CN102841307B - 一种逻辑故障定位的方法 - Google Patents
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CN102841307B true CN102841307B (zh) | 2015-07-22 |
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Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
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CN103675641B (zh) * | 2013-12-23 | 2016-04-27 | 龙芯中科技术有限公司 | 芯片故障定位方法、装置及系统 |
US9239360B2 (en) * | 2014-01-28 | 2016-01-19 | Texas Instruments Incorporated | DFT approach to enable faster scan chain diagnosis |
CN104133751A (zh) * | 2014-08-06 | 2014-11-05 | 浪潮(北京)电子信息产业有限公司 | 一种对芯片进行调试的方法和芯片 |
CN105589775A (zh) * | 2015-12-23 | 2016-05-18 | 苏州汇莱斯信息科技有限公司 | 一种多余度飞控计算机通道故障逻辑算法 |
CN109444716B (zh) * | 2018-11-27 | 2021-08-10 | 中科曙光信息产业成都有限公司 | 一种具有定位功能的扫描测试结构及方法 |
CN111274080A (zh) * | 2020-01-19 | 2020-06-12 | 芜湖荣芯电子科技有限公司 | 基于寄存器扫描链的调试数字电路功能的方法 |
Citations (6)
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CN1453593A (zh) * | 2002-04-23 | 2003-11-05 | 华为技术有限公司 | 一种非边界扫描器件逻辑簇故障测试方法 |
CN1862274A (zh) * | 2006-05-27 | 2006-11-15 | 合肥工业大学 | 一种多扫描链的大规模集成电路测试数据压缩方法 |
CN101663648A (zh) * | 2007-02-12 | 2010-03-03 | 明导公司 | 低功耗扫描测试技术及装置 |
CN101957430A (zh) * | 2010-09-29 | 2011-01-26 | 北京航天测控技术开发公司 | 一种可降低噪声的边界扫描测试方法和装置 |
CN102565682A (zh) * | 2010-12-14 | 2012-07-11 | 苏州工业园区谱芯科技有限公司 | 一种基于二分法的故障测试向量的定位方法 |
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US7437638B2 (en) * | 2002-11-12 | 2008-10-14 | Agilent Technologies, Inc. | Boundary-Scan methods and apparatus |
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Address after: The Science Park Research Institute of Jiangsu province Suzhou City Road 215513, Changshou City economic and Technological Development Zone No. 5 Patentee after: CHANGSHU RESEARCH INSTITUTE CO LTD OF NANJING University OF SCIENCE AND TECHNOLOGY Address before: 223100 Dongfeng Road, Hongze, Jiangsu, China, No. 17, No. Patentee before: CHANGSHU RESEARCH INSTITUTE CO LTD OF NANJING University OF SCIENCE AND TECHNOLOGY |
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