CN103502891B - 致动投射曝光设备中的元件的装置 - Google Patents
致动投射曝光设备中的元件的装置 Download PDFInfo
- Publication number
- CN103502891B CN103502891B CN201280022137.6A CN201280022137A CN103502891B CN 103502891 B CN103502891 B CN 103502891B CN 201280022137 A CN201280022137 A CN 201280022137A CN 103502891 B CN103502891 B CN 103502891B
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- Prior art keywords
- actuator
- activator portion
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- bearing frame
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- Prior art date
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- 239000012190 activator Substances 0.000 claims abstract description 85
- 230000003287 optical effect Effects 0.000 claims abstract description 14
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- 230000003068 static effect Effects 0.000 claims description 8
- 238000001514 detection method Methods 0.000 claims description 3
- 230000003213 activating effect Effects 0.000 abstract description 7
- 238000010586 diagram Methods 0.000 description 6
- 230000001629 suppression Effects 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 230000010355 oscillation Effects 0.000 description 5
- 210000001747 pupil Anatomy 0.000 description 5
- 238000013461 design Methods 0.000 description 4
- 230000005484 gravity Effects 0.000 description 4
- 230000005284 excitation Effects 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000011218 segmentation Effects 0.000 description 3
- 230000001133 acceleration Effects 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000001393 microlithography Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000003071 parasitic effect Effects 0.000 description 2
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000003679 aging effect Effects 0.000 description 1
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- 238000006073 displacement reaction Methods 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000000763 evoking effect Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70766—Reaction force control means, e.g. countermass
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70825—Mounting of individual elements, e.g. mounts, holders or supports
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Mounting And Adjusting Of Optical Elements (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161483153P | 2011-05-06 | 2011-05-06 | |
| DE102011075393.1 | 2011-05-06 | ||
| DE102011075393A DE102011075393B4 (de) | 2011-05-06 | 2011-05-06 | Anordnung zur Aktuierung eines Elementes in einer Projektionsbelichtungsanlage |
| US61/483,153 | 2011-05-06 | ||
| PCT/EP2012/056628 WO2012152520A1 (en) | 2011-05-06 | 2012-04-12 | Arrangement for actuating an element in a projection exposure apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103502891A CN103502891A (zh) | 2014-01-08 |
| CN103502891B true CN103502891B (zh) | 2016-11-02 |
Family
ID=47019435
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280022137.6A Active CN103502891B (zh) | 2011-05-06 | 2012-04-12 | 致动投射曝光设备中的元件的装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9081292B2 (enExample) |
| JP (1) | JP6121401B2 (enExample) |
| CN (1) | CN103502891B (enExample) |
| DE (1) | DE102011075393B4 (enExample) |
| WO (1) | WO2012152520A1 (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104272191B (zh) | 2012-04-26 | 2017-06-09 | Asml荷兰有限公司 | 光刻设备及器件制造方法 |
| DE102013201081A1 (de) * | 2013-01-24 | 2014-03-13 | Carl Zeiss Smt Gmbh | Vorrichtung zur Lagerung eines optischen Bauelements |
| JP6168957B2 (ja) * | 2013-09-30 | 2017-07-26 | キヤノン株式会社 | 光学装置、投影光学系、露光装置および物品の製造方法 |
| EP3078148B1 (en) * | 2013-12-02 | 2020-03-18 | Sony Corporation | Communication device, infrastructure equipment and methods for receiving downlink control information |
| NL2014487A (en) * | 2014-04-17 | 2015-11-02 | Asml Netherlands Bv | Lithographic Apparatus and Device Manufacturing Method. |
| JP6371576B2 (ja) * | 2014-05-02 | 2018-08-08 | キヤノン株式会社 | 光学装置、投影光学系、露光装置、および物品の製造方法 |
| WO2015173362A1 (de) * | 2014-05-14 | 2015-11-19 | Carl Zeiss Smt Gmbh | Optimale anordnung von aktuier- und sensorpunkten auf einem optischen element |
| DE102015201870A1 (de) | 2015-02-03 | 2016-08-04 | Carl Zeiss Smt Gmbh | Anordnung zur Positionsmanipulation eines Elementes, insbesondere in einem optischen System |
| DE102016202408A1 (de) * | 2016-02-17 | 2017-01-26 | Carl Zeiss Smt Gmbh | Anordnung zur Positionsmanipulation eines Elementes in einem optischen System |
| ES2603655B1 (es) * | 2016-04-21 | 2017-09-25 | Consorci Per A La Construcció, Equipament I Explotació Del Laboratori De Llum De Sincrotró | Dispositivo y método de aplicación de fuerza en un objeto |
| DE102016216917A1 (de) * | 2016-09-07 | 2018-03-08 | Carl Zeiss Smt Gmbh | Optisches System, insbesondere Lithographieanlage, sowie Verfahren |
| DE102016225900A1 (de) * | 2016-12-21 | 2018-06-21 | Carl Zeiss Smt Gmbh | Tauchspulenaktuator |
| US10955761B2 (en) | 2017-02-02 | 2021-03-23 | Asml Netherlands B.V. | Lithographic apparatus, lithographic projection apparatus and device manufacturing method |
| DE102017216458A1 (de) * | 2017-09-18 | 2019-03-21 | Carl Zeiss Smt Gmbh | Verfahren zur Herstellung eines Spiegels als optischer Komponente für ein optisches System einer Projektionsbelichtungsanlage für die Projektionslithographie |
| DE102018200528A1 (de) * | 2018-01-15 | 2018-12-13 | Carl Zeiss Smt Gmbh | Projektionsbelichtungsanlage für die Halbleiterlithographie mit Sensorschutz |
| DE102020208013B3 (de) | 2020-06-29 | 2021-09-02 | Carl Zeiss Smt Gmbh | Kompensation von kriecheffekten in einer abbildungseinrichtung |
| DE102023205570A1 (de) * | 2023-06-14 | 2024-06-27 | Carl Zeiss Smt Gmbh | Optisches system und projektionsbelichtungsanlage |
| DE102023208718A1 (de) * | 2023-09-08 | 2025-03-13 | Carl Zeiss Smt Gmbh | Vibrationskorrektureinheit, Verfahren zum Betreiben einer Vibrationskorrektureinheit, Sensor und Lithographieanlage mit einem Sensor |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1442755A (zh) * | 2001-12-21 | 2003-09-17 | Asml荷兰有限公司 | 光刻装置及器件制造方法 |
| CN101441420A (zh) * | 2007-10-02 | 2009-05-27 | Asml荷兰有限公司 | 光刻设备以及器件制造方法 |
| CN101446771A (zh) * | 2007-10-23 | 2009-06-03 | Asml荷兰有限公司 | 具有主动阻尼组件的光刻设备 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW316874B (enExample) * | 1995-05-30 | 1997-10-01 | Philips Electronics Nv | |
| US20030019791A1 (en) * | 2001-06-18 | 2003-01-30 | Petronetics, Llc. | Method to upgrade hydrocarbon mixtures |
| JP4574206B2 (ja) * | 2003-04-25 | 2010-11-04 | キヤノン株式会社 | 駆動装置、それを用いた露光装置、デバイスの製造方法 |
| WO2005085671A1 (ja) * | 2004-03-08 | 2005-09-15 | Nikon Corporation | 防振装置、露光装置、及び防振方法 |
| US7126674B2 (en) * | 2004-06-14 | 2006-10-24 | Asml Netherlands B.V. | Positioning device and device manufacturing method |
| JP2007103657A (ja) * | 2005-10-04 | 2007-04-19 | Canon Inc | 光学素子保持装置、露光装置およびデバイス製造方法 |
| JP2007316132A (ja) * | 2006-05-23 | 2007-12-06 | Canon Inc | 反射装置 |
| NL1036568A1 (nl) * | 2008-03-18 | 2009-09-21 | Asml Netherlands Bv | Actuator system, lithographic apparatus, and device manufacturing method. |
| NL2003424A (en) * | 2008-10-07 | 2010-04-08 | Asml Netherlands Bv | Projection assembly and lithographic apparartus. |
| EP2295829B1 (de) * | 2009-09-11 | 2016-07-13 | Integrated Dynamics Engineering | Verbessertes aktives Schwingungsisolationssystem |
| DE102012202553A1 (de) * | 2012-02-20 | 2013-08-22 | Carl Zeiss Smt Gmbh | Lithographievorrichtung mit dämpfungsvorrichtung |
-
2011
- 2011-05-06 DE DE102011075393A patent/DE102011075393B4/de not_active Expired - Fee Related
-
2012
- 2012-04-12 JP JP2014508730A patent/JP6121401B2/ja active Active
- 2012-04-12 CN CN201280022137.6A patent/CN103502891B/zh active Active
- 2012-04-12 WO PCT/EP2012/056628 patent/WO2012152520A1/en not_active Ceased
-
2013
- 2013-09-10 US US14/022,819 patent/US9081292B2/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1442755A (zh) * | 2001-12-21 | 2003-09-17 | Asml荷兰有限公司 | 光刻装置及器件制造方法 |
| CN101441420A (zh) * | 2007-10-02 | 2009-05-27 | Asml荷兰有限公司 | 光刻设备以及器件制造方法 |
| CN101446771A (zh) * | 2007-10-23 | 2009-06-03 | Asml荷兰有限公司 | 具有主动阻尼组件的光刻设备 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2012152520A1 (en) | 2012-11-15 |
| DE102011075393A1 (de) | 2012-11-08 |
| JP2014519186A (ja) | 2014-08-07 |
| JP6121401B2 (ja) | 2017-04-26 |
| DE102011075393B4 (de) | 2013-08-14 |
| US9081292B2 (en) | 2015-07-14 |
| CN103502891A (zh) | 2014-01-08 |
| US20140016109A1 (en) | 2014-01-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |