CN103827026B - 具有碳纳米管层的结构及其形成方法 - Google Patents
具有碳纳米管层的结构及其形成方法 Download PDFInfo
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- CN103827026B CN103827026B CN201280046391.XA CN201280046391A CN103827026B CN 103827026 B CN103827026 B CN 103827026B CN 201280046391 A CN201280046391 A CN 201280046391A CN 103827026 B CN103827026 B CN 103827026B
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- 238000000034 method Methods 0.000 title claims abstract description 62
- 239000002041 carbon nanotube Substances 0.000 title claims abstract description 13
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 title abstract description 11
- 229910021393 carbon nanotube Inorganic materials 0.000 title abstract description 10
- 239000000758 substrate Substances 0.000 claims abstract description 87
- 239000013545 self-assembled monolayer Substances 0.000 claims abstract description 39
- 239000002243 precursor Substances 0.000 claims abstract description 31
- 239000002094 self assembled monolayer Substances 0.000 claims abstract description 30
- 238000007306 functionalization reaction Methods 0.000 claims abstract description 22
- 239000002356 single layer Substances 0.000 claims abstract description 10
- 239000002563 ionic surfactant Substances 0.000 claims abstract 2
- 125000000524 functional group Chemical group 0.000 claims description 53
- 239000000243 solution Substances 0.000 claims description 22
- 239000004094 surface-active agent Substances 0.000 claims description 17
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 17
- 150000002500 ions Chemical class 0.000 claims description 14
- 150000003863 ammonium salts Chemical class 0.000 claims description 9
- 229910044991 metal oxide Inorganic materials 0.000 claims description 9
- 150000004706 metal oxides Chemical class 0.000 claims description 9
- 150000003839 salts Chemical class 0.000 claims description 9
- 239000002253 acid Substances 0.000 claims description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 7
- 239000000203 mixture Substances 0.000 claims description 7
- 150000004714 phosphonium salts Chemical class 0.000 claims description 7
- 239000003795 chemical substances by application Substances 0.000 claims description 6
- FHIVAFMUCKRCQO-UHFFFAOYSA-N diazinon Chemical compound CCOP(=S)(OCC)OC1=CC(C)=NC(C(C)C)=N1 FHIVAFMUCKRCQO-UHFFFAOYSA-N 0.000 claims description 6
- 229910052751 metal Inorganic materials 0.000 claims description 6
- 239000002184 metal Substances 0.000 claims description 6
- NEAQRZUHTPSBBM-UHFFFAOYSA-N 2-hydroxy-3,3-dimethyl-7-nitro-4h-isoquinolin-1-one Chemical compound C1=C([N+]([O-])=O)C=C2C(=O)N(O)C(C)(C)CC2=C1 NEAQRZUHTPSBBM-UHFFFAOYSA-N 0.000 claims description 5
- RWSOTUBLDIXVET-UHFFFAOYSA-N Dihydrogen sulfide Chemical class S RWSOTUBLDIXVET-UHFFFAOYSA-N 0.000 claims description 5
- 150000002527 isonitriles Chemical class 0.000 claims description 5
- -1 pyridiniujm Chemical class 0.000 claims description 5
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 5
- LSDPWZHWYPCBBB-UHFFFAOYSA-N Methanethiol Chemical compound SC LSDPWZHWYPCBBB-UHFFFAOYSA-N 0.000 claims description 4
- 240000002853 Nelumbo nucifera Species 0.000 claims description 4
- 235000006508 Nelumbo nucifera Nutrition 0.000 claims description 4
- 235000006510 Nelumbo pentapetala Nutrition 0.000 claims description 4
- 150000003009 phosphonic acids Chemical class 0.000 claims description 4
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 238000000502 dialysis Methods 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims description 3
- 239000003513 alkali Substances 0.000 claims description 2
- 239000007864 aqueous solution Substances 0.000 claims description 2
- NRHMKIHPTBHXPF-TUJRSCDTSA-M sodium cholate Chemical compound [Na+].C([C@H]1C[C@H]2O)[C@H](O)CC[C@]1(C)[C@@H]1[C@@H]2[C@@H]2CC[C@H]([C@@H](CCC([O-])=O)C)[C@@]2(C)[C@@H](O)C1 NRHMKIHPTBHXPF-TUJRSCDTSA-M 0.000 claims description 2
- RWSOTUBLDIXVET-UHFFFAOYSA-O sulfonium Chemical compound [SH3+] RWSOTUBLDIXVET-UHFFFAOYSA-O 0.000 claims description 2
- 150000007942 carboxylates Chemical group 0.000 claims 3
- QPJVMBTYPHYUOC-UHFFFAOYSA-N methyl benzoate Chemical compound COC(=O)C1=CC=CC=C1 QPJVMBTYPHYUOC-UHFFFAOYSA-N 0.000 claims 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 claims 1
- MOTZDAYCYVMXPC-UHFFFAOYSA-N dodecyl hydrogen sulfate Chemical compound CCCCCCCCCCCCOS(O)(=O)=O MOTZDAYCYVMXPC-UHFFFAOYSA-N 0.000 claims 1
- 229910052708 sodium Inorganic materials 0.000 claims 1
- 239000011734 sodium Substances 0.000 claims 1
- 239000010410 layer Substances 0.000 abstract description 19
- 239000011248 coating agent Substances 0.000 abstract description 5
- 238000000576 coating method Methods 0.000 abstract description 5
- 238000004873 anchoring Methods 0.000 abstract description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 2
- 238000000059 patterning Methods 0.000 description 14
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 10
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 9
- 239000000463 material Substances 0.000 description 7
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 6
- 229910000449 hafnium oxide Inorganic materials 0.000 description 6
- WIHZLLGSGQNAGK-UHFFFAOYSA-N hafnium(4+);oxygen(2-) Chemical compound [O-2].[O-2].[Hf+4] WIHZLLGSGQNAGK-UHFFFAOYSA-N 0.000 description 6
- 150000001350 alkyl halides Chemical class 0.000 description 5
- 230000008901 benefit Effects 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 4
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 4
- 230000003213 activating effect Effects 0.000 description 4
- 239000003945 anionic surfactant Substances 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 229910052739 hydrogen Inorganic materials 0.000 description 4
- 239000001257 hydrogen Substances 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- DBMJMQXJHONAFJ-UHFFFAOYSA-M Sodium laurylsulphate Chemical compound [Na+].CCCCCCCCCCCCOS([O-])(=O)=O DBMJMQXJHONAFJ-UHFFFAOYSA-M 0.000 description 3
- 239000004141 Sodium laurylsulphate Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 239000006185 dispersion Substances 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 150000002894 organic compounds Chemical class 0.000 description 3
- 238000001338 self-assembly Methods 0.000 description 3
- 235000019333 sodium laurylsulphate Nutrition 0.000 description 3
- 238000003756 stirring Methods 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- WMFOQBRAJBCJND-UHFFFAOYSA-M Lithium hydroxide Chemical compound [Li+].[OH-] WMFOQBRAJBCJND-UHFFFAOYSA-M 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 2
- ABLZXFCXXLZCGV-UHFFFAOYSA-N Phosphorous acid Chemical compound OP(O)=O ABLZXFCXXLZCGV-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- OKJPEAGHQZHRQV-UHFFFAOYSA-N Triiodomethane Natural products IC(I)I OKJPEAGHQZHRQV-UHFFFAOYSA-N 0.000 description 2
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 description 2
- HUCVOHYBFXVBRW-UHFFFAOYSA-M caesium hydroxide Chemical compound [OH-].[Cs+] HUCVOHYBFXVBRW-UHFFFAOYSA-M 0.000 description 2
- 150000001768 cations Chemical class 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 239000008367 deionised water Substances 0.000 description 2
- 229910021641 deionized water Inorganic materials 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 2
- 230000005669 field effect Effects 0.000 description 2
- 239000013505 freshwater Substances 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- INQOMBQAUSQDDS-UHFFFAOYSA-N iodomethane Chemical compound IC INQOMBQAUSQDDS-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- YNBADRVTZLEFNH-UHFFFAOYSA-N methyl nicotinate Chemical compound COC(=O)C1=CC=CN=C1 YNBADRVTZLEFNH-UHFFFAOYSA-N 0.000 description 2
- 238000001000 micrograph Methods 0.000 description 2
- 239000002071 nanotube Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 239000002244 precipitate Substances 0.000 description 2
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 2
- 230000002940 repellent Effects 0.000 description 2
- 239000005871 repellent Substances 0.000 description 2
- CPRMKOQKXYSDML-UHFFFAOYSA-M rubidium hydroxide Chemical compound [OH-].[Rb+] CPRMKOQKXYSDML-UHFFFAOYSA-M 0.000 description 2
- 239000000725 suspension Substances 0.000 description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 2
- 239000011787 zinc oxide Substances 0.000 description 2
- QUYPSOKUBYENRV-UHFFFAOYSA-N 1h-pyrazole;pyridine Chemical compound C=1C=NNC=1.C1=CC=NC=C1 QUYPSOKUBYENRV-UHFFFAOYSA-N 0.000 description 1
- 239000005711 Benzoic acid Substances 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- AVXURJPOCDRRFD-UHFFFAOYSA-N Hydroxylamine Chemical compound ON AVXURJPOCDRRFD-UHFFFAOYSA-N 0.000 description 1
- HZNTVAYNXKPCFK-UHFFFAOYSA-N N-hydroxy-4-pyridinecarboxamide Chemical class ONC(=O)C1=CC=NC=C1 HZNTVAYNXKPCFK-UHFFFAOYSA-N 0.000 description 1
- 229910018828 PO3H2 Inorganic materials 0.000 description 1
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 229920002472 Starch Polymers 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 1
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical class C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 1
- 238000010306 acid treatment Methods 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 150000001450 anions Chemical class 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000002585 base Substances 0.000 description 1
- 235000010233 benzoic acid Nutrition 0.000 description 1
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 1
- 230000001588 bifunctional effect Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 150000001733 carboxylic acid esters Chemical class 0.000 description 1
- 239000003093 cationic surfactant Substances 0.000 description 1
- 229960001927 cetylpyridinium chloride Drugs 0.000 description 1
- YMKDRGPMQRFJGP-UHFFFAOYSA-M cetylpyridinium chloride Chemical compound [Cl-].CCCCCCCCCCCCCCCC[N+]1=CC=CC=C1 YMKDRGPMQRFJGP-UHFFFAOYSA-M 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 239000012954 diazonium Substances 0.000 description 1
- REZZEXDLIUJMMS-UHFFFAOYSA-M dimethyldioctadecylammonium chloride Chemical compound [Cl-].CCCCCCCCCCCCCCCCCC[N+](C)(C)CCCCCCCCCCCCCCCCCC REZZEXDLIUJMMS-UHFFFAOYSA-M 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- CJNBYAVZURUTKZ-UHFFFAOYSA-N hafnium(iv) oxide Chemical compound O=[Hf]=O CJNBYAVZURUTKZ-UHFFFAOYSA-N 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 230000002209 hydrophobic effect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 125000001160 methoxycarbonyl group Chemical group [H]C([H])([H])OC(*)=O 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- 229960001238 methylnicotinate Drugs 0.000 description 1
- GQPLMRYTRLFLPF-UHFFFAOYSA-N nitrous oxide Inorganic materials [O-][N+]#N GQPLMRYTRLFLPF-UHFFFAOYSA-N 0.000 description 1
- 229910052755 nonmetal Inorganic materials 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- YSWYYGKGAYSAOJ-UHFFFAOYSA-N phosphane Chemical compound P.P YSWYYGKGAYSAOJ-UHFFFAOYSA-N 0.000 description 1
- 150000003904 phospholipids Chemical class 0.000 description 1
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- NNFCIKHAZHQZJG-UHFFFAOYSA-N potassium cyanide Chemical compound [K+].N#[C-] NNFCIKHAZHQZJG-UHFFFAOYSA-N 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- RDRCCJPEJDWSRJ-UHFFFAOYSA-N pyridine;1h-pyrrole Chemical compound C=1C=CNC=1.C1=CC=NC=C1 RDRCCJPEJDWSRJ-UHFFFAOYSA-N 0.000 description 1
- 150000003254 radicals Chemical class 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 238000004626 scanning electron microscopy Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 235000019698 starch Nutrition 0.000 description 1
- 239000008107 starch Substances 0.000 description 1
- UUCCCPNEFXQJEL-UHFFFAOYSA-L strontium dihydroxide Chemical compound [OH-].[OH-].[Sr+2] UUCCCPNEFXQJEL-UHFFFAOYSA-L 0.000 description 1
- 229910001866 strontium hydroxide Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 239000006228 supernatant Substances 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07D—HETEROCYCLIC COMPOUNDS
- C07D213/00—Heterocyclic compounds containing six-membered rings, not condensed with other rings, with one nitrogen atom as the only ring hetero atom and three or more double bonds between ring members or between ring members and non-ring members
- C07D213/02—Heterocyclic compounds containing six-membered rings, not condensed with other rings, with one nitrogen atom as the only ring hetero atom and three or more double bonds between ring members or between ring members and non-ring members having three double bonds between ring members or between ring members and non-ring members
- C07D213/04—Heterocyclic compounds containing six-membered rings, not condensed with other rings, with one nitrogen atom as the only ring hetero atom and three or more double bonds between ring members or between ring members and non-ring members having three double bonds between ring members or between ring members and non-ring members having no bond between the ring nitrogen atom and a non-ring member or having only hydrogen or carbon atoms directly attached to the ring nitrogen atom
- C07D213/60—Heterocyclic compounds containing six-membered rings, not condensed with other rings, with one nitrogen atom as the only ring hetero atom and three or more double bonds between ring members or between ring members and non-ring members having three double bonds between ring members or between ring members and non-ring members having no bond between the ring nitrogen atom and a non-ring member or having only hydrogen or carbon atoms directly attached to the ring nitrogen atom with hetero atoms or with carbon atoms having three bonds to hetero atoms with at the most one bond to halogen, e.g. ester or nitrile radicals, directly attached to ring carbon atoms
- C07D213/78—Carbon atoms having three bonds to hetero atoms, with at the most one bond to halogen, e.g. ester or nitrile radicals
- C07D213/79—Acids; Esters
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/20—Carbon compounds, e.g. carbon nanotubes or fullerenes
- H10K85/221—Carbon nanotubes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07D—HETEROCYCLIC COMPOUNDS
- C07D213/00—Heterocyclic compounds containing six-membered rings, not condensed with other rings, with one nitrogen atom as the only ring hetero atom and three or more double bonds between ring members or between ring members and non-ring members
- C07D213/02—Heterocyclic compounds containing six-membered rings, not condensed with other rings, with one nitrogen atom as the only ring hetero atom and three or more double bonds between ring members or between ring members and non-ring members having three double bonds between ring members or between ring members and non-ring members
- C07D213/04—Heterocyclic compounds containing six-membered rings, not condensed with other rings, with one nitrogen atom as the only ring hetero atom and three or more double bonds between ring members or between ring members and non-ring members having three double bonds between ring members or between ring members and non-ring members having no bond between the ring nitrogen atom and a non-ring member or having only hydrogen or carbon atoms directly attached to the ring nitrogen atom
- C07D213/60—Heterocyclic compounds containing six-membered rings, not condensed with other rings, with one nitrogen atom as the only ring hetero atom and three or more double bonds between ring members or between ring members and non-ring members having three double bonds between ring members or between ring members and non-ring members having no bond between the ring nitrogen atom and a non-ring member or having only hydrogen or carbon atoms directly attached to the ring nitrogen atom with hetero atoms or with carbon atoms having three bonds to hetero atoms with at the most one bond to halogen, e.g. ester or nitrile radicals, directly attached to ring carbon atoms
- C07D213/72—Nitrogen atoms
- C07D213/76—Nitrogen atoms to which a second hetero atom is attached
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0657—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
- H01L29/0665—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body the shape of the body defining a nanostructure
- H01L29/0669—Nanowires or nanotubes
- H01L29/0676—Nanowires or nanotubes oriented perpendicular or at an angle to a substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/484—Insulated gate field-effect transistors [IGFETs] characterised by the channel regions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/12—Deposition of organic active material using liquid deposition, e.g. spin coating
-
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Abstract
一种形成具有选择性地放置的碳纳米管的结构的方法,一种制造带电碳纳米管的方法,一种双官能前体以及一种具有成束最少的高密度碳纳米管层的结构。将碳纳米管选择性地放置在具有两个区域的衬底上。所述第一区域的等电点超过所述第二区域的等电点。将所述衬底浸没在具有锚定端和带电端的双官能前体的溶液中。所述锚定端与所述第一区域键合以形成具有带电端的自组装单层。将具有带电单层的衬底浸没在具有相反电荷的碳纳米管的溶液中以在所述自组装单层上形成碳纳米管层。通过官能化或用离子表面活性剂的涂布制造所述带电的碳纳米管。
Description
技术领域
本发明通常涉及在衬底上放置碳纳米管(下文中称为“CNT”)的方法。具体地,本发明涉及在预先图案化的表面上选择性放置带电CNT,该预先图案化的表面具有相反带电的自组装单层(monolayer)。
背景技术
CNT可以是半导电的,并且因此作为场效应晶体管(下文中称为“FET”)的沟道材料而受到关注。相应地,正在开发将CNT放置在衬底上以用于FET的方法。
一种在衬底上放置CNT的方法包括从悬浮液中定向组装CNT。在该方法中,衬底被图案化以限定CNT对其具有亲和力的区域。该亲和力是由于衬底或CNT官能化来促进衬底和CNT之间的键合。
在一种情况下,为了将CNT放置在衬底上,现有技术用有机化合物盖印(stamp)衬底以产生具有亲水性区域和疏水性区域的衬底。亲水性区域是原始衬底表面,疏水性区域是用有机化合物盖印了的区域。将衬底浸没在CNT的溶液中并且干燥衬底从而在亲水性区域上留下CNT。然而,衬底表面上的CNT成束(即,一组CNT以像绳子一样的方式扭在一起)和/或是多层的。成束的或多层的CNT并不是理想的,因为由它们制成的晶体管需要较高的电压来导通和关断。所描述的方法的另一个缺点是CNT的溶液不能到达宽度小(大约200nm或更小)的凹陷亲水性区域。因此,CNT将被放置在大的亲水性区域中,而小的亲水性特性未被覆盖。因此,基于氢键(一种类型的偶极键)的CNT放置方法可能导致差的选择性。
在其它方法中,现有技术通过首先官能化CNT、然后将CNT直接放在衬底上,来将CNT放置在衬底上。然而,这种方法导致衬底上的CNT密度低。
因此,需要这样的方法,该方法以最少的成束、选择性地将高密度CNT的单层放置在衬底上。
发明内容
本发明致力于提供一种形成具有选择性地放置的碳纳米管(“CNT”)的结构的方法。所述方法包括:提供具有表面的衬底;以及使所述衬底的表面与前体分子的溶液接触,从而在所述表面上形成具有第一离子电荷部分的自组装单层。之后,使所述自组装单层与多个具有第二离子电荷部分的CNT的分散系接触。
根据本发明的另一方面,一种具有CNT层的结构包括具有第一区域和第二区域的衬底、所述第一区域上的自组装单层和所述自组装单层上的CNT层。所述CNT层具有超过每平方微米1CNT的密度。
根据本发明的又一方面,公开了一种用于制造自组装单层的双官能前体分子。所述双官能前体分子包括:用于将所述单层锚定到衬底第一官能基团以及具有第一离子电荷部分(moiety)的第二官能基团。从下述基团中选择所述第一官能基团:硫醇、异腈、膦酸(phosphonic acid)和异羟肟酸。所述第一离子电荷部分可以是包括铵盐、锍盐和鏻盐(phosphonium salt)的鎓盐(onium salt)。
本发明的优点包括碳纳米管的密度增加以及多层CNT或成束CNT的形成减少。
另一优点是CNTFET的电学性能更佳。
结合对附图的描述,本发明的其它特征和优点将变得显而易见,其中在所有图中相同的编号表示相同或相似的部分。
附图说明
现在将参考附图仅通过例子描述本发明的实施例,在附图中:
图1是根据本发明实施例的将CNT放置在衬底上的方法的流程图;
图2a示出了根据本发明实施例的图案化的衬底的横截面图;
图2b示出了根据本发明实施例图2a的图案化的衬底的俯视图;
图3示出了根据本发明实施例在具有第一等电点的衬底区域上形成自组装单层的双官能前体材料;
图4示出了根据本发明实施例、具有在图案化的衬底的第一区域上的第一离子电荷部分的自组装单层接触具有第二离子电荷部分的CNT的溶液;
图5示出了通过根据本发明实施例的方法形成的自组装单层上的CNT层;
图6是根据本发明实施例具有选择性放置的CNT层的衬底的扫描电子显微镜图像;
图7a示出了根据本发明实施例的具有第一官能基团和第二官能基团的双官能前体基团,其为具有第一离子电荷部分的铵盐,其中所述第一离子电荷部分是带正电的;
图7b示出了根据本发明实施例的具有第一官能基团和第二官能基团的双官能前体基团,其为具有第一离子电荷部分的铵盐,其中所述第一离子电荷部分是带正电的;
图7c示出了根据本发明实施例的具有第一官能基团和第二官能基团的双官能前体基团,其为具有第一离子电荷部分的吡啶盐,其中所述第一离子电荷部分是带正电的;
图7d示出了根据本发明实施例的具有第一官能基团和第二官能基团的双官能前体基团,其为具有第一离子电荷部分的锍盐,其中所述第一离子电荷部分是带正电的;
图7e示出了根据本发明实施例的具有第一官能基团和第二官能基团的双官能前体基团,其为具有第一离子电荷部分的鏻盐(phosphonium),其中所述第一离子电荷部分是带正电的;
图8a示出了根据本发明实施例、通过官能化CNT形成具有第二离子电荷部分的CNT的方法的第一步骤,在该第一步骤中,有机盐是重氮盐(R-N2 +X-),其与CNT分散系(dispersion)结合以形成图8b所示的官能化的CNT;
图8b示出了根据本发明实施例、通过官能化CNT形成具有第二离子电荷部分的CNT的方法的第二步骤,在该第二步骤中,将KOH和水与官能化的CNT混合以形成图8c所示的最终产物。
图8c示出了在根据本发明实施例通过官能化CNT形成具有第二离子电荷部分的CNT的方法中的最终产物——具有第二电荷部分的CNT。
图9示出了本发明实施例、通过用离子表面活性剂涂布CNT形成具有第二离子电荷部分的CNT的方法。
具体实施方式
本发明的基本原理是以很少的成束或者没有成束地、在衬底上形成高密度CNT单层的方法。将结合图1-6描述所述方法以及所得到的结构。本发明也包括用于所述在衬底上放置CNT的方法的用于自组装单层的双官能前体分子。结合图7描述该双官能前体的实施例。本发明还包括用于产生具有第二离子电荷部分的方法,结合图8-9描述了该方法的实施例。与以下实施例相结合地进行本发明的详细描述。请注意,附图标记仅仅是附图标记,因此不必将所述方法限制为附图标记的数字顺序。
参考图1,给出了根据本发明实施例的将CNT放置在衬底上的方法的流程图。在附图标记10处,提供图案化的衬底。图案化该衬底以便在该衬底上产生第一区域和第二区域。在附图标记20处,使图案化的衬底与包含前体的溶液接触。该前体是双官能的,意思是其具有用于两种不同目的的两个官能基团。第一官能基团用于将该前体锚定到衬底,第二官能用作(第一)离子电荷部分。通过使衬底与前体溶液接触,该第一官能基团(该锚定官能基团)与衬底的第一区域形成键,由此在该区域形成自组装单层;第二官能基团保留在适当位置,因此该单层具有第一离子电荷部分。在附图标记30处,使具有自组装单层的衬底与包含具有第二离子电荷部分的CNT的分散系接触。第一和第二电荷部分是相反的,因此CNT被静电吸引到具有第一离子电荷部分的自组装单层,这样在该自组装单层上得到了CNT层。在附图标记50,清洗该衬底以留下自组装单层上的CNT层,该自组装单层在衬底的第一区域上。
参考图2a,示出了图案化的衬底200的横截面。该衬底具有基底210、第一区域220和第二区域230。此处,第二区域230被示为高于第一区域220,然而,该区域可以是共面的或者该第一区域220可以高于该第二区域230。此处,该第二区域230被示为在该第一区域220的一部分的顶上。然而,也可能出现相反的形成,或者该区域彼此毗邻。因此,该区域相对于彼此的确切横截面构造可以有很多变型(甚至超出上面讨论的那些变型),图2a仅仅是一个实施例。
参考图2b,示出了同一图案化的衬底的自顶向下透视图。在图2b中,第一区域220是侧面与第二区域230相接的简单的条。然而,该第一和第二区域可以采取各种形状或构造。
接下来,讨论第一和第二区域的等电位属性。等电点是pH,在该处表面不携带净电荷。在本发明中,第一区域220具有第一等电点,第二区域230具有第二等电点。第一和第二等电点彼此不同,其中第一等电点(即,第一区域220的等电点)大于第二等电点(即,第二区域230的等电点)。优选地,第一区域的等电点和第二区域的等电点的差应当约为4或更大。例如,具有约为7的等电点的氧化铪的第一区域220与具有约为2的等电点的二氧化硅的第二区域230,导致约为5的等电点差。
接下来,讨论适用作图案化的衬底的第一和第二区域的材料。在第一实施例中,第一区域220是金属氧化物,第二区域230是诸如但不限于氧化硅(SixOzHz)的非金属氧化物。金属氧化物包括元素周期表的IVB、VB、VIB、VIIB、VIII或IIA(CAS版本)族中的至少一种金属。说明性地,金属氧化物第一区域220可以是氧化铝(Al2O3)、氧化铪(HfO2)、氧化钛(TiOx)、或者氧化锌((ZnO)。在第二实施例中,第一区域220可以是任何氧化物,包括非金属氧化物和金属氧化物。在第二实施例中,第二区域230是金属。用于第二区域的金属的例子包括金、钯、铜、铂等。
参考图3,图案化的衬底200与包含双官能前体250的溶液240接触,从而形成具有第一离子电荷部分的自组装单层(下文中称为“SAM”)265。该前体250是双官能的,意思是其具有依次用于两种不同目的的两个官能基团(252、254)。
第一官能基团252用于将前体250锚定到图案化的衬底200的第一区域220。第二官能基团254具有第一离子电荷部分264,其用于在该工艺中与CNT层的第二离子电荷部分形成键。通过使图案化的衬底200接触前体溶液240,第一官能基团252(锚定官能基团)与衬底的第一区域220形成键,由此在第一区域220处形成具有第一离子电荷部分264的自组装单层265。(双官能前体以及第一和第二官能基团的具体例子稍后讨论)。
第一离子电荷部分264可以是带正电的或带负电的。在优选实例中,图案化的衬底200具有氧化铪第一区域220和氧化硅(SiOx)第二区域230。在优选实施例中,形成在第一区域220(氧化铪)上的SAM 265具有正的第一离子电荷部分264。因此,在该特定优选实施例的此时,衬底的整个表面在形成CNT之前是亲水性的。这与依赖于衬底上亲水性和疏水性差异来确定CNT放置的选择性的现有技术方法形成对照。因此,在本发明中,选择性部分地由衬底的第一和第二区域的等电点差确定。
参考图4,图案化的衬底200的第一区域220上的具有第一离子电荷部分264的SAM265,与具有第二离子电荷部分274的CNT 271的溶液270接触。稍后讨论具有第二离子电荷部分的CNT的形成方式。相反带电的第一离子电荷部分264与第二离子电荷部分274之间的库伦吸引力将CNT 271键合284到衬底的第一区域220中的SAM(见图5)。在水中清洗衬底,从而留下在图案化的衬底200的第一区域220上选择性地形成的CNT层290。该清洗步骤去除任何过量的CNT,从而优选形成CNT的单层。层209的CNT可以是单壁的或多壁的CNT。在本发明的方法中清洗步骤是可能的,因为在CNT与SAM的带电相反的离子之间产生的键284强于现有技术方法中发现的纯粹的氢键。因此,键284不会像氢键那样能在水中离解。
本发明的一个优点是CNT上的电荷部分来自CNT周围的带电官能度(chargedfunctionality)或带电表面活性剂,与纳米管本身的诱导电荷相反。通过使用附着到CNT的带电官能度或表面活性剂,CNT与SAM覆盖的衬底之间的相互作用增加,这导致衬底200的希望区域上的CNT密度增加。
仍参考图5,CNT层290呈现出从约10CNT/μm2到约100CNT/μm2及其之间的范围的CNT密度。所得到的CNT层290呈现出从约0.1束/μm2到约1束/μm2及其之间的范围的减小的束密度。图6是根据本发明实施例具有选择性放置的CNT的衬底的扫描电子显微镜图像。
接下来,将讨论适当的双官能前体250。如先前所述,双官能前体具有用于锚定的第一官能基团252和用于形成第一离子电荷部分264的第二官能基团。第一官能基团(锚定基团)252的密度取决于第一区域220的材料。当第一区域220的材料是金属时,第一官能基团252是巯基(-SH)或异腈(-NC)。当第一区域220的材料是金属氧化物时,第一官能基团252是膦酸(-PO3H2)或异羟肟酸(-CONHOH)。
接下来,将讨论双官能前体250的第二官能基团254。第二官能基团254可以被转化成离子电荷部分264(在本申请中也称为带电离子部分)。第二官能基团254可以(1)在前体250将其自身锚定到衬底以形成自组装单层之前、或者(2)在前体250将其自身锚定到衬底以形成自组装单层之后,被转化成离子电荷部分264。在第一种情况下,所形成的自组装单层具有第一电荷部分264。在第二种情况下,最初自组装单层不带电并且必须被转化成具有第一离子电荷的SAM。
参考图7a-e,双官能前体250的例子,其中第二官能基团254已经被转化成带正电的第一离子电荷部分264。所有双官能前体250在底部都具有“R”基团,其代表先前描述的第一官能基团252(即,锚定基团)。在图7a-e中,第一离子电荷部分264都是带正电的鎓盐。具体地,图7a-b示出了铵盐,图7c是吡啶盐的例子,图7d是锍盐,并且图7E是鏻盐。继续,在图7a和7b中,“n”代表从2到16的整数,在图7b中“Z”代表单个键、氧、NH或硫;在图7a、7b、7c和7d中,“R1”、R2”和“R3”可以独立地为氢、或者具有1到10个碳的烷基;在图7e中,“Ar1”、“Ar2”和“Ar3”可以独立地为苯基或取代的苯基环;并且在所有的图7中,“X”是卤素。在图7a-b中绘出的铵盐优于重氮盐(-N2 +),因为重氮盐将与CNT(无论CNT具有部分电荷或完全的离子电荷)形成共价键。共价键使晶体管和其它电子应用中CNT的电学性能劣化。
可以被转化为图7的带正电的部分的第二官能基团254如下:铵盐(图7a和b)可以通过使胺与酸反应制成;吡啶盐(图7c)可以通过使吡啶与卤代烷反应制成;锍盐(图7d)可以通过使硫化物与卤代烷反应制成;并且鏻盐(图7e)可以通过使三芳基膦与卤代烷反应制成。
尽管图7a-e示出了具有正电荷的第一离子电荷部分264的例子,但是具有带负电的第一离子电荷部分264的双官能前体250也在本发明的范围内。在带负电的第一离子部分的情况下,双官能分子与图7a-e的相同,只是正电荷部分264被诸如-COO-或Ar-O-的带负电的部分取代。可以被转化成带负电的部分264的第二官能基团254的例子是诸如-COOCH3的羧酸脂和苯酚。这些基团通过与诸如KOH的强碱反应以分别产生-COO-或Ar-O-,而被转化成带负电的部分264。
接下来,将讨论术语“离子电荷部分”。部分是具有电荷的分子的一部分。在本发明中,电荷是由于一个分子从另一个分子夺取了电子或电子对而形成的;意味着电荷部分是离子的。本发明的离子性的带电分子应当与极性分子(例如,在水中发现的那些,-NH2、-NHNH2、-ONH2、-ONHOH和–CONHO-)形成对照。极性分子是在分子内具有不均匀的电子分布的分子。由于极性分子具有不均匀的电子分布,该分子中的原子有时被称为部分带电或者被称为具有偶极矩。然而,由于相反(部分地)带电的偶极-偶极吸引力导致的弱键,不应当与本发明的相反带电的离子的吸引力导致的较强键混淆。
讨论转向在CNT 271上生成第二离子电荷部分274的两种方式。官能化,在CNT上生成第二离子电荷部分274的第一种方式可以通过如下方式实现:将芳基重氮盐与CNT分散系混合以形成共价地键合到具有官能基团的有机化合物的CNT。然后将具有官能基团的CNT放置在水强碱溶液中以将该官能基团转化成第二离子电荷部分274。强碱的例子包括但不限于LiOH、NaOH、RbOH、CsOH、Ca(OH)2、Sr(OH)2、Ba(OH)2和优选的KOH。
参考图8a-c,示出了使CNT官能化以形成带负电的离子部分274的具体例子。在图8a中,有机盐是重氮盐(R-N2 +X-),其与CNT 271分散系组合。此处,重氮盐的“R”是苯甲酸甲酯。该盐与CNT共价地键合以形成图8b中的具有官能基团的CNT 271(即“官能化的CNT”)。继续参考图8b,将KOH和水与官能化的CNT混合以将官能基团的一部分(此处,羧酸脂-COOCH3)转化成第二离子电荷部分274(此处,-COO-)。
图8a-c中未示出官能化CNT以形成带正电的离子部分274的具体例子,然而,吡啶重氮盐可以与CNT分散系混合以形成官能化的CNT。然后,用酸处理该官能化的CNT以形成吡啶盐或用卤代烷(例如,但不限于碘甲烷)处理该官能化的CNT以形成N-烷基吡啶卤化物。该处理将官能基团的一部分(此处,吡啶)转化成第二离子电荷部分274(此处,CH3 -X+)。
参考图9,示出了生成第二离子电荷部分274的第二种方式,涂布。可以通过将CNT271与具有第二带电离子部分274的离子表面活性剂的溶液混合,实现在CNT上的涂布。在图9中,将包含CNT 271的水分散系与离子表面活性剂276混合。离子表面活性剂276的材料中的一些在CNT周围形成单层,如图9所示,作为具有重叠的离子表面活性剂276的CNT 271。包含CNT分散系和离子表面活性剂的溶液在纯水中经历渗析从而去除任何过量的离子表面活性剂。通过去除过量的离子表面活性剂276,在具有第一离子电荷部分的SAM上放置具有第二离子电荷部分的CNT的放置产量增加,这是因为SAM位置将被不与CNT 271相关联的离子表面活性剂276占据。
第二离子电荷部分274将与第一带电离子部分264相反地带电。因此,如果第一离子电荷部分264是正的,则离子表面活性剂276将是阴离子的;如果第一离子电荷部分264是负的,则离子表面活性剂276将是阳离子的。除了一些脂肪和磷脂用作阴离子表面活性剂,阴离子表面活性剂的例子还包括但不限于DNA、十二烷基硫酸钠和胆酸钠。阳离子表面活性剂的例子包括但不限于氯化十六烷吡啶、双十八烷基二甲基氯化铵。
可以在涂布CNT 271之前或涂布CNT 271之后使该表面活性剂变成离子的。例如,阴离子表面活性剂可以通过用碱处理它们的酸形式来制备,阳离子表面活性剂可以通过用卤代烷处理叔胺来制备。
本发明的一个优点是两个带电分子之间的键284强于极性分子与CNT之间的电荷。此外,所公开的第一离子电荷部分264优于备选部分(例如,Ar-N2 +),因为当前第一离子电荷部分不像Ar-N2 +那样与CNT形成共价键。在一些情况下,与CNT的共价键可能干扰CNT的电子学属性。CNT场效应晶体管的一种电学属性是其输运特性(Id(A)vs.Vg(V))。低的导通电流等于差的性能,并且是与CNT的共价键的指示。较高的导通电流(10-7A或更高)表示CNT的晶格反向(return),因此没有共价键到最少的共价键。
接下来,给出了本发明的实例性实施例。
实例I-用于自组装的带正电的双官能前体分子。将氰化钾(50mg)添加到这样的溶液:在10mL四氢呋喃和5mL甲醇中异烟酸甲酯(1.17克,0.01摩尔)和水中50%羟胺(1.3克,0.02摩尔)的溶液。在室温下搅动该混合物18个小时之后,过滤沉淀物并且用二乙醚对其进行洗涤和干燥,得到分析纯的N-羟基异烟酰胺。将后者添加到在甲醇中的5%碘甲烷中并且在室温下搅动两天。在减压下蒸发甲醇并且从乙醇中结晶固体残留物,得到纯的4-羟氨基-N-甲基吡啶碘化物。
实例II-通过官能化制备带负电的CNT。将四氟硼酸亚硝(12mg、1毫摩尔)添加到在5mL乙腈中的甲基-4-氨基苯甲酸酯的悬浮液(15mg,1毫摩尔)中。将所得到的溶液逐滴添加到在包含1%的十二烷基硫酸钠的水中的单壁碳纳米管(1mg)的水悬浮液中。在静置18个小时之后,对溶液进行离心分离并且将沉淀物添加到10mL的10%甲醇氢氧化钾溶液中。在搅动4小时之后,添加20mL的丙酮并且对混合物进行离心分离。丢弃浮在表面的液体并且将沉淀物溶解在去离子水中,得到带负电的碳纳米管的水性溶液。
实例III-涂布了阴离子表面活性剂的单层的CNT的水性分散系的制备。用纯水渗析1%的十二烷基硫酸钠中的碳纳米管的分散系数天,在此期间在24小时之后使用新鲜的水。在用新鲜的水渗析数次之后,过滤器内的溶液不包含自由表面活性剂并且所有的表面活性剂附着到碳纳米管。
实例IV-碳纳米管的选择性放置。将用氧化硅区域和氧化铪区域图案化的硅衬底浸没在乙醇中的4-羟氨基-N-甲基吡啶碘化物溶液的2mM溶液中。在一个小时之后,该衬底从该溶液移出并且用大量乙醇清洗并且在氮气流下干燥。然后将现在在氧化铪上涂布有带正电的离子单层的衬底浸没在实例II的带负电的(离子的,不是偶极的)官能化的纳米管的溶液中。在一个小时之后,移出该衬底并且用去离子水对其进行清洗并且在氮气流下干燥。衬底的扫描电子显微检查(图9)显示出了在氧化铪区域上选择性放置的高密度碳纳米管。
尽管已经参考当前被认为是优选实施例的内容描述的本发明,但是应当理解本发明不限于所公开的实施例。相反,本发明旨在覆盖包含在所附权利要求的精神和范围内的各种修改和等效布置。以下权利要求的范围应当与广为人知的解释相一致以便包含这些修改和等效结构和功能。
Claims (24)
1.一种形成具有选择性地放置的碳纳米管的结构的方法,该方法包括:
提供具有表面的衬底;
使所述衬底的所述表面与前体分子的溶液接触,从而在所述表面上形成具有第一离子电荷部分的自组装单层;
使所述自组装单层与具有第二离子电荷部分的多个碳纳米管的分散系接触,
还包括:在使所述衬底与所述多个碳纳米管的分散系接触之前:
通过(1)使所述多个碳纳米管与具有羧酸酯基团的有机分子键合以形成多个官能化的碳纳米管,并且(2)将所述羧酸酯基团转化成所述第二离子电荷部分,来形成具有所述第二离子电荷部分的所述多个碳纳米管。
2.根据权利要求1的方法,还包括:
清洗以去除过量的碳纳米管。
3.根据权利要求1或2的方法,其中所述第一和第二离子电荷部分相反带电。
4.根据权利要求3的方法,其中所述第一离子电荷部分是正的,所述第二离子电荷部分是负的。
5.根据权利要求1或2的方法,其中所述第一离子电荷部分是选自包括铵盐、吡啶盐、锍盐和鏻盐的组的鎓盐。
6.根据权利要求3的方法,其中所述第一离子电荷部分是选自包括铵盐、吡啶盐、锍盐和鏻盐的组的鎓盐。
7.根据权利要求4的方法,其中所述第一离子电荷部分是选自包括铵盐、吡啶盐、锍盐和鏻盐的组的鎓盐。
8.根据权利要求1或2的方法,其中所述前体分子具有:
将所述自组装单层锚定到所述衬底的第一官能基团;以及
具有第一离子电荷部分的第二官能基团。
9.根据权利要求3的方法,其中所述前体分子具有:
将所述自组装单层锚定到所述衬底的第一官能基团;以及
具有第一离子电荷部分的第二官能基团。
10.根据权利要求4的方法,其中所述前体分子具有:
将所述自组装单层锚定到所述衬底的第一官能基团;以及
具有第一离子电荷部分的第二官能基团。
11.根据权利要求8的方法,其中所述第一官能基团选自包括硫醇和异腈的组;并且其中所述衬底包括金属。
12.根据权利要求9的方法,其中所述第一官能基团选自包括硫醇和异腈的组;并且其中所述衬底包括金属。
13.根据权利要求10的方法,其中所述第一官能基团选自包括硫醇和异腈的组;并且其中所述衬底包括金属。
14.根据权利要求8的方法,其中
所述第一官能基团选自包括膦酸和异羟肟酸的组;并且
其中所述衬底包括金属氧化物区域。
15.根据权利要求9的方法,其中
所述第一官能基团选自包括膦酸和异羟肟酸的组;并且
其中所述衬底包括金属氧化物区域。
16.根据权利要求10的方法,其中
所述第一官能基团选自包括膦酸和异羟肟酸的组;并且
其中所述衬底包括金属氧化物区域。
17.根据权利要求1的方法,其中提供所述衬底还包括:
图案化所述衬底以形成第一区域和第二区域,每个区域具有等电点,其中所述第一区域的等电点大于所述第二区域的等电点。
18.根据权利要求17的方法,其中所述第一区域的等电点和所述第二区域的等电点之差至少为4。
19.根据权利要求17或18的方法,其中在所述衬底上形成所述自组装单层在所述衬底的所述第一区域上选择性地发生。
20.根据权利要求17的方法,其中所述第一区域是金属氧化物,并且所述第二区域是二氧化硅。
21.根据权利要求1的方法,其中键合所述多个碳纳米管包括:
混合水、所述多个碳纳米管、表面活性剂和苯甲酸甲酯的重氮盐,以形成苯甲酸甲酯的多个官能化的碳纳米管。
22.根据权利要求1或21的方法,其中转化所述羧酸酯基团包括:
将碱与所述多个官能化的碳纳米管混合,以在所述官能化的碳纳米管上形成具有负电荷的所述第二离子电荷部分。
23.一种形成具有选择性地放置的碳纳米管的结构的方法,该方法包括:
提供具有表面的衬底;
使所述衬底的所述表面与前体分子的溶液接触,从而在所述表面上形成具有第一离子电荷部分的自组装单层;
使所述自组装单层与具有第二离子电荷部分的多个碳纳米管的分散系接触,
还包括:在使所述衬底与所述多个碳纳米管的分散系接触之前:
通过如下步骤形成具有所述第二离子电荷的所述多个碳纳米管:
(1)在离子表面活性剂水溶液中组合所述多个碳纳米管以形成涂布了所述离子表面活性剂的单层的碳纳米管与过量的离子表面活性剂的混合物;以及(2)在水中渗析所述混合物以去除所述过量的离子表面活性剂;
其中所述离子表面活性剂的离子电荷部分是所述第二离子电荷部分。
24.根据权利要求23的方法,其中所述离子表面活性剂选自包括胆酸钠、十二烷基硫酸钠的组。
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JP2015501273A (ja) | 2015-01-15 |
US20160137605A1 (en) | 2016-05-19 |
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CA2847579C (en) | 2021-02-23 |
US9884827B2 (en) | 2018-02-06 |
EP2760785A1 (en) | 2014-08-06 |
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CN103827026A (zh) | 2014-05-28 |
US20160141501A1 (en) | 2016-05-19 |
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