CN103097952B - 电磁THz波产生器件、电磁THz波检测器件和时域分光装置 - Google Patents

电磁THz波产生器件、电磁THz波检测器件和时域分光装置 Download PDF

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Publication number
CN103097952B
CN103097952B CN201180040604.3A CN201180040604A CN103097952B CN 103097952 B CN103097952 B CN 103097952B CN 201180040604 A CN201180040604 A CN 201180040604A CN 103097952 B CN103097952 B CN 103097952B
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China
Prior art keywords
electromagnetic wave
light
dielectric
optical waveguide
waveguide
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Expired - Fee Related
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CN201180040604.3A
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English (en)
Chinese (zh)
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CN103097952A (zh
Inventor
关口亮太
加治木康介
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Canon Inc
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Canon Inc
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/37—Non-linear optics for second-harmonic generation
    • G02F1/377—Non-linear optics for second-harmonic generation in an optical waveguide structure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/35—Non-linear optics
    • G02F1/37—Non-linear optics for second-harmonic generation
    • G02F1/374—Cherenkov radiation
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00—Function characteristic
    • G02F2203/13—Function characteristic involving THZ radiation

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Nonlinear Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Toxicology (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN201180040604.3A 2010-08-24 2011-08-08 电磁THz波产生器件、电磁THz波检测器件和时域分光装置 Expired - Fee Related CN103097952B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2010187563 2010-08-24
JP2010-187563 2010-08-24
JP2011161411A JP5836683B2 (ja) 2010-08-24 2011-07-22 電磁波発生素子、電磁波検出素子、時間領域分光装置
JP2011-161411 2011-07-22
PCT/JP2011/068492 WO2012029534A1 (en) 2010-08-24 2011-08-08 Electromagnetic thz wave generating device, electromagnetic thz wave detecting device, and time -domain spectroscopy apparatus

Publications (2)

Publication Number Publication Date
CN103097952A CN103097952A (zh) 2013-05-08
CN103097952B true CN103097952B (zh) 2015-11-25

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CN201180040604.3A Expired - Fee Related CN103097952B (zh) 2010-08-24 2011-08-08 电磁THz波产生器件、电磁THz波检测器件和时域分光装置

Country Status (5)

Country Link
US (1) US9244331B2 (https=)
EP (1) EP2609466B1 (https=)
JP (1) JP5836683B2 (https=)
CN (1) CN103097952B (https=)
WO (1) WO2012029534A1 (https=)

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ITPD20130190A1 (it) * 2013-07-05 2015-01-06 Istituto Naz Di Fisica Nuclea Re Metodo e sistema per caratterizzare impulsi laser brevi e ultrabrevi emessi ad elevata frequenza di ripetizione
WO2016070273A1 (en) 2014-11-07 2016-05-12 Institut National De La Recherche Scientifique Method and apparatus for characterization of terahertz radiation
US9496921B1 (en) * 2015-09-09 2016-11-15 Cpg Technologies Hybrid guided surface wave communication
JP6731868B2 (ja) * 2017-02-17 2020-07-29 株式会社Ｓｃｒｅｅｎホールディングス 撮像方法および撮像装置
CN109946262B (zh) * 2017-12-21 2024-01-26 深圳先进技术研究院 一种基于太赫兹波的检测装置及检测系统
CN108377139B (zh) * 2018-01-30 2021-09-14 Oppo广东移动通信有限公司 电子装置
CN108535520A (zh) * 2018-05-18 2018-09-14 浙江大学 一种电磁场近场测量装置和制作电磁探针的方法
JP7252488B2 (ja) * 2019-03-29 2023-04-05 ダイキン工業株式会社 成形品の検査方法、及び、成形品の製造方法
CN110927700B (zh) * 2019-11-13 2023-04-28 中国航空工业集团公司洛阳电光设备研究所 一种保护接收探测器的激光回波控制光路

Citations (1)

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WO2006062073A1 (ja) * 2004-12-08 2006-06-15 Riken テラヘルツ波発生方法及び装置

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US3644846A (en) * 1970-05-04 1972-02-22 Bell Telephone Labor Inc Optical modulation by submillimeter-wave signals and applications thereof
US4446448A (en) * 1982-08-13 1984-05-01 The United States Of America As Represented By The Secretary Of The Army Biasing magnet holder-tuning cap for dielectric waveguide circulator
JP2895204B2 (ja) * 1990-10-22 1999-05-24 パイオニア株式会社 光波長変換素子及びその製造方法
JPH09197454A (ja) * 1996-01-19 1997-07-31 Mitsubishi Materials Corp 導波路型非線形光学デバイス
IL136673A0 (en) * 2000-06-11 2001-06-14 Orsense Ltd A method and device for measuring the concentration of glucose or other substance in blood
WO2006092874A1 (ja) * 2005-03-01 2006-09-08 Osaka University 高分解・高速テラヘルツ分光計測装置
US7486247B2 (en) * 2006-02-13 2009-02-03 Optimer Photonics, Inc. Millimeter and sub-millimeter wave detection
US7515801B2 (en) * 2006-12-28 2009-04-07 Wisconsin Alumni Research Foundation Coherent terahertz radiation source
JP4834718B2 (ja) * 2008-01-29 2011-12-14 キヤノン株式会社 パルスレーザ装置、テラヘルツ発生装置、テラヘルツ計測装置及びテラヘルツトモグラフィー装置
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Extremely frequency-widened terahertz wave generation using Cherenkov-type radiation;Koji Suizu等;《OPTICS EXPRESS》;20090413;第17卷(第8期);全文 *
Generation of tunable narrow-band surface-emitted terahertz radiation in periodically poled lithium niobate;C .Weiss等;《OPTICS LETTERS》;20010415;第26卷(第8期);全文 *

Also Published As

Publication number Publication date
CN103097952A (zh) 2013-05-08
US20130146768A1 (en) 2013-06-13
EP2609466A1 (en) 2013-07-03
JP2012068620A (ja) 2012-04-05
EP2609466B1 (en) 2014-07-16
US9244331B2 (en) 2016-01-26
JP5836683B2 (ja) 2015-12-24
WO2012029534A1 (en) 2012-03-08

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