CN104345064A - A hole checking device - Google Patents
A hole checking device Download PDFInfo
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- CN104345064A CN104345064A CN201410016658.1A CN201410016658A CN104345064A CN 104345064 A CN104345064 A CN 104345064A CN 201410016658 A CN201410016658 A CN 201410016658A CN 104345064 A CN104345064 A CN 104345064A
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- hole
- image data
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- white noise
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/894—Pinholes
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- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Textile Engineering (AREA)
- Biochemistry (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention provides a hole checking device capable of preventing error detection of holes caused by cosmic-ray mesons. The hole checking device in an embodiment is provided with an image data acquiring part, a hole detection part and a white noise determining part. The image data acquiring part acquires camera image data of an object to be checked. The hole detection part detects zones having luminance exceeding the candidate hole detection threshold in zones having a specified and determined size corresponding to the size of the hole to be detected, from a line of the camera image data having a specified width determined corresponding to the size of the hole to be detected in a direction orthometric to a conveying direction of the object to be detected, and adopts the zones as candidate holes. The white noise determining part determines that the candidate holes detected by the hole detection part as white noise, under the circumstance that the hole detection part detects candidate holes in a certain line of the camera image data, and does not detect candidate holes in a line of the camera image date next to the certain line of the camera image data.
Description
Technical field
Embodiments of the present invention relate to hole testing fixture.
Background technology
In the past, in order to detect the hole produced on steel plate, following method was widely used, namely, under the state being configured with the steel plate of check object between illuminating lamp and video camera, utilize camera head to take the illumination light passed through from the through hole of steel plate, carry out detect aperture according to photographed images.
Prior art document
Patent documentation
Patent documentation 1: Japanese Unexamined Patent Publication 2001-249005 publication
But, in such hole testing fixture, due to cosmic-ray particle (Cosmic Ray Particle) (alpha ray, neutron ray etc.), and the imaging apparatus of CCD, CMOS is affected, in its output signal (vision signal), produce the white noise (white noise) of spike (spike) randomly, be hole detection signal by this white noise error detection sometimes.
Summary of the invention
Problem to be solved by this invention is for providing a kind of hole testing fixture that can prevent the error detection in the hole caused because of cosmic-ray particle.
The hole testing fixture of embodiment, the image data that use is taken check object and obtained, detect passing through of the light irradiated from the opposition side in the shooting face of check object, detect the through hole produced in check object thus, possess view data obtaining section, hole test section, white noise detection unit.View data obtaining section obtains the image data of check object.Hole test section, from orthogonal direction, the carrying direction with check object has in the image data of 1 row of the Rack determined accordingly with the size in the hole detected, has the Subarea detecting of the brightness exceeding candidate hole detection threshold for candidate hole by the middle of each subregion with the prescribed level determined accordingly with the size in the hole detected.White noise detection unit is when hole test section detects candidate hole and candidate hole do not detected in the image data of upper 1 row once of the image data of this 1 row in the image data of certain 1 row, and the candidate hole detected by hole test section is judged to be white noise.
Embodiment
Below, the hole testing fixture of an embodiment is described with reference to accompanying drawing.
The hole testing fixture of present embodiment is removed at the upper white noise caused because of cosmic-ray particle produced of the output signal (vision signal) of ccd video camera or cmos camera (hereinafter referred to as video camera) by image procossing, prevents the error detection in hole thus.Fig. 1 represents the one-piece construction comprising the hole testing fixture of present embodiment and the steel plate of check object etc.In addition, check object is not limited to steel plate, can using the check object of the object of arbitrary tabular as the hole testing fixture of present embodiment.
Hole testing fixture has below the lighting device 1(such as LED, fluorescent light and is recited as illumination 1), video camera 2 and the PC3 for real-time image processing.On-the-spot in inspection, as shown in Figure 1, be configured with the state of steel plate 4 of check object between illumination 1 and video camera 2 under, utilize video camera 2 to take the illumination light passed through from the through hole 6 of steel plate 4.In addition, above steel plate 4 is carried with constant speed in Y direction (length direction (carrying direction) of steel plate 4) by multiple roller 7.
Fig. 2 illustrates the hardware configuration example of PC3.PC3 is the signal conditioning packages such as common PC, possesses CPU31, ROM32, RAM33, storage part 34, operating portion 35, display part 36 and video camera I/F portion 37.
CPU31, by being launched to perform in RAM33 by the base program be stored in ROM32, storage part 34, unifies the action of each several part of control PC3.In addition, CPU31, by the application program be stored in ROM32, storage part 34 being launched to perform in RAM33, realizes each function part described later.
ROM32 stores various programs, set information performed by CPU31.RAM33 is the main storage means of PC3, also for temporarily storing the image data from video camera 2.
Storage part 34 is HDD(Hard Disk Drive) etc. auxilary unit, store various programs, set information performed by CPU31.In addition, storage part 34 also stores the result etc. of image procossing described later.
Operating portion 35 is the input equipments such as keyboard, mouse, exports the operation input accepted from the user of PC3 to CPU31.Display part 36 is LCD(Liquid Crystal Display) etc. display device, show word, image etc. according to the control of CPU31.In addition, video camera I/F portion 37 accepts the vision signal from video camera 2, sends these data to CPU31.
Then, the functional structure of PC3 is described.Fig. 3 is the block diagram of the functional structure example representing PC3.As shown in the drawing, PC3 possesses view data obtaining section 311, hole test section 312, white noise detection unit 313, as the function part that the handling part 310 be made up of CPU31 and main storage portion and RAM33 and application program concerted action realize.In addition, the data handled by each several part, result are kept at memory device 320(RAM33 or storage part 34) in.
View data obtaining section 311, via video camera I/F portion 37, obtains the image data 321 from video camera 2 successively, and is kept at memory device 320.
Hole test section 312, based on the image data 321 be kept in memory device 320, carries out the process such as the detection in candidate hole, the removal of white noise.The testing result (candidate hole testing result 322) in candidate hole is stored in memory device 320.
White noise detection unit 313, based on the testing result of hole test section 312, judges the candidate hole that detects whether as white noise.
In the hole testing fixture of the present embodiment formed as described above, the vision signal from video camera 2 is transfused to PC3.In PC3, by view data obtaining section 311, using the vision signal from video camera 2 as the two dimensional image shown in Fig. 4, its data (image data 321) are kept in memory device 320.When using one dimension ccd video camera or one-dimensional, cmos video camera (line sensor (line sensor)) as video camera 2, video camera 2 and the shift action of the steel plate 4 carried towards Y direction scan 1 row of the X-direction (Width of steel plate 4) of steel plate 4 accordingly successively.In addition, the view data obtaining section 311 of PC3 obtains the one dimensional image data of each scanning of video camera 2 successively, and is kept in memory device 320.Hole test section 312 and white noise detection unit 313, when view data obtaining section 311 obtains the image data 321 of 1 row, perform respective process successively.
Fig. 5 is an example of the image data 321 of 1 row (suitable with the line shown in the Reference numeral 5 in Fig. 1) in X-direction.In addition, in Figure 5, the position on transverse axis corresponds to the position of the X-direction shown in Fig. 1, and the longitudinal axis is the brightness of position.In the present embodiment, the grade of brightness is 256 grades of gray scales, will have the part alternatively hole of the brightness exceeding hole detection threshold (such as, 50).In the diagram, show that in order to illustrate the part for the subregion of black is candidate hole.In addition, in the diagram, represent the candidate hole as white noise by Reference numeral A, represent the candidate hole as real hole by Reference numeral B.
In addition, the sweep velocity when surface of line sensor to plate 4 is scanned is determined according to the size in the transporting velocity of steel plate 4 and the hole of detection.At this, when detecting the hole of 1mm, scan in the mode of the width making 1 behavior 0.5mm in image data 321.In the present example, show in Fig. 5 for cancellate 1 subregion is the width of 0.5mm.In addition, about the brightness shown in each 1 subregion in image data 321, using formed each 1 subregion pixel group certain position pixel value as the brightness (typical value) of this 1 subregion or using mean value as this brightness.
Then, the detailed content of the process of hole test section 312 and white noise detection unit 313 is described.Fig. 6 is the process flow diagram of the relevant treatment that the removal of white noise that undertaken by hole test section 312 and white noise detection unit 313, that cause because of cosmic-ray particle and the detection in real hole are described.
First, hole test section 312 retrieves candidate hole (step S101).At this, when detecting part (part of 1 subregion in Fig. 4) with the brightness exceeding hole detection threshold (such as 50) in 1 scan-data (data of 1 row of X-direction) of the image data 321 that PC3 preserves (being yes in step s 102), this part is identified as candidate hole.When the part becoming candidate hole not detected (being no in step s 102), a series of process shown in this figure is implemented to Y direction next reverse line of (suitable with the carrying direction of steel plate 4) of image data 321.
At this, if candidate hole detected, then position coordinates (the x in candidate hole that will now detect of hole test section 312
n, y
n) alternatively hole testing result 322 be kept at (step S103) in memory device 320.
Then, hole test section 312 is in the image data of the upper image data 321(next line once scanned, once scan on when using one dimension ccd video camera and the image data of 1 row of X-direction that obtains) in, retrieval candidate hole further.At this, the next line from image data 321, retrieval has the candidate hole (step S104) of the brightness exceeding hole detection threshold.
At this, when part (1 subregion) with the brightness exceeding hole detection threshold becoming candidate hole not detected (being no in step S105), the position coordinates (x that white noise detection unit 313 will be arrived by last Scanning Detction
n, y
n) candidate hole be judged to be white noise, based on this result of determination, hole test section 312 removes this candidate hole (step S106) from image data 321.
On the other hand, when exist there is part (1 subregion) of the brightness exceeding hole detection threshold (be yes in step S105), the position coordinates (x in candidate hole that hole test section 312 will now detect
n+1, y
n+1) alternatively hole testing result 322 be kept at (step S107) in memory device 320.
In addition, white noise detection unit 313 implements white noise judgement (step S108) further according to following condition.
(1) at ︱ x
n-x
n+1time ︱ > white noise decision content (such as, at this, the degree (about 2.5mm) of 5 subregions) (being yes in step S108), white noise detection unit 313 is by position coordinates (x
n, y
n) candidate hole be judged to be white noise, based on this result of determination, hole test section 312 removes this candidate hole (step S106) from image data 321.
(2) at ︱ x
n-x
n+1during ︱≤white noise decision content (being no in step S108), white noise detection unit 313 is by position coordinates (x
n, y
n) candidate hole be judged to be real hole (step S109).Now, corresponding candidate hole as real hole, keeps image data 321 constant by hole test section 312.
In addition, the row later to the reverse next line of the Y direction (suitable with the carrying direction of steel plate 4) of image data 321, carries out above process (step S101 ~ S109) successively.
In the judgement in white noise described above and real hole, utilize the white noise that causes because of cosmic-ray particle usually discontinuous generation in the Y-axis direction feature, when X-direction there is not feature several times yet and at real hole (in this case more than 1mm) the candidate hole that detects in 3 subregion (in this case 1.5mm) continuous print features etc., the differentiation in white noise and real hole must be carried out as described above.
According to above image procossing, white noise because cosmic-ray particle causes can be detected and removed, thus the precision detected in hole can be improved.
Above, although the description of embodiments of the present invention, but this embodiment is used as example, is not used in restriction scope of invention.In addition, its new embodiment can be implemented in other various modes, can carry out various omission, displacement, change without departing from the spirit and scope of the invention.This embodiment and distortion thereof are included in scope of invention, aim, and are included in scope that the invention recorded with claims is equal to.
Accompanying drawing explanation
Fig. 1 represents the integrally-built figure comprising the hole testing fixture of an embodiment and the steel plate of check object etc.
Fig. 2 is the block diagram of the example of the hardware configuration representing PC.
Fig. 3 is the block diagram of the example of the functional structure representing PC.
Fig. 4 is the figure of the example representing image data.
Fig. 5 is the figure of an example of the image data representing 1 scanning (1 row).
Fig. 6 is the process flow diagram of the relevant treatment that the removal of white noise that undertaken by hole test section and white noise detection unit, that cause because of cosmic-ray particle and the detection in real hole are described.
Reference text explanation
1 lighting device
2 video cameras
3PC
4 steel plates
The line of 5 sweep objects
6 through holes
7 rollers
31CPU
32ROM
33RAM
34 storage parts
35 operating portions
36 display parts
37 video camera I/F portions
310 handling parts
311 view data obtaining sections
312 hole test sections
313 white noise detection units
320 memory devices
321 image data
322 candidate hole testing results
Claims (6)
1. a hole testing fixture, the image data that use is taken check object and obtained, detects passing through of the light irradiated from the opposition side of the imaging surface of check object, detects the through hole produced in check object thus, it is characterized in that,
Possess:
View data obtaining section, obtains the image data of described check object;
Hole test section, have in the image data of 1 row of the Rack determined accordingly with the size in hole detected from the direction that the carrying direction with described check object is orthogonal, there is the Subarea detecting of the brightness exceeding candidate hole detection threshold for candidate hole by the middle of each subregion with the prescribed level determined accordingly with the size in the hole detected; And
White noise detection unit, when described hole test section detects candidate hole and candidate hole do not detected in the image data of lower 1 row of the image data of this 1 row in the image data of certain 1 row, the described candidate hole detected by described hole test section is judged to be white noise.
2. hole according to claim 1 testing fixture, is characterized in that,
Described first candidate hole and described second candidate hole, when described hole test section detects the first candidate hole and the second candidate hole detected in the image data of lower 1 row of the image data of this 1 row in the image data of certain 1 row, are set to x in the position on the direction that the carrying direction with described check object is orthogonal by described white noise detection unit respectively
nand x
n+1, meeting
︱ x
n-x
n+1︱ > white noise decision content
Condition time, described first candidate hole being judged to be white noise, when not meeting such condition, described first candidate hole being judged to be hole.
3. hole according to claim 1 and 2 testing fixture, is characterized in that,
The subregion in the described candidate hole being judged as white noise is removed by described hole test section from described image data.
4. hole according to any one of claim 1 to 3 testing fixture, is characterized in that,
When the camera head of the described check object of shooting is the camera head utilizing one dimension picture pick-up device,
Described view data obtaining section obtains takes described 1 row and the image data obtained successively,
Described hole test section and described white noise detection unit, when described view data obtaining section obtains the image data of described 1 row, implement the process of described hole test section and described white noise detection unit respectively successively.
5. hole according to any one of claim 1 to 4 testing fixture, is characterized in that,
Described camera head is ccd video camera or cmos camera.
6. hole according to any one of claim 1 to 5 testing fixture, is characterized in that,
Also have:
Lighting device, light is irradiated in the face to the side of described check object; And
Described camera head, takes this check object from the face of this check object opposite side.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013152950A JP6104745B2 (en) | 2013-07-23 | 2013-07-23 | Hole inspection device |
| JP2013-152950 | 2013-07-23 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104345064A true CN104345064A (en) | 2015-02-11 |
| CN104345064B CN104345064B (en) | 2017-04-12 |
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ID=52486501
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410016658.1A Active CN104345064B (en) | 2013-07-23 | 2014-01-14 | A hole checking device |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP6104745B2 (en) |
| KR (1) | KR101604528B1 (en) |
| CN (1) | CN104345064B (en) |
| TW (1) | TWI477732B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107533147A (en) * | 2015-05-14 | 2018-01-02 | 科磊股份有限公司 | For reducing in checking system by the system and method for radiation-induced spurious counts |
| CN111689218A (en) * | 2020-06-04 | 2020-09-22 | 九江学院 | Product emptying method and system, mobile terminal and storage medium |
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| MY165130A (en) * | 2015-03-31 | 2018-02-28 | Nisshin Steel Co Ltd | Surface defect inspecting device and method for hot-dip coated steel sheets |
| JP6600543B2 (en) * | 2015-12-04 | 2019-10-30 | 花王株式会社 | Method for manufacturing absorbent article |
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| JP2001085487A (en) | 1999-09-09 | 2001-03-30 | Toshiba Corp | Method of detecting hole pattern and hole pattern detector, and method of measuring hole area at hole center, and device for measuring area of hole at the hole center |
| JP2001249005A (en) | 2000-03-06 | 2001-09-14 | Toshiba Corp | Hole detector |
| JP2001343331A (en) * | 2000-05-31 | 2001-12-14 | Nkk Corp | System and method for inspecting defect |
| JP2002365226A (en) * | 2001-06-04 | 2002-12-18 | Hamamatsu Photonics Kk | Pin hole detector |
| KR100879342B1 (en) | 2002-05-29 | 2009-01-19 | 주식회사 포스코 | Through hole detection apparatus of moving works |
| US20060291716A1 (en) | 2005-06-28 | 2006-12-28 | Janakiraman Vaidyanathan | Thermal imaging and laser scanning systems and methods for determining the location and angular orientation of a hole with an obstructed opening residing on a surface of an article |
| JP4450776B2 (en) * | 2005-07-22 | 2010-04-14 | 株式会社日立ハイテクノロジーズ | Defect inspection method and appearance inspection apparatus |
| US20110184694A1 (en) * | 2007-08-19 | 2011-07-28 | Camtek Ltd. | Depth measurements of narrow holes |
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| CN201138332Y (en) * | 2008-01-10 | 2008-10-22 | 武汉钢铁(集团)公司 | On-line detecting device for pore on steel board |
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| CN101545870B (en) * | 2009-04-30 | 2010-08-11 | 湖南通源机电科技有限公司 | High-speed automatic detector of microscopic pinhole defect in chromium plate film |
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- 2013-07-23 JP JP2013152950A patent/JP6104745B2/en active Active
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2014
- 2014-01-14 CN CN201410016658.1A patent/CN104345064B/en active Active
- 2014-01-21 TW TW103102105A patent/TWI477732B/en active
- 2014-01-24 KR KR1020140008842A patent/KR101604528B1/en active IP Right Grant
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107533147A (en) * | 2015-05-14 | 2018-01-02 | 科磊股份有限公司 | For reducing in checking system by the system and method for radiation-induced spurious counts |
| US10241217B2 (en) | 2015-05-14 | 2019-03-26 | Kla-Tencor Corporation | System and method for reducing radiation-induced false counts in an inspection system |
| CN111689218A (en) * | 2020-06-04 | 2020-09-22 | 九江学院 | Product emptying method and system, mobile terminal and storage medium |
| CN111689218B (en) * | 2020-06-04 | 2021-11-05 | 九江学院 | Product emptying method and system, mobile terminal and storage medium |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201504591A (en) | 2015-02-01 |
| JP2015021948A (en) | 2015-02-02 |
| CN104345064B (en) | 2017-04-12 |
| JP6104745B2 (en) | 2017-03-29 |
| KR20150011748A (en) | 2015-02-02 |
| TWI477732B (en) | 2015-03-21 |
| KR101604528B1 (en) | 2016-03-17 |
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