CN104523285A - 一种电子皮肤及其制备方法 - Google Patents

一种电子皮肤及其制备方法 Download PDF

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Publication number
CN104523285A
CN104523285A CN201410770984.1A CN201410770984A CN104523285A CN 104523285 A CN104523285 A CN 104523285A CN 201410770984 A CN201410770984 A CN 201410770984A CN 104523285 A CN104523285 A CN 104523285A
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film transistor
thin film
tft
insulating barrier
electrode
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CN201410770984.1A
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CN104523285B (zh
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刘萍
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Guang Dong Dongbond Technology Co ltd
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Guangdong Dongbang Technology Co Ltd
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Priority to CN201410770984.1A priority Critical patent/CN104523285B/zh
Publication of CN104523285A publication Critical patent/CN104523285A/zh
Priority to PCT/CN2015/095549 priority patent/WO2016091070A1/zh
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Priority to US15/618,976 priority patent/US10624582B2/en
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    • A61B5/00Measuring for diagnostic purposes; Identification of persons
    • A61B5/68Arrangements of detecting, measuring or recording means, e.g. sensors, in relation to patient
    • A61B5/6801Arrangements of detecting, measuring or recording means, e.g. sensors, in relation to patient specially adapted to be attached to or worn on the body surface
    • A61B5/6813Specially adapted to be attached to a specific body part
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    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00Measuring for diagnostic purposes; Identification of persons
    • A61B5/01Measuring temperature of body parts ; Diagnostic temperature sensing, e.g. for malignant or inflamed tissue
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    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
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    • A61B5/00Measuring for diagnostic purposes; Identification of persons
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    • A61B5/0205Simultaneously evaluating both cardiovascular conditions and different types of body conditions, e.g. heart and respiratory condition
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    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00Measuring for diagnostic purposes; Identification of persons
