CN103134422A - Testing device with four coplanar feet - Google Patents
Testing device with four coplanar feet Download PDFInfo
- Publication number
- CN103134422A CN103134422A CN2011103913709A CN201110391370A CN103134422A CN 103134422 A CN103134422 A CN 103134422A CN 2011103913709 A CN2011103913709 A CN 2011103913709A CN 201110391370 A CN201110391370 A CN 201110391370A CN 103134422 A CN103134422 A CN 103134422A
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- coplanar
- parallel circuit
- pin
- electronic component
- feet
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Abstract
The invention discloses a testing device with four coplanar feet, and the testing device with the four coplanar feet is applied to the field of electronic component manufacture. The testing device with the four coplanar feet comprises a power supply and a parallel circuit. One parallel connection node of the parallel circuit is provided with a four-hole socket carrying out four-foot coplanar tests. When four lead feet of an electronic component are coplanar, the four lead feet of the electronic component are evenly inserted in the four jacks of the four-hole socket, and the parallel circuit is in breakover. When the four lead feet of the electronic component are not coplanar, the four lead feet of the electronic component cannot be evenly inserted in the four jacks of the four-hole socket, and the parallel circuit cannot be in breakover. The testing device with the four coplanar feet has the advantages of being capable of improving the efficiency and the accuracy of the four-foot coplanar tests in the field of the electronic component manufacture.
Description
Technical field
The present invention relates to a kind of four coplanar proving installations of pin for manufacture field of electronic elements.
Background technology
On the electronic component that generally uses at present, four pins are arranged, a qualified electronic component, these four pins should be coplanar, namely so-called four pin are coplanar.Present technical standard, the plane error of these four pins judge that namely this electronic component is that four pin are coplanar within 0.1mm, only in this way this electronic component be only qualified.The coplanar method of testing of four pin that adopts at present is: adopt projection pattern, electronic component pin is used the equipment such as optical comparator be projected to measurement by magnification on screen, four pin coplanarities are judged.Inefficiency, and the False Rate that the human operational error causes is higher, causes the four coplanar test accuracys rate of pin to descend.
Summary of the invention
The objective of the invention is in order to overcome the deficiencies in the prior art, a kind of four coplanar proving installations of pin are provided, it is simple in structure, and the judgement four coplanar efficient of pin and accuracy rate are all high
A kind of technical scheme that realizes above-mentioned purpose is: a kind of four coplanar proving installations of pin, comprise power supply and parallel circuit, and the four eyed socket of the four coplanar tests of pin is carried out in a sys node setting of described parallel circuit.
Further, on two of described parallel circuit branch roads, the first resistance and the second resistance are set respectively.
Further, described power supply is direct supply.
Further, on two of described parallel circuit branch roads, the first rectifier and the second rectifier are set respectively.
Further, described the first rectifier and described the second rectifier are commutation diodes.
Adopted the technical scheme of a kind of four coplanar proving installations of pin of the present invention, namely comprise power supply and parallel circuit at described proving installation, the technical scheme of the four eyed socket of the four coplanar tests of pin is carried out in a sys node setting of described parallel circuit, and its technique effect is: efficient and the accuracy rate that can improve the field of electronic components manufacturing four coplanar tests of pin.
Description of drawings
Fig. 1 is the circuit diagram of a kind of four coplanar proving installations of pin of the present invention.
Embodiment
To see also Fig. 1 and Fig. 2, in order can understand technical scheme of the present invention better, below by embodiment particularly, and to be described in detail by reference to the accompanying drawings:
A kind of four coplanar proving installations of pin of the present invention comprise power supply 1 and parallel circuit 2, and the four eyed socket 3 of the four coplanar tests of pin is carried out in a sys node setting of described parallel circuit 2.
When four pins, four pin of electronic component when coplanar, four pins of electronic component evenly are plugged on four jacks of four eyed socket, described parallel circuit conducting, when four pins of electronic component are not that four pin are when coplanar, four pins of electronic component can't evenly be plugged on four jacks of described four eyed socket, and described parallel circuit can't conducting.
Therefore according to the break-make of circuit, just can judge whether four pins of electronic component are that four pin are coplanar.Compared with classic method, the four coplanar testing efficiencies of pin and accuracy rate are higher.
In order to protect the electronic component of testing can be not breakdown because of short circuit, therefore on two branch roads of described parallel circuit 2, the first resistance 21 and the second resistance 22 be set respectively.Certain the first resistance 21 and the second resistance 22 also available bulb substitute, and observe like this conducting of parallel circuit and open circuit more intuitively, and efficient is also higher.
In order further to improve the convenience that described proving installation uses, what described power supply 1 adopted is direct supply, the first rectifier 23 and the second rectifier 24 are set respectively on two branch roads of described parallel circuit, and what described the first rectifier 23 and the second rectifier 24 were selected is commutation diode or IGBT pipe.
Those of ordinary skill in the art will be appreciated that, above embodiment illustrates the present invention, and be not to be used as limitation of the invention, as long as in connotation scope of the present invention, all will drop in claims scope of the present invention variation, the modification of the above embodiment.
Claims (5)
1. coplanar proving installation of pin, it is characterized in that: described proving installation comprises power supply (1) and parallel circuit (2), the four eyed socket (3) of the four coplanar tests of pin is carried out in a sys node setting of described parallel circuit (2).
2. the four coplanar proving installations of pin according to claim 1, is characterized in that: the first resistance (21) and the second resistance (22) are set respectively on two branch roads of described parallel circuit (2).
3. proving installation according to claim 1 and 2, it is characterized in that: described power supply (1) is direct supply.
4. the four coplanar proving installations of pin according to claim 3, is characterized in that: the first rectifier (23) and the second rectifier (24) are set respectively on two branch roads of described parallel circuit (2).
5. four coplanar proving installations of pin according to claim 4, it is characterized in that: described the first rectifier (23) and described the second rectifier (24) are commutation diodes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011103913709A CN103134422A (en) | 2011-11-30 | 2011-11-30 | Testing device with four coplanar feet |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011103913709A CN103134422A (en) | 2011-11-30 | 2011-11-30 | Testing device with four coplanar feet |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN103134422A true CN103134422A (en) | 2013-06-05 |
Family
ID=48494573
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011103913709A Pending CN103134422A (en) | 2011-11-30 | 2011-11-30 | Testing device with four coplanar feet |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103134422A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103593517A (en) * | 2013-11-01 | 2014-02-19 | 浪潮电子信息产业股份有限公司 | Design method based on board-level power-supply current feedback circuit |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN85203558U (en) * | 1985-08-20 | 1987-01-28 | 罗春根 | Pocket ttl integrated circuit on-line tester |
| US20050118869A1 (en) * | 2001-11-12 | 2005-06-02 | Fci Americas Technology, Inc. | Connector for high-speed communications |
| CN1847784A (en) * | 2005-04-05 | 2006-10-18 | 华为技术有限公司 | Device pin coplanarity measuring method |
| CN101424511A (en) * | 2008-12-16 | 2009-05-06 | 桂林电子科技大学 | Coplanarity detector for pins of IC chip |
| CN201993451U (en) * | 2010-12-14 | 2011-09-28 | 河南省电力公司平顶山供电公司 | Switching power supply maintenance detector |
| CN202393347U (en) * | 2011-11-30 | 2012-08-22 | 上海市电力公司 | Four-pin co-planarity tester |
-
2011
- 2011-11-30 CN CN2011103913709A patent/CN103134422A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN85203558U (en) * | 1985-08-20 | 1987-01-28 | 罗春根 | Pocket ttl integrated circuit on-line tester |
| US20050118869A1 (en) * | 2001-11-12 | 2005-06-02 | Fci Americas Technology, Inc. | Connector for high-speed communications |
| CN1847784A (en) * | 2005-04-05 | 2006-10-18 | 华为技术有限公司 | Device pin coplanarity measuring method |
| CN101424511A (en) * | 2008-12-16 | 2009-05-06 | 桂林电子科技大学 | Coplanarity detector for pins of IC chip |
| CN201993451U (en) * | 2010-12-14 | 2011-09-28 | 河南省电力公司平顶山供电公司 | Switching power supply maintenance detector |
| CN202393347U (en) * | 2011-11-30 | 2012-08-22 | 上海市电力公司 | Four-pin co-planarity tester |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103593517A (en) * | 2013-11-01 | 2014-02-19 | 浪潮电子信息产业股份有限公司 | Design method based on board-level power-supply current feedback circuit |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20130605 |