CN102495353A - Radio frequency integrated circuit test system and control method thereof - Google Patents
Radio frequency integrated circuit test system and control method thereof Download PDFInfo
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- CN102495353A CN102495353A CN2011104434773A CN201110443477A CN102495353A CN 102495353 A CN102495353 A CN 102495353A CN 2011104434773 A CN2011104434773 A CN 2011104434773A CN 201110443477 A CN201110443477 A CN 201110443477A CN 102495353 A CN102495353 A CN 102495353A
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Abstract
The invention discloses a radio frequency integrated circuit test system. The system comprises: an upper computer, a bottom hardware control module, a test fixture board and a programmable test apparatus. The system is characterized in that: a serial port module, a circuit function setting module and a parameter test module are arranged in the upper computer; the bottom hardware control module comprises a single chip microcomputer and the single chip microcomputer is provided with a MCU serial port module, a data operation module, a MCU function initialization module and a circuit setting operation module; the serial port module is used for communication between the upper computer and the single chip microcomputer of the bottom hardware control module; the circuit function setting module is used to set and select a working mode of the test system; the parameter test module is used to select a test parameter and carry out corresponding function setting to the test parameter; function call of an automation test can be provided; read-write control is carried out to the programmable test apparatus; whether a test result is qualified is determined and indication is performed. The system can be widely used for the control and test analysis of the radio frequency circuit.
Description
Technical field
The present invention relates to test macro and method, be specifically related to RF IC test macro and control method.
Background technology
Along with development of integrated circuits, more and more tend to digital-to-analogue and mix monolithic integrated optical circuit.Inside circuit is controlled analog part through digital function module, therefore for the test analysis of integrated circuit, at first need verify the digital function module part, to reach the operate as normal through digital function module control analog part.Because the digital function module that different circuits is inner integrated is also different, comprising I2C communication protocol, SPI serial communication protocol, logic level control etc.And for RF IC, according to receiving cable, transmission channel and different unit such as combine frequently, its parameter index otherness is bigger.Therefore for different circuits, need make separately the test system hardware part, the program part of test macro also need be write different interface control programs according to different protocol etc., causes workload big, and cost is high, and the cycle is long, and efficient is low.
Summary of the invention
One of technical matters to be solved by this invention is to provide the RF IC test macro.
Two of technical matters to be solved by this invention is to provide RF IC test macro control method.
In order to solve the problems of the technologies described above, according to first technical scheme of the present invention, the RF IC test macro comprises host computer, bottom hardware control module, test fixture plate and program-controlled testing tool; It is characterized in that:
In host computer, be provided with serial port module, circuit function is provided with module, parameter testing module, wherein:
The single-chip microcomputer that serial port module is used for host computer and bottom hardware control module communicates;
Circuit function is provided with module (13) and is used for mode of operation to test macro and is provided with and selects; Comprise that the bus operation mode that is used for test macro is provided with; Compatible multiple interfaces, various protocols; Reception and emission mode to RF IC to be measured are selected to be provided with; The circuit gain of RF IC to be measured is selected control; The on-off circuit of RF IC to be measured is carried out the selection of gating passage; Realize that multi-functional, multinomial purpose is multiplexing;
The parameter testing module is used for test parameter is selected, and test parameter is carried out corresponding power function setting; Calling of general purpose interface bus is provided; The function call button of automatic test is provided; Program-controlled testing tool is read and write control; Test result is carried out whether qualified judgement and indicated; Test result is shown and stores; Realize automatic test;
In the bottom hardware control module, comprise single-chip microcomputer, in single-chip microcomputer, be provided with MCU serial port module, data operation module, MCU function initialization module and circuit setting operation module, wherein:
The MCU serial port module is used for communicating with host computer, and the MCU serial port module receives the data of host computer through serial port module output, outputs to the data operation module after handling; And for the value of the RF IC internal register to be measured that register manipulation is arranged, the EBI corresponding with the test fixture plate through the bottom hardware control module reads, and handles the back and is sent to host computer through the MCU serial port module;
The data operation module is used for the data that receive are recovered, and discernible data is provided for MCU function initialization module and circuit setting operation module;
MCU function initialization module is judged the data of data computing module output, and is carried out the single-chip processor i/o mouth initialization of corresponding function by data through the result after judging;
Circuit setting operation module: the data to the output of data computing module are judged, and are utilized initialized single-chip processor i/o mouth RF IC to be measured to be carried out the control of corresponding mode of operation through the corresponding function setting function of call by result after judging;
RF IC to be measured is installed on the test fixture plate; RF IC test clamp plate to be measured and bottom hardware control module and host computer carry out communication; And RF IC test clamp plate output signal to be measured is to program-controlled testing tool or receive the signal that program-controlled testing tool is exported;
Program-controlled testing tool receives the signal of the parameter testing module output of host computer, and the test clamp plate reads the data of RF IC to be measured, outputs to host computer.