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    • A61B5/024Detecting, measuring or recording pulse rate or heart rate
    • A61B5/02438Detecting, measuring or recording pulse rate or heart rate with portable devices, e.g. worn by the patient
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    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00Measuring for diagnostic purposes; Identification of persons
    • A61B5/22Ergometry; Measuring muscular strength or the force of a muscular blow
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00Measuring for diagnostic purposes; Identification of persons
    • A61B5/22Ergometry; Measuring muscular strength or the force of a muscular blow
    • A61B5/221Ergometry, e.g. by using bicycle type apparatus
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    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
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    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
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    • H01L27/1259Multistep manufacturing methods
    • H01L27/1262Multistep manufacturing methods with a particular formation, treatment or coating of the substrate
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    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/49Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
    • H01L29/4908Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET for thin film semiconductor, e.g. gate of TFT
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    • H01L29/49Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
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    • H01L29/49Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
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    • H01L29/76Unipolar devices, e.g. field effect transistors
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    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
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    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B2560/00Constructional details of operational features of apparatus; Accessories for medical measuring apparatus
    • A61B2560/04Constructional details of apparatus
    • A61B2560/0462Apparatus with built-in sensors
    • A61B2560/0468Built-in electrodes
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B2562/00Details of sensors; Constructional details of sensor housings or probes; Accessories for sensors
    • A61B2562/02Details of sensors specially adapted for in-vivo measurements
    • A61B2562/0247Pressure sensors
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B2562/00Details of sensors; Constructional details of sensor housings or probes; Accessories for sensors
