CN104364635B - 在光谱分析仪中使用实时或近实时验证的碰撞展宽补偿 - Google Patents

在光谱分析仪中使用实时或近实时验证的碰撞展宽补偿 Download PDF

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CN104364635B
CN104364635B CN201380015938.4A CN201380015938A CN104364635B CN 104364635 B CN104364635 B CN 104364635B CN 201380015938 A CN201380015938 A CN 201380015938A CN 104364635 B CN104364635 B CN 104364635B
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gas
sample gas
volume
spectrometer
verification
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CN104364635A (zh
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阿尔弗雷德·菲提施
刘翔
黄旭弘
季文海
理查德·L·克莱因
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Endless And Hauser Optical Analysis Co ltd
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SpectraSensors Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0297—Constructional arrangements for removing other types of optical noise or for performing calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/05—Flow-through cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/031—Multipass arrangements
    • G01N2021/0314—Double pass, autocollimated path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G01N2021/396—Type of laser source
    • G01N2021/399—Diode laser
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/121—Correction signals
    • G01N2201/1211—Correction signals for temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/121—Correction signals
    • G01N2201/1218—Correction signals for pressure variations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
CN201380015938.4A 2012-03-23 2013-03-21 在光谱分析仪中使用实时或近实时验证的碰撞展宽补偿 Active CN104364635B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/428,591 2012-03-23
US13/428,591 US8976358B2 (en) 2012-03-23 2012-03-23 Collisional broadening compensation using real or near-real time validation in spectroscopic analyzers
PCT/US2013/033383 WO2013142737A1 (en) 2012-03-23 2013-03-21 Collisional broadening compensation using real or near-real time validation in spectroscopic analyzers

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CN104364635A CN104364635A (zh) 2015-02-18
CN104364635B true CN104364635B (zh) 2017-05-31

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US (2) US8976358B2 (enExample)
EP (1) EP2828642A1 (enExample)
CN (1) CN104364635B (enExample)
AU (1) AU2013234971B2 (enExample)
CA (1) CA2865649C (enExample)
IN (1) IN2014MN02008A (enExample)
WO (1) WO2013142737A1 (enExample)

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DE102014101915B4 (de) * 2014-02-14 2024-08-01 Avl Analytical Technologies Gmbh Vorrichtung und Verfahren zur Bestimmung der Konzentration zumindest eines Gases in einem Probengasstrom mittels Infrarotabsorptionsspektroskopie
CN107250740A (zh) * 2014-11-06 2017-10-13 光谱引擎股份公司 光学测量系统
US10643008B2 (en) * 2014-11-11 2020-05-05 Spectrasensors, Inc. Target analyte detection and quantification in sample gases with complex background compositions
CN104374712A (zh) * 2014-11-19 2015-02-25 山东罗纳德分析仪器有限公司 一种光谱分析仪的谱型变化补偿方法及装置
CN104713841B (zh) * 2015-02-09 2017-05-24 中国石油大学(华东) 一种自校准分析仪的设计方法及装置
CN107532997B (zh) * 2015-05-12 2021-06-18 柯尼卡美能达株式会社 植物生长指标测定装置及其方法以及植物生长指标测定系统
US11953427B2 (en) * 2015-08-03 2024-04-09 Endress+Hauser Optical Analysis, Inc. Reconstruction of frequency registration for quantitative spectroscopy
EP3332230B1 (en) * 2015-08-03 2021-12-01 SpectraSensors, Inc. Reconstruction of frequency registration deviations for quantitative spectroscopy
US9696204B2 (en) * 2015-08-03 2017-07-04 Spectrasensors, Inc. Determination and correction of frequency registration deviations for quantitative spectroscopy
JP2017129374A (ja) * 2016-01-18 2017-07-27 株式会社堀場製作所 分析装置、及び、分析方法
KR102497849B1 (ko) * 2016-05-09 2023-02-07 삼성전자주식회사 분석물질 농도 예측 방법 및 장치
US10677713B1 (en) * 2016-08-04 2020-06-09 Hrl Laboratories, Llc Adaptive gas analyzer
CN106841035B (zh) 2017-01-25 2024-02-23 成都中信华瑞科技有限公司 检测方法及装置
US10663344B2 (en) 2017-04-26 2020-05-26 Viavi Solutions Inc. Calibration for an instrument (device, sensor)
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CN108124462B (zh) * 2017-11-28 2020-11-17 深圳达闼科技控股有限公司 一种混合物检测方法及设备
US12044570B2 (en) 2018-03-27 2024-07-23 Viavi Solutions Inc. Calibration for an instrument (device, sensor)
US12493007B2 (en) 2018-08-08 2025-12-09 Brightspec, Inc. Methods and apparatus for low-volatility sampling
WO2020106557A1 (en) 2018-11-21 2020-05-28 Thermo Fisher Scientific Inc. System and method for rapid and accurate trace gas measurement
JP7498545B2 (ja) * 2019-05-09 2024-06-12 株式会社堀場エステック 吸光分析システム、吸光分析システム用プログラム、吸光分析装置、及び、吸光度測定方法
CN110208204A (zh) * 2019-06-13 2019-09-06 苗春磊 一种基于dlp技术的傅里叶变换光谱仪
US11079324B2 (en) * 2019-07-15 2021-08-03 Spectrasensors, Inc. Spectrometer with wide-scan tunable diode laser
US11719576B2 (en) * 2019-11-01 2023-08-08 California Institute Of Technology Mid-wave and long-wave infrared point spectrometer
WO2021241589A1 (ja) * 2020-05-29 2021-12-02 株式会社堀場製作所 分析装置、分析装置用プログラム及び分析方法
US11456577B2 (en) * 2020-07-28 2022-09-27 Raytheon Company Monolithic quantum cascade laser (QCL)/avalanche photodiode (APD) infrared transceiver
US11639892B2 (en) * 2021-04-02 2023-05-02 Abb Schweiz Ag Systems and methods for skewed basis set fitting
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US5900635A (en) * 1995-09-29 1999-05-04 Instrumentarium Oy Correction of collision broadening in non-dispersive absorption measurement of gases
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IN2014MN02008A (enExample) 2015-08-07
CA2865649C (en) 2017-07-18
US9618391B2 (en) 2017-04-11
WO2013142737A1 (en) 2013-09-26
AU2013234971B2 (en) 2015-06-25
EP2828642A1 (en) 2015-01-28
CN104364635A (zh) 2015-02-18
US8976358B2 (en) 2015-03-10
CA2865649A1 (en) 2013-09-26
US20160011047A1 (en) 2016-01-14
AU2013234971A1 (en) 2014-09-11
US20130250301A1 (en) 2013-09-26

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