CN102780474B - Insulated gate bipolar transistor control circuit - Google Patents
Insulated gate bipolar transistor control circuit Download PDFInfo
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- CN102780474B CN102780474B CN201210252273.6A CN201210252273A CN102780474B CN 102780474 B CN102780474 B CN 102780474B CN 201210252273 A CN201210252273 A CN 201210252273A CN 102780474 B CN102780474 B CN 102780474B
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Abstract
The embodiment of the present invention provides a kind of insulated gate bipolar transistor control circuit, comprises IGBT, and at least one circuit in the first negative-feedback circuit and the second negative-feedback circuit; The first end of the first negative-feedback circuit is connected with the grid of IGBT, and the second end of the first negative-feedback circuit is connected with the auxiliary emitter-base bandgap grading of IGBT, for reducing the current variation speeds between the collector electrode of IGBT and power emitter-base bandgap grading when IGBT turns off; The first end of the second negative-feedback circuit is connected with the grid of IGBT, and the second end of the second negative-feedback circuit is connected with the auxiliary emitter-base bandgap grading of IGBT, for reducing the current variation speeds between the collector electrode of IGBT and power emitter-base bandgap grading when IGBT opens.By the current changing rate between the collector electrode of control IGBT and power emitter-base bandgap grading, the damage to IGBT can be reduced, and then protect IGBT.
Description
Technical field
The embodiment of the present invention relates to electric and electronic technical field, particularly relates to a kind of insulated gate bipolar transistor control circuit.
Background technology
In recent years, insulated gate bipolar transistor (Insulated Gate Bipolar Transistor, IGBT) becomes a kind of device with self-switching-off capability be widely used as the representative of third generation power electronic device.It is that 600V and above converter system are as fields such as alternating current machine, frequency converter, Switching Power Supply, lighting circuit and Traction Drives that IGBT can be widely used in direct voltage.
IGBT is by bipolar junction transistor (Bipolar Junction Transistor, and metal-oxide half field effect transistor (Metal-Oxide-Semiconductor Field-Effect Transistor BJT), MOSFET) the compound full-control type voltage driven type power semiconductor formed, wherein, BJT saturation pressure reduces, current carrying density is large, but drive current is larger, MOSFET driving power is little, switching speed is fast, but conduction voltage drop is large, current carrying density is little, IGBT combines the advantage of above two kinds of devices, have the advantage of the high input impedance of MOSFET and low conduction voltage drop two aspect of BJT concurrently.Therefore, IGBT has the advantages that to be easy to drive, peak current capacity turns off greatly, certainly, switching frequency is high.
But in the shutoff of IGBT or opening process, when IGBT opens speed, it is excessive that the fly-wheel diode that directly may be connected with IGBT produces reverse recovery current, and cause afterflow diode to damage; When IGBT turns off, load current may be caused and decline too fast, and produce larger current variation speeds di/dt, cause higher overvoltage finally to puncture IGBT, and produce the damage to IGBT.
Summary of the invention
The embodiment of the present invention provides a kind of for insulated gate bipolar transistor control circuit, when IGBT opens or turn off, can reduce the current variation speeds di/dt between the collector electrode of IGBT and power emitter-base bandgap grading.
The embodiment of the present invention provides a kind of insulated gate bipolar transistor control circuit, it is characterized in that, comprises insulated gate bipolar transistor, and at least one circuit in the first negative-feedback circuit and the second negative-feedback circuit;
The first end of described first negative-feedback circuit is connected with the grid of described insulated gate bipolar transistor, second end of described first negative-feedback circuit is connected with the auxiliary emitter-base bandgap grading of described insulated gate bipolar transistor, for reducing the current variation speeds between the collector electrode of insulated gate bipolar transistor and power emitter-base bandgap grading when insulated gate bipolar transistor turns off;
The first end of described second negative-feedback circuit is connected with the grid of described insulated gate bipolar transistor, second end of described second negative-feedback circuit is connected with the auxiliary emitter-base bandgap grading of described insulated gate bipolar transistor, for reducing the current variation speeds between the collector electrode of insulated gate bipolar transistor and power emitter-base bandgap grading when insulated gate bipolar transistor is opened.
In embodiments of the present invention, by arranging the first negative-feedback circuit and/or the second negative-feedback circuit, wherein the first negative-feedback circuit can coordinate with the stray inductance of insulated gate bipolar transistor, the current variation speeds between the grid of insulated gate bipolar transistor and power emitter-base bandgap grading is reduced when insulated gate bipolar transistor turns off, second negative-feedback circuit can coordinate with the stray inductance of insulated gate bipolar transistor, the current variation speeds between the grid of insulated gate bipolar transistor and power emitter-base bandgap grading is reduced when insulated gate bipolar transistor is opened, thus can make when IGBT opens or turn off, when IGBT collector electrode to power emitter-base bandgap grading rate of current di/dt change excessive time, by the first negative-feedback circuit of arranging in IGBT circuit and/or the second negative-feedback circuit, current variation speeds di/dt between the collector and emitter that can reduce IGBT, thus reduce the damage opened or turn off IGBT, play the effect of protection IGBT.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the schematic diagram of IGBT control circuit in one embodiment of the invention;
Fig. 2 is the schematic diagram of IGBT control circuit in another embodiment of the present invention;
Fig. 3 is the schematic diagram of IGBT control circuit in another embodiment of the present invention;
Fig. 4 is the schematic diagram that the present invention goes back IGBT control circuit in an embodiment;
Fig. 5 is the IGBT control circuit schematic diagram being provided with drive circuit in one embodiment of the invention;
Fig. 6 is the IGBT control circuit schematic diagram being provided with drive circuit in another embodiment of the present invention.
Embodiment
For making the object of the embodiment of the present invention, technical scheme and advantage clearly, below in conjunction with the accompanying drawing in the embodiment of the present invention, technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
Embodiments provide a kind of insulated gate bipolar transistor control circuit, comprise IGBT, and at least one circuit in the first negative-feedback circuit and the second negative-feedback circuit.
Fig. 1 is the schematic diagram of IGBT control circuit in one embodiment of the invention.As shown in Figure 1; first negative-feedback circuit 1 can play the effect of Control protection to IGBT when IGBT turns off; the first end of the first negative-feedback circuit 1 is connected with the grid G of IGBT; second end of the first negative-feedback circuit 1 is connected with the power emitter-base bandgap grading E` of IGBT; for coordinating with the stray inductance of insulated gate bipolar transistor, reduce the current variation speeds di/dt between the collector electrode C of IGBT and power emitter-base bandgap grading E` when IGBT turns off.A stray inductance L is had between the auxiliary emitter-base bandgap grading E and power emitter-base bandgap grading E` of IGBT
p, this stray inductance produces in process of production.The embodiment of the present invention is the current variation speeds di/dt according to producing in stray inductance; use the voltage that stray inductance produces; the voltage of lifting IGBT grid G; the turn-off speed of IGBT is slowed down; current variation speeds di/dt between domination set electrode C to power emitter-base bandgap grading E`; thus the damage that can reduce when IGBT overvoltage, and protect IGBT.
Fig. 2 is the schematic diagram of IGBT control circuit in another embodiment of the present invention; As shown in Figure 2; second negative-feedback circuit 2 can play the effect of Control protection to IGBT when IGBT opens; the first end of the second negative-feedback circuit 2 is connected with the grid G of IGBT; second end of the second negative-feedback circuit 2 is connected with the power emitter-base bandgap grading E` of IGBT; for coordinating with the stray inductance of insulated gate bipolar transistor, reduce the current variation speeds di/dt between the collector electrode C of IGBT and power emitter-base bandgap grading E` when IGBT opens.Further, the embodiment of the present invention is the current variation speeds di/dt according to producing in stray inductance, use the voltage that stray inductance produces, reduce the voltage of IGBT grid G, the speed of opening of IGBT is slowed down, current variation speeds di/dt between domination set electrode C to power emitter-base bandgap grading E`, thus the damage reducing the fly-wheel diode be connected with IGBT.
The embodiment of the present invention at least one circuit by arranging on IGBT circuit in the first negative-feedback circuit 1 and the second negative-feedback circuit 2.When IGBT opens or turn off, make the first above-mentioned negative-feedback circuit 1 and the second negative-feedback circuit 2 and the stray inductance L of IGBT between auxiliary emitter-base bandgap grading E and power emitter-base bandgap grading E`
pcoordinate, reduce or the voltage of lifting IGBT grid G, reduce current changing rate di/dt, thus the damage to IGBT can be reduced, and protect IGBT.It will be appreciated by those skilled in the art that, by arranging the first negative-feedback circuit and the second negative-feedback circuit in IGBT circuit, can when opening or turn off IGBT circuit, when producing larger current changing rate, can the collector electrode of direct control IGBT to emitter current, thus carry out FEEDBACK CONTROL by stray inductance, the voltage between effective control gate with auxiliary emitter-base bandgap grading (being connected also referred to as Kelvin).
Washability, IGBT control circuit also comprises an additional inductor L
p1, this additional inductor L
pthe first end of 1 and the stray inductance L of IGBT
pone end series connection, additional inductor L
psecond end of 1 is connected with the power emitter-base bandgap grading E` of IGBT.The additional inductor of the present embodiment also can reach the effect of inductance by a wire of connecting in stray inductance, specifically, by the first end of a wire and the stray inductance L of IGBT
pone end series connection, the second end of this wire is connected with the power emitter-base bandgap grading E` of IGBT.Can increase by increasing additional inductor the voltage formed on inductance at the present embodiment, and then increase the negative feedback of inductance generation, thus improve the sensitivity of IGBT control circuit.
As shown in Figure 1, the first negative-feedback circuit 1 of IGBT control circuit comprises the first resistance R of series connection
a1, the first diode D1 and transient voltage controller TVS1, the negative pole of transient voltage controller TVS1 is positioned at the second end side of the first negative-feedback circuit 1, be connected with the power emitter-base bandgap grading E` of IGBT, the positive pole of the first diode D1 is connected with the positive pole of transient voltage controller TVS1, the negative pole of the first diode D1 and the first resistance R
a1 is connected, the first resistance R
athe 1 first end side being positioned at the first negative-feedback circuit 1.Wherein, transient voltage controller TVS1 can when driving shutoff IGBT, when producing the change in voltage of moment at transient voltage controller TVS1 two ends, speed that can be higher its impedance is reduced largely, simultaneously stability big current, by the voltage clamp between its two ends numerically certain, thus guarantee that circuit element below damages from the high-octane impact of transient state.Transient voltage controller TVS1 can replace with voltage-stabiliser tube, but uses the effect of transient voltage controller better in the present embodiment.First diode D1 can be fast recovery diode (Fast recovery diode, FRD), it is good that fast recovery diode is that one has switching characteristic, the semiconductor diode that repercussion recovery time is short, because base is very thin, the reverse recovery time of reverse recovery diodes is shorter, therefore forward voltage drop is lower, reverse breakdown voltage (withstand voltage) is higher, but the present embodiment is not as limit, first diode also can be Schottky diode, every those skilled in the art institute is thinkable, the electronic device of unidirectional conduction current in the embodiment of the present invention can be realized, that is, the moment that first diode D1 turns off at IGBT, when becoming the time of counter voltage to be less than recovery time by positive voltage variation, can resume speed very fast realize individual event conducting, thus make electric current normal stream through the first diode D1.
Above-mentioned the present embodiment also can be the power emitter-base bandgap grading E` that the negative pole of transient voltage controller is connected to IGBT, the positive pole of transient voltage controller is connected with the first resistance, first resistance is connected with the positive pole of the first diode again, the negative grid G being connected to IGBT of the first diode, does not specifically limit the series sequence of the first resistance, the first diode and transient voltage controller at this.
Optionally, the transient voltage controller in above-described embodiment and the first diode also can be replaced by a bidirectional transient voltage controller.
Needs illustrate, when driving shutoff IGBT, voltage between the grid G of IGBT and emitter E starts to reduce, and is also being diminished by the electric current between the collector C of IGBT and emitter E simultaneously, the stray inductance L therefore between the auxiliary emitter-base bandgap grading E and power emitter-base bandgap grading E` of IGBT
pon produce negative lower positive voltage.When the turn-off speed of IGBT is very fast, the voltage drop between grid G and emitter E is very fast, then at stray inductance L
pthe current changing rate di/dt of upper generation is also comparatively large, thus at stray inductance L
pthe voltage of upper generation is comparatively large, then can puncture transient voltage controller TVS1, and then by the conducting of the first diode D1, electric current is again by the first resistance R
aarrive the grid G of IGBT after 1, thus improve the grid voltage of IGBT, the speed that the IGBT that is equivalent to have slowed down turns off, drive turn off IGBT time can minimizing to a certain degree to the damage of IGBT, and then protection IGBT.
As shown in Figure 2, the second negative-feedback circuit 2 of IGBT control circuit comprises the second diode D2, field effect transistor Q2 and the second resistance R of series connection
e2, the positive pole of the second diode D2 is positioned at the first end side of the second negative-feedback circuit 2, and negative pole and the field effect transistor Q2 of the second diode d that drains is connected, and the source electrode s of field effect transistor Q2 is positioned at the second end side of the second negative-feedback circuit 2, the grid g ground connection of field effect transistor Q2, the second resistance R
e2 are arranged between the source electrode s of field effect transistor Q2 and the second end of the second negative-feedback circuit 2.Wherein, the second diode D2 can be fast recovery diode also can be Schottky diode, and every those skilled in the art institute is thinkable, can realize the electronic device of unidirectional conduction current in the embodiment of the present invention.Field effect transistor plays the effect of switch, and when the voltage between the grid g and source electrode s of field effect transistor is enough large, field effect transistor can be started working in conducting.
When IGBT is opened in driving, the voltage between the grid G of IGBT and emitter E starts to rise, simultaneously generation current between the collector C and emitter E of IGBT, and therefore the change of electric current makes the stray inductance L between the auxiliary emitter-base bandgap grading E and power emitter-base bandgap grading E` of IGBT
pon produce just lower negative voltage.Open speed as IGBT, electric current can conducting second diode D2, the stray inductance L between the auxiliary emitter-base bandgap grading E and power emitter-base bandgap grading E` of IGBT
pthe current changing rate di/dt of upper generation is comparatively large, therefore stray inductance L
pthe voltage of upper generation is comparatively large (inductive drop U=L*(di/dt) also), then can produce voltage difference between the grid g of scene effect pipe Q2 and source electrode s, thus field effect transistor Q2 conducting can be made, then by the first resistance R
eafter 2, make the second diode D2, field effect transistor Q2 and the second resistance R of whole series connection
ethe current lead-through of the 2, second diode D2, and then reduce the grid voltage of IGBT, the speed that the IGBT that can slow down opens, the damage to the fly-wheel diode that is connected with IGBT can be reduced when driving and turning off IGBT.
Needs illustrate, the present embodiment also can by the location swap of the second diode D2 and field effect transistor Q2, specifically, the drain electrode d of field effect transistor Q2 can be arranged on the first end side of the second negative-feedback circuit 2, field effect transistor Q2 source electrode is connected with the positive pole of the second diode D2, the grid g ground connection of field effect transistor Q2, the negative pole of the second diode D2 is positioned at the second end side of the second negative-feedback circuit 2, the second resistance R
e2 are arranged between the negative pole of the second diode D2 and the second end of the second negative-feedback circuit 2.By the location swap by above-mentioned second diode D2 and field effect transistor Q2; when IGBT is opened in driving; voltage between the grid G of IGBT and emitter E starts to rise; the voltage of field effect transistor Q2 drain electrode d also starts to rise; diode D2 can be utilized to protect Q2, avoid that negative voltage is excessive causes damage to Q2.
Fig. 3 is the schematic diagram of IGBT control circuit in yet another embodiment of the invention.As shown in Figures 2 and 3, on the basis of IGBT control circuit described in Fig. 2, the second feedback circuit 2 can also arrange the 3rd diode D
clamp2, by the 3rd diode D
clampthe negative pole of 2 is connected with the source electrode s of field effect transistor Q2, and by the 3rd diode D
clampthe positive pole of 2 is connected on the negative voltage VEE of drive circuit.The maximum voltage that the grid g of general field effect transistor and source electrode s can bear is ± 20V, by arranging the 3rd diode D on the second feedback circuit 2 of IGBT control circuit
clamp2, can voltage between scene effect pipe Q2 grid g and source electrode s excessive time, by the voltage between the grid g of the 3rd diode nip field effect transistor Q2 and source electrode s, and then have certain protection to field effect transistor Q2.
Fig. 4 the present invention goes back the schematic diagram of IGBT control circuit in an embodiment.As shown in Figure 4, no longer illustrate with the same section of Fig. 3, difference is the 3rd diode D in Fig. 3
clamp2 can replace with a transient voltage controller group TVS3, transient voltage controller group TVS3 can be bidirectional transient voltage controller, namely be equivalent to two voltage stabilizing didoe differential concatenations, namely the negative pole of two transient voltage controllers is oppositely arranged, wherein, the positive pole of a transient voltage controller is connected with the grid g of field effect transistor Q3, and the positive pole of another transient voltage controller is connected with the source electrode s of field effect transistor Q3.By arranging a transient voltage controller group on the second feedback circuit 2 of IGBT control circuit; can voltage between scene effect pipe Q3 grid g and source electrode s excessive time; by the voltage between the grid g of transient voltage controller group nip field effect transistor Q3 and source electrode s, and then there is certain protection to field effect transistor Q3.
Fig. 5 is the IGBT control circuit schematic diagram being provided with drive circuit in one embodiment of the invention.As shown in Figure 5, be arranged in the circuit of driving by the IGBT control circuit in above-described embodiment, the IGBT control circuit of the present embodiment is identical with the IGBT control circuit in Fig. 4, no longer illustrates at this.The drive circuit of the present embodiment can be totem-pote circuit, and specifically, totem is exactly each transistor up and down, upper pipe is NPN type triode, collector c meets positive supply VCC, and lower pipe is PNP triode, and collector c meets negative supply VEE, two base stage b connect together, be connected on input, upper pipe NPN type triode is attempted by output together with receiving with the emitter-base bandgap grading e of lower pipe PNP triode, when input signal is high, upper pipe NPN conducting; When input signal is low, lower pipe PNP conducting, can provide enough voltage, current amplitude, makes IGBT unlikely release under normal work and overload situations saturated and damages.This is not restricted for drive circuit in the present embodiment, and every those skilled in the art can expect, can realize the circuit of the driving of opening or disconnecting to IGBT.
Fig. 6 is the IGBT control circuit schematic diagram being provided with drive circuit in another embodiment of the present invention.As shown in Figure 6, the IGBT control circuit of the present embodiment is identical with the IGBT control circuit in Fig. 1, no longer illustrates at this.Drive circuit can be totem-pote circuit, and this is not restricted, everyly can provide enough voltage, current amplitudes, makes IGBT unlikely release under normal work and overload situations saturated and any drive circuit of damaging.
In above-mentioned inventive embodiments, by arranging at least one circuit in the first negative-feedback circuit 1 and the second negative-feedback circuit 2 on IGBT circuit, when IGBT opens or turn off, can according to the stray inductance L of IGBT between auxiliary emitter-base bandgap grading E and power emitter-base bandgap grading E`
pthe current changing rate di/dt of upper formation, reduces or the voltage of lifting IGBT grid G, the turn-off speed of IGBT is slowed down, and uses the voltage that stray inductance produces, thus can reduce the damage when IGBT overvoltage, and protect IGBT; Or the speed of opening of IGBT is slowed down, the current variation speeds di/dt between domination set electrode C to power emitter-base bandgap grading E`, thus the damage reducing the fly-wheel diode be connected with IGBT.
Last it is noted that above each embodiment is only in order to illustrate technical scheme of the present invention, be not intended to limit; Although with reference to foregoing embodiments to invention has been detailed description, those of ordinary skill in the art is to be understood that: it still can be modified to the technical scheme described in foregoing embodiments, or carries out equivalent replacement to wherein some or all of technical characteristic; And these amendments or replacement, do not make the essence of appropriate technical solution depart from the scope of various embodiments of the present invention technical scheme.
Claims (6)
1. an insulated gate bipolar transistor control circuit, is characterized in that, comprises insulated gate bipolar transistor, and the first negative-feedback circuit;
The first end of described first negative-feedback circuit is connected with the grid of described insulated gate bipolar transistor, second end of described first negative-feedback circuit is connected with the power emitter-base bandgap grading of described insulated gate bipolar transistor, for coordinating with the stray inductance of insulated gate bipolar transistor, reduce the current variation speeds between the collector electrode of insulated gate bipolar transistor and power emitter-base bandgap grading when insulated gate bipolar transistor turns off;
Wherein, described first negative feedback road comprises the first resistance of series connection, the first diode and transient voltage controller, the positive pole of described transient voltage controller is positioned at the first end side of described first negative-feedback circuit, and the positive pole of described first diode is positioned at the second end side of described first negative-feedback circuit.
2. insulated gate bipolar transistor control circuit according to claim 1, is characterized in that, also comprises an additional inductor;
The first end of described additional inductor is connected with one end of the stray inductance of insulated gate bipolar transistor, and the second end of described additional inductor is connected with the power emitter-base bandgap grading of insulated gate bipolar transistor.
3. an insulated gate bipolar transistor control circuit, is characterized in that, comprises insulated gate bipolar transistor, with the second negative-feedback circuit;
The first end of described second negative-feedback circuit is connected with the grid of described insulated gate bipolar transistor, second end of described second negative-feedback circuit is connected with the power emitter-base bandgap grading of described insulated gate bipolar transistor, for coordinating with the stray inductance of insulated gate bipolar transistor, reduce the current variation speeds between the collector electrode of insulated gate bipolar transistor and power emitter-base bandgap grading when insulated gate bipolar transistor is opened;
Wherein, described second negative-feedback circuit comprises the second diode of series connection, field effect transistor and the second resistance, the positive pole of described second diode is positioned at the first end side of described second negative-feedback circuit, and the negative pole of described second diode drains with described field effect transistor and is connected; The source electrode of described field effect transistor is positioned at the second end side of described second negative-feedback circuit, the grounded-grid of described field effect transistor, between the source electrode that described second resistance is arranged on the drain electrode of described field effect transistor and the second end of described second negative-feedback circuit; Or the drain electrode of described field effect transistor is positioned at the first end side of described second negative-feedback circuit, described field effect transistor source electrode is connected with the positive pole of described second diode, the grounded-grid of described field effect transistor, the negative pole of described second diode is positioned at the second end side of described second negative-feedback circuit, and described second resistance is arranged between the negative pole of described second diode and the second end of described second negative-feedback circuit.
4. insulated gate bipolar transistor control circuit according to claim 3, is characterized in that, also comprises an additional inductor;
The first end of described additional inductor is connected with one end of the stray inductance of insulated gate bipolar transistor, and the second end of described additional inductor is connected with the power emitter-base bandgap grading of insulated gate bipolar transistor.
5. the insulated gate bipolar transistor control circuit according to claim 3 or 4, is characterized in that, also comprises the 3rd diode, and the positive pole of described 3rd diode connects negative voltage, and the negative pole of described 3rd diode is connected with the source electrode of described field effect transistor.
6. the insulated gate bipolar transistor control circuit according to claim 3 or 4, it is characterized in that, also comprise a transient voltage controller group, the negative pole of two transient voltage controllers of described transient voltage controller group is oppositely arranged, the positive pole of one of them transient voltage controller is connected with the grid of described field effect transistor, and the positive pole of another transient voltage controller is connected with the source electrode of described field effect transistor.
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DE102015114284B3 (en) * | 2015-08-27 | 2016-09-29 | Infineon Technologies Ag | METHOD AND CONTROL UNIT FOR CONTROLLING A TRANSISTOR |
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CN107565942B (en) * | 2017-10-16 | 2024-04-19 | 云南电网有限责任公司电力科学研究院 | Protection circuit for MOSFET |
WO2019232705A1 (en) * | 2018-06-06 | 2019-12-12 | 华为技术有限公司 | Transistor circuit, and manufacturing method thereof |
CN109856521B (en) * | 2018-12-27 | 2022-02-18 | 北京京能新能源有限公司 | Device testing system and method |
CN110572011B (en) * | 2019-08-20 | 2020-10-02 | 合肥工业大学 | IGBT drive circuit soft switching device with short-circuit protection |
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CN112311374A (en) * | 2020-10-23 | 2021-02-02 | 华为技术有限公司 | Switching circuit |
CN112953481B (en) * | 2021-01-27 | 2022-09-27 | 复旦大学 | Drive module, switching circuit and electronic equipment of GaN transistor |
CN115714138B (en) * | 2022-11-10 | 2023-08-15 | 上海功成半导体科技有限公司 | IGBT device and preparation method thereof |
CN115580120B (en) * | 2022-11-17 | 2023-02-17 | 杭州飞仕得科技股份有限公司 | IGBT drive protection circuit based on three-level topological structure |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5444591A (en) * | 1993-04-01 | 1995-08-22 | International Rectifier Corporation | IGBT fault current limiting circuit |
CN101752841A (en) * | 2008-12-19 | 2010-06-23 | 比亚迪股份有限公司 | Insulated gate bipolar transistor (IGBT) protection circuit and motor control system |
-
2012
- 2012-07-20 CN CN201210252273.6A patent/CN102780474B/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5444591A (en) * | 1993-04-01 | 1995-08-22 | International Rectifier Corporation | IGBT fault current limiting circuit |
CN101752841A (en) * | 2008-12-19 | 2010-06-23 | 比亚迪股份有限公司 | Insulated gate bipolar transistor (IGBT) protection circuit and motor control system |
Non-Patent Citations (2)
Title |
---|
IGBT Fault Protection Based on di/dt Feedback Control;Frank Huang et;《PESC Record-IEEE Annual Power Electronics Specialists Conference》;20070731;第1481-1482页 * |
电力电子实验装置中的晶闸管保护;王鲁杨等;《上海电力学院学报》;20090831;第25卷(第4期);第312页 * |
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