According to a kind of preferred version of RF IC test macro of the present invention, circuit function is provided with the read-write control that module also is used for the RF IC to be measured that register manipulation is arranged is carried out register;
The MCU serial port module also is used for the value to the RF IC internal register to be measured that register manipulation is arranged, and the EBI corresponding with the test fixture plate through the bottom hardware control module reads, and handles the back and is sent to host computer through the MCU serial port module.
A kind of preferred version according to RF IC test macro of the present invention; Said bottom hardware control module also comprises level shifting circuit; Also be provided with the parallel port module in the said host computer, the parallel port module is read and write control through level shifting circuit and test fixture plate to RF IC to be measured;
Said level shifting circuit is changed back test clamp plate with the level signal of the parallel port module output of host computer and is outputed to RF IC to be measured; And output to host computer after the data of RF IC test clamp plate to be measured output are changed.
Owing in host computer (1), both be provided with serial port module, be provided with the parallel port module again, also be provided with level shifting circuit (6) in the bottom hardware control module (2), guaranteed that the native system interface both had been applicable to that serial ports also was applicable to the parallel port.
According to a kind of preferred version of RF IC test macro of the present invention, also be provided with the transmission line calibration module in the said host computer; The transmission line calibration module is used for the test cable that prevention at radio-frequency port uses is calibrated, and calibration data is stored, and provided calibration data to the parameter testing module.Guaranteed measuring accuracy.
According to second technical scheme of the present invention, RF IC test macro control method is characterized in that: comprise the steps:
A, according to RF IC to be measured, through circuit function module is set and test macro is provided with and selects;
B, single-chip microcomputer are waited for and are received data, after single-chip microcomputer is received data, by self-defined communications protocol data are handled, and handle the instruction that host computer is carried out in the back;
C, select the test parameter of wanting through the parameter testing module;
D, RF IC to be measured is carried out the control of mode of operation according to the function setting function of current institute test parameter; And program-controlled testing tool is carried out the state setting through general purpose interface bus GPIB;
E, read program-controlled testing tool test data;
F, call the calibration data of transmission line calibration module, test data is calibrated and shown;
G, judge whether test result is qualified, and result of determination is shown.
According to a kind of preferred version of RF IC test macro control method of the present invention, steps A comprises to be selected the bus operation mode of test macro; Reception and emission mode to RF IC to be measured are selected to be provided with; The circuit gain of RF IC to be measured is selected control; The on-off circuit of RF IC to be measured is carried out the selection of gating passage;
According to a kind of preferred version of RF IC test macro control method of the present invention,, also comprise in the steps A register is carried out read and/or write for the RF IC to be measured that register is arranged.
A kind of preferred version according to RF IC test macro control method of the present invention; Single-chip microcomputer is waited for and is received data among the step B, after single-chip microcomputer is received data, data is handled; And press the instruction that self-defined communications protocol is carried out host computer, concrete steps are:
B1, single-chip microcomputer are waited for the reception data,
After B2, single-chip microcomputer are received data, judge whether the data of receiving are data frame heads; If the data frame head gets into step B3; If not the data frame head returns step B1;
B3, Data Receiving and storage;
Whether the data that B4, judgement are received are data postambles; If the data postamble gets into step B5; If not the data postamble returns step B3;
B5, data operation module are recovered the non-frame head in the packet that receives and the data of postamble;
B6, MCU function initialization module judge whether protocols having is instructed in the recovered data, if protocols having instruction in the recovered data gets into step B7; If no-protocol instruction in the data, whether identify after the protocols having initialization in the judgment data, if identify after the no-protocol initialization in the data, return step B1; If identify after the protocols having initialization in the data, get into step B8;
B7, MCU function initialization module carry out initialization to corresponding I/O mouth, and initialized I/O mouth is identified, and return step B1;
B8, circuit setting operation module judge whether function command is arranged in the recovered data, if no function sign in the data is returned step B1; If in the data Function Identification is arranged; Then judge whether once more to identify after the protocols having initialization; If not then return step B1,, then call corresponding function setting function if identify after the protocols having initialization; Utilize initialized single-chip processor i/o mouth that RF IC to be measured is carried out the control of corresponding mode of operation, return step B1.
The beneficial effect of RF IC test macro of the present invention and control method is: the compatible multiple interfaces of the present invention, various protocols, can realize that multi-functional, multinomial purpose is multiplexing, and owing to be provided with the transmission line calibration module, guaranteed measuring accuracy; The present invention is easy to use, and function is many, efficient is high, can realize automatic test, can be widely used in the radio-frequency receiving-transmitting passage, frequently combines, the control and the test analysis of radio circuits such as modulator and detuner, has a good application prospect.
Description of drawings
Fig. 1 is the theory diagram of the described RF IC test macro of invention.
Fig. 2 is the program flow chart of single-chip microcomputer 5.
Fig. 3 is that 1 pair of host computer has the RF IC to be measured of register manipulation to carry out register read-write control flow block diagram.
Fig. 4 is that 1 pair of program-controlled testing tool 4 of host computer is tested the control flow block diagram.
Embodiment
Referring to Fig. 1, the RF IC test macro is made up of host computer 1, bottom hardware control module 2, test fixture plate 3 and program-controlled testing tool 4; Wherein:
In host computer 1, be provided with serial port module 12, circuit function is provided with module 13, parameter testing module 15, parallel port module 11 and transmission line calibration module 14, wherein:
The single-chip microcomputer 5 that serial port module 12 is used for host computer 1 and bottom hardware control module 2 communicates;
Circuit function is provided with module 13 and is used for mode of operation to test macro and is provided with and selects; Comprise that the bus operation mode that is used for test macro is provided with; Reception and emission mode to RF IC to be measured are selected to be provided with; The circuit gain of RF IC to be measured is selected control; The on-off circuit of RF IC to be measured is carried out the selection of gating passage; Circuit function is provided with the read-write control that module (13) also is used for the RF IC to be measured that register manipulation is arranged is carried out register;
Transmission line calibration module 14 is used for the test cable that prevention at radio-frequency port uses is calibrated, and calibration data is stored, and provided calibration data to the parameter testing module.
Parallel port module 11 is read and write control through level shifting circuit 6 and 3 pairs of RF ICs to be measured of test fixture plate;
In bottom hardware control module 2, comprise single-chip microcomputer 5 and level shifting circuit 6, in single-chip microcomputer 5, be provided with MCU serial port module 51, data operation module 52, MCU function initialization module 53 and circuit setting operation module 54, wherein:
MCU serial port module 51 is used for single-chip microcomputer 5 serial ports are carried out initialization operation; Baud rate to single-chip microcomputer 5 serial ports is operated; MCU serial port module 51 is used for communicating with host computer 1, and MCU serial port module 51 receives the data of host computer 1 through serial port module 12 outputs, outputs to data operation module 52 after handling; And for the value of the RF IC internal register to be measured that register manipulation is arranged, read with test fixture plate 3 corresponding EBIs, handle the back and be sent to host computer 1 through MCU serial port module 51 through bottom hardware control module 2;
The data of 53 pairs of data computing modules of MCU function initialization module, 52 outputs are judged, and are pressed data to carrying out the single-chip processor i/o mouth initialization of corresponding function through the result after judging;
The data of 54 pairs of data computing modules of circuit setting operation module, 52 outputs are judged; And, utilize initialized single-chip processor i/o mouth RF IC to be measured to be carried out the control of corresponding mode of operation through the corresponding function setting function of call by result after judging;
Said level shifting circuit 6 is changed back test clamp plate 3 with the level signal of parallel port module 11 outputs of host computer 1 and is outputed to RF IC to be measured; And the data of RF IC test clamp plate 3 outputs to be measured are carried out outputing to host computer 1 after the level conversion.
RF IC to be measured is installed on the test fixture plate 3; RF IC test clamp plate 3 to be measured carries out communication with bottom hardware control module 2 and host computer 1; And RF IC test clamp plate 3 output signals to be measured are to program-controlled testing tool 4 or receive the signal that program-controlled testing tool 4 is exported;
Program-controlled testing tool 4 receives the signal of parameter testing module 15 outputs of host computer 1, and test clamp plate 3 reads the data of RF IC to be measured, outputs to host computer 1.
Referring to Fig. 2 to Fig. 4, RF IC test macro control method comprises the steps:
A, according to RF IC to be measured, through circuit function 13 pairs of test macros of module are set and and select;
B, single-chip microcomputer 5 are waited for and are received data, after single-chip microcomputer 5 is received data, by self-defined communications protocol data are handled, and handle the instruction that host computer 1 is carried out in the back;
C, select the test parameters of wanting through parameter testing module 15;
D, RF IC to be measured is carried out the control of mode of operation according to the function setting function of current institute test parameter; And program-controlled testing tool 4 is carried out the state setting through general purpose interface bus GPIB;
E, read program-controlled testing tool 4 test datas;
F, call the calibration data of transmission line calibration module 14, test data is calibrated and shown;
G, judge whether test result is qualified, and result of determination is shown; Defective when test result, click independent test and test this parameter once more, call this parameter function trial function once more, in the interface, refresh and show test results, judge once more whether test result is qualified, if still defective, EOT also sends out a warning; If test result is qualified, judge whether it is last parameter, if last parameter finishes and gives a green light; If not last parameter, click and continue test or next parameter is proceeded test, circuit is carried out the control of corresponding mode of operation according to the test function function of current institute test parameter; And through GPIB program-controlled testing tool 4 is carried out the step that is provided with of corresponding states.
In specific embodiment, steps A comprises to be selected the bus operation mode of test macro; Bus operation mode comprises SPI or I2C or level control; Reception and emission mode to RF IC to be measured are selected to be provided with; The circuit gain of RF IC to be measured is selected control, and circuit gain control comprises aanalogvoltage gain control or digital gain control; The on-off circuit of RF IC to be measured is carried out the selection of gating passage;
In specific embodiment,, also comprise in the steps A register is carried out read and/or write for the RF IC to be measured that register is arranged.
In specific embodiment, single-chip microcomputer 5 is waited for and is received data among the step B, after single-chip microcomputer 5 is received data, data is handled, and is pressed the instruction that self-defined communications protocol is carried out host computer 1, and concrete steps are:
B1, single-chip microcomputer 5 are waited for and are received data;
After B2, single-chip microcomputer 5 are received data, judge whether the data of receiving are data frame heads; If the data frame head gets into step B3; If not the data frame head returns step B1;
B3, Data Receiving and storage;
Whether the data that B4, judgement are received are data postambles; If the data postamble gets into step B5; If not the data postamble returns step B3;
The non-frame head in B5,52 pairs of packets that receive of data operation module and the data of postamble are recovered;
B6, MCU function initialization module judge whether protocols having is instructed in the recovered data, if protocols having instruction in the recovered data gets into step B7; If no-protocol instruction in the data, whether identify after the protocols having initialization in the judgment data, if identify after the no-protocol initialization in the data, return step B1; If identify after the protocols having initialization in the data, get into step B8;
B7,53 pairs of corresponding I/O mouths of MCU function initialization module carry out initialization, and initialized I/O mouth is identified, and return step B1;
B8, circuit setting operation module 54 judge whether function command is arranged in the recovered data, if no function sign in the data is returned step B1; If in the data Function Identification is arranged; Then judge whether once more to identify after the protocols having initialization; If not then return step B1,, then call corresponding function setting function if identify after the protocols having initialization; Utilize initialized single-chip processor i/o mouth that RF IC to be measured is carried out the control of corresponding mode of operation, return step B1.
