CN104142123A - Three-degree of freedom laser measuring system applied to mechanical equipment geometric error measurement - Google Patents

Three-degree of freedom laser measuring system applied to mechanical equipment geometric error measurement Download PDF

Info

Publication number
CN104142123A
CN104142123A CN201310168047.4A CN201310168047A CN104142123A CN 104142123 A CN104142123 A CN 104142123A CN 201310168047 A CN201310168047 A CN 201310168047A CN 104142123 A CN104142123 A CN 104142123A
Authority
CN
China
Prior art keywords
prism
light
degree
group
geometric error
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201310168047.4A
Other languages
Chinese (zh)
Other versions
CN104142123B (en
Inventor
肖鹏飞
池峰
陈勇辉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Micro Electronics Equipment Co Ltd
Original Assignee
Shanghai Micro Electronics Equipment Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Micro Electronics Equipment Co Ltd filed Critical Shanghai Micro Electronics Equipment Co Ltd
Priority to CN201310168047.4A priority Critical patent/CN104142123B/en
Publication of CN104142123A publication Critical patent/CN104142123A/en
Application granted granted Critical
Publication of CN104142123B publication Critical patent/CN104142123B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

The invention belongs to the technology of laser precision measurement, and particularly relates to a three-degree of freedom laser measuring system applied to mechanical equipment geometric error measurement. The three-degree of freedom laser measuring system comprises a beam splitter set, a polarizing beam splitter set, a movable reflector set and a fixed reflector set. By means of the technical scheme based on double-frequency laser interference, three physical items including one displacement item and two rotating items can be measured at the same time, the detecting time can be greatly shortened, the detecting efficiency can be improved, traceability is high, a sensing head is a passive device, heat interference cannot be introduced, a cable is not needed to output signals, and then an error caused by heat interference is eliminated. The three-degree of freedom laser measuring system is produced for special requirements, and is moderate in cost, high in precision, very high in applicability and market value and suitable for being applied to various complex mechanical devices such as an engine, an excavator, a generator, a locomotive, a numerical control machine tool and the like.

Description

Be applied to the Three Degree Of Freedom laser measurement system that plant equipment geometric error is measured
Technical field
The invention belongs to accurate laser measurement technology, be specifically related to a kind of Three Degree Of Freedom laser measurement system that plant equipment geometric error is measured that is applied to.
Background technology
Along with the development of modern processing and high-end equipment sophisticated manufacturing, more and more higher to the requirement on machining accuracy of numerically-controlled machine.To assemble out in order producing the high precision precision machine tool that meets Production requirement, and to make lathe keep high-accuracy state.The detection of lathe geometric error amount will be become to the problem that cannot avoid.Only detect the geometric error of lathe, could confirm whether the lathe of producing meets the demands, and further improve the machining precision of lathe, or the systematic error of existing lathe is compensated.
In general, the process need of debuging lathe detects every geometric error, for debuging design accuracy.Lathe dispatches from the factory and need to detect lathe global error, to confirm overall performance.In the use procedure of lathe, need regularly detect the geometric error of lathe, to guarantee that machine finish do not drift about.According to existing precision machine tool geometric error detection means, once can only detect a margin of error, and for high-precision numerical control lathe, its margin of error at least will detect 21, therefore, each margin of error of the complete complete lathe of detection, the needed time is very tediously long, causes very considerable invisible cost.
People attempt to address this problem always, and have developed many measuring methods and technology.Sum up and comprise: traditional optical means, based on the method for diffraction of light, the method that the method for following the trail of based on laser and laser interference combine with laser alignment.Wherein, be the state-of-the-art method of applying at present based on laser interference and laser alignment.
But existing detection system bulky complex, laser interferometer cannot detect displacement and amount of spin simultaneously, if amount of spin detects by sensor PSD, can not accomplish to trace to the source, precision authority is low, and sensing head needs active device to carry out signal transmission, its warming-up effect measuring accuracy.
Summary of the invention
Technical matters to be solved by this invention is system complex, measurement data can not be traced to the source, active device heating impacts measurement result, in order to overcome above deficiency, provides a kind of Three Degree Of Freedom laser measurement system that plant equipment geometric error is measured that is applied to.
In order to solve the problems of the technologies described above, technical scheme of the present invention is: described in be applied to plant equipment geometric error measure Three Degree Of Freedom laser measurement system comprise spectroscope group, polarization spectroscope group, motion reflective mirror group and fixed counter-mirror group, incident light is equally divided into the first parallel with incident light but not coplanar beamlet by described spectroscope group, the second beamlet and the 3rd beamlet, described polarization spectroscope group is positioned in the light path of 3 beamlets, each beamlet is reference light and measures light through polarization spectroscope component, motion reflective mirror group is arranged in the light path of measuring light and is reflected back polarization spectroscope group, fixed counter-mirror group is arranged in the light path of reference light and is reflected back polarization spectroscope group, the reference light being reflected back and measurement light converge rear formation and interfere, interference signal is used for calculating described Three Degree Of Freedom.
Further, before and after comprising, described spectroscope group arranges and orthogonal front parallelogram prism and rear parallelogram prism, four sides of each parallelogram prism are followed successively by the plane of incidence vertical with incident light, with the plane of incidence angle light splitting surface that is acute angle, the reflecting surface relative with light splitting surface and the exit facet relative with the plane of incidence, the plane of incidence of rear parallelogram prism is relative with the light splitting surface of front parallelogram prism, the front triangle prism and the Vee formation prism that before and after described spectroscope group also comprises, arrange, triangular prism hypotenuse place face is transmission plane, vertical with incident light is beamlet face, the light splitting surface of the transmission plane of described front triangle prism and front parallelogram prism fits, the beamlet face of described front triangle prism and the plane of incidence of rear parallelogram prism fit, the light splitting surface of the transmission plane of Vee formation prism and rear parallelogram prism fits.
Further, the beamlet face of the exit facet of described rear parallelogram prism and the described Vee formation prism adjacent with this exit facet, all with the plane of incidence laminating of described polarization spectroscope group.
Further, the principal section of described parallelogram prism is the parallelogram of 45 ° of pair of horns, and the principal section of triangular prism is isosceles right triangle.
Further, the light splitting surface of each described parallelogram prism is provided with depolarization spectro-film, and described reflecting surface is provided with high-reflecting film, and other sides are provided with anti-reflective film.
Further, the splitting ratio of the depolarization spectro-film of described front parallelogram prism is 2:1, and the splitting ratio of the depolarization spectro-film of rear parallelogram prism is 1:1.
Further, the light splitting surface plating High Extinction Ratio polarization beam splitter of described polarization spectroscope group, all the other workplace coating anti reflection films.
Further, described motion reflective mirror group comprises 3 reverberators, 3 reverberators lay respectively in the light path of measurement light of 3 beamlets and are reflected back polarization spectroscope group, described fixed counter-mirror group structure is identical with motion reflective mirror group, lays respectively in the light path of reference light of 3 beamlets and is reflected back polarization spectroscope group.
Further, the plane of incidence coating anti reflection film of each described reverberator, reflecting surface plating depolarization reflectance coating.
Further, described reverberator is prism of corner cube reverberator.
Technical scheme provided by the invention is based on double-frequency laser interference, can measure 3 physical quantitys simultaneously, wherein 1 displacement, 2 rotation amounts, can shorten detection time greatly, improve detection efficiency, and its tractability is strong, sensing head is passive device, can not introduce heat and disturb, do not need cable output signal, and then eliminate heat and disturb the error causing.Meanwhile, it is for specific demand, and cost is moderate, and precision is high, possesses very strong application and marketable value, goes for the plant equipment of various complexity, such as engine, and excavator, generator, locomotive and numerically-controlled machine etc.
Brief description of the drawings
Fig. 1 is the structural representation of measuring system of the present invention;
Fig. 2 is the isolating construction figure of spectroscope group of the present invention;
Fig. 3 is the structural representation of motion reflective mirror group of the present invention;
Fig. 4 is light path process in measuring system test of the present invention;
Fig. 5 is the measuring method of system Three Degree Of Freedom of the present invention.
Shown in figure:
1-spectroscope group, parallelogram prism before 11-, 111,111 '-plane of incidence, 112,112 '-light splitting surface, 113-reflecting surface, 114,114 '-exit facet, parallelogram prism after 12-, 13-front triangle prism, 131,131 '-transmission plane, 132,132 '-beamlet face, 14-Vee formation prism;
2-polarization spectroscope group;
3-motion reflective mirror group, 31-the first reverberator, 32-the second reverberator, 33-the 3rd reverberator;
4-fixed counter-mirror group;
5-laser instrument, 51-incident light, 52-beamlet, 521-primary optic axis, 522-the second optical axis, 523-the 3rd optical axis, 53-reference light, 54-measures light;
6-coupling mechanism, 7-photoelectric accounter, 8-data processing and display device.
Embodiment
Below in conjunction with accompanying drawing, the present invention is described in detail:
As shown in Figure 1, the Three Degree Of Freedom laser measurement system that is applied to the measurement of plant equipment geometric error of the present invention comprises spectroscope group 1, polarization spectroscope group 2, motion reflective mirror group 3 and fixed counter-mirror group 4.
The optical path direction of incident light be X to, X upwards sets gradually spectroscope group, polarization spectroscope group and motion reflective mirror group, described fixed counter-mirror group is arranged in the Y-direction of polarization spectroscope group.
As shown in Figure 2, described in spectroscope group 1, spectroscope group comprises front parallelogram prism 11, rear parallelogram prism 12, front triangle prism 13 and Vee formation prism 14.
Front parallelogram prism 11 is identical with the structure of rear parallelogram prism 12, and former parallelogram prism 11 is example.The principal section of described front parallelogram prism 11 is the parallelogram of 45 ° of pair of horns, its four sides be followed successively by with X to the vertical plane of incidence 111, with the less light splitting surface 112 of the plane of incidence 111 angles, the reflecting surface 113 relative with light splitting surface 112 and the exit facet 114 relative with the plane of incidence 111.
Front triangle prism 13 is identical with the structure of Vee formation prism 14, and former triangular prism 13 is example.The principal section of described front triangle prism 13 is isosceles right triangle, hypotenuse place face is transmission plane 131, with X to vertical be beamlet face 132, the transmission plane 131 of described front triangle prism 13 fits with the light splitting surface 112 of front parallelogram prism 11, the beamlet face 132 of described front triangle prism 13 fits with the plane of incidence 111 ' of rear parallelogram prism 12, and the transmission plane 131 ' of described Vee formation prism 14 fits with the light splitting surface 112 ' of rear parallelogram prism 52.
Described front parallelogram prism 11 is mutually vertical with rear parallelogram prism 12, and the rear plane of incidence 111 ' of parallelogram prism is relative with the light splitting surface 112 of front parallelogram prism.
Described light splitting surface 112 and transmission plane 131 apply the depolarization spectro-film that splitting ratio is 2:1, wherein 2/3 light intensity transmission, 1/3 light intensity reflection, light splitting surface 112 ' and transmission plane 131 ' apply the depolarization spectro-film that splitting ratio is 1:1, half-transmitting and half-reflecting, described reflecting surface 113 applies HR high-reflecting film, and other sides of prism apply AR anti-reflective film.
As shown in Figure 1, the beamlet face 132 ' of the exit facet 114 ' relative with the plane of incidence 111 ' and the described Vee formation prism 14 adjacent with this face in described rear parallelogram prism 12, all fit with the plane of incidence of described polarization spectroscope group 2, described polarization spectroscope group 2 is PBS prism, formed by two triangular prisms, plating High Extinction Ratio polarization beam splitter in the middle of two triangular prisms, all the other workplace plating AR anti-reflective films.
The modular construction that described motion reflective mirror group 3 adopts with fixed counter-mirror group 4 is identical with number of components, taking motion reflective mirror group 3 as example, as shown in Figure 3, it comprise 3 right-angle prism reverberators be respectively the first reverberator 31, with the first reverberator 31 the second reverberator 32 arranged side by side with overlay the first reverberator 31 the 3rd reverberator 33 above, the plane of incidence plating AR anti-reflective film of each reverberator, reflecting surface plating depolarization reflectance coating.
Described fixed counter-mirror group 4 also comprises three reverberators, in like manner, and the plane of incidence plating AR anti-reflective film of each reverberator, reflecting surface plating depolarization reflectance coating.
As shown in Figure 4, in test, light path process is followed successively by: laser instrument 5 is launched X to cross polarization double-frequency laser Shu Zuowei incident light 51, incident light 51 is equally divided into three cross polarization double frequency beamlets 52 parallel with incident light 51 through spectroscope group 1, be specially premenstrual parallelogram prism 11 and front triangle prism 13, it is 2:1 two-beam that incident light 51 is divided into beam intensity ratio.The first son bundle light 521 of 1/3 light intensity enters polarization spectroscope group 2, the light beam of 2/3 light intensity enters rear parallelogram prism 12 and Vee formation prism 14, the light beam of 2/3 light intensity is further divided into two beamlets that beam intensity ratio is 1:1, i.e. the second beamlet 522 and the 3rd beamlet 523.Described each beamlet 52 is divided into reference light 53 and measures light 54 through polarization spectroscope group 2, fixed counter-mirror group 4 receives reference light 53 and is reflected back polarization spectroscope group 2, motion reflective mirror group 2 receives to be measured light 54 and is reflected back polarization spectroscope group 2, the reflected light of the reflected light of reference light 53 and measurement light 54 is incorporated to an optical interference circuit, form interference fringe through coupling mechanism 6, photoelectric accounter 7 is counted respectively the movement of three groups of interference fringes, then provides X to displacement, Ry amount of spin and Rz amount of spin through data processing and display device 8.
Concrete data processing method is as follows:
As shown in Figure 5, three equivalent measurement point a, b and the c of system of the present invention on testee, the X that the interference fringe that the first beamlet 521 forms and a are ordered is to displacement X acorresponding, the X that the interference fringe that the second beamlet 522 forms and b are ordered is to displacement X bcorresponding, the X that the interference fringe that the 3rd beamlet 523 forms and c are ordered is to displacement X ccorresponding, the centre distance between the first beamlet 521 and the second beamlet 522 is Ly, and the centre distance between the first beamlet 521 and the 3rd beamlet 523 is Lz.In order better to eliminate the impact of environmental error and vibration, X is to displacement d, and Ry amount of spin α and Rz amount of spin β are respectively:
d=(X a+X b+X c)/3
α=arcsin((X b-X a)/Ly)
β=arcsin((X c-X a)/Lz)。
It is pointed out that and also can adopt X a, X band X cin some values as X to displacement.

