CN103390857A - Optical module lookup table generating method and device - Google Patents
Optical module lookup table generating method and device Download PDFInfo
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- CN103390857A CN103390857A CN2013102902547A CN201310290254A CN103390857A CN 103390857 A CN103390857 A CN 103390857A CN 2013102902547 A CN2013102902547 A CN 2013102902547A CN 201310290254 A CN201310290254 A CN 201310290254A CN 103390857 A CN103390857 A CN 103390857A
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Abstract
The invention discloses an optical module lookup table generating method and device. The optical module lookup table generating method comprises determining a first environment temperature point which is corresponding to the highest total current when the TEC (Thermo Electric Cooler) locking temperature is set to be a preset value; gradually raising the TEC locking temperature at the first environment temperature point and determining the optimal TEC locking temperature; updating the TEC locking temperature to be the optimal TEC locking temperature and adjusting the extinction ratio to be a target value to obtain a first modulation current set value and a first MCU (Micro Control Unit)temperature value; placing an optical module under the low temperature environment temperature, setting the TEC locking temperature to be a preset value and adjusting the extinction ratio to be a target value to obtain a second modulation current set value and a second MCU temperature value; establishing a TEC locking temperature lookup table according to the obtained first and second MCU temperature value and writing the TEC locking temperature lookup table into the optical module; establishing a modulation current lookup table according to the obtained first and second modulation current set value and writing the modulation current lookup table into the optical module. According to the optical module lookup table generating method and device, the stable performance of an EML (Electro-absorption Modulated Laser) can be improved.
Description
Technical field
The present invention relates to optical communication field, relate in particular to a kind of method and device that generates the optical module look-up table.
Background technology
Electroabsorption Modulated Laser (EML, Electro-absorption Modulated Laser) extinction ratio is to offer light emission secondary module (TOSA by the electronics secondary module, Transmitter Optical Subassembly) modulated current size determines, when average light power fixedly the time, modulated current is larger, and extinction ratio is just larger; Because the performance of EML is affected by working temperature, for fixing modulated current, when working temperature reduced, extinction ratio can reduce; When working temperature raise, extinction ratio can raise.
The variation of EML working temperature can cause the EML wave length shift, need TOSA inside to be provided with thermoelectric refrigerating unit (TEC, ThermoElectric Cooler) and control circuit, EML is carried out accurate monitoring, TEC controls refrigeration or heating by the sense of current and size that change is flowed through, and the temperature of refrigeration or heating, make the working temperature all-the-time stable of EML a fixed value.Because the EML working temperature correspondingly changes with variation of ambient temperature, when ambient temperature lower, the EML working temperature reduces, TEC needs larger electric current to produce the working temperature of heat rising EML, when ambient temperature is higher, the EML working temperature raises, and TEC needs larger electric current to absorb the working temperature of heat reduction EML, to guarantee the stability of EML, but can cause the optical module power consumption significantly to increase.
In practical application, optical module need to be adjusted the stability of modulated current with the performance of assurance optical module according to the variation of working temperature, adjusts TEC locking temperature value, to reduce power consumption.
The method of existing generation optical module look-up table, in the optical module look-up table, by ambient temperature being divided into a plurality of intervals, be arranged to different TOSA core temperature in each interval, be the TEC locking temperature, low interval in ambient temperature, the TOSA core temperature is low, in the higher interval of ambient temperature, the TOSA core temperature is high.In subsequent applications,, according to ambient temperature inquiry optical module look-up table, obtain the TOSA core temperature of setting, and TEC is worked under the TOSA of this setting core temperature.Like this, by reducing the difference of ambient temperature and TOSA core temperature, and then reduce the required electric current of TEC, thereby arrive the purpose that reduces the optical module power consumption.
By as seen above-mentioned, the method of existing generation optical module look-up table, by in advance ambient temperature being divided into a plurality of intervals, be arranged to different TOSA core temperature in each interval, reduce the difference of ambient temperature and TOSA core temperature, and then reduce the required electric current of TEC, although can reduce the optical module power consumption, but correspondingly do not regulate modulated current, cause when working temperature reduces, extinction ratio reduces; When working temperature raise, extinction ratio raise, and makes the stability of EML poor.
Summary of the invention
Goal of the invention of the present invention has been to provide a kind of method and device that generates the optical module look-up table, promotes the stability of EML.
Aspect according to an embodiment of the invention, a kind of method that generates the optical module look-up table is provided, comprise: when electric refrigerator TEC locking temperature is preset value, obtain respectively optical module corresponding total current when low temperature, normal temperature, three ambient temperature points of high temperature, determine first environment temperature spot corresponding to the highest total current; At the first environment temperature spot, the TEC locking temperature progressively raises, obtain the numerical value of corresponding total current, bias current, MCU temperature, extinction ratio,, according to the numerical value of the total current of obtaining, bias current, MCU temperature, extinction ratio, determine best electric refrigerator TEC locking temperature; Upgrading the TEC locking temperature is best TEC locking temperature, and extinction ratio is adjusted to the extinction ratio desired value that sets in advance, and obtains the first modulated current set point and a MCU temperature value; Optical module is placed at the low temperature environment temperature, and the TEC locking temperature is set to preset value, and extinction ratio is adjusted to described extinction ratio desired value, obtains the second modulated current set point and the 2nd MCU temperature value; Set up TEC locking temperature question blank according to a MCU temperature value that obtains and the 2nd MCU temperature value, and TEC locking temperature question blank is write optical module; Set up the modulated current question blank according to the first modulated current set point of obtaining and the second modulated current set point, and the modulated current question blank is write optical module.
Wherein, described extinction ratio desired value is 6.5dB.
Wherein, the MCU temperature value that described basis is obtained and the 2nd MCU temperature value are set up TEC locking temperature question blank and are comprised: take the MCU temperature as abscissa, the TEC locking temperature is ordinate, calculates the temperature slope parameter of the straight line of described preset value formation corresponding to described best TEC locking temperature corresponding to a described MCU temperature value and described the 2nd MCU temperature value; Divide the ambient temperature point,, according to the described temperature slope parameter of obtaining, calculate the TEC locking temperature value under each ambient temperature point of dividing, set up the described TEC locking temperature question blank of ambient temperature point and TEC locking temperature value mapping relations.
Wherein, described low temperature is 0 ° of C, and described high temperature is 70 ° of C, and described normal temperature is 25 ° of C, in 0 ° of C-70 ° of C scope, take 2 ° of C as interval, ambient temperature is divided into 35 temperature spots.
Wherein, the formula of described accounting temperature Slope Parameters is:
In formula,
K
1For the temperature slope parameter;
a
2For best TEC locking temperature;
a
1For TEC locking temperature preset value;
T
2It is a MCU temperature value;
T
1It is the 2nd MCU temperature value.
Wherein, the formula of described calculating TEC locking temperature value is:
a=a
1-K
1(T
1-T)
In formula,
A is the TEC locking temperature under current environmental temperature;
T is the MCU temperature value under current environmental temperature.
Wherein, the first modulated current set point that described basis is obtained and the second modulated current set point are set up the modulated current question blank and are comprised: ambient temperature is set as normal temperature, inquire about described TEC locking temperature question blank, obtain TEC locking temperature corresponding to this normal temperature, TEC is adjusted to this locking temperature, and adjust extinction ratio to described desired value, obtain the 3rd modulated current set point; Calculate modulated current normalization Slope Parameters according to described the first modulated current set point of obtaining, described the second modulated current set point and described the 3rd modulated current set point; Divide the ambient temperature point,, according to the described modulated current normalization Slope Parameters of obtaining, calculate the modulated current set point under each ambient temperature point of dividing, set up described modulated current question blank.
Wherein, the formula of described calculating modulated current normalization Slope Parameters is:
In formula,
K
2For modulated current normalization Slope Parameters;
i
2It is the first modulated current set point;
i
1It is the second modulated current set point;
i
3It is the 3rd modulated current set point.
Wherein, the formula of described calculating modulated current set point is:
i=i
2-K
2i
3(T
2-T)
In formula,
I is the modulated current set point under current environmental temperature.
Wherein, described temperature slope parameter is 1.279412; Described modulated current normalization Slope Parameters is-0.002804.
Wherein, described method further comprises: the ambient temperature of obtaining optical module, inquire about described TEC locking temperature question blank and described modulated current question blank, obtain corresponding TEC locking temperature and the modulated current of ambient temperature of described optical module, drive optical module according to the TEC locking temperature that obtains and modulated current work.
Another aspect according to an embodiment of the invention, a kind of device that generates the optical module look-up table also is provided, has comprised: power consumption processing module, locking temperature acquisition module, the first modulated current acquisition module, the second modulated current acquisition module and question blank generation module; Described power consumption processing module, be used for when the TEC locking temperature is preset value, obtains respectively optical module corresponding total current when low temperature, normal temperature, three ambient temperature points of high temperature, definite first environment temperature spot corresponding to the highest total current; Described locking temperature acquisition module, be used at described first environment temperature spot, the TEC locking temperature progressively raises, obtain the numerical value of corresponding total current, bias current, MCU temperature, extinction ratio,, according to the numerical value of the total current of obtaining, bias current, MCU temperature, extinction ratio, determine best electric refrigerator TEC locking temperature; Described the first modulated current acquisition module, be used at described first environment temperature spot, upgrading the TEC locking temperature is described best TEC locking temperature, and extinction ratio is adjusted to the extinction ratio desired value that sets in advance, and obtains the first modulated current set point and a MCU temperature value; Described the second modulated current acquisition module, be used for optical module is placed at the low temperature environment temperature, and the TEC locking temperature is set to preset value, and extinction ratio is adjusted to described extinction ratio desired value, obtains the second modulated current set point and the 2nd MCU temperature value; Described question blank generation module, be used for setting up TEC locking temperature question blank according to the described MCU temperature value and described the 2nd MCU temperature value that obtain, set up the modulated current question blank according to described the first modulated current set point of obtaining and described the second modulated current set point, and described TEC locking temperature question blank and described modulated current question blank are write optical module.
Preferably, described question blank generation module comprises: temperature slope parameter acquiring unit, TEC locking temperature question blank generation unit, the 3rd modulated current acquiring unit, modulated current normalization Slope Parameters acquiring unit, modulated current question blank generation unit; Described temperature slope parameter acquiring unit, be used for take the MCU temperature as abscissa, the TEC locking temperature is ordinate, calculates the temperature slope parameter of the straight line of described preset value formation corresponding to described best TEC locking temperature corresponding to a described MCU temperature value and described the 2nd MCU temperature value; Described TEC locking temperature question blank generation unit, be used for dividing the ambient temperature point, according to the described temperature slope parameter of obtaining, calculate the TEC locking temperature value under each ambient temperature point of dividing, set up the described TEC locking temperature question blank of ambient temperature point and TEC locking temperature value mapping relations; Described the 3rd modulated current acquiring unit, be used for ambient temperature is set as normal temperature, inquires about described TEC locking temperature question blank, obtain TEC locking temperature corresponding to this normal temperature, TEC is adjusted to this locking temperature, and adjusts extinction ratio to described desired value, obtain the 3rd modulated current set point; Described modulated current normalization Slope Parameters computing unit, be used for calculating described modulated current normalization Slope Parameters according to described the first modulated current set point of obtaining, described the second modulated current set point and described the 3rd modulated current set point; Described modulated current question blank generation unit, be used for dividing the ambient temperature point,, according to the described modulated current normalization Slope Parameters of obtaining, calculates the modulated current set point under each ambient temperature point of dividing, sets up described modulated current question blank.
Preferably, described device further comprises: TEC locking temperature and modulated current adjusting module, be used for obtaining the ambient temperature of optical module, inquire about described TEC locking temperature question blank and described modulated current question blank, obtain corresponding TEC locking temperature and the modulated current of ambient temperature of described optical module, drive optical module according to the TEC locking temperature that obtains and modulated current work.
by as seen above-mentioned, in embodiment of the present invention technical scheme, according to the optical module that obtains at low temperature, normal temperature, the corresponding modulated current set point of three ambient temperature points of high temperature, the MCU temperature value, divide the ambient temperature point, calculate each ambient temperature point corresponding TEC locking temperature and modulated current set point, generate TEC locking temperature question blank and modulated current question blank, in subsequent process, obtain ambient temperature, inquiry TEC locking temperature question blank and modulated current question blank, drive optical module according to the TEC locking temperature corresponding with ambient temperature and the modulated current work that obtain, correspondingly TEC locking temperature value and modulated current set point are set to corresponding Query Value, effectively reduce the power consumption of optical module, guarantee the extinction ratio substantially constant, promote the stability of EML.
Description of drawings
, in order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, below will the accompanying drawing of required use in embodiment or description of the Prior Art be briefly described.Apparently, the accompanying drawing in below describing is only some embodiments of the present invention, for those of ordinary skills, can also obtain according to these accompanying drawing illustrated embodiments other embodiment and accompanying drawing thereof.
Fig. 1 is the method flow schematic diagram that the embodiment of the present invention generates the optical module look-up table;
Fig. 2 is the apparatus structure schematic diagram that the embodiment of the present invention generates the optical module look-up table.
Embodiment
For making purpose of the present invention, technical scheme and advantage clearer, referring to accompanying drawing and enumerate preferred embodiment, the present invention is described in more detail.Yet, need to prove, many details of listing in specification are only in order to make the reader, to one or more aspects of the present invention, a thorough understanding be arranged, even if do not have these specific details also can realize these aspects of the present invention.
The method of existing generation optical module look-up table, by in advance ambient temperature being divided into a plurality of intervals, be arranged to different TOSA core temperature in each interval, reduce the difference of ambient temperature and TOSA core temperature, and then reduce the required electric current of TEC,, although can reduce the optical module power consumption, correspondingly do not regulate modulated current, cause when working temperature reduces, extinction ratio reduces; When working temperature raise, extinction ratio raise, and makes the stability of EML poor.
in embodiments of the present invention, a kind of method and device that generates the optical module look-up table is provided, the optical module that obtains by basis is at low temperature, normal temperature, the corresponding modulated current set point of three ambient temperature points of high temperature, the MCU temperature value, divide the ambient temperature point, calculate each ambient temperature point corresponding TEC locking temperature and modulated current set point, generate TEC locking temperature question blank and modulated current question blank, in subsequent process, obtain ambient temperature, inquiry TEC locking temperature question blank and modulated current question blank, drive optical module according to the TEC locking temperature corresponding with ambient temperature and the modulated current work that obtain, correspondingly TEC locking temperature value and modulated current set point are set to corresponding Query Value, effectively reduce the power consumption of optical module, guarantee the extinction ratio substantially constant, promote the stability of EML.
Fig. 1 is the method flow schematic diagram that the embodiment of the present invention generates the optical module look-up table.Referring to Fig. 1, this flow process comprises:
In this step, TEC locking temperature preset value is 48 ° of C, optical module is placed in respectively under-5 ° of C low temperature environments, 25 ° of C normal temperature environments, 70 ° of C hot environments and works.
The numerical tabular of the optical module that table 1 obtains for the embodiment of the present invention corresponding total current, bias current, MCU temperature, extinction ratio when three ambient temperature point work.
Table 1
In table 1, the working temperature of the whole optical module of the working temperature of MCU reaction, as the reference foundation.
With reference to table 1 data, in the 3rd group of data, the total current of optical module is 640mA, is three groups of the highest total currents in data, determines that 70 ° of C corresponding to the highest total current are the first environment temperature spot.
In this step, optical module is placed under 70 ° of C hot environments and works, the TEC locking temperature is from 48 ° of C, progressively rise to 53 ° of C, 58 ° of C, 60 ° of C, observe the variation of eye diagram quality, with cause the optical module total current low and and the measured TEC locking temperature of the matter value of eye pattern as best TEC locking temperature value.
The numerical tabular of the optical module that table 2 obtains for the embodiment of the present invention corresponding total current, bias current, MCU temperature, extinction ratio when four TEC locking temperature point work.
Table 2
In table 2, the working temperature of the whole optical module of the working temperature of MCU reaction, as the reference foundation.
With reference to table 2 data, when the TEC locking temperature rose to 58 ° of C, the total current of optical module was 433mA, and extinction ratio is 7.96dB; When the TEC locking temperature rose to 60 ° of C, the optical module total current was 407mA, and extinction ratio is 8.45dB; The total current of optical module when this two TEC locking temperature points is low, simultaneously, because the factor that affects eye diagram quality is mainly extinction ratio and average light power, the size of bias current determines the size of average light power, in table, the bias current substantially constant, just say that also average light power is constant, the target extinction ratio of business level EML is 6.5dB, as long as extinction ratio is more near 6.5dB, eye diagram quality is better, can determine that 58 ° of C are best TEC locking temperature value.
In this step, optical module is worked under 70 ° of C hot environments, and the TEC locking temperature is 58 ° of C, by adjusting modulated current, make extinction ratio reach 6.5dB, record modulated current set point and MCU temperature value at this moment, as the first modulated current set point and a MCU temperature value.
In actual applications, use the optical module of business level as reference standard, the extinction ratio of optical module is remained on 6.5dB as desired value.
In this step, optical module is worked under 0 ° of C low temperature environment, and the TEC locking temperature is 58 ° of C of preset value, by adjusting modulated current, make extinction ratio reach 6.5dB, record modulated current set point and MCU temperature value at this moment, as the second modulated current set point and the 2nd MCU temperature value.
In this step, set up TEC locking temperature question blank according to a MCU temperature value that obtains and the 2nd MCU temperature value and comprise:
A11, take the MCU temperature as abscissa, the TEC locking temperature is ordinate, calculates the temperature slope parameter of the straight line of preset value formation corresponding to best TEC locking temperature corresponding to a MCU temperature value and the 2nd MCU temperature value;
The formula of accounting temperature Slope Parameters is:
In formula,
K
1For the temperature slope parameter;
a
2For best TEC locking temperature under the first environment temperature spot;
a
1For TEC locking temperature preset value under the low temperature environment temperature spot;
T
2It is a MCU temperature value;
T
1It is the 2nd MCU temperature value;
In this step, slope K
1Be 1.279412.
A12, divide the ambient temperature point,, according to the Slope Parameters of obtaining, calculates the TEC locking temperature value under each ambient temperature point of dividing, sets up the TEC locking temperature question blank of ambient temperature point and TEC locking temperature value mapping relations.
In this step, the residing ambient temperature of optical module is when 0 ° of C-70 ° of C range, and corresponding TEC locking temperature computing formula is:
a=a
1-K
1(T
1-T)
In formula,
a
1For TEC locking temperature under the low temperature environment temperature spot presets;
T
1It is the 2nd MCU temperature value;
T is MCU temperature value under current environmental temperature;
K
1For the temperature slope parameter;
In 0 ° of C-70 ° of C scope, take 2 ° of C as interval, ambient temperature is marked off 35 temperature spots, according to TEC locking temperature computing formula, and MCU temperature value correspondingly, calculate TEC locking temperature numerical value under one group of varying environment temperature spot of dividing, set up the TEC locking temperature question blank of ambient temperature point and TEC locking temperature value mapping relations.
In practical application, the optical module applied environment temperature range of business level is 0 ° of C-70 ° of C.
In this step, setting up the modulated current question blank according to the first modulated current set point of obtaining and the second modulated current set point comprises:
A21, be set as normal temperature with ambient temperature, and inquiry TEC locking temperature question blank, obtain TEC locking temperature corresponding to this normal temperature, TEC is adjusted to this locking temperature, and adjusts extinction ratio to desired value, obtains the 3rd modulated current set point;
In this step, optical module is placed at 25 ° of C normal temperature environment temperature and works, inquiry TEC locking temperature question blank, obtain 25 ° of TEC locking temperature values that the C temperature spot is corresponding, TEC is adjusted to this locking temperature adjusts simultaneously extinction ratio to 6.5dB, obtain the modulated current set point of this moment, as the 3rd modulated current set point.
A22, calculate modulated current normalization Slope Parameters according to the first modulated current set point of obtaining, the second modulated current set point and the 3rd modulated current set point;
In this step, the formula that calculates modulated current normalization slope is
In formula,
i
2It is the first modulated current set point;
i
1It is the second modulated current set point;
i
3It is the 3rd modulated current set point;
T
2It is a MCU temperature value;
T
1It is the 2nd MCU temperature value.
Preferably, modulated current normalization slope K
2For-0.002804.
In this step, because there is certain otherness in the consistency of the modulated current set point of each optical module, adopt 3 temperature spots to proofread and correct, be that ceiling temperature point is divided by with the difference of lower limit temperature point MCU temperature value with difference and the ceiling temperature point of lower limit temperature point modulated current set point, obtain modulated current normalization Slope Parameters with the reciprocal multiplication of normal temperature modulated current setting value again, this parameter has more accuracy.
A23, divide the ambient temperature point,, according to the modulated current normalization Slope Parameters of obtaining, calculates the modulated current set point under each ambient temperature point of dividing, sets up the modulated current question blank;
In this step, the residing ambient temperature of optical module is when 0 ° of C-70 ° of C range, and corresponding modulated current computing formula is:
i=i
2-K
2i
3(T
2-T)
In formula,
i
3It is the 3rd modulated current set point;
i
2It is the first modulated current set point;
T
2It is a MCU temperature value;
T is MCU temperature value under current environmental temperature;
K
2For modulated current normalization slope;
In 0 ° of C-70 ° of C scope, take 2 ° of C as interval, ambient temperature is marked off 35 temperature spots, according to the modulated current computing formula, and MCU temperature value correspondingly, calculate one group of modulated current set point under the varying environment temperature spot of dividing, set up the modulated current question blank of ambient temperature point and modulated current set point mapping relations.
Table 3 is placed in the varying environment temperature for the embodiment of the present invention with optical module, after TEC locking temperature question blank and modulated current question blank adjustment TEC locking temperature and modulated current, and the numerical tabular of the total current of acquisition, MCU temperature, extinction ratio.
Table 3
| Ambient temperature (° C) | Module total current (mA) | MCU temperature (° C) | Extinction ratio (dB) |
| -5 | 391 | 16.5 | 6.59 |
| 25 | 310 | 41.3 | 6.51 |
| 70 | 412 | 90.3 | 6.62 |
Above-mentioned experimental result shows, optical module is placed in respectively at low temperature, normal temperature and hot environment temperature, after adjusting TEC locking temperature value and modulated current set point by TEC locking temperature question blank and modulated current question blank, the extinction ratio of optical module is floated up and down among a small circle at 6.5dB, substantially constant, meet the desired value of business level application, and the value of total current reduces obviously under extreme temperature conditions.
Fig. 2 is the structural representation that the embodiment of the present invention generates the device of optical module look-up table.Referring to Fig. 2, this device comprises: power consumption processing module 201, locking temperature acquisition module 202, the first modulated current acquisition module 203, the second modulated current acquisition module 204, question blank generation module 205; Wherein,
Power consumption processing module 201, be used for when the TEC locking temperature is preset value, obtains respectively optical module corresponding total current when low temperature, normal temperature, three ambient temperature points of high temperature, definite first environment temperature spot corresponding to the highest total current;
Locking temperature acquisition module 202, be used at the first environment temperature spot, the TEC locking temperature progressively raises, obtain the numerical value of corresponding total current, bias current, MCU temperature, extinction ratio,, according to the numerical value of the total current of obtaining, bias current, MCU temperature, extinction ratio, determine best electric refrigerator TEC locking temperature;
The first modulated current acquisition module 203, be used at the first environment temperature spot, and upgrading the TEC locking temperature is best TEC locking temperature, and extinction ratio is adjusted to the extinction ratio desired value that sets in advance, and obtains the first modulated current set point and a MCU temperature value;
The second modulated current acquisition module 204, be used for optical module is placed at the low temperature environment temperature, and the TEC locking temperature is set to preset value, and extinction ratio is adjusted to described extinction ratio desired value, obtains the second modulated current set point and the 2nd MCU temperature value;
Question blank generation module 205, be used for setting up TEC locking temperature question blank according to the MCU temperature value and the 2nd MCU temperature value that obtain, set up the modulated current question blank according to the first modulated current set point of obtaining and the second modulated current set point, and TEC locking temperature question blank and modulated current question blank are write optical module.
Question blank generation module 205 comprises: temperature slope parameter acquiring unit, TEC locking temperature question blank generation unit, the 3rd modulated current acquiring unit, modulated current normalization Slope Parameters acquiring unit, modulated current question blank generation unit;
The temperature slope parameter acquiring unit, be used for take the MCU temperature as abscissa, and the TEC locking temperature is ordinate, calculates the temperature slope parameter of the straight line of preset value formation corresponding to best TEC locking temperature corresponding to a MCU temperature value and the 2nd MCU temperature value;
TEC locking temperature question blank generation unit, be used for dividing the ambient temperature point, according to the temperature slope parameter of obtaining, calculate the TEC locking temperature value under each ambient temperature point of dividing, set up the TEC locking temperature question blank of ambient temperature point and TEC locking temperature value mapping relations;
The 3rd modulated current acquiring unit, be used for ambient temperature is set as normal temperature, inquiry TEC locking temperature question blank, obtain TEC locking temperature corresponding to this normal temperature, TEC is adjusted to this locking temperature, and adjusts extinction ratio to desired value, obtain the 3rd modulated current set point;
Modulated current normalization Slope Parameters acquiring unit, be used for calculating modulated current normalization Slope Parameters according to the first modulated current set point of obtaining, the second modulated current set point and the 3rd modulated current set point;
Modulated current question blank generation unit, be used for dividing the ambient temperature point,, according to the modulated current normalization Slope Parameters of obtaining, calculates the modulated current set point under each ambient temperature point of dividing, sets up the modulated current question blank.
Further, the device that the embodiment of the present invention generates the optical module look-up table also comprises TEC locking temperature and modulated current adjusting module 206, TEC locking temperature and modulated current adjusting module 206 are used for inquiry TEC locking temperature question blank and modulated current question blank, obtain corresponding TEC locking temperature and the modulated current of ambient temperature of optical module, drive optical module according to the TEC locking temperature that obtains and modulated current work.
The foregoing is only preferred embodiment of the present invention, not be used for limiting the scope of the invention.Within the spirit and principles in the present invention all, any modification of doing, be equal to and replace and improvement etc., all should be included in protection scope of the present invention.
Claims (10)
1. a method that generates the optical module look-up table, is characterized in that, comprising:
When electric refrigerator TEC locking temperature is preset value, obtain respectively optical module corresponding total current when low temperature, normal temperature, three ambient temperature points of high temperature, determine first environment temperature spot corresponding to the highest total current;
At the first environment temperature spot, the TEC locking temperature progressively raises, obtain the numerical value of corresponding total current, bias current, MCU temperature, extinction ratio,, according to the numerical value of the total current of obtaining, bias current, MCU temperature, extinction ratio, determine best electric refrigerator TEC locking temperature;
Upgrading the TEC locking temperature is best TEC locking temperature, and extinction ratio is adjusted to the extinction ratio desired value that sets in advance, and obtains the first modulated current set point and a MCU temperature value;
Optical module is placed at the low temperature environment temperature, and the TEC locking temperature is set to preset value, and extinction ratio is adjusted to described extinction ratio desired value, obtains the second modulated current set point and the 2nd MCU temperature value;
Set up TEC locking temperature question blank according to a MCU temperature value that obtains and the 2nd MCU temperature value, and TEC locking temperature question blank is write optical module;
Set up the modulated current question blank according to the first modulated current set point of obtaining and the second modulated current set point, and the modulated current question blank is write optical module.
2. method according to claim 1, wherein, described extinction ratio desired value is 6.5dB.
3. method according to claim 1, wherein, the MCU temperature value that described basis is obtained and the 2nd MCU temperature value are set up TEC locking temperature question blank and are comprised:
Take the MCU temperature as abscissa, the TEC locking temperature is ordinate, calculates the temperature slope parameter of the straight line of preset value formation corresponding to best TEC locking temperature corresponding to a MCU temperature value and the 2nd MCU temperature value;
Divide the ambient temperature point,, according to the Slope Parameters of obtaining, calculate the TEC locking temperature value under each ambient temperature point of dividing, set up the TEC locking temperature question blank of ambient temperature point and TEC locking temperature value mapping relations.
4. method according to claim 3, wherein, described low temperature is 0 ° of C, and described high temperature is 70 ° of C, and described normal temperature is 25 ° of C, in 0 ° of C-70 ° of C scope, take 2 ° of C as interval, ambient temperature is divided into 35 temperature spots.
5. method according to claim 1, wherein, the first modulated current set point that described basis is obtained and the second modulated current set point are set up the modulated current question blank and are comprised:
Ambient temperature is set as normal temperature, and inquiry TEC locking temperature question blank, obtain TEC locking temperature corresponding to this normal temperature, TEC is adjusted to this locking temperature, and adjusts extinction ratio to desired value, obtains the 3rd modulated current set point;
Calculate modulated current normalization Slope Parameters according to the first modulated current set point of obtaining, the second modulated current set point and the 3rd modulated current set point;
Divide the ambient temperature point,, according to the modulated current normalization Slope Parameters of obtaining, calculate the modulated current set point under each ambient temperature point of dividing, set up the modulated current question blank.
6. according to claim 3 or 5 described methods, wherein,
Described temperature slope parameter is 1.279412; Described modulated current normalization Slope Parameters is-0.002804.
7. the described method of according to claim 1 to 6 any one, wherein, described method further comprises:
Obtain the ambient temperature of optical module, inquire about described TEC locking temperature question blank and modulated current question blank, obtain corresponding TEC locking temperature and the modulated current of ambient temperature of described optical module, drive optical module according to the TEC locking temperature that obtains and modulated current work.
8. a device that generates the optical module look-up table, is characterized in that, comprising: power consumption processing module, locking temperature acquisition module, the first modulated current acquisition module, the second modulated current acquisition module and question blank generation module; Wherein,
The power consumption processing module, be used for when the TEC locking temperature is preset value, obtains respectively optical module corresponding total current when low temperature, normal temperature, three ambient temperature points of high temperature, definite first environment temperature spot corresponding to the highest total current;
The locking temperature acquisition module, be used at the first environment temperature spot, the TEC locking temperature progressively raises, obtain the numerical value of corresponding total current, bias current, MCU temperature, extinction ratio,, according to the numerical value of the total current of obtaining, bias current, MCU temperature, extinction ratio, determine best electric refrigerator TEC locking temperature;
The first modulated current acquisition module, be used at the first environment temperature spot, and upgrading the TEC locking temperature is best TEC locking temperature, and extinction ratio is adjusted to the extinction ratio desired value that sets in advance, and obtains the first modulated current set point and a MCU temperature value;
The second modulated current acquisition module, be used for optical module is placed at the low temperature environment temperature, and the TEC locking temperature is set to preset value, and extinction ratio is adjusted to described extinction ratio desired value, obtains the second modulated current set point and the 2nd MCU temperature value;
The question blank generation module, be used for setting up TEC locking temperature question blank according to the MCU temperature value and the 2nd MCU temperature value that obtain, set up the modulated current question blank according to the first modulated current set point of obtaining and the second modulated current set point, and TEC locking temperature question blank and modulated current question blank are write optical module.
9. device according to claim 8, it is characterized in that, described question blank generation module comprises: temperature slope parameter acquiring unit, TEC locking temperature question blank generation unit, the 3rd modulated current acquiring unit, modulated current normalization Slope Parameters acquiring unit, modulated current question blank generation unit; Wherein,
The temperature slope parameter acquiring unit, be used for take the MCU temperature as abscissa, the TEC locking temperature is ordinate, calculates the temperature slope parameter of the straight line of described preset value formation corresponding to described best TEC locking temperature corresponding to a described MCU temperature value and described the 2nd MCU temperature value;
TEC locking temperature question blank generation unit, be used for dividing the ambient temperature point, according to the described temperature slope parameter of obtaining, calculate the TEC locking temperature value under each ambient temperature point of dividing, set up the described TEC locking temperature question blank of ambient temperature point and TEC locking temperature value mapping relations;
The 3rd modulated current acquiring unit, be used for ambient temperature is set as normal temperature, inquires about described TEC locking temperature question blank, obtain TEC locking temperature corresponding to this normal temperature, TEC is adjusted to this locking temperature, and adjusts extinction ratio to described desired value, obtain the 3rd modulated current set point;
Modulated current normalization Slope Parameters computing unit, be used for calculating described modulated current normalization Slope Parameters according to described the first modulated current set point of obtaining, described the second modulated current set point and described the 3rd modulated current set point;
Modulated current question blank generation unit, be used for dividing the ambient temperature point,, according to the described modulated current normalization Slope Parameters of obtaining, calculates the modulated current set point under each ambient temperature point of dividing, sets up described modulated current question blank.
10. according to claim 8 or claim 9 device, is characterized in that, further comprises:
TEC locking temperature and modulated current adjusting module, be used for obtaining the ambient temperature of optical module, inquire about described TEC locking temperature question blank and described modulated current question blank, obtain corresponding TEC locking temperature and the modulated current of ambient temperature of described optical module, drive optical module according to the TEC locking temperature that obtains and modulated current work.
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