CN103969031B - Method of least square measures the method for liquid crystal corrector response matrix - Google Patents
Method of least square measures the method for liquid crystal corrector response matrix Download PDFInfo
- Publication number
- CN103969031B CN103969031B CN201410203990.9A CN201410203990A CN103969031B CN 103969031 B CN103969031 B CN 103969031B CN 201410203990 A CN201410203990 A CN 201410203990A CN 103969031 B CN103969031 B CN 103969031B
- Authority
- CN
- China
- Prior art keywords
- matrix
- wavefront
- response matrix
- liquid crystal
- square
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Eye Examination Apparatus (AREA)
Abstract
The invention belongs to adaptive optics field, be the method for method of least square measurement liquid crystal wavefront corrector response matrix.The present invention adopts the Zernike pattern corrugated that a large amount of random coefficient combines, the corrugated these calculated is applied on liquid crystal wavefront corrector one by one, the light dot matrix slope data on corresponding corrugated is measured successively by Hartman wavefront detector, constitute calculation matrix, and then utilize the calculated relationship between calculation matrix and response matrix, eliminate the error in measuring by least square matrix algorithm, draw accurate response matrix.The response matrix with method of least square statistical measurement being utilized respectively general measure has carried out the fibre bundle adaptively correcting imaging under turbulent flow interference, as shown in the figure, a () is for before correction, the imaging effect of two methods b () is corresponding with (c) difference before and after, find out that the response matrix of method of least square statistical measurement makes imaging definition improve really, show that the peak value of (c) is 3 times of (b) through radial direction average power detection.
Description
Technical field
The invention belongs to adaptive optics field, be the method for a kind of method of least square measurement liquid crystal wavefront corrector response matrix.Relate to the statistical thinking of method of least square and the matrix operations method of big data quantity, specifically a kind of method of method of least square measurement liquid crystal wavefront corrector response matrix being eliminated random error by big measurement, statistical calculation.
Background technology
The distortion of atmospheric optical wavefront can be carried out real-Time Compensation correction, recover telescopical high-resolution imaging by LCD self-adapting optic system, therefore has important application in heavy caliber ground telescope.
The ADAPTIVE OPTICS SYSTEMS generally docked with telescope is based on two correctors in thick school and essence school to complete wavefront correction, that wherein does thick school tilts the inclination before galvanometer only corrects incident light wave, and the higher order wave front-distortion after slant correction is completed correction by wave-front corrector, namely by liquid crystal wavefront corrector, correction is completed for LCD self-adapting optic system.
Response matrix have expressed the fixing quantity relation between wave-front corrector and wave front detector, is the foundation that Wavefront detecting signal is converted in adaptively correcting process wavefront correction signal.So, the certainty of measurement of response matrix directly affects the imaging effect of ADAPTIVE OPTICS SYSTEMS.This impact is particularly acute in LCD self-adapting optic system, because the consideration based on light energy utilization ratio, LCD self-adapting optic system needs adopt opened loop control [Q.Q.Mu, Z.L.Cao, D.Y.Li, L.Hu, andL.Xuan, " Open-loopcorrectionofhorizontalturbulence:systemdesignan dresult, " ApplOptics47,4297-4301 (2008) .], rather than distortion of image mirror ADAPTIVE OPTICS SYSTEMS uses closed loop control.In closed loop control, after wave front detector is placed in corrector, detection is the post fit residuals after correction, not only it will be seen that the working effect of corrector, and can progressively correct by convergence, correction accuracy each time can be loosened from detectable signal；And in opened loop control, wave front detector direct detection external interference, the working effect of corrector cannot be understood from detectable signal, strict accuracy Design can only be leaned on to hold, so the certainty of measurement of response matrix is also the important step affecting LCD self-adapting optical imaging effect.
The operation principle of Hartman wavefront detector has detailed description on [FrancoisRoddier, Adaptiveopticsinastronomy, CambridgeUniversityPress, 1999, Part2, pp99].Hartman wavefront detector is to split corrugated with microlens array, on the wavelet face after segmentation only tilt and be absent from high-order distortion, thus with the slope in this wavelet face of position measurement of wavelet face light beam focus；So corresponding overall corrugated Hartman wavefront detector then presents optical lattice, calculate each facula mass center side-play amount in x-axis and y-axis in light dot matrix, equal to the Relative slope being aware of each wavelet face, these slope datas are lined up matrix according to hot spot sequence number, the phase corrugated, overall position detected can be reconstructed according to the standard of response matrix, also referred to as wavefront, and the correction signal being scaled on wave-front corrector can be easy to.
Owing to any one phrase wave front Φ can express with the combining form on Zernike pattern corrugated:
Wherein I represents and takes front I item Zernike pattern, and does not comprise translation item, and i-th Zernike pattern is Zi, ciFor ZiCoefficient, i=1,2,3 ... I, so the response matrix of liquid crystal wavefront corrector records by applying I item Zernike pattern corrugated thereon.The order applying I item Zernike pattern corrugated to liquid crystal wavefront corrector is that the sequence number according to i is from lowest-order until high-order applies one by one, the position on pattern corrugated rises and falls mutually and represents in units of the central wavelength lambda of incident illumination, monochromatic light is actually generally adopted to measure response matrix, position fluctuating peak-to-valley value mutually for convenient data processing Zernike pattern is typically chosen as 1 λ, it may also be said to the coefficient c of Zernike patterniIt is 1；On Hartman wavefront detector, measure corresponding Z successively simultaneouslyiThe each hot spot slope data of light dot matrix, here define light dot matrix effective light spot number be J, J need more than I, hot spot ordinal number is j, j=1,2,3......J；Two slope components that the slope of each hot spot is decomposed in x-axis and y-axis represent, then response matrix M2J,IBe the slope data matrix of 2J row I row, wherein the slope data submatrix in 1～J behavior x-axis, slope data submatrix in J～2J behavior y-axis.The measuring method of custom liquid crystals wave-front corrector response matrix is referring to Chinese invention patent (ZL200910266664.1), " universal liquid crystal adaptive aberration correcting retina imaging system ".It is all tens of or hundreds of numerals due to I and J, therefore response matrix M2J,IIt it is a quite huge matrix.
Therefore the certainty of measurement of response matrix is highly susceptible to the interference of many-sided random factor, one is the liquid crystal wavefront corrector expression error to especially higher order mode corrugated, each Zernike pattern corrugated, two is the uncompensable errors of Hartman wavefront detector, three is the impact of the factors such as environmental air flowing, and the error of response matrix can make wavefront reconstruction standard drift, cause that LCD self-adapting optical imaging effect is deteriorated.The present invention is directed to this problem, it is proposed to eliminate the way of error.
Summary of the invention
It is an object of the invention to provide a kind of method that method of least square measures liquid crystal wavefront corrector response matrix, it is possible to avoid the error in measuring, it is ensured that the normal response precision on Zernike pattern corrugated, thus improving the effect of LCD self-adapting optical imagery.
Present disclosure is to adopt the Zernike pattern corrugated of a large amount of random coefficients combination, its expression formula such as (1) formula, the corrugated these calculated is applied on liquid crystal wavefront corrector one by one, the light dot matrix slope data on corresponding corrugated is measured successively by Hartman wavefront detector, constitute calculation matrix, and then utilize the calculated relationship between calculation matrix and response matrix, eliminate the error in calculation matrix by least square matrix algorithm, solve accurate response matrix.
In order to be more fully understood that the present invention, the thought of the present invention is explained in detail below.
By the corrugated of (1) formula both sides and corrugated Φ and train patterns corrugated ZiAll be converted to slope data matrix to represent, then correspondence 2J slope data of Φ, vector S arranged in columns2J, and just corresponding response matrix M on the right side of (1) formula2J,IWith Zernike mode coefficient vector CIProduct, wherein CIFor I ciThe column vector lined up；Further by S2JCorrespond to the slope data of the light dot matrix that Hartman wavefront detector is measured, wherein contain error, write as error vector N2J, N2JIt is and S2JThe column vector of same unit number, represents that then (1) formula converts to containing error in the slope data of each hot spot:
S2J-N2J=M2J,I*CI(2)
It is emphasized that the condition that (2) formula is set up: I item Zernike pattern before selecting, wherein do not include translation item, i-th Zernike pattern ZiCoefficient be ci, i=1,2,3 ... I；In Hartman wavefront detector, the effective light spot number of light dot matrix is that J, J have to be larger than 1.3I, and effective light spot ordinal number is j, j=1,2,3......J；Response matrix M2J,IIt it is the calibration slope data matrix of 2J row I row.
M2J,IIt is the response matrix that application claims takes.
In order to accurately measure M2J,I, applying K Zernike mode combinations wavefront to liquid crystal wavefront corrector, kth wavefront is expressed asMake K > 103> > I, an I Zernike mode coefficient ci,kIt is less than the random number in (-0.5,0.5) scope；K Zernike mode combinations wavefront is detected respectively, it is thus achieved that the slope data column vector S of K light dot matrix with Hartman wavefront detector2J,k, meet the relation of (2) formula, draw:
Further by K slope data column vector S2J,kIt is arranged to make up the slope matrix of 2J row K row K Zernike mode coefficient vector CI, k are arranged to make up the coefficient matrix of I row K row K error vector N2J, k are arranged to make up the error matrix of 2J row K row (3) formula can be rewritten into:
MS=M2J,I*MZ+MN(4)。
Owing to K is very big, can take advantage of according to least square matrix algorithm is same in (4) formula both sidesWherein MNMatrix is approximately 0 matrix with it after being multiplied, it is possible to eliminate, therefore becomes the accurate solution of response matrix on the right side of equationIt is expressed as:
Then by the slope matrix M of K the Zernike mode combinations wavefront recorded in Hartmann sensorSWith the mode coefficient matrix M being made up of random numberZ, it is both input into GPU picture processor and carries out matrix operations, accurate response matrix can be calculated within the time less than 1 millisecondIt is equivalent to the response matrix M that application claims takes2J,I。
I Zernike mode coefficient c of the present inventioni,kSpan need segmentation to limit with the increase of I, because liquid crystal wavefront corrector response higher order mode time error can with corrugated peak-to-valley value strengthen and strengthen rapidly, therefore when I≤35 ci,kSpan be (-0.5,0.5), the c when 35≤I≤65i,kSpan be (-0.3,0.3), the c when 65≤I≤104i,kSpan be (-0.1,0.1), the c when 104≤I≤152i,kSpan be (-0.05,0.05).
The accurate response matrix of the present inventionMeasurement and data process the initialization content being before the work of LCD self-adapting system, therefore the adaptively correcting speed of not influential system, but the interference that response matrix is measured by many factors is eliminated, the adaptively correcting precision of system can be improved, namely improve the imaging effect of LCD self-adapting system.
Accompanying drawing explanation
The LCD self-adapting that Fig. 1 is the embodiment of the present invention is corrected into as light path design schematic diagram.1 is fibre bundle point source, 2,3,4,5,6 respectively the first lens, the second lens, the 3rd lens, the 4th lens, the 5th lens, 7 is the wavelength monochromatic sheet at 780nm, 8 is 45 ° of reflecting mirrors arranged, and 9 is liquid crystal wavefront corrector, and 10 is PBS polarization beam apparatus, 11 is Hartman wavefront detector, 12 is imaging CCD, and 13 is 1/2 wave plate, and 14 is overfall simulator.
Fig. 2 is the picture of the fibre bundle point source 1 that the embodiment of the present invention obtains in LCD self-adapting system, wherein (a) is the picture of the lower fibre bundle point source 1 of " atmospheric turbulance " interference, b response matrix that () is general measure liquid crystal wavefront corrector 9, the fibre bundle point source 1 obtained through self adaptation wavefront correction picture, (c) be have employed method of least square measure the accurate response matrix of liquid crystal wavefront corrector 9, through the picture of fibre bundle point source 1 of self adaptation wavefront correction acquisition.
The radial direction average power spectra of (c) in Fig. 2 He (b) image is done ratio by Fig. 3, wherein transverse axis is the pixel space frequency of imaging CCD camera 12, curve shows that the power peak of (c) image is bordering on 3 times of (b) image power peak value, quantitatively illustrates that the definition of (c) image ratio (b) image is much higher.
Detailed description of the invention
First on laboratory optical table, build LCD self-adapting correction imaging optical path as shown in Figure 1, wherein 1 is fibre bundle point source, 2,3,4,5,6 respectively the first lens, the second lens, the 3rd lens, the 4th lens, the 5th lens, 7 is the wavelength monochromatic sheet at 780nm, 8 be 45 ° arrange reflecting mirrors, 9 is liquid crystal wavefront corrector, 10 is PBS polarization beam apparatus, and 11 is Hartman wavefront detector, and 12 is imaging CCD, 13 is 1/2 wave plate, and 14 is overfall simulator.Liquid crystal wavefront corrector 9, Hartman wavefront detector 11, imaging CCD12 have the computer of adaptively correcting imaging control software design to be connected with storage with overfall simulator 14, this computer is inserted with the Geforce9800GTXGPU picture processor of nVidia company simultaneously, and this is very general GPU picture processor.
LCD self-adapting corrects the technical parameter of each element in imaging optical path and acts on as follows:
1) fibre bundle point source 1 is the halogen light source of fiber bundle coupling, has xenon lamp spectrum, fibre bundle diameter 200 μm, core diameter 10 μm；The effect of fibre bundle point source 1 is for measuring the response matrix of liquid crystal wavefront corrector 9 offer light source, additionally also as " point target " that be imaged.
2) first lens the 2, second lens the 3, the 3rd lens the 4, the 4th lens the 5, the 5th lens 6 are double; two glued achromat, bore is 25mm, 25mm, 65mm, 25mm, 25mm respectively, and focal length is 100mm, 100mm, 270mm, 100mm, 100mm respectively.
3) wavelength X=780nm of monochromatic sheet 7, its effect is will to become monochromatic light by the light beam of liquid crystal wavefront corrector 9, it is to avoid liquid crystal wavefront corrector 9 produces dispersion interference, makes the analysis of experimental result simplify.
4) reflecting mirror 8 bore is 15mm, is positioned at the focal point of the second lens 3, and angle at 45 ° is placed with the optical axis of the second lens 3；Its effect is that the monochromatic light that wavelength is 780nm 90 ° of the axle of folding that will transmit through monochromatic sheet 7 can enter liquid crystal wavefront corrector 9.
5) liquid crystal wavefront corrector 9 is pure position phase LCOS type liquid crystal wavefront corrector, and reception window is 6.14mm × 6.14mm, number of picture elements 256 × 256, Spatial transmission degree of depth 800nm；Its effect is based on the wavefront distortion that response matrix adaptively correcting overfall simulator 14 causes.
6) PBS polarization beam apparatus 10, is of a size of 25mm × 25mm × 25mm, and the extinction ratio of its P polarization light is 1 × 10-3；Its effect is that the S-polarization luminous reflectance that can not be corrected by liquid crystal wavefront corrector 9 enters Hartman wavefront detector 11, corrected P polarization light is transmitted into imaging CCD camera 12 and imaging；Due to the wavefront of Hartman wavefront detector 11 direct detection " external world " i.e. overfall simulator 14 interference, rather than the residual error after liquid crystal wavefront corrector 9 correction, so being the self adaptive imaging system of opened loop control.
7) Hartman wavefront detector 11 has 22.5mm receiving aperture, and detectable wave band is from 350nm～1000nm, lenticule array of light spots 15*15, lenticule focal length 4.4mm, effective light spot number J=137；Its effect is the wavefront distortion of detecting turbulence simulator 14 interference.
8) imaging CCD camera 12 is the product of ANDOR company of Britain DV897 model, pixel count 512 × 512, and bore is 13mm × 13mm；Its effect is the target imaging for setting.
9) 1/2 wave plate 13, its effect is: insert the light path between the 3rd lens 4 and the 4th lens 5 when needing to measure liquid crystal wavefront corrector 9 response matrix, make the light beam polarization direction half-twist of arrival PBS polarization beam apparatus 10, then the P polarization light that liquid crystal wavefront corrector 9 is modulated is reflected by PBS polarization beam apparatus 10 and enters Hartman wavefront detector 11, forms the closed loop control light path measuring liquid crystal wavefront corrector 9 response matrix；After completing response matrix measurement, then 1/2 wave plate 13 is removed light path, recover the adaptively correcting imaging system of opened loop control.
10) overfall simulator 14 is LexitekInc. product, and its effect is that simulation produces the turbulent flow of atmospheric coherence length 10cm on 1 meter of Aperture Telescope, the imaging of interference fibre bundle point source 1.
Respond matrix to measure:
1/2 wave plate 13 is inserted the light path between the 3rd lens 4 and the 4th lens 5, make the light beam polarization direction half-twist of arrival PBS polarization beam apparatus 10, then the corrected P polarization light of liquid crystal wavefront corrector 9 is reflected by PBS polarization beam apparatus 10 and enters Hartman wavefront detector 11, forms the closed loop control light path measuring liquid crystal wavefront corrector 9 response matrix；
Make Zernike pattern count I=35, remove translation item, take front 35 Zernike pattern Zi, i=1,2,3......35；
The effective light spot number J=137 of Hartman wavefront detector 11；2J=274；
A) conventional method measures response matrix M274,35
According to i=1,2,3......35 order applies Zi before the Zernike mode wave of peak-to-valley value 1 λ successively to liquid crystal wavefront corrector, also sequential reads out x-axis and the y-axis slope data of the response light dot matrix of each Zi wavefront in Hartman wavefront detector, constitutes slope data column vector S274,i, according to the order of i successively by 35 slope vector S274,iIt is arranged to make up 274 row 35 row response matrix M274,35, it is stored in the above-mentioned computer with adaptively correcting imaging control software design and GPU picture processor.
B) method of least square statistical measurement response matrix
I) making K=10000, the random number randomly generating 35 row 10000 row in (-0.5,0.5) scope constitutes mode coefficient matrix MZ, MZThe 1st row and the column data of k=1 as shown in table 1, MZThe 2nd row and the column data of k=2 as shown in table 2, MZThe 3rd row and the column data of k=3 as shown in table 3, MZOther column data all similar with the data that table 1 is listed to table 3；
Table 1
Table 2
Table 3
Ii) according to k=1, the order of 2,3......10000, successively delivery formula coefficient matrix MZColumn vector, namely Zernike mode coefficient vector
C35,kAs 35 Zernike pattern ZiCoefficient, i=1,2,3......35, constitute Zernike mode combinations wavefrontSuccessively by ΦkIt is applied to liquid crystal wavefront corrector；In Hartman wavefront detector, obtain light dot matrix successively, calculate x-axis and the y-axis slope data of each 137 effective light spots of smooth dot matrix, constitute a series of slope data column vector S274,k, k=1,2,3......10000；
Iii) by 10000 slope data column vector S274,k, according to k=1, the order of 2,3......10000 is arranged to make up 274 row 10000 row slope matrix MS；
Iv) by MZAnd MSMatrix element data respectively according to from left to right, from top to bottom sequentially input in the above-mentioned computer being inserted with GPU picture processor, according to formula (5), GPU picture processor in less than 1ms, calculate accurate response matrixWillData be stored in this computer.
It is utilized respectively the response matrix M274,35 of conventional method measurement and the response matrix of method of least square statistical measurementThe adaptively correcting imaging process of fibre bundle point source 1 is operated in laboratory simulation:
First in the light path built, 1/2 wave plate 13 is removed light path, recovers the adaptively correcting imaging system of opened loop control；
Overfall simulator 14 is inserted between the first lens 2 and the second lens 3；
Open storage and have the computer of adaptively correcting imaging control software design, imaging CCD camera 12 and overfall simulator 14 are started working, when being subject to " turbulent flow " to disturb, the image of the fibre bundle point source 1 of imaging CCD camera 12 shooting is such as shown in Fig. 2 (a), very fuzzy；
Start adaptively correcting imaging control software design；
Select to use conventional method to measure the response matrix M obtained274,35Carrying out adaptively correcting imaging, the image of the fibre bundle point source 1 of now imaging CCD camera 12 shooting, such as shown in Fig. 2 (b), shows the fiber cores of arrangement, and picture element is much better compared with the Fig. 2 (a) before adaptively correcting；
Select the response matrix using method of least square statistics to obtainCarrying out adaptively correcting imaging, the image of the fibre bundle point source 1 of now imaging CCD camera 12 shooting, such as shown in Fig. 2 (c), shows the fiber cores becoming apparent from arrangement than Fig. 2 (b)；
Close adaptively correcting imaging software.
Evaluate the response matrix M of general measure274,35Response matrix with method of least square statistics acquisition
The intensity profile data of the Fig. 2 (b) imaging CCD camera 12 shot and (c) do radially average power spectra, namely the pixel space intensity profile data of imaging CCD camera 12 are drawn power spectrum as Fourier transformation, then radially it is being averaging, finally obtain (c) ratio to the radial direction average power spectra of (b), as shown in Figure 3, wherein transverse axis is pixel space frequency, and namely the reciprocal of abscissa represented with the cycle that pixel count quantifies.Being found out that the radial direction mean power peak value of (c) in Fig. 2 is 3 times of (b) by Fig. 3 curve, peak value occurs in nearly 0.2 pixel count-1Place, corresponding 5 pixels cycle, the picture of a basic corresponding fiber cores, quantitatively describe much sharp keen than (b) of the imaging of (c).Thus proving that the response matrix of general measure is highly susceptible to various factors impact, error is bigger；And adopt the response matrix of method of least square statistical measurement can eliminate interference well, keep its degree of accuracy.
Claims (4)
1. the method that a method of least square measures liquid crystal wavefront corrector response matrix, it is characterized in that: the Zernike pattern corrugated adopting a large amount of random coefficient to combine, the corrugated these calculated is applied on liquid crystal wavefront corrector one by one, the light dot matrix slope data on corresponding corrugated is measured successively by Hartman wavefront detector, constitute calculation matrix, and then utilize the calculated relationship between calculation matrix and response matrix, eliminate the error in calculation matrix by least square matrix algorithm, draw accurate response matrix；
Method of least square measures concretely comprising the following steps of liquid crystal wavefront corrector response matrix:
I item Zernike pattern before selecting, does not wherein include translation item, i-th Zernike pattern ZiCoefficient be ci, i=1,2,3 ... I；In Hartman wavefront detector, the effective light spot number of light dot matrix is that J, J have to be larger than 1.3I, and effective light spot ordinal number is j, j=1,2,3... ... J；Response matrix M2J,IIt it is the calibration slope data matrix of 2J row I row；
Applying K Zernike mode combinations wavefront to liquid crystal wavefront corrector, kth wavefront is expressed asK=1,2,3... ... K, make K > 103> > I, an I Zernike mode coefficient ci,kFor the random number in (-0.5,0.5) scope；K Zernike mode combinations wavefront is detected respectively, it is thus achieved that the slope data column vector S of K light dot matrix with Hartman wavefront detector2J,k；Further by K slope data column vector S2J,kIt is arranged to make up the slope matrix M of 2J row K rowS, by K Zernike mode coefficient vector CI,kIt is arranged to make up the coefficient matrix M of I row K rowZ；
Utilize least square matrix algorithm, be:Solve the accurate solution of response matrix
2. the method that a kind of method of least square according to claim 1 measures liquid crystal wavefront corrector response matrix, is characterized in that I described Zernike mode coefficient ci,kSpan need segmentation to limit with the increase of I, the c when I≤35i,kSpan be (-0.5,0.5), the c when 35≤I≤65i,kSpan be (-0.3,0.3), the c when 65≤I≤104i,kSpan be (-0.1,0.1), the c when 104≤I≤152i,kSpan be (-0.05,0.05).
3. the method that a kind of method of least square according to claim 1 measures liquid crystal wavefront corrector response matrix, is characterized in that the slope matrix M of K the Zernike mode combinations wavefront recorded in described Hartman wavefront detectorSWith the mode coefficient matrix M being made up of random numberZ, it is both input in GPU picture processor and carries out least square matrix operations, accurate response matrix can be calculated within the Millisecond time
4. the method that a kind of method of least square according to claim 1 measures liquid crystal wavefront corrector response matrix, it is characterized in that I=35 Zernike mode combinations wavefront of applying on described liquid crystal wavefront corrector, this Zernike mode combinations wavefront applies K=10000 altogether, through the response matrix of the relatively conventional measurement of response matrix that least square matrix algorithm solves, the radial direction mean power peak value of self adaptive imaging is made to improve 2 times.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410203990.9A CN103969031B (en) | 2014-05-14 | 2014-05-14 | Method of least square measures the method for liquid crystal corrector response matrix |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410203990.9A CN103969031B (en) | 2014-05-14 | 2014-05-14 | Method of least square measures the method for liquid crystal corrector response matrix |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103969031A CN103969031A (en) | 2014-08-06 |
| CN103969031B true CN103969031B (en) | 2016-07-06 |
Family
ID=51238802
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410203990.9A Active CN103969031B (en) | 2014-05-14 | 2014-05-14 | Method of least square measures the method for liquid crystal corrector response matrix |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103969031B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI645169B (en) * | 2018-02-09 | 2018-12-21 | 國立中央大學 | Wavefront detection system and method |
| CN113360842B (en) * | 2021-06-29 | 2022-11-22 | 中国科学院长春光学精密机械与物理研究所 | Rapid global decoupling liquid crystal deformable mirror adaptive optical system wave front control method |
| CN114034470B (en) * | 2021-11-10 | 2022-09-20 | 中国科学院长春光学精密机械与物理研究所 | Telescope wavefront rotation angle calculation method and device and telescope |
| CN114463198A (en) * | 2021-12-30 | 2022-05-10 | 南京诺源医疗器械有限公司 | Method for improving fluorescent imaging definition |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19800844A1 (en) * | 1998-01-13 | 1999-07-15 | Johannes Prof Dr Schwider | Method for wave front measurement using Shack-Hartmann sensor |
| CN1831499A (en) * | 2006-04-10 | 2006-09-13 | 中国科学院光电技术研究所 | Self-adaptive optical system based on microprism shack-Hartmann wavefront sensor |
| CN101211008A (en) * | 2006-12-29 | 2008-07-02 | 中国科学院长春光学精密机械与物理研究所 | White light LCD self-adapting optic system |
| CN101726848A (en) * | 2009-12-25 | 2010-06-09 | 中国科学院长春光学精密机械与物理研究所 | Adaptive liquid crystal optical system capable of opening loop and closing loop |
| CN102540453A (en) * | 2012-02-27 | 2012-07-04 | 中国科学院长春光学精密机械与物理研究所 | Liquid-crystal adaptive optical system with compact structure and high sensitivity |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011220979A (en) * | 2010-04-14 | 2011-11-04 | Nikon Corp | Aberration measurement apparatus and aberration measurement method |
-
2014
- 2014-05-14 CN CN201410203990.9A patent/CN103969031B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19800844A1 (en) * | 1998-01-13 | 1999-07-15 | Johannes Prof Dr Schwider | Method for wave front measurement using Shack-Hartmann sensor |
| CN1831499A (en) * | 2006-04-10 | 2006-09-13 | 中国科学院光电技术研究所 | Self-adaptive optical system based on microprism shack-Hartmann wavefront sensor |
| CN101211008A (en) * | 2006-12-29 | 2008-07-02 | 中国科学院长春光学精密机械与物理研究所 | White light LCD self-adapting optic system |
| CN101726848A (en) * | 2009-12-25 | 2010-06-09 | 中国科学院长春光学精密机械与物理研究所 | Adaptive liquid crystal optical system capable of opening loop and closing loop |
| CN102540453A (en) * | 2012-02-27 | 2012-07-04 | 中国科学院长春光学精密机械与物理研究所 | Liquid-crystal adaptive optical system with compact structure and high sensitivity |
Non-Patent Citations (1)
| Title |
|---|
| 液晶波前校正器特性研究;曹召良 等;《光子学报》;20081031;第37卷(第10期);第2043-2047页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103969031A (en) | 2014-08-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105700128B (en) | A kind of spliced telescope common phase level control device and control method | |
| CN103969031B (en) | Method of least square measures the method for liquid crystal corrector response matrix | |
| Bowman et al. | An SLM-based Shack–Hartmann wavefront sensor for aberration correction in optical tweezers | |
| CN102889935A (en) | Self-adaptive optical system near-field wavefront sensor calibration device and calibration method based on phase difference method | |
| WO2023125542A1 (en) | Metalens array, and wavefront detection system | |
| CN106338343B (en) | Wavefront detection method based on Fresnel zone plate | |
| Bos et al. | On-sky verification of Fast and Furious focal-plane wavefront sensing: Moving forward toward controlling the island effect at Subaru/SCExAO | |
| CN104568149B (en) | Solar grating spectral imaging device capable of correcting system aberration | |
| CN106324828B (en) | Liquid crystal-distorting lens hybrid self-adaption method of designing optical system | |
| CN106526839B (en) | Synchronous wavefront-free self-adaptive optical system based on mode | |
| CN103969824B (en) | The method for designing of beam folding LCD self-adapting optic system | |
| CN101546037A (en) | Model-free wavefront distortion correcting system based on spatial light modulator | |
| CN107402447B (en) | The design of LCD self-adapting optic system with PD image processing function | |
| CN102589720B (en) | Hartmann wavefront measuring instrument suitable for non-uniform light illumination | |
| CN101797149A (en) | Liquid crystal adaptive aberration correction retinal imaging device with high-efficiency utilization of energy | |
| CN102564731A (en) | Lens focal length and wavefront distortion measuring device | |
| CN101706951B (en) | Method, device and system for objectively evaluating pneumatic optical image quality based on feature fusion | |
| CN103234480A (en) | Rapid surface shape detection method for circular convex aspheric surfaces | |
| CN105203213A (en) | Method for calculating composite wavefront sensing adaptive optical system recovery voltage | |
| CN102937421A (en) | Real-time detection method of symmetrical optical non-spherical face of rotary shaft | |
| CN201983921U (en) | Lens focal length and wavefront distortion measuring device | |
| Lee et al. | Fine optical alignment correction of astronomical spectrographs via in-situ full-field moment-based wavefront sensing | |
| CN106526829A (en) | Liquid crystal-deformable mirror mixed type adaptive system matched with 2-meter telescope | |
| CN108519671A (en) | A kind of closed-loop corrected control method of spliced telescope system phase translation error | |
| CN104155000A (en) | Linearity gradual change optical filter type multispectral imaging instrument based on secondary imaging |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |