CN102706708B - X射线残余应力测试系统校准试块制作方法 - Google Patents
X射线残余应力测试系统校准试块制作方法 Download PDFInfo
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Abstract
本发明涉及一种X射线残余应力测试系统校准试块制作方法,包括以下步骤:1)采用颗粒直径为1<d<45
Description
技术领域
本发明涉及一种X射线残余应力测试系统校准试块制作方法,该方法属于一种计量领域。
背景技术
X射线残余应力测试系统国内无溯源,无校准方法,其工作参数涉及的领域宽,包括:温度参数,力学参数,长度参数及无损探伤参数等多个领域,操作过程复杂,该设备主要用于测试金属表面(铁、铝、钛、钢)残余应力的检测,采用X射线检测原理,对金属表面奥氏体、马氏体等应力进行检测。
发明内容
本发明要解决的技术问题是提供一种X射线残余应力测试系统校准试块制作方法,该方法不仅步骤简单,而且应力小,接近零应力。
为解决以上问题,本发明的具体技术方案如下:一种X射线残余应力测试系统校准试块制作方法,包括以下步骤:
1)采用颗粒直径为1 <d<45的无应力铁粉,在真空中对其退火处理;
2)用丙酮将氮纤维素胶合剂稀释为10%的溶液作为粘合剂溶液;
3)将退火后的无应力铁粉撒在显微镜载玻片上,然后在上面均匀滴上粘合剂溶液;
4)再在粘合剂溶液上撒上退火后的无应力铁粉,并用另一个显微镜载玻片扣合;
5)上表面平整后,拿下上面的显微镜载玻片,继续重复3和4步骤,直至试块的厚度为15cm,并且表面平整,将试块晒干即得到X射线残余应力测试系统校准试块。
该X射线残余应力测试系统校准试块制作方法采用上述步骤,可以更好的保证试块的达到最小,接近为零,从而有效的对X射线残余应力测试系统进行校准,保证测量值的准确度。
具体实施方式
一种X射线残余应力测试系统校准试块制作方法,其特征在于包括以下步骤:
1)采用颗粒直径为1<d<45的无应力铁粉,在真空中对其退火处理;
2)用丙酮将氮纤维素胶合剂稀释为10%的溶液作为粘合剂溶液;
3)将退火后的无应力铁粉撒在显微镜载玻片上,然后在上面均匀滴上粘合剂溶液;
4)再在粘合剂溶液上撒上退火后的无应力铁粉,并用另一个显微镜载玻片扣合;
5)上表面平整后,拿下上面的显微镜载玻片,继续重复3和4步骤,直至试块的厚度为15cm,并且表面平整,将试块晒干即得到X射线残余应力测试系统校准试块,如果粘合剂过量导致表面不平整,可以重新使用丙酮湿润表面,使其平整后,再干燥即可。
该X射线残余应力测试系统校准试块使用时,放置在探头下,测得5次应力值的平均值在±14MPa范围内,则X射线残余应力测试系统为合格产品。
Claims (1)
1.一种X射线残余应力测试系统校准试块制作方法,其特征在于包括以下步骤:
1)采用颗粒直径为1 <d<45的无应力铁粉,在真空中对其退火处理;
2)用丙酮将氮纤维素胶合剂稀释为10%的溶液作为粘合剂溶液;
3)将退火后的无应力铁粉撒在显微镜载玻片上,然后在上面均匀滴上粘合剂溶液;
4)再在粘合剂溶液上撒上退火后的无应力铁粉,并用另一个显微镜载玻片扣合;
5)上表面平整后,拿下上面的显微镜载玻片,继续重复3和4步骤,直至试块的厚度为15cm,并且表面平整,将试块晒干即得到X射线残余应力测试系统校准试块。
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US9989496B2 (en) | 2012-11-29 | 2018-06-05 | Beijing Institute Of Technology | Fixed value residual stress test block and manufacturing and preservation method thereof |
CN103604874A (zh) * | 2013-10-30 | 2014-02-26 | 北京理工大学 | 残余压应力定值试块的制作工艺及其使用和保存方法 |
CN103616129A (zh) * | 2013-12-09 | 2014-03-05 | 北京理工大学 | 一种用于拉压残余应力超声检测系统的自动校准方法 |
CN103837603B (zh) * | 2014-02-28 | 2017-02-15 | 北京理工大学 | 残余应力梯度校准试块的使用方法 |
JP7059974B2 (ja) * | 2019-03-25 | 2022-04-26 | 新東工業株式会社 | X線残留応力測定用基準片の製造方法及びx線残留応力測定用基準片 |
Citations (3)
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US5450461A (en) * | 1993-12-30 | 1995-09-12 | General Electric Company | Self-calibrating computed tomography imaging system |
CN1645091A (zh) * | 2005-01-13 | 2005-07-27 | 上海交通大学 | X射线应力测量标定试样的制备方法 |
CN1648646A (zh) * | 2005-02-03 | 2005-08-03 | 上海交通大学 | X射线奥氏体测量标定试样的制备方法 |
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US5450461A (en) * | 1993-12-30 | 1995-09-12 | General Electric Company | Self-calibrating computed tomography imaging system |
CN1645091A (zh) * | 2005-01-13 | 2005-07-27 | 上海交通大学 | X射线应力测量标定试样的制备方法 |
CN1648646A (zh) * | 2005-02-03 | 2005-08-03 | 上海交通大学 | X射线奥氏体测量标定试样的制备方法 |
Non-Patent Citations (3)
Title |
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JP特开2007-309923A 2007.11.29 * |
张持重等.采用X射线法测算金属材料内部残余应力的研究.《吉林化工学院学报》.2001,第18卷(第4期),73-75. * |
采用X射线法测算金属材料内部残余应力的研究;张持重等;《吉林化工学院学报》;20011231;第18卷(第4期);73-75 * |
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