CN103988279A - 质谱仪真空接口方法以及设备 - Google Patents
质谱仪真空接口方法以及设备 Download PDFInfo
- Publication number
- CN103988279A CN103988279A CN201280061127.3A CN201280061127A CN103988279A CN 103988279 A CN103988279 A CN 103988279A CN 201280061127 A CN201280061127 A CN 201280061127A CN 103988279 A CN103988279 A CN 103988279A
- Authority
- CN
- China
- Prior art keywords
- plasma
- intercepting
- intercepting device
- getter
- mass spectrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0495—Vacuum locks; Valves
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/067—Ion lenses, apertures, skimmers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1121291.7 | 2011-12-12 | ||
| GB1121291.7A GB2498174B (en) | 2011-12-12 | 2011-12-12 | Mass spectrometer vacuum interface method and apparatus |
| PCT/EP2012/075302 WO2013087732A1 (en) | 2011-12-12 | 2012-12-12 | Mass spectrometer vacuum interface method and apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103988279A true CN103988279A (zh) | 2014-08-13 |
Family
ID=45560286
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280061127.3A Pending CN103988279A (zh) | 2011-12-12 | 2012-12-12 | 质谱仪真空接口方法以及设备 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9697999B2 (https=) |
| JP (1) | JP6030662B2 (https=) |
| CN (1) | CN103988279A (https=) |
| AU (1) | AU2012351701B2 (https=) |
| CA (1) | CA2858459C (https=) |
| DE (1) | DE112012005182B4 (https=) |
| GB (1) | GB2498174B (https=) |
| WO (1) | WO2013087732A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104637773A (zh) * | 2015-02-16 | 2015-05-20 | 江苏天瑞仪器股份有限公司 | 质谱仪一级真空结构 |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2498173C (en) * | 2011-12-12 | 2018-06-27 | Thermo Fisher Scient Bremen Gmbh | Mass spectrometer vacuum interface method and apparatus |
| WO2015040392A1 (en) * | 2013-09-20 | 2015-03-26 | Micromass Uk Limited | Ion inlet assembly |
| JP6512718B2 (ja) | 2014-05-01 | 2019-05-15 | ペルキネルマー ヘルス サイエンシーズ, インコーポレイテッド | 試料中のセレンおよびケイ素の検出および定量化のためのシステムおよび方法 |
| US10692692B2 (en) * | 2015-05-27 | 2020-06-23 | Kla-Tencor Corporation | System and method for providing a clean environment in an electron-optical system |
| JP6048552B1 (ja) * | 2015-08-21 | 2016-12-21 | 株式会社 イアス | オンライン移送した分析試料の分析システム |
| DE102015122155B4 (de) | 2015-12-17 | 2018-03-08 | Jan-Christoph Wolf | Verwendung einer Ionisierungsvorrichtung |
| EP3639289A2 (de) | 2017-06-16 | 2020-04-22 | Plasmion Gmbh | Vorrichtung und verfahren zur ionisation eines analyten sowie vorrichtung und verfahren zur analyse eines ionisierten analyten |
| EP3474311A1 (en) * | 2017-10-20 | 2019-04-24 | Tofwerk AG | Ion molecule reactor |
| KR102133334B1 (ko) * | 2020-02-25 | 2020-07-14 | 영인에이스 주식회사 | 질량분석기 |
| KR102728997B1 (ko) * | 2021-12-02 | 2024-11-13 | 영인에이스 주식회사 | 질량 분석기 |
| CN114536480B (zh) * | 2022-03-02 | 2023-05-23 | 重庆天荣日盛家居科技有限公司 | 多工位木质家居板材切割设备 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5625185A (en) * | 1994-09-22 | 1997-04-29 | Finnigan Mat Gmbh | Mass spectrometer, especially ICP-MS |
| US6703610B2 (en) * | 2002-02-01 | 2004-03-09 | Agilent Technologies, Inc. | Skimmer for mass spectrometry |
| US7009176B2 (en) * | 2004-03-08 | 2006-03-07 | Thermo Finnigan Llc | Titanium ion transfer components for use in mass spectrometry |
| US7741600B2 (en) * | 2006-11-17 | 2010-06-22 | Thermo Finnigan Llc | Apparatus and method for providing ions to a mass analyzer |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4341662A (en) | 1980-04-11 | 1982-07-27 | Pfefferle William C | Method of catalytically coating low porosity ceramic surfaces |
| JPS6420669A (en) | 1987-07-16 | 1989-01-24 | Fujitsu Ltd | Field-effect semiconductor device |
| JPH0542611Y2 (https=) * | 1987-07-29 | 1993-10-27 | ||
| JPS6445049A (en) * | 1987-08-14 | 1989-02-17 | Nippon Telegraph & Telephone | Mass spectrograph for secondary ion |
| GB9525507D0 (en) | 1995-12-14 | 1996-02-14 | Fisons Plc | Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source |
| JP3521218B2 (ja) * | 1997-07-04 | 2004-04-19 | 独立行政法人産業技術総合研究所 | 金属−絶縁性セラミック複合サンプラー及びスキマー |
| GB9820210D0 (en) * | 1998-09-16 | 1998-11-11 | Vg Elemental Limited | Means for removing unwanted ions from an ion transport system and mass spectrometer |
| JP4636800B2 (ja) * | 2002-03-08 | 2011-02-23 | ヴァリアン オーストラリア ピーティーワイ.エルティーディー. | プラズマ質量分析計 |
| JP5308641B2 (ja) * | 2007-08-09 | 2013-10-09 | アジレント・テクノロジーズ・インク | プラズマ質量分析装置 |
| US7915580B2 (en) | 2008-10-15 | 2011-03-29 | Thermo Finnigan Llc | Electro-dynamic or electro-static lens coupled to a stacked ring ion guide |
| GB0908252D0 (en) * | 2009-05-13 | 2009-06-24 | Micromass Ltd | Surface coating on sampling cone of mass spectrometer |
-
2011
- 2011-12-12 GB GB1121291.7A patent/GB2498174B/en active Active
-
2012
- 2012-12-12 CA CA2858459A patent/CA2858459C/en not_active Expired - Fee Related
- 2012-12-12 CN CN201280061127.3A patent/CN103988279A/zh active Pending
- 2012-12-12 US US14/364,639 patent/US9697999B2/en active Active
- 2012-12-12 JP JP2014546498A patent/JP6030662B2/ja not_active Expired - Fee Related
- 2012-12-12 WO PCT/EP2012/075302 patent/WO2013087732A1/en not_active Ceased
- 2012-12-12 AU AU2012351701A patent/AU2012351701B2/en not_active Ceased
- 2012-12-12 DE DE112012005182.3T patent/DE112012005182B4/de active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5625185A (en) * | 1994-09-22 | 1997-04-29 | Finnigan Mat Gmbh | Mass spectrometer, especially ICP-MS |
| US6703610B2 (en) * | 2002-02-01 | 2004-03-09 | Agilent Technologies, Inc. | Skimmer for mass spectrometry |
| US7009176B2 (en) * | 2004-03-08 | 2006-03-07 | Thermo Finnigan Llc | Titanium ion transfer components for use in mass spectrometry |
| US7741600B2 (en) * | 2006-11-17 | 2010-06-22 | Thermo Finnigan Llc | Apparatus and method for providing ions to a mass analyzer |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104637773A (zh) * | 2015-02-16 | 2015-05-20 | 江苏天瑞仪器股份有限公司 | 质谱仪一级真空结构 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP6030662B2 (ja) | 2016-11-24 |
| GB201121291D0 (en) | 2012-01-25 |
| DE112012005182T5 (de) | 2014-08-28 |
| CA2858459A1 (en) | 2013-06-20 |
| US9697999B2 (en) | 2017-07-04 |
| US20140331861A1 (en) | 2014-11-13 |
| AU2012351701A1 (en) | 2014-07-03 |
| CA2858459C (en) | 2020-03-31 |
| DE112012005182B4 (de) | 2021-01-21 |
| JP2015502023A (ja) | 2015-01-19 |
| AU2012351701B2 (en) | 2015-10-29 |
| WO2013087732A1 (en) | 2013-06-20 |
| GB2498174A (en) | 2013-07-10 |
| GB2498174B (en) | 2016-06-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103999187B (zh) | 质谱仪真空接口方法以及设备 | |
| CA2858459C (en) | Mass spectrometer vacuum interface method and apparatus | |
| CA2858989A1 (en) | Collision cell multipole | |
| JP5802566B2 (ja) | 質量分析装置 | |
| CN107799382B (zh) | 用于质谱分析的离子传输装置 | |
| WO2012176534A1 (ja) | 液体クロマトグラフ質量分析装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20140813 |
|
| RJ01 | Rejection of invention patent application after publication |