CN102305908A - Parameter test platform for electronic component - Google Patents
Parameter test platform for electronic component Download PDFInfo
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- CN102305908A CN102305908A CN201110220284A CN201110220284A CN102305908A CN 102305908 A CN102305908 A CN 102305908A CN 201110220284 A CN201110220284 A CN 201110220284A CN 201110220284 A CN201110220284 A CN 201110220284A CN 102305908 A CN102305908 A CN 102305908A
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Abstract
The invention discloses a parameter test platform for an electronic component. The platform is characterized in that: the platform comprises a power supply module, a voltage display module, and a signal source module and a plurality of channel sections, wherein the channel sections are in parallel connection and at least comprises seven connection terminals. Besides, the power supply module comprises a power supply ground terminal, a +15V output terminal and a +30 V output terminal, wherein the power supply ground terminal, the +15V output terminal and the +30 V output terminal are respectively connected with a first connection terminal, a second terminal and a third terminal of the channel sections; the voltage display module comprises a voltage input first terminal and a voltage input second terminal, wherein the voltage input first terminal and the voltage input second terminal are respectively connected to a fourth connection terminal and a fifth connection terminal of the channel sections; and the signal source module comprises a signal output terminal and a signal ground terminal, wherein the signal output terminal and the signal ground terminal are respectively connected with a sixth connection terminal and a seventh connection terminal of the channel sections. According to the invention, a module joint mode is employed; and the test platform provided in the invention has expansibility and can be applied to test various complex electronic components; therefore, the test platform provided in the invention is suitable for electronic technology practice.
Description
Technical field
The present invention relates to device for inspecting electronic component package.
Background technology
Electronic devices and components commonly used have resistance, electric capacity, diode, triode etc.; Adopt multimeter to test to these electronic devices and components; Also have some electronic devices and components commonly used,, be difficult to test with multimeter separately like 555 integrated packages, controllable silicon, LM317,7805 etc.
Summary of the invention
The present invention provides a kind of extendible electronic devices and components parameter testing platform.
Electronic devices and components parameter testing platform; It is characterized in that comprising power module, voltage display module and signal source module; Also comprise the draw-in groove that several are parallelly connected; Said draw-in groove comprises 7 splicing ears at least; Said power module comprise power supply ground end ,+the 15V output terminal and+the 30V output terminal, be connected to first splicing ear, second splicing ear and the 3rd splicing ear of draw-in groove respectively; The voltage display module comprises that voltage is imported first end and voltage is imported second end, is connected to the 4th splicing ear and the 5th splicing ear of draw-in groove respectively; Signal source module comprises signal output part and signal ground end, is connected to the 6th splicing ear and the 7th splicing ear of draw-in groove respectively.
Further, described electronic devices and components parameter testing platform comprises 555 test modules, and said 555 test modules comprise first plug-in card, and first plug-in card can removably be adorned and be inserted on the draw-in groove; Said 555 test modules comprise 555 test benches; The 11 resistance; The 12 resistance; The 13 resistance; The 14 resistance; The 11 electric capacity; The 12 electric capacity and the 11 light emitting diode; First port of 555 test benches be connected to first plug-in card first splicing ear; Second port of 555 test benches links to each other with the 6th port of 555 test benches; The 11 electric capacity is electrochemical capacitor; Second port of 555 test benches links to each other with the positive pole of the 11 electric capacity; The negative pole of the 11 electric capacity links to each other with first port of test bench; The positive pole of the 11 electric capacity is connected to the 7th port of test bench through the 12 resistance; The 3rd port of test bench is connected to first port of test bench through the 14 resistance; The 4th port of test bench links to each other with the 8th port of test bench; And be connected to second splicing ear of first plug-in card; The 8th port of test bench is connected to the 7th port of test bench through the 11 resistance, and the 8th port of test bench is connected to the 3rd port of test bench through the 11 light emitting diode and the 13 resistance.
Further, the electronic components parametric test platform, including one-way thyristor test modules, one-way thyristor test module includes a second card, the second card can be removably mounted into the card slot; SCRs test module includes a first three-terminal test blocks, the first three-terminal test socket is connected to a third port connected to a second terminal of the first card, the first three-terminal test seat first port through the second twelve three-terminal switch is connected to the first seat of the third test port, a second card to the second resistor connection terminals through the twenty-third and twenty-first light-emitting diode is connected to the first seat of the first three-terminal test port , the second connection terminal after the card a second twenty-first and twenty-second resistor connected to the first three-terminal resistance test seat of the third port, a twenty-first and twenty-second resistor connection point through resistors twenty first switch connected to the first three-terminal test seat a second port.Further, the 21 switch and second twelvemo are closed and are touch-switch.
Further, the electronic components parametric test platform, including test module LM317, LM317 test module includes a third card, the third card can be removably mounted into the card slot; LM317 test module includes a second three-terminal test seat, second seat three-terminal test a third port connected to the third card of the second connecting terminal, a second three-terminal test seat first port through the thirty-first resistor is connected to a second three-terminal test seat a second port, the second three-terminal test socket via a first port of the thirty-second resistor connected to the third card of the first connection terminal, the thirty-first and thirty-second parallel resistor capacitor, a second three-terminal test Block thirty-third through the second port connected to the third resistor to the fourth connection terminal card, and the third to the fourth connection terminals of the card through the thirty-fourth resistor connected to the third connection terminal of the first card, The third card of the first connection terminal of the fifth and the third connection terminal connected to the card.
Further, the electronic components parametric test platform, including the 78 series regulator block test module 78 series regulator block test module includes a fourth card, the fourth card into the card slot can be removably mounted on; 78 series regulator block test module includes a third three-terminal test blocks, the third three-terminal test seat first port is connected to the fourth card of the third connection terminal, a third three-end testing of the first port and the third seat three-terminal test socket is provided between the second port of the thirty-second capacitor, the third three-terminal test a third port with the third seat three-terminal test socket is provided between the second port of the thirty-third capacitor, the first thirty-three test socket terminal connected to the second port of the first connecting terminals fourth card, the fourth card of the first connection terminal and the fourth connection terminal connected to the fifth card, the third of the three-terminal testers three fourth port connected with the fourth card terminal.
Compared with prior art; The present invention has following advantage: the present invention adopts the module juncture; Has extendability; Test other electronic devices and components if desired; Can expand easily; Therefore electronic devices and components parameter testing platform of the present invention can be tested multiplely than the complicated electronic components and parts, is highly suitable in the Electronic Process Practical Course.
Description of drawings
Fig. 1 is a structural representation of the present invention;
Fig. 2 is the circuit theory diagrams of 555 test modules;
Fig. 3 is the circuit theory diagrams of one-way SCR test module;
Fig. 4 is the circuit theory diagrams of LM317 test module;
Fig. 5 is the circuit theory diagrams of 78 serial regulator block test modules.
Embodiment
As shown in Figure 1; Electronic devices and components parameter testing platform; It is characterized in that comprising power module, voltage display module and signal source module; The draw-in groove that also comprises 4 parallel connections; Draw-in groove can be expanded as required; Said draw-in groove comprises 8 splicing ears, said power module comprise power supply ground end GND ,+the 15V output terminal and+the 30V output terminal, be connected to first splicing ear 1, second splicing ear 2 and the 3rd splicing ear 3 of draw-in groove respectively; The voltage display module comprises that voltage is imported first end "+" end and voltage is imported second end "-" end, is connected to the 4th splicing ear 4 and the 5th splicing ear 5 of draw-in groove respectively; Signal source module comprises signal output part "+" end and signal ground end "-" end, is connected to the 6th splicing ear 6 and the 7th splicing ear 7 of draw-in groove respectively.Among the figure, the 8th splicing ear 8 of draw-in groove is unsettled, and it can be connected to first splicing ear 1 of draw-in groove, thereby the reliability of enhanced system also can be used as the expansion end and is used for other purposes.
As shown in Figure 2,555 test modules comprise the first plug-in card (not shown), and first plug-in card can removably be adorned and be inserted on the draw-in groove; Said 555 test modules comprise 555 test bench U11; The 11 resistance R 11; The 12 resistance R 12; The 13 resistance R 13; The 14 resistance R 14; The 11 capacitor C 11; The 12 capacitor C 12 and the 11 LED 11; First port one of 555 test bench U11 be connected to first plug-in card first splicing ear; Second port 2 of 555 test benches links to each other with the 6th port 6 of 555 test benches; The 11 capacitor C 11 is an electrochemical capacitor; Second port 2 of 555 test benches links to each other with the positive pole of the 11 capacitor C 11; The negative pole of the 11 capacitor C 11 links to each other with first port one of test bench; The positive pole of the 11 capacitor C 11 is connected to the 7th port 7 of test bench through the 12 resistance R 12; The 3rd port 3 of test bench is connected to first port one of test bench through the 14 resistance R 14; The 4th port 4 of test bench links to each other with the 8th port 8 of test bench; And be connected to second splicing ear of first plug-in card; The 8th port 8 of test bench is connected to the 7th port 7 of test bench through the 11 resistance R 11, and the 8th port 8 of test bench is connected to the 3rd port 3 of test bench through the 11 LED 11 and the 13 resistance R 13.First plug-in card is inserted into (first splicing ear of first plug-in card is connected with first splicing ear of draw-in groove on the draw-in groove; The i splicing ear of first plug-in card is connected with the i splicing ear of draw-in groove); Can test 555; When inserting in 555 test benches with 555, what the i.e. expression of the 11 LED 11 flicker was tested 555 is normal.
Shown in Figure 3, the test module comprises a second one-way thyristor card (not shown) can be removably mounted to the second card into the card slot; way thyristor test module includes a first thirteen-end testing seat MCR21, MCR21 first three test socket end of the third port 3 connected to the second card first connection terminal, the first three-terminal test seat MCR21 a first port through the twenty-second switch K22 end connected to the first three test blocks MCR21 third port 3, the second card after twenty-third second connection terminal resistor R23 and the twenty-first light-emitting diode LED21 end connected to the first three of the first test seat MCR21 a port 1, the second card after a twenty-first second connection terminal resistor R21 and resistor R22 twenty second end connected to the first three test blocks MCR21 third port 3, the twenty-first resistor R21 and the first twenty-two resistors R22 through the connection point of the twenty-first switch K21 terminal connected to the first three test blocks MCR21 second port 2.The 21 switch and second twelvemo are closed and are touch-switch.Second plug-in card is inserted into (the i splicing ear of second plug-in card is connected with the i splicing ear of draw-in groove) on the draw-in groove, can tests one-way SCR.First port one, second port 2 and the 3rd port 3 of the pin A of one-way SCR, G, respectively corresponding the one or the three end test bench MCR21 of K; Press the 21 K switch 21; The 21 LED 21 is bright; Unclamp the 21 K switch 21; The 21 LED 21 is kept bright; Press second twelvemo and close K21 and unclamp, the 21 LED 21 extinguishes, and this representes that promptly the one-way SCR of being tested is normal.
Shown in Figure 4, LM317 test module includes a third card (not shown in the figure), and the third can be removably fitted into the card slot on; LM317 test module includes a second three-terminal test blocks JP31, first twenty-three end test seat JP31 third port 3 connected to the third card of the second connecting terminal, a second three-terminal test seat JP31 first port 1 through thirty-first resistor R31 is connected to a second three-terminal test seat a second port 2 JP31, JP31 second three-seat-side test port 1 of the first resistor R32 through the thirty-second card connected to the third terminal of the first connection, the thirty-thirty-second capacitor C31 and resistor R32 connected in parallel, the second three-terminal test seat JP31 second port 2 through thirty-third resistor R33 connected to the third connection terminal fourth card, the third card of the fourth connection terminal resistor R34 through thirty-fourth a first card connected to the third connection terminal, and the third card of the first connection terminal of the fifth and the third connection terminal connected to the card.The 3rd plug-in card is inserted into (the i splicing ear of the 3rd plug-in card is connected with the i splicing ear of draw-in groove) on the draw-in groove, can tests LM317, the voltage stabilizing value of LM317 can be presented at the voltage display module.
Shown in Figure 5, the test module 78 series regulator block comprises a fourth card (not shown) can be detachably mounted to the fourth card into the card slot; series regulator block 78 includes a first test module thirty-three terminal test blocks JP32, JP32 third three-terminal test seat first port 1 is connected to the fourth card of the third connection terminal (+30 V), the third three-terminal test seat JP32 a first port and the third three-terminal test seat JP32 is provided between the second port two thirty second capacitor C32, the third three-terminal test seat JP32 third port 3 and the third three-terminal test seat JP32 is provided between the second port 2 thirty-third capacitor C33, the third three-terminal test seat JP32 second port 2 is connected to the fourth card of the first connection terminal, the fourth card of the first connection terminal and the fourth the fifth card connectors connected to a third three-terminal tester JP32 third port 3 and the fourth card of the fourth connection terminal.The 4th plug-in card is inserted into (the i splicing ear of the 4th plug-in card is connected with the i splicing ear of draw-in groove) on the draw-in groove; Then can test 78 serial regulator blocks, testable 78 serial regulator blocks comprise 7805,7806,7809,7812,7815,7824 etc.
Claims (6)
1. electronic devices and components parameter testing platform; It is characterized in that comprising power module, voltage display module and signal source module; Also comprise the draw-in groove that several are parallelly connected; Said draw-in groove comprises 7 splicing ears at least; Said power module comprise power supply ground end ,+the 15V output terminal and+the 30V output terminal, be connected to first splicing ear, second splicing ear and the 3rd splicing ear of draw-in groove respectively; The voltage display module comprises that voltage is imported first end and voltage is imported second end, is connected to the 4th splicing ear and the 5th splicing ear of draw-in groove respectively; Signal source module comprises signal output part and signal ground end, is connected to the 6th splicing ear and the 7th splicing ear of draw-in groove respectively.
2. electronic devices and components parameter testing platform according to claim 1 is characterized in that comprising 555 test modules, and said 555 test modules comprise first plug-in card, and first plug-in card can removably be adorned and be inserted on the draw-in groove; Said 555 test modules comprise 555 test benches; The 11 resistance; The 12 resistance; The 13 resistance; The 14 resistance; The 11 electric capacity; The 12 electric capacity and the 11 light emitting diode; First port of 555 test benches be connected to first plug-in card first splicing ear; Second port of 555 test benches links to each other with the 6th port of 555 test benches; The 11 electric capacity is electrochemical capacitor; Second port of 555 test benches links to each other with the positive pole of the 11 electric capacity; The negative pole of the 11 electric capacity links to each other with first port of test bench; The positive pole of the 11 electric capacity is connected to the 7th port of test bench through the 12 resistance; The 3rd port of test bench is connected to first port of test bench through the 14 resistance; The 4th port of test bench links to each other with the 8th port of test bench; And be connected to second splicing ear of first plug-in card; The 8th port of test bench is connected to the 7th port of test bench through the 11 resistance, and the 8th port of test bench is connected to the 3rd port of test bench through the 11 light emitting diode and the 13 resistance.
3 according to claim 2, wherein the parameters of the test platform electronic components, characterized by comprising one-way SCR test module includes a second one-way thyristor test module card, the card can be removably mounted to the second into the card slot; way thyristor test module includes a first three-terminal test blocks, the first three-terminal test blocks a third port connected to the second card of the first connection terminal, the first three-terminal test seat After twenty-second switch first port connected to the first three test blocks third port terminal, a second terminal connected to a second card after twenty-third and twenty-first light-emitting diode resistor connected to the first three-terminal test seat first port, a second card to the second resistor connection terminals through the twenty-first and twenty-second resistor connected to the first three test socket terminal third port, twenty-first and twenty-resistance two resistor are connected through the twenty-first switch connected to the first three-terminal test seat a second port.
4. electronic devices and components parameter testing platform according to claim 3 is characterized in that the 21 switch and second twelvemo pass is touch-switch.