In the specific implementation, the function setting function according to current institute test parameter among the step D is carried out the control of mode of operation to RF IC to be measured, concrete realizing method is following:
For example this RF IC to be measured belongs to logic level control, and need be operated in receiving cable this moment, and what utilize is that serial ports and bottom hardware control module 2 communicate, and then instructs to bottom hardware control module 2 through serial port module 12 transmission correspondences; After bottom hardware control module 2 restore data RF IC to be measured is provided with; Host computer 1 sends data code:
tBuf[0]?:=?$f0;
tBuf[1]?:=?Data1?shr?4;
tBuf[2]?:=?Data1?and?$0f;
tBuf[3]?:=?Data2?shr?4;
tBuf[4]?:=?Data2?and?$0f;
tBuf[5]?:=?$ff;
Form1.Comm1.WriteCommData(tBuf,6);
What Data1 represented is the receiving cable mode data, and what Data2 represented is circuit gain control, and f0 and ff then represent data frame head and data postamble.
Bottom hardware control module (2) then only need get final product the conversion that initialized single-chip processor i/o mouth carries out high-low level.
During test, the selection of serial ports and parallel port then is to belong to the interface that user oneself selects for use and decide.
To through general purpose interface bus program-controlled testing tool (4) being carried out the state setting among the step D, concrete implementation method is following:
According to the mode of operation of institute's test circuit, the instrument that needs are used carries out correspondence setting.For example receiving cable work is double conversion, the external local oscillator of circuit, TCH test channel gain.Need use three signal sources and a frequency spectrograph this moment.At first be the setting of signal source being carried out output frequency and power, the performance number that frequency spectrum reads corresponding frequency is set then.The signalization source code is following:
Aglient_SetFre(AG_Add_A,3000,-80,1);
Aglient_SetFre(AG_Add_B,2700,0,1);
Aglient_SetFre(AG_Add_C,343,0,1);
Above-mentioned code representes that respectively the instrument address is the signal source output 3000MHz of AG_Add_A; The signal of-80dBm, instrument address are the signal source output 2700MHz of AG_Add_B, the signal of 0dBm; The instrument address is the signal source output 343MHz of AG_Add_C, the signal of 0dBm.
Function Aglient_SetFre () specific code is following:
Procedure
Aglient_SetFre?(nAddr:integer;fre:double;amp:double;OnorOff:integer);
begin
SetComm(nAddr,'FREQ?'+floattostr(fre)+'?MHZ');
SetComm(nAddr,'POW?'+floattostr(AMP)+'?DBM');
IF?OnorOff?=?0?THEN
SetComm(nAddr,'OUTP?OFF')
ELSE
SetComm(nAddr,'OUTP?ON');
end;
It is following to read the frequency spectrograph code:
P1?:=?AgilentN9020AReadPeak(Aglient9020ADD_rx,43,0.5,20);
Gain?:=?P1+80
And AgilentN9020AreadPeak () specific code is following:
function?AgilentN9020AReadPeak(nAddr:integer;cf,sp,am:double):double;
begin
SetComm(nAddr,'DISP:WIND:TRAC:Y:RLEV:OFFS?0');
SetComm(nAddr,'DISP:WIND:TRAC:Y:RLEV?'+?floattostr(am)?+'?dBm');
SetComm(nAddr,'FREQ:CENT?'+?floattostr(cf)?+'?MHZ');
SetComm(nAddr,'FREQ:SPAN?'+floattostr(sp)+'?MHZ');
SetComm(nAddr,'CALC:MARK:MODE?ON');
Sleep(800);
SetComm(nAddr,'CALC:MARK1:MAX');
Sleep(100);
SetComm(nAddr,'CALC:MARK1:Y?');
result?:=?roundto(GetComm(nAddr),-2);
end;
Communicate through self-defining communication protocol between host computer 1 and the bottom hardware control module 2; In self-defining communication protocol; Carry out encapsulation of data with a packet; Adopt identical data frame head; Carry out the data sync of host computer and single-chip microcomputer, two data after the data frame head are defined as protocol instructions or function command, and promptly single-chip microcomputer judges that according to second field among the host computer packet that receives belonging to any agreement calls the perhaps instruction of funcall; After the function command, then be the data that belong to transmission, data are represented the end of packet afterwards as the data postamble of packet with a special instruction.Concrete form is seen table 1 host computer and single chip communication data layout such as table 1 or table 2, wherein, and the form the when form when table 1 instructs for host-host protocol, table 2 instruct for transfer function.
Table 1
| The data frame head | Protocol instructions | Protocol instructions | The data postamble |
Table 2
| The data frame head | Function command | Function command | Data | ... | Data | The data postamble |
Host computer 1 data processing operation code is as follows:
tBuf[3]?:=?Data1?shr?4;
tBuf[4]?:=?Data1?and?$0f;
tBuf[5]?:=?Data2?shr?4;
tBuf[6]?:=?Data2?and?$0f;
It is as follows that single-chip microcomputer 5 data are recovered operation part:
data1=(Receive_Buffer[2]<<4)|Receive_Buffer[3];
data2=(Receive_Buffer[4]<<4)|Receive_Buffer[5];
Top specific embodiments of the invention is described, still, and the scope that is not limited only to embodiment of the present invention's protection.
Claims (8)
1. the RF IC test macro comprises host computer (1), bottom hardware control module (2), test fixture plate (3) and program-controlled testing tool (4); It is characterized in that:
In host computer (1), be provided with serial port module (12), circuit function is provided with module (13) and parameter testing module (15); In bottom hardware control module (2), comprise single-chip microcomputer (5), in single-chip microcomputer (5), be provided with MCU serial port module (51), data operation module (52), MCU function initialization module (53) and circuit setting operation module (54); Wherein:
The single-chip microcomputer (5) that serial port module (12) is used for host computer (1) and bottom hardware control module (2) communicates;
Circuit function is provided with module (13) and is used for mode of operation to test macro and is provided with and selects;
Parameter testing module (15) is used for test parameter is selected, and test parameter is carried out corresponding power function setting; The function call of automatic test is provided; Program-controlled testing tool (4) is read and write control; Test result is carried out whether qualified judgement and indicated;
MCU serial port module (51) is used for communicating with host computer (1), and MCU serial port module (51) receives the data of host computer (1) through serial port module (12) output, outputs to data operation module (52) after handling;
Data operation module (52) is used for the data that receive are recovered, and discernible data is provided for MCU function initialization module (53) and circuit setting operation module (54);
MCU function initialization module (54) is judged the data of data computing module (52) output, and is pressed data to carrying out the single-chip processor i/o mouth initialization of corresponding function through the result after judging;
Circuit setting operation module (54) is judged the data of data computing module (52) output; And, utilize initialized single-chip processor i/o mouth RF IC to be measured to be carried out the control of corresponding mode of operation through the corresponding function setting function of call by result after judging;
RF IC to be measured is installed on the test fixture plate (3); RF IC test clamp plate to be measured (3) and bottom hardware control module (2) are carried out communication with host computer (1); And RF IC test clamp plate to be measured (3) output signal is to program-controlled testing tool (4) or receive the signal that program-controlled testing tool (4) is exported;
Program-controlled testing tool (4) receives the signal of the parameter testing module output of host computer (1), and test clamp plate (3) reads the data of RF IC to be measured, outputs to host computer (1).
2. RF IC test macro according to claim 1 is characterized in that:
Circuit function is provided with the read-write control that module (13) also is used for the RF IC to be measured that register manipulation is arranged is carried out register;
MCU serial port module (51) also is used for the value to the RF IC internal register to be measured that register manipulation is arranged; Read with the corresponding EBI of test fixture plate (3) through bottom hardware control module (2), handle the back and be sent to host computer (1) through MCU serial port module (51).
3. RF IC test macro according to claim 1 and 2; It is characterized in that: said bottom hardware control module (2) also comprises level shifting circuit (6); Also be provided with parallel port module (11) in the said host computer (1), parallel port module (11) is read and write control through level shifting circuit (6) and test fixture plate (3) to RF IC to be measured;
Said level shifting circuit (6) is changed back test clamp plate (3) with the level signal of parallel port module (11) output of host computer (1) and is outputed to RF IC to be measured; And output to host computer (1) after the data of RF IC test clamp plate to be measured (3) output are changed.
4. RF IC test macro according to claim 3 is characterized in that: also be provided with transmission line calibration module (14) in the said host computer (1); Transmission line calibration module (14) is used for the test cable that prevention at radio-frequency port uses is calibrated, and calibration data is stored, and provided calibration data to parameter testing module (15).
5. RF IC test macro control method is characterized in that: comprise the steps:
A, according to RF IC to be measured, through circuit function module (13) is set and test macro is provided with and selects;
B, single-chip microcomputer (5) are waited for and are received data, after single-chip microcomputer (5) is received data, by self-defined communications protocol data are handled, and are carried out the instruction of host computer (1);
C, select the test parameter of wanting through parameter testing module (15);
D, RF IC to be measured is carried out the control of mode of operation, and program-controlled testing tool (4) is carried out the state setting through general purpose interface bus according to the function setting function of current institute test parameter;
E, read program-controlled testing tool (4) test data;
F, call the calibration data of transmission line calibration module (14), test data is calibrated and shown;
G, judge whether test result is qualified, and result of determination is shown.
6. RF IC test macro control method according to claim 5 is characterized in that:
Steps A comprises to be selected the bus operation mode of test macro; Reception and emission mode to RF IC to be measured are selected to be provided with; The circuit gain of RF IC to be measured is selected control; The on-off circuit of RF IC to be measured is carried out the selection of gating passage.
7. RF IC test macro control method according to claim 6 is characterized in that:
For the RF IC to be measured that register is arranged, also comprise in the steps A register is carried out read and/or write.
8. according to claim 5,6 or 7 described RF IC test macro control methods, it is characterized in that:
Single-chip microcomputer is waited for and is received data among the step B, after single-chip microcomputer is received data, data is handled, and is pressed the instruction that self-defined communications protocol is carried out host computer, and concrete steps are:
B1, single-chip microcomputer are waited for and are received data;
After B2, single-chip microcomputer are received data, judge whether the data of receiving are data frame heads; If the data frame head gets into step B3; If not the data frame head returns step B1;
B3, Data Receiving and storage;
Whether the data that B4, judgement are received are data postambles; If the data postamble gets into step B5; If not the data postamble returns step B3;
B5, data operation module are recovered the non-frame head in the packet that receives and the data of postamble;
B6, MCU function initialization module judge whether protocols having is instructed in the recovered data, if protocols having instruction in the recovered data gets into step B7; If no-protocol instruction in the data, whether identify after the protocols having initialization in the judgment data, if identify after the no-protocol initialization in the data, return step B1; If identify after the protocols having initialization in the data, get into step B8;
