CN103996457B - 银纳米线薄膜及其制备方法、阵列基板、显示装置 - Google Patents
银纳米线薄膜及其制备方法、阵列基板、显示装置 Download PDFInfo
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- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 title claims abstract description 134
- 239000002042 Silver nanowire Substances 0.000 title claims abstract description 121
- 239000000758 substrate Substances 0.000 title claims abstract description 23
- 238000002360 preparation method Methods 0.000 title claims abstract description 13
- 239000010410 layer Substances 0.000 claims abstract description 85
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- 238000000034 method Methods 0.000 claims abstract description 18
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- 238000000059 patterning Methods 0.000 claims abstract description 6
- 238000012545 processing Methods 0.000 claims abstract description 5
- 239000000463 material Substances 0.000 claims description 18
- 229920002120 photoresistant polymer Polymers 0.000 claims description 16
- 229910052709 silver Inorganic materials 0.000 claims description 10
- 239000004332 silver Substances 0.000 claims description 10
- 238000001035 drying Methods 0.000 claims description 9
- 238000005530 etching Methods 0.000 claims description 9
- 230000009467 reduction Effects 0.000 claims description 8
- 229920001296 polysiloxane Polymers 0.000 claims description 6
- 239000002904 solvent Substances 0.000 claims description 5
- 239000007788 liquid Substances 0.000 claims description 4
- 230000001590 oxidative effect Effects 0.000 claims description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 3
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 230000008859 change Effects 0.000 claims description 3
- 239000007789 gas Substances 0.000 claims description 3
- 239000001301 oxygen Substances 0.000 claims description 3
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- 238000007254 oxidation reaction Methods 0.000 abstract description 9
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- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000002105 nanoparticle Substances 0.000 description 3
