CN104508468B - 表面增强拉曼散射元件 - Google Patents
表面增强拉曼散射元件 Download PDFInfo
- Publication number
- CN104508468B CN104508468B CN201380041034.9A CN201380041034A CN104508468B CN 104508468 B CN104508468 B CN 104508468B CN 201380041034 A CN201380041034 A CN 201380041034A CN 104508468 B CN104508468 B CN 104508468B
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/068—Optics, miscellaneous
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- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012178765A JP6023509B2 (ja) | 2012-08-10 | 2012-08-10 | 表面増強ラマン散乱ユニット |
| JP2012-178765 | 2012-08-10 | ||
| PCT/JP2013/071698 WO2014025029A1 (ja) | 2012-08-10 | 2013-08-09 | 表面増強ラマン散乱素子 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104508468A CN104508468A (zh) | 2015-04-08 |
| CN104508468B true CN104508468B (zh) | 2017-04-05 |
Family
ID=50068245
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201380041034.9A Expired - Fee Related CN104508468B (zh) | 2012-08-10 | 2013-08-09 | 表面增强拉曼散射元件 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9874523B2 (enExample) |
| EP (1) | EP2889607B1 (enExample) |
| JP (1) | JP6023509B2 (enExample) |
| CN (1) | CN104508468B (enExample) |
| TW (1) | TWI627127B (enExample) |
| WO (1) | WO2014025029A1 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5908370B2 (ja) * | 2012-08-10 | 2016-04-26 | 浜松ホトニクス株式会社 | 表面増強ラマン散乱ユニット |
| CN104508466B (zh) | 2012-08-10 | 2018-07-17 | 浜松光子学株式会社 | 表面增强拉曼散射元件 |
| EP2884264B1 (en) | 2012-08-10 | 2019-11-20 | Hamamatsu Photonics K.K. | Surface-enhanced raman scattering element, and method for producing same |
| JP6294797B2 (ja) * | 2014-09-10 | 2018-03-14 | 浜松ホトニクス株式会社 | 表面増強ラマン散乱ユニット |
| US10527494B2 (en) * | 2014-09-26 | 2020-01-07 | Korea Intitute of Machinery & Materials | Substrate on which multiple nanogaps are formed, and manufacturing method therefor |
| KR101639684B1 (ko) * | 2014-09-29 | 2016-07-15 | 한국기계연구원 | 나노갭이 조절된 기판 및 이의 제조방법 |
| KR101639686B1 (ko) * | 2014-09-29 | 2016-07-25 | 한국기계연구원 | 복수의 나노갭이 형성된 기판 및 이의 제조방법 |
| FR3049671B1 (fr) | 2016-04-04 | 2018-09-21 | Valeo Embrayages | Ensemble pour dispositif de transmission de couple, dispositif de transmission de couple, et leurs procedes de montage |
| CN107561053B (zh) * | 2016-07-01 | 2020-04-28 | 清华大学 | 一种单分子检测方法 |
| JP6559187B2 (ja) * | 2016-07-01 | 2019-08-14 | ツィンファ ユニバーシティ | 単一分子検出用のキャリア及び単一分子検出装置 |
| CN106292200B (zh) * | 2016-09-19 | 2018-05-29 | 苏州大学 | 全息制作表面拉曼增强基底的方法与光刻系统 |
| KR102046436B1 (ko) * | 2018-04-26 | 2019-11-19 | 한국기계연구원 | 미끄럼 절연막을 포함하는 기판 및 이의 제조방법 |
| TWI856328B (zh) * | 2022-06-10 | 2024-09-21 | 國立臺北科技大學 | 一具有頂角薄膜光柵結構的基板 |
| KR20240034365A (ko) * | 2022-09-07 | 2024-03-14 | 한국재료연구원 | 3차원 나노 플라즈모닉 캐비티 기판 및 이의 제조 방법 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080094621A1 (en) * | 2006-10-20 | 2008-04-24 | Zhiyong Li | Nanoscale structures, systems, and methods for use in nano-enhanced raman spectroscopy (ners) |
| CN101319994A (zh) * | 2007-06-08 | 2008-12-10 | 富士胶片株式会社 | 微细构造体及其制造方法、光电场增强器件 |
| JP2011107032A (ja) * | 2009-11-19 | 2011-06-02 | Omron Corp | 表面プラズモン共鳴チップ |
| US20110166045A1 (en) * | 2009-12-01 | 2011-07-07 | Anuj Dhawan | Wafer scale plasmonics-active metallic nanostructures and methods of fabricating same |
| WO2012024006A2 (en) * | 2010-05-21 | 2012-02-23 | Princeton University | Structures for enhancement of local electric field, light absorption, light radiation, material detection and methods for making and using of the same |
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| JPH0544867U (ja) | 1991-11-18 | 1993-06-15 | 三洋電機株式会社 | 測定装置の包装体 |
| JPH07260646A (ja) | 1994-03-17 | 1995-10-13 | Nikon Corp | 試料容器 |
| US20040023046A1 (en) | 1998-08-04 | 2004-02-05 | Falko Schlottig | Carrier substrate for Raman spectrometric analysis |
| JP2003026232A (ja) | 2001-07-18 | 2003-01-29 | Seiko Epson Corp | 梱包方法及び緩衝材 |
| US7460224B2 (en) | 2005-12-19 | 2008-12-02 | Opto Trace Technologies, Inc. | Arrays of nano structures for surface-enhanced Raman scattering |
| CN100357738C (zh) | 2004-03-26 | 2007-12-26 | 博奥生物有限公司 | 一种检测小分子化合物的方法 |
| NZ551786A (en) | 2004-05-19 | 2011-03-31 | Vp Holding Llc | Optical sensor with layered plasmon structure for enhanced detection of chemical groups by surface enhanced raman scattering |
| JP2005337771A (ja) | 2004-05-25 | 2005-12-08 | National Institute For Materials Science | ナノ構造を有する集積化ピラー構造光学素子 |
| GB0424458D0 (en) * | 2004-11-04 | 2004-12-08 | Mesophotonics Ltd | Metal nano-void photonic crystal for enhanced raman spectroscopy |
| US7245370B2 (en) | 2005-01-06 | 2007-07-17 | Hewlett-Packard Development Company, L.P. | Nanowires for surface-enhanced Raman scattering molecular sensors |
| US7528948B2 (en) | 2006-07-25 | 2009-05-05 | Hewlett-Packard Development Company, L.P. | Controllable surface enhanced Raman spectroscopy |
| BRPI0719825A2 (pt) | 2006-10-12 | 2014-05-06 | Koninkl Philips Electronics Nv | Sistema de detecção e método para detectar pelo menos uma molécula alvo |
| JP2008196992A (ja) | 2007-02-14 | 2008-08-28 | National Institute Of Information & Communication Technology | 表面プラズモンの電場増強構造 |
| JP5397577B2 (ja) | 2007-03-05 | 2014-01-22 | オムロン株式会社 | 表面プラズモン共鳴センサ及び当該センサ用チップ |
| JP2008268059A (ja) | 2007-04-23 | 2008-11-06 | St Japan Inc | 試料ホルダ |
| JP2009047623A (ja) | 2007-08-22 | 2009-03-05 | Jiyasuko Eng Kk | 透過測定用ホルダ |
| JP2009103643A (ja) | 2007-10-25 | 2009-05-14 | Fujifilm Corp | 表面増強ラマン分光装置 |
| US8115920B2 (en) | 2007-11-14 | 2012-02-14 | 3M Innovative Properties Company | Method of making microarrays |
| JP2009222507A (ja) | 2008-03-14 | 2009-10-01 | National Institute Of Advanced Industrial & Technology | 微量物質検出素子 |
| JP2009236830A (ja) * | 2008-03-28 | 2009-10-15 | Sumitomo Precision Prod Co Ltd | 被分析物担体、及び、その製造方法 |
| CN101281133B (zh) | 2008-05-12 | 2010-08-18 | 中国科学院合肥物质科学研究院 | 具有大面积微纳树状结构阵列的表面增强拉曼活性基底的制备方法 |
| US8198706B2 (en) | 2008-07-25 | 2012-06-12 | Hewlett-Packard Development Company, L.P. | Multi-level nanowire structure and method of making the same |
| JP4980324B2 (ja) | 2008-09-30 | 2012-07-18 | テルモ株式会社 | 成分測定装置 |
| US8531658B2 (en) | 2008-10-30 | 2013-09-10 | Nippon Telegraph And Telephone Corporation | Measuring chip device using magnets for installation/removal |
| JP2012508881A (ja) | 2008-11-17 | 2012-04-12 | ヒューレット−パッカード デベロップメント カンパニー エル.ピー. | 表面増強ラマン散乱(sers)用基板 |
| CN102307699B (zh) | 2009-02-09 | 2015-07-15 | 浜松光子学株式会社 | 加工对象物的切断方法 |
| WO2011022093A2 (en) | 2009-04-13 | 2011-02-24 | The Board Of Trustees Of The Leland Stanford Junior University | Methods and devices for detecting the presence of an analyte in a sample |
| US20120081703A1 (en) | 2009-05-07 | 2012-04-05 | Nant Holdings Ip, Llc | Highly Efficient Plamonic Devices, Molecule Detection Systems, and Methods of Making the Same |
| JP2011021085A (ja) | 2009-07-15 | 2011-02-03 | Yokohama Rubber Co Ltd:The | 空気入りタイヤ用ゴム組成物 |
| JP2011033518A (ja) | 2009-08-04 | 2011-02-17 | Toray Res Center:Kk | 表面増強ラマン分光分析方法 |
| US8659391B2 (en) | 2009-08-18 | 2014-02-25 | Indian Institute Of Technology Madras | Multielement and multiproperty tagging |
| WO2011034533A1 (en) | 2009-09-17 | 2011-03-24 | Hewlett-Packard Development Company, L.P. | Electrically driven devices for surface enhanced raman spectroscopy |
| JP2011075348A (ja) | 2009-09-30 | 2011-04-14 | Nidek Co Ltd | 試験片の製造方法 |
| TWI523950B (zh) | 2009-09-30 | 2016-03-01 | 凸版印刷股份有限公司 | 核酸分析裝置 |
| DK2491372T3 (da) * | 2009-10-23 | 2021-10-18 | Univ Danmarks Tekniske | Overfladeforbedrede raman-spredningssubstratforbrugsvarer til raman-spektroskopi |
| JP5589656B2 (ja) | 2009-12-11 | 2014-09-17 | セイコーエプソン株式会社 | センサーチップ、センサーカートリッジ及び分析装置 |
| JP5574783B2 (ja) | 2010-03-31 | 2014-08-20 | 富士フイルム株式会社 | 蛍光検出装置および方法 |
| US8358407B2 (en) | 2010-04-30 | 2013-01-22 | Hewlett-Packard Development Company, L.P. | Enhancing signals in Surface Enhanced Raman Spectroscopy (SERS) |
| US20140154668A1 (en) * | 2010-05-21 | 2014-06-05 | The Trustees Of Princeton University | Structures for Enhancement of Local Electric Field, Light Absorption, Light Radiation, Material Detection and Methods for Making and Using of the Same. |
| JP2012050073A (ja) | 2010-07-30 | 2012-03-08 | Nikon Corp | 撮像装置及び画像合成プログラム |
| JP5779963B2 (ja) | 2011-04-28 | 2015-09-16 | ナノフォトン株式会社 | 観察試料密閉容器 |
| US9080980B2 (en) | 2011-07-27 | 2015-07-14 | Hewlett-Packard Development Company, L.P. | Surface enhanced raman spectroscopy employing a nanorod in a surface indentation |
| TWI469917B (zh) * | 2012-08-09 | 2015-01-21 | Nat Univ Tsing Hua | 具表面增強拉曼散射活性之結構、其製造方法及其偵測裝置 |
| US10132755B2 (en) * | 2012-08-10 | 2018-11-20 | Hamamatsu Photonics K.K. | Surface-enhanced Raman scattering element, and method for manufacturing surface-enhanced Raman scattering element |
| JP6055234B2 (ja) * | 2012-08-10 | 2016-12-27 | 浜松ホトニクス株式会社 | 表面増強ラマン散乱ユニット |
| JP5908370B2 (ja) | 2012-08-10 | 2016-04-26 | 浜松ホトニクス株式会社 | 表面増強ラマン散乱ユニット |
| JP5945192B2 (ja) * | 2012-08-10 | 2016-07-05 | 浜松ホトニクス株式会社 | 表面増強ラマン散乱ユニット |
| EP2884264B1 (en) * | 2012-08-10 | 2019-11-20 | Hamamatsu Photonics K.K. | Surface-enhanced raman scattering element, and method for producing same |
| CN104508466B (zh) * | 2012-08-10 | 2018-07-17 | 浜松光子学株式会社 | 表面增强拉曼散射元件 |
| CN108827928B (zh) | 2012-08-10 | 2021-12-24 | 浜松光子学株式会社 | 表面增强拉曼散射单元及其使用方法 |
| EP2884262B1 (en) | 2012-08-10 | 2022-04-27 | Hamamatsu Photonics K.K. | Surface-enhanced raman scattering unit |
-
2012
- 2012-08-10 JP JP2012178765A patent/JP6023509B2/ja active Active
-
2013
- 2013-08-09 EP EP13828677.8A patent/EP2889607B1/en active Active
- 2013-08-09 TW TW102128771A patent/TWI627127B/zh not_active IP Right Cessation
- 2013-08-09 US US14/420,422 patent/US9874523B2/en active Active
- 2013-08-09 CN CN201380041034.9A patent/CN104508468B/zh not_active Expired - Fee Related
- 2013-08-09 WO PCT/JP2013/071698 patent/WO2014025029A1/ja not_active Ceased
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080094621A1 (en) * | 2006-10-20 | 2008-04-24 | Zhiyong Li | Nanoscale structures, systems, and methods for use in nano-enhanced raman spectroscopy (ners) |
| CN101319994A (zh) * | 2007-06-08 | 2008-12-10 | 富士胶片株式会社 | 微细构造体及其制造方法、光电场增强器件 |
| JP2011107032A (ja) * | 2009-11-19 | 2011-06-02 | Omron Corp | 表面プラズモン共鳴チップ |
| US20110166045A1 (en) * | 2009-12-01 | 2011-07-07 | Anuj Dhawan | Wafer scale plasmonics-active metallic nanostructures and methods of fabricating same |
| WO2012024006A2 (en) * | 2010-05-21 | 2012-02-23 | Princeton University | Structures for enhancement of local electric field, light absorption, light radiation, material detection and methods for making and using of the same |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201410590A (zh) | 2014-03-16 |
| EP2889607B1 (en) | 2020-09-23 |
| JP2014037970A (ja) | 2014-02-27 |
| JP6023509B2 (ja) | 2016-11-09 |
| US9874523B2 (en) | 2018-01-23 |
| CN104508468A (zh) | 2015-04-08 |
| EP2889607A1 (en) | 2015-07-01 |
| EP2889607A4 (en) | 2016-09-28 |
| US20150212000A1 (en) | 2015-07-30 |
| TWI627127B (zh) | 2018-06-21 |
| WO2014025029A1 (ja) | 2014-02-13 |
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Legal Events
| Date | Code | Title | Description |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170405 |