CN104297665A - 一种用于芯片量产测试的ate接口电路板管理组件 - Google Patents
一种用于芯片量产测试的ate接口电路板管理组件 Download PDFInfo
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Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105978637A (zh) * | 2016-06-20 | 2016-09-28 | 深圳极智联合科技股份有限公司 | 多dut测试系统及其测试方法 |
CN106546902A (zh) * | 2016-10-13 | 2017-03-29 | 芯海科技(深圳)股份有限公司 | 一种otp型mcu在未预留测试接口情况下的量产测试方法 |
CN106771950A (zh) * | 2016-12-21 | 2017-05-31 | 珠海市中芯集成电路有限公司 | 一种用于晶圆的测试系统及其测试方法 |
CN107506268A (zh) * | 2017-07-26 | 2017-12-22 | 芯海科技(深圳)股份有限公司 | 一种ic在量产阶段写入唯一id的方法 |
CN108226744A (zh) * | 2016-12-22 | 2018-06-29 | 比亚迪股份有限公司 | 板卡测试方法、装置及板卡 |
CN109073693A (zh) * | 2016-04-29 | 2018-12-21 | 泰瑞达(上海)有限公司 | 用于提供准确模拟信号的方法和测试系统 |
CN109633413A (zh) * | 2018-12-28 | 2019-04-16 | 芯海科技(深圳)股份有限公司 | 一种32位mcu芯片测试系统及其测试方法 |
CN110058141A (zh) * | 2018-01-19 | 2019-07-26 | 神讯电脑(昆山)有限公司 | 芯片测试系统及其测试方法 |
CN111966593A (zh) * | 2020-08-12 | 2020-11-20 | 南京宏泰半导体科技有限公司 | 一种芯片测试量产前自动补偿的实现方法 |
CN116580757A (zh) * | 2023-07-12 | 2023-08-11 | 悦芯科技股份有限公司 | 一种虚拟ate测试方法及系统 |
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CN1035570A (zh) * | 1988-01-26 | 1989-09-13 | 富士通西班牙股份有限公司 | 计算机接口板 |
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US20080174319A1 (en) * | 2007-01-11 | 2008-07-24 | Harper Marcellus C | Load Board Based Test Circuits |
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CN101750578A (zh) * | 2008-12-16 | 2010-06-23 | 北京华大泰思特半导体检测技术有限公司 | 一种集成电路板级自动测试系统 |
CN103235202A (zh) * | 2012-08-20 | 2013-08-07 | 苏州大学 | 一种具有自动补偿功能的多路模拟信号采集系统 |
CN103675647A (zh) * | 2013-12-10 | 2014-03-26 | 中国船舶重工集团公司第七〇九研究所 | 一种基于集成电路标准样片的校准装置及方法 |
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2014
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CN1035570A (zh) * | 1988-01-26 | 1989-09-13 | 富士通西班牙股份有限公司 | 计算机接口板 |
CN1411173A (zh) * | 2001-09-27 | 2003-04-16 | 华为技术有限公司 | 宽带产品接口类单板通用测试方法 |
CN2593207Y (zh) * | 2002-12-30 | 2003-12-17 | 威盛电子股份有限公司 | 元件测试装置 |
US20080174319A1 (en) * | 2007-01-11 | 2008-07-24 | Harper Marcellus C | Load Board Based Test Circuits |
CN201196776Y (zh) * | 2008-05-27 | 2009-02-18 | 华为技术有限公司 | 具有时钟备份的单板及系统 |
CN101750578A (zh) * | 2008-12-16 | 2010-06-23 | 北京华大泰思特半导体检测技术有限公司 | 一种集成电路板级自动测试系统 |
CN103235202A (zh) * | 2012-08-20 | 2013-08-07 | 苏州大学 | 一种具有自动补偿功能的多路模拟信号采集系统 |
CN103675647A (zh) * | 2013-12-10 | 2014-03-26 | 中国船舶重工集团公司第七〇九研究所 | 一种基于集成电路标准样片的校准装置及方法 |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109073693B (zh) * | 2016-04-29 | 2021-06-11 | 泰瑞达(上海)有限公司 | 用于提供准确模拟信号的方法和测试系统 |
CN109073693A (zh) * | 2016-04-29 | 2018-12-21 | 泰瑞达(上海)有限公司 | 用于提供准确模拟信号的方法和测试系统 |
US10782339B2 (en) | 2016-04-29 | 2020-09-22 | Teradyne, Inc. | Method and test system for providing accurate analog signals |
CN105978637A (zh) * | 2016-06-20 | 2016-09-28 | 深圳极智联合科技股份有限公司 | 多dut测试系统及其测试方法 |
CN106546902A (zh) * | 2016-10-13 | 2017-03-29 | 芯海科技(深圳)股份有限公司 | 一种otp型mcu在未预留测试接口情况下的量产测试方法 |
CN106771950A (zh) * | 2016-12-21 | 2017-05-31 | 珠海市中芯集成电路有限公司 | 一种用于晶圆的测试系统及其测试方法 |
CN108226744A (zh) * | 2016-12-22 | 2018-06-29 | 比亚迪股份有限公司 | 板卡测试方法、装置及板卡 |
CN107506268A (zh) * | 2017-07-26 | 2017-12-22 | 芯海科技(深圳)股份有限公司 | 一种ic在量产阶段写入唯一id的方法 |
CN110058141A (zh) * | 2018-01-19 | 2019-07-26 | 神讯电脑(昆山)有限公司 | 芯片测试系统及其测试方法 |
CN109633413A (zh) * | 2018-12-28 | 2019-04-16 | 芯海科技(深圳)股份有限公司 | 一种32位mcu芯片测试系统及其测试方法 |
CN111966593A (zh) * | 2020-08-12 | 2020-11-20 | 南京宏泰半导体科技有限公司 | 一种芯片测试量产前自动补偿的实现方法 |
CN111966593B (zh) * | 2020-08-12 | 2021-12-17 | 南京宏泰半导体科技有限公司 | 一种芯片测试量产前自动补偿的实现方法 |
CN116580757A (zh) * | 2023-07-12 | 2023-08-11 | 悦芯科技股份有限公司 | 一种虚拟ate测试方法及系统 |
CN116580757B (zh) * | 2023-07-12 | 2023-09-22 | 悦芯科技股份有限公司 | 一种虚拟ate测试方法及系统 |
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