CN103163340A - 电波暗室 - Google Patents
电波暗室 Download PDFInfo
- Publication number
- CN103163340A CN103163340A CN2011104117260A CN201110411726A CN103163340A CN 103163340 A CN103163340 A CN 103163340A CN 2011104117260 A CN2011104117260 A CN 2011104117260A CN 201110411726 A CN201110411726 A CN 201110411726A CN 103163340 A CN103163340 A CN 103163340A
- Authority
- CN
- China
- Prior art keywords
- anechoic chamber
- antenna
- perisporium
- absorbing material
- semicircle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
- G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Abstract
Description
电波暗室 | 100 |
容置空间 | 110 |
半电波暗室 | 130 |
全电波暗室 | 150 |
周壁 | 10 |
吸波材料 | 16 |
尖锥部 | 162 |
底面 | 20 |
第一底面 | 22 |
第二底面 | 24 |
旋转台 | 30 |
测试桌 | 32 |
天线阵列 | 40 |
低频水平天线 | 42 |
低频垂直天线 | 44 |
高频水平天线 | 46 |
高频垂直天线 | 48 |
待测物 | 50 |
Claims (7)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2011104117260A CN103163340A (zh) | 2011-12-12 | 2011-12-12 | 电波暗室 |
TW100146247A TW201325427A (zh) | 2011-12-12 | 2011-12-14 | 電波暗室 |
US13/660,050 US20130147650A1 (en) | 2011-12-12 | 2012-10-25 | Electromagnetic anechoic chamber |
JP2012262632A JP2013123050A (ja) | 2011-12-12 | 2012-11-30 | 電波暗室 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2011104117260A CN103163340A (zh) | 2011-12-12 | 2011-12-12 | 电波暗室 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN103163340A true CN103163340A (zh) | 2013-06-19 |
Family
ID=48571485
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2011104117260A Pending CN103163340A (zh) | 2011-12-12 | 2011-12-12 | 电波暗室 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20130147650A1 (zh) |
JP (1) | JP2013123050A (zh) |
CN (1) | CN103163340A (zh) |
TW (1) | TW201325427A (zh) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104407257A (zh) * | 2014-12-04 | 2015-03-11 | 成都思邦力克科技有限公司 | 电磁兼容性检测系统 |
CN104655949A (zh) * | 2013-11-21 | 2015-05-27 | 鸿富锦精密电子(天津)有限公司 | 电波暗室及电磁干扰的测试方法 |
CN104749451A (zh) * | 2013-12-27 | 2015-07-01 | 深圳市计量质量检测研究院 | 电波暗室及其使用方法 |
CN106646045A (zh) * | 2016-12-21 | 2017-05-10 | 工业和信息化部电信研究院 | 用于10米法半电波暗室高频和低频辐射骚扰测试的系统 |
CN108370278A (zh) * | 2015-12-16 | 2018-08-03 | 兰洛斯公司 | 用于测试与交通工具的无线通信的方法和装置 |
CN109884569A (zh) * | 2019-01-31 | 2019-06-14 | 中国人民解放军63653部队 | 一种小反射宽频带标准场产生装置 |
CN110398721A (zh) * | 2018-04-25 | 2019-11-01 | 成都飞机工业(集团)有限责任公司 | 一种雷达吸波材料遮挡屏成型方法 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105636420B (zh) * | 2016-01-11 | 2018-10-16 | 北京仿真中心 | 一种屏蔽暗箱 |
KR101935259B1 (ko) * | 2017-02-10 | 2019-01-07 | 한국전자통신연구원 | 전자파 잔향실 |
CN112087252A (zh) * | 2020-08-06 | 2020-12-15 | 航天科工空间工程发展有限公司 | 一种微波暗墙 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001228188A (ja) * | 2000-02-21 | 2001-08-24 | San Technos Kk | 電波暗室 |
JP2002353683A (ja) * | 2001-05-28 | 2002-12-06 | Murata Mfg Co Ltd | 電波暗室および電波暗室用の遮蔽体 |
CN101750549A (zh) * | 2008-12-15 | 2010-06-23 | 北方设计研究院 | 可进行电磁兼容测试和天线测量的电磁测量综合暗室 |
CN201589796U (zh) * | 2009-11-27 | 2010-09-22 | 英业达股份有限公司 | 电磁波暗室 |
-
2011
- 2011-12-12 CN CN2011104117260A patent/CN103163340A/zh active Pending
- 2011-12-14 TW TW100146247A patent/TW201325427A/zh unknown
-
2012
- 2012-10-25 US US13/660,050 patent/US20130147650A1/en not_active Abandoned
- 2012-11-30 JP JP2012262632A patent/JP2013123050A/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001228188A (ja) * | 2000-02-21 | 2001-08-24 | San Technos Kk | 電波暗室 |
JP2002353683A (ja) * | 2001-05-28 | 2002-12-06 | Murata Mfg Co Ltd | 電波暗室および電波暗室用の遮蔽体 |
CN101750549A (zh) * | 2008-12-15 | 2010-06-23 | 北方设计研究院 | 可进行电磁兼容测试和天线测量的电磁测量综合暗室 |
CN201589796U (zh) * | 2009-11-27 | 2010-09-22 | 英业达股份有限公司 | 电磁波暗室 |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104655949A (zh) * | 2013-11-21 | 2015-05-27 | 鸿富锦精密电子(天津)有限公司 | 电波暗室及电磁干扰的测试方法 |
CN104749451A (zh) * | 2013-12-27 | 2015-07-01 | 深圳市计量质量检测研究院 | 电波暗室及其使用方法 |
CN104407257A (zh) * | 2014-12-04 | 2015-03-11 | 成都思邦力克科技有限公司 | 电磁兼容性检测系统 |
CN108370278A (zh) * | 2015-12-16 | 2018-08-03 | 兰洛斯公司 | 用于测试与交通工具的无线通信的方法和装置 |
CN108370278B (zh) * | 2015-12-16 | 2021-05-11 | 兰洛斯公司 | 用于测试与交通工具的无线通信的方法和装置 |
US11088768B2 (en) | 2015-12-16 | 2021-08-10 | Ranlos Ab | Method and apparatus for testing wireless communication to vehicles |
CN106646045A (zh) * | 2016-12-21 | 2017-05-10 | 工业和信息化部电信研究院 | 用于10米法半电波暗室高频和低频辐射骚扰测试的系统 |
CN110398721A (zh) * | 2018-04-25 | 2019-11-01 | 成都飞机工业(集团)有限责任公司 | 一种雷达吸波材料遮挡屏成型方法 |
CN109884569A (zh) * | 2019-01-31 | 2019-06-14 | 中国人民解放军63653部队 | 一种小反射宽频带标准场产生装置 |
Also Published As
Publication number | Publication date |
---|---|
US20130147650A1 (en) | 2013-06-13 |
JP2013123050A (ja) | 2013-06-20 |
TW201325427A (zh) | 2013-06-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20180209 Address after: Haiyun street, Tianjin economic and Technological Development Zone No. 80 Applicant after: Hongfujin Precision Electronics (Tianjin) Co., Ltd. Address before: 518109 Guangdong city of Shenzhen province Baoan District Longhua Town Industrial Zone tabulaeformis tenth East Ring Road No. 2 two Applicant before: Hongfujin Precise Industry (Shenzhen) Co., Ltd. Applicant before: Hon Hai Precision Industry Co., Ltd. |
|
TA01 | Transfer of patent application right | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20130619 |
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RJ01 | Rejection of invention patent application after publication |