CN104345064B - A hole checking device - Google Patents
A hole checking device Download PDFInfo
- Publication number
- CN104345064B CN104345064B CN201410016658.1A CN201410016658A CN104345064B CN 104345064 B CN104345064 B CN 104345064B CN 201410016658 A CN201410016658 A CN 201410016658A CN 104345064 B CN104345064 B CN 104345064B
- Authority
- CN
- China
- Prior art keywords
- hole
- image data
- candidate
- white noise
- row
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/894—Pinholes
Abstract
The invention provides a hole checking device capable of preventing error detection of holes caused by cosmic-ray mesons. The hole checking device in an embodiment is provided with an image data acquiring part, a hole detection part and a white noise determining part. The image data acquiring part acquires camera image data of an object to be checked. The hole detection part detects zones having luminance exceeding the candidate hole detection threshold in zones having a specified and determined size corresponding to the size of the hole to be detected, from a line of the camera image data having a specified width determined corresponding to the size of the hole to be detected in a direction orthometric to a conveying direction of the object to be detected, and adopts the zones as candidate holes. The white noise determining part determines that the candidate holes detected by the hole detection part as white noise, under the circumstance that the hole detection part detects candidate holes in a certain line of the camera image data, and does not detect candidate holes in a line of the camera image date next to the certain line of the camera image data.
Description
Technical field
Embodiments of the present invention are related to hole check device.
Background technology
In the past, in order to detect the hole produced on steel plate, widely use following method, i.e. illuminating lamp and video camera it
Between be configured with the state of the steel plate of check object, the illumination light passed through from the through hole of steel plate, root are shot using camera head
Hole is detected according to photographed images.
Prior art literature
Patent document
Patent document 1：Japanese Unexamined Patent Publication 2001-249005 publications
But, in such hole check device, due to cosmic-ray particle（Cosmic Ray Particle）（α is penetrated
Line, neutron ray etc.）, and the imaging apparatus of CCD, CMOS is affected, in its output signal（Vision signal）In it is random
Ground produces spike（spike）White noise（white noise）, it is sometimes hole detection signal by the white noise error detection.
The content of the invention
Problem to be solved by this invention is to provide a kind of error detection in the hole for being prevented from causing because of cosmic-ray particle
Hole check device.
The hole check device of embodiment, using image data obtained from check object is shot, detects from inspection
The light of the opposition side irradiation in the shooting face of object passes through, and thus detecting the through hole produced in check object, possesses figure
As data acquisition, hole test section, white noise detection unit.View data obtaining section obtains the image data of check object.
Hole test section from check object carry on the orthogonal direction in direction with accordingly determining with the size in the hole of detection
Rack 1 row image data in, will have the prescribed level that accordingly determines of size with the hole of detection
Each subregion in the middle of have more than candidate hole detection threshold value brightness Subarea detecting be candidate hole.White noise detection unit is examined in hole
Survey portion detects 1 row next time of candidate hole and the image data in 1 row in the image data of certain 1 row
Image data in be not detected by candidate hole in the case of, the candidate hole that hole test section is detected is judged to white noise
Sound.
Description of the drawings
Fig. 1 is to represent the integrally-built figure including the hole check device of an embodiment and the steel plate etc. of check object.
Fig. 2 is the block diagram of the example of the hardware configuration for representing PC.
Fig. 3 is the block diagram of the example of the functional structure for representing PC.
Fig. 4 is the figure of an example for representing image data.
Fig. 5 is to represent 1 scanning（1 row）Image data an example figure.
Fig. 6 is to illustrate white noise being carried out by hole test section and white noise detection unit, causing because of cosmic-ray particle
Removal and real hole detection relevant treatment flow chart.
Reference text explanation
1 lighting device
2 video cameras
3PC
4 steel plates
The line of 5 sweep objects
6 through holes
7 rollers
31CPU
32ROM
33RAM
34 storage parts
35 operating portions
36 display parts
37 video camera I/F portions
310 processing units
311 view data obtaining sections
312 hole test sections
313 white noise detection units
320 storage devices
321 image datas
322 candidate hole testing results
Specific embodiment
Below, it is described with reference to the hole check device of an embodiment.
