CN103826800B - 精制作业支援装置、精制作业支援方法及精制作业支援系统 - Google Patents

精制作业支援装置、精制作业支援方法及精制作业支援系统 Download PDF

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Publication number
CN103826800B
CN103826800B CN201280047127.8A CN201280047127A CN103826800B CN 103826800 B CN103826800 B CN 103826800B CN 201280047127 A CN201280047127 A CN 201280047127A CN 103826800 B CN103826800 B CN 103826800B
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CN
China
Prior art keywords
mentioned
refining
work support
steel plate
information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201280047127.8A
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English (en)
Chinese (zh)
Other versions
CN103826800A (zh
Inventor
中尾宪午
原田稔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Publication of CN103826800A publication Critical patent/CN103826800A/zh
Application granted granted Critical
Publication of CN103826800B publication Critical patent/CN103826800B/zh
Expired - Fee Related legal-status Critical Current
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B27/00—Other grinding machines or devices
    • B24B27/033—Other grinding machines or devices for grinding a surface for cleaning purposes, e.g. for descaling or for grinding off flaws in the surface
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8809—Adjustment for highlighting flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8867—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
    • G01N2021/887—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing the measurements made in two or more directions, angles, positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Signal Processing (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • General Factory Administration (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
CN201280047127.8A 2012-02-06 2012-11-07 精制作业支援装置、精制作业支援方法及精制作业支援系统 Expired - Fee Related CN103826800B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2012-023173 2012-02-06
JP2012023173 2012-02-06
PCT/JP2012/078838 WO2013118357A1 (ja) 2012-02-06 2012-11-07 精整作業支援装置、精整作業支援方法及び精整作業支援システム

Publications (2)

Publication Number Publication Date
CN103826800A CN103826800A (zh) 2014-05-28
CN103826800B true CN103826800B (zh) 2016-02-17

Family

ID=48947144

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201280047127.8A Expired - Fee Related CN103826800B (zh) 2012-02-06 2012-11-07 精制作业支援装置、精制作业支援方法及精制作业支援系统

Country Status (5)

Country Link
JP (1) JP5382262B1 (pt)
KR (1) KR101513407B1 (pt)
CN (1) CN103826800B (pt)
BR (1) BR112014008297A2 (pt)
WO (1) WO2013118357A1 (pt)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104669064A (zh) * 2015-01-21 2015-06-03 苏州市国之福自动化设备有限公司 Cnc视觉辅助加工系统及方法
JP6198990B2 (ja) * 2015-04-01 2017-09-20 三菱電機株式会社 作業指示システム
JP6678298B2 (ja) * 2016-09-28 2020-04-08 パナソニックＩｐマネジメント株式会社 フィーダ配置支援システムおよびフィーダ配置支援方法
JP6580723B2 (ja) * 2018-01-16 2019-09-25 株式会社神鋼エンジニアリング＆メンテナンス 鋼板の形状矯正装置及び形状矯正方法
CN110666874A (zh) * 2019-10-12 2020-01-10 广东瑞洲科技有限公司 一种具有扫描、投影以及视觉定位功能的柔性材料切割机

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0666523A (ja) * 1992-08-18 1994-03-08 Yoshikawa Kogyo Co Ltd 板の寸法測定方法
JPH07308852A (ja) * 1994-05-16 1995-11-28 Noritake Co Ltd 疵取り用研削装置
JPH1010054A (ja) * 1996-06-26 1998-01-16 Nissan Motor Co Ltd 表面欠陥検査装置
JPH10277912A (ja) * 1997-04-04 1998-10-20 Nippon Steel Corp 鋼片の表面疵処理方法
JP2002289377A (ja) * 2001-03-28 2002-10-04 Toshiba Lighting & Technology Corp 照明制御システム
JP2009053122A (ja) * 2007-08-28 2009-03-12 Panasonic Electric Works Co Ltd 透明フィルム外観検査システム
JP4260451B2 (ja) * 2002-09-30 2009-04-30 関東自動車工業株式会社 車両塗面検査用欠陥マーキング装置
JP2011075301A (ja) * 2009-09-29 2011-04-14 Koike Sanso Kogyo Co Ltd 寸法検査システム及び寸法検査方法
JP2011239029A (ja) * 2010-05-06 2011-11-24 Hitachi Consumer Electronics Co Ltd 映像表示装置、省電力制御装置、及び省電力方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006268212A (ja) * 2005-03-23 2006-10-05 Hiroshi Mitsumata 命令入力装置
CN100460099C (zh) * 2006-12-08 2009-02-11 广州珠江钢铁有限责任公司 一种薄规格热轧钢板的轧制操作方法
KR101102242B1 (ko) * 2009-11-25 2012-01-03 주식회사 프라이머스코즈 의사 손동작으로 제어되는 수술실용 환자정보 디스플레이 장치와 그 제어방법
CN202155373U (zh) * 2011-06-24 2012-03-07 武汉点线科技有限公司 一种热轧钢板几何尺寸测量装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0666523A (ja) * 1992-08-18 1994-03-08 Yoshikawa Kogyo Co Ltd 板の寸法測定方法
JPH07308852A (ja) * 1994-05-16 1995-11-28 Noritake Co Ltd 疵取り用研削装置
JPH1010054A (ja) * 1996-06-26 1998-01-16 Nissan Motor Co Ltd 表面欠陥検査装置
JPH10277912A (ja) * 1997-04-04 1998-10-20 Nippon Steel Corp 鋼片の表面疵処理方法
JP2002289377A (ja) * 2001-03-28 2002-10-04 Toshiba Lighting & Technology Corp 照明制御システム
JP4260451B2 (ja) * 2002-09-30 2009-04-30 関東自動車工業株式会社 車両塗面検査用欠陥マーキング装置
JP2009053122A (ja) * 2007-08-28 2009-03-12 Panasonic Electric Works Co Ltd 透明フィルム外観検査システム
JP2011075301A (ja) * 2009-09-29 2011-04-14 Koike Sanso Kogyo Co Ltd 寸法検査システム及び寸法検査方法
JP2011239029A (ja) * 2010-05-06 2011-11-24 Hitachi Consumer Electronics Co Ltd 映像表示装置、省電力制御装置、及び省電力方法

Also Published As

Publication number Publication date
KR20140046486A (ko) 2014-04-18
KR101513407B1 (ko) 2015-04-17
BR112014008297A2 (pt) 2017-04-18
JP5382262B1 (ja) 2014-01-08
WO2013118357A1 (ja) 2013-08-15
CN103826800A (zh) 2014-05-28
JPWO2013118357A1 (ja) 2015-05-11

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SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CP01 Change in the name or title of a patent holder

Address after: Tokyo, Japan

Patentee after: Nippon Iron & Steel Corporation

Address before: Tokyo, Japan

Patentee before: Nippon Steel Corporation

CP01 Change in the name or title of a patent holder
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20160217

Termination date: 20201107

CF01 Termination of patent right due to non-payment of annual fee