CN202177671U - Electronic component parameter testing platform - Google Patents
Electronic component parameter testing platform Download PDFInfo
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- CN202177671U CN202177671U CN2011202789714U CN201120278971U CN202177671U CN 202177671 U CN202177671 U CN 202177671U CN 2011202789714 U CN2011202789714 U CN 2011202789714U CN 201120278971 U CN201120278971 U CN 201120278971U CN 202177671 U CN202177671 U CN 202177671U
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Abstract
The utility model discloses an electronic component parameter testing platform which is characterized in that the electronic component parameter testing platform includes a power supply module, a voltage display module, a signal source module, and a plurality of slots which are connected in parallel; the slot includes at least seven connecting terminals; the power module includes a power ground terminal, a plus 15V output terminal and a plus 30V output terminal which are connected with first connecting terminals, second connecting terminals, and third connecting terminals of the slots respectively; the voltage display module includes a voltage input first terminal and a voltage input second terminal which are connected with fourth connecting terminals and fifth connecting terminals of the slots respectively. The signal source module includes a signal output terminal and a signal ground terminal which are connected with sixth connecting terminals and seven connecting terminals of the slots respectively. The electronic component parameter testing platform adopts the module connecting mode, has the expansibility, and can test various complex electronic components, and is suitable for the electronic technology practice.
Description
Technical field
The utility model relates to device for inspecting electronic component package.
Background technology
Electronic devices and components commonly used have resistance, electric capacity, diode, triode etc.; Adopt multimeter to test to these electronic devices and components; Also have some electronic devices and components commonly used,, be difficult to test with multimeter separately like 555 integrated packages, controllable silicon, LM317,7805 etc.
The utility model content
The utility model provides a kind of extendible electronic devices and components parameter testing platform.
Electronic devices and components parameter testing platform; It is characterized in that comprising power module, voltage display module and signal source module; Also comprise the draw-in groove that several are parallelly connected; Said draw-in groove comprises 7 splicing ears at least, said power module comprise power supply ground end ,+the 15V output terminal and+the 30V output terminal, be connected to first splicing ear, second splicing ear and the 3rd splicing ear of draw-in groove respectively; The voltage display module comprises that voltage is imported first end and voltage is imported second end, is connected to the 4th splicing ear and the 5th splicing ear of draw-in groove respectively; Signal source module comprises signal output part and signal ground end, is connected to the 6th splicing ear and the 7th splicing ear of draw-in groove respectively.
Further, described electronic devices and components parameter testing platform comprises 555 test modules, and said 555 test modules comprise first plug-in card, and first plug-in card can removably be adorned and be inserted on the draw-in groove; Said 555 test modules comprise 555 test benches, the 11 resistance, the 12 resistance, the 13 resistance, the 14 resistance, the 11 electric capacity, the 12 electric capacity and the 11 light emitting diode; First port of 555 test benches be connected to first plug-in card first splicing ear; Second port of 555 test benches links to each other with the 6th port of 555 test benches; The 11 electric capacity is electrochemical capacitor; Second port of 555 test benches links to each other with the positive pole of the 11 electric capacity; The negative pole of the 11 electric capacity links to each other with first port of test bench, and the positive pole of the 11 electric capacity is connected to the 7th port of test bench through the 12 resistance, and the 3rd port of test bench is connected to first port of test bench through the 14 resistance; The 4th port of test bench links to each other with the 8th port of test bench; And be connected to second splicing ear of first plug-in card, and the 8th port of test bench is connected to the 7th port of test bench through the 11 resistance, and the 8th port of test bench is connected to the 3rd port of test bench through the 11 light emitting diode and the 13 resistance.
Further, described electronic devices and components parameter testing platform comprises the one-way SCR test module, and the one-way SCR test module comprises second plug-in card, and second plug-in card can removably be adorned and be inserted on the draw-in groove; The one-way SCR test module comprises the one or three end test bench; The 3rd port of the one or three end test bench is connected to first splicing ear of second plug-in card; First port of the one or three end test bench closes the 3rd port that is connected to the one or three end test bench through second twelvemo; Second splicing ear of second plug-in card is connected to first port of the one or three end test bench through the 23 resistance and the 21 light emitting diode; Second splicing ear of second plug-in card is connected to the 3rd port of the one or three end test bench through the 21 resistance and the 22 resistance, and the tie point of the 21 resistance and the 22 resistance is connected to second port of the one or three end test bench through the 21 switch.Further, the 21 switch and second twelvemo are closed and are touch-switch.
Further, described electronic devices and components parameter testing platform comprises the LM317 test module, and the LM317 test module comprises the 3rd plug-in card, and the 3rd plug-in card can removably be adorned and be inserted on the draw-in groove; The LM317 test module comprises the two or three end test bench; The 3rd port of the two or three end test bench is connected to second splicing ear of the 3rd plug-in card; First port of the two or three end test bench is connected to second port of the two or three end test bench through the 31 resistance; First port of the two or three end test bench is connected to first splicing ear of the 3rd plug-in card through the 32 resistance; The 31 electric capacity is parallelly connected with the 32 resistance; Second port of the two or three end test bench is connected to the 4th splicing ear of the 3rd plug-in card through the 33 resistance, and the 4th splicing ear of the 3rd plug-in card is connected to first splicing ear of the 3rd plug-in card through the 34 resistance, and first splicing ear of the 3rd plug-in card links to each other with the 5th splicing ear of the 3rd plug-in card.
Further, described electronic devices and components parameter testing platform comprises 78 serial regulator block test modules, and 78 serial regulator block test modules comprise the 4th plug-in card, and the 4th plug-in card can removably be adorned and be inserted on the draw-in groove; 78 serial regulator block test modules comprise the three or three end test bench; First port of the three or three end test bench is connected to the 3rd splicing ear of the 4th plug-in card; Be provided with the 32 electric capacity between first port of the three or three end test bench and second port of the three or three end test bench; Be provided with the 33 electric capacity between the 3rd port of the three or three end test bench and second port of the three or three end test bench; Second port of the three or three end test bench is connected to first splicing ear of the 4th plug-in card, and first splicing ear of the 4th plug-in card links to each other with the 5th splicing ear of the 4th plug-in card, and the 3rd port of the three or three end tester links to each other with the 4th splicing ear of the 4th plug-in card.
Compared with prior art; The utlity model has following advantage: the utility model adopts the module juncture; Have extendability, test other electronic devices and components if desired, can expand easily; Therefore the electronic devices and components parameter testing platform of the utility model can be tested multiplely than the complicated electronic components and parts, is highly suitable in the Electronic Process Practical Course.
Description of drawings
Fig. 1 is the structural representation of the utility model;
Fig. 2 is the circuit theory diagrams of 555 test modules;
Fig. 3 is the circuit theory diagrams of one-way SCR test module;
Fig. 4 is the circuit theory diagrams of LM317 test module;
Fig. 5 is the circuit theory diagrams of 78 serial regulator block test modules.
Embodiment
As shown in Figure 1; Electronic devices and components parameter testing platform is characterized in that comprising power module, voltage display module and signal source module, also comprises the draw-in groove of 4 parallel connections; Draw-in groove can be expanded as required; Said draw-in groove comprises 8 splicing ears, said power module comprise power supply ground end GND ,+the 15V output terminal and+the 30V output terminal, be connected to first splicing ear 1, second splicing ear 2 and the 3rd splicing ear 3 of draw-in groove respectively; The voltage display module comprises that voltage is imported first end "+" end and voltage is imported second end "-" end, is connected to the 4th splicing ear 4 and the 5th splicing ear 5 of draw-in groove respectively; Signal source module comprises signal output part "+" end and signal ground end "-" end, is connected to the 6th splicing ear 6 and the 7th splicing ear 7 of draw-in groove respectively.Among the figure, the 8th splicing ear 8 of draw-in groove is unsettled, and it can be connected to first splicing ear 1 of draw-in groove, thereby the reliability of enhanced system also can be used as the expansion end and is used for other purposes.
As shown in Figure 2,555 test modules comprise the first plug-in card (not shown), and first plug-in card can removably be adorned and be inserted on the draw-in groove; Said 555 test modules comprise 555 test bench U11, the 11 resistance R the 11, the 12 resistance R the 12, the 13 resistance R the 13, the 14 resistance R the 14, the 11 capacitor C the 11, the 12 capacitor C 12 and the 11 LED 11; First port one of 555 test bench U11 be connected to first plug-in card first splicing ear; Second port 2 of 555 test benches links to each other with the 6th port 6 of 555 test benches; The 11 capacitor C 11 is an electrochemical capacitor; Second port 2 of 555 test benches links to each other with the positive pole of the 11 capacitor C 11; The negative pole of the 11 capacitor C 11 links to each other with first port one of test bench, and the positive pole of the 11 capacitor C 11 is connected to the 7th port 7 of test bench through the 12 resistance R 12, and the 3rd port 3 of test bench is connected to first port one of test bench through the 14 resistance R 14; The 4th port 4 of test bench links to each other with the 8th port 8 of test bench; And be connected to second splicing ear of first plug-in card, and the 8th port 8 of test bench is connected to the 7th port 7 of test bench through the 11 resistance R 11, and the 8th port 8 of test bench is connected to the 3rd port 3 of test bench through the 11 LED 11 and the 13 resistance R 13.First plug-in card is inserted into (first splicing ear of first plug-in card is connected with first splicing ear of draw-in groove on the draw-in groove; The i splicing ear of first plug-in card is connected with the i splicing ear of draw-in groove); Can test 555; When inserting in 555 test benches with 555, what the i.e. expression of the 11 LED 11 flicker was tested 555 is normal.
As shown in Figure 3, the one-way SCR test module comprises the second plug-in card (not shown), and second plug-in card can removably be adorned and be inserted on the draw-in groove; The one-way SCR test module comprises the one or three end test bench MCR21; The 3rd port 3 of the one or three end test bench MCR21 is connected to first splicing ear of second plug-in card; First port one of the one or three end test bench MCR21 closes the 3rd port 3 that K22 is connected to the one or three end test bench MCR21 through second twelvemo; Second splicing ear of second plug-in card is connected to first port one of the one or three end test bench MCR21 through the 23 resistance R 23 and the 21 LED 21; The tie point that second splicing ear of second plug-in card is connected to the 3rd port 3, the 21 resistance R 21 and the 22 resistance R 22 of the one or three end test bench MCR21 through the 21 resistance R 21 and the 22 resistance R 22 is connected to second port 2 of the one or three end test bench MCR21 through the 21 K switch 21.The 21 switch and second twelvemo are closed and are touch-switch.Second plug-in card is inserted into (the i splicing ear of second plug-in card is connected with the i splicing ear of draw-in groove) on the draw-in groove, can tests one-way SCR.First port one, second port 2 and the 3rd port 3 of the pin A of one-way SCR, G, respectively corresponding the one or the three end test bench MCR21 of K; It is bright to press the 21 K switch 21, the 21 LEDs 21, unclamps the 21 K switch 21; The 21 LED 21 is kept bright; Press second twelvemo and close K21 and unclamp, the 21 LED 21 extinguishes, and this representes that promptly the one-way SCR of being tested is normal.
As shown in Figure 4, the LM317 test module comprises the 3rd plug-in card (not shown), and the 3rd plug-in card can removably be adorned and be inserted on the draw-in groove; The LM317 test module comprises the two or three end test bench JP31; The 3rd port 3 of the two or three end test bench JP31 is connected to second splicing ear of the 3rd plug-in card; First port one of the two or three end test bench JP31 is connected to second port 2 of the two or three end test bench JP31 through the 31 resistance R 31; First port one of the two or three end test bench JP31 is connected to first splicing ear of the 3rd plug-in card through the 32 resistance R 32; The 31 capacitor C 31 is parallelly connected with the 32 resistance R 32; Second port 2 of the two or three end test bench JP31 is connected to the 4th splicing ear of the 3rd plug-in card through the 33 resistance R 33, and the 4th splicing ear of the 3rd plug-in card is connected to first splicing ear of the 3rd plug-in card through the 34 resistance R 34, and first splicing ear of the 3rd plug-in card links to each other with the 5th splicing ear of the 3rd plug-in card.The 3rd plug-in card is inserted into (the i splicing ear of the 3rd plug-in card is connected with the i splicing ear of draw-in groove) on the draw-in groove, can tests LM317, the voltage stabilizing value of LM317 can be presented at the voltage display module.
As shown in Figure 5,78 serial regulator block test modules comprise the 4th plug-in card (not shown), and the 4th plug-in card can removably be adorned and be inserted on the draw-in groove; 78 serial regulator block test modules comprise the three or three end test bench JP32; First port one of the three or three end test bench JP32 be connected to the 4th plug-in card the 3rd splicing ear (+30V); Be provided with the 32 capacitor C 32 between second port 2 of first port one of the three or three end test bench JP32 and the three or three end test bench JP32; Be provided with the 33 capacitor C 33 between the 3rd port 3 of the three or three end test bench JP32 and second port 2 of the three or three end test bench JP32; Second port 2 of the three or three end test bench JP32 is connected to first splicing ear of the 4th plug-in card; First splicing ear of the 4th plug-in card links to each other with the 5th splicing ear of the 4th plug-in card, and the 3rd port 3 of the three or three end tester JP32 links to each other with the 4th splicing ear of the 4th plug-in card.The 4th plug-in card is inserted into (the i splicing ear of the 4th plug-in card is connected with the i splicing ear of draw-in groove) on the draw-in groove; Then can test 78 serial regulator blocks, testable 78 serial regulator blocks comprise 7805,7806,7809,7812,7815,7824 etc.
Claims (6)
1. electronic devices and components parameter testing platform; It is characterized in that comprising power module, voltage display module and signal source module; Also comprise the draw-in groove that several are parallelly connected; Said draw-in groove comprises 7 splicing ears at least, said power module comprise power supply ground end ,+the 15V output terminal and+the 30V output terminal, be connected to first splicing ear, second splicing ear and the 3rd splicing ear of draw-in groove respectively; The voltage display module comprises that voltage is imported first end and voltage is imported second end, is connected to the 4th splicing ear and the 5th splicing ear of draw-in groove respectively; Signal source module comprises signal output part and signal ground end, is connected to the 6th splicing ear and the 7th splicing ear of draw-in groove respectively.
2. electronic devices and components parameter testing platform according to claim 1 is characterized in that comprising 555 test modules, and said 555 test modules comprise first plug-in card, and first plug-in card can removably be adorned and be inserted on the draw-in groove; Said 555 test modules comprise 555 test benches, the 11 resistance, the 12 resistance, the 13 resistance, the 14 resistance, the 11 electric capacity, the 12 electric capacity and the 11 light emitting diode; First port of 555 test benches be connected to first plug-in card first splicing ear; Second port of 555 test benches links to each other with the 6th port of 555 test benches; The 11 electric capacity is electrochemical capacitor; Second port of 555 test benches links to each other with the positive pole of the 11 electric capacity; The negative pole of the 11 electric capacity links to each other with first port of test bench, and the positive pole of the 11 electric capacity is connected to the 7th port of test bench through the 12 resistance, and the 3rd port of test bench is connected to first port of test bench through the 14 resistance; The 4th port of test bench links to each other with the 8th port of test bench; And be connected to second splicing ear of first plug-in card, and the 8th port of test bench is connected to the 7th port of test bench through the 11 resistance, and the 8th port of test bench is connected to the 3rd port of test bench through the 11 light emitting diode and the 13 resistance.
3. electronic devices and components parameter testing platform according to claim 2 is characterized in that comprising the one-way SCR test module, and the one-way SCR test module comprises second plug-in card, and second plug-in card can removably be adorned and be inserted on the draw-in groove; The one-way SCR test module comprises the one or three end test bench; The 3rd port of the one or three end test bench is connected to first splicing ear of second plug-in card; First port of the one or three end test bench closes the 3rd port that is connected to the one or three end test bench through second twelvemo; Second splicing ear of second plug-in card is connected to first port of the one or three end test bench through the 23 resistance and the 21 light emitting diode; Second splicing ear of second plug-in card is connected to the 3rd port of the one or three end test bench through the 21 resistance and the 22 resistance, and the tie point of the 21 resistance and the 22 resistance is connected to second port of the one or three end test bench through the 21 switch.
4. electronic devices and components parameter testing platform according to claim 3 is characterized in that the 21 switch and second twelvemo pass is touch-switch.
5. electronic devices and components parameter testing platform according to claim 3 is characterized in that comprising the LM317 test module, and the LM317 test module comprises the 3rd plug-in card, and the 3rd plug-in card can removably be adorned and be inserted on the draw-in groove; The LM317 test module comprises the two or three end test bench; The 3rd port of the two or three end test bench is connected to second splicing ear of the 3rd plug-in card; First port of the two or three end test bench is connected to second port of the two or three end test bench through the 31 resistance; First port of the two or three end test bench is connected to first splicing ear of the 3rd plug-in card through the 32 resistance; The 31 electric capacity is parallelly connected with the 32 resistance; Second port of the two or three end test bench is connected to the 4th splicing ear of the 3rd plug-in card through the 33 resistance, and the 4th splicing ear of the 3rd plug-in card is connected to first splicing ear of the 3rd plug-in card through the 34 resistance, and first splicing ear of the 3rd plug-in card links to each other with the 5th splicing ear of the 3rd plug-in card.
6. electronic devices and components parameter testing platform according to claim 5 is characterized in that comprising 78 serial regulator block test modules, and 78 serial regulator block test modules comprise the 4th plug-in card, and the 4th plug-in card can removably be adorned and be inserted on the draw-in groove; 78 serial regulator block test modules comprise the three or three end test bench; First port of the three or three end test bench is connected to the 3rd splicing ear of the 4th plug-in card; Be provided with the 32 electric capacity between first port of the three or three end test bench and second port of the three or three end test bench; Be provided with the 33 electric capacity between the 3rd port of the three or three end test bench and second port of the three or three end test bench; Second port of the three or three end test bench is connected to first splicing ear of the 4th plug-in card, and first splicing ear of the 4th plug-in card links to each other with the 5th splicing ear of the 4th plug-in card, and the 3rd port of the three or three end tester links to each other with the 4th splicing ear of the 4th plug-in card.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011202789714U CN202177671U (en) | 2011-08-03 | 2011-08-03 | Electronic component parameter testing platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011202789714U CN202177671U (en) | 2011-08-03 | 2011-08-03 | Electronic component parameter testing platform |
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| Publication Number | Publication Date |
|---|---|
| CN202177671U true CN202177671U (en) | 2012-03-28 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011202789714U Expired - Fee Related CN202177671U (en) | 2011-08-03 | 2011-08-03 | Electronic component parameter testing platform |
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| Country | Link |
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| CN (1) | CN202177671U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102305908A (en) * | 2011-08-03 | 2012-01-04 | 华南理工大学 | Parameter test platform for electronic component |
| CN107462835A (en) * | 2017-08-21 | 2017-12-12 | 安徽中家智康科技有限公司 | A kind of card insert type one controls the test device of more frequency-changeable compressors |
-
2011
- 2011-08-03 CN CN2011202789714U patent/CN202177671U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102305908A (en) * | 2011-08-03 | 2012-01-04 | 华南理工大学 | Parameter test platform for electronic component |
| CN102305908B (en) * | 2011-08-03 | 2013-07-03 | 华南理工大学 | Parameter test platform for electronic component |
| CN107462835A (en) * | 2017-08-21 | 2017-12-12 | 安徽中家智康科技有限公司 | A kind of card insert type one controls the test device of more frequency-changeable compressors |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120328 Termination date: 20140803 |
|
| EXPY | Termination of patent right or utility model |