CN1032234C - 对x光图象进行反差均衡的装置和方法 - Google Patents

对x光图象进行反差均衡的装置和方法 Download PDF

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Publication number
CN1032234C
CN1032234C CN88101717.5A CN88101717A CN1032234C CN 1032234 C CN1032234 C CN 1032234C CN 88101717 A CN88101717 A CN 88101717A CN 1032234 C CN1032234 C CN 1032234C
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CN
China
Prior art keywords
mentioned
human body
threshold value
transmissivity
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN88101717.5A
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English (en)
Chinese (zh)
Other versions
CN88101717A (zh
Inventor
尤格·夫拉斯布洛姆
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Optische Industrie de Oude Delft NV
Original Assignee
Optische Industrie de Oude Delft NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optische Industrie de Oude Delft NV filed Critical Optische Industrie de Oude Delft NV
Publication of CN88101717A publication Critical patent/CN88101717A/zh
Application granted granted Critical
Publication of CN1032234C publication Critical patent/CN1032234C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/36—Temperature of anode; Brightness of image power
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/60—Circuit arrangements for obtaining a series of X-ray photographs or for X-ray cinematography

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN88101717.5A 1987-04-02 1988-04-02 对x光图象进行反差均衡的装置和方法 Expired - Fee Related CN1032234C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8700781 1987-04-02
NL8700781A NL8700781A (nl) 1987-04-02 1987-04-02 Werkwijze en inrichting voor contrastharmonisatie van een roentgenbeeld.

Publications (2)

Publication Number Publication Date
CN88101717A CN88101717A (zh) 1988-10-19
CN1032234C true CN1032234C (zh) 1996-07-03

Family

ID=19849804

Family Applications (1)

Application Number Title Priority Date Filing Date
CN88101717.5A Expired - Fee Related CN1032234C (zh) 1987-04-02 1988-04-02 对x光图象进行反差均衡的装置和方法

Country Status (8)

Country Link
EP (1) EP0348433B1 (nl)
JP (1) JP2651229B2 (nl)
CN (1) CN1032234C (nl)
DE (1) DE3877749T2 (nl)
IL (1) IL85959A (nl)
IN (1) IN169731B (nl)
NL (1) NL8700781A (nl)
WO (1) WO1988007807A1 (nl)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8900553A (nl) * 1989-03-07 1990-10-01 Optische Ind De Oude Delft Nv Werkwijze en inrichting voor spleetradiografie.
US5008914A (en) * 1989-05-30 1991-04-16 Eastman Kodak Company Quantitative imaging employing scanning equalization radiography
NL8902117A (nl) * 1989-08-22 1991-03-18 Optische Ind De Oude Delft Nv Inrichting voor spleetradiografie.
US20040066885A1 (en) * 2002-07-08 2004-04-08 Kabushiki Kaisha Toshiba X-ray diagnosis apparatus

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE372884B (nl) * 1970-02-09 1975-01-20 Medinova Ab
FR2485790A1 (fr) * 1980-06-24 1981-12-31 Radiologie Cie Gle Systeme de filtration, a effet modulable a distance et appareil de radiologie comportant un tel systeme
US4497062A (en) * 1983-06-06 1985-01-29 Wisconsin Alumni Research Foundation Digitally controlled X-ray beam attenuation method and apparatus
NL8400845A (nl) * 1984-03-16 1985-10-16 Optische Ind De Oude Delft Nv Inrichting voor spleetradiografie.
NL8401411A (nl) * 1984-05-03 1985-12-02 Optische Ind De Oude Delft Nv Inrichting voor spleetradiografie.
DE3500812A1 (de) * 1985-01-11 1986-07-17 Siemens AG, 1000 Berlin und 8000 München Roentgendiagnostikeinrichtung mit halbtransparenter blende
CA1244971A (en) * 1985-11-14 1988-11-15 Shih-Ping Wang X-ray radiography method and system

Also Published As

Publication number Publication date
WO1988007807A1 (en) 1988-10-06
DE3877749D1 (de) 1993-03-04
EP0348433B1 (en) 1993-01-20
EP0348433A1 (en) 1990-01-03
IL85959A0 (en) 1988-09-30
CN88101717A (zh) 1988-10-19
JPH02502868A (ja) 1990-09-06
DE3877749T2 (de) 1993-06-24
IN169731B (nl) 1991-12-14
NL8700781A (nl) 1988-11-01
JP2651229B2 (ja) 1997-09-10
IL85959A (en) 1992-07-15

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C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C53 Correction of patent of invention or patent application
COR Change of bibliographic data

Free format text: CORRECT: PATENTEE; FROM: B.V. OPTISCHE INDUSTRIE DE OUDE DELFT TO: DELFT INSTRUMENTS INTELLECTUALPROPERTY CO., LTD.

CP01 Change in the name or title of a patent holder

Patentee after: B. V. Optische Industries 'De Oude Delft'

Patentee before: B.V.Optische Industrie "De Dude Delft"

C19 Lapse of patent right due to non-payment of the annual fee
CF01 Termination of patent right due to non-payment of annual fee