5 according to claim 3, wherein the parameters of the test platform electronic components, characterized in that the test module comprises LM317, LM317 test module comprises a third card, the card can be removably mounted to the third into the card slot; LM317 Test module includes a second three-terminal test seat, second seat three-terminal test a third port connected to the third card of the second connecting terminal, a second three-terminal test socket via a first port connected to the thirty-first resistor twenty-three second port terminal test seat, the second seat of the first three-terminal test ports through thirty second resistor connected to the third card of the first connection terminal, the thirty-first and thirty-second resistor in parallel with capacitor The second three-terminal test socket via a second port of the thirty-third resistor connected to the third card of the fourth connection terminal, and the third to the fourth card through thirty-fourth resistor connection terminal connected to the third card The first connection terminal, a third card is a first connecting terminal and a third connection terminal connected to a fifth card.
As claimed in claim 5, wherein the parameters of the test platform electronic components, characterized by comprising 78 series regulator block test module 78 series regulator block test module includes a fourth card, the card can be detachably mounted to the fourth into the card slot; 78 series regulator block test module includes a third three-terminal test blocks, the third three-terminal test seat first port is connected to the fourth card of the third connection terminal, a third three-terminal test seat the first port and the third three-terminal test socket is provided between the second port of the thirty-second capacitor, the third three-terminal test a third port with the third seat three-terminal test socket is provided between the second port of the first thirty-three capacitance, the third three-terminal test socket is connected to a second port of the first connecting terminals fourth card, the fourth card of the first connection terminal and the fourth connection terminal connected to the fifth card, and the third three-terminal tester third port and the fourth connection terminal is connected to the fourth card.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110220284 CN102305908B (en) | 2011-08-03 | 2011-08-03 | Parameter test platform for electronic component |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110220284 CN102305908B (en) | 2011-08-03 | 2011-08-03 | Parameter test platform for electronic component |
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| CN102305908A true CN102305908A (en) | 2012-01-04 |
| CN102305908B CN102305908B (en) | 2013-07-03 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN 201110220284 Expired - Fee Related CN102305908B (en) | 2011-08-03 | 2011-08-03 | Parameter test platform for electronic component |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1299974A (en) * | 1999-12-15 | 2001-06-20 | 曹骥 | Comprehensive aging and screening equipment for electronic components and devices |
| CN201035124Y (en) * | 2007-04-19 | 2008-03-12 | 清华大学 | Integrated circuit tester |
| CN201138364Y (en) * | 2007-12-13 | 2008-10-22 | 北京华元骏也科技有限公司 | High-speed electronic temperature characteristic test apparatus |
| CN101551431A (en) * | 2008-04-01 | 2009-10-07 | 德律科技股份有限公司 | Electronic device testing system and method |
| US20110178751A1 (en) * | 2008-02-05 | 2011-07-21 | Murata Manufacturing Co., Ltd. | Method for correcting measurement errors and electronic component characteristics measuring device |
| CN202177671U (en) * | 2011-08-03 | 2012-03-28 | 华南理工大学 | Electronic component parameter testing platform |
-
2011
- 2011-08-03 CN CN 201110220284 patent/CN102305908B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1299974A (en) * | 1999-12-15 | 2001-06-20 | 曹骥 | Comprehensive aging and screening equipment for electronic components and devices |
| CN201035124Y (en) * | 2007-04-19 | 2008-03-12 | 清华大学 | Integrated circuit tester |
| CN201138364Y (en) * | 2007-12-13 | 2008-10-22 | 北京华元骏也科技有限公司 | High-speed electronic temperature characteristic test apparatus |
| US20110178751A1 (en) * | 2008-02-05 | 2011-07-21 | Murata Manufacturing Co., Ltd. | Method for correcting measurement errors and electronic component characteristics measuring device |
| CN101551431A (en) * | 2008-04-01 | 2009-10-07 | 德律科技股份有限公司 | Electronic device testing system and method |
| CN202177671U (en) * | 2011-08-03 | 2012-03-28 | 华南理工大学 | Electronic component parameter testing platform |
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| CN102305908B (en) | 2013-07-03 |
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