CN103884952A - Analysis method of ceramic capacitor failure - Google Patents
Analysis method of ceramic capacitor failure Download PDFInfo
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- CN103884952A CN103884952A CN201410053562.2A CN201410053562A CN103884952A CN 103884952 A CN103884952 A CN 103884952A CN 201410053562 A CN201410053562 A CN 201410053562A CN 103884952 A CN103884952 A CN 103884952A
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Abstract
The embodiment of the invention provides an analysis method of a ceramic capacitor failure, belonging to the field of ceramic capacitors in electronic equipment. The internal defects of a ceramic capacitor can be accurately analyzed, and the success rate of analysis is raised. The analysis method of a ceramic capacitor failure comprises a step of carrying out resistance test on a ceramic capacitor to be analyzed, recording the measured resistance as an initial resistance, and judging the failure state of the ceramic capacitor to be analyzed according to the initial resistance, a step of preparing the ceramic capacitor to be analyzed as a microsection sample, carrying out grinding, carrying out real-time testing on the resistance in the processing of grinding, and recording the measured resistance as a test value, a step of stopping grinding when the change amount of the test value exceeds the 10% of the initial resistance, and carrying out positioning observation of the defect part of the ceramic capacitor to be analyzed, and a step of carrying out comprehensive analysis of the defect part, and determining the failure reason of the ceramic capacitor to be analyzed. The analysis method can be used in the analysis of the ceramic capacitor failure.
Description
Technical field
The present invention relates to ceramic condenser field in electronic equipment, relate in particular to the analytical approach that a kind of ceramic condenser lost efficacy.
Background technology
Ceramic condenser (ceramic capacitor) is to use pottery as dielectric, by ceramic matrix two sides spraying silver layer, then can be made into as pole plate through the silver film of easy fired.Ceramic condenser is one of a large amount of main elements that use in electronic product, have that capacity is large, volume is little, electric capacity is stable, high temperature resistant corrosion stability is good and be applicable to the advantages such as surface installation, be widely used in vibration, High frequency filter, power supply decoupling and the bypass circuit in complete electronic set.
Owing to often there will be the Problem of Failure of ceramic condenser in the actual production of ceramic condenser with in using, thereby affect the overall performance of product, therefore, inefficacy product is carried out to failure analysis and there is very positive realistic meaning.The failure analysis method of existing ceramic condenser is that inefficacy ceramic condenser is made to metallographic microsection sample, adopts the method for mechanical lapping to be ground to the inside of ceramic condenser, and under metaloscope or scanning electron microscope, observes section pattern.If no abnormal, just repeat to grind for observation, conventionally stop grinding out behind 3 cross sections.
But in actual analysis, inventor finds, this analytical approach is comparatively effective for the serious mechanical damage of analysis ceramic condenser, thermal stress damage, and analytic process is simple, but does not have directive significance for analyzing ceramic condenser because internal tiny crack defect causes the situation of short circuit.So, a kind of method that provides short position to ceramic condenser inside to judge, locate, analyze is provided badly.
Summary of the invention
The analytical approach that the embodiment of the present invention provides a kind of ceramic condenser to lose efficacy, can accurate analysis to go out the inherent vice of ceramic condenser, improves and is parsed into power.
For achieving the above object, embodiments of the invention adopt following technical scheme:
The analytical approach that ceramic condenser lost efficacy, comprising:
Ceramic condenser to be analyzed is carried out to resistance test, the resistance recording is designated as to initial resistance, and judge the failure state of described ceramic condenser to be analyzed according to described initial resistance;
Described ceramic condenser to be analyzed is made to metallographic microsection sample, grind, in process of lapping, resistance is carried out to real-time testing, and the resistance recording is designated as to test value;
When the variable quantity of described test value exceed described initial resistance 10% time, stop grinding the rejected region of ceramic condenser to be analyzed described in position observation;
Described rejected region is comprehensively analyzed, determined the failure cause of described ceramic condenser to be analyzed.
Optionally, describedly described ceramic condenser to be analyzed made to metallographic microsection sample comprise:
After being poured into a mould, the outside of described ceramic condenser to be analyzed makes again metallographic microsection sample.
Further, described cast is to pour into a mould by epoxy resin.
Optionally, described in, be ground to mechanical lapping.
Further, described grinding comprises:
First be ground to the internal electrode of described ceramic condenser to be analyzed with 300-800 order emery paper, then carry out fine grinding with 800 orders or above emery paper.
Optionally, describedly in process of lapping, resistance is carried out to real-time testing and is:
In the time the internal electrode of described ceramic condenser to be analyzed being carried out to fine grinding with 800 orders or above emery paper, resistance is carried out to real-time testing.
Further, described real-time testing is to use multimeter to test the internal electrode of described ceramic condenser to be analyzed.
Optionally, described in described position observation, the rejected region of ceramic condenser to be analyzed comprises:
First utilize photoinduction resistance variations analytical technology to position the rejected region of described ceramic condenser to be analyzed, then the rejected region of location is placed under metaloscope and is observed.
Further, described in, be placed in that under metaloscope, to observe be to observe under the details in a play not acted out on stage, but told through dialogues of described metaloscope.
Optionally, described analytical approach is carried out resistance test described to ceramic condenser to be analyzed, the resistance recording is designated as to initial resistance and also comprises before:
Described ceramic condenser to be analyzed is carried out to outward appearance microscopy, confirm the surface topography of described ceramic condenser to be analyzed.
Optionally, described failure state comprises short circuit and electric leakage.
The analytical approach that the embodiment of the present invention provides a kind of ceramic condenser to lose efficacy; compare from existing analytical approach and different be; the method that the embodiment of the present invention provides has not only been carried out protection effectively to ceramic condenser to be analyzed in the time that ceramic condenser to be analyzed is analyzed; also by it being carried out to real-time resistance test; make its inner rejected region avoid preferably extraneous unnecessary stress to disturb being positioned before analyzing; thereby can analyze accurately the inherent vice of ceramic condenser, improve and be parsed into power.The method is simple, easy to operate, has stronger applicability.
Accompanying drawing explanation
The process flow diagram of the analytical approach that the ceramic condenser that Fig. 1 provides for the embodiment of the present invention lost efficacy;
Fig. 2 locates the rejected region schematic diagram obtaining for the photoinduction resistance variations analytical technology of utilizing that the embodiment of the present invention provides;
Fig. 3 is the local enlarged diagram of rejected region in Fig. 2.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is only the present invention's part embodiment, rather than whole embodiment.Based on the embodiment in the present invention, those of ordinary skills, not making the every other embodiment obtaining under creative work prerequisite, belong to the scope of protection of the invention.
The analytical approach that a kind of ceramic condenser embodiment of the present invention being provided below in conjunction with accompanying drawing lost efficacy is described in detail.
The process flow diagram of the analytical approach that the ceramic condenser that Fig. 1 provides for the embodiment of the present invention lost efficacy.The analytical approach that the embodiment of the present invention provides a kind of ceramic condenser to lose efficacy, comprising:
(1) ceramic condenser to be analyzed is carried out to resistance test, the resistance recording is designated as to initial resistance, and judge the failure state of described ceramic condenser to be analyzed according to described initial resistance.
In this step, need first ceramic condenser to be analyzed to be carried out to initial resistance test, thereby judge the failure state of described ceramic condenser to be analyzed according to the initial resistance recording.Wherein, failure state mainly comprises two kinds, and optional, described failure state comprises short circuit and electric leakage.When described ceramic condenser to be analyzed is carried out to initial resistance test, can select with multimeter, it to be tested, multimeter is placed between its two end electrodes and can be tested.
Preferably, before this step, also can comprise: described ceramic condenser to be analyzed is carried out to outward appearance microscopy, confirm the surface topography of described ceramic condenser to be analyzed.Like this can be first get rid of outside at ceramic condenser due to the inefficacy that serious mechanical damage causes by outward appearance microscopy, play the effect of pre-eliminating.
(2) described ceramic condenser to be analyzed is made to metallographic microsection sample, grind, in process of lapping, resistance is carried out to real-time testing, and the resistance recording is designated as to test value.
In this step, in the time that described ceramic condenser to be analyzed is made to metallographic microsection sample, optional, be that the method by pouring into a mould in the outside of described ceramic condenser to be analyzed is made metallographic microsection sample.Doing so is on the one hand to consider that the electric capacity of described ceramic condenser to be analyzed is less, if it is not poured into a mould to processing, thereby cannot grind and prepare microsection it, to consider described ceramic condenser to be analyzed to be solidificated in while grinding again in the mould of cast on the other hand, the further crack defect that just can avoid preferably the horizontal mechanical stress producing due to the external world in process of lapping to cause, and then avoid the erroneous judgement to rejected region.
Wherein, the mould material of selecting when described ceramic condenser to be analyzed is poured into a mould is selected the resinous material that insulating property are good and cure shrinkage is little conventionally, to avoid producing larger stress at interiors of products, damages the element that is enclosed in the inside.Optionally, described cast is to pour into a mould by epoxy resin.
Preparing after metallographic microsection sample, need grind it, further finding possible rejected region.Optionally, described in, be ground to mechanical lapping.At this, in step, described grinding can comprise: be first ground to the internal electrode of described ceramic condenser to be analyzed with 300-800 order emery paper, then carry out fine grinding with 800 orders or above emery paper.It should be noted that, it is the possible rejected region in order to find its internal electrode that metallographic microsection sample is ground, so can select larger object emery paper to grind in the time being not yet ground to its internal electrode, in the time extremely approaching internal electrode or electrode, can carry out fine grinding by selection of small object emery paper, to avoid possible rejected region because degree of grind is compared with large and destroyed.
Further, in fine grinding process, need resistance to carry out real-time testing, in the time described ceramic condenser to be analyzed being ground with 800 orders or above emery paper, internal electrode is tested, to find accurately the rejected region of electrode interior.Wherein, optional, real-time testing is to use multimeter to test the internal electrode of described ceramic condenser to be analyzed.Same, using multimeter to test it is also that the centre that multimeter is placed in to two end electrodes is tested.Be decided to be 8-12 second the interval time of test, preferably 10 seconds, this interval time scope build-in test be in order to test it more accurately, to avoid milling time due to interval long and possible rejected region is caused to unnecessary destruction.
(3) when the variable quantity of described test value exceed described initial resistance 10% time, stop grinding the rejected region of ceramic condenser to be analyzed described in position observation.
In this step, with the variable quantity that stops as a reference, when the variable quantity of described test value exceed described initial resistance 10% time, can think and arrive the position of rejected region.Determine after rejected region preliminary, need further determine it.Optionally, can utilize photoinduction resistance variations (OBIRCH) analytical technology to position the rejected region of described ceramic condenser to be analyzed.It should be noted that, those skilled in the art also can further determine rejected region by other analytical approach, and the method that the embodiment of the present invention is enumerated is not unique.But select in the present embodiment photoinduction resistance variations analytical technology, because the method is after by laser beam, the determinand surface under constant voltage is scanned, if while there is the defect such as crackle, cavity on resistance via, can cause temperature to raise at fault location, further cause resistance and the curent change of resistance via, thus location defect position accurately.
After precise positioning, just can be placed under metaloscope and observe rejected region is carried out.When observation, equal observable under the bright field of metaloscope and details in a play not acted out on stage, but told through dialogues.Observe but be chosen in the present embodiment, under the details in a play not acted out on stage, but told through dialogues of described metaloscope.This is because the optic Tyndall effect that metaloscope details in a play not acted out on stage, but told through dialogues utilizes, because the light source central beam by condenser system can not from top to bottom be radiated on determinand by object lens, tiltedly impinge upon on determinand but change path hypsokinesis, described details in a play not acted out on stage, but told through dialogues can be observed the invisible lines of common light field, and this inherent vice for analyzing electrode is suitable for the most.
(4) described rejected region is comprehensively analyzed, determined the failure cause of described ceramic condenser to be analyzed.
In this step, integrate all information obtaining above, confirm that described ceramic condenser to be analyzed is the inefficacy that exists micro-crack to cause due to electric capacity inside, thereby to be technique by ceramic condenser producer bad and cause in judgement.
The analytical approach that the embodiment of the present invention provides a kind of ceramic condenser to lose efficacy; compare from existing analytical approach and different be; the method that the embodiment of the present invention provides has not only been carried out protection effectively to ceramic condenser to be analyzed in the time that ceramic condenser to be analyzed is analyzed; also by it being carried out to real-time resistance test; make its inner rejected region avoid preferably extraneous unnecessary stress to disturb being positioned before analyzing; thereby can analyze accurately the inherent vice of ceramic condenser, improve and be parsed into power.The method is simple, easy to operate, has stronger applicability.
