CN104215176B - High accuracy optical interval measurement device and method - Google Patents

High accuracy optical interval measurement device and method Download PDF

Info

Publication number
CN104215176B
CN104215176B CN201410472652.5A CN201410472652A CN104215176B CN 104215176 B CN104215176 B CN 104215176B CN 201410472652 A CN201410472652 A CN 201410472652A CN 104215176 B CN104215176 B CN 104215176B
Authority
CN
China
Prior art keywords
optical
optical fiber
measurement
light source
path
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201410472652.5A
Other languages
Chinese (zh)
Other versions
CN104215176A (en
Inventor
杨宝喜
魏张帆
胡小邦
李璟
陈明
朱菁
薛佩佩
黄惠杰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Guowang Optical Technology Co., Ltd.
Original Assignee
Shanghai Institute of Optics and Fine Mechanics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Institute of Optics and Fine Mechanics of CAS filed Critical Shanghai Institute of Optics and Fine Mechanics of CAS
Priority to CN201410472652.5A priority Critical patent/CN104215176B/en
Publication of CN104215176A publication Critical patent/CN104215176A/en
Application granted granted Critical
Publication of CN104215176B publication Critical patent/CN104215176B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

Disclosed are a high accuracy optical interval measurement device and a high accuracy optical interval measurement method. The high accuracy optical interval measurement device comprises a short coherent light source, a laser length measurement light source, an illumination indication light source, a first optical fiber coupler, a second optical fiber coupler, a measurement light path, a reference mirror light path, a delayed scanning light path, a wavelength division multiplexer, a first photoelectric detector, a second photoelectric detector, connection optical fibers and an environment sensor. According to the high accuracy optical interval measurement device and the high accuracy optical interval measurement method, a time domain optical coherence chromatographic technique is adopted, a broadband light source and the high accuracy delayed scanning light path are used to achieve noncontact measurement of optical element intervals, a common optical path length measurement technique is used to obtain accurate displacement of the delayed scanning light path, measurement errors are eliminated and measurement accuracy is improved by using an extraction algorithm enveloped with five step phase shift interference fringes and through environment compensation, the internal measurement accuracy in a measurement range can reach the submicron level, and simultaneously measurement can be performed in real time and measurement efficiency is improved during the installation adjustment process of an optical instrument.

Description

High-precision optical interval measurement device and measuring method
Technical field
The present invention relates to field of optical measurements and in particular to a kind of non-contacting based on optical fiber Michelson interference principle Measurement apparatus and measuring method are measured with lens separation to lens center thickness.
Background technology
In optical field, lens are as the most basic optical element of composition optical system, the processing of its center thickness Error will directly influence the image quality of whole optical system.During optical instrument is debug, position of optical element error Larger on the assembling quality impact of whole machine optics, it is also error more rambunctious, particularly in exposure system of photo-etching machine, aerial survey mirror In head, the assembling process of the high performance precision optical system such as interferometer standard lens, laserresonator, lens centre is spaced all Very strict control is had to require, the little by little deviation at its lens centre interval all may lead to the deterioration of image quality.How to solve Certainly the positional precision of optical element is to ensure that the key point of its optical property.
In traditional optical measurement, at present great majority using dial gauge or amesdial etc. carry out contact type measurement or and The pure optical meanss of the formula that connects measure.The major defect of contact type measurement is the anti-reflection film of easy snag lens surface, measures power Piece surface is easily made to damage, therefore certainty of measurement is relatively low.And indirect type measurement, so that its precision is reduced because needing reduced parameter. And, above two method measures all more difficult practical center accurately finding lens, therefore certainty of measurement is not high, is not suitable for The dress school of high-performance objective.
In the prior art, " optical lens center thickness measuring system and method " is (referring to Chinese patent CN 102435146 A) in, disclose a set of noncontact lens center thickness measuring system based on the confocal method of optics, its measurement letter Single quick, but its measurement range is little, is limited it is adaptable to list is saturating by minimal wave length in light source and long wavelength's focal length The measurement of mirror, its precision is restricted by measurement range and spectrogrph optical resolution.
Content of the invention
It is an object of the invention to the certainty of measurement of optical interval and efficiency in raising optical measurement, and provide a kind of base In the high-precision optical interval measurement apparatus and method of optical fiber Michelson interference principle, using Time Domain Optical coherent tomographic skill Art, realizes the non-cpntact measurement at optical element interval using wideband light source and high accuracy delaying sweep light path, is swashed by common light path The precise displacement of flash ranging long technical limit spacing optical delay circuit, using the extraction algorithm of five step phase shift interference fringe envelopes and by ring Border compensates, and eliminates measurement error, improves certainty of measurement, interval measurement precision can reach submicron order in measurement range, simultaneously Can realize measuring in real time during optical instrument is debug.
The technical solution of the present invention is specific as follows:
A kind of high-precision optical interval measurement device, for double fiber coupler structures, specifically includes:Short-coherence light source, swash The long light source of flash ranging, illumination instruction light source, the first fiber coupler, the second fiber coupler, optical path, reference mirror light path, Delaying sweep light path, wavelength division multiplexer, the first photodetector, the second photodetector, connection optical fiber, environmental sensor.
Short-coherence light source and the second fiber coupler are connected to two ports of the side of the first fiber coupler, swash The long light source of flash ranging and optical path are connected to two ports of the opposite side of the first fiber coupler, illuminate instruction light source It is connected with optical path;Reference mirror light path and delaying sweep light path are connected to two of the opposite side of the second fiber coupler Port, wavelength division multiplexer is connected with a port of the side of the second fiber coupler, and the first and second photodetectors are respectively It is connected with two output ports of wavelength division multiplexer.
Described short-coherence light source is super-radiance light emitting diode (Superluminescent LED), is wideband light source, There is the coherence length of very little, the interference signal as device measures light source.
Described laser length measurement light source is distributed feedback laser (Distributed FeedBack Laser), has Extraordinary monochromaticity, as the long positioned light source of survey of device.
Described illumination instruction light source is laser diode, sends visible ray in order to coordinate the tune of determinand optical axis position Section.
Described optical path includes four-dimensional adjustment frame, adjustable focus optical fiber amasthenic lens, determinand and installing rack.Measurement light Road is connected with the first fiber coupler by adjustable focus optical fiber amasthenic lens, and the measuring beam that short-coherence light source sends is through first Fiber coupler enters the adjustable focus optical fiber amasthenic lens in optical path, and each surface in determinand is reflected, and returns to The second fiber coupler is entered after first fiber coupler.Installing rack is used for adjusting and fix the position of determinand, four-dimensional adjustment Frame is fixed to adjustable focus optical fiber amasthenic lens and is pointed to and position adjustments are it is ensured that the optical axis weight of its optical axis and determinand Close.Adjustable focus optical fiber amasthenic lens is positioned over optical path foremost, can be gone out by adjusting adjustable focus optical fiber amasthenic lens The focal position of irradiating light beam is it is ensured that the light beam major part that in determinand, each surface reflects returns to adjustable focus optical fiber amasthenic lens In.
Described reference mirror light path includes an optical fiber retroeflector, by connecting optical fiber and the second fiber coupler phase Even, the reflected beams on each surface in determinand in optical path are reflected.It is right that the position of optical fiber retroeflector should be located at Answer the initial position (from the nearest position of fiber optic collimator camera lens) of removable scanning reflection mirror in delaying sweep light path, that is, after optical fiber Initial position to reflector and scanning reflection mirror removable in delaying sweep light path is aplanatic.
It is mobile flat that described delaying sweep light path includes fiber optic collimator camera lens, removable scanning reflection mirror and Motor drive Platform.Fiber optic collimator camera lens is positioned over delaying sweep light path foremost, and delaying sweep light path passes through fiber optic collimator camera lens and second Fiber coupler connection, short coherent measurement light beam and laser length measurement light beam are incided removable after fiber optic collimator camera lens collimation On scanning reflection mirror and reflect, return in the second fiber coupler.Removable scanning reflection mirror is arranged on a Motor drive and moves On moving platform, with certain speed uniform motion in measurement process, its position zinformation is existed respectively by laser length measurement light beam Produced by the reflected beams of reference mirror light path and removable scanning reflection mirror, interference signal measurement obtains.
Described wavelength division multiplexer is 1310/1550nm wavelength division multiplexer, for by the interference signal of two kinds of different wave lengths Carry out separating, be divided into two-way, respectively enter the first and second photodetectors.
First, second described photodetector is used for receiving short coherent measurement light beam and the ripple of wavelength 1310nm respectively The interference signal produced by laser length measurement light beam of long 1550nm, and it is connected display with computer.
Described connection optical fiber is single-mode polarization maintaining fiber, it is to avoid the measurement error being caused due to polarization mode dispersion.
Described environmental sensor separately detects temperature under the present circumstances, air pressure, relative humidity and delaying sweep Inside temperature in light path, is applied to the compensation of refractive index value of calculation in algorithm it is ensured that the precision of interval measurement.
Treat the measuring method at object test light interval using above-mentioned optical interval measurement device, the method includes following step Suddenly:
1. illumination instruction light source is connected to optical path by optical fiber, light source is opened, is fixed by installing rack Determinand, adjusts the position of adjustable focus optical fiber amasthenic lens by adjusting four-dimensional adjustment frame, according to each surface reflection in determinand The luminous point returned, adjust adjustable focus optical fiber amasthenic lens outgoing beam to determinand) center, i.e. the optical axis of determinand With in optical path measuring beam optical axis coincidence;
2. close illumination instruction light source, 4. the optical fiber of port is replaced illumination instruction and used by connecting the first fiber coupler the Light source and the connection optical fiber of optical path, open short-coherence light source and laser length measurement light source, adjust the adjustable focus in optical path Optical fiber amasthenic lens, makes the stiffness of coupling of each surface reflection in determinand as big as possible;
3. the Motor drive mobile platform in described delaying sweep light path is controlled at the uniform velocity to drive removable scanning reflection mirror Move, the interference signal recording is inputted computer by the first photodetector and the second photodetector respectively;
4. computer carries out data processing, draws the optical interval of determinand:
Carry out the extraction of interference signal using the five step phase shift nonlinear algorithms interfered based on phase shift, calculate each as the following formula The tangent value of the phase place of sampled point,
Wherein I1、I2、I3、I4、I5It is respectively the light intensity value of five neighbouring sample points,
Using edlen formula, the refractive index of air and group index are modified:
, n 15 - 1 = [ 8342.13 + 2406030 ( 130 - σ 2 ) - 1 + 15997 ( 38.9 - σ 2 ) - 1 ] × 10 - 8 n t , p - 1 = p ( n 15 - 1 ) 720.775 × 1 + p ( 0.817 - 0.0133 t ) × 10 - 6 1 + 0.0036610 t n t , p , f = n t , p - f ( 5.7224 - 0.0457 σ 2 ) × 10 - 8 ;
Comparison using optical path and optics group delay in delaying sweep light path draws the optical interval in determinand Dmea,
In formula, nairWith ng,airRepresent refractive index and the group index of air respectively, they are by wavelength (λ1Or λ2), gas Warm (the temperature T in delaying sweep light pathrefOr the temperature T in optical pathmea), air pressure p and relative humidity RH determined, The computing formula of its refractive index is edlen formula:
n15- 1=[8342.13+2406030 (130- σ2)-1+15997(38.9-σ2)-1]×10-8
n t , p - 1 = p ( n 15 - 1 ) 720.775 × 1 + p ( 0.817 - 0.0133 t ) × 10 - 6 1 + 0.0036610 t
nt,p,f=nt,p-f(5.7224-0.0457σ2)×10-8
In formula:(n15- 1) be in the air at a normal atmosphere, 15 DEG C refractive index, σ be vacuum in wave number, be The inverse of wavelength X, unit be μm-1, (nt,p- 1) it is the refractive index being subject to temperature and effects of air pressure in normal air, nt,p,fFor mark The refractive index that quasi- in the air is affected by temperature, air pressure and water vapor partial pressure, t is temperature DEG C, and p is air pressure Torr, and f divides for steam Pressure Torr, by nt,p,fRefractive index n can be obtainedairAnd its dispersion relation of wavelength, using the formula of group indexCorresponding group index n can be drawng,air.
Compared with formerly technology, the present invention has following technological merit:
1) the high-precision optical interval measurement apparatus and method based on optical fiber Michelson interference principle proposed by the present invention Belong to non-contact measurement, contact can be efficiently solved and indirect type measures the shortcoming that optical interval is brought, measure model Enclose big, measurement efficiency is high, can disposably complete the measurement at multigroup interval in one group of optical system.
2) present invention, using double fiber coupler structures, makes the light path of generation interference signal two light beam be located at same in device Under environment, eliminate reference path and optical path in single fiber coupler structure and be located at the environment in device and outside device respectively Influence factor.
3) present invention adopts optical interval measurement signal and the version of the common light path of laser length measurement signal, eliminates removable It is achieved that the accurate measurement of its shift length, interval measurement precision can reach sub-micro for the errors in position measurement of dynamic scanning reflection mirror Meter level.
Brief description
Fig. 1 is the high-precision optical interval measurement device total figure based on optical fiber Michelson interference principle of the present invention.
In figure:
1 is short-coherence light source;
2 is laser length measurement light source;
3 is illumination instruction light source;
4 is the first fiber coupler;
5 is the second fiber coupler;
6 is optical path;
601 is four-dimensional adjustment frame;
602 is adjustable focus optical fiber amasthenic lens;
603 is determinand;
604 is installing rack;
7 is reference mirror light path;
701 is optical fiber retroeflector;
8 is delaying sweep light path;
801 is fiber optic collimator camera lens;
802 is removable scanning reflection mirror;
803 is Motor drive mobile platform;
9 is wavelength division multiplexer;
10 is the first photodetector;
11 is the second photodetector;
12 is to connect optical fiber;
13 is environmental sensor.
Specific embodiment
With reference to the accompanying drawings and detailed description the present invention is described in further detail, but this should not be limited with this Bright protection domain.
As shown in figure 1, the high-precision optical interval measurement device of the present invention mainly comprises the following steps:Short coherent light Source 1, laser length measurement light source 2, illumination instruction light source 3, the first fiber coupler 4, the second fiber coupler 5, optical path 6, Reference mirror light path 7, delaying sweep light path 8, wavelength division multiplexer 9, the first photodetector 10, the second photodetector 11, connection Optical fiber 12, environmental sensor 13.
Short-coherence light source 1 and the second fiber coupler 5 are connected to two ends of the side of the first fiber coupler 4 Mouth, laser length measurement light source 2 and optical path 6 are connected to two ports of the opposite side of the first fiber coupler 4, and illumination refers to Show and be connected with optical path 6 with light source 3;Reference mirror light path 7 and delaying sweep light path 8 are connected to the second fiber coupler 5 Opposite side two ports, wavelength division multiplexer 9 is connected with a port of the side of the second fiber coupler 5, the first photoelectricity Detector and the second photodetector 10,11 are connected with two output ports of wavelength division multiplexer 9 respectively.
Described short-coherence light source 1 is super-radiance light emitting diode (SLED), minimum output power 15mW, central wavelength lambda1 =1310nm, half-peak band width Δ λ=50nm, coherence length is about 15 μm.
Described laser length measurement light source 2 is distributed feedback laser, central wavelength lambda2=1550nm, -3dB live width is 2MHz, output is up to 30mW.
Described illumination instruction light source 3 is laser diode, central wavelength lambda=655nm, half-peak band width δ λ= 30nm, output is 0.676mW.
The measuring beam that short-coherence light source 1 sends is coupled to and is connected with optical path 6 by the first described fiber coupler 4 Connection optical fiber 12 in, and make the reflected beams on each surface in determinand 603 be coupled to the company being connected with the second fiber coupler 5 Connect in optical fiber 12;The laser length measurement light beam coupling that laser length measurement light source 2 sends can be connected to the second fiber coupler 5 simultaneously Connection optical fiber 12 in.
The second described fiber coupler 5 is respectively by the measuring beam reflecting through 603 kinds of each surfaces of determinand and laser Survey long light beam, be beamed into two-beam respectively and respectively enter reference mirror light path 7 and delaying sweep light path 8, simultaneously also by reference mirror light The light beam coupling that road 7 reflects with delaying sweep light path 8 is in the connection optical fiber 12 being connected with wavelength division multiplexer 9.
Described optical path 6 includes four-dimensional adjustment frame 601, adjustable focus optical fiber amasthenic lens 602, determinand 603 and peace Shelve 604.Optical path 6 is connected with the first fiber coupler 4 by adjustable focus optical fiber amasthenic lens 602, short-coherence light source 1 The measuring beam going out enters the adjustable focus optical fiber amasthenic lens 602 in optical path 6 through the first fiber coupler 4, through treating Survey each surface in thing 603 to be reflected, after returning to the first fiber coupler 4, enter the second fiber coupler 5.Installing rack 604 is used In the position adjusting and fixing determinand 603, four-dimensional adjustment frame 601 is fixed to adjustable focus optical fiber amasthenic lens 602 and goes forward side by side Row points to and position adjustments are it is ensured that the optical axis coincidence of optical axis and the determinand 603 of focusing optical fiber amasthenic lens 602.Adjustable focus light Fine amasthenic lens 602 is positioned over optical path 6 foremost, by adjusting adjustable focus optical fiber amasthenic lens 602 outgoing beam Focal position is it is ensured that the first photodetector 10 can obtain a very strong interference signal.
Described reference mirror light path 7 includes an optical fiber retroeflector 701, by connecting optical fiber 12 and the second optical fiber coupling Clutch 5 is connected, and the reflected beams on each surface in determinand 603 in optical path 6 are reflected.Optical fiber retroeflector 701 Position should be located at the initial position of removable scanning reflection mirror 802 in corresponding delaying sweep light path 8 (from fiber optic collimator camera lens 801 nearest positions), may move the initial of scanning reflection mirror 802 in optical fiber retroeflector 701 and delaying sweep light path 8 Position is aplanatic.
Described delaying sweep light path 8 includes fiber optic collimator camera lens 801, removable scanning reflection mirror 802 and Motor drive Mobile platform 803.Fiber optic collimator camera lens 801 is positioned over delaying sweep light path 8 foremost, and delaying sweep light path 8 passes through optical fiber Collimation camera lens 801 is connected with the second fiber coupler 5, and short coherent measurement light beam and laser length measurement light beam pass through fiber optic collimator camera lens Incide on removable scanning reflection mirror 802 after 801 collimations and reflect, return in the second fiber coupler 5.Removable scanning is anti- Penetrate mirror 802 to be arranged on a Motor drive mobile platform 803, with certain speed uniform motion, its position in measurement process Mobile message is produced in the reflected beams of reference mirror light path 7 and removable scanning reflection mirror 802 respectively by laser length measurement light beam Raw interference signal measurement obtains.
Described wavelength division multiplexer 9 is 1310/1550nm wavelength division multiplexer, for by the interference signal of two kinds of different wave lengths Carry out separating, be divided into two-way, respectively enter the first photodetector 10 and the second photodetector 11.
The first described photodetector 10 and the second photodetector 11 are two photodiodes, spectral response range For 950~1650nm, receive the short coherent measurement light beam of wavelength 1310nm and the laser length measurement light beam of wavelength 1550nm respectively Produced interference signal, and it is connected display with computer.
Described connection optical fiber 12 is single-mode polarization maintaining fiber, and cutoff wavelength is 1260nm.
Described environmental sensor 13 separately detects temperature under the present circumstances, air pressure, relative humidity and postpones to sweep Retouch the inside temperature in light path 8, be applied to the compensation of refractive index value of calculation in algorithm it is ensured that the precision of interval measurement.
The short coherent measurement light beam that in device, short-coherence light source 1 sends enters into measurement light through the first fiber coupler 4 In road 6, the reflected light on each two surfaces in determinand 603, it is divided into two bundles through the second fiber coupler 5, light beam enters Reference mirror light path 7, another light beam enters in delaying sweep light path 8.In delaying sweep light path 8, light beam is through fiber optic collimator mirror Reflected by removable scanning reflection mirror 802 after 801.Each the reflected beams return in the second fiber coupler 5, enter wavelength-division Multiplexer 9.Now, the reflected beams of removable scanning reflection mirror 802 and optical fiber retroeflector 701 in reference mirror light path 7 The reflected beams interfere generation interference signal, through algorithm process after being detected by the first photodetector 10, obtain interfering letter Number intensity distributions.Meanwhile, the laser length measurement light beam that laser length measurement light source 2 sends, respectively through the first fiber coupler and It is divided into two bundles after two fiber couplers 4,5, respectively enter reference mirror light path 7 and delaying sweep light path 8, by the second photodetection Device 11 obtains interference signal produced by the reflected beams in two light paths, because it produces interference signal with short coherent measurement light beam Sample frequency identical, you can produce the removable scanning corresponding to interference signal extreme value place to obtain short coherent measurement light beam The relative position of reflecting mirror 802.Removable scanning reflection mirror 802 corresponding to maximum position occurs respectively by interference signal The difference of the position in delaying sweep light path 8, you can to calculate the optical interval of determinand 603.
During systematic survey, the high-precision optical interval measurement device of the present invention and measuring method, including following step Suddenly:
1. illumination instruction light source 3 is passed through connection optical fiber 12 and connect the adjustable focus optical fiber focus lamp to optical path 6 602, light source is opened, determinand 603 is fixed by installing rack 604, adjust adjustable focus light by adjusting four-dimensional adjustment frame 601 The position of fine amasthenic lens 602, the luminous point being reflected according to surface each in determinand 603, adjust adjustable focus optical fiber focus lamp 602 outgoing beam to determinand 603 center, i.e. the optical axis of determinand 603 and adjustable focus optical fiber amasthenic lens 602 The optical axis coincidence of outgoing measuring beam;
2. close illumination instruction light source 3, the connection optical fiber 12 connecting the first fiber coupler 4 the 4. port is replaced photograph The bright instruction connection optical fiber 12 of light source 3 and adjustable focus optical fiber amasthenic lens 602 in optical path 6, opens short-coherence light source 1 He Laser length measurement light source 2, adjusts the adjustable focus optical fiber amasthenic lens 602 of optical path 6, makes each surface reflection in determinand 603 Stiffness of coupling as big as possible;
3. the Motor drive mobile platform 803 in delaying sweep light path 8 is controlled at the uniform velocity to drive removable scanning reflection mirror 802 Mobile, the first photodetector 10 and the second photodetector 11 receive respectively wavelength 1310nm short coherent measurement light beam and The input computer of interference signal produced by laser length measurement light beam of wavelength 1550nm;
4. described computer carries out, to interference signal, the optical interval that data processing draws determinand 603:
Whole device is actually with optical path 6 and relatively being surveyed of optics group delay in delaying sweep light path 8 Amount, optics group delay is defined as ngD, wherein ngFor group index, under setted wavelength, it is defined asD is physical distance.Removable scanning reflection mirror in systematic survey, in delaying sweep light path 8 802 carry out uniform rectilinear scanning along the direction parallel to optical axis with certain speed on electrically driven (operated) mobile platform, meanwhile, with The computer that first photodetector 10 is connected with the second photodetector 11 constantly gathers and processes acquisition in scanning process Wavelength 1310nm short coherent measurement light beam and interference signal produced by wavelength 1550nm laser length measurement light beam, using based on shifting Five step phase shift nonlinear algorithms of interference carry out the extraction of interference signal, have good precision and weight under actual noise grade Renaturation.In interference signal, the modulation degree of certain given sampled point can be defined by following formula: Wherein I1、I2、I3、I4、I5It is respectively the light intensity value of five neighbouring sample points, the phase place of each sampled point can be calculated by following formula Value,
Make the phase-shift phase in phase shift algorithmWherein v is removable scanning reflection in delaying sweep light path 8 The translational speed of mirror 802, fsFor system sampling frequency, it is also the sample frequency of laser length measurement beam interference signal simultaneously, v can be obtained =30mm s-1, fs=180kHz.Then, when scanning reflection mirror 802 removable in delaying sweep light path 8 moves to a certain position Put so as to when in the reflected beams and reference mirror light path 7, the reflected beams group delay difference of optical fiber retroeflector 701 is zero, interfere Signal is peak value;Make its reflected beams and optical fiber retroreflection in reference mirror light path 7 when removable scanning reflection mirror 802 moves to The reflected beams group delay difference of device 701 is ngDuring the position of D, an interference peak signal (wherein n will be obtained againgFor determinand In 603 between each surface medium group index, D is the optical interval in determinand 603 between two surfaces).If determinand 603 include multigroup optical interval, then multiple peak values will occur, respectively in the first photodetector 10 during single pass The position of removable scanning reflection mirror 802, as determinand in optical path 6 in delaying sweep light path 8 corresponding to individual peak value Each optical mirror plane vertex position in 603.Hereinafter it is further described:Removable scanning reflection mirror 802 relative Position ZrefCan be defined by below equation:WhereinFor in the second photodetector 11 to wavelength X2= The laser length measurement beam interference signal measurement of 1550nm the phase value being obtained by algorithm process.Wavelength X1Measurement interfere letter Number and wavelength X2Laser length measurement interference signal be with identical sample frequency fsObtain, therefore two in measurement interference signal The distance between peak value is relative distance D of removable scanning reflection mirror 802 movement in delaying sweep light path 8ref, also just corresponding The optical interval D of optical element in determinand 603 in the optical path 6mea.Can be represented with following two formula:
ng,air1,Tref,p,RH)·Dref=ng,air1,Tmea,p,RH)·Dmea(2)
In formula it is assumed that in optical path 6 medium of determinand 603 optical interval be air, otherwise this right of formula ng,airShould be replaced with the group index of this medium.
In formula, nairWith ng,airRepresent refractive index and the group index of air respectively, they are by wavelength (λ1Or λ2), gas Warm (the temperature T in delaying sweep light path 8refOr the temperature T in optical path 6mea), air pressure p and relative humidity RH determined Fixed, here it is the reason in device, environmental sensor 13 exists.The computing formula of its refractive index is edlen formula:
n15- 1=[8342.13+2406030 (130- σ2)-1+15997(38.9-σ2)-1]×10-8
n t , p - 1 = p ( n 15 - 1 ) 720.775 × 1 + p ( 0.817 - 0.0133 t ) × 10 - 6 1 + 0.0036610 t
nt,p,f=nt,p-f(5.7224-0.0457σ2)×10-8
In formula:(n15- 1) be in the air at a normal atmosphere, 15 DEG C refractive index, σ be vacuum in wave number, be The inverse of wavelength X, unit be μm-1, (nt,p- 1) it is the refractive index being subject to temperature and effects of air pressure in normal air, nt,p,fFor mark The refractive index that quasi- in the air is affected by temperature, air pressure and water vapor partial pressure, t is temperature DEG C, and p is air pressure Torr, and f divides for steam Pressure Torr.By nt,p,fRefractive index n can be obtainedairAnd its dispersion relation of wavelength, using the formula of group indexCorresponding group index n can be drawng,air.
So the optical interval D determinand 603 can be drawn from formula (1), (2)meaFormula:
Optical interval D from this formula it can be seen that in determinand 603meaIt is proportional to laser instrument in laser length measurement light source 2 Wavelength X2Divided by wavelength X2Under air refraction nair2,Tref, p, RH), therefore need before measuring to this wavelength and Its time stability is calibrated.Using a heat-staple gauged distance block, (thermal coefficient of expansion is about 0.05 × 10-6K-1) come Measure calibration, if DexactFor the accurate distance of this gauged distance block, then the precision laser wavelength after calibrating isLaser wavelength lambda is assumed in this formula2It is in close proximity to (several nanometers) accurate wavelength X2,exact.

Claims (8)

1. a kind of high-precision optical interval measurement device is it is characterised in that for double fiber coupler structures, including short-coherence light source (1), laser length measurement light source (2), illumination instruction light source (3), the first fiber coupler (4), the second fiber coupler (5), survey Amount light path (6), reference mirror light path (7), delaying sweep light path (8), wavelength division multiplexer (9), the first photodetector (10), second Photodetector (11), connection optical fiber (12) and environmental sensor (13), described optical path (6) includes four-dimensional adjustment frame (601), adjustable focus optical fiber amasthenic lens (602), determinand (603) and installing rack (604), described adjustable focus optical fiber focus lamp Head (602) is placed in four-dimensional adjustment frame (601), and described determinand (603) is placed on installing rack (604), described reference mirror Light path (7) includes an optical fiber retroeflector (701), and described delaying sweep light path (8) includes fiber optic collimator camera lens (801), may move scanning reflection mirror (802) and Motor drive mobile platform (803), described removable scanning reflection mirror (802) it is placed on described Motor drive mobile platform (803), the position relationship of above-mentioned component is as follows:
1. the outfan of described short-coherence light source (1) passes through to connect optical fiber (12) and described first fiber coupler (4) the Port is connected, and the outfan of described laser length measurement light source (2) passes through to connect the of optical fiber (12) and the first fiber coupler (4) 3. port be connected, adjustable focus optical fiber amasthenic lens (602) in described optical path (6) pass through connect optical fiber (12) with described The first fiber coupler (4) the 4. port be connected, before measurement starts will first to described optical path (6) in measurement light Bundle is aligned with the optical axis of determinand (603), and now described illumination instruction is passed through to connect optical fiber (12) and institute with light source (3) Adjustable focus optical fiber amasthenic lens (602) in the optical path (6) stated are connected;
The of described the first fiber coupler (4) 2. port through connecting the of optical fiber (12) and the second fiber coupler (5) 1. Port is connected, the second fiber coupler (5) the 3. port through connecting optical fiber (12) and described optical fiber retroeflector (701) It is connected, the other end of the 4. connection optical fiber (12) of port of the second fiber coupler (5) is placed in described delaying sweep light path (8) front focus of the fiber optic collimator camera lens (801) in, the second fiber coupler (5) the 2. port through connect optical fiber (12) with The input of described wavelength division multiplexer (9) is connected, two outfans of this wavelength division multiplexer (9) respectively with the first described light Electric explorer (10) is connected with the second photodetector (11), described the first photodetector (10) and the second photodetector (11) outfan is connected with the input of computer.
2. high-precision optical interval measurement device according to claim 1 is it is characterised in that described short-coherence light source (1) For super-radiance light emitting diode, central wavelength lambdaSLED=1310nm, coherence length is 15 μm.
3. high-precision optical interval measurement device according to claim 1 is it is characterised in that described laser length measurement light source (2) it is distributed feedback laser, central wavelength lambdaLASER=1550nm, -3dB live width is 2MHz.
4. high-precision optical interval measurement device according to claim 1 is it is characterised in that described illumination instruction is used up Source (3) is laser diode, central wavelength lambda=655nm.
5. high-precision optical interval measurement device according to claim 1 is it is characterised in that described wavelength division multiplexer (9) For 1310/1550nm wavelength division multiplexer.
6. high-precision optical interval measurement device according to claim 1 is it is characterised in that described the first photodetection The spectral response range of device (10) and the second photodetector (11) is 950~1650nm, receives the short of wavelength 1310nm respectively The interference signal produced by laser length measurement light beam of coherent measurement light beam and wavelength 1550nm.
7. high-precision optical interval measurement device according to claim 1 is it is characterised in that described connection optical fiber (12) For single-mode polarization maintaining fiber, cutoff wavelength is 1260nm.
8. treat the measuring method at object test light interval using the optical interval measurement device described in claim 1, its feature exists Comprise the following steps in the method:
1. connection optical fiber (12) is passed through in illumination instruction light source (3) to connect to optical path (6), light source is opened, passes through The fixing determinand (603) of installing rack (604), adjusts adjustable focus optical fiber amasthenic lens (602) by adjusting four-dimensional adjustment frame (601) Position, the luminous point being reflected according to each surface in determinand (603), adjust the going out of adjustable focus optical fiber amasthenic lens (602) Irradiating light beam to determinand (603) center, that is, in the optical axis of determinand (603) and optical path (6) measuring beam Optical axis coincidence;
2. close illumination instruction with light source (3), will connect connection optical fiber (12) replacement of the first fiber coupler (4) the 4. port The illumination instruction connection optical fiber (12) of light source (3) and optical path (6), opens short-coherence light source (1) and laser length measurement light source (2), adjust adjustable focus optical fiber amasthenic lens (602) in optical path (6), make each surface reflection in determinand (603) Stiffness of coupling is as big as possible;
3. the Motor drive mobile platform (803) in described delaying sweep light path (8) is controlled at the uniform velocity to drive removable scanning anti- Penetrate mirror (802) mobile, the interference signal recording is inputted by the first photodetector (10) and the second photodetector (11) respectively Computer;
4. computer carries out data processing, draws the optical interval of determinand (603):
Carry out the extraction of interference signal using the five step phase shift nonlinear algorithms interfered based on phase shift, calculate each sampling as the following formula The tangent value of the phase place of point,
Wherein I1、I2、I3、I4、I5It is respectively the light intensity value of five neighbouring sample points,
Using edlen formula, the refractive index of air and group index are modified:
n15- 1=[8342.13+2406030 (130- σ2)-1+15997(38.9-σ2)-1]×10-8,
nt,p,f=nt,p-f(5.7224-0.0457σ2)×10-8
Comparison using optical path (6) and optics group delay in delaying sweep light path (8) draws the light in determinand (603) Learn interval Dmea,
In formula, DrefFor the distance between two peak values in measurement interference signal, i.e. removable scanning in delaying sweep light path (8) The relative distance of reflecting mirror (802) movement, Zref,1And Zref,2Respectively in the first photodetector (10) during single pass The relative position of removable scanning reflection mirror (802) in corresponding delaying sweep light path (8) during each peak value occurs,With For in the second photodetector (11) to wavelength X2The laser length measurement beam interference signal measurement of=1550nm simultaneously passes through at algorithm Manage the phase value obtaining, it corresponds respectively to relative position Z of removable scanning reflection mirror (802)ref,1And Zref,2, nairWith ng,airRepresent refractive index and the group index of air respectively, they are by wavelength X1Or λ2, temperature, that is, in delaying sweep light path Temperature TrefOr the temperature T in optical pathmea, air pressure p and relative humidity RH determined, the computing formula of its refractive index is Edlen formula:
n15- 1=[8342.13+2406030 (130- σ2)-1+15997(38.9-σ2)-1]×10-8
nt,p,f=nt,p-f(5.7224-0.0457σ2)×10-8
In formula:(n15- 1) be in the air at a normal atmosphere, 15 DEG C refractive index, σ be vacuum in wave number, be wavelength The inverse of λ, unit be μm-1, (nt,p- 1) it is the refractive index being subject to temperature and effects of air pressure in normal air, nt,p,fFor standard null The refractive index being affected by temperature, air pressure and water vapor partial pressure in gas, t is temperature DEG C, and p is air pressure Torr, and f is water vapor partial pressure Torr, by nt,p,fRefractive index n can be obtainedairAnd its dispersion relation of wavelength, using the formula of group indexCorresponding group index n can be drawng,air.
CN201410472652.5A 2014-09-17 2014-09-17 High accuracy optical interval measurement device and method Active CN104215176B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410472652.5A CN104215176B (en) 2014-09-17 2014-09-17 High accuracy optical interval measurement device and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410472652.5A CN104215176B (en) 2014-09-17 2014-09-17 High accuracy optical interval measurement device and method

Publications (2)

Publication Number Publication Date
CN104215176A CN104215176A (en) 2014-12-17
CN104215176B true CN104215176B (en) 2017-02-08

Family

ID=52096917

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201410472652.5A Active CN104215176B (en) 2014-09-17 2014-09-17 High accuracy optical interval measurement device and method

Country Status (1)

Country Link
CN (1) CN104215176B (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105674903B (en) * 2016-01-08 2018-04-17 中国科学院上海光学精密机械研究所 The measuring device and measuring method of lens group minute surface spacing
CN105674902B (en) * 2016-01-08 2018-04-17 中国科学院上海光学精密机械研究所 Optics microscope group minute surface gap measuring apparatus and measuring method
CN105737733A (en) * 2016-02-04 2016-07-06 浙江理工大学 Air refractive index correction method in large-range absolute distance measurement
CN105806231B (en) * 2016-03-10 2018-08-17 哈尔滨工程大学 A kind of calibrator based on optical fiber white light interference principle
CN106840001B (en) * 2017-01-16 2019-02-01 中国科学院上海光学精密机械研究所 The non-contact measurement apparatus and measurement method of optical lens center thickness
CN107144235A (en) * 2017-05-03 2017-09-08 佛山科学技术学院 A kind of article surface Shape measure method and device
CN108982418B (en) * 2018-07-02 2022-04-19 北京无线电计量测试研究所 Air refractive index measuring device and method based on microcavity laser dispersion interference method
CN110081815B (en) * 2019-04-25 2021-01-05 天津大学 Low-coherence interference fringe distortion correction method based on white light LED
CN110726682A (en) * 2019-09-26 2020-01-24 山东大学 In-situ online reflection optical measurement system and method
CN113566716B (en) * 2021-08-27 2023-04-28 西安应用光学研究所 Device and method for measuring micro relative displacement of reflecting mirror component in vibration environment
CN114414540B (en) * 2021-12-09 2023-10-13 华中光电技术研究所(中国船舶重工集团公司第七一七研究所) Cold atomic group fluorescent signal coherent detection device

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1796929A (en) * 2004-12-25 2006-07-05 鸿富锦精密工业(深圳)有限公司 Optical fiber interference type device and method for measuring thickness
CN101013025A (en) * 2007-02-09 2007-08-08 北京交通大学 Optical fiber interference type on-line micro-displacement measuring system using fibre grating
CN101040778A (en) * 2007-04-24 2007-09-26 浙江大学 Spectral coverage OCT imaging method based on optical scanning delay line and the system
CN102112865A (en) * 2008-08-05 2011-06-29 原子能与替代能源委员会 Contactless method of measuring density of porous material, using refractive index of porous material obtained by optical coherence tomography
CN102435146A (en) * 2011-12-08 2012-05-02 广州标旗电子科技有限公司 Optical lens center thickness measuring system and method
CN102494623A (en) * 2011-11-11 2012-06-13 中国科学院光电技术研究所 Non-contact measuring method and device for center distance of optical surface in lens
CN103322933A (en) * 2013-07-04 2013-09-25 中国科学院长春光学精密机械与物理研究所 Non-contact type optical mirror surface interval measuring device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004251779A (en) * 2003-02-20 2004-09-09 Fuji Photo Optical Co Ltd Three-dimensional shape detector for long flexible member
US7327463B2 (en) * 2004-05-14 2008-02-05 Medrikon Corporation Low coherence interferometry utilizing magnitude
US7742174B2 (en) * 2006-07-17 2010-06-22 Bioptigen, Inc. Methods, systems and computer program products for removing undesired artifacts in fourier domain optical coherence tomography (FDOCT) systems using continuous phase modulation and related phase modulators

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1796929A (en) * 2004-12-25 2006-07-05 鸿富锦精密工业(深圳)有限公司 Optical fiber interference type device and method for measuring thickness
CN101013025A (en) * 2007-02-09 2007-08-08 北京交通大学 Optical fiber interference type on-line micro-displacement measuring system using fibre grating
CN101040778A (en) * 2007-04-24 2007-09-26 浙江大学 Spectral coverage OCT imaging method based on optical scanning delay line and the system
CN102112865A (en) * 2008-08-05 2011-06-29 原子能与替代能源委员会 Contactless method of measuring density of porous material, using refractive index of porous material obtained by optical coherence tomography
CN102494623A (en) * 2011-11-11 2012-06-13 中国科学院光电技术研究所 Non-contact measuring method and device for center distance of optical surface in lens
CN102435146A (en) * 2011-12-08 2012-05-02 广州标旗电子科技有限公司 Optical lens center thickness measuring system and method
CN103322933A (en) * 2013-07-04 2013-09-25 中国科学院长春光学精密机械与物理研究所 Non-contact type optical mirror surface interval measuring device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Highly accurate measurement of lens surface distances within optical assemblies for quality testing;Langehanenberg P, Ruprecht A, Off D, et al;《SPIE Optical Engineering+ Applications. International Society for Optics and Photonics》;20130930;第8844卷;第88440F-1-88440F-8页 *

Also Published As

Publication number Publication date
CN104215176A (en) 2014-12-17

Similar Documents

Publication Publication Date Title
CN104215176B (en) High accuracy optical interval measurement device and method
CN106840001B (en) The non-contact measurement apparatus and measurement method of optical lens center thickness
KR101390721B1 (en) Measuring method of refractive index and measuring apparatus of refractive index
CN104154869B (en) White light interference lens center thickness measuring system and method
CN108061639B (en) Large dynamic range and high precision phase difference method wavefront measuring instrument combined with adaptive optics technology
CN105737733A (en) Air refractive index correction method in large-range absolute distance measurement
CN103954589B (en) The precision measurement apparatus of a kind of optical material specific refractory power and method
CN107144537B (en) Method and system for measuring visible light Fourier transform absorption spectrum
CN110082071B (en) Device and method for measuring optical parallel difference of right-angle prism
CN103322933A (en) Non-contact type optical mirror surface interval measuring device
CN105674902A (en) Mirror surface clearance measurement device and measurement method for optical lens assembly
CN108132026B (en) Infrared and visible light dual-wavelength transmission type interference testing device in semiconductor
JPH08101020A (en) Thickness measuring device
CN103454249A (en) Method and device for detecting uniformity of optical glass based on white light interferometry
CN110736721B (en) Glass plate refractive index uniformity detection device and detection method based on diffraction grating
CN107782697B (en) Method and device for measuring refractive index of broadband confocal infrared lens element
CN114894308A (en) Spectrometer calibration method and system based on low coherence interference
US20240085269A1 (en) Acquiring apparatus, acquiring method, and optical system manufacturing method
CN105444702A (en) Object flatness optical detection system
CN105115940B (en) Optical material refractive index curve measuring method and device
JP2015010922A (en) Refractive index measurement method, refractive index measurement apparatus, and optical element manufacturing method
CN205642638U (en) Simple and easy low -cost real -time measuring device of wavelength
CN204807041U (en) Novel absolute distancer of many light sources multi -wavelength laser Interferometer
CN101000232A (en) Method for precision measuring space offset of telephotolens and eyepiece using interferometer
CN110243760B (en) Line domain frequency domain optical coherence tomography system and longitudinal coordinate calibration method thereof

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20190926

Address after: Room 601-10, 6th floor, No. 2, Jingyuan Beijie, Beijing Economic and Technological Development Zone, Daxing District, Beijing, 100176

Patentee after: Beijing Guowang Optical Technology Co., Ltd.

Address before: 800-211 201800 post office box, Shanghai, Jiading District

Patentee before: Shanghai Optical Precision Machinery Inst., Chinese Academy of Sciences

TR01 Transfer of patent right