Claims (10)

1. one kind is applied to the Three Degree Of Freedom laser measurement system that plant equipment geometric error is measured, it is characterized in that, comprise spectroscope group, polarization spectroscope group, motion reflective mirror group and fixed counter-mirror group, incident light is equally divided into the first parallel with incident light but not coplanar beamlet by described spectroscope group, the second beamlet and the 3rd beamlet, described polarization spectroscope group is positioned in the light path of 3 beamlets, each beamlet is reference light and measures light through polarization spectroscope component, motion reflective mirror group is arranged in the light path of measuring light and is reflected back polarization spectroscope group, fixed counter-mirror group is arranged in the light path of reference light and is reflected back polarization spectroscope group, the reference light being reflected back and measurement light converge rear formation and interfere, interference signal is used for calculating described Three Degree Of Freedom.
According to claim 1 a kind of be applied to plant equipment geometric error measure Three Degree Of Freedom laser measurement system, it is characterized in that, before and after comprising, described spectroscope group arranges and orthogonal front parallelogram prism and rear parallelogram prism, four sides of each parallelogram prism are followed successively by the plane of incidence vertical with incident light, with the plane of incidence angle light splitting surface that is acute angle, the reflecting surface relative with light splitting surface and the exit facet relative with the plane of incidence, the plane of incidence of rear parallelogram prism is relative with the light splitting surface of front parallelogram prism, the front triangle prism and the Vee formation prism that before and after described spectroscope group also comprises, arrange, triangular prism hypotenuse place face is transmission plane, vertical with incident light is beamlet face, the light splitting surface of the transmission plane of described front triangle prism and front parallelogram prism fits, the beamlet face of described front triangle prism and the plane of incidence of rear parallelogram prism fit, the light splitting surface of the transmission plane of Vee formation prism and rear parallelogram prism fits.
According to claim 2 a kind of be applied to plant equipment geometric error measure Three Degree Of Freedom laser measurement system, it is characterized in that, the beamlet face of the exit facet of described rear parallelogram prism and the described Vee formation prism adjacent with this exit facet, all with the plane of incidence laminating of described polarization spectroscope group.
According to claim 2 a kind of be applied to plant equipment geometric error measure Three Degree Of Freedom laser measurement system, it is characterized in that, the principal section of described parallelogram prism is the parallelogram of 45 ° of pair of horns, and the principal section of triangular prism is isosceles right triangle.
According to claim 2 a kind of be applied to plant equipment geometric error measure Three Degree Of Freedom laser measurement system, it is characterized in that, the light splitting surface of each described parallelogram prism is provided with depolarization spectro-film, and described reflecting surface is provided with high-reflecting film, and other sides are provided with anti-reflective film.
According to claim 5 a kind of be applied to plant equipment geometric error measure Three Degree Of Freedom laser measurement system, it is characterized in that, the splitting ratio of the depolarization spectro-film of described front parallelogram prism is 2:1, and the splitting ratio of the depolarization spectro-film of rear parallelogram prism is 1:1.
7. be a kind ofly according to claim 1 applied to the Three Degree Of Freedom laser measurement system that plant equipment geometric error is measured, it is characterized in that the light splitting surface of described polarization spectroscope group plating High Extinction Ratio polarization beam splitter, all the other workplace coating anti reflection films.
According to claim 1 a kind of be applied to plant equipment geometric error measure Three Degree Of Freedom laser measurement system, it is characterized in that, described motion reflective mirror group comprises 3 reverberators, 3 reverberators lay respectively in the light path of measurement light of 3 beamlets and are reflected back polarization spectroscope group, described fixed counter-mirror group structure is identical with motion reflective mirror group, lays respectively in the light path of reference light of 3 beamlets and is reflected back polarization spectroscope group.
9. be a kind ofly according to claim 8 applied to the Three Degree Of Freedom laser measurement system that plant equipment geometric error is measured, it is characterized in that the plane of incidence coating anti reflection film of each described reverberator, reflecting surface plating depolarization reflectance coating.
According to claim 8 a kind of be applied to plant equipment geometric error measure Three Degree Of Freedom laser measurement system, it is characterized in that, described reverberator is prism of corner cube reverberator.
CN201310168047.4A 2013-05-08 2013-05-08 It is applied to the Three Degree Of Freedom laser measurement system of plant equipment geometric error measurement Active CN104142123B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310168047.4A CN104142123B (en) 2013-05-08 2013-05-08 It is applied to the Three Degree Of Freedom laser measurement system of plant equipment geometric error measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310168047.4A CN104142123B (en) 2013-05-08 2013-05-08 It is applied to the Three Degree Of Freedom laser measurement system of plant equipment geometric error measurement

Publications (2)

Publication Number Publication Date
CN104142123A true CN104142123A (en) 2014-11-12
CN104142123B CN104142123B (en) 2017-04-05

Family

ID=51851377

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310168047.4A Active CN104142123B (en) 2013-05-08 2013-05-08 It is applied to the Three Degree Of Freedom laser measurement system of plant equipment geometric error measurement

Country Status (1)

Country Link
CN (1) CN104142123B (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106979750A (en) * 2017-04-11 2017-07-25 西南交通大学 A kind of method for fast measuring and its device of lathe translation shaft geometric error
CN107121073A (en) * 2017-06-09 2017-09-01 中国科学院光电技术研究所 A kind of high-precision Three Degree Of Freedom method for real-time measurement and device based on laser interferometer
CN108180844A (en) * 2017-12-21 2018-06-19 复旦大学 A kind of multiple degrees of freedom precise displacement monitoring system based on double-frequency laser interference principle
CN109373906A (en) * 2018-09-05 2019-02-22 三英精控(天津)仪器设备有限公司 Method that is a kind of while measuring distance, flexion-extension and beat
CN111189390A (en) * 2020-01-09 2020-05-22 陕西科技大学 Machine tool geometric error measuring device based on laser interference principle
CN111551114A (en) * 2020-05-22 2020-08-18 华中科技大学 Linear guide rail six-degree-of-freedom geometric error measuring device and method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1439864A (en) * 2003-03-05 2003-09-03 北方交通大学 Laser multiple degree-of-freedom measuring system and method
US20030186136A1 (en) * 2002-02-12 2003-10-02 Hill Henry A. Separated beam multiple degree of freedom interferometer
CN101344375A (en) * 2008-07-31 2009-01-14 上海微电子装备有限公司 High resolution heterodyne laser interference system and method for improving definition
CN102288104A (en) * 2011-07-22 2011-12-21 中国科学院上海光学精密机械研究所 Six-axis four-splitting interferometer
CN102721369A (en) * 2012-06-01 2012-10-10 清华大学 Device for measuring multi-degree-of-freedom displacement of wafer stage by laser interferometer

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030186136A1 (en) * 2002-02-12 2003-10-02 Hill Henry A. Separated beam multiple degree of freedom interferometer
CN1439864A (en) * 2003-03-05 2003-09-03 北方交通大学 Laser multiple degree-of-freedom measuring system and method
CN101344375A (en) * 2008-07-31 2009-01-14 上海微电子装备有限公司 High resolution heterodyne laser interference system and method for improving definition
CN102288104A (en) * 2011-07-22 2011-12-21 中国科学院上海光学精密机械研究所 Six-axis four-splitting interferometer
CN102721369A (en) * 2012-06-01 2012-10-10 清华大学 Device for measuring multi-degree-of-freedom displacement of wafer stage by laser interferometer

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
周云飞 等: "超精密工件台多维激光测量系统研究", 《机床与液压》 *

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106979750A (en) * 2017-04-11 2017-07-25 西南交通大学 A kind of method for fast measuring and its device of lathe translation shaft geometric error
CN107121073A (en) * 2017-06-09 2017-09-01 中国科学院光电技术研究所 A kind of high-precision Three Degree Of Freedom method for real-time measurement and device based on laser interferometer
CN108180844A (en) * 2017-12-21 2018-06-19 复旦大学 A kind of multiple degrees of freedom precise displacement monitoring system based on double-frequency laser interference principle
CN109373906A (en) * 2018-09-05 2019-02-22 三英精控(天津)仪器设备有限公司 Method that is a kind of while measuring distance, flexion-extension and beat
CN109373906B (en) * 2018-09-05 2020-07-28 三英精控(天津)仪器设备有限公司 Method for simultaneously measuring distance, pitch and yaw
CN111189390A (en) * 2020-01-09 2020-05-22 陕西科技大学 Machine tool geometric error measuring device based on laser interference principle
CN111189390B (en) * 2020-01-09 2021-08-10 陕西科技大学 Machine tool geometric error measuring device based on laser interference principle
CN111551114A (en) * 2020-05-22 2020-08-18 华中科技大学 Linear guide rail six-degree-of-freedom geometric error measuring device and method
CN111551114B (en) * 2020-05-22 2021-07-27 华中科技大学 Linear guide rail six-degree-of-freedom geometric error measuring device and method

Also Published As

Publication number Publication date
CN104142123B (en) 2017-04-05

Similar Documents

Publication Publication Date Title
CN111457843B (en) Displacement measuring device, displacement measuring method and photoetching equipment
US9036154B2 (en) Four-axis four-subdividing interferometer
CN104330039B (en) A kind of large-numerical aperture optical fiber point-diffraction interference device and method for three-dimensional coordinates measurement
CN103322927B (en) A kind of Three Degree Of Freedom heterodyne grating interferometer displacement measurement system
CN104142123B (en) It is applied to the Three Degree Of Freedom laser measurement system of plant equipment geometric error measurement
CN103309177B (en) Workpiece platform system of photoetching machine
CN105823422A (en) Two-degree-of-freedom heterodyne grating interferometer displacement measurement system and method
CN109238148A (en) A kind of five degree of freedom heterodyne grating interference measuring system
CN103644848B (en) A kind of three dimensional grating displacement measurement system using double-frequency laser
CN101324421A (en) Synchronous phase-shifting Fizeau interferometer
CN108775878B (en) Grating heterodyne interference system and roll angle measuring method thereof
CN101691998A (en) Two-dimensional laser autocollimator
CN102289152A (en) optical system wave aberration detection device
US9036155B2 (en) Six-axis four-subdividing interferometer
CN103424069B (en) For the optical devices of many geometric errors measurement amount, interference system and measuring method
JP6285808B2 (en) Interferometer
CN106643507B (en) A kind of Three-coordinate measurer and method based on binary channels point-diffraction interference
US7187451B2 (en) Apparatus for measuring two-dimensional displacement
CN103759655A (en) Two-freedom homodyne grating interferometer displacement measuring system based on optical octave method
CN201251428Y (en) Synchronous phase-shifting fizeau interferometer
CN112747667B (en) Differential interferometer apparatus
CN108709505A (en) A kind of wide range interference formula grating scale and its distance measuring method
CN117367327B (en) Pentagonal prism perpendicularity detection system and method
CN112882347B (en) Grating switchable displacement measuring device, measuring method and photoetching system
CN102878923A (en) Five-axle differential interferometer

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CP01 Change in the name or title of a patent holder

Address after: 201203 Pudong New Area East Road, No. 1525, Shanghai

Patentee after: Shanghai microelectronics equipment (Group) Limited by Share Ltd

Address before: 201203 Pudong New Area East Road, No. 1525, Shanghai

Patentee before: Shanghai Micro Electronics Equipment Co., Ltd.

CP01 Change in the name or title of a patent holder