- 235000009566 rice Nutrition 0.000 description 3
- 229910001923 silver oxide Inorganic materials 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000002086 nanomaterial Substances 0.000 description 2
- 239000002070 nanowire Substances 0.000 description 2
- SQGYOTSLMSWVJD-UHFFFAOYSA-N silver(1+) nitrate Chemical compound [Ag+].[O-]N(=O)=O SQGYOTSLMSWVJD-UHFFFAOYSA-N 0.000 description 2
- 229910000108 silver(I,III) oxide Inorganic materials 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 239000000908 ammonium hydroxide Substances 0.000 description 1
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- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- MRNHPUHPBOKKQT-UHFFFAOYSA-N indium;tin;hydrate Chemical group O.[In].[Sn] MRNHPUHPBOKKQT-UHFFFAOYSA-N 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
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- NNFCIKHAZHQZJG-UHFFFAOYSA-N potassium cyanide Chemical compound [K+].N#[C-] NNFCIKHAZHQZJG-UHFFFAOYSA-N 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910001961 silver nitrate Inorganic materials 0.000 description 1
- AKHNMLFCWUSKQB-UHFFFAOYSA-L sodium thiosulfate Chemical compound [Na+].[Na+].[O-]S([O-])(=O)=S AKHNMLFCWUSKQB-UHFFFAOYSA-L 0.000 description 1
- 235000019345 sodium thiosulphate Nutrition 0.000 description 1
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- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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Abstract
本发明公开了一种银纳米线薄膜及其制备方法、阵列基板、显示装置;银纳米线薄膜包括形成在基板上的银纳米线层和形成在所述银纳米线层上的保护层;银纳米线薄膜的制备方法包括以下步骤:在基板上形成银纳米线层;在所述银纳米线层上方形成保护层;通过一次构图工艺,形成银纳米线图案,所述银纳米线图案的上方有保护层覆盖。本发明通过在银纳米线薄膜的成膜工艺中添加银纳米线抗氧化处理工艺,可以减少由于银纳米线层放置时间过长引起的膜层氧化问题,同时可以增加银纳米线层的导电能力,提升产品性能和寿命。
Description
技术领域
本发明涉及显示技术领域,特别是涉及一种银纳米线薄膜及其制备方法、阵列基板、显示装置。
背景技术
透明导电薄膜被广泛应用于平板显示器,太阳能电池、光发射器件、光通信设备、固态照明等光电领域。近年来在柔性衬底上制备透明导电薄膜具有可折叠、重量轻、不易碎、便于运输、易于大面积生产及设备投资少等优点,可广泛应用于光电领域,成为近年来透明导电薄膜研究的新方向。目前工业广泛应用的透明导电薄膜是氧化铟锡(ITO),因其金属资源含量不丰富且铟有毒,ITO电极易碎、化学性质不稳定,不耐酸碱、红外光透过率低、价格昂贵,尤其是在新兴柔性电子器件中的大面积应用受到限制。
于是,对应的ITO透明导电薄膜的替代材料也在不断的开发中,其中比较有前途的是银纳米线材料,银纳米线是一种直径30nm左右、长度为几十微米左右的纳米材料。相对于ITO来说,银纳米线材料具有杰出的导电性能和纳米结构特性,同时具有柔性特性和较优的价格优势。但是限制银纳米线层的一个主要问题是银纳米线的氧化问题,银纳米线层的氧化严重影响了产品的性能和寿命。
