CN105467330B - LED power aging testing jig - Google Patents
LED power aging testing jig Download PDFInfo
- Publication number
- CN105467330B CN105467330B CN201410458518.XA CN201410458518A CN105467330B CN 105467330 B CN105467330 B CN 105467330B CN 201410458518 A CN201410458518 A CN 201410458518A CN 105467330 B CN105467330 B CN 105467330B
- Authority
- CN
- China
- Prior art keywords
- connector
- led power
- positive terminal
- fictitious load
- testing jig
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Landscapes
- Led Devices (AREA)
Abstract
The present invention discloses a kind of LED power aging testing jig, including:Several connectors, it is connected in series between each connector, each connector has positive terminal and negative pole end, wire jumper short circuit can be passed through between the positive terminal and negative pole end of each connector, it with wire jumper short circuit and is grounded between the positive terminal and negative pole end of first connector, with wire jumper short circuit between the positive terminal and negative pole end of end connector;Several fictitious load groups, there are one the fictitious load groups for concatenation between connector described in each two.It is the LED power burn-in test that may achieve different size only to need a set of jig, and design is simple, easy to operate;And do not need to use cement resistor, jig is small, light-weight;The use of light emitting diode can more detect whether LED power normally exports.
Description
【Technical field】
The present invention relates to aging testing jig, more particularly to a kind of LED power aging testing jig.
【Background technology】
For different Power LED (LED power) products, such as 3W, 5W, 10W, 15W etc., to LED power product
When doing burn in (aging) tests, it will usually be completed using the fictitious load of different equivalent resistances.
Because of the output voltage of each product, output current is all different, and load is also all different.Producing line is for difference at present
LED power when being tested, fictitious load is used as using different cement resistors, correspondingly designs and adapts to different LED
The aging testing jig of power supply.
However, above-mentioned aging testing jig, since different LED power products just needs to design different jigs,
Jig is various;Further, since the sufficiently bulky of cement resistor, weight are very heavy, therefore, jig occupied space is big, operate fiber crops
It is tired.
In view of this, it is really necessary to develop a kind of LED power aging testing jig, to solve the above problems.
【Invention content】
It is therefore an object of the present invention to a kind of LED power aging testing jig is provided, to solve for different voltages specification
LED power product need when doing burn-in test using different jigs, design trouble, cumbersome and existing jig volume is big,
The problem of weight is big.
In order to achieve the above object, LED power aging testing jig provided by the invention, including:
Several connectors are connected in series between each connector, and each connector has positive terminal and negative pole end, each company
Connecing between the positive terminal of device and negative pole end can be by wire jumper short circuit, between the positive terminal and negative pole end of first connector with wire jumper short circuit simultaneously
Ground connection, with wire jumper short circuit between the positive terminal and negative pole end of end connector;
Several fictitious load groups, there are one the fictitious load groups for concatenation between connector described in each two.
Optionally, each fictitious load group includes the bridge heap (bridge diode) that several are connected in series with.
Optionally, the bridge heap uses the electronic component of model US8KB80R.
Optionally, the first fictitious load group includes five bridge heaps being connected in series with, remaining each fictitious load group includes
Two bridge heaps being connected in series with.
Optionally, the pressure drop of each bridge heap is 1.4V.
Optionally, the connector number is 17, and the number of the fictitious load group is 16.
Optionally, it in addition to first connector, is connected in series between the positive terminal and ground of remaining each connector luminous
Diode and resistance.
Compared to the prior art, using the LED power aging testing jig of the present invention, in use, will need to carry out old
The LED power cathode for changing test connects first connector, the connector that the connection of LED power anode is chosen, the connection chosen
Respectively with wire jumper short circuit between the positive terminal and negative pole end of each connector between device and the first connector so that institute
It states the overall presure drop after each fictitious load string formation connection between the connector chosen and the first connector and is more than LED to be tested electricity
Source output voltage 80% and less than or equal to its output voltage.Since the LED power of the different output voltages of correspondence carries out aging
Test, it is only necessary to corresponding connector positive terminal is selected to be connect with LED power anode, and by the connector chosen with it is described first
Respectively with wire jumper short circuit between the positive terminal and negative pole end of each connector between connector, you can reach.Therefore, it only needs
A set of jig is the LED power burn-in test that may achieve different size, and design is simple, easy to operate;And it does not need to use water
Mud resistance, jig is small, light-weight;The use of light emitting diode can more detect whether LED power normally exports.
【Description of the drawings】
Fig. 1 is schematically shown as the electrical block diagram of one preferred embodiment of LED power aging testing jig of the present invention.
Fig. 2 is schematically shown as the electrical block diagram of a preferred embodiment of the present invention jackshaft heap.
【Specific embodiment】
Referring to Fig. 1, Fig. 1 is schematically shown as the electrical block diagram of LED power aging testing jig of the present invention.
In order to achieve the above object, LED power aging testing jig provided by the invention, including:
Several connectors 100 are connected in series between each connector 100, and each connector 100 has positive terminal 101 and negative
Extreme 102, between the positive terminal 101 of each connector 100 and negative pole end 102 can by wire jumper short circuit, first connector 100
It with wire jumper short circuit and is grounded between positive terminal 101 and negative pole end 102, end is between the positive terminal 101 of connector 100 and negative pole end 102
With wire jumper short circuit;
Several fictitious load groups, between connector 100 described in each two concatenation there are one the fictitious load group, wherein,
Each each fictitious load group can be to include bridge heap 200 that several are connected in series with (please in conjunction with referring to Fig.2, Fig. 2 is schematically shown as
The electrical block diagram of a preferred embodiment of the present invention jackshaft heap), the bridge heap 200 is, for example, the electronics of model US8KB80R
Element, the pressure drop of each bridge heap 200 is 1.4V.
In the present embodiment, the first fictitious load group includes five bridge heaps 200 being connected in series with, remaining each fictitious load
Group includes two bridge heaps 200 being connected in series with.Described 100 numbers of connector are 17, and the number of the fictitious load group is 16
It is a.
Using the LED power aging testing jig of the present invention, in use, the LED power that progress burn-in test will be needed
Cathode connects first connector 100, the connector 100 that the connection of LED power anode is chosen, the connector 100 chosen and institute
It states between the positive terminal 101 of each connector 100 and the negative pole end 102 between first connector 100 respectively with wire jumper short circuit,
So that the overall presure drop after each fictitious load string formation between the connector 100 chosen and the first connector 100 joins is big
In LED power output voltage to be tested 80% and less than or equal to its output voltage, to ensure that the LED power carries out aging
With higher load factor and without departing from its output voltage during test.
Since the LED power of the different output voltages of correspondence carries out burn-in test, it is only necessary to select corresponding connector 100 just
Extreme 101 connect with LED power anode, and by each company between the connector 100 chosen and the first connector 100
It connects between the positive terminal 101 of device 100 and negative pole end 102 respectively with wire jumper short circuit, you can reach.In this way, with as follows
For situation:The number of the fictitious load group is 16, and the first fictitious load group includes five bridge heaps being connected in series with
200, remaining each fictitious load group includes two bridge heaps 200 being connected in series with, and the pressure drop of each bridge heap 200 is 1.4V.Then may be used
To reach the pressure drop after following 16 series connection:7V, 9.8V, 12.6V, 15.4V, 18.2V, 21V, 23.8V, 26.6V, 29.4V,
32.2V, 35V, 37.8V, 40.6V, 43.4V, 46.2V, 49V.Therefore, it is the LED that may achieve different size only to need a set of jig
Power source aging is tested, and design is simple, easy to operate;And do not need to use cement resistor, jig is small, light-weight.
Optionally, in addition to first connector 100, the company of series connection between the positive terminal 101 and ground of remaining each connector 100
Light emitting diode 300 and resistance 400 are connected to, the resistance 400 is used to divide to ensure 300 both ends operating voltage of light emitting diode
(resistance value of the resistance 400 according to this can with 500 ohm of selected as, 700 ohm, 900 ohm, 1.1K ohm, 1.3K ohm,
1.5K ohm, 1.7K ohm, 1.9K ohm, 2.1K ohm, 2.3K ohm, 2.5K ohm, 2.7K ohm, 2.9K ohm, 3.1K
Ohm, 3.3K ohm, 3.5K ohm).The use of light emitting diode 300 can more detect whether LED power normally exports.
It is noted that the present invention is not limited to the above embodiment, any person skilled in the art is based on this hair
Any simple modification, equivalent change and modification that bright technical solution makees above-described embodiment both falls within the protection model of the present invention
In enclosing.
Claims (7)
1. a kind of LED power aging testing jig, which is characterized in that it includes:
Several connectors are connected in series between each connector, and each connector has positive terminal and negative pole end, each connector
Positive terminal and negative pole end between with wire jumper short circuit and can be connect by wire jumper short circuit, between the positive terminal and negative pole end of first connector
Ground, with wire jumper short circuit between the positive terminal and negative pole end of end connector;
Several fictitious load groups, there are one the fictitious load groups for concatenation between connector described in each two;
Wherein, the overall presure drop after each fictitious load string formation connection between the connector and the first connector chosen is more than to be measured
Try the 80% of LED power output voltage and less than or equal to its output voltage.
2. LED power aging testing jig as described in claim 1, which is characterized in that if each fictitious load group includes
The dry bridge heap being connected in series with.
3. LED power aging testing jig as claimed in claim 2, which is characterized in that the bridge heap uses model
The electronic component of US8KB80R.
4. LED power aging testing jig as claimed in claim 2, which is characterized in that the first fictitious load group includes
Five bridge heaps being connected in series with, remaining each fictitious load group include two bridge heaps being connected in series with.
5. LED power aging testing jig as claimed in claim 2, which is characterized in that the pressure drop of each bridge heap is 1.4V.
6. LED power aging testing jig as described in claim 1, which is characterized in that the connector number is 17, institute
The number for stating fictitious load group is 16.
7. the LED power aging testing jig as described in any one of claim 1-6, which is characterized in that except first connector
Outside, light emitting diode and resistance are connected in series between the positive terminal and ground of remaining each connector.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410458518.XA CN105467330B (en) | 2014-09-10 | 2014-09-10 | LED power aging testing jig |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410458518.XA CN105467330B (en) | 2014-09-10 | 2014-09-10 | LED power aging testing jig |
Publications (2)
Publication Number | Publication Date |
---|---|
CN105467330A CN105467330A (en) | 2016-04-06 |
CN105467330B true CN105467330B (en) | 2018-06-26 |
Family
ID=55605244
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201410458518.XA Active CN105467330B (en) | 2014-09-10 | 2014-09-10 | LED power aging testing jig |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN105467330B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109507562B (en) * | 2018-12-24 | 2024-05-14 | 南昌易美光电科技有限公司 | Circuit board and method for lamp bead aging experiment |
TWI818976B (en) * | 2019-04-12 | 2023-10-21 | 博計電子股份有限公司 | Low voltage drop electronic load connections |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102445635A (en) * | 2010-10-11 | 2012-05-09 | 中国电信股份有限公司 | Quick tester for wire jumper |
CN102692594A (en) * | 2011-03-21 | 2012-09-26 | 海洋王照明科技股份有限公司 | Tool and method for testing constant current of LED drive board |
CN102866346A (en) * | 2012-09-14 | 2013-01-09 | 京东方科技集团股份有限公司 | Platform and method for testing light-emitting diode (LED) array drive efficiency |
CN203191534U (en) * | 2013-04-11 | 2013-09-11 | 青岛方舟机电有限公司 | Test box for LED (light-emitting diode) power panel |
CN204228930U (en) * | 2014-09-10 | 2015-03-25 | 神讯电脑(昆山)有限公司 | LED power aging testing jig |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004027676B4 (en) * | 2004-04-30 | 2006-06-14 | Siemens Ag | Method and device for testing at least one LED string |
CN103901355A (en) * | 2012-12-29 | 2014-07-02 | 鸿富锦精密工业(深圳)有限公司 | Power supply test circuit |
-
2014
- 2014-09-10 CN CN201410458518.XA patent/CN105467330B/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102445635A (en) * | 2010-10-11 | 2012-05-09 | 中国电信股份有限公司 | Quick tester for wire jumper |
CN102692594A (en) * | 2011-03-21 | 2012-09-26 | 海洋王照明科技股份有限公司 | Tool and method for testing constant current of LED drive board |
CN102866346A (en) * | 2012-09-14 | 2013-01-09 | 京东方科技集团股份有限公司 | Platform and method for testing light-emitting diode (LED) array drive efficiency |
CN203191534U (en) * | 2013-04-11 | 2013-09-11 | 青岛方舟机电有限公司 | Test box for LED (light-emitting diode) power panel |
CN204228930U (en) * | 2014-09-10 | 2015-03-25 | 神讯电脑(昆山)有限公司 | LED power aging testing jig |
Non-Patent Citations (1)
Title |
---|
基于单片机和模数转换器的实用测试系统;高欢等;《计算机测量与控制》;20110131;第19卷(第01期);第26-29页 * |
Also Published As
Publication number | Publication date |
---|---|
CN105467330A (en) | 2016-04-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101359038B (en) | Electronic load device capable of simulating LED characteristic and simulation method thereof | |
US9176178B2 (en) | Battery simulation circuit | |
US20090261843A1 (en) | Load simulator | |
CN206990773U (en) | A kind of detection means for testing power module working condition | |
CN201278011Y (en) | Electric power socket tester | |
CN105467330B (en) | LED power aging testing jig | |
US20150097573A1 (en) | Load apparatus for testing | |
CN105813268B (en) | The light-source system of LED load light source automatic identification | |
CN203572845U (en) | Relay checking platform | |
CN205643583U (en) | Test wire rod detecting instrument | |
CN104090205A (en) | Cable connection testing circuit | |
CN207318677U (en) | Controllable dry cell discharge curve measuring circuit | |
CN104935061B (en) | Battery charge prompting circuit and lamps and lanterns | |
CN204228930U (en) | LED power aging testing jig | |
CN201740835U (en) | Wire testing device | |
CN203643520U (en) | Optoelectronic coupler fault detector | |
CN201408234Y (en) | Electronic cable tester | |
CN105467232B (en) | The test circuit of converter | |
CN203981819U (en) | A kind of cable connecting test circuit | |
CN204086445U (en) | A kind of wire breakage detection device for cables | |
CN208140898U (en) | A kind of power source aging pinboard | |
CN205829243U (en) | A kind of power circuit | |
CN201845072U (en) | Portable wide-range detection device for voltage-regulating value of voltage-regulator tube | |
CN203490311U (en) | Two-stage filter detection circuit | |
CN203658480U (en) | Voltage-stabilization photoelectric coupler detection circuit |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |