CN104682193B - The method for generating temperature lookup table of optical module - Google Patents

The method for generating temperature lookup table of optical module Download PDF

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Publication number
CN104682193B
CN104682193B CN201510135047.3A CN201510135047A CN104682193B CN 104682193 B CN104682193 B CN 104682193B CN 201510135047 A CN201510135047 A CN 201510135047A CN 104682193 B CN104682193 B CN 104682193B
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China
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temperature
test
value
register value
optical module
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CN201510135047.3A
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Chinese (zh)
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CN104682193A (en
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陈彪
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青岛海信宽带多媒体技术有限公司
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Priority to CN201510135047.3A priority Critical patent/CN104682193B/en
Priority to CN201310003863.XA priority patent/CN103078249B/en
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Abstract

The invention discloses a kind of method and device for generating temperature lookup table of optical module.This method includes:The luminous power and extinction ratio of adjustment test optical module output obtain test optical module in the test temperature value of temperature spot, test bias current sets register value and test modulation current settings register value to the desired value pre-set;The current value of acquisition is normalized, the temperature range electric current normalization slope parameter of each temperature spot formation is obtained;The luminous power and extinction ratio of optical module output to be applied are adjusted to the desired value pre-set, operating temperature value, bias current sets register value and modulation current settings register value of the optical module to be applied under normal temperature environment is obtained;With reference to the electric current normalization slope parameter obtained in advance, the current temperature look-up table of the optical module to be applied is generated, and the current temperature look-up table of generation is write into the optical module to be applied.Using the present invention, the efficiency of generation temperature lookup table of optical module can be improved.

Description

The method for generating temperature lookup table of optical module
The application is the entitled " method and dress of generation temperature lookup table of optical module proposed on 01 06th, 2013 Put " Chinese invention patent application 201310003863.X divisional application.
Technical field
The present invention relates to optical communication technique, more particularly to a kind of method and device for generating temperature lookup table of optical module.
Background technology
Current domestic market and international market, the fiber optic communication direction merged with a large bandwidth and at a high rate with multiple business Have begun to application;In numerous solutions, fiber to the home (FTTH, Fiber To The Home's) is considered as It is the ultimate solution of broadband access, domestic market large-area applications.
Optical module is as the core component of FTTH in optical fiber telecommunications system, and the stabilization of optical module overall performance is directly and optical fiber The performance of communication system is stable related, and the optical port performance of optical module transmitting terminal, that is, the optical signal quality launched, and is influence light again The key factor of fiber communication stable system performance.
In the optical signal quality parameter of optical port transmitting for influenceing optical module transmitting terminal, primary concern is that eye diagram quality, its In, the principal element of influence eye diagram quality is average light power and extinction ratio, and average light power and extinction ratio are by optical module Laser-driven chip be supplied to laser bias current and modulation size of current determine, bias current is bigger, average light Power is bigger;When average light power is fixed, modulation electric current is bigger, and extinction ratio is bigger;On this basis, due to laser It is the device with temperature characterisitic, in addition it is also necessary to consider the temperature characterisitic of device, for fixed bias current and modulation electric current Say, when the temperature decreases, luminous power can become big, and extinction ratio can be reduced;When the temperature increases, luminous power can diminish, extinction ratio meeting Rise.
Optical module is in actual applications, it is necessary to be maintained in operating temperature range, for example, the temperature range of business level application For 0~70 DEG C, the temperature range of industrial scale applications is -40~85 DEG C.If the optical port parameter of optical module transmitting terminal is unstable, example Such as, light eye pattern parameter fluctuation is larger, may all cause receiving end None- identified, and then cause communication disruption.
In practical application, for the optical port parameter of stable optical mode block transmitting terminal, optical module transmitting terminal typically uses closed loop control System, by introducing luminous power automated power control (APC, Automatic Power Control) loop in optical module, is used for The laser diode and backlight diode in biased electrical flow control circuit are adjusted, APC loops are the bias current control of transmitting terminal Circuit processed introduces an amount of negative feedback, passes through the backlight diode close with laser diode, coupling unit laser diode institute The luminous power issued, produces the back facet current of feedback, so that APC loops are according to the feedback current and bias current, with After the reference value of setting is compared relatively, the bias current of adjustment output to light emitting diode, and then stable average light power.
In theory, backlight diode is no temperature characterisitic, if i.e. laser diode is luminous constant, and, swash The coefficient of coup of optical diode and backlight diode is constant, and backlight diode is supplied to the feedback current (biased electrical of APC loops Stream) it is constant, but in practical application, the originator optical device that laser diode and backlight diode are packaged, i.e. light are sent out Penetrate secondary module (TOSA, Transmitter Optical Subassembly), temperature influence, when laser diode launches permanent Determine luminous power, if temperature change, the bias current of backlight diode output can also change, and the change of bias current The luminous power that laser diode can be influenceed to launch.So, APC loops will be caused in variation of ambient temperature, optical module transmitting Luminous power can not be stablized in setting value;And if average light power changes, extinction ratio can also change therewith, meanwhile, The change of temperature, the effect for being also modulated influence to electric current.
In practical application, it is necessary to according to the temperature of optical module transmitting terminal, to input laser diode in APC loops Modulation electric current is controlled, so that the constant optical signal of laser diode transmission power.Thus, in the prior art, in optical module Software in, by define a temperature lookup table of optical module, according to comprising temperature sensor micro-control unit (MCU, Micro Control Unit) observed temperature come compensate (APCset) value of the bias current in optical module and modulation electric current (MODset) value, i.e., adjust APCset, MODset, so as to compensate luminous power and extinction ratio so that optical module according to temperature change The luminous power and extinction ratio for exporting optical signal are stable.Wherein,
APCset, MODset correspond to an independent temperature lookup table of optical module respectively, when MCU monitors that temperature changes When, the Current Temperatures monitored according to MCU search the current temperature spot correspondence in the temperature lookup table of optical module pre-set APCset, MODset value, and using the value found as current APCset, MODset setting value, to control laser Diode, so that the optical signal quality of stable optical mode block originator.
The method of existing generation temperature lookup table of optical module, for each optical module, according to its operating temperature range, chooses Multiple operating temperature points, in each operating temperature point, the temperature that MCU monitoring of the record comprising temperature sensor is obtained, regulation swashs The bias current and modulation electric current of optical diode, so that the luminous power and extinction ratio of the optical signal of laser diode transmitting are simultaneously The numerical value pre-set is met, and by the corresponding monitoring temperature of operating temperature point, and, the corresponding biasing of operating temperature point Electric current and modulation current settings register value write-in temperature lookup table of optical module, according to same mode, obtain each work temperature Degree point corresponding bias current and modulation current settings register value, and write temperature lookup table of optical module.So, in the light In the follow-up work of module, obtained temperature is monitored according to MCU, temperature lookup table of optical module is searched, corresponding biased electrical is obtained Stream and modulation current settings register value, as the control parameter of laser diode, so that the light of laser diode output Power and extinction ratio are constant, lift the stability of optical fiber telecommunications system.
From above-mentioned, the method for existing generation temperature lookup table of optical module to each optical module, it is necessary to be operated temperature Test in the range of degree, for determining the modulation electric current and bias current sets value of correspondence check point in follow-up work, leads to Frequently with high-low temperature chamber or air pressure gun by the temperature adjustment of optical module to each operating temperature point, and from lifting/lowering temperature to optical module Temperature stabilization, all needs the time, thus, this method for being conventionally produced temperature lookup table of optical module is, it is necessary to be directed to each Optical module, required time length, the efficiency of generation temperature lookup table of optical module are low, and the resources of production of occupancy are more, are unfavorable for production line The raising of production efficiency.
The content of the invention
The embodiment provides a kind of method for generating temperature lookup table of optical module, generation optical mode deblocking temperature is improved The efficiency of look-up table.
Embodiments of the invention additionally provide a kind of device for generating temperature lookup table of optical module, improve generation optical module temperature Spend the efficiency of look-up table.