The hole check device of present embodiment is removed in ccd video camera or cmos camera by image procossing（Below
Referred to as video camera）Output signal（Vision signal）The white noise caused because of cosmic-ray particle of upper generation, thus prevents hole
Error detection.Fig. 1 represents the overall structure including the hole check device of present embodiment and the steel plate etc. of check object.Additionally,
Check object is not limited to steel plate, can be right as the inspection of the hole check device of present embodiment using the object of arbitrary tabular
As.
Hole check device has the lighting devices such as LED, fluorescent lamp 1（Below it is recited as illumination 1）, video camera 2 and be used for
The PC3 of real-time image processing.Scene is being checked, as shown in figure 1, being configured with the steel of check object between illumination 1 and video camera 2
In the state of plate 4, the illumination light passed through from the through hole 6 of steel plate 4 is shot using video camera 2.Additionally, by multiple rollers 7 with perseverance
Constant speed degree is in Y direction（The length direction of steel plate 4（Carry direction））Upper carrying steel plate 4.
Fig. 2 illustrates the hardware configuration example of PC3.PC3 is the information processor such as common PC, possess CPU31,
ROM32, RAM33, storage part 34, operating portion 35, display part 36 and video camera I/F portions 37.
CPU31 by will be stored in ROM32, storage part 34 in base program launch to be performed to unite in RAM33
The action of each several part of one control PC3.In addition, CPU31 by will be stored in ROM32, storage part 34 in application program exist
Launch to be performed to realize each function part described later in RAM33.
Various programs, set information performed by ROM32 storage CPU31.RAM33 is the main storage means of PC3, is additionally operable to
Temporarily store the image data from video camera 2.
Storage part 34 is HDD（Hard Disk Drive）Deng auxilary unit, the various journeys performed by CPU31 are stored
Sequence, set information.In addition, storage part 34 also stores result of image procossing described later etc..
Operating portion 35 is the input equipments such as keyboard, mouse, and the operation input accepted from the user of PC3 is exported to CPU31.It is aobvious
Show that portion 36 is LCD（Liquid Crystal Display）Deng display device, word, image are shown according to the control of CPU31
Deng.In addition, video camera I/F portions 37 receive the vision signal from video camera 2, CPU31 is transmitted the data to.
Then, the functional structure of PC3 is illustrated.Fig. 3 is the block diagram of the functional structure example for representing PC3.As shown in the drawing,
PC3 possesses view data obtaining section 311, hole test section 312, white noise detection unit 313, is as by CPU31 and main storage portion
Processing unit 310 that RAM33 is constituted and application program co-operating are come the function part realized.In addition, data handled by each several part,
Result is stored in storage device 320（RAM33 or storage part 34）In.
View data obtaining section 311 obtains successively the image data from video camera 2 via video camera I/F portions 37
321, and save it in storage device 320.
Hole test section 312 based on image data 321 in storage device 320 is stored in, carry out candidate hole detection,
Removal of white noise etc. is processed.The testing result in candidate hole（Candidate hole testing result 322）In being stored in storage device 320.
Whether testing result of the white noise detection unit 313 based on hole test section 312, judge the candidate hole for detecting as white noise
Sound.
In the hole check device of the present embodiment for constituting as described above, the vision signal from video camera 2 is defeated
Enter PC3.In PC3, by view data obtaining section 311, using from the two dimension shown in the vision signal as Fig. 4 of video camera 2
Image, by its data（Image data 321）In being stored in storage device 320.Taken the photograph using one-dimensional CCD as video camera 2
Camera or one-dimensional, cmos video camera（Line sensor（line sensor））In the case of, video camera 2 with towards Y direction carry
Steel plate 4 shift action accordingly successively scan steel plate 4 X-direction（The width of steel plate 4）1 row.In addition,
The view data obtaining section 311 of PC3 obtains successively the one dimensional image data that video camera 2 is scanned every time, and saves it in storage
In equipment 320.Hole test section 312 and white noise detection unit 313 obtain the shooting figure of 1 row whenever view data obtaining section 311
During as data 321, respective process is performed successively.
Fig. 5 is 1 row in X-direction（It is suitable with the line shown in the reference 5 in Fig. 1）Image data 321
An example.Additionally, in Figure 5, corresponding to the position of the X-direction shown in Fig. 1, the longitudinal axis is each position to the position on transverse axis
The brightness at place.In the present embodiment, the grade of brightness is 256 grades of gray scales, will be with more than hole detection threshold value（For example, 50）'s
The part of brightness is used as candidate hole.In the diagram, the part that the subregion of black is shown as to illustrate is candidate hole.Additionally, in figure
In 4, the candidate hole of white noise is denoted as by reference A, the candidate hole in real hole is denoted as by reference B.
Additionally, transporting velocity and detection of sweep speed when line sensor is scanned to the surface of plate 4 according to steel plate 4
Hole size and determine.Here, when the hole of 1mm is detected, so that the width of 1 behavior 0.5mm in image data 321
Mode be scanned.In the present example, the width that cancellate 1 subregion is 0.5mm is shown as in Fig. 5.In addition, with regard to shooting
The brightness shown in each 1 subregion in view data 321, will form the pixel value of certain position of the pixel group of each 1 subregion
As the brightness of 1 subregion（Typical value）Or using mean value as the brightness.
Then, the detailed content of the process of hole test section 312 and white noise detection unit 313 is illustrated.Fig. 6 is illustrated by hole
Removal that test section 312 and white noise detection unit 313 are carried out, white noise causing because of cosmic-ray particle and real
The flow chart of the relevant treatment of the detection in hole.
First, the retrieval candidate of hole test section 312 hole（Step S101）.Here, the image data preserved in PC3
321 1 scan data（The data of 1 row of X-direction）In detect with exceed hole detection threshold value（Such as 50）It is bright
The part of degree（The part of 1 subregion in Fig. 4）In the case of（It is in step s 102 yes）, the part is identified as into candidate
Hole.In the case where being not detected by becoming the part in candidate hole（It is in step s 102 no）, to image data 321
Y direction（It is suitable with the carrying direction of steel plate 4）Next reverse line implements a series of process shown in the figure.
If here, detect candidate hole, hole test section 312 is by the position coordinates in the candidate hole for now detecting（xn, yn）
It is stored in storage device 320 as candidate hole testing result 322（Step S103）.
Then, hole test section 312 is in the image data 321 for scanning next time（The image data of next line,
The image data of 1 row of X-direction scan in the case of using one-dimensional ccd video camera next time obtained from）In, enter one
Step retrieval candidate hole.Here, the next line from image data 321, retrieval is with the brightness more than hole detection threshold value
Candidate hole（Step S104）.
Here, being not detected by becoming the part with the brightness more than hole detection threshold value in candidate hole（1 subregion）
In the case of（It is no in step S105）, the position coordinates that white noise detection unit 313 will be arrived by last Scanning Detction
（xn, yn）Candidate hole be judged to white noise, based on the result of determination, hole test section 312 is removed from image data 321 should
Candidate hole（Step S106）.
On the other hand, there is the part with the brightness more than hole detection threshold value（1 subregion）In the case of（In step
S105 is yes）, hole test section 312 is by the position coordinates in the candidate hole for now detecting（xN+1, yN+1）Tie as the detection of candidate hole
Really 322 it is stored in storage device 320（Step S107）.
In addition, white noise detection unit 313 further implements white noise according to following conditions judging（Step S108）.
（1）In ︱ xn-xN+1︱ ＞ white noise decision contents（Here, such as degree of 5 subregions（About 2.5mm））When（In step
It is yes in S108）, white noise detection unit 313 is by position coordinates（xn, yn）Candidate hole be judged to white noise, based on judgement knot
Really, hole test section 312 removes the candidate hole from image data 321（Step S106）.
（2）In ︱ xn-xN+1During ︱≤white noise decision content（It is no in step S108）, white noise detection unit 313 is by position
Coordinate（xn, yn）Candidate hole be judged to real hole（Step S109）.Now, hole test section 312 using corresponding candidate hole as
Real hole, keeps image data 321 constant.
In addition, the Y direction to image data 321（It is suitable with the carrying direction of steel plate 4）Reverse next line
Later row, carries out successively the process of the above（Step S101～S109）.
It is logical using the white noise caused because of cosmic-ray particle in the judgement in white noise described above and real hole
The characteristics of often discontinuously occurring in the Y-axis direction, the characteristics of X-direction does not also occur several times and in real hole（Here
For more than 1mm）In the case of the candidate hole that detects must be in 3 subregions（Here is 1.5mm）The characteristics of continuous etc., as above institute
Stating carries out like that the differentiation of white noise and real hole.
Image procossing according to more than, is able to detect that the white noise caused because of cosmic-ray particle and removes it, from
And the precision of hole detection can be improved.
More than, although embodiments of the present invention are illustrated, but the embodiment is used as example, is not used in restriction invention
Scope.In addition, its new embodiment can be implemented in other various modes, can be in the scope of the objective without departing from invention
Inside carry out various omissions, displacement, change.The embodiment and its deformation are included in the scope of invention, objective, and are included in
In the range of the invention recorded with claims is equal to.
Claims (6)
1. a kind of hole check device, using image data obtained from check object is shot, detects taking the photograph from check object
The light of the opposition side irradiation of image planes passes through, thus detecting the through hole produced in check object, it is characterised in that
Possess：
View data obtaining section, obtains the image data of the check object；
Hole test section, from the check object carry on the orthogonal direction in direction with relative with the size in the hole of detection
Should be in the image data of 1 row of Rack that determines of ground, by with accordingly determining with the size in the hole of detection
The Subarea detecting in the middle of each subregion of prescribed level with the brightness more than candidate hole detection threshold value is candidate hole；And
White noise detection unit, candidate hole is detected and in 1 row in the hole test section in the image data of certain 1 row
Image data lower 1 row image data in be not detected by candidate hole in the case of, by the hole test section
The candidate hole for detecting is judged to white noise.
2. hole check device according to claim 1, it is characterised in that
The white noise detection unit the hole test section detect in the image data of certain 1 row the first candidate hole and
In the case of detecting the second candidate hole in the image data of lower 1 row of the image data of 1 row, by described
One candidate hole and the second candidate hole set respectively in the position on the orthogonal direction in direction of carrying with the check object
For xnAnd xn+1, meeting
︱ xn-xn+1︱ ＞ white noise decision contents
Condition when, the first candidate hole is judged to into white noise, when such condition is unsatisfactory for, by first candidate
Hole is judged to hole.
3. hole check device according to claim 1 and 2, it is characterised in that
The hole test section removes the subregion for being judged as the candidate hole of white noise from the image data.
4. hole check device according to claim 1 and 2, it is characterised in that
In the case where the camera head for shooting the check object is the camera head using one-dimensional picture pick-up device,
Described image data acquisition is obtained and shoots image data obtained from 1 row successively,
The hole test section and the white noise detection unit obtain the shooting figure of 1 row whenever described image data acquisition
During as data, implement the process of the hole test section and the white noise detection unit successively respectively.
5. hole check device according to claim 4, it is characterised in that
The camera head is ccd video camera or cmos camera.
6. hole check device according to claim 1 and 2, it is characterised in that
Also have：
Lighting device, to the face irradiation light of the side of the check object；And
Camera head, from the face of the check object opposite side check object is shot.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013152950A JP6104745B2 (en) | 2013-07-23 | 2013-07-23 | Hole inspection device |
| JP2013-152950 | 2013-07-23 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104345064A CN104345064A (en) | 2015-02-11 |
| CN104345064B true CN104345064B (en) | 2017-04-12 |
Family
ID=52486501
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410016658.1A Active CN104345064B (en) | 2013-07-23 | 2014-01-14 | A hole checking device |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP6104745B2 (en) |
| KR (1) | KR101604528B1 (en) |
| CN (1) | CN104345064B (en) |
| TW (1) | TWI477732B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3279645A4 (en) * | 2015-03-31 | 2018-09-26 | Nisshin Steel Co., Ltd. | Device for examining surface defect in hot-dipped steel plate, and method for examining surface defect |
| US9841512B2 (en) | 2015-05-14 | 2017-12-12 | Kla-Tencor Corporation | System and method for reducing radiation-induced false counts in an inspection system |
| JP6600543B2 (en) * | 2015-12-04 | 2019-10-30 | 花王株式会社 | Method for manufacturing absorbent article |
| CN111689218B (en) * | 2020-06-04 | 2021-11-05 | 九江学院 | Product emptying method and system, mobile terminal and storage medium |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002365226A (en) * | 2001-06-04 | 2002-12-18 | Hamamatsu Photonics Kk | Pin hole detector |
| CN201138332Y (en) * | 2008-01-10 | 2008-10-22 | 武汉钢铁(集团)公司 | On-line detecting device for pore on steel board |
| DE102008012533A1 (en) * | 2008-03-04 | 2009-09-10 | INPRO Innovationsgesellschaft für fortgeschrittene Produktionssysteme in der Fahrzeugindustrie mbH | Surface defect and/or internal defect testing method for connected component, involves strongly cooling droplets of water spray by steep temperature gradients, and homogenously and convectively exciting water spray for thermography |
| CN101545870A (en) * | 2009-04-30 | 2009-09-30 | 湖南通源机电科技有限公司 | High-speed automatic detector of microscopic pinhole defect in chromium plate film |
| CN101887026A (en) * | 2009-05-13 | 2010-11-17 | 日本麦可罗尼克斯股份有限公司 | Non-lighting inspection apparatus |
| JP2012107936A (en) * | 2010-11-16 | 2012-06-07 | Toyo Kohan Co Ltd | Surface inspection method and apparatus for perforated plate |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3751660B2 (en) * | 1995-06-15 | 2006-03-01 | 浜松ホトニクス株式会社 | Regular pattern defect inspection system |
| JP2001085487A (en) | 1999-09-09 | 2001-03-30 | Toshiba Corp | Method of detecting hole pattern and hole pattern detector, and method of measuring hole area at hole center, and device for measuring area of hole at the hole center |
| JP2001249005A (en) | 2000-03-06 | 2001-09-14 | Toshiba Corp | Hole detector |
| JP2001343331A (en) * | 2000-05-31 | 2001-12-14 | Nkk Corp | System and method for inspecting defect |
| KR100879342B1 (en) | 2002-05-29 | 2009-01-19 | 주식회사 포스코 | Through hole detection apparatus of moving works |
| US20060291716A1 (en) | 2005-06-28 | 2006-12-28 | Janakiraman Vaidyanathan | Thermal imaging and laser scanning systems and methods for determining the location and angular orientation of a hole with an obstructed opening residing on a surface of an article |
| JP4450776B2 (en) * | 2005-07-22 | 2010-04-14 | 株式会社日立ハイテクノロジーズ | Defect inspection method and appearance inspection apparatus |
| TWI454656B (en) * | 2007-08-19 | 2014-10-01 | Camtek Ltd | Depth measurement of narrow holes |
| TWI402495B (en) * | 2007-10-05 | 2013-07-21 | Hitachi Int Electric Inc | Three-dimensional measuring device |
| US7821647B2 (en) * | 2008-02-21 | 2010-10-26 | Corning Incorporated | Apparatus and method for measuring surface topography of an object |
| TW201326737A (en) * | 2011-12-30 | 2013-07-01 | Metal Ind Res & Dev Ct | Measuring system and method for morphology of hole surface |
-
2013
- 2013-07-23 JP JP2013152950A patent/JP6104745B2/en active Active
-
2014
- 2014-01-14 CN CN201410016658.1A patent/CN104345064B/en active Active
- 2014-01-21 TW TW103102105A patent/TWI477732B/en active
- 2014-01-24 KR KR1020140008842A patent/KR101604528B1/en active IP Right Grant
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002365226A (en) * | 2001-06-04 | 2002-12-18 | Hamamatsu Photonics Kk | Pin hole detector |
| CN201138332Y (en) * | 2008-01-10 | 2008-10-22 | 武汉钢铁(集团)公司 | On-line detecting device for pore on steel board |
| DE102008012533A1 (en) * | 2008-03-04 | 2009-09-10 | INPRO Innovationsgesellschaft für fortgeschrittene Produktionssysteme in der Fahrzeugindustrie mbH | Surface defect and/or internal defect testing method for connected component, involves strongly cooling droplets of water spray by steep temperature gradients, and homogenously and convectively exciting water spray for thermography |
| CN101545870A (en) * | 2009-04-30 | 2009-09-30 | 湖南通源机电科技有限公司 | High-speed automatic detector of microscopic pinhole defect in chromium plate film |
| CN101887026A (en) * | 2009-05-13 | 2010-11-17 | 日本麦可罗尼克斯股份有限公司 | Non-lighting inspection apparatus |
| JP2012107936A (en) * | 2010-11-16 | 2012-06-07 | Toyo Kohan Co Ltd | Surface inspection method and apparatus for perforated plate |
Also Published As
| Publication number | Publication date |
|---|---|
| KR101604528B1 (en) | 2016-03-17 |
| JP2015021948A (en) | 2015-02-02 |
| CN104345064A (en) | 2015-02-11 |
| TWI477732B (en) | 2015-03-21 |
| JP6104745B2 (en) | 2017-03-29 |
| TW201504591A (en) | 2015-02-01 |
| KR20150011748A (en) | 2015-02-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107315011B (en) | Image processing apparatus, image processing method, and storage medium | |
| CN104345064B (en) | A hole checking device | |
| JP5086970B2 (en) | Wood appearance inspection device, wood appearance inspection method | |
| JP2003244521A (en) | Information processing method and apparatus, and recording medium | |
| US10429317B2 (en) | Optical device for detecting an internal flaw of a transparent substrate and method for the same | |
| JP2006010392A (en) | Through hole measuring system, method, and through hole measuring program | |
| JP2008041749A (en) | Device for inspecting image defect | |
| JP2006090921A (en) | Visual examination device, threshold determining method visual examination method and program for functionalizing computer as visual examination device | |
| JP4581424B2 (en) | Appearance inspection method and image processing apparatus | |
| JP2009236760A (en) | Image detection device and inspection apparatus | |
| JP6482589B2 (en) | Camera calibration device | |
| KR101126759B1 (en) | Method of teaching for electronic parts information in chip mounter | |
| JP2016212488A (en) | Inspection system, inspection method, program, and storage medium | |
| CN110801208B (en) | Tooth crack detection method and system | |
| JP2005189167A (en) | Bridge inspection device of cap | |
| JP2006050356A (en) | Image processing method and inspection apparatus | |
| JP2017166855A (en) | Detection device, method, and program | |
| JP5402182B2 (en) | Appearance inspection method and appearance inspection apparatus | |
| JP2008011005A (en) | Defect inspection method and program of image sensor | |
| JP3915753B2 (en) | Image detection device | |
| JP2008224562A (en) | System, method and program for inspecting foreign substance | |
| JP4720742B2 (en) | Material flow rate measuring method and material flow rate measuring device | |
| JP2004045245A (en) | Edge detection method | |
| JP2005092471A (en) | Image processing device | |
| JP2002216112A (en) | Dot printing inspection device and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |