CN103551344A - Full-automatic washing machine - Google Patents
Full-automatic washing machine Download PDFInfo
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- CN103551344A CN103551344A CN201310534562.XA CN201310534562A CN103551344A CN 103551344 A CN103551344 A CN 103551344A CN 201310534562 A CN201310534562 A CN 201310534562A CN 103551344 A CN103551344 A CN 103551344A
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- megasonic
- fully automatic
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
- B08B3/022—Cleaning travelling work
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/20—Cleaning of moving articles, e.g. of moving webs or of objects on a conveyor
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/08—Cleaning involving contact with liquid the liquid having chemical or dissolving effect
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B2203/00—Details of cleaning machines or methods involving the use or presence of liquid or steam
- B08B2203/02—Details of machines or methods for cleaning by the force of jets or sprays
- B08B2203/0288—Ultra or megasonic jets
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- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning By Liquid Or Steam (AREA)
Abstract
Description
技术领域technical field
本发明涉及清洗设备领域,特别涉及一种全自动清洗机。The invention relates to the field of cleaning equipment, in particular to a fully automatic cleaning machine.
背景技术Background technique
晶片在制程过程中所沾附的化学试剂或杂质,必须经由清洗机适时予以清洗。目前,多是通过人工将晶片放入到清洗机清洗,清洗完成后再由人工取出,并拿到烘干机中烘干,操作不便,且浪费人力物力。The chemical reagents or impurities attached to the wafer during the manufacturing process must be cleaned in a timely manner by a cleaning machine. At present, most of the wafers are manually put into the cleaning machine for cleaning. After cleaning, they are manually taken out and dried in the dryer, which is inconvenient to operate and wastes manpower and material resources.
发明内容Contents of the invention
本发明提供一种全自动清洗机,实现晶片清洗的全自动化,提高晶片清洗效率。The invention provides a fully automatic cleaning machine, which realizes full automation of wafer cleaning and improves wafer cleaning efficiency.
为解决上述技术问题,本发明提供一种全自动清洗机,包括:机壳、依次设置在所述机壳内的进料装置、取片装置、兆声清洗装置、甩干装置以及出料装置;其中,所述取片装置在所述进料装置、兆声清洗装置、甩干装置以及出料装置之间移动送料。In order to solve the above technical problems, the present invention provides a fully automatic cleaning machine, comprising: a casing, a feeding device sequentially arranged in the casing, a sheet taking device, a megasonic cleaning device, a drying device and a discharging device ; Wherein, the sheet taking device moves and feeds between the feeding device, the megasonic cleaning device, the spin-drying device and the discharging device.
作为优选,所述进料装置包括水槽和进料气缸,进料气缸设置在水槽顶部,用于吸取放置在水槽中的晶片。Preferably, the feeding device includes a water tank and a feeding cylinder, and the feeding cylinder is arranged on the top of the water tank for sucking the wafers placed in the water tank.
作为优选,所述取片装置包括丝杆、设置在所述丝杆上的多个机械手以及控制各机械手动作的取片气缸。Preferably, the film taking device includes a screw rod, a plurality of manipulators arranged on the screw mandrel, and a film taking cylinder for controlling the movement of each manipulator.
作为优选,所述兆声清洗装置包括第一兆声喷淋装置、晶片刷洗装置和第二兆声喷淋装置,其中,所述晶片刷洗装置设置在所述第一、第二兆声喷淋装置的中间。Preferably, the megasonic cleaning device includes a first megasonic shower device, a wafer scrubbing device and a second megasonic shower device, wherein the wafer scrubbing device is arranged between the first and second megasonic shower middle of the device.
作为优选,所述第一、第二兆声喷淋装置分别包括:兆声波发生器、喷淋装置、吸附装置和伺服电机;其中,兆声波发生器和喷淋装置设置于吸附装置的上方,用于对放置在吸附装置上的晶片进行喷淋清洗,所述伺服电机控制所述吸附装置旋转。Preferably, the first and second megasonic shower devices respectively include: a megasonic generator, a shower device, an adsorption device and a servo motor; wherein the megasonic generator and the shower device are arranged above the adsorption device, It is used to spray and clean the wafer placed on the adsorption device, and the servo motor controls the rotation of the adsorption device.
作为优选,所述甩干装置的顶部采用喷气装置。Preferably, the top of the spin-drying device adopts an air jet device.
作为优选,所述出料装置采用两对称设置的存料槽。Preferably, the discharge device adopts two symmetrically arranged storage tanks.
作为优选,所述兆声清洗装置、甩干装置以及出料装置的顶端由同一气缸控制移动。Preferably, the tops of the megasonic cleaning device, the spin-drying device and the discharge device are controlled to move by the same cylinder.
作为优选,所述机壳上与取料装置和出料装置对应的位置上分别设置有窗口。Preferably, windows are respectively provided on the casing at positions corresponding to the feeding device and the discharging device.
作为优选,所述机壳的底部还设置有活动轮。Preferably, the bottom of the casing is also provided with movable wheels.
与现有技术相比,本发明具有以下优点:本发明采用通过将用于清洗晶片的各装置集成到一个机壳内,并由取片装置移动送料,实现晶片的全自动清洗,提高了晶片的清洗效率,节省生产成本。Compared with the prior art, the present invention has the following advantages: the present invention integrates the various devices for cleaning the wafer into a casing, and moves and feeds the material by the taking-up device to realize fully automatic cleaning of the wafer, and improves the wafer cleaning efficiency. High cleaning efficiency, save production cost.
附图说明Description of drawings
图1为本发明一具体实施方式中全自动清洗机的结构示意图;Fig. 1 is the structural representation of fully automatic cleaning machine in a specific embodiment of the present invention;
图2为本发明一具体实施方式中全自动清洗机的侧视图;Fig. 2 is a side view of a fully automatic washing machine in a specific embodiment of the present invention;
图3为本发明一具体实施方式中第一兆声喷淋装置的结构示意图。Fig. 3 is a schematic structural diagram of a first megasonic shower device in a specific embodiment of the present invention.
图中:10-机壳、101-活动轮、102-窗口、20-进料装置、201-进料气缸、202-水槽、30-取片装置、301-取片气缸、302-机械手、303-丝杆、40-第一兆声喷淋装置、401-兆声波发生器、402-喷淋装置、403-吸附装置、404-伺服电机、50-晶片刷洗装置、60-第二兆声喷淋装置、70-甩干装置、80-出料装置、90-气缸。In the figure: 10-casing, 101-moving wheel, 102-window, 20-feeding device, 201-feeding cylinder, 202-water tank, 30-feeding device, 301-feeding cylinder, 302-manipulator, 303 -screw, 40-first megasonic spray device, 401-megasonic generator, 402-spray device, 403-adsorption device, 404-servo motor, 50-wafer scrubbing device, 60-second megasonic spray Shower device, 70-drying device, 80-discharging device, 90-cylinder.
具体实施方式Detailed ways
为使本发明的上述目的、特征和优点能够更加明显易懂,下面结合附图对本发明的具体实施方式做详细的说明。需说明的是,本发明附图均采用简化的形式且均使用非精准的比例,仅用以方便、明晰地辅助说明本发明实施例的目的。In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be noted that all the drawings of the present invention are in simplified form and use inaccurate scales, and are only used to facilitate and clearly assist the purpose of illustrating the embodiments of the present invention.
请参照图1~3,本发明提供的全自动清洗机,包括:机壳10、依次设置在所述机壳10内的进料装置20、取片装置30、兆声清洗装置、甩干装置70以及出料装置80;所述兆声清洗装置包括第一兆声喷淋装置40、晶片刷洗装置50和第二兆声喷淋装置60,所述晶片刷洗装置50设置在所述第一、第二兆声喷淋装置40、60的中间;所述取片装置30在所述进料装置20、兆声清洗装置、甩干装置70以及出料装置80之间移动送料。本发明通过将用于清洗晶片的各装置集成到一个机壳10内,并由取片装置30移动送料,实现晶片的全自动清洗,提高了晶片的清洗效率,节省生产成本。Please refer to Figures 1 to 3, the fully automatic cleaning machine provided by the present invention includes: a
请继续参照图1~3,所述进料装置20包括水槽202和进料气缸201,进料气缸201设置在水槽顶部,用于吸取放置在水槽202中的晶片。需要强调的是,晶片放置在水槽202中的水平液面下、避免晶片受空气污染。进料气缸201将晶片取出后,由取片装置30移动到第一兆声喷淋装置40处,以进行后续清洗动作。Please continue to refer to FIGS. 1-3 , the
作为优选,所述取片装置30包括丝杆303、设置在所述丝杆303上的多个机械手302以及控制各机械手302动作的取片气缸301。工作时,所述取片气缸301带动机械手302上的晶片移动,实现晶片在各装置之间的自动转移。Preferably, the
请重点参照图3,所述第一、第二兆声喷淋装置40、60分别包括:兆声波发生器401、喷淋装置402、吸附装置403和伺服电机404;其中,兆声波发生器401和喷淋装置402设置于吸附装置403的上方,用于对放置在吸附装置403上的晶片进行喷淋清洗,所述伺服电机404控制所述吸附装置403旋转。具体地,工作时,兆声波发生器401和喷淋装置402同时对吸附在吸附装置403上的晶片进行兆声喷淋,同时伺服电机404控制晶片旋转,确保晶片表面所有区域都被清洗干净。本实施例中,兆声波发生器由高频振效应并结合化学清洗剂的化学反应对晶片进行清洗的。液体分子在这种声波的推动下作加速运动,最大瞬时速度可达到30cm/s。因此,不会形成超声波清洗样的气泡,而只以高速的流体波连续冲击晶片表面,使晶片表面附着的污染物的细小微粒被强制除去并进入到清洗液中。兆声波清洗抛光片可去掉晶片表面上小于0.2μm的粒子,起到超声波起不到的作用。因此,所述第一、第二兆声喷淋装置40、60能同时起到机械擦片和化学清洗两种作用。Please focus on Fig. 3, the first and second
请继续参照图1~3,作为优选,所述甩干装置70的顶部采用喷气装置,所述晶片刷洗装置50的顶部采用晶片刷对晶片表面进行刷洗,确保粘附在晶片上的杂质脱离晶片。需要说明的是,所述晶片刷洗装置50和甩干装置70的底部与第一、第二兆声喷淋装置40、60的结构相同,均包括吸附装置403和伺服电机404,因此,刷洗晶片和甩干晶片时,晶片均是处于高速旋转状态的。进一步的,所述兆声清洗装置、甩干装置70以及出料装置80的顶端由同一气缸90控制移动,由于全自动清洗机工作时,机壳10内的各装置均在工作,而工作完成后,上述各装置的顶部由所述气缸90带动,移动至一侧,便于取片装置30将放置与各装置底部的晶片移出,确保晶片清洗的流畅性。Please continue to refer to Fig. 1~3, as preferably, the top of described spin-
请继续参照图1~3,作为优选,所述出料装置80采用两对称设置的存料槽,所述存料槽的结构与水槽202相同,用于保存清洗完成后的晶片,同样,晶片位于存料槽的液面以下,避免二次污染。Please continue to refer to FIGS. 1 to 3. As a preference, the
请重点参照图2,作为优选,所述机壳10的底部还设置有活动轮101,便于根据具体工艺需求移动全自动清洗机,节省人力物力;所述机壳10上与进料装置20和出料装置80对应的位置上分别设置有窗口102,便于工作人员将待清洗的晶片放入和清洗后的晶片取出。Please refer to Fig. 2 emphatically, as a preference, the bottom of the
综上所述,本发明提供的全自动清洗机,包括:机壳10、依次设置在所述机壳10内的进料装置20、取片装置30、兆声清洗装置、甩干装置70以及出料装置80;所述兆声清洗装置包括第一兆声喷淋装置40、晶片刷洗装置50和第二兆声喷淋装置60,所述晶片刷洗装置50设置在所述第一、第二兆声喷淋装置40、60的中间;所述取片装置30在所述进料装置20、兆声清洗装置、甩干装置70以及出料装置80之间移动送料。本发明采用通过将用于清洗晶片的各装置集成到一个机壳10内,并由取片装置30移动送料,实现晶片的全自动清洗,提高了晶片的清洗效率,节省生产成本。In summary, the fully automatic cleaning machine provided by the present invention includes: a
显然,本领域的技术人员可以对发明进行各种改动和变型而不脱离本发明的精神和范围。这样,倘若本发明的这些修改和变型属于本发明权利要求及其等同技术的范围之内,则本发明也意图包括这些改动和变型在内。Obviously, those skilled in the art can make various changes and modifications to the invention without departing from the spirit and scope of the invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and equivalent technologies thereof, the present invention also intends to include these modifications and variations.
Claims (10)
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| CN201310534562.XA CN103551344A (en) | 2013-11-01 | 2013-11-01 | Full-automatic washing machine |
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| CN201310534562.XA CN103551344A (en) | 2013-11-01 | 2013-11-01 | Full-automatic washing machine |
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| CN105195465A (en) * | 2015-09-21 | 2015-12-30 | 同济大学 | Fully-automatic optical element cleaning device with ultrasonic-megasonic composite frequency |
| CN105921432A (en) * | 2016-05-16 | 2016-09-07 | 苏州辰轩光电科技有限公司 | Diamond double-side brush-washing machine |
| WO2020077649A1 (en) * | 2018-10-15 | 2020-04-23 | 杭州众硅电子科技有限公司 | Cmp wafer cleaning apparatus |
| CN114247682A (en) * | 2021-11-25 | 2022-03-29 | 安徽微芯长江半导体材料有限公司 | Special post-cutting cleaning device and cleaning method for silicon carbide wafer |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105195465A (en) * | 2015-09-21 | 2015-12-30 | 同济大学 | Fully-automatic optical element cleaning device with ultrasonic-megasonic composite frequency |
| CN105195465B (en) * | 2015-09-21 | 2017-07-18 | 同济大学 | A kind of ultrasonic wave mega sonic wave combination frequency full-automatic optical element cleaning device |
| CN105921432A (en) * | 2016-05-16 | 2016-09-07 | 苏州辰轩光电科技有限公司 | Diamond double-side brush-washing machine |
| WO2020077649A1 (en) * | 2018-10-15 | 2020-04-23 | 杭州众硅电子科技有限公司 | Cmp wafer cleaning apparatus |
| CN114247682A (en) * | 2021-11-25 | 2022-03-29 | 安徽微芯长江半导体材料有限公司 | Special post-cutting cleaning device and cleaning method for silicon carbide wafer |
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Application publication date: 20140205 |
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