According to an aspect of the invention, there is provided a kind of method for generating temperature lookup table of optical module, including:
It is multiple temperature spots to divide environment temperature in advance, in each temperature spot, the luminous power of adjustment test optical module output To the target luminous power pre-set, test optical module is obtained in the test temperature value of temperature spot and test bias current sets Register value;
The extinction ratio of adjustment test optical module output obtains test optical module in each temperature to the target extinction ratio pre-set The test modulation current settings register value of degree point;
The test bias current sets register value of acquisition is normalized, the temperature of each temperature spot formation is obtained Interval bias current normalization slope parameter;The test modulation current settings register value of acquisition is normalized, obtained Take the temperature range modulation electric current normalization slope parameter of each temperature spot formation;
The luminous power of optical module output to be applied is adjusted to the target luminous power pre-set, and, the extinction ratio of output To the target extinction ratio pre-set, operating temperature value of the optical module to be applied under normal temperature environment, biased electrical are obtained respectively Stream setting register value and modulation current settings register value;
According to the operating temperature value of acquisition, bias current sets register value, with reference to the bias current normalizing obtained in advance Change Slope Parameters, generate the bias current temperature lookup table of the optical module to be applied;According to the operating temperature value and tune of acquisition Current settings register value processed, with reference to the modulation electric current normalization slope parameter obtained in advance, generates the optical module to be applied Current temperature look-up table is modulated, and the bias current temperature lookup table of generation and modulation current temperature look-up table are write this and waits to answer Use optical module.
Wherein, the test bias current sets register value of described pair of acquisition is normalized, and obtains each temperature spot The temperature range bias current normalization slope parameter of formation includes:
According to each temperature spot of division, corresponding temperature range is formed;
Obtain the test bias current sets register value for pre-setting temperature spot;
Obtain the difference of the interval corresponding test temperature value of each temperature spot;
Obtain the difference of the interval corresponding test bias current sets register value of each temperature spot;
It is interval for each temperature spot, by the difference of the interval test bias current sets register value of the temperature spot divided by The difference of test temperature value, then with pre-setting the reciprocal multiplication for testing bias current sets register value of temperature spot, obtain The temperature range bias current normalization slope parameter.
Wherein, the formula of the acquisition bias current normalization slope parameter is:
In formula,
kbFor bias current normalization slope parameter;
IbuFor the corresponding test bias current sets register value of the interval ceiling temperature of temperature spot;
IbdFor the corresponding test bias current sets register value of temperature spot interval limit temperature;
TuFor the corresponding test temperature value of the interval ceiling temperature of temperature spot;
TdFor the corresponding test temperature value of temperature spot interval limit temperature;
IbcTo pre-set the test bias current sets register value of temperature spot.
Wherein, the test modulation current settings register value of described pair of acquisition is normalized, and obtains each temperature spot The temperature range modulation electric current normalization slope parameter of formation includes:
According to each temperature spot of division, corresponding temperature range is formed;
Obtain the test modulation current settings register value for pre-setting temperature spot;
Obtain the difference of the interval corresponding test temperature value of each temperature spot;
Obtain the difference of the interval corresponding test modulation current settings register value of each temperature spot;
It is interval for each temperature spot, by the interval test of the temperature spot modulate current settings register value difference divided by The difference of test temperature value, then with pre-setting the reciprocal multiplication for testing modulation current settings register value of temperature spot, obtain The temperature range modulates electric current normalization slope parameter.
Wherein, obtaining the formula for modulating electric current normalization slope parameter is:
In formula,
kmFor modulation electric current normalization slope parameter;
ImuFor the corresponding test modulation current settings register value of the interval ceiling temperature of temperature spot;
ImdFor the corresponding test modulation current settings register value of temperature spot interval limit temperature;
TuFor the corresponding test temperature value of the interval ceiling temperature of temperature spot;
TdFor the corresponding test temperature value of temperature spot interval limit temperature;
ImcTo pre-set the test modulation current settings register value of temperature spot.
Wherein, the temperature range bias current normalization slope parameter and modulation electric current normalizing of each temperature spot formation are obtained Change after Slope Parameters, methods described further comprises:
Temperature spot and the mapping relations of bias current normalization slope parameter are built, and, build temperature spot and modulation electricity Flow the mapping relations of normalization slope parameter.
Wherein, the operating temperature value according to acquisition, bias current sets register value, with reference to the biasing obtained in advance Electric current normalization slope parameter, generating the bias current temperature lookup table of the optical module to be applied includes:
The temperature range bias current normalization slope parameter of each temperature spot formation obtained in advance is inquired about, the work is obtained The corresponding bias current normalization slope value of temperature value;
According to the slope value and bias current sets register value, the inclined of the interval interior other temperature spots of the temperature spot is calculated Put current settings register value;
Obtain according to the interval bound temperature spot of the temperature spot corresponding bias current sets register value and in advance The interval bias current normalization slope parameter of adjacent temperature spot, calculates the bias current of the interval interior each temperature spot of adjacent temperature spot Register value is set, until the bias current sets register value for each temperature range for obtaining the optical module to be applied is calculated, it is raw Into bias current temperature lookup table.
Wherein, the formula of the bias current sets register value for calculating the interval interior other temperature spots of the temperature spot is:
Ibt=Ibw-kb×(Tw-Tt)×Ibc
In formula,
IbtFor the interval inherent other work temperatures of the corresponding temperature spot of operating temperaturetWhen bias current sets register Value;
IbwFor the corresponding bias current sets register value of operating temperature;
kbFor the bias current normalization slope parameter that the corresponding temperature spot of operating temperature is interval;
TwFor operating temperature value;
IbcTo pre-set the test bias current sets register value of temperature spot.
Wherein, the formula of the bias current sets register value for calculating the interval interior each temperature spot of adjacent temperature spot is:
Ibt'=Ibwu-kb'×(Tw'-Tt')×Ibc
In formula,
Ibt'For the interval inherent work temperature of adjacent temperature spott'When bias current sets register value;
IbwuFor the interval bias current corresponding with the intersection point temperature in adjacent temperature spot interval of the corresponding temperature spot of operating temperature Set register value;
kb'For the bias current normalization slope parameter that adjacent temperature spot is interval;
Tw'For intersection point temperature value;
IbcTo pre-set the test bias current sets register value of temperature spot.
Wherein, the operating temperature value according to acquisition, bias current sets register value, with reference to the biasing obtained in advance Electric current normalization slope parameter, generating the bias current temperature lookup table of the optical module to be applied includes:
The temperature range bias current normalization slope parameter of each temperature spot formation obtained in advance is inquired about, the work is obtained The corresponding bias current normalization slope value of temperature value;
Temperature and the coordinate system of bias current sets register value are built, using temperature as abscissa, bias current sets are posted Storage value is ordinate, using the corresponding bias current sets register value of operating temperature value as basic point, with the operating temperature value pair The bias current normalization slope value answered is slope, builds the interval straight line of the corresponding temperature spot of the operating temperature value;
The corresponding bias current sets register value of bound temperature spot of the straight line built is obtained, with adjacent temperature spot area Between corresponding bias current normalization slope value be slope, build the interval straight line of adjacent temperature spot, what generation was represented with coordinate system Bias current temperature lookup table.
Wherein, the operating temperature value and modulation current settings register value according to acquisition, with reference to what is obtained in advance Electric current normalization slope parameter is modulated, generating the temperature range modulation current temperature look-up table of the optical module to be applied includes:
The temperature range modulation electric current normalization slope parameter of each temperature spot formation obtained in advance is inquired about, the work is obtained The corresponding modulation electric current normalization slope value of temperature value;
According to the slope value and modulation current settings register value, the tune of the interval interior other temperature spots of the temperature spot is calculated Current settings register value processed;
Obtain according to the interval bound temperature spot of the temperature spot corresponding modulation current settings register value and in advance The interval modulation electric current normalization slope parameter of adjacent temperature spot, calculates the modulation electric current of the interval interior each temperature spot of adjacent temperature spot Register value is set, until the modulation current settings register value for each temperature range for obtaining the optical module to be applied is calculated, it is raw Into modulation current temperature look-up table.