氧化银化学式Ag2O,分子量231.74,褐色或灰黑色固体,密度7.143g/cm,300℃时迅速分解生成银和氧气,略溶于水,极易溶于硝酸、氨水、硫代硫酸钠及氰化钾溶液,其氨溶液用完要及时处理,久置会析出强烈爆炸性的黑色晶体--氮化银或亚氨化银,用作氧化剂,玻璃着色剂,由硝酸银溶液跟氢氧化钠溶液反应制得。
在实际的工艺当中,经常应用到高温工艺,比如生产触摸传感器产品时,在透明导电电极上需要沉积氮化硅,此时对应的沉积温度在300度左右,对应的Ag2O很容易分解,并且分解后对应的O2会对上层膜层造成严重损害,比如破损、气泡等不良,造成上下金属层的短路等影响。
发明内容
(一)要解决的技术问题
本发明要解决的技术问题是如何克服银纳米线薄膜形成透明导电薄膜时易氧化的问题。
(二)技术方案
为了解决上述技术问题,本发明提供一种银纳米线薄膜的制备方法,其包括以下步骤:
在基板上形成银纳米线层;
在所述银纳米线层上方形成保护层;
对形成有保护层的银纳米线层进行还原处理;
通过一次构图工艺,形成银纳米线图案,所述银纳米线图案的上方有保护层覆盖。
优选地,对形成有保护层的所述银纳米线层进行还原处理具体为:
在300℃~350℃的温度下烘干所述保护层,所述保护层的材料由耐高温材料形成。
优选地,在所述银纳米线层上方形成保护层的步骤前还包括对所述银纳米线层进行预还原处理,具体为:
在非氧化气体环境中,在300℃~350℃的温度下烘干所述银纳米线层。
优选地,通过一次构图工艺,形成银纳米线图案的具体过程为:
在所述银纳米线层上均匀涂敷一层光刻胶;
利用掩膜版进行曝光、显影,在光刻胶上形成图案;
进行后烘处理,增加光刻胶和银纳米线层的黏附性;
对有光刻胶图形的银纳米线层进行刻蚀,采用湿法刻蚀对银纳米线层进行刻蚀,将没有光刻胶保护的区域用刻蚀液腐蚀掉;
用剥离液对光刻胶剥离。
优选地,所述保护层由硅基树脂形成。
进一步地,本发明还提供了一种银纳米线薄膜,其包括形成在基板上的银纳米线层和形成在所述银纳米线层上的保护层。
优选地,所述银纳米线层的厚度为100nm~1um;所述保护层的厚度大于500nm。
优选地,所述保护层由耐高温材料形成,所述耐高温材料能够耐受300度以上的温度。
优选地,所述保护层由硅基树脂形成。
进一步地,本发明还提供了一种阵列基板,其中,所述阵列基板中的透明导电薄膜由上述任一项所述的银纳米线薄膜形成。
进一步地,本发明还提供了一种显示装置,其包括上述所述的阵列基板。
(三)有益效果
上述技术方案具有如下优点:在银纳米线薄膜结构中,通过增加保护层,对银纳米线层起保护作用,避免其氧化;进一步地,通过在银纳米线薄膜的成膜工艺中添加银纳米线抗氧化处理工艺,减少由于银纳米线层放置时间过长引起的膜层氧化问题,同时可以增加银纳米线层的导电能力,提升产品性能和寿命。
附图说明
图1至图3是本发明实施例中银纳米线薄膜的形成流程示意图。
其中,1:衬底;2:银纳米线层;3:保护层;4:刮板。
具体实施方式
下面结合附图和实施例,对本发明的具体实施方式作进一步详细描述。以下实施例用于说明本发明,但不用来限制本发明的范围。
为了解决现有技术中银纳米线薄膜形成透明导电薄膜时易氧化的问题,本发明提供一种更加安全可靠的银纳米线薄膜,其包括形成在基板上的银纳米线层和形成在所述银纳米线层上的保护层,通过增加保护层,对银纳米线层起保护作用,避免其氧化;进一步地,通过在银纳米线薄膜的成膜工艺中添加银纳米线抗氧化处理工艺,减少由于银纳米线层放置时间过长引起的膜层氧化问题,同时可以增加银纳米线层的导电能力,提升产品性能和寿命。
实施例1
本实施例提供的银纳米线薄膜包括形成在基板上的银纳米线层和形成在所述银纳米线层上的保护层,银纳米线层能够发挥其导电薄膜的功能,保护层对银纳米线层起保护作用,避免其受氧化而影响产品的性能和寿命。
其中,所述银纳米线层的厚度为100nm~1um,对于厚度而言,由于所要求的电阻值不同,对应设计的厚度值也会不同,差异性较大,对于单根银纳米线,其直径在几十纳米到几百纳米,至少要求两层银纳米线覆盖来形成银纳米线层,所以能够使用到的银纳米线层的厚度即在100nm~1um之间。
上述保护层由耐高温材料形成,所述耐高温材料能够耐受300度以上的温度,优选硅基树脂等材料;所述保护层的厚度大于500nm,以通过保护层充分覆盖纳米银线层,对纳米银线层起到保护防氧化的作用。
本实施例银纳米线薄膜结构中,通过增加保护层,对银纳米线层起保护作用,避免其氧化,提升使用银纳米线薄膜结构的产品性能和寿命。
实施例2
基于上述实施例1所提到的银纳米线薄膜结构,为了减少银纳米线的氧化对后续工艺的影响,本实施例提出了一种银纳米线薄膜的制备方法,具体工艺流程如下,可参照图1至图3所示:
1.通过一定方式在衬底1上进行均匀涂敷银纳米线层2,涂敷方式可以是采用刮胶的方式,也可以采用旋转涂胶的方式。
银纳米线层的厚度为100nm~1um,对于厚度而言,由于所要求的电阻值不同,对应设计的厚度值也会不同,差异性较大,对于单根银纳米线,其直径在几十纳米到几百纳米,至少要求两层银纳米线覆盖来形成银纳米线层,所以能够使用到的银纳米线层的厚度即在100nm~1um之间。
2.进行烘干,由于银纳米线的油墨中有大量的溶解银纳米线的溶剂,为了得到一定硬度的银纳米线层,需要进行烘干处理,将里面的溶剂大部分挥发掉。
挥发溶剂的同时,能够将被氧化的氧化银进行预还原,烘干优选在300度以上,最佳地在300℃~350℃之间的高温环境下,在氮气等非氧化气体环境中对银纳米线层进行烘干处理,一般烘干时间是半个小时到一个小时之间,烘干温度太低的话氧化银无法还原。
3.保护层涂覆;通过一定方式在银纳米线层2表面涂覆一定厚度的保护层3;涂敷方式可以是采用刮胶的方式,如图2和图3中所示的刮板4,也可以采用旋转涂胶的方式。
所述保护层的材料由耐高温材料形成,所述耐高温材料能够耐受300度以上的温度,优选硅基树脂等材料,以能够承受烘干温度,
4.烘干:固定一定的温度,将保护层固化;
优选在300℃~350℃的温度下对所述保护层进行烘干,烘干的同时对银纳米线层进行还原处理。
5.涂敷光刻胶,在银纳米线层上均匀涂敷一定厚度的光刻胶;通过具有一定图案的掩模版进行曝光,显影,在光刻胶上形成一定的图案;进行后烘处理,增加光刻胶和银纳米层的黏附性;对有光刻胶图形的银纳米层进行刻蚀,通常采用湿法刻蚀的办法对银纳米线层进行刻蚀,将没有光刻胶保护的地方用刻蚀液给腐蚀掉;最后用剥离液对光刻胶剥离。
至此完成整个银纳米线层的构图工艺。
上述实施例中,还可以对银纳米线层用低温烘干,然后涂上保护层,用300度以上高温烘干保护层及实现对银纳米线层的还原处理,同样也可以实现烘干和降低电阻两个功效。
基于上述实施例1和实施例2,本发明还公开了一种阵列基板,所述阵列基板中的透明导电薄膜由上述所述的银纳米线薄膜形成;本发明还公开了一种显示装置,其包括上述所述的阵列基板,该显示装置可以为:液晶面板、电子纸、液晶电视、液晶显示器、数码相框、手机、平板电脑等具有任何显示功能的产品或部件。
由以上实施例可以看出,在银纳米线薄膜结构中,通过增加保护层,对银纳米线层起保护作用,避免其氧化;进一步地,通过在银纳米线薄膜的成膜工艺中添加银纳米线抗氧化处理工艺,减少由于银纳米线层放置时间过长引起的膜层氧化问题,同时可以增加银纳米线层的导电能力,提升产品性能和寿命。
以上所述仅是本发明的优选实施方式,应当指出,对于本技术领域的普通技术人员来说,在不脱离本发明技术原理的前提下,还可以做出若干改进和替换,这些改进和替换也应视为本发明的保护范围。
Claims (10)
1.一种银纳米线薄膜的制备方法,其特征在于,包括以下步骤:
在基板上形成银纳米线层;
在非氧化气体环境中,在300℃~350℃的温度下,对所述银纳米线层进行烘干处理,将里面的溶剂大部分挥发掉,以得到一定硬度的银纳米线层;挥发溶剂的同时将被氧化的氧化银进行预还原处理;烘干时间是半个小时到一个小时之间;
在所述银纳米线层上方形成保护层,形成保护层覆盖纳米银线层的二层结构;
对形成有保护层的银纳米线层进行还原处理;
通过一次构图工艺,形成银纳米线图案,所述银纳米线图案的上方有保护层覆盖。
2.如权利要求1所述的银纳米线薄膜的制备方法,其特征在于,对形成有保护层的所述银纳米线层进行还原处理具体为:
在300℃~350℃的温度下烘干所述保护层,所述保护层的材料由耐高温材料形成。
3.如权利要求1所述的银纳米线薄膜的制备方法,其特征在于,通过一次构图工艺,形成银纳米线图案的具体过程为:
在所述银纳米线层上均匀涂敷一层光刻胶;
利用掩膜版进行曝光、显影,在光刻胶上形成图案;
进行后烘处理,增加光刻胶和银纳米线层的黏附性;
对有光刻胶图形的银纳米线层进行刻蚀,采用湿法刻蚀对银纳米线层进行刻蚀,将没有光刻胶保护的区域用刻蚀液腐蚀掉;
用剥离液对光刻胶剥离。
4.如权利要求2所述的银纳米线薄膜的制备方法,其特征在于,所述保护层由硅基树脂形成。
5.一种采用如权利要求1~4任一所述银纳米线薄膜的制备方法制备的银纳米线薄膜,其特征在于,包括形成在基板上的银纳米线层和形成在所述银纳米线层上的保护层。
6.如权利要求5所述的银纳米线薄膜,其特征在于,所述银纳米线层的厚度为100nm~1um;所述保护层的厚度大于500nm。
7.如权利要求5所述的银纳米线薄膜,其特征在于,所述保护层由耐高温材料形成,所述耐高温材料能够耐受300度以上的温度。
8.如权利要求5所述的银纳米线薄膜,其特征在于,所述保护层由硅基树脂形成。
9.一种阵列基板,其特征在于,所述阵列基板中的透明导电薄膜由上述权利要求5~8中任一项所述的银纳米线薄膜形成。
10.一种显示装置,其特征在于,包括权利要求9所述的阵列基板。
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