CN104464621B - 补偿amoled电源压降的方法 - Google Patents
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Abstract
本发明提供了一种补偿AMOLED电源压降的方法,包括:步骤1、从AMOLED的COF端开始,量测面板每一列发光单元的亮度值L;步骤2、绘制各列发光单元由IR Drop所引起的亮度变化曲线;步骤3、依据亮度差ΔL与电压差ΔV之间的比例转换关系,即ΔV=α·ΔL,从每相邻两列发光单元之间亮度的差值,计算每相邻两列发光单元之间需要补偿的电压值;步骤4、当时序控制器发送数据电压信号,显示画面时,第一列发光单元的数据电压不做补偿,第二列发光单元的数据电压加上第一个补偿值ΔV1,第三列发光单元的数据电压加上第一与第二个补偿值的和(ΔV1+ΔV2),以此类推到最后一列。该方法能够解决在大尺寸AMOLED显示装置中由于IR Drop引起的亮度不均问题。
Description
技术领域
本发明涉及显示技术领域,尤其涉及一种补偿AMOLED电源压降的方法。
背景技术
有机电致发光显示器件(Organic Light-Emitting Display,OLED)是指有机半导体发光材料在电场驱动下,通过载流子注入和复合导致发光的现象。其发光原理是利用铟锡金属氧化物(Indium Tin Oxdies,ITO)透明电极和金属电极分别作为器件的阳极和阴极,在一定电压驱动下,电子和空穴分别从阴极和阳极注入到电子和空穴传输层,电子和空穴分别经过电子和空穴传输层迁移到发光层,并在发光层中相遇形成激子使发光分子激发,后者经过辐射弛豫而发出可见光。
OLED具有更薄更轻、主动发光(不需要背光源)、无视角问题、高清晰、高亮度、响应快速、能耗低、使用温度范围广、抗震能力强、成本低和可实现柔性显示等优点。
OLED按照驱动方式可以分为无源驱动和有源驱动两大类,即直接寻址和薄膜晶体管(Thin Film Transistor,TFT)矩阵寻址两类。其中,有源驱动也称为有源矩阵(ActiveMatrix,AM)型,AMOLED中的每个发光单元都由TFT寻址独立控制。发光单元和TFT寻址电路组成的像素结构需要通过电源信号线对其加载直流电源信号(OVDD)进行驱动。
然而,在大尺寸的AMOLED显示装置中,由于背板电源信号线不可避免的存在一定电阻,且所有像素的驱动电流都由OVDD提供,因此在靠近OVDD电源供电位置区域的电源电压相比离供电位置较远区域的电源电压要高,这种现象被称为电源压降(IR Drop)。由于OVDD的电压与电流相关,IR Drop会造成不同区域的电流差异,进而导致在显示时出现亮度不均匀(mura)现象。
目前,AMOLED的补偿方法有内部补偿和外部补偿。其中,AMOLED内部补偿只有针对驱动TFT的阈值电压(Vth)或沟道迁移率(μ)做补偿,但无法补偿IR drop;外部补偿又分为光学补偿和电性补偿,电性补偿只能补偿驱动TFT和OLED的阈值电压,无法补偿IR Drop,光学补偿虽能补偿IR Drop,却无法做到实时补偿。中国专利文献CN1424707A是本发明最接近的现有技术。
发明内容
本发明的目的在于,提供一种补偿AMOLED电源压降的方法,解决在大尺寸AMOLED显示装置中由于IR Drop引起的亮度不均匀问题。
为实现上述目的,本发明提供一种补偿AMOLED电源压降的方法,包括以下步骤:
步骤1、从AMOLED的COF端开始,量测面板每一列发光单元的亮度值L;
步骤2、依据步骤1中所量测的面板每一列发光单元的亮度值L,绘制各列发光单元由IR Drop所引起的亮度变化曲线;
步骤3、依据亮度差ΔL与电压差ΔV之间的比例转换关系,即ΔV=α·ΔL,其中α为一比例因子,从每相邻两列发光单元之间亮度的差值,计算每相邻两列发光单元之间需要补偿的电压值;
第二列相对于第一列发光单元所需要补偿的电压值为第一个补偿值ΔV1、第三列相对于第二列发光单元所需要补偿的电压值为第二个补偿值ΔV2,依次类推到最后一列。
步骤4、当时序控制器发送数据电压信号,显示画面时,第一列发光单元的数据电压不做补偿,第二列发光单元的数据电压加上第一个补偿值ΔV1,第三列发光单元的数据电压加上第一与第二个补偿值的和(ΔV1+ΔV2),以此类推到最后一列。
所述步骤2的亮度变化曲线中,随着发光单元所在列数的增长,所量测到的各列发光单元的亮度值越来越低。
所述步骤3采用的演算方法为:
ΔVn-1=α·ΔLn-1=α·(Ln-Ln-1)
ΔVn-1为第n列与第n-1列发光单元所需要补偿的第n-1个电压值,ΔLn-1为第n列发光单元的亮度Ln与第n-1列发光单元的亮度Ln-1的亮度差值,n为大于1的正整数。
所述步骤4采用的演算方法为:
Vn表示第n列发光单元最终所需的电压,Vdata表示数据电压,n为大于1的正整数。
所述补偿AMOLED电源压降的方法,将所需要补偿的电压值直接加在数据电压上,不需要额外的补偿电路。
所述步骤3中获得的每相邻两列发光单元之间需要补偿的电压值存储在记忆单元中。
所述补偿AMOLED电源压降的方法,应用于OVDD单驱AMOLED显示装置或OVDD双驱AMOLED显示装置。本发明的有益效果:本发明提供的一种补偿AMOLED电源压降的方法,将由IR Drop造成的亮度差值转化为电压差值,并对每一列发光单元的数据电压进行相应的电压补偿,解决了大尺寸AMOLED显示装置中由于IR Drop引起的亮度不均问题,且演算复杂度低,不需要额外的电路,能够减少电路面积,增加开口率。
附图说明
为了能更进一步了解本发明的特征以及技术内容,请参阅以下有关本发明的详细说明与附图,然而附图仅提供参考与说明用,并非用来对本发明加以限制。
附图中:
图1为本发明补偿AMOLED电源压降的方法的流程图;
图2为应用本发明的补偿AMOLED电源压降的方法的OVDD单驱AMOLED显示装置的示意图;
图3为对应图2中OVDD单驱AMOLED显示装置的亮度变化曲线;
图4为应用本发明的补偿AMOLED电源压降的方法的OVDD双驱AMOLED显示装置的示意图。
具体实施方式
为更进一步阐述本发明所采取的技术手段及其效果,以下结合本发明的优选实施例及其附图进行详细描述。
请参阅图1,本发明提供一种补偿AMOLED电源压降的方法,包括以下步骤:
步骤1、从AMOLED的覆晶薄膜端(Chip On Film,COF)开始,量测面板每一列发光单元的亮度值L。
图2所示为应用本发明的补偿AMOLED电源压降的方法的OVDD单驱AMOLED显示装置。该OVDD单驱AMOLED显示装置包括显示面板1、OVDD电源线2、X向基板(Xboard)3、COF端4。结合图2,进行所述步骤1量测面板每一列发光单元的亮度值L时,从所述COF端4开始,沿OVDD电源线2的布线方向自左向右依次量测每一列发光单元的亮度值。
步骤2、依据步骤1中所量测的面板每一列发光单元的亮度值L,绘制各列发光单元由IR Drop所引起的亮度变化曲线。
图3所示为对应图2中OVDD单驱AMOLED显示装置的亮度变化曲线,其中X轴为所量测的发光单元所在的列数,Y轴为亮度值L。由图3可知,随着发光单元所在列数的增长,由于OVDD电源线2的不断加长,受IR Drop的影响,所量测到的各列发光单元的亮度值越来越低。
步骤3、依据亮度差ΔL与电压差ΔV之间的比例转换关系,即ΔV=α·ΔL,其中α为一比例因子,从每相邻两列发光单元之间亮度的差值,计算每相邻两列发光单元之间需要补偿的电压值。
具体的,第二列相对于第一列发光单元所需要补偿的电压值为第一个补偿值ΔV1、第三列相对于第二列发光单元所需要补偿的电压值为第二个补偿值ΔV2,依次类推到最后一列。
即有:ΔVn-1=α·ΔLn-1=α·(Ln-Ln-1)
ΔVn-1为第n列与第n-1列发光单元所需要补偿的第n-1个电压值,ΔLn-1为第n列发光单元的亮度Ln与第n-1列发光单元的亮度Ln-1的亮度差值,n为大于1的正整数。
所述步骤3中获得的每相邻两列发光单元之间需要补偿的电压值存储在记忆单元中。
步骤4、当时序控制器(Time Controller Register,TCON)发送数据电压信号,显示画面时,第一列发光单元的数据电压不做补偿,第二列发光单元的数据电压加上第一个补偿值ΔV1,第三列发光单元的数据电压加上第一与第二个补偿值的和(ΔV1+ΔV2),以此类推到最后一列。
即:
Vn表示第n列发光单元最终所需的电压,Vdata表示数据电压,n为大于1的正整数。
该步骤4将每列发光单元所需的补偿电压直接加在数据电压里面,不需要额外的补偿电路,从而可以减少电路面积,增加开口率。
经过上述四个步骤对每列发光单元进行电压补偿后,能够有效补偿AMOLED的电源压降,解决在大尺寸AMOLED显示装置中由于IR Drop引起的显示亮度不均问题。
图4所示为应用本发明的补偿AMOLED电源压降的方法的OVDD双驱AMOLED显示装置的示意图,与图2所示的OVDD单驱AMOLED显示装置相比较,该OVDD双驱AMOLED显示装置增加了第二X向基板3’与第二COF端4’,采用双向扫描驱动。正向扫描驱动时应用X向基板3与COF端4,因而上述步骤1为自左向右依次量测每一列发光单元的亮度值,发光单元所在的列数由左至右依次增长;反向扫描驱动时应用第二X向基板3’与第二COF端4’,因而上述步骤1为自右向左依次量测每一列发光单元的亮度值,发光单元所在的列数由右至左依次增长。其余步骤保持不变,此处不再赘述。。
综上所述,本发明的一种补偿AMOLED电源压降的方法,将由IR Drop造成的亮度差值转化为电压差值,并对每一列发光单元的数据电压进行相应的电压补偿,解决了大尺寸AMOLED显示装置中由于IR Drop引起的亮度不均问题,且演算复杂度低,不需要额外的电路,能够减少电路面积,增加开口率。
以上所述,对于本领域的普通技术人员来说,可以根据本发明的技术方案和技术构思作出其他各种相应的改变和变形,而所有这些改变和变形都应属于本发明权利要求的保护范围。
Claims (7)
1.一种补偿AMOLED电源压降的方法,其特征在于,包括以下步骤:
步骤1、从AMOLED的COF端开始,量测面板每一列发光单元的亮度值L;
步骤2、依据步骤1中所量测的面板每一列发光单元的亮度值L,绘制各列发光单元由IRDrop所引起的亮度变化曲线;
步骤3、依据亮度差ΔL与电压差ΔV之间的比例转换关系,即ΔV=α·ΔL,其中α为一比例因子,从每相邻两列发光单元之间亮度的差值,计算每相邻两列发光单元之间需要补偿的电压值;
第二列相对于第一列发光单元所需要补偿的电压值为第一个补偿值ΔV1、第三列相对于第二列发光单元所需要补偿的电压值为第二个补偿值ΔV2,依次类推到最后一列;
步骤4、当时序控制器发送数据电压信号,显示画面时,第一列发光单元的数据电压不做补偿,第二列发光单元的数据电压加上第一个补偿值ΔV1,第三列发光单元的数据电压加上第一与第二个补偿值的和(ΔV1+ΔV2),以此类推到最后一列。
2.如权利要求1所述的补偿AMOLED电源压降的方法,其特征在于,所述步骤2的亮度变化曲线中,随着发光单元所在列数的增长,所量测到的各列发光单元的亮度值越来越低。
3.如权利要求1所述的补偿AMOLED电源压降的方法,其特征在于,所述步骤3采用的演算方法为:
ΔVn-1=α·ΔLn-1=α·(Ln-Ln-1)
ΔVn-1为第n列与第n-1列发光单元所需要补偿的第n-1个电压值,ΔLn-1为第n列发光单元的亮度Ln与第n-1列发光单元的亮度Ln-1的亮度差值,n为大于1的正整数。
4.如权利要求2所述的补偿AMOLED电源压降的方法,其特征在于,所述步骤4采用的演算方法为:
Vn表示第n列发光单元最终所需的电压,Vdata表示数据电压,n为大于1的正整数。
5.如权利要求1所述的补偿AMOLED电源压降的方法,其特征在于,将所需要补偿的电压值直接加在数据电压上,不需要额外的补偿电路。
6.如权利要求1所述的补偿AMOLED电源压降的方法,其特征在于,所述步骤3中获得的每相邻两列发光单元之间需要补偿的电压值存储在记忆单元中。
7.如权利要求1所述的补偿AMOLED电源压降的方法,其特征在于,应用于OVDD单驱AMOLED显示装置或OVDD双驱AMOLED显示装置。
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US14/423,122 US9959812B2 (en) | 2014-11-14 | 2015-02-06 | Method of compensating AMOLED power supply voltage drop |
JP2017525025A JP6579669B2 (ja) | 2014-11-14 | 2015-02-06 | Amoled電源電圧降下の補償方法 |
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