Wherein, the formula of the modulation current settings register value for calculating the interval interior other temperature spots of the temperature spot is:
Imt=Imw-km×(Tw-Tt)×Imc
In formula,
ImtFor the interval inherent other work temperatures of the corresponding temperature spot of operating temperaturetWhen modulation current settings register Value;
ImwFor the corresponding modulation current settings register value of operating temperature;
kmFor the modulation electric current normalization slope parameter that the corresponding temperature spot of operating temperature is interval;
TwFor operating temperature value;
ImcTo pre-set the test modulation current settings register value of temperature spot.
Wherein, the formula of the modulation current settings register value for calculating the interval interior each temperature spot of adjacent temperature spot is:
Imt'=Imwu-km'×(Tw'-Tt')×Imc
In formula,
Imt'For the interval inherent work temperature of adjacent temperature spott'When modulation current settings register value;
ImwuFor the interval modulation electric current corresponding with the intersection point temperature in adjacent temperature spot interval of the corresponding temperature spot of operating temperature Set register value;
km'For the modulation electric current normalization slope parameter that adjacent temperature spot is interval;
Tw'For intersection point temperature value;
ImcTo pre-set the test modulation current settings register value of temperature spot.
A kind of device for generating temperature lookup table of optical module, the device includes:Bias current acquisition module, test is tested to adjust Electric current acquisition module processed, normalized module, using optical module electric current acquisition module and temperature lookup table generation module, its In,
Bias current acquisition module is tested, is multiple temperature spots for dividing environment temperature in advance, in each temperature spot, adjusts The luminous power of whole test optical module output obtains test temperature of the test optical module in temperature spot to the target luminous power pre-set Angle value and test bias current sets register value;
Test modulation electric current acquisition module, extinction ratio to the target pre-set for adjusting test optical module output disappears Current settings register value is modulated in light ratio, the test for obtaining test optical module in each temperature spot;
Normalized module, is normalized for the test bias current sets register value to acquisition, obtains Take the temperature range bias current normalization slope parameter of each temperature spot formation;Current settings register is modulated in test to acquisition Value is normalized, and obtains the temperature range modulation electric current normalization slope parameter of each temperature spot formation;
Using optical module electric current acquisition module, for adjusting the luminous power of optical module output to be applied to the mesh pre-set Luminous power is marked, and, the extinction ratio of output obtains the optical module to be applied in normal temperature respectively to the target extinction ratio pre-set Operating temperature value, bias current sets register value and modulation current settings register value under environment;
Temperature lookup table generation module, for the operating temperature value according to acquisition, bias current sets register value, with reference to The bias current normalization slope parameter obtained in advance, generates the bias current temperature lookup table of the optical module to be applied;According to The operating temperature value and modulation current settings register value of acquisition, with reference to the modulation electric current normalization slope ginseng obtained in advance Number, generates the modulation current temperature look-up table of the optical module to be applied, and by the bias current temperature lookup table of generation and modulation Current temperature look-up table writes the optical module to be applied.
It is preferred that the test bias current acquisition module includes:Temperature range division unit, test temperature mathematic interpolation Unit, test bias current difference computational unit, bias current normalization slope computing unit, test modulation current differential are calculated Unit and modulation electric current normalization slope computing unit, wherein,
Temperature range division unit, for each temperature spot according to division, forms corresponding temperature range;
Test temperature difference computational unit, the difference for obtaining the interval corresponding test temperature value of each temperature spot;
Bias current difference computational unit is tested, the test bias current sets for the setting temperature spot according to acquisition are posted Storage value, obtains the difference of the interval corresponding test bias current sets register value of each temperature spot;
Bias current normalization slope computing unit, for interval for each temperature spot, by the survey that the temperature spot is interval The difference of bias current sets register value divided by the difference of test temperature value are tried, then with pre-setting the test biasing of temperature spot The reciprocal multiplication of current settings register value, obtains the temperature range bias current normalization slope parameter;
Test modulation current differential computing unit, sets for the test for the pre-setting temperature spot modulation electric current according to acquisition Determine register value, obtain the difference of the interval corresponding test modulation current settings register value of each temperature spot;
Electric current normalization slope computing unit is modulated, for interval for each temperature spot, by the survey that the temperature spot is interval The difference of examination modulation current settings register value divided by the difference of test temperature value, then with pre-setting the test modulation of temperature spot The reciprocal multiplication of current settings register value, obtains temperature range modulation electric current normalization slope parameter.
It is preferred that the temperature lookup table generation module includes:Bias current normalization slope acquiring unit, bias current Set register value acquiring unit, bias current temperature lookup table generation unit, modulation electric current normalization slope acquiring unit, tune Current settings register value acquiring unit processed and modulation current temperature look-up table generation unit, wherein,
Bias current normalization slope acquiring unit, for inquiring about bias current normalization slope computing unit, obtains work Make the corresponding bias current normalization slope value of temperature value;
Bias current sets register value acquiring unit, for the slope value according to acquisition and operating temperature correspondence Bias current sets register value, calculate the temperature spot it is interval in other temperature spots bias current sets register value;
Bias current temperature lookup table generation unit, for according to the corresponding biasing of the interval bound temperature spot of the temperature spot Current settings register value and the interval bias current normalization slope parameter of the adjacent temperature spot obtained in advance, are calculated adjacent The bias current sets register value of each temperature spot in temperature spot is interval, until calculating each temperature for obtaining the optical module to be applied Interval bias current sets register value, generates bias current temperature lookup table;
Electric current normalization slope acquiring unit is modulated, for inquiring about modulation electric current normalization slope computing unit, obtaining should The corresponding modulation electric current normalization slope value of operating temperature value;
Current settings register value acquiring unit is modulated, for the slope value according to acquisition and operating temperature correspondence Modulation current settings register value, calculate the temperature spot it is interval in other temperature spots modulation current settings register value;
Current temperature look-up table generation unit is modulated, for according to the corresponding modulation of the interval bound temperature spot of the temperature spot Current settings register value and the interval modulation electric current normalization slope parameter of the adjacent temperature spot obtained in advance, are calculated adjacent The modulation current settings register value of each temperature spot in temperature spot is interval, until calculating each temperature for obtaining the optical module to be applied Interval modulation current settings register value, generation modulation current temperature look-up table.
From above-mentioned, the method and device of the generation temperature lookup table of optical module of the embodiment of the present invention, this method includes: It is multiple temperature spots to divide environment temperature in advance, in each temperature spot, and the luminous power of adjustment test optical module output to setting in advance The target luminous power put, obtains test optical module in the test temperature value of temperature spot and test bias current sets register Value;The extinction ratio of adjustment test optical module output obtains test optical module in each temperature spot to the target extinction ratio pre-set Test modulation current settings register value;The test bias current sets register value of acquisition is normalized, obtained Take the temperature range bias current normalization slope parameter of each temperature spot formation;Test modulation current settings deposit to acquisition Device value is normalized, and obtains the temperature range modulation electric current normalization slope parameter of each temperature spot formation;Adjust and wait to answer The luminous power exported with optical module to the target luminous power pre-set, and, the extinction ratio of output to the target pre-set Extinction ratio, obtain respectively operating temperature value of the optical module to be applied under normal temperature environment, bias current sets register value with And modulation current settings register value;According to the operating temperature value of acquisition, bias current sets register value, with reference to advance acquisition Bias current normalization slope parameter, generate the bias current temperature lookup table of the optical module to be applied;According to the work of acquisition Make temperature value and modulation current settings register value, with reference to the modulation electric current normalization slope parameter obtained in advance, generation should The modulation current temperature look-up table of optical module to be applied, and the bias current temperature lookup table of generation and modulation current temperature are looked into Table is looked for write the optical module to be applied.So, without to each optical module, need to all be tested, carried in operating temperature range The high efficiency of generation temperature lookup table of optical module, reduces the time needed for generation temperature lookup table of optical module.