Embodiment 1
First, ceramic condenser to be analyzed is carried out to outward appearance microscopy, no abnormal; Secondly, ceramic condenser to be analyzed is carried out to resistance test, confirmation ceramic condenser is short-circuit failure; Then by electric capacity poured with epoxy resin to be analyzed, make metallographic microsection sample.First roughly grind with 400 order emery papers, be ground to electrode zone in ceramic condenser, then carry out fine grinding with 1200 order emery papers, the resistance that every grinding 8 seconds is cut into slices between termination electrode A, the B of sample to electric capacity to be analyzed is tested; When finding that resistance become greater to 500 ohm or stop when above grinding by short circuit, carry out OBIRCH analysis, as shown in Figure 2 and Figure 3, navigate to the rejected region of ceramic condenser, under metaloscope details in a play not acted out on stage, but told through dialogues to OBIRCH analyzing and positioning to abnormal area carry out observation analysis, find to exist in ceramic condenser body the crack morphology of micro-crack; Last comprehensive analyze the result that appeal step draws, confirm ceramic condenser short-circuit failure be due in capacitance body, exist micro-crack, judgement be ceramic condenser manufacturer production technique bad due to.
Embodiment 2
First, ceramic condenser to be analyzed is carried out to outward appearance microscopy, no abnormal; Secondly, ceramic condenser to be analyzed is carried out to resistance test, confirmation ceramic condenser is short-circuit failure; Then by electric capacity poured with epoxy resin to be analyzed, make metallographic microsection sample.First roughly grind with 600 order emery papers, be ground to electrode zone in ceramic condenser, then carry out fine grinding with 1000 order emery papers, the resistance that every grinding 10 seconds is cut into slices between termination electrode A, the B of sample to electric capacity to be analyzed is tested; When finding that resistance become greater to 600 ohm or stop when above grinding by short circuit, carry out OBIRCH analysis, navigate to the rejected region of ceramic condenser, under metaloscope details in a play not acted out on stage, but told through dialogues to OBIRCH analyzing and positioning to abnormal area carry out observation analysis, find to exist in ceramic condenser body the crack morphology of micro-crack; Last comprehensive analyze the result that appeal step draws, confirm ceramic condenser short-circuit failure be due in capacitance body, exist micro-crack, judgement be ceramic condenser manufacturer production technique bad due to.
Obviously, above-described embodiment is only for example is clearly described, and the not restriction to embodiment.For those of ordinary skill in the field, can also make other changes in different forms on the basis of the above description.Here without also giving exhaustive to all embodiments.And the apparent variation of being extended out thus or the still protection domain in the invention of variation.
Claims (11)
1. the analytical approach that ceramic condenser lost efficacy, is characterized in that, comprising:
Ceramic condenser to be analyzed is carried out to resistance test, the resistance recording is designated as to initial resistance, and judge the failure state of described ceramic condenser to be analyzed according to described initial resistance;
Described ceramic condenser to be analyzed is made to metallographic microsection sample, grind, in process of lapping, resistance is carried out to real-time testing, and the resistance recording is designated as to test value;
When the variable quantity of described test value exceed described initial resistance 10% time, stop grinding the rejected region of ceramic condenser to be analyzed described in position observation;
Described rejected region is comprehensively analyzed, determined the failure cause of described ceramic condenser to be analyzed.
2. analytical approach according to claim 1, is characterized in that, describedly described ceramic condenser to be analyzed is made to metallographic microsection sample comprises:
After being poured into a mould, the outside of described ceramic condenser to be analyzed makes again metallographic microsection sample.
3. analytical approach according to claim 2, is characterized in that, described cast is to pour into a mould by epoxy resin.
4. analytical approach according to claim 1, is characterized in that, described in be ground to mechanical lapping.
5. analytical approach according to claim 4, is characterized in that, described grinding comprises:
First be ground to the internal electrode of described ceramic condenser to be analyzed with 300-800 order emery paper, then carry out fine grinding with 800 orders or above emery paper.
6. analytical approach according to claim 1, is characterized in that, describedly in process of lapping, resistance is carried out to real-time testing and is:
In the time the internal electrode of described ceramic condenser to be analyzed being carried out to fine grinding with 800 orders or above emery paper, resistance is carried out to real-time testing.
7. analytical approach according to claim 6, is characterized in that, described real-time testing is to use multimeter to test the internal electrode of described ceramic condenser to be analyzed.
8. analytical approach according to claim 1, is characterized in that, the rejected region of ceramic condenser to be analyzed comprises described in described position observation:
First utilize photoinduction resistance variations analytical technology to position the rejected region of described ceramic condenser to be analyzed, then the rejected region of location is placed under metaloscope and is observed.
9. analytical approach according to claim 8, is characterized in that, described in be placed in that under metaloscope, to observe be to observe under the details in a play not acted out on stage, but told through dialogues of described metaloscope.
10. analytical approach according to claim 1, is characterized in that, described analytical approach is carried out resistance test described to ceramic condenser to be analyzed, the resistance recording is designated as to initial resistance and also comprises before:
Described ceramic condenser to be analyzed is carried out to outward appearance microscopy, confirm the surface topography of described ceramic condenser to be analyzed.
11. analytical approachs according to claim 1, is characterized in that, described failure state comprises short circuit and electric leakage.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105510523A (en) * | 2014-09-25 | 2016-04-20 | 黄武 | Failure analysis method for triode transistor |
| CN106770502A (en) * | 2017-01-03 | 2017-05-31 | 航天科工防御技术研究试验中心 | A kind of position finding and detection method of capacitance short-circuit failure |
| CN108169651A (en) * | 2017-11-22 | 2018-06-15 | 北京无线电计量测试研究所 | A kind of clock crystal oscillator detection method |
| CN109459676A (en) * | 2018-11-28 | 2019-03-12 | 苏州天标检测技术有限公司 | A kind of condenser failure analyzing detecting method |
| CN111626999A (en) * | 2020-05-22 | 2020-09-04 | 广东电网有限责任公司 | Patch capacitor failure detection method and grinding and polishing method |
| CN113155841A (en) * | 2021-02-24 | 2021-07-23 | 北京振兴计量测试研究所 | Failure positioning method and device for chip thin film resistor |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102419338A (en) * | 2011-08-16 | 2012-04-18 | 上海华碧检测技术有限公司 | Failure analysis method of capacitor |
-
2014
- 2014-02-17 CN CN201410053562.2A patent/CN103884952A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102419338A (en) * | 2011-08-16 | 2012-04-18 | 上海华碧检测技术有限公司 | Failure analysis method of capacitor |
Non-Patent Citations (2)
| Title |
|---|
| 刘燕芳等: "多层陶瓷电容器的失效分析", 《电子元件与材料》 * |
| 汪洋等: "贴片电容器失效分析", 《电子元件与材料》 * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105510523A (en) * | 2014-09-25 | 2016-04-20 | 黄武 | Failure analysis method for triode transistor |
| CN106770502A (en) * | 2017-01-03 | 2017-05-31 | 航天科工防御技术研究试验中心 | A kind of position finding and detection method of capacitance short-circuit failure |
| CN108169651A (en) * | 2017-11-22 | 2018-06-15 | 北京无线电计量测试研究所 | A kind of clock crystal oscillator detection method |
| CN108169651B (en) * | 2017-11-22 | 2021-05-11 | 北京无线电计量测试研究所 | Clock crystal oscillator detection method |
| CN109459676A (en) * | 2018-11-28 | 2019-03-12 | 苏州天标检测技术有限公司 | A kind of condenser failure analyzing detecting method |
| CN111626999A (en) * | 2020-05-22 | 2020-09-04 | 广东电网有限责任公司 | Patch capacitor failure detection method and grinding and polishing method |
| CN113155841A (en) * | 2021-02-24 | 2021-07-23 | 北京振兴计量测试研究所 | Failure positioning method and device for chip thin film resistor |
| CN113155841B (en) * | 2021-02-24 | 2023-06-06 | 北京振兴计量测试研究所 | Failure positioning method and device for chip thin film resistor |
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Application publication date: 20140625 |