide scanner
EP2150039A1 (de) * 2008-07-28 2010-02-03 Basler AG Verfahren zur Bilderfassung von relativ bewegten Objekten
CN102348965A (zh) * 2009-03-10 2012-02-08 皇家飞利浦电子股份有限公司 用于使用时间延迟和积分传感器进行成像的时域复用

Also Published As

Publication number Publication date
CN109547714B (zh) 2021-03-02
JP2015531580A (ja) 2015-11-02
CA2887001C (en) 2021-11-02
WO2014059318A1 (en) 2014-04-17
CA2887001A1 (en) 2014-04-17
EP2907301A1 (en) 2015-08-19
CN104541500A (zh) 2015-04-22
CN109547714A (zh) 2019-03-29
US9402042B2 (en) 2016-07-26
US20140104468A1 (en) 2014-04-17
JP6033452B2 (ja) 2016-11-30
EP2907301A4 (en) 2016-08-31
EP2907301B1 (en) 2020-06-03

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