Brief description of the drawings
Fig. 1 is embodiment of the present invention APC loop control circuit structural representations.
Bias currents and Output optical power and the signal of on-load voltage of the Fig. 2 for embodiment of the present invention laser triode Figure.
Fig. 3 is the modulating characteristic schematic diagram of embodiment of the present invention laser triode.
Fig. 4 is the method flow schematic diagram that the embodiment of the present invention generates temperature lookup table of optical module.
Fig. 5 is embodiment of the present invention normalization slope parameter schematic diagram.
Fig. 6 is the apparatus structure schematic diagram that the embodiment of the present invention generates temperature lookup table of optical module.
Embodiment
For the objects, technical solutions and advantages of the present invention are more clearly understood, referring to the drawings and preferred reality is enumerated Example is applied, the present invention is described in more detail.However, it is necessary to which many details listed in explanation, specification are only to be Reader is set to have a thorough explanation to the one or more aspects of the present invention, even without these specific details can also Realize the aspects of the invention.
The term such as " module " used in this application, " system " is intended to include the entity related to computer, for example but does not limit In hardware, firmware, combination thereof, software or executory software.For example, module can be, it is not limited to:Processing The process run on device, processor, object, executable program, thread, program and/or the computer performed.For example, count It can be module to calculate the application program run in equipment and this computing device.One or more modules can be located at executory In one process and/or thread, a module can also be located on a computer and/or be distributed in two or more platform calculating Between machine.
The method of existing generation temperature lookup table of optical module, it is necessary to each optical module, the luminous power pre-set with And under extinction ratio situation, the test in temperature range is operated, for determining follow-up modulation electric current and bias current Setting value, required time length, the efficiency of generation temperature lookup table of optical module are low.
In the embodiment of the present invention, it is considered to be operated the survey in temperature range to a number of optical module sample in advance Examination, obtains predetermined luminous power and each bias current sets register value and modulation current settings register under extinction ratio Value, is normalized, and obtains the optical module test temperature look-up table with current value mapping relations comprising operating temperature, so Afterwards, according to the test of optical module during normal temperature, modulation electric current and bias current sets value of the optical module in the normal temperature are obtained, And the optical module test temperature look-up table being previously obtained is combined, calculated, generated the temperature lookup table of the optical module, and write Into the optical module, so that without to each optical module, need to all be tested in operating temperature range, be improved generation The efficiency of temperature lookup table of optical module, reduces the time needed for generation temperature lookup table of optical module.
Below first to the present embodiments relate to APC loops illustrate.
Fig. 1 is embodiment of the present invention APC loop control circuit structural representations.Referring to Fig. 1, the control circuit includes:Partially Current circuit and modulation current circuit are put, wherein,
Modulation current circuit includes:First laser triode V1, second laser triode V2 and first resistor R1;
Bias current circuit includes:3rd laser triode V3, the first amplifier amplifier A1, the second amplifier amplifier A2, 3rd comparator A3, second resistance R2,3rd resistor R3, the 4th resistance R4, the 5th resistance R5 and inductance L1, wherein,
Electric current (MOD-), radio pole and second laser triode V2 are modulated in first laser triode V1 base stage access first Radio be extremely connected, and access the voltage (VCC) that pre-sets, emitter stage is connected with second laser triode V2 emitter stage, And be connected with first resistor R1 one end;
Electric current (MOD+) is modulated in second laser triode V2 base stage access second;
First resistor R1 other end ground connection;
First amplifier amplifier A1 negative phase end is connected with second resistance R2 one end, positive terminal and the one of second resistance R2 End is connected, and output end is connected with the second resistance R2 other end;
Second amplifier amplifier A2 negative phase end is connected with 3rd resistor R3 one end, positive terminal and the one of the 4th resistance R4 End is connected, and output end is connected with the 3rd resistor R3 other end;
The one end of 4th resistance R4 one end also with inductance L1 is connected, the 4th resistance R4 other end ground connection, inductance L1's The other end accesses predetermined voltage;
3rd comparator A3 negative phase end is connected with the first amplifier amplifier A1 output end, and positive terminal is put with the second amplifier Big device A2 output end is connected, and output end is connected with the 3rd laser triode V3 base stage;
3rd laser triode V3 emitter stage is connected with the 5th resistance R5 one end, colelctor electrode and second laser triode V2 colelctor electrode is connected;
5th resistance R5 other end ground connection.
Second laser triode V2 is laser LD, and the first amplifier amplifier A1 is backlight diode PD, and PD is used for basis Sense the power of luminosity, sensing optical signal is converted into corresponding electric signal, is amplified, computing, the modulation letter needed for obtaining Number;
MOD+, MOD- input for modulated current signal, and Ibias is the bias current for flowing through LD, the size of the bias current Determine the size of luminous power;
Vset (the 3rd comparator A3 positive terminal) is the setting voltage reference points of target luminous power;
PD is detected after LD output light, and LD output optical signal is amplified by amplifier amplifier A1, is exported to extremely Comparator A3 inverting input, meanwhile, the Vset reference voltages being adjusted are sent to comparator A3 in-phase end, by than After export to the 3rd comparator V3;
3rd comparator A3 and the 3rd laser triode V3 composition DC constant current power supplies, adjust LD bias current Ibias, when When LD Output optical power declines, PD outputs reduce, and comparator A3 end of oppisite phase input voltage declines, on comparator A3 output voltages Rise, the 3rd laser triode V3 base current rises, and then collector current Ibias rises, the increase of LD Output optical power makes PD outputs also corresponding increase is obtained, the decline of LD Output optical power is offset.Conversely, then electric current Ibias reduces, under LD Output optical power Drop.
Bias currents and Output optical power and the signal of on-load voltage of the Fig. 2 for embodiment of the present invention laser triode Figure.Referring to Fig. 2, abscissa is bias current, and ordinate is respectively Output optical power and on-load voltage.
Ith is the current threshold point of LD lasers, when the positive bias current being carried on LD lasers is not less than Ith When, the luminous power of LD lasers can be ignored, and during more than Ith, the luminous power increase of LD lasers is obvious, The size of Ibias and LD Output optical power is close to linear relationship.With bias current Ibias increasing, LD laser is loaded into The voltage at device two ends can be also stepped up.
If temperature is raised, can make LD Output optical power reduces, for example, at high temperature, same electric current Ibias, LD Output optical power can decrease, i.e., in fig. 2, work as T1<During T2, under same bias current, the corresponding output lights of T1 Power is more than the corresponding Output optical power of T2.
Fig. 3 is the modulating characteristic schematic diagram of embodiment of the present invention laser triode.Determined referring to Fig. 3, bias current Ibias The operating point of LD lasers, modulated current signal is loaded into the base stage of laser by Imod (MOD+, MOD-), and Imod is one Individual AC differential signal, and Ibias is a direct current signal, as shown in figure 3, by the way that Ibias and Imod are loaded into laser During two ends (base stage and radio pole), the signal that a luminous intensity has been modulated just is obtained.
Fig. 4 is the method flow schematic diagram that the embodiment of the present invention generates temperature lookup table of optical module.Referring to Fig. 4, the flow Including:
Step 401, it is multiple temperature spots environment temperature to be divided in advance, in each temperature spot, adjustment test optical module output Luminous power to the target luminous power pre-set, obtain test optical module in the test temperature value of temperature spot and test biasing Current settings register value;
In this step, for conventional optical module, the general temperature range at -40 DEG C~85 DEG C of environment temperature residing for it It is interior, thus, take environment temperature be -40 DEG C~85 DEG C, and by the environment temperature be divided into -40 DEG C, -20 DEG C, 5 DEG C, 25 DEG C, 50 DEG C, totally seven temperature spots of 70 DEG C and 85 DEG C.Certainly, in practical application, it would however also be possible to employ other manner divides environment temperature, example Such as, with 5 DEG C for temperature step dash time-sharing environment temperature.
Optical module in the course of the work, due to the factor influence such as luminous, heating so that temperature and surrounding ring during its work Border temperature is differed, and optical module transmitting optical signal characteristic (luminous power and extinction ratio) with work when temperature it is related, thus, Need to obtain in different environment temperatures, the corresponding operating temperature of optical module, i.e. test temperature.
Due to being built-in with the MCU comprising temperature sensor in optical module, by the MCU sensing temperatures comprising temperature sensor.
Table 1 is that the 1# test optical modules that the embodiment of the present invention is obtained are biased in the test temperature value of each temperature spot and test Current settings register value parameter list.
Table 1
In table 1,
SN, to test the sequence number of optical module;
The field where test temperature, the second row value is temperature point value (- 40 DEG C~85 DEG C), and the third line is test optical module Under relevant temperature point, the circuit board temperature that the temperature sensor actual measurement circuit board in MCU is obtained, i.e. test temperature value, unit It is DEG C;
The field where test bias current sets register value, the second row value is temperature point value (- 40 DEG C~85 DEG C), the Three performance testing optical modules are under relevant temperature point, the luminous power that adjustment test optical module is exported to the target light work(pre-set During rate, obtained test bias current sets register value, no unit is counted using the decimal system (Dec).Test optical mode Block under designated environment temperature conditions (- 40 DEG C~85 DEG C) each temperature spot, the optical power adjustment that LD is exported to target light work( APCset register values during the dBm of rate value -2.5 (dBm), are decimal data.In practical application, APCset deposits The stated range minimum of device is 0, and maximum is 255.
Test sample 1# modules are spaced, in the range of -40 DEG C~85 DEG C of environment temperature, multiple test temperature points are taken, and will Optical power adjustment is adjusted to 6.5DB desired values to -2.5dBm, extinction ratio, records bias current sets value during each temperature spot APCset and modulation current setting value MODset.
Step 402, the extinction ratio of adjustment test optical module output obtains test optical mode to the target extinction ratio pre-set Block modulates current settings register value in the test of each temperature spot;
In this step, the test can be adjusted on the basis of step 401 obtains test bias current sets register value The extinction ratio of optical module is to the target extinction ratio pre-set, so that electricity is modulated in the test for obtaining test optical module in the temperature spot Stream setting register value;Can also be after step 401 obtains the test bias current sets register value of each temperature spot, again The test optical module is placed in each temperature spot, and adjusts the extinction ratio of the test optical module to the target extinction ratio pre-set, So as to obtain test optical module respectively current settings register value is modulated in the test of each temperature spot.
Table 2 is that the 1# test optical modules that the embodiment of the present invention is obtained are modulated in the test temperature value of each temperature spot and test Bias current sets register value parameter list.
Table 2
In table 2,
SN, to test the sequence number of optical module;
The field where test temperature, the second row value is temperature point value (- 40 DEG C~85 DEG C), and the third line is test optical module Under relevant temperature point, the circuit board temperature that the temperature sensor actual measurement circuit board in MCU is obtained, i.e. test temperature value, unit It is DEG C;
The field where test modulation current settings register value, the second row value is temperature point value (- 40 DEG C~85 DEG C), The third line is tests optical module under relevant temperature point, and extinction ratio to the target pre-set of adjustment test optical module output disappears During light ratio, obtained test modulation current settings register value, no unit is counted using the decimal system (Dec).That is test light Module under designated environment temperature conditions (- 40 DEG C~85 DEG C) each temperature spot, the extinction ratio that LD is exported is adjusted to target and disappeared MODset register values during light ratio 6.5 decibels (DB), are decimal data.In practical application, the MODset registers Stated range minimum is 0, and maximum is 255.
In practical application, reference point can be set using fixed bias current, stablize luminous power by APC loops, and The stabilization of extinction ratio, then complete the write-in of temperature lookup table of optical module by triplet, for example, optical module is put respectively In work low temperature point T1, normal temperature point T2, work high temperature dot T3, adjustment modulation electric current, it is the desired value pre-set to make extinction ratio, If the corresponding modulation current setting value of three temperature spots is respectively A1, A2, A3, application program automatically to { T1, T2, T3 }, A1, A2, A3 } two polygometries are used, modulation current setting value-temperature curve is fitted to, and then obtain temperature lookup table corresponding temperature point Modulation current setting value, and look-up table data is write into optical module.
Step 403, the test bias current sets register value of acquisition is normalized, obtains each temperature spot shape Into temperature range bias current normalization slope parameter;The test modulation current settings register value of acquisition is normalized Processing, obtains the temperature range modulation electric current normalization slope parameter of each temperature spot formation;
In this step, the test bias current sets register value of acquisition is normalized, each temperature spot is obtained The temperature range bias current normalization slope parameter of formation includes:
A11, according to each temperature spot of division, forms corresponding temperature range;
In this step, if as it was previously stated, environment temperature is divided into -40 DEG C, -20 DEG C, 5 DEG C, 25 DEG C, 50 DEG C, 70 DEG C And 85 DEG C of totally seven temperature spots, then the temperature range formed be respectively [- 40, -20], [- 20, -5], [5,25], [25,50], [50,70].
A12, obtains the test bias current sets register value for pre-setting temperature spot;
In this step, it is preferred that pre-setting temperature spot for 25 DEG C.
A13, obtains the difference of the interval corresponding test temperature value of each temperature spot;
In this step, each temperature spot is interval, two test temperature values of correspondence, for example, for temperature range [- 40 ,- 20], corresponding test temperature value interval is [- 22.6, -2.72], then the difference of test temperature value is 19.88.
A14, obtains the difference of the interval corresponding test bias current sets register value of each temperature spot;
Similar with step A13 in this step, each temperature spot is interval, two test bias current sets deposits of correspondence Device value, for example, for temperature range [- 40, -20], including two temperature spots, i.e. ceiling temperature point and lower limit temperature point, it is right The test bias current sets register value interval answered is [48,49], is set comprising the corresponding test bias current of ceiling temperature point Determine register value and the corresponding test bias current sets register value of lower limit temperature point, then test bias current sets deposit The difference of device value is 1.
A15, it is interval for each temperature spot, by the difference of the interval test bias current sets register value of the temperature spot Divided by the difference of test temperature value, then with pre-setting the reciprocal multiplication for testing bias current sets register value of temperature spot, Obtain the temperature range bias current normalization slope parameter.
In this step, the formula for calculating bias current normalization slope parameter is:
In formula,
kbFor bias current normalization slope parameter;
IbuFor the corresponding test bias current sets register value of the interval ceiling temperature of temperature spot;
IbdFor the corresponding test bias current sets register value of temperature spot interval limit temperature;
TuFor the corresponding test temperature value of the interval ceiling temperature of temperature spot;
TdFor the corresponding test temperature value of temperature spot interval limit temperature;
IbcTo pre-set the test bias current sets register value of temperature spot.
Table 3 is that the interval corresponding bias current normalization slope parameter list of obtained each temperature spot is calculated according to table 1.
Table 3
In table 3,
For situation of the environment temperature more than more than 85 DEG C of optical module, its bias current normalization slope ginseng can be given tacit consent to Number is identical with the bias current normalization slope parameter that 70~85 DEG C of temperature spots are interval.
In table 3, handled based on the test data of the table 1 of 1# module testings and table 2:Joined according to normalization slope Number computing formula, calculate respectively bias current APCset, each temperature range for modulating electric current MODset setting values normalization it is oblique Rate.In the embodiment of the present invention, it is normalized with set values during 25 DEG C of room temperature.
The test modulation current settings register value of acquisition is normalized, the temperature of each temperature spot formation is obtained The interval modulation electric current normalization slope parameter of degree includes:
A21, according to each temperature spot of division, forms corresponding temperature range;
A22, obtains the test modulation current settings register value for pre-setting temperature spot;
In this step, it is preferred that pre-setting temperature spot for 25 DEG C.
A23, obtains the difference of the interval corresponding test temperature value of each temperature spot;
A24, obtains the difference of the interval corresponding test modulation current settings register value of each temperature spot;
A25, it is interval for each temperature spot, the interval test of the temperature spot is modulated to the difference of current settings register value Divided by the difference of test temperature value, then with pre-setting the reciprocal multiplication for testing modulation current settings register value of temperature spot, Obtain temperature range modulation electric current normalization slope parameter.
In this step, the formula for calculating modulation electric current normalization slope parameter is:
In formula,
kmFor modulation electric current normalization slope parameter;
ImuFor the corresponding test modulation current settings register value of the interval ceiling temperature of temperature spot;
ImdFor the corresponding test modulation current settings register value of temperature spot interval limit temperature;
TuFor the corresponding test temperature value of the interval ceiling temperature of temperature spot;
TdFor the corresponding test temperature value of temperature spot interval limit temperature;
ImcTo pre-set the test modulation current settings register value of temperature spot.
Table 4 is that the interval corresponding modulation electric current normalization slope parameter list of obtained each temperature spot is calculated according to table 2.
Table 4
In table 4,
For situation of the environment temperature more than more than 85 DEG C of optical module, it can be given tacit consent to and modulate electric current normalization slope ginseng Number is identical with the modulation electric current normalization slope parameter that 70~85 DEG C of temperature spots are interval.
It is preferred that obtaining the interval bias current normalization slope parameter of each temperature spot and the normalization of modulation electric current tiltedly After rate parameter, temperature spot and the mapping relations of bias current normalization slope parameter are built, and, build temperature spot and modulation electricity Flow the mapping relations of normalization slope parameter.So as to which according to temperature spot, the corresponding bias current normalizing of the temperature spot can be obtained Change Slope Parameters and modulation electric current normalization slope parameter.
Fig. 5 is embodiment of the present invention normalization slope parameter schematic diagram.Referring to Fig. 5, abscissa is environment temperature in figure, is indulged Coordinate is bias current normalization slope parameter or modulates electric current normalization slope parameter, each comprising seven temperature spot intervals Temperature spot interval one normalization slope of correspondence, respectively K1~K7, wherein, ordinate is 0 expression normalization slope parameter pair The register value answered is 0, and ordinate is that 1 represents that the corresponding register value of normalization slope parameter is 255.Normalization slope becomes Gesture line one is divided into 7 sections, and the slope of each section of normalization slope Trendline is known, thus, in subsequent applications, as long as obtaining Take the offset (operating temperature) of T temperature spots, it is possible to by the segmentation slope of normalization slope Trendline, derive whole trend The offset of line.
Step 404, the luminous power of optical module output to be applied is adjusted to the target luminous power pre-set, and, output Extinction ratio to the target extinction ratio pre-set, the operating temperature of the optical module to be applied under normal temperature environment is obtained respectively Value, bias current sets register value and modulation current settings register value;
In this step, if necessary to which optical module is placed in into working condition, it is necessary to which write-in temperature range is inclined in the optical module Electric current normalization slope parameter and modulation electric current normalization slope parameter are put, so that the optical module can be according to operating temperature Change, adjusts bias current sets register value and modulation current settings register value, so as to maintain optical module light work(in real time Rate and extinction ratio it is constant.
According to step 401 and the similar method of step 402, can obtain the optical module to be applied setting work temperature Bias current sets register value and modulation current settings register value under degree.
In the embodiment of the present invention, processing module sample 2# under 30 DEG C of environment of environment temperature, passes through external program and MCU Single chip communication, adjusts APCset, MODset register setting value, obtains target luminous power -2.5dBm and extinction ratio 6.5DB, APCset, MODset register setting value of the adjustment are respectively the bias current sets register under the setting operating temperature Value and modulation current settings register value.
It is preferred that normal temperature environment is 25 DEG C or 30 DEG C.
Step 405, according to the operating temperature value of acquisition, bias current sets register value, with reference to the biasing obtained in advance Electric current normalization slope parameter, generates the bias current temperature lookup table of the optical module to be applied;According to the operating temperature of acquisition Value and modulation current settings register value, with reference to the modulation electric current normalization slope parameter obtained in advance, generate this to be applied The modulation current temperature look-up table of optical module, and the bias current temperature lookup table of generation and modulation current temperature look-up table are write Enter the optical module to be applied.
It is inclined with reference to what is obtained in advance according to the operating temperature value of acquisition, bias current sets register value in this step Electric current normalization slope parameter is put, generating the bias current temperature lookup table of the optical module to be applied includes:
B11, inquires about the temperature range bias current normalization slope parameter of each temperature spot formation obtained in advance, obtaining should The corresponding bias current normalization slope value of operating temperature value;
In this step, from the bias current normalization slope parameter obtained in advance, the corresponding temperature of searching work temperature value Degree point is interval, obtains the interval bias current normalization slope value.
B12, according to the slope value and bias current sets register value, calculates the interval interior other temperature spots of the temperature spot Bias current sets register value;
In this step, the formula for calculating the bias current sets register value of the interval interior other temperature spots of the temperature spot is:
Ibt=Ibw-kb×(Tw-Tt)×Ibc
In formula,
IbtFor the interval inherent other work temperatures of the corresponding temperature spot of operating temperaturetWhen bias current sets register Value;
IbwFor the corresponding bias current sets register value of operating temperature;
kbFor the bias current normalization slope parameter that the corresponding temperature spot of operating temperature is interval;
TwFor operating temperature value;
IbcTo pre-set the test bias current sets register value of temperature spot.
In the embodiment of the present invention, according to APCset, MODset setting value under 30 degree of environment temperatures obtained above, by returning One changes that slope is counter is calculated, obtains bias current APCset temperature lookup tables data, modulates electric current MODset temperature lookup tables Data.For example, as described above, when under 30 degree of environment temperatures, the temperature that MCU is monitored is T1, luminous power and extinction ratio adjustment To after desired value, APCset setting values now are APCset1, and MODset setting values are MODset1, then use for reference table 3, the and of table 4 Fig. 5, if T1 is in K3 segmentation, then other temperature spots T2 APCset, MODset offset can be by as above in K3 segmentations Formula is obtained, and is compensated after value, on the basis of temperature compensation table segmented compensation normalization slope is obtained, can be oblique by normalization Rate is calculated, so as to obtain the value of whole temperature range APCset compensation table or MODset compensation tables, by PC programs by with The communication of MCU single-chip microcomputers, will compensate the setting value write-in MCU softwares of each temperature spot of table, completes modular debugging.
So, according to slope value and bias current sets register value, it can calculate and obtain each in temperature spot interval The corresponding bias current sets register value of operating temperature, so as to avoid testing each temperature spot.
B13, is obtained according to the corresponding bias current sets register value of the interval bound temperature spot of the temperature spot and in advance The bias current normalization slope parameter in the adjacent temperature spot interval taken, calculates the biasing of the interval interior each temperature spot of adjacent temperature spot Current settings register value, until calculating the bias current sets register for each temperature range for obtaining the optical module to be applied Value, generates bias current temperature lookup table.
In this step, the formula for calculating the bias current sets register value of the interval interior each temperature spot of adjacent temperature spot is:
Ibt'=Ibwu-kb'×(Tw'-Tt')×Ibc
In formula,
Ibt'For the interval inherent work temperature of adjacent temperature spott'When bias current sets register value;
IbwuFor the interval bias current corresponding with the intersection point temperature in adjacent temperature spot interval of the corresponding temperature spot of operating temperature Set the corresponding temperature spot of register value, i.e. operating temperature interval ceiling temperature point or the corresponding bias current of lower limit temperature point Set register value;
kb'For the bias current normalization slope parameter that adjacent temperature spot is interval;
Tw'For intersection point temperature value;
IbcTo pre-set the test bias current sets register value of temperature spot.
It is inclined with reference to what is obtained in advance according to the operating temperature value of acquisition, bias current sets register value in practical application Electric current normalization slope parameter is put, generating the bias current temperature lookup table of the optical module to be applied can include:
B15, inquires about the temperature range bias current normalization slope parameter of each temperature spot formation obtained in advance, obtaining should The corresponding bias current normalization slope value of operating temperature value;
B16, builds temperature and the coordinate system of bias current sets register value, using temperature as abscissa, bias current is set Register value is determined for ordinate, using the corresponding bias current sets register value of operating temperature value as basic point, with the operating temperature It is worth corresponding bias current normalization slope value for slope, builds the interval straight line of the corresponding temperature spot of the operating temperature value;
B17, obtains the corresponding bias current sets register value of bound temperature spot of the straight line built, with adjacent temperature The interval corresponding bias current normalization slope value of point is slope, builds the interval straight line of adjacent temperature spot, generates with coordinate system table The bias current temperature lookup table shown.
According to the operating temperature value of acquisition and modulation current settings register value, return with reference to the modulation electric current obtained in advance One changes Slope Parameters, generates the temperature range modulation current temperature look-up table of the optical module to be applied and includes:
B21, inquires about the temperature range modulation electric current normalization slope parameter of each temperature spot formation obtained in advance, obtaining should The corresponding modulation electric current normalization slope value of operating temperature value;
In this step, from modulation electric current normalization slope parameter, the corresponding temperature spot of searching work temperature value is interval, obtains Take the interval slope value.
B22, according to the slope value and modulation current settings register value, calculates the interval interior other temperature spots of the temperature spot Modulation current settings register value;
In this step, the formula for calculating the modulation current settings register value of the interval interior other temperature spots of the temperature spot is:
Imt=Imw-km×(Tw-Tt)×Imc
In formula,
ImtFor the interval inherent other work temperatures of the corresponding temperature spot of operating temperaturetWhen modulation current settings register Value;
ImwFor the corresponding modulation current settings register value of operating temperature;
kmFor the modulation electric current normalization slope parameter that the corresponding temperature spot of operating temperature is interval;
TwFor operating temperature value;
ImcTo pre-set the test modulation current settings register value of temperature spot.
So, according to slope value and modulation current settings register value, it can calculate and obtain each in temperature spot interval The corresponding modulation current settings register value of operating temperature, so as to obtain the interval modulation electric current normalization slope ginseng of the temperature spot Number.
B23, is obtained according to the corresponding modulation current settings register value of the interval bound temperature spot of the temperature spot and in advance The modulation electric current normalization slope parameter in the adjacent temperature spot interval taken, calculates the modulation of the interval interior each temperature spot of adjacent temperature spot Current settings register value, until calculating the modulation current settings register for each temperature range for obtaining the optical module to be applied Value, generation modulation current temperature look-up table.
In this step, the formula for calculating the modulation current settings register value of the interval interior each temperature spot of adjacent temperature spot is:
Imt'=Imwu-km'×(Tw'-Tt')×Imc
In formula,
Imt'For the interval inherent work temperature of adjacent temperature spott'When modulation current settings register value;
ImwuFor the interval modulation electric current corresponding with the intersection point temperature in adjacent temperature spot interval of the corresponding temperature spot of operating temperature Set the corresponding temperature spot of register value, i.e. operating temperature interval ceiling temperature point or the corresponding modulation electric current of lower limit temperature point Set register value;
km'For the modulation electric current normalization slope parameter that adjacent temperature spot is interval;
Tw'For intersection point temperature value;
ImcTo pre-set the test modulation current settings register value of temperature spot.
Certainly, in practical application, according to the operating temperature value of acquisition and modulation current settings register value, with reference to advance The modulation electric current normalization slope parameter of acquisition, generates the temperature range modulation current temperature look-up table of the optical module to be applied It can include:
B25, inquires about the temperature range modulation electric current normalization slope parameter of each temperature spot formation obtained in advance, obtaining should The corresponding modulation electric current normalization slope value of operating temperature value;
B26, using temperature as abscissa, modulation current settings register value is that ordinate builds temperature and modulation current settings The coordinate system of register value, using the corresponding modulation current settings register value of operating temperature value as basic point, with the operating temperature value Corresponding modulation electric current normalization slope value is slope, builds the interval straight line of the corresponding temperature spot of the operating temperature value;
B27, obtains the corresponding modulation current settings register value of bound temperature spot of the straight line built, with adjacent temperature The interval corresponding modulation electric current normalization slope value of point is slope, builds the interval straight line of adjacent temperature spot, generates with coordinate system table The modulation current temperature look-up table shown.
So, the interval modulation electric current normalization slope parameter of adjacent temperature spot is being obtained, then is passing through adjacent temperature spot area Between modulation electric current normalization slope parameter formula, the interval adjacent next temperature spot area of adjacent with this temperature spot can be obtained Between modulation electric current normalization slope parameter, so as to obtain the interval modulation electric current normalization slope parameter of all temperature spots.I.e. In the case of known compensation one temperature spot setting value of table normalization slope and normal temperature, other temperature can be extrapolated from formula Degree point offset.
Table 5 is that the embodiment of the present invention writes the temperature lookup table of optical module of generation after optical module, the optical mode according to write-in Deblocking temperature look-up table controls optical module, the luminous power and the parameter signal table of extinction ratio of obtained optical module output.
Table 5
Temperature spot/DEG C -40 -20 -5 0 25 50 70 85
Luminous power/dBm -2.4 -2.46 -2.45 -2.49 -2.51 -2.5 -2.45 -2.42
Extinction ratio/DB 6.44 6.52 6.56 6.61 6.69 6.63 6.58 6.61
In table 5,
Optical module is under the environment temperature of setting, for example, under multiple temperature spots in -40 DEG C~85 DEG C, being obtained by MCU Corresponding operating temperature under environment temperature is taken, temperature lookup table of optical module is searched, obtains the corresponding bias current of the operating temperature And modulation electric current, so that the luminous power and extinction ratio to optical module are controlled, make it stable.
From table 5, the test value of luminous power and extinction ratio is close to sets target:Luminous power -2.5dBm, extinction ratio 6.5DB, the method for showing embodiment of the present invention generation temperature lookup table of optical module is feasible.
From above-mentioned, the method for the generation temperature lookup table of optical module of the embodiment of the present invention, based on optical module laser two The P-I curves and temperature characterisitic of pole pipe, obtain each bias current sets register under predetermined luminous power and extinction ratio in advance Value and modulation current settings register value, are handled with reference to mathematics method for normalizing, are obtained electric current normalization slope parameter, In subsequent applications, according to the bias current sets register value and modulation current settings register value of optical module at normal temperatures, Using the electric current normalization slope parameter being previously obtained, the current value under each temperature spot is calculated, so as to generate temperature lookup table simultaneously Optical module is write, effectively to control the bias current sets and modulation current settings of optical module, makes bias current and modulation electric current In optical module operating temperature range, luminous power and extinction ratio meet use requirement.So, in the generating process of temperature lookup table In, for each optical module, it is only necessary to carry out normal temperature test, save the low temperature and high temperature side during existing use conventional method Resource is tried, the efficiency of generation temperature lookup table of optical module is improved, the time needed for generation temperature lookup table of optical module is reduced, Reduce optical module production cost simultaneously;Further, it is to avoid optical module low temperature, high temperature test, when effectively saving processing Between, reduce resources of production occupancy;Moreover, by new work flow, simplifying optical module production process.
Fig. 6 is the apparatus structure schematic diagram that the embodiment of the present invention generates temperature lookup table of optical module.Referring to Fig. 6, the device Including:Test bias current acquisition module, test and modulate electric current acquisition module, normalized module, using optical module electric current Acquisition module and temperature lookup table generation module, wherein,
Bias current acquisition module is tested, is multiple temperature spots for dividing environment temperature in advance, in each temperature spot, adjusts The luminous power of whole test optical module output obtains test temperature of the test optical module in temperature spot to the target luminous power pre-set Angle value and test bias current sets register value;
Test modulation electric current acquisition module, extinction ratio to the target pre-set for adjusting test optical module output disappears Current settings register value is modulated in light ratio, the test for obtaining test optical module in each temperature spot;
Normalized module, is normalized for the test bias current sets register value to acquisition, obtains Take the temperature range bias current normalization slope parameter of each temperature spot formation;Current settings register is modulated in test to acquisition Value is normalized, and obtains the temperature range modulation electric current normalization slope parameter of each temperature spot formation;
Using optical module electric current acquisition module, for adjusting the luminous power of optical module output to be applied to the mesh pre-set Luminous power is marked, and, the extinction ratio of output obtains the optical module to be applied in normal temperature respectively to the target extinction ratio pre-set Operating temperature value, bias current sets register value and modulation current settings register value under environment;
Temperature lookup table generation module, for the operating temperature value according to acquisition, bias current sets register value, with reference to The bias current normalization slope parameter obtained in advance, generates the bias current temperature lookup table of the optical module to be applied;According to The operating temperature value and modulation current settings register value of acquisition, with reference to the modulation electric current normalization slope ginseng obtained in advance Number, generates the modulation current temperature look-up table of the optical module to be applied, and by the bias current temperature lookup table of generation and modulation Current temperature look-up table writes the optical module to be applied.
Wherein, test bias current acquisition module includes:Temperature range division unit, test temperature difference computational unit, Test bias current difference computational unit, bias current normalization slope computing unit, test modulation current differential computing unit And modulation electric current normalization slope computing unit (not shown), wherein,
Temperature range division unit, for each temperature spot according to division, forms corresponding temperature range;
Test temperature difference computational unit, the difference for obtaining the interval corresponding test temperature value of each temperature spot;
Bias current difference computational unit is tested, the test bias current sets for the setting temperature spot according to acquisition are posted Storage value, obtains the difference of the interval corresponding test bias current sets register value of each temperature spot;
Bias current normalization slope computing unit, for interval for each temperature spot, by the survey that the temperature spot is interval The difference of bias current sets register value divided by the difference of test temperature value are tried, then with pre-setting the test biasing of temperature spot The reciprocal multiplication of current settings register value, obtains the temperature range bias current normalization slope parameter;
Test modulation current differential computing unit, sets for the test for the pre-setting temperature spot modulation electric current according to acquisition Determine register value, obtain the difference of the interval corresponding test modulation current settings register value of each temperature spot;
Electric current normalization slope computing unit is modulated, for interval for each temperature spot, by the survey that the temperature spot is interval The difference of examination modulation current settings register value divided by the difference of test temperature value, then with pre-setting the test modulation of temperature spot The reciprocal multiplication of current settings register value, obtains temperature range modulation electric current normalization slope parameter.
Temperature lookup table generation module includes:Bias current normalization slope acquiring unit, bias current sets register It is worth acquiring unit, bias current temperature lookup table generation unit, modulation electric current normalization slope acquiring unit, modulation current settings Register value acquiring unit and modulation current temperature look-up table generation unit (not shown), wherein,
Bias current normalization slope acquiring unit, for inquiring about bias current normalization slope computing unit, obtains work Make the corresponding bias current normalization slope value of temperature value;
Bias current sets register value acquiring unit, for the slope value according to acquisition and operating temperature correspondence Bias current sets register value, calculate the temperature spot it is interval in other temperature spots bias current sets register value;
Bias current temperature lookup table generation unit, for according to the corresponding biasing of the interval bound temperature spot of the temperature spot Current settings register value and the interval bias current normalization slope parameter of the adjacent temperature spot obtained in advance, are calculated adjacent The bias current sets register value of each temperature spot in temperature spot is interval, until calculating each temperature for obtaining the optical module to be applied Interval bias current sets register value, generates bias current temperature lookup table;
Electric current normalization slope acquiring unit is modulated, for inquiring about modulation electric current normalization slope computing unit, obtaining should The corresponding modulation electric current normalization slope value of operating temperature value;
Current settings register value acquiring unit is modulated, for the slope value according to acquisition and operating temperature correspondence Modulation current settings register value, calculate the temperature spot it is interval in other temperature spots modulation current settings register value;
Current temperature look-up table generation unit is modulated, for according to the corresponding modulation of the interval bound temperature spot of the temperature spot Current settings register value and the interval modulation electric current normalization slope parameter of the adjacent temperature spot obtained in advance, are calculated adjacent The modulation current settings register value of each temperature spot in temperature spot is interval, until calculating each temperature for obtaining the optical module to be applied Interval modulation current settings register value, generation modulation current temperature look-up table.
In the embodiment of the present invention, bias current temperature lookup table and modulation current temperature look-up table can be merged, Obtain temperature lookup table.
Can be with one of ordinary skill in the art will appreciate that realizing that all or part of step in above-described embodiment method is The hardware of correlation is instructed to complete by program, the program can be stored in a computer read/write memory medium, such as: ROM/RAM, magnetic disc, CD etc..
The above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art For member, under the premise without departing from the principles of the invention, some improvements and modifications can also be made, these improvements and modifications also should It is considered as protection scope of the present invention.

Claims (3)

1. a kind of method for generating temperature lookup table of optical module, this method includes:
It is multiple temperature spots to divide environment temperature in advance, in each temperature spot, and the luminous power of adjustment test optical module output is to pre- The target luminous power first set, obtains test optical module in the test temperature value of temperature spot and test bias current sets deposit Device value;
The extinction ratio of adjustment test optical module output obtains test optical module in each temperature spot to the target extinction ratio pre-set Test modulation current settings register value;
The test bias current sets register value of acquisition is normalized, the temperature range of each temperature spot formation is obtained Bias current normalization slope parameter;
The test modulation current settings register value of acquisition is normalized, the temperature range of each temperature spot formation is obtained Electric current normalization slope parameter is modulated, including:According to each temperature spot of division, corresponding temperature range is formed;Acquisition is set in advance Put the test modulation current settings register value of temperature spot;Obtain the difference of the corresponding test temperature value of each temperature range;Obtain Take the difference of the corresponding test modulation current settings register value of each temperature range;For each temperature range, by the temperature The difference divided by the difference of test temperature value of interval test modulation current settings register value, then with pre-setting temperature spot The reciprocal multiplication of test modulation current settings register value, obtains temperature range modulation electric current normalization slope parameter;
The luminous power of optical module to be applied output is adjusted to the target luminous power pre-set, and, the extinction ratio of output is to pre- The target extinction ratio first set, obtains operating temperature value of the optical module to be applied under normal temperature environment, bias current and sets respectively Determine register value and modulation current settings register value;
It is oblique with reference to the bias current normalization obtained in advance according to the operating temperature value of acquisition, bias current sets register value Rate parameter, generates the bias current temperature lookup table of the optical module to be applied;According to the operating temperature value of acquisition and modulation electricity Stream setting register value, with reference to the modulation electric current normalization slope parameter obtained in advance, generates the modulation of the optical module to be applied Current temperature look-up table, and the bias current temperature lookup table of generation and modulation current temperature look-up table are write into the light to be applied Module.
2. the formula for the method for claim 1, wherein obtaining the bias current normalization slope parameter is:
k b = I b u - I b d T u - T d &times; 1 I b c
In formula,
kbFor bias current normalization slope parameter;
IbuFor the corresponding test bias current sets register value of temperature range ceiling temperature;
IbdFor the corresponding test bias current sets register value of temperature range lower limit temperature;
TuFor the corresponding test temperature value of temperature range ceiling temperature;
TdFor the corresponding test temperature value of temperature range lower limit temperature;
IbcTo pre-set the test bias current sets register value of temperature spot.
3. the formula for the method for claim 1, wherein obtaining the modulation electric current normalization slope parameter is:
k m = I m u - I m d T u - T d &times; 1 I m c
In formula,
kmFor modulation electric current normalization slope parameter;
ImuFor the corresponding test modulation current settings register value of temperature range ceiling temperature;
ImdFor the corresponding test modulation current settings register value of temperature range lower limit temperature;
TuFor the corresponding test temperature value of temperature range ceiling temperature;
TdFor the corresponding test temperature value of temperature range lower limit temperature;
ImcTo pre-set the test modulation current settings register value of temperature spot.
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