IN2014MN02008A - - Google Patents

Info

Publication number
IN2014MN02008A
IN2014MN02008A IN2008MUN2014A IN2014MN02008A IN 2014MN02008 A IN2014MN02008 A IN 2014MN02008A IN 2008MUN2014 A IN2008MUN2014 A IN 2008MUN2014A IN 2014MN02008 A IN2014MN02008 A IN 2014MN02008A
Authority
IN
India
Prior art keywords
spectrometer
validation
gas
background
sample gas
Prior art date
Application number
Inventor
Alfred Feitisch
Xiang Liu
Hsu hung HUANG
Wenhai Ji
Richard L Cline
Original Assignee
Spectrasensors Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Spectrasensors Inc filed Critical Spectrasensors Inc
Publication of IN2014MN02008A publication Critical patent/IN2014MN02008A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0297Constructional arrangements for removing other types of optical noise or for performing calibration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/42Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N21/05Flow-through cuvettes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N21/031Multipass arrangements
    • G01N2021/0314Double pass, autocollimated path
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G01N2021/396Type of laser source
    • G01N2021/399Diode laser
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/121Correction signals
    • G01N2201/1211Correction signals for temperature
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/121Correction signals
    • G01N2201/1218Correction signals for pressure variations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/127Calibration; base line adjustment; drift compensation

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

Validation verification data quantifying an intensity of light reaching a detector of a spectrometer from a light source of the spectrometer after the light passes through a validation gas across a known path length can be collected or received. The validation gas can include an amount of an analyte compound and an undisturbed background composition that is representative of a sample gas background composition of a sample gas to be analyzed using a spectrometer. The sample gas background composition can include one or more background components. The validation verification data can be compared with stored calibration data for the spectrometer to calculate a concentration adjustment factor and sample measurement data collected with the spectrometer can be modified using this adjustment factor to compensate for collisional broadening of a spectral peak of the analyte compound by the background components. Related methods articles of manufacture systems and the like are described.
IN2008MUN2014 2012-03-23 2013-03-21 IN2014MN02008A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/428,591 US8976358B2 (en) 2012-03-23 2012-03-23 Collisional broadening compensation using real or near-real time validation in spectroscopic analyzers
PCT/US2013/033383 WO2013142737A1 (en) 2012-03-23 2013-03-21 Collisional broadening compensation using real or near-real time validation in spectroscopic analyzers

Publications (1)

Publication Number Publication Date
IN2014MN02008A true IN2014MN02008A (en) 2015-08-07

Family

ID=48096235

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2008MUN2014 IN2014MN02008A (en) 2012-03-23 2013-03-21

Country Status (7)

Country Link
US (2) US8976358B2 (en)
EP (1) EP2828642A1 (en)
CN (1) CN104364635B (en)
AU (1) AU2013234971B2 (en)
CA (1) CA2865649C (en)
IN (1) IN2014MN02008A (en)
WO (1) WO2013142737A1 (en)

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US8976358B2 (en) 2012-03-23 2015-03-10 Spectrasensors, Inc. Collisional broadening compensation using real or near-real time validation in spectroscopic analyzers
US20140361172A1 (en) * 2013-06-11 2014-12-11 Jp3 Measurement, Llc Detection of h2s in natural gas and hydrocarbon streams using a dual-path near-ir spectroscopy system
DE102014101915B4 (en) * 2014-02-14 2024-08-01 Avl Analytical Technologies Gmbh Device and method for determining the concentration of at least one gas in a sample gas stream by means of infrared absorption spectroscopy
CN107250740A (en) * 2014-11-06 2017-10-13 光谱引擎股份公司 optical measuring system
US10643008B2 (en) * 2014-11-11 2020-05-05 Spectrasensors, Inc. Target analyte detection and quantification in sample gases with complex background compositions
CN104374712A (en) * 2014-11-19 2015-02-25 山东罗纳德分析仪器有限公司 Spectral pattern change compensation method and spectral pattern change compensation device for spectrum analyzer
CN104713841B (en) * 2015-02-09 2017-05-24 中国石油大学(华东) Self-calibration analyzer design method and device
CN107532997B (en) * 2015-05-12 2021-06-18 柯尼卡美能达株式会社 Plant growth index measuring device and method thereof, and plant growth index measuring system
US11953427B2 (en) * 2015-08-03 2024-04-09 Endress+Hauser Optical Analysis, Inc. Reconstruction of frequency registration for quantitative spectroscopy
EP3332230B1 (en) * 2015-08-03 2021-12-01 SpectraSensors, Inc. Reconstruction of frequency registration deviations for quantitative spectroscopy
US9696204B2 (en) * 2015-08-03 2017-07-04 Spectrasensors, Inc. Determination and correction of frequency registration deviations for quantitative spectroscopy
JP2017129374A (en) * 2016-01-18 2017-07-27 株式会社堀場製作所 Analysis device and analysis method
KR102497849B1 (en) * 2016-05-09 2023-02-07 삼성전자주식회사 Method and apparatus for predicting analyte concentration
US10677713B1 (en) * 2016-08-04 2020-06-09 Hrl Laboratories, Llc Adaptive gas analyzer
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US10824049B1 (en) 2017-10-06 2020-11-03 Hrl Laboratories, Llc Optical-frequency up-converting spectrometric imager
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US12044570B2 (en) 2018-03-27 2024-07-23 Viavi Solutions Inc. Calibration for an instrument (device, sensor)
US12493007B2 (en) 2018-08-08 2025-12-09 Brightspec, Inc. Methods and apparatus for low-volatility sampling
WO2020106557A1 (en) 2018-11-21 2020-05-28 Thermo Fisher Scientific Inc. System and method for rapid and accurate trace gas measurement
JP7498545B2 (en) * 2019-05-09 2024-06-12 株式会社堀場エステック Absorption analysis system, program for absorption analysis system, absorption analysis device, and absorbance measurement method
CN110208204A (en) * 2019-06-13 2019-09-06 苗春磊 A kind of Fourier transform spectrometer, based on DLP technology
US11079324B2 (en) * 2019-07-15 2021-08-03 Spectrasensors, Inc. Spectrometer with wide-scan tunable diode laser
US11719576B2 (en) * 2019-11-01 2023-08-08 California Institute Of Technology Mid-wave and long-wave infrared point spectrometer
WO2021241589A1 (en) * 2020-05-29 2021-12-02 株式会社堀場製作所 Analysis device, program for analysis device, and analysis method
US11456577B2 (en) * 2020-07-28 2022-09-27 Raytheon Company Monolithic quantum cascade laser (QCL)/avalanche photodiode (APD) infrared transceiver
US11639892B2 (en) * 2021-04-02 2023-05-02 Abb Schweiz Ag Systems and methods for skewed basis set fitting
US12546709B2 (en) 2022-12-30 2026-02-10 Endress+Hauser Optical Analysis, Inc. Quantification of target analyte based on multi-layer multi-variant spectra analysis for spectroscopic analyzers
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Also Published As

Publication number Publication date
CA2865649C (en) 2017-07-18
US9618391B2 (en) 2017-04-11
WO2013142737A1 (en) 2013-09-26
AU2013234971B2 (en) 2015-06-25
EP2828642A1 (en) 2015-01-28
CN104364635A (en) 2015-02-18
US8976358B2 (en) 2015-03-10
CA2865649A1 (en) 2013-09-26
US20160011047A1 (en) 2016-01-14
AU2013234971A1 (en) 2014-09-11
US20130250301A1 (en) 2013-09-26
CN104364635B (en) 2017-05-31

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