CN204945296U - A kind of cellular phone data line tester - Google Patents
A kind of cellular phone data line tester Download PDFInfo
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- CN204945296U CN204945296U CN201520691441.0U CN201520691441U CN204945296U CN 204945296 U CN204945296 U CN 204945296U CN 201520691441 U CN201520691441 U CN 201520691441U CN 204945296 U CN204945296 U CN 204945296U
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- 230000001413 cellular effect Effects 0.000 title claims abstract description 19
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- 239000004065 semiconductor Substances 0.000 claims description 38
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- RSWGJHLUYNHPMX-UHFFFAOYSA-N Abietic-Saeure Natural products C12CCC(C(C)C)=CC2=CCC2C1(C)CCCC2(C)C(O)=O RSWGJHLUYNHPMX-UHFFFAOYSA-N 0.000 description 1
- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 description 1
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- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 1
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Abstract
The utility model discloses a kind of cellular phone data line tester, it comprises MCU main control chip, MCU main control chip input end is connected with data line plate interface module, power input interface module, mode switching key module, output terminal is connected with pattern and switches display lamp module, test result display lamp module, hummer module, and input/output terminal is connected with data line board test circuit module; Data line board test circuit module comprises the first test module, the second test module, the 3rd test module.It can judge the quality of tested product fast in the short time, and can accurately detect defective products and poor prognostic cause, and the quick repair process problem of guide maintenance personnel, accuracy of detection is high, substantially increases cellular phone data line detection efficiency.
Description
Technical field
The utility model relates to electronic technology field, is specifically related to a kind of cellular phone data line tester.
Background technology
The detection of current cellular phone data line is detected by artificial multimeter mostly, or by outside test aircraft frock, the hard contact of thimble connection data line detects.Because the False Rate that test fixture connecting line comes off and the external factor such as thimble loose contact causes is quite high, and length consuming time.
Apple iPhone data line inside chip and circuit are different from other conventional data lines, data line circuit board size is less, database in production run, charging panel, data line and charging wire semi-manufacture and product line inconvenience hand dipping or increase test point and measures, half-finished product plate or welding wire process after detection add a lot of difficulty to a lot of wire rod processing factory! Fraction defective is too high perplexs each manufacturer always.Market is tested accurately high testing tool little, too high again with prototype testing cost, test speed is too slow, and test result is not directly perceived, brings inconvenience to production and selling!
Utility model content
For above problem, the utility model provides a kind of cellular phone data line tester, it can judge the quality of tested product fast in the short time, and can accurately detect defective products and poor prognostic cause, the quick repair process problem of guide maintenance personnel, accuracy of detection is high, substantially increases cellular phone data line detection efficiency.
For realizing above object, the technical solution adopted in the utility model is: a kind of cellular phone data line tester, it comprises MCU main control chip, described MCU main control chip input end is connected with data line plate interface module, power input interface module, mode switching key module, output terminal is connected with pattern and switches display lamp module, test result display lamp module, hummer module, and input/output terminal is connected with data line board test circuit module; Described data line board test circuit module comprises the first test module, the second test module, the 3rd test module;
Described first test module comprises the metal-oxide-semiconductor Q2 be connected separately with an I/O port of MCU main control chip by grid; Described metal-oxide-semiconductor Q2 drain electrode is connected with light emitting diode D3; Described metal-oxide-semiconductor Q2 source electrode drains with metal-oxide-semiconductor Q5 and is connected; Described metal-oxide-semiconductor Q5 source electrode is connected with supply voltage end; The grid of described metal-oxide-semiconductor Q5 is connected separately with an I/O port of MCU;
Described second test module comprises the metal-oxide-semiconductor Q3 be connected separately with an I/O port of MCU main control chip by grid; Described metal-oxide-semiconductor Q3 source electrode is connected with supply voltage end; Described metal-oxide-semiconductor Q3 drains and data line plate interface model calling;
Described 3rd test module comprises the metal-oxide-semiconductor Q4 be connected separately with an I/O port of MCU main control chip by grid; Described metal-oxide-semiconductor Q4 drain electrode is connected with data line plate connection interface module; Described metal-oxide-semiconductor Q4 source electrode is connected with resistance R25; Described resistance R25 other end ground connection.
Further, described power input interface module is provided with DC socket interface, USB interface, PIN needle interface.
Further, described data line plate interface module comprises data line plate interface part one and data line plate interface part two; Described data line plate interface part one is provided with winding displacement interface P6 be connected with cellular phone data line; Data line plate interface part one is connected with MCU main control chip by described data line plate interface part two.
Further, be provided with button S1 in described mode switching key module to be connected with MCU main control chip.
Further, be provided with multiple light emitting diode in described pattern switching display lamp module, the anode of each light emitting diode is connected with an I/O port of MCU main control chip separately, the plus earth of diode.
Further, be provided with multiple light emitting diode in described test result display lamp module, the negative electrode of each light emitting diode is connected with an I/O port of MCU main control chip separately, and the anode of diode is connected with supply voltage end.
The beneficial effects of the utility model:
1, usable range is wide, the utility model is applicable to the test of iPhone5/5C/5S and iphone5lightning data line, data line plate, charging wire, charging panel, is namely applicable to the test of the data line plate of Android system by changing data line plate interface type.
2, measuring accuracy is high, speed is fast, have employed MCU chip and automatically detect tested database or data line, after measured data plate or data line plug tester, just can see in several seconds that testing result is qualified or defective intuitively, underproof words are again the problems of which part, shown one by one, greatly improve the production testing efficiency of producer by LED light.
Accompanying drawing explanation
Fig. 1 is the utility model system chart.
Fig. 2 is the circuit diagram of MCU main control chip connecting test result prompting hummer, mode switching key, pilot lamp.
Fig. 3 is part A expanded view in Fig. 2.
Fig. 4 is part B expanded view in Fig. 2.
Fig. 5 is C partial enlargement figure in Fig. 2.
Fig. 6 is power input interface partial circuit figure.
Fig. 7 is test result status indicator lamp circuit diagram.
Fig. 8 is data line plate interface part one circuit diagram.
Fig. 9 is data line plate interface part two circuit diagram.
Figure 10 is the first test module circuit diagram.
Figure 11 is the second test module circuit diagram.
Figure 12 is the 3rd test module circuit diagram.
Embodiment
The technical solution of the utility model is understood better in order to make those skilled in the art; below in conjunction with accompanying drawing, the utility model is described in detail; the description of this part is only exemplary and explanatory, should not have any restriction to protection domain of the present utility model.
As shown in figs. 1-12, anatomical connectivity of the present utility model closes: a kind of cellular phone data line tester, it comprises MCU main control chip, described MCU main control chip input end is connected with data line plate interface module, power input interface module, mode switching key module, output terminal is connected with pattern and switches display lamp module, test result display lamp module, hummer module, and input/output terminal is connected with data line board test circuit module; Described data line board test circuit module comprises the first test module, the second test module, the 3rd test module;
Described first test module comprises the metal-oxide-semiconductor Q2 be connected separately with an I/O port of MCU main control chip by grid; Described metal-oxide-semiconductor Q2 drain electrode is connected with light emitting diode D3; Described metal-oxide-semiconductor Q2 source electrode drains with metal-oxide-semiconductor Q5 and is connected; Described metal-oxide-semiconductor Q5 source electrode is connected with supply voltage end; The grid of described metal-oxide-semiconductor Q5 is connected separately with an I/O port of MCU;
Described second test module comprises the metal-oxide-semiconductor Q3 be connected separately with an I/O port of MCU main control chip by grid; Described metal-oxide-semiconductor Q3 source electrode is connected with supply voltage end; Described metal-oxide-semiconductor Q3 drains and data line plate interface model calling;
Described 3rd test module comprises the metal-oxide-semiconductor Q4 be connected separately with an I/O port of MCU main control chip by grid; Described metal-oxide-semiconductor Q4 drain electrode is connected with data line plate connection interface module; Described metal-oxide-semiconductor Q4 source electrode is connected with resistance R25; Described resistance R25 other end ground connection.
Preferably, described power input interface module is provided with DC socket interface, USB interface, PIN needle interface.
Preferably, described data line plate interface module comprises data line plate interface part one and data line plate interface part two; Described data line plate interface part one is provided with winding displacement interface P6 be connected with cellular phone data line; Data line plate interface part one is connected with MCU main control chip by described data line plate interface part two.
Preferably, be provided with button S1 in described mode switching key module to be connected with MCU main control chip.
Preferably, be provided with multiple light emitting diode in described pattern switching display lamp module, the anode of each light emitting diode is connected with an I/O port of MCU main control chip separately, the plus earth of diode.
Preferably, be provided with multiple light emitting diode in described test result display lamp module, the negative electrode of each light emitting diode is connected with an I/O port of MCU main control chip separately, and the anode of diode is connected with supply voltage end.
Principle of work of the present utility model is described below:
During concrete use, power input part divides, and be master control borad access 5V DC voltage by P1, P3 or P5 interface, tester VCC is energized, and MCU works.Push button S1 for switch test pattern, has database respectively, charging panel, data line, charging wire pattern, select a kind of test pattern, corresponding test pattern pilot lamp can be lighted.
Drafting board pattern: database to be measured or charging panel are inserted on the platelet of drawing, MCU master control can carry out open circuit or short-circuit test (accident of charging panel pattern D+, D-) to power vd D, GND, D+, D-of database or charging panel one by one.
When in Fig. 2, MCU main control chip delivery outlet Sel-board level is low, P channel MOS tube Q5 conducting in Figure 10, VDD energising on platelet, if now on platelet, VDD does not have and GND short circuit, then CK-VDD is still high level, the VDD situation being judged Board Under Test by CK-VDDAD input port level state of MCU main control chip in Fig. 2, it is high that MCU main control chip exports TestGND, N-channel MOS pipe Q4 meeting conducting then in Figure 12, the TGND of Board Under Test is communicated with GND by R25 resistance, if VDD and shorted to earth, so R25 can flow through larger electric current, by I-ADC, MCU main control chip judges that electric current is excessive, then think VDD shorted to earth.VDD status indicator lamp flicker corresponding in Fig. 7.
Because apple database inside also has one for controlling the metal-oxide-semiconductor charged, when in Figure 10, MOS-ON is low level by the output of MCU main control chip, P channel MOS tube Q2 conducting, VDD is discharged to R26 cement resistor by Q2, if the welding of database inner metal-oxide-semiconductor is good, without the problem of rosin joint or open circuit, so LED D3 will light.
D+, D-whether short circuit judges to export high level by MCU main control chip to D+ (D-), detect D-(D+) whether be that height is determined, if do not have short circuit, then the LED D4 in Fig. 7 or D5 will light.
Survey line pattern: this pattern can test the data line and charging wire semi-manufacture and product line that have welded.Choose survey line pattern by button S1, data line large USB head and small data the end of a thread are inserted on the corresponding platelet that master control borad draws respectively.Compare drafting board pattern, need to detect the whether corresponding connection of 4PIN line again, whether have the situation of short circuit or open circuit.
First, the Sel-line in Figure 12 is by MCU main control chip output low level, and P channel MOS tube Q3 conducting, so VOUT has voltage 5V, by sampling CK-VDD change, MCU can judge whether vdd line is communicated with.
And whether GND line is communicated with, be detected by the GNDC mouth in Fig. 8.GNDC is pulled to high level by MCU main control chip at ordinary times, during test, TestGND exports high by MCU main control chip, N-channel MOS pipe Q4 meeting conducting then in Figure 12, be communicated with GND by R25 resistance by the TGND of survey line, so GNDC can become low level, by the change of this level, MCU judges whether GND line is communicated with.
D+ in Fig. 9, D-are sampled by D+AD and the D-AD delivering to MCU after R18, R21 and R17, R20 dividing potential drop respectively.Both intrinsic standoff ratios are different, so by detecting AD sampled value, can distinguish these two lines whether short circuit or open circuit.
It should be noted that, in this article, term " comprises ", " comprising " or its any other variant are intended to contain comprising of nonexcludability, thus make to comprise the process of a series of key element, method, article or equipment and not only comprise which key element, but also comprise other key elements clearly do not listed, or also comprise by the intrinsic key element of this process, method, article or equipment.
Apply specific case herein to set forth principle of the present utility model and embodiment, the explanation of above example just understands method of the present utility model and core concept thereof for helping.The above is only preferred implementation of the present utility model, should be understood that, due to the finiteness of literal expression, and objectively there is unlimited concrete structure, for those skilled in the art, under the prerequisite not departing from the utility model principle, some improvement, retouching or change can also be made, also above-mentioned technical characteristic can be combined by rights; These improve retouching, change or combination, or the design of utility model and technical scheme are directly applied to other occasion without improving, and all should be considered as protection domain of the present utility model.
Claims (6)
1. a cellular phone data line tester, it comprises MCU main control chip, it is characterized in that, described MCU main control chip input end is connected with data line plate interface module, power input interface module, mode switching key module, output terminal is connected with pattern and switches display lamp module, test result display lamp module, hummer module, and input/output terminal is connected with data line board test circuit module; Described data line board test circuit module comprises the first test module, the second test module, the 3rd test module;
Described first test module comprises the metal-oxide-semiconductor Q2 be connected separately with an I/O port of MCU main control chip by grid; Described metal-oxide-semiconductor Q2 drain electrode is connected with light emitting diode D3; Described metal-oxide-semiconductor Q2 source electrode drains with metal-oxide-semiconductor Q5 and is connected; Described metal-oxide-semiconductor Q5 source electrode is connected with supply voltage end; The grid of described metal-oxide-semiconductor Q5 is connected separately with an I/O port of MCU;
Described second test module comprises the metal-oxide-semiconductor Q3 be connected separately with an I/O port of MCU main control chip by grid; Described metal-oxide-semiconductor Q3 source electrode is connected with supply voltage end; Described metal-oxide-semiconductor Q3 drains and data line plate interface model calling;
Described 3rd test module comprises the metal-oxide-semiconductor Q4 be connected separately with an I/O port of MCU main control chip by grid; Described metal-oxide-semiconductor Q4 drain electrode is connected with data line plate connection interface module; Described metal-oxide-semiconductor Q4 source electrode is connected with resistance R25; Described resistance R25 other end ground connection.
2. a kind of cellular phone data line tester according to claim 1, is characterized in that, described power input interface module is provided with DC socket interface, USB interface, PIN needle interface.
3. a kind of cellular phone data line tester according to claim 1, is characterized in that, described data line plate interface module comprises data line plate interface part one and data line plate interface part two; Described data line plate interface part one is provided with winding displacement interface P6 be connected with cellular phone data line; Data line plate interface part one is connected with MCU main control chip by described data line plate interface part two.
4. a kind of cellular phone data line tester according to claim 1, is characterized in that, is provided with button S1 and is connected with MCU main control chip in described mode switching key module.
5. a kind of cellular phone data line tester according to claim 1, it is characterized in that, be provided with multiple light emitting diode in described pattern switching display lamp module, the anode of each light emitting diode is connected with an I/O port of MCU main control chip separately, the plus earth of diode.
6. a kind of cellular phone data line tester according to claim 1, it is characterized in that, multiple light emitting diode is provided with in described test result display lamp module, the negative electrode of each light emitting diode is connected with an I/O port of MCU main control chip separately, and the anode of diode is connected with supply voltage end.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201520691441.0U CN204945296U (en) | 2015-09-08 | 2015-09-08 | A kind of cellular phone data line tester |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201520691441.0U CN204945296U (en) | 2015-09-08 | 2015-09-08 | A kind of cellular phone data line tester |
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| CN204945296U true CN204945296U (en) | 2016-01-06 |
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| CN201520691441.0U Expired - Fee Related CN204945296U (en) | 2015-09-08 | 2015-09-08 | A kind of cellular phone data line tester |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107783007A (en) * | 2017-11-16 | 2018-03-09 | 江门市凯拓电子有限公司 | A kind of welding data line detector |
| CN109031004A (en) * | 2018-09-03 | 2018-12-18 | 广东品能实业股份有限公司 | USB charging wire detection device |
| CN111273195A (en) * | 2020-02-13 | 2020-06-12 | 深圳亚力盛连接器有限公司 | Chip data line testing arrangement |
| CN112986865A (en) * | 2021-04-13 | 2021-06-18 | 深圳维普创新科技有限公司 | Cable function detection method, circuit and detector |
-
2015
- 2015-09-08 CN CN201520691441.0U patent/CN204945296U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107783007A (en) * | 2017-11-16 | 2018-03-09 | 江门市凯拓电子有限公司 | A kind of welding data line detector |
| CN109031004A (en) * | 2018-09-03 | 2018-12-18 | 广东品能实业股份有限公司 | USB charging wire detection device |
| CN111273195A (en) * | 2020-02-13 | 2020-06-12 | 深圳亚力盛连接器有限公司 | Chip data line testing arrangement |
| CN112986865A (en) * | 2021-04-13 | 2021-06-18 | 深圳维普创新科技有限公司 | Cable function detection method, circuit and detector |
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| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160106 Termination date: 20200908 |