JP6033452B2 - Ｃｃｄイメージャを使用した時間遅延および積分走査 - Google Patents

Ｃｃｄイメージャを使用した時間遅延および積分走査 Download PDF

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JP6033452B2
JP6033452B2 JP2015536954A JP2015536954A JP6033452B2 JP 6033452 B2 JP6033452 B2 JP 6033452B2 JP 2015536954 A JP2015536954 A JP 2015536954A JP 2015536954 A JP2015536954 A JP 2015536954A JP 6033452 B2 JP6033452 B2 JP 6033452B2
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columns
focal plane
plane array
tdi
integration
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Japanese (ja)
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JP2015531580A (ja
JP2015531580A5 (enExample
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パーカー、マーティン
ミルズ、ジェイソン
プラバラ、アッシュ
アームストロング、フランク
エリクソン、ジェフリー
ハベンガ、グレゴリー
テイラー、チャールズ
ラトケ、ウィリアム
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ソルラブス、インコーポレイテッド
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/711—Time delay and integration [TDI] registers; TDI shift registers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/713—Transfer or readout registers; Split readout registers or multiple readout registers

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2015536954A 2012-10-12 2013-10-11 Ｃｃｄイメージャを使用した時間遅延および積分走査 Expired - Fee Related JP6033452B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261713474P 2012-10-12 2012-10-12
US61/713,474 2012-10-12
PCT/US2013/064612 WO2014059318A1 (en) 2012-10-12 2013-10-11 Time delay and integration scanning using a ccd imager

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JP2015531580A JP2015531580A (ja) 2015-11-02
JP2015531580A5 JP2015531580A5 (enExample) 2016-06-30
JP6033452B2 true JP6033452B2 (ja) 2016-11-30

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JP2015536954A Expired - Fee Related JP6033452B2 (ja) 2012-10-12 2013-10-11 Ｃｃｄイメージャを使用した時間遅延および積分走査

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US (1) US9402042B2 (enExample)
EP (1) EP2907301B1 (enExample)
JP (1) JP6033452B2 (enExample)
CN (2) CN104541500B (enExample)
CA (1) CA2887001C (enExample)
WO (1) WO2014059318A1 (enExample)

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US9891177B2 (en) * 2014-10-03 2018-02-13 Kla-Tencor Corporation TDI sensor in a darkfield system
US9374540B1 (en) * 2015-01-13 2016-06-21 Exelis, Inc. Multi-register bank enhanced digital time delay integration using CMOS ROIC
FR3031859B1 (fr) * 2015-01-16 2018-04-20 Areva Np Reconstitution de scene par assemblage d'images
US20160295149A1 (en) * 2015-04-03 2016-10-06 Thorlabs, Inc. Simultaneous multi-channel tdi imaging on a multi-tap imager
CN106534632B (zh) * 2016-11-03 2019-03-29 桂林电子科技大学 同步扫描成像系统
CN107659776A (zh) * 2017-09-27 2018-02-02 中国科学院长春光学精密机械与物理研究所 高分辨率卫星动态机动延长曝光时间方法
CN108037499B (zh) * 2017-10-30 2020-06-16 中国人民解放军92232部队 一种光电毫米波三坐标搜索跟踪装置及方法
CN108495065B (zh) * 2018-02-01 2020-11-06 中国科学院国家空间科学中心 一种帧转移型面阵ccd的驱动时序控制方法
CN108322681B (zh) * 2018-02-23 2020-08-14 长春长光辰芯光电技术有限公司 抑制图像失配的tdi感光器件及图像传感器
CN108449556B (zh) * 2018-03-16 2019-12-24 成都中信华瑞科技有限公司 跨行时延积分方法、装置及相机
WO2022054794A1 (ja) 2020-09-10 2022-03-17 株式会社ビームセンス Ｘ線透視装置
CN112672141B (zh) * 2020-12-16 2022-01-07 长光卫星技术有限公司 一种tdi ccd非感光区域漏光率检测系统及方法
EP4413410A4 (en) * 2021-10-04 2025-09-03 Ultima Genomics Inc ENHANCED RESOLUTION IMAGING
CN116866726B (zh) * 2023-09-01 2023-11-07 合肥埃科光电科技股份有限公司 Tdi相机积分方法、彩色tdi相机积分方法、tdi相机及介质

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US5668887A (en) * 1992-05-29 1997-09-16 Eastman Kodak Company Coating density analyzer and method using non-synchronous TDI camera
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JP3819511B2 (ja) 1997-02-13 2006-09-13 富士写真フイルム株式会社 Ｃｃｄ撮像デバイスにおけるモニタ方法およびディジタルスチルカメラ
JP3371764B2 (ja) * 1997-06-27 2003-01-27 株式会社日立製作所 撮像方法及び装置
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JP3643745B2 (ja) * 2000-02-21 2005-04-27 株式会社モリタ製作所 Ｘ線撮影用検出器及びｘ線撮影装置
US6711283B1 (en) 2000-05-03 2004-03-23 Aperio Technologies, Inc. Fully automatic rapid microscope slide scanner
US7009163B2 (en) * 2001-06-22 2006-03-07 Orbotech Ltd. High-sensitivity optical scanning using memory integration
US6933975B2 (en) * 2002-04-26 2005-08-23 Fairchild Imaging TDI imager with automatic speed optimization
JP4786207B2 (ja) * 2005-03-17 2011-10-05 浜松ホトニクス株式会社 顕微鏡システム
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JP2010539469A (ja) * 2007-09-16 2010-12-16 メイア ベン−レヴィ 周期パターン照明及びｔｄｉによる結像測定システム
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JP4537467B2 (ja) * 2008-03-18 2010-09-01 アドバンスド・マスク・インスペクション・テクノロジー株式会社 試料検査装置及び試料検査方法
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JP4968227B2 (ja) * 2008-10-03 2012-07-04 三菱電機株式会社 イメージセンサ及びその駆動方法
CN102348965B (zh) * 2009-03-10 2014-06-04 皇家飞利浦电子股份有限公司 用于使用时间延迟和积分传感器进行成像的时域复用
RU2403593C1 (ru) * 2010-01-21 2010-11-10 Общество с ограниченной ответственностью предприятие "МЕДТЕХ" Матричный рентгеновский приемник для сканирующего рентгеновского аппарата
US8451354B2 (en) * 2010-05-17 2013-05-28 Commissariat A L'energie Atomique Et Aux Energies Alternatives TDI image sensor in CMOS technology with high video capture rate
US8629387B2 (en) * 2010-07-07 2014-01-14 Raytheon Company Multi-layer sensor chip assembly and method for imaging generating image data with a frame-sum mode and a time-delay integration mode
EP3066823A4 (en) * 2013-11-06 2017-06-07 Thorlabs, Inc. Method for correcting images acquired via asynchronously triggered acquisition

Also Published As

Publication number Publication date
CN109547714B (zh) 2021-03-02
JP2015531580A (ja) 2015-11-02
CA2887001C (en) 2021-11-02
WO2014059318A1 (en) 2014-04-17
CN104541500B (zh) 2018-11-06
CA2887001A1 (en) 2014-04-17
EP2907301A1 (en) 2015-08-19
CN104541500A (zh) 2015-04-22
CN109547714A (zh) 2019-03-29
US9402042B2 (en) 2016-07-26
US20140104468A1 (en) 2014-04-17
EP2907301A4 (en) 2016-08-31
EP2907301B1 (en) 2020-06-03

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