CN110289550B - Current correction method and device for optical module and computer readable storage medium - Google Patents
Current correction method and device for optical module and computer readable storage medium Download PDFInfo
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- CN110289550B CN110289550B CN201910559263.9A CN201910559263A CN110289550B CN 110289550 B CN110289550 B CN 110289550B CN 201910559263 A CN201910559263 A CN 201910559263A CN 110289550 B CN110289550 B CN 110289550B
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Abstract
The invention discloses a current correction method of an optical module. The method comprises the following steps: obtaining an original temperature lookup table of an optical module and a plurality of bias current debugging values in a preset temperature interval; and calculating according to the plurality of bias current debugging values and a preset calculation formula to obtain corresponding correction values, and correcting the original temperature lookup table according to the correction values. The invention also discloses a current correction device of the optical module and a computer readable storage medium. The invention can realize the correction method of the temperature lookup table of the optical module, ensure that the optical module can load proper bias current on the laser in a certain high-temperature range, and stabilize the extinction ratio of the optical module in a certain range.
Description
Technical Field
The present invention relates to the field of optical modules, and in particular, to a method and an apparatus for correcting current of an optical module, and a computer-readable storage medium.
Background
The optical module is called as optical receiving-transmitting integrated module, it is the core device in optical communication, it can complete the optical-electric/electric-optical conversion process of optical signal, it is formed from photoelectronic device, functional circuit and optical interface, in which the photoelectronic device includes receiving and transmitting two portions. In brief, the receiving portion converts an optical signal into an electrical signal, and the transmitting portion converts the electrical signal into an optical signal. In the optical-electrical/electrical-optical conversion process, along with the rise of temperature, the optical module needs to load a driving current on an internal laser through a driving chip in the optical module, so that the optical power and the extinction ratio of the laser are controlled within a certain range, and the problem that the slope efficiency curve of the laser becomes slow along with the rise of temperature is solved.
At present, in a certain temperature range, the driving current value is converted into a voltage DAC value, and the DAC value is scaled according to a certain proportion according to the voltage DAC value to generate a temperature lookup table of the corresponding relation between the DAC value of the driving current and the temperature so as to adjust the driving current loaded on the laser and well meet the requirements. The total is divided into two parts, namely bias current and modulation current. Under open-loop control, modulation current changes have a greater effect on the magnitude of the output optical power, and bias current changes have a greater effect on the magnitude of the extinction ratio. In normal temperature debugging, a bias current lookup table and a modulation current lookup table are generally generated. However, within a certain high temperature range, the difference between the working characteristics of the actual laser and the bias current adjusted by using the bias current temperature lookup table is large, so that the optical parameter index of the extinction ratio is unqualified.
Disclosure of Invention
The invention mainly aims to provide a current correction method, a current correction device and a computer readable storage medium for an optical module, and aims to provide a method for performing high-temperature compensation on a temperature lookup table of the optical module, so that the optical module can load appropriate bias current on a laser within a certain high-temperature range, and the extinction ratio of the optical module is stabilized within a certain range.
In order to achieve the above object, the present invention provides a current correction method for an optical module, including:
obtaining an original temperature lookup table of an optical module and a plurality of bias current debugging values in a preset temperature interval;
and calculating according to the plurality of bias current debugging values and a preset calculation formula to obtain corresponding correction values, and correcting the original temperature lookup table according to the correction values.
Optionally, the step of obtaining an original temperature lookup table of the light module includes:
obtaining a corresponding relation between a DAC value of the bias current and the temperature;
and zooming the corresponding relation according to a preset proportion and then drawing a table to obtain an original temperature lookup table of the optical module.
Optionally, the step of obtaining a plurality of bias current debug values within a preset temperature interval of the optical module includes:
and adjusting the bias current values of the optical module at a plurality of temperatures in a preset temperature interval according to preset requirements to obtain a plurality of bias current debugging values meeting the requirements.
Optionally, the step of calculating according to the plurality of bias current debugging values and a preset calculation formula to obtain corresponding correction values, and correcting the original temperature lookup table according to the correction values includes:
calculating a first bias current debugging value under a first preset temperature value, a second bias current debugging value under a second preset temperature value and a data value in the original temperature lookup table according to a first preset formula to obtain a calculation intermediate value;
obtaining a correction value corresponding to each temperature value according to the calculation intermediate value and a second preset formula;
and correcting the original temperature lookup table according to the correction value.
Optionally, the first preset formula is:
Cn-C0＝n*a1+n*(n-1)/2*X；
a1＝C1-C0；
n＝(1+(B-A)/T)；
wherein n is the total number of temperatures in the preset temperature interval, a is the first preset temperature value, B is the second preset temperature value, T is the temperature interval value, Cn is the second bias current value, C1 is the first bias current value, C0 is the bias current value of the a-T temperature point in the original temperature lookup table, and X is the calculation intermediate value.
Optionally, the second preset formula is:
am-am-1＝(m-1)X；
am＝Cm-Cm-1，m∈[1-n]；
wherein, CmBias current value of m temperature points, Cm-1The bias current value of the temperature point m-1, X is the calculated intermediate value, and m represents any temperature point in n temperatures.
Optionally, the step of correcting the original temperature lookup table according to the correction value includes:
and changing the bias current value at the corresponding temperature of the original temperature lookup table into the corrected value.
Optionally, the optical module comprises a 25G optical module.
In order to achieve the above object, the present invention also provides a current correction device for an optical module, including: a memory, a processor and a current correction program of the optical module stored on the memory and capable of running on the processor, wherein the current correction program of the optical module realizes the steps of the current correction method of the optical module when being executed by the processor.
In order to achieve the above object, the present invention further provides a computer-readable storage medium having a current correction program for an optical module stored thereon, the current correction program for an optical module, when executed by a processor, implementing the steps of the above current correction method for an optical module.
The invention provides a current correction method and device for an optical module and a computer storage medium. In the method, an original temperature lookup table of an optical module and a plurality of bias current debugging values in a preset temperature interval are obtained; and calculating according to the plurality of bias current debugging values and a preset calculation formula to obtain corresponding correction values, and correcting the original temperature lookup table according to the correction values. Through the mode, the high-temperature section in the temperature lookup table in the optical module can be corrected through the bias current debugging value obtained through debugging at high temperature, so that the optical module loads bias current to operate according to the corrected temperature lookup table, the extinction ratio of the optical module can be stabilized in a target interval at high temperature, namely the optical parameter index of the optical module is qualified, and the integral power consumption of the optical module is guaranteed to meet the requirement.
Drawings
FIG. 1 is a schematic diagram of an apparatus in a hardware operating environment according to an embodiment of the present invention;
FIG. 2 is a flowchart illustrating a first embodiment of a current correction method for an optical module according to the present invention;
FIG. 3 is a flowchart illustrating a current correction method for an optical module according to a second embodiment of the present invention;
FIG. 4 is a flowchart illustrating a current correction method for an optical module according to a third embodiment of the present invention;
FIG. 5 is a flowchart illustrating a fourth embodiment of a current correction method for an optical module according to the present invention;
FIG. 6 is a flowchart illustrating a fifth embodiment of a current correction method for an optical module according to the present invention;
FIG. 7 is a schematic view illustrating temperature search according to a first embodiment of a method for correcting a current of an optical module according to the present invention;
fig. 8 is a schematic calculation diagram of a temperature lookup table according to a fourth embodiment of the current correction method for an optical module of the present invention.
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
As shown in fig. 1, fig. 1 is a schematic device structure diagram of a hardware operating environment according to an embodiment of the present invention.
The terminal of the embodiment of the invention can be a PC, and can also be a terminal device with a data processing function, such as a smart phone, a tablet computer, a portable computer and the like.
As shown in fig. 1, the terminal may include: a processor 1001, such as a CPU, a network interface 1004, a user interface 1003, a memory 1005, a communication bus 1002. Wherein a communication bus 1002 is used to enable connective communication between these components. The user interface 1003 may include a Display screen (Display), an input unit such as a Keyboard (Keyboard), and the optional user interface 1003 may also include a standard wired interface, a wireless interface. The network interface 1004 may optionally include a standard wired interface, a wireless interface (e.g., WI-FI interface). The memory 1005 may be a high-speed RAM memory or a non-volatile memory (e.g., a magnetic disk memory). The memory 1005 may alternatively be a storage device separate from the processor 1001.
Optionally, the terminal may further include a camera, a Radio Frequency (RF) circuit, a sensor, an audio circuit, a Wi-Fi module, and the like. Such as light sensors, motion sensors, and other sensors. Specifically, the light sensor may include an ambient light sensor that may adjust the brightness of the display screen according to the brightness of ambient light, and a proximity sensor that may turn off the display screen and/or the backlight when the mobile terminal is moved to the ear. As one of the motion sensors, the gravity acceleration sensor can detect the magnitude of acceleration in each direction (generally, three axes), detect the magnitude and direction of gravity when the mobile terminal is stationary, and can be used for applications (such as horizontal and vertical screen switching, related games, magnetometer attitude calibration), vibration recognition related functions (such as pedometer and tapping) and the like for recognizing the attitude of the mobile terminal; of course, the mobile terminal may also be configured with other sensors such as a gyroscope, a barometer, a hygrometer, a thermometer, and an infrared sensor, which are not described herein again.
Those skilled in the art will appreciate that the terminal structure shown in fig. 1 is not intended to be limiting and may include more or fewer components than those shown, or some components may be combined, or a different arrangement of components.
As shown in fig. 1, a memory 1005, which is a kind of computer storage medium, may include therein a current correction program of an operating system, a network communication module, a user interface module, and a light module.
In the terminal shown in fig. 1, the network interface 1004 is mainly used for connecting to a backend server and performing data communication with the backend server; the user interface 1003 is mainly used for connecting a client (user side) and performing data communication with the client; and the processor 1001 may be configured to call a current modification program of the optical module stored in the memory 1005, and perform the following operations:
obtaining an original temperature lookup table of an optical module and a plurality of bias current debugging values in a preset temperature interval;
and calculating according to the plurality of bias current debugging values and a preset calculation formula to obtain corresponding correction values, and correcting the original temperature lookup table according to the correction values.
Further, the processor 1001 may call the current correction program of the optical module stored in the memory 1005, and further perform the following operations:
obtaining a corresponding relation between a DAC value of the bias current and the temperature;
and zooming the corresponding relation according to a preset proportion and then drawing a table to obtain an original temperature lookup table of the optical module.
Further, the processor 1001 may call the current correction program of the optical module stored in the memory 1005, and further perform the following operations:
and adjusting the bias current values of the optical module at a plurality of temperatures in a preset temperature interval according to preset requirements to obtain a plurality of bias current debugging values meeting the requirements.
Further, the processor 1001 may call the current correction program of the optical module stored in the memory 1005, and further perform the following operations:
calculating a first bias current debugging value under a first preset temperature value, a second bias current debugging value under a second preset temperature value and a data value in the original temperature lookup table according to a first preset formula to obtain a calculation intermediate value;
obtaining a correction value corresponding to each temperature value according to the calculation intermediate value and a second preset formula;
and correcting the original temperature lookup table according to the correction value.
Further, the processor 1001 may call the current correction program of the optical module stored in the memory 1005, and further perform the following operations:
the first preset formula is as follows:
Cn-C0＝n*a1+n*(n-1)/2*X；
a1＝C1-C0；
n＝(1+(B-A)/T)；
wherein n is the total number of temperatures in the preset temperature interval, a is the first preset temperature value, B is the second preset temperature value, T is the temperature interval value, Cn is the second bias current value, C1 is the first bias current value, C0 is the bias current value of the a-T temperature point in the original temperature lookup table, and X is the calculation intermediate value.
Further, the processor 1001 may call the current correction program of the optical module stored in the memory 1005, and further perform the following operations:
the second preset formula is as follows:
am-am-1＝(m-1)X；
am＝Cm-Cm-1，m∈[1-n]；
wherein, CmBias current value of m temperature points, Cm-1The bias current value of the temperature point m-1, X is the calculated intermediate value, and m represents any temperature point in n temperatures.
Further, the processor 1001 may call the current correction program of the optical module stored in the memory 1005, and further perform the following operations:
and changing the bias current value at the corresponding temperature of the original temperature lookup table into the corrected value.
Further, the processor 1001 may call the current correction program of the optical module stored in the memory 1005, and further perform the following operations:
the optical module comprises a 25G optical module.
The specific embodiment of the current correction device for an optical module of the present invention is substantially the same as the embodiments of the current correction method for an optical module described below, and is not described herein again.
Referring to fig. 2, fig. 2 is a flowchart illustrating a current correction method for an optical module according to a first embodiment of the present invention, where the current correction method for the optical module includes:
step S100, obtaining an original temperature lookup table of an optical module and a plurality of bias current debugging values in a preset temperature interval;
in the use process of the optical module, due to the rise of the temperature, the deterioration of an oblique efficiency curve of a laser in the optical module is accelerated, so that a mode of loading a bias current on the laser is needed, and the overall energy consumption of the optical module meets the requirement. Generally, a temperature lookup table needs to be written in the laser, and the bias current is loaded according to the corresponding relation between the DAC value of the bias current and the temperature in the temperature lookup table. However, in a high temperature environment, the bias current is adjusted by using the temperature lookup table, which has a large difference from the actual working characteristics of the laser, so that the optical parameter index of the extinction ratio is unqualified. Therefore, the invention corrects the high-temperature section of the temperature lookup table, so that the corrected temperature lookup table can meet the actual requirement. Firstly, an original temperature lookup table of an optical module and a plurality of bias current debugging values in a preset temperature interval are obtained, the optical module can be a 25G optical module, and the 25G optical module modulated by a single channel has high speed and excellent usability. The original temperature lookup table is a temperature lookup table without correction, and is generally a temperature lookup table in which a bias current DAC value is generated by converting a bias current value into a voltage DAC value (hereinafter referred to as a bias current DAC value) and scaling the voltage DAC value in a certain proportion to generate a corresponding relationship between the bias current DAC value and temperature, and in the table, a curve with a certain rule is formed by a temperature value and the bias current DAC value. The preset temperature interval is a set high temperature interval, namely a high temperature section needing to be corrected in the temperature lookup table. The bias current debugging value is a group of debugging values obtained by debugging the extinction ratio in the temperature range of the high-temperature interval.
For example, fig. 7, a is a curve of the original temperature lookup table of the module 1 and the module 2, and B, C is a curve of the modified temperature lookup table of the module 1 and the module 2, it can be found that the curve of the modified temperature lookup table is greatly different from the curve of the original temperature lookup table in a high temperature range, especially at 72 to 88 degrees celsius (the housing temperature), and if the scaled BIAS temperature lookup table is written into the module, the problem of poor (larger) extinction ratio may occur. The curve of the corrected temperature lookup table can enable the performance of the optical module to be stable in a high-temperature section, and the extinction ratio can be controlled within a proper range.
And step S200, calculating according to the plurality of bias current debugging values and a preset calculation formula to obtain corresponding correction values, and correcting the original temperature lookup table according to the correction values.
After obtaining an original temperature lookup table of an optical module and a plurality of bias current debugging values in a preset temperature interval, calculating according to the plurality of bias current debugging values and a preset calculation formula to obtain corresponding correction values, and correcting the original temperature lookup table according to the correction values. After the correction value is obtained, interpolation correction processing is carried out on the high-temperature lookup table section in the original temperature lookup table, so that the extinction ratio can be stabilized in a target value interval in the whole high-temperature section, and the temperature lookup table of more accurate bias current can be obtained. Because each module is debugged at high temperature and a specific interpolation compensation method is adopted, the lookup table curves of the laser of each module are different and are suitable for the module, and the qualified purpose is achieved. And under high temperature, loading corresponding current according to the corrected temperature lookup table, so that the extinction ratio of the optical module can be stabilized in a range.
The invention provides a current correction method and device for an optical module and a computer storage medium. In the method, an original temperature lookup table of an optical module and a plurality of bias current debugging values in a preset temperature interval are obtained; and calculating according to the plurality of bias current debugging values and a preset calculation formula to obtain corresponding correction values, and correcting the original temperature lookup table according to the correction values. Through the mode, the high-temperature section in the temperature lookup table in the optical module can be corrected through the bias current debugging value obtained through debugging at high temperature, so that the optical module loads bias current to operate according to the corrected temperature lookup table, the extinction ratio of the optical module can be stabilized in a target interval at high temperature, namely the optical parameter index of the optical module is qualified, and the integral power consumption of the optical module is guaranteed to meet the requirement.
Referring to fig. 3, fig. 3 is a flowchart illustrating a current correction method for an optical module according to a second embodiment of the present invention.
Based on the foregoing embodiment, in this embodiment, step S100 includes:
step S110, obtaining a corresponding relation between a DAC value of the bias current and the temperature;
in this embodiment, a corresponding relationship between the DAC value of the offset current and the temperature is obtained first. The corresponding relation is obtained by debugging the extinction ratio at normal temperature, specifically, bias currents at normal temperature, such as 15 degrees centigrade and 20 degrees centigrade, are obtained respectively through testing, and the corresponding relation between the DAC value of the dynamic current and the temperature is obtained through calculation according to the obtained 2 current values.
And step S120, drawing a table after the corresponding relation is scaled according to a preset proportion, and obtaining an original temperature lookup table of the optical module.
And after the corresponding relation between the offset current DAC value and the temperature is obtained, scaling the corresponding relation according to a preset proportion to obtain an original temperature lookup table of the optical module. The data in the original temperature lookup table is obtained by debugging the extinction ratio at normal temperature, so that the data of the high-temperature section of the original temperature lookup table is inaccurate for the high-temperature condition.
Referring to fig. 4, fig. 4 is a flowchart illustrating a current correction method for an optical module according to a third embodiment of the present invention.
Based on the foregoing embodiment, in this embodiment, step S100 includes:
step S130, adjusting the bias current values of the optical module at a plurality of temperatures in a preset temperature interval according to preset requirements, and obtaining a plurality of bias current debugging values meeting the requirements.
In this embodiment, the bias current values of the optical module at multiple temperatures in the preset temperature interval are adjusted according to the preset requirement, so as to obtain multiple bias current debug values meeting the requirement. After the high temperature is stable within a preset high temperature range, debugging the extinction ratio of the optical module according to the preset requirement is carried out, and the obtained bias current debugging value meets the requirement of the extinction ratio.
Referring to fig. 5, fig. 5 is a flowchart illustrating a current correction method for an optical module according to a fourth embodiment of the present invention.
Based on the foregoing embodiment, in this embodiment, step S200 includes:
step S210, calculating a first bias current debugging value under a first preset temperature value, a second bias current debugging value under a second preset temperature value and a data value in the original temperature lookup table according to a first preset formula to obtain a calculation intermediate value;
in this embodiment, a first bias current debug value at a first preset temperature value and a second bias current debug value at a second preset temperature value are obtained first. The first preset temperature value can be an initial temperature value of a high-temperature section needing to be corrected, the second preset temperature value can be an end-point temperature value of the high-temperature section needing to be corrected, and the initial temperature value is smaller than the end-point temperature value. The first bias current debugging value is a first bias current debugging value obtained by debugging the extinction ratio of the optical module under a first preset temperature value; the second bias current debugging value is a second bias current debugging value obtained by debugging the extinction ratio of the optical module at a second preset temperature value.
After a first bias current debugging value under a first preset temperature value and a second bias current debugging value under a second preset temperature value are obtained, the first bias current debugging value, the second bias current debugging value and a data value in the original temperature lookup table are calculated according to a first preset formula, and a calculation intermediate value is obtained.
The first predetermined formula is:
Cn-C0＝n*a1+n*(n-1)/2*X；
a1＝C1-C0；
n＝(1+(B-A)/T)；
wherein n is the total number of temperatures in the preset temperature interval, a is the first preset temperature value, B is the second preset temperature value, T is the temperature interval value, Cn is the second bias current value, C1 is the first bias current value, C0 is the bias current value of the a-T temperature point in the original temperature lookup table, and X is the calculation intermediate value.
By the above formula, the calculation intermediate value X can be obtained by calculation.
Step S220, obtaining a correction value corresponding to each temperature value according to the calculation intermediate value and a second preset formula;
after the calculation intermediate value X is obtained, the correction value corresponding to each temperature value may be obtained according to a second preset formula.
The second predetermined formula is:
am-am-1＝(m-1)X；
am＝Cm-Cm-1，m∈[1-n]；
wherein, CmBias current value of m temperature points, Cm-1The bias current value of the temperature point m-1, X is the calculated intermediate value, and m represents any temperature point in n temperatures.
By the above formula, the correction values of all temperature points in the high temperature section can be obtained by calculation.
For example, in the open-loop modulation of a 25G direct dimming module, the high temperature compensation for the extinction ratio is a large probability event, while the high temperature compensation event for the optical power depends on the requirement of the high temperature optical power index and is a relatively small probability event, so the compensation method for the bias current is discussed first. It can be found from actual module tests that the offset current compensation is performed for the temperature between the temperature a and the temperature B because the offset current is scaled and then written into the module temperature lookup table to be completely satisfactory below the case temperature a without performing other compensation, but the offset current becomes different from the case temperature a to be directly applied to the case temperature B (the high temperature of the industrial optical module).
The corresponding bias current value at temperature point a is set as C1 in the array, and the corresponding bias current value at temperature point B is set as Cn in the array, n ═ 1+ (B-a)/T) [ T: the interval value of the middle temperature in the temperature lookup table, which is 2 ℃ in this embodiment, may also be 1 ℃ or 0.5 ℃), for example: if the point a is 66 ℃ and the point B is 88 ℃, the number sequence Cn corresponding to the point B is C12, where n is (1+ (88-66)/2)
Remember that a1 ═ C1-C0(C0 is the bias current value of the previous temperature point found before the temperature point A)
a2＝C2-C1
…
a12＝C12-C11
Let a2-a1 be X
a3-a2＝2X
a4-a3＝3X
…
a12-a11＝11X
Then the formula is obtained, Cn-C0 ═ n a1+ n (n-1)/2X
Therefore, X can be obtained from the offset current value Cn at the point B, the corresponding offset current value C1 at the point a, and the offset current value C0 corresponding to the previous searched temperature point at the point a, which are obtained by debugging at high temperature.
And calculating the Cn value of the point in the sequence, namely C0+ n a1+ n (n-1)/2X
The method utilizes the working characteristics of the laser, and when the temperature rises, the working slope efficiency of the laser is reduced; the change in slope efficiency in adjacent unit temperatures is slowly decreasing, so that the required bias current increment is also increased in order to keep the extinction ratio constant (see fig. 8), assuming that the change in this bias current increment is considered equal, to approximate the bias current curve. In this approach, there are well-defined starting point (temperature a point) and ending point (temperature B), so the look-up table generated by each approach is well-defined and targeted.
And step S230, correcting the original temperature lookup table according to the correction value.
After the correction values of all the temperature points in the high temperature section are obtained, the original temperature lookup table can be corrected according to the correction values of all the temperature points.
Referring to fig. 6, fig. 6 is a flowchart illustrating a fifth embodiment of a current correction method for an optical module according to the present invention.
Based on the foregoing embodiment, in this embodiment, step S230 includes:
in step S231, the bias current value at the temperature corresponding to the original temperature lookup table is changed to the correction value.
In this embodiment, the correction of the original temperature lookup table may be performed by performing interpolation correction on a high-temperature section in the original temperature lookup table, that is, changing the bias current value at the temperature corresponding to the original temperature lookup table into the correction value.
In addition, the embodiment of the invention also provides a computer readable storage medium.
The computer-readable storage medium of the present invention stores a current correction program for an optical module, which when executed by a processor implements the steps of the current correction method for an optical module described above.
The method implemented when the current correction program of the optical module running on the processor is executed may refer to each embodiment of the current correction method of the optical module of the present invention, and is not described herein again.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or system. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or system that comprises the element.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but in many cases, the former is a better implementation manner. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium (e.g., ROM/RAM, magnetic disk, optical disk) as described above and includes instructions for enabling a terminal device (e.g., a mobile phone, a computer, a server, an air conditioner, or a network device) to execute the method according to the embodiments of the present invention.
The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes, which are made by using the contents of the present specification and the accompanying drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (7)
1. A current correction method for an optical module, the current correction method for an optical module comprising:
obtaining an original temperature lookup table of an optical module and a plurality of bias current debugging values in a preset temperature interval;
calculating according to the plurality of bias current debugging values and a preset calculation formula to obtain corresponding correction values, and correcting the original temperature lookup table according to the correction values;
the step of calculating according to the plurality of bias current debugging values and a preset calculation formula to obtain corresponding correction values, and correcting the original temperature lookup table according to the correction values comprises the following steps:
calculating a first bias current debugging value under a first preset temperature value, a second bias current debugging value under a second preset temperature value and a data value in the original temperature lookup table according to a first preset formula to obtain a calculation intermediate value;
obtaining a correction value corresponding to each temperature value according to the calculation intermediate value and a second preset formula;
correcting the original temperature lookup table according to the correction value; wherein the content of the first and second substances,
the first preset formula is as follows:
Cn-C0＝n*a1+n*(n-1)/2*X；
a1＝C1-C0；
n＝(1+(B-A)/T)；
wherein n is the total number of temperatures in a preset temperature interval, A is a first preset temperature value, B is a second preset temperature value, T is a temperature interval value, Cn is a second bias current value, C1 is a first bias current value, C0 is a bias current value of an A-T temperature point in an original temperature lookup table, and X is a calculation intermediate value;
the second preset formula is as follows:
am-am-1＝(m-1)X；
am＝Cm-Cm-1，m∈[1-n]；
wherein, CmBias current value of m temperature points, Cm-1The bias current value of the temperature point m-1, X is the calculated intermediate value, and m represents any temperature point in n temperatures.
2. The method for current modification of a light module as claimed in claim 1, wherein the step of obtaining a raw temperature lookup table of the light module comprises:
obtaining a corresponding relation between a DAC value of the bias current and the temperature;
and zooming the corresponding relation according to a preset proportion and then drawing a table to obtain an original temperature lookup table of the optical module.
3. The method for modifying the current of the optical module as claimed in claim 1, wherein the step of obtaining a plurality of tuning values of the bias current within a preset temperature interval of the optical module comprises:
and adjusting the bias current values of the optical module at a plurality of temperatures in a preset temperature interval according to preset requirements to obtain a plurality of bias current debugging values meeting the requirements.
4. The method for correcting the current of the optical module according to claim 1, wherein the step of correcting the original temperature lookup table according to the correction value comprises:
and changing the bias current value at the corresponding temperature of the original temperature lookup table into the corrected value.
5. The method for correcting current of an optical module according to claim 1, wherein the optical module comprises a 25G optical module.
6. An optical module current correction device, comprising: memory, a processor and a current correction program for a light module stored on said memory and executable on said processor, said current correction program for a light module implementing the steps of the current correction method for a light module according to any of claims 1 to 5 when executed by said processor.
7. A computer-readable storage medium, characterized in that the computer-readable storage medium has stored thereon a current correction program of an optical module, which when executed by a processor implements the steps of the current correction method of the optical module according to any one of claims 1 to 5.
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