    • A61B2562/02Details of sensors specially adapted for in-vivo measurements
    • A61B2562/0271Thermal or temperature sensors
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B2562/00Details of sensors; Constructional details of sensor housings or probes; Accessories for sensors
    • A61B2562/06Arrangements of multiple sensors of different types
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B2562/00Details of sensors; Constructional details of sensor housings or probes; Accessories for sensors
    • A61B2562/12Manufacturing methods specially adapted for producing sensors for in-vivo measurements
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00Measuring for diagnostic purposes; Identification of persons
    • A61B5/02Detecting, measuring or recording pulse, heart rate, blood pressure or blood flow; Combined pulse/heart-rate/blood pressure determination; Evaluating a cardiovascular condition not otherwise provided for, e.g. using combinations of techniques provided for in this group with electrocardiography or electroauscultation; Heart catheters for measuring blood pressure
    • A61B5/024Detecting, measuring or recording pulse rate or heart rate
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
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Abstract

本发明公开了一种电子皮肤及其制备方法,电子皮肤是在柔性基板上设有氧化物薄膜晶体管、压力传感器和温度传感器,压力传感器和温度传感器分别位于柔性基板的两侧,氧化物薄膜晶体管包括第一薄膜晶体管和第二薄膜晶体管,压力传感器用于驱动第一薄膜晶体管,温度传感器用于驱动第二薄膜晶体管。制备方法是在双面覆有导电材料的柔性基板上进行刻蚀、沉积形成氧化物薄膜晶体管、压力传感器和温度传感器。本发明提供的电子皮肤,可以同时测量压力和温度,结构简单,工作电压低、功耗小、灵敏度高、传感器信号间的干扰小。

Description

一种电子皮肤及其制备方法
技术领域
本发明涉及一种电子皮肤及其制备方法。
背景技术
电子皮肤是在柔软的塑料薄膜中,嵌入各种各样的柔性薄膜晶体管和各类传感器,因为和皮肤一样又软又薄,又是贴在皮肤上的电子设备,可以满足人体大面积的要求。电子皮肤不仅可以感受压力和温度,还可以感受光、湿度、紧张以及超声波等,能够通过实时监测脉搏、心跳、体温、肌肉群震动等人体健康生理指标,对人体健康数据变化及时做出反馈,甚至实现疾病的前期预防和诊断。同时还可以配置存储器,还可以具备无线供电、无线数据传输的功能,便于随身携带,进行长时间、连续的医学信号监测。因此该技术打开了通向微型移动健康监测仪的大门。有必要提供一种结构简单、高灵敏度耐用的电子皮肤。
发明内容
为解决上述技术问题,本发明提出一种电子皮肤及其制备方法,该电子皮肤可以同时测量压力和温度,结构简单,工作电压低、功耗小、灵敏度高、传感器信号间的干扰小。
为实现上述目的,本发明采用以下技术方案:
本发明公开了一种电子皮肤,在柔性基板上设有氧化物薄膜晶体管、压力传感器和温度传感器,其中所述压力传感器和所述温度传感器分别位于所述柔性基板的两侧,所述氧化物薄膜晶体管包括第一薄膜晶体管和第二薄膜晶体管,所述压力传感器用于驱动所述第一薄膜晶体管,所述温度传感器用于驱动所述第二薄膜晶体管。
优选地,所述柔性基板的材料是厚度为10~50μm的聚酰亚胺。
优选地,所述第一薄膜晶体管和所述第二薄膜晶体管采用同样的顶栅结构,所述压力传感器和所述温度传感器分别设有对应的存储电容。
优选地,所述第一薄膜晶体管和所述第二薄膜晶体管分别包括漏极、源极、栅极、有源层、第一栅极绝缘层和第二栅极绝缘层,其中:
漏极与源极位于同一层,有源层位于对应的漏极与源极所在的层之上且与对应的漏极、源极部分重叠,第一绝缘层覆盖在对应的有源层之上,第二绝缘层覆盖在对应的漏极、源极与第一绝缘层之上,栅极位于对应的第二绝缘层之上;
所述第一薄膜晶体管的源极与所述压力传感器相连,所述第二薄膜晶体管的源极通过所述柔性基板的过孔与所述温度传感器相连。
优选地,所述第一薄膜晶体管和所述第二薄膜晶体管的漏极、源极、栅极采用金属电极、透明导电电极或碳纳米管;所述第一薄膜晶体管和所述第二薄膜晶体管的有源层采用金属氧化物半导体;所述第一薄膜晶体管和所述第二薄膜晶体管的第一绝缘层采用SiOx,所述第一薄膜晶体管和所述第二薄膜晶体管的第二绝缘层采用SiNx。
本发明另外还公开了一种电子皮肤的制备方法,在双面覆有导电材料的柔性基板上通过刻蚀、沉积方法形成第一薄膜晶体管、第二薄膜晶体管、压力传感器和温度传感器,其中所述压力传感器和所述温度传感器分别形成于所述柔性基板的两侧。
优选地,所述制备方法具体包括以下步骤:
S1:在双面覆有导电材料的柔性基板的一侧刻蚀出图案A,所述图案A包括第一薄膜晶体管的源极、漏极和第二薄膜晶体管的源极、漏极;
S2:在所述柔性基板的另一侧刻蚀出图案B,所述图案B包括温度传感器的电极;
S3:在所述图案B连接的柔性基板的对应位置钻孔,并电镀钻孔位置,使得所述图案B与所述图案A电连接;
S4:在图案A上形成半导体层,再在所述半导体层上再沉积绝缘层,在所述半导体层上分别刻蚀出第一薄膜晶体管和第二薄膜晶体管的有源层,在所述绝缘层分别刻蚀出第一薄膜晶体管和第二薄膜晶体管的第一绝缘层,再在第一薄膜晶体管和第二薄膜晶体管的第一绝缘层沉积第二绝缘层;
S5:在第二绝缘层上形成导电层,刻蚀出第一薄膜晶体管和第二薄膜晶体管的栅极、以及压力传感器。
优选地,步骤S4具体包括:
S41:在图案A上采用磁控溅射的方法形成金属氧化物半导体层,再在金属氧化物半导体层上采用原子层沉积方法形成SiOx层;
S42:在SiOx层上采用干法刻蚀工艺分别刻蚀出第一薄膜晶体管和第二薄膜晶体管的第一绝缘层,在金属氧化物半导体层上采用湿法刻蚀工艺分别刻蚀出第一薄膜晶体管和第二薄膜晶体管的有源层;
S43:在第一薄膜晶体管和第二薄膜晶体管的第一绝缘层上采用等离子体增强化学气相沉积法形成第一薄膜晶体管和第二薄膜晶体管的第二绝缘层,并在第二绝缘层与源极的连接对应位置采用干法刻蚀形成过孔。
优选地,步骤S5具体包括:
S51:在第一薄膜晶体管和第二薄膜晶体管的第二绝缘层上采用磁控溅射的方法形成导电层,刻蚀出第一薄膜晶体管和第二薄膜晶体管的栅极、压力传感器和温度传感器的下电极;
S52:采用等离子体增强化学气相沉积法形成钝化层;
S53:采用干法刻蚀工艺刻蚀出压力传感器的敏感区域,采用印刷或喷墨打印方法形成压力传感器的敏感层,再在敏感层上形成压力传感器的上电极。
优选地,第一薄膜晶体管的源极和漏极之间的间距是2~20μm,第二薄膜晶体管的源极和漏极之间的间距是2~20μm。
本发明与现有技术相比的有益效果在于:本发明提供的电子皮肤将压力传感器和温度传感器设置于柔性基板的两侧,可以同时测量压力和温度,具有柔性的特点,结构简单,工作电压低、功耗小、灵敏度高、传感器信号间的干扰小。
附图说明
图1是本发明优选实施例的电子皮肤的剖面示意图;
图2是传感器单元的等效电路图;
图3是传感器单元的驱动脉冲图;
图4是本发明优选实施例的电子皮肤的制备示意图之一;
图5是本发明优选实施例的电子皮肤的制备示意图之二;
图6是本发明优选实施例的电子皮肤的制备过程中的俯视图;
图7是本发明优选实施例的电子皮肤的温度传感器的连接示意图。
具体实施方式
下面对照附图并结合优选的实施方式对本发明作进一步说明。
图1是本发明优选实施例的电子皮肤的剖面示意图,该电子皮肤包括柔性基板50,柔性基板50上有第一薄膜晶体管、第二薄膜晶体管、压力传感器和温度传感器,其中压力传感器和温度传感器分别位于柔性基板的两侧,第一薄膜晶体管用于驱动压力传感器,第二薄膜晶体管用于驱动温度传感器。第一薄膜晶体管包括漏极11、源极12、栅极13、有源层14、第一绝缘层15和第二绝缘层16,第二薄膜管包括漏极21、源极22、栅极23、有源层24、第一绝缘层25和第二绝缘层26。漏极11、源极12、漏极21、源极22位于同一层,有源层14位于漏极11、源极12所在的层之上且与漏极11、源极12部分重叠,有源层24位于漏极21、源极22所在的层之上且与漏极21、源极22部分重叠,第一绝缘层15覆盖在有源层14之上,第一绝缘层25覆盖在有源层24之上,第二绝缘层16覆盖在漏极11、源极12与第一绝缘层15之上,第二绝缘层26覆盖在漏极21、源极22与第一绝缘层25之上,栅极13位于第二绝缘层16之上,栅极23位于第二绝缘层26之上。压力传感器包括下电极31、上电极32、压力敏感层33和电极34,压力传感器的下电极31通过过孔70与第一薄膜晶体管的源极12相连,下电极31、第二绝缘层16和电极34构成压力传感器的存储电容,压力敏感层33和上电极32的有效区域由钝化层60限定。温度传感器包括下电极41、电极42、过孔43和电极44,温度传感器的电极42通过过孔80和过孔43与第二薄膜晶体管的源极22相连,电极44、第二绝缘层26和下电极41构成温度传感器的存储电容。优选地,柔性基板的材料为10~50μm的聚酰亚胺;漏极11、源极12、栅极13、漏极21、源极22、栅极23、下电极31、上电极32、电极34、下电极41、电极42、电极44以及互联的导电层可以选用金属电极、透明导电电极、导电纳米银、碳纳米管等;有源层14、24可以选用金属氧化物半导体,如ZTO(氧化锌锡)、IGZO(镓铟酸锌)等;第一绝缘层15、25可以选用SiOx;第二绝缘层16、26可以选用SiNx;压力敏感层33可以选用QTC材料、压电材料或压阻材料等,钝化层60选用SiNx。
该电子皮肤的传感器单元可以通过扫描寻址来读出压力、温度变化产生的电信号。传感器单元的等效电路如图2所示,相应的驱动脉冲如图3所示。其中行电极110与第一薄膜晶体管T1的栅极相连,行驱动器130的信号为第一薄膜晶体管T1提供扫描脉冲Vgate以选取行电极,第一薄膜晶体管T1的源极和第二薄膜晶体管T2的源极连接到列电极120。压力传感单元等效为可变电阻R1,有触摸时,电阻大小与压力大小有关;没有触摸时,电阻很大,信号存储在电容器C1中;温度传感单元等效为随温度变化的可变电阻R2,信号存储在电容器C2中。
结合图2和图3,当Vgate为低时,第一薄膜晶体管T1、第二薄膜晶体管T2截止,压力传感器和温度传感器都处于信号积分阶段,若有触摸行为或温度发生变化时,压力传感单元或温度传感单元的电阻发生变化,对应的存储电容通过相应的传感单元放电,节点A1或节点A2的电压发生变化;当Vgate为高时,第一薄膜晶体管T1、第二薄膜晶体管T2导通,压力传感器和温度传感器都处于信号读取阶段,列电极120通过第一薄膜晶体管T1、第二薄膜晶体管T2分别对电容器C1、电容器C2充电,充电信号由列放大器140读出。
制备本发明优选实施例的电子皮肤的制备方法,包括以下步骤:
如图4所示,首先选用双面覆有导电材料的柔性基板50,优选柔性基板的厚度为10~50μm,本实施例选用厚度为25μm的双面覆铜的聚酰亚胺材料。在柔性基板50的一侧的铜刻蚀出图案100,图案100代表薄膜晶体管的源极、漏极、电容的电极、行电极(数据线)、列电极(扫描线)以及互联的导线等,在柔性基板50的另一侧的铜刻蚀出图案200,图案200代表温度传感器的电极等。
如图5所示,再用胶300保护图案200,在图案200与柔性基板50连接的对应位置处钻孔,孔径优选为10~50μm,然后电镀形成过孔43,并去胶300。
如图6所示,是柔性基板50的俯视图,其中包括第一薄膜晶体管和第二薄膜晶体管。从图中看出,刻蚀柔性基板50上的铜形成的有:第一薄膜晶体管的源极12、漏极11,第二薄膜晶体管的源极22、漏极21,漏极11、21均连接到的行电极(数据线)120,存储电容C1的电极34和存储电容C2的电极44,以及电镀形成的过孔43。其中第一薄膜晶体管的源极12与漏极11之间的沟道宽度为2~20μm,优选为10μm,从而满足了电子皮肤的柔性特征。
结合图1、图5和图6,在刻蚀的图案100上采用磁控溅射的方法形成半导体层,如ZTO、IGZO等,优选的厚度为40~60nm,采用ALD(原子层沉积技术)方法沉积SiOx层,优选厚度为20nm,再采用干法刻蚀工艺形成第一薄膜晶体管的第一绝缘层15和第二薄膜晶体管的第一绝缘层25,采用湿法刻蚀工艺形成第一薄膜晶体管的有源层14和第二薄膜晶体管的有源层24。在第一薄膜晶体管的第一绝缘层15和第二薄膜晶体管的第一绝缘层25上采用PECVD(等离子体增强化学气相沉积法)方法沉积SiNx层,优选厚度为80~200nm,即同时形成了第一薄膜晶体管的第二绝缘层16和第二薄膜晶体管的第二绝缘层26。采用干法刻蚀工艺形成过孔70和过孔80,接着采用磁控溅射的方法形成导电层,在形成的导电层上刻蚀形成的有:第一薄膜晶体管的栅极13、第二薄膜晶体管的栅极23、与栅极13、23相连的列电极(扫描线)120、压力传感器的下电极31、温度传感器的下电极41,其中压力传感器的下电极31通过过孔70与第一薄膜晶体管的源极12相连,压力传感器的下电极31与电极34形成存储电容C1;温度传感器的下电极41通过过孔80与第二薄膜晶体管的源极22相连,也通过过孔43与柔性基板50的下面的温度传感器相连,温度传感器的下电极41与电极44形成存储电容C2。
最后采用PECVD方法形成钝化层60,通过干法刻蚀方法形成压力传感器的敏感区域,采用印刷、喷墨打印的方法形成压力敏感层33,再通过磁控溅射的方法形成压力传感器的上电极32。
温度传感器可以采用堆积方法,但是这种方式的柔韧性较差,因此本发明优选实施例采用如图7所示的温度传感器,其中电极421、422均为温度传感器的连接导线,即都是对应图1中所示的温度传感器的电极42,电极421与第二薄膜晶体管的源极相连。其中温度传感器可以有多种选择,本发明优选实施例中采用热敏电阻45,并且热敏电阻45在平面内与电极421、422相连。
本发明提供的电子皮肤是一种基于氧化物TFT的电子皮肤,该电子皮肤包括柔性基板、氧化物TFT、压力传感器和温度传感器,其中氧化物TFT包括第一薄膜晶体管和第二薄膜晶体管。第一薄膜晶体管和第二薄膜晶体管采用同样的顶栅结构,工艺上一次形成;第一薄膜晶体管的源极与压力传感器相连,第一薄膜晶体管成为压力传感器的信号读出机构,压力信号存储在对应的存储电容中;第二薄膜晶体管的源极通过柔性基板上的过孔与温度传感器相连,第二薄膜晶体管成为温度传感器的信号读出机构,温度变化信号存储在对应的存储电容中。另外,压力传感器和温度传感器位于同一个TFT阵列中,采用同样的扫描读出脉冲,通过行电极(数据线)读出压力变化信号和温度变化信号。
通过本发明的制备方法制备得到的电子皮肤实现了同时具有测量压力和温度的功能,可以用于人体脉搏、心脏跳动、眼压、肌肉运动等的检测,也可以用于体温或环境温度的检测。
以上内容是结合具体的优选实施方式对本发明所作的进一步详细说明,不能认定本发明的具体实施只局限于这些说明。对于本发明所属技术领域的技术人员来说,在不脱离本发明构思的前提下,还可以做出若干等同替代或明显变型,而且性能或用途相同,都应当视为属于本发明的保护范围。

Claims (10)

1.一种电子皮肤,其特征在于,在柔性基板上设有氧化物薄膜晶体管、压力传感器和温度传感器,其中所述压力传感器和所述温度传感器分别位于所述柔性基板的两侧,所述氧化物薄膜晶体管包括第一薄膜晶体管和第二薄膜晶体管,所述压力传感器用于驱动所述第一薄膜晶体管,所述温度传感器用于驱动所述第二薄膜晶体管。
2.根据权利要求1所述的电子皮肤,其特征在于,所述柔性基板的材料是厚度为10~50μm的聚酰亚胺。
3.根据权利要求1所述的电子皮肤,其特征在于,所述第一薄膜晶体管和所述第二薄膜晶体管采用同样的顶栅结构,所述压力传感器和所述温度传感器分别设有对应的存储电容。
4.根据权利要求1至3任一项所述的电子皮肤,其特征在于,所述第一薄膜晶体管和所述第二薄膜晶体管分别包括漏极、源极、栅极、有源层、第一栅极绝缘层和第二栅极绝缘层,其中:
漏极与源极位于同一层,有源层位于对应的漏极与源极所在的层之上且与对应的漏极、源极部分重叠,第一绝缘层覆盖在对应的有源层之上,第二绝缘层覆盖在对应的漏极、源极与第一绝缘层之上,栅极位于对应的第二绝缘层之上;
所述第一薄膜晶体管的源极与所述压力传感器相连,所述第二薄膜晶体管的源极通过所述柔性基板的过孔与所述温度传感器相连。
5.根据权利要求4所述的电子皮肤,其特征在于,所述第一薄膜晶体管和所述第二薄膜晶体管的漏极、源极、栅极采用金属电极、透明导电电极或碳纳米管;所述第一薄膜晶体管和所述第二薄膜晶体管的有源层采用金属氧化物半导体;所述第一薄膜晶体管和所述第二薄膜晶体管的第一绝缘层采用SiOx,所述第一薄膜晶体管和所述第二薄膜晶体管的第二绝缘层采用SiNx。
6.一种电子皮肤的制备方法,其特征在于,在双面覆有导电材料的柔性基板上通过刻蚀、沉积方法形成第一薄膜晶体管、第二薄膜晶体管、压力传感器和温度传感器,其中所述压力传感器和所述温度传感器分别形成于所述柔性基板的两侧。
7.如权利要求6所述的制备方法,其特征在于,具体包括以下步骤:
S1:在双面覆有导电材料的柔性基板的一侧刻蚀出图案A,所述图案A包括第一薄膜晶体管的源极、漏极和第二薄膜晶体管的源极、漏极;
S2:在所述柔性基板的另一侧刻蚀出图案B,所述图案B包括温度传感器的电极;
S3:在所述图案B连接的柔性基板的对应位置钻孔,并电镀钻孔位置,使得所述图案B与所述图案A电连接;
S4:在图案A上形成半导体层,再在所述半导体层上再沉积绝缘层,在所述半导体层上分别刻蚀出第一薄膜晶体管和第二薄膜晶体管的有源层,在所述绝缘层分别刻蚀出第一薄膜晶体管和第二薄膜晶体管的第一绝缘层,再在第一薄膜晶体管和第二薄膜晶体管的第一绝缘层沉积第二绝缘层;
S5:在第二绝缘层上形成导电层,刻蚀出第一薄膜晶体管和第二薄膜晶体管的栅极、以及压力传感器。
8.根据权利要求7所述的制备方法,其特征在于,步骤S4具体包括:
S41:在图案A上采用磁控溅射的方法形成金属氧化物半导体层,再在金属氧化物半导体层上采用原子层沉积方法形成SiOx层;
S42:在SiOx层上采用干法刻蚀工艺分别刻蚀出第一薄膜晶体管和第二薄膜晶体管的第一绝缘层,在金属氧化物半导体层上采用湿法刻蚀工艺分别刻蚀出第一薄膜晶体管和第二薄膜晶体管的有源层;
S43:在第一薄膜晶体管和第二薄膜晶体管的第一绝缘层上采用等离子体增强化学气相沉积法形成第一薄膜晶体管和第二薄膜晶体管的第二绝缘层,并在第二绝缘层与源极的连接对应位置采用干法刻蚀形成过孔。
9.根据权利要求7所述的制备方法,其特征在于,步骤S5具体包括:
S51:在第一薄膜晶体管和第二薄膜晶体管的第二绝缘层上采用磁控溅射的方法形成导电层,刻蚀出第一薄膜晶体管和第二薄膜晶体管的栅极、压力传感器和温度传感器的下电极;
S52:采用等离子体增强化学气相沉积法形成钝化层;
S53:采用干法刻蚀工艺刻蚀出压力传感器的敏感区域,采用印刷或喷墨打印方法形成压力传感器的敏感层,再在敏感层上形成压力传感器的上电极。
10.根据权利要求7至10任一项所述的制备方法,其特征在于,第一薄膜晶体管的源极和漏极之间的间距是2~20μm,第二薄膜晶体管的源极和漏极之间的间距是2~20μm。
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Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105105724A (zh) * 2015-09-14 2015-12-02 中国地质大学(武汉) 太阳能可穿戴计算式人体健康监测帽
CN105286831A (zh) * 2015-11-17 2016-02-03 中国地质大学(武汉) 可穿戴计算式智能保健手套
WO2016091070A1 (zh) * 2014-12-12 2016-06-16 广东东邦科技有限公司 一种电子皮肤及其制备方法
CN105841850A (zh) * 2016-05-12 2016-08-10 京东方科技集团股份有限公司 一种压电传感器及其制作方法
CN105852806A (zh) * 2016-03-24 2016-08-17 浙江大学 一种用于伤口实时监测的电子皮肤
CN106328659A (zh) * 2016-08-19 2017-01-11 京东方科技集团股份有限公司 阵列基板及其制备方法、显示面板
CN106562767A (zh) * 2016-11-04 2017-04-19 深圳大学 一种汗液检测系统及制备方法
CN107530008A (zh) * 2015-05-06 2018-01-02 赫尔比公司 传感器单元
CN108168734A (zh) * 2018-02-08 2018-06-15 南方科技大学 一种基于纤毛温度传感的柔性电子皮肤及其制备方法
WO2019010741A1 (zh) * 2017-07-14 2019-01-17 江苏申源新材料有限公司 一种柔韧高强机器人皮肤制备方法
CN109374024A (zh) * 2018-11-05 2019-02-22 四川大学 一种具有凹坑结构的压阻式电子皮肤及其制备方法
WO2019047063A1 (zh) * 2017-09-06 2019-03-14 中国科学院深圳先进技术研究院 集成检测传感器及触摸感应设备
CN109655170A (zh) * 2019-01-14 2019-04-19 清华大学 柔性薄膜传感器及检测装置
CN110200627A (zh) * 2019-06-05 2019-09-06 上海大学 一种有源高密度电极阵列及其制备方法
CN110243504A (zh) * 2019-06-29 2019-09-17 上海中航光电子有限公司 压力传感装置、压力传感装置的驱动方法及制作方法
CN110793676A (zh) * 2018-08-02 2020-02-14 北京纳米能源与系统研究所 温度湿度压力传感器及其制备方法、电子皮肤
CN111403431A (zh) * 2019-01-02 2020-07-10 京东方科技集团股份有限公司 柔性体及控制其发生形变的方法
CN111491556A (zh) * 2017-03-13 2020-08-04 微巨数据科技(深圳)有限公司 用于时间分辨地测量心脏功能的特征参量的方法和设备
CN113543698A (zh) * 2018-12-13 2021-10-22 武汉联影智融医疗科技有限公司 利用电子皮肤的用户监测的装置、系统和方法
CN114427883A (zh) * 2021-12-28 2022-05-03 荣成歌尔微电子有限公司 温湿度传感器及其制备方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10194856B2 (en) * 2015-12-22 2019-02-05 Sharp Laboratories Of America, Inc. Matrix multi-sensor array
KR102054190B1 (ko) * 2017-01-23 2019-12-10 동우 화인켐 주식회사 고성능 필름형 터치 센서 및 그 제조방법
CN107256870A (zh) * 2017-06-09 2017-10-17 京东方科技集团股份有限公司 一种阵列基板及制作方法、柔性显示面板、显示装置
CN107300392A (zh) * 2017-07-12 2017-10-27 广东顺德中山大学卡内基梅隆大学国际联合研究院 一种基于双栅薄膜晶体管的多功能传感器及其制备方法
CN107644880B (zh) * 2017-10-19 2020-04-14 京东方科技集团股份有限公司 氧化物薄膜晶体管显示基板及其制作方法、显示装置
CN111811703B (zh) * 2020-07-21 2022-04-08 京东方科技集团股份有限公司 压力传感器和电子装置
CN113193115B (zh) * 2021-05-19 2023-05-12 电子科技大学 一种悬空碳纳米管场效应晶体管及其制备方法
CN115356007A (zh) * 2022-08-17 2022-11-18 厦门大学 一种温度压力双模传感单元、制备方法及其制备的传感器

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI309198B (en) * 2005-08-25 2009-05-01 Molecular Imprints Inc System to transfer a template transfer body between a motion stage and a docking plate
US8332053B1 (en) * 2009-04-28 2012-12-11 Hrl Laboratories, Llc Method for fabrication of a stretchable electronic skin
US20130294617A1 (en) * 2012-05-03 2013-11-07 Motorola Mobility Llc Coupling an Electronic Skin Tattoo to a Mobile Communication Device
CN103411710A (zh) * 2013-08-12 2013-11-27 国家纳米科学中心 一种压力传感器、电子皮肤和触屏设备
CN103616097A (zh) * 2013-10-22 2014-03-05 中国石油大学(华东) 一种柔性薄膜触觉传感器件及其制作方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE602005013692D1 (de) * 2004-12-07 2009-05-14 Semiconductor Energy Lab Halbleiterbauelement und verfahren zu seiner herstellung
TWI309195B (en) 2007-03-21 2009-05-01 Ind Tech Res Inst Artificial skin having pressure and temperature sensors
JP2012119532A (ja) * 2010-12-01 2012-06-21 Seiko Epson Corp 薄膜トランジスタ形成用基板、半導体装置、電気装置
CN104583762B (zh) * 2012-03-26 2017-05-31 泰克年研究发展基金会公司 用于组合感测压力、温度和湿度的平台单元
CN103000530B (zh) * 2012-11-13 2015-05-20 深圳丹邦投资集团有限公司 顶栅氧化物薄膜晶体管的制造方法
US9236552B2 (en) * 2013-04-04 2016-01-12 William N. Carr Thermoelectric micro-platform for cooling and temperature sensing
US10032872B2 (en) * 2013-05-17 2018-07-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, method for manufacturing the same, and apparatus for manufacturing semiconductor device
CN104523285B (zh) 2014-12-12 2016-09-21 广东东邦科技有限公司 一种电子皮肤及其制备方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI309198B (en) * 2005-08-25 2009-05-01 Molecular Imprints Inc System to transfer a template transfer body between a motion stage and a docking plate
US8332053B1 (en) * 2009-04-28 2012-12-11 Hrl Laboratories, Llc Method for fabrication of a stretchable electronic skin
US20130294617A1 (en) * 2012-05-03 2013-11-07 Motorola Mobility Llc Coupling an Electronic Skin Tattoo to a Mobile Communication Device
CN103411710A (zh) * 2013-08-12 2013-11-27 国家纳米科学中心 一种压力传感器、电子皮肤和触屏设备
CN103616097A (zh) * 2013-10-22 2014-03-05 中国石油大学(华东) 一种柔性薄膜触觉传感器件及其制作方法

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
MARKUS KRAUSE ET AL: "PbTiO3/P(VDF-TrFE) nanocomposites for flexible skin", 《ELECTRETS, 2008. ISE-13. 13TH INTERNATIONAL SYMPOSIUM ON》 *
MARTIN ZIRKL ET AL: "Low-Voltage Organic Thin-Film Transistors with High-k Nanocomposite Gate Dielectrics for Flexible Electronics and Optothermal Sensors", 《ADVANCED MATERIALS》 *
TAKAO SOMEYA ET AL: "Cut-and-Paste Organic FET Customized ICs for Application to Artificial Skin", 《2004 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE》 *

Cited By (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016091070A1 (zh) * 2014-12-12 2016-06-16 广东东邦科技有限公司 一种电子皮肤及其制备方法
US10624582B2 (en) 2014-12-12 2020-04-21 Guang Dong Dongbond Technology Co., Ltd. Electronic skin and manufacturing method therefor
CN107530008A (zh) * 2015-05-06 2018-01-02 赫尔比公司 传感器单元
US11045093B2 (en) 2015-05-06 2021-06-29 Healbe Corporation Sensor unit
CN107530008B (zh) * 2015-05-06 2020-07-28 赫尔比公司 传感器单元
CN105105724A (zh) * 2015-09-14 2015-12-02 中国地质大学(武汉) 太阳能可穿戴计算式人体健康监测帽
CN105286831A (zh) * 2015-11-17 2016-02-03 中国地质大学(武汉) 可穿戴计算式智能保健手套
CN105286831B (zh) * 2015-11-17 2019-01-01 中国地质大学(武汉) 可穿戴计算式智能保健手套
CN105852806B (zh) * 2016-03-24 2018-07-31 浙江大学 一种用于伤口实时监测的电子皮肤
CN105852806A (zh) * 2016-03-24 2016-08-17 浙江大学 一种用于伤口实时监测的电子皮肤
CN105841850A (zh) * 2016-05-12 2016-08-10 京东方科技集团股份有限公司 一种压电传感器及其制作方法
WO2017193708A1 (zh) * 2016-05-12 2017-11-16 京东方科技集团股份有限公司 压电传感器及其制作方法
US10461240B2 (en) 2016-05-12 2019-10-29 Boe Technology Group Co., Ltd. Piezoelectric sensors and methods for manufacturing the same
CN106328659B (zh) * 2016-08-19 2019-06-14 京东方科技集团股份有限公司 阵列基板及其制备方法、显示面板
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WO2019010741A1 (zh) * 2017-07-14 2019-01-17 江苏申源新材料有限公司 一种柔韧高强机器人皮肤制备方法
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CN110793676A (zh) * 2018-08-02 2020-02-14 北京纳米能源与系统研究所 温度湿度压力传感器及其制备方法、电子皮肤
CN109374024A (zh) * 2018-11-05 2019-02-22 四川大学 一种具有凹坑结构的压阻式电子皮肤及其制备方法
CN113543698A (zh) * 2018-12-13 2021-10-22 武汉联影智融医疗科技有限公司 利用电子皮肤的用户监测的装置、系统和方法
CN111403431A (zh) * 2019-01-02 2020-07-10 京东方科技集团股份有限公司 柔性体及控制其发生形变的方法
US11706992B2 (en) 2019-01-02 2023-07-18 Fuzhou Boe Optoelectronics Technology Co., Ltd. Flexible body and method for controlling flexible body to deform
CN111403431B (zh) * 2019-01-02 2023-09-05 京东方科技集团股份有限公司 柔性体及控制其发生形变的方法
CN109655170A (zh) * 2019-01-14 2019-04-19 清华大学 柔性薄膜传感器及检测装置
CN110200627A (zh) * 2019-06-05 2019-09-06 上海大学 一种有源高密度电极阵列及其制备方法
CN110243504B (zh) * 2019-06-29 2021-06-15 上海中航光电子有限公司 压力传感装置、压力传感装置的驱动方法及制作方法
CN110243504A (zh) * 2019-06-29 2019-09-17 上海中航光电子有限公司 压力传感装置、压力传感装置的驱动方法及制作方法
CN114427883A (zh) * 2021-12-28 2022-05-03 荣成歌尔微电子有限公司 温湿度传感器及其制备方法

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