B7, MCU function initialization module carry out initialization to corresponding I/O mouth, and initialized I/O mouth is identified, and return step B1;
B8, circuit setting operation module judge whether function command is arranged in the recovered data, if no function sign in the data is returned step B1; If in the data Function Identification is arranged; Then judge whether once more to identify after the protocols having initialization; If not then return step B1,, then call corresponding function setting function if identify after the protocols having initialization; Utilize initialized single-chip processor i/o mouth that RF IC to be measured is carried out the control of corresponding mode of operation, return step B1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110443477.3A CN102495353B (en) | 2011-12-27 | 2011-12-27 | Radio frequency integrated circuit test system and control method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110443477.3A CN102495353B (en) | 2011-12-27 | 2011-12-27 | Radio frequency integrated circuit test system and control method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102495353A true CN102495353A (en) | 2012-06-13 |
| CN102495353B CN102495353B (en) | 2014-04-09 |
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| CN103064011A (en) * | 2012-12-27 | 2013-04-24 | 广州中大微电子有限公司 | Radio frequency identification devices (RFID) reader chip process testing system and method |
| CN103852714A (en) * | 2012-11-30 | 2014-06-11 | 联发科技股份有限公司 | Integrated circuit, test equipment and RF testing system |
| CN104503898A (en) * | 2014-11-24 | 2015-04-08 | 四川长虹电器股份有限公司 | Method and system for checking embedded software debugging parameter in real time |
| CN104977527A (en) * | 2015-07-29 | 2015-10-14 | 江苏杰进微电子科技有限公司 | Integrated circuit IC test device and test method thereof |
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| CN108075840A (en) * | 2017-11-16 | 2018-05-25 | 上海微波技术研究所（中国电子科技集团公司第五十研究所） | A kind of wireless communication terminal RF power parameter automatic calibration system |
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| CN109781179A (en) * | 2019-01-25 | 2019-05-21 | 云南保利天同仪器有限公司 | Multi-channel multi-parameter sensor detecting system and its detection method |
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| US10320494B2 (en) | 2011-06-13 | 2019-06-11 | Mediatek Inc. | RF testing system using integrated circuit |
| US9525500B2 (en) | 2011-06-13 | 2016-12-20 | Mediatek Inc. | Low-cost test/calibration system and calibrated device for low-cost test/calibration system |
| US10110325B2 (en) | 2011-06-13 | 2018-10-23 | Mediatek Inc. | RF testing system |
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| CN103852714A (en) * | 2012-11-30 | 2014-06-11 | 联发科技股份有限公司 | Integrated circuit, test equipment and RF testing system |
| CN103852714B (en) * | 2012-11-30 | 2016-11-23 | 联发科技股份有限公司 | Integrated circuit, test equipment and radio frequency test system |
| CN103064011A (en) * | 2012-12-27 | 2013-04-24 | 广州中大微电子有限公司 | Radio frequency identification devices (RFID) reader chip process testing system and method |
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| CN104977527A (en) * | 2015-07-29 | 2015-10-14 | 江苏杰进微电子科技有限公司 | Integrated circuit IC test device and test method thereof |
| CN105353297B (en) * | 2015-12-02 | 2018-03-16 | 天津七六四通信导航技术有限公司 | Universal anti-interference digital processing board test platform and method of testing |
| CN105353297A (en) * | 2015-12-02 | 2016-02-24 | 天津七六四通信导航技术有限公司 | Universal anti-interference digital processing board test platform and test method |
| CN106443239A (en) * | 2016-08-31 | 2017-02-22 | 安徽赛福电子有限公司 | Intelligent microwave device detecting apparatus |
| CN108169656A (en) * | 2016-12-07 | 2018-06-15 | 镇江常畅光伏电子有限公司 | A kind of RF IC test equipment |
| CN106841980A (en) * | 2017-01-10 | 2017-06-13 | 芯原微电子(上海)有限公司 | A kind of Bluetooth integrated circuit test system and method for testing |
| CN108075840A (en) * | 2017-11-16 | 2018-05-25 | 上海微波技术研究所（中国电子科技集团公司第五十研究所） | A kind of wireless communication terminal RF power parameter automatic calibration system |
| CN108075840B (en) * | 2017-11-16 | 2021-02-09 | 上海微波技术研究所（中国电子科技集团公司第五十研究所） | Automatic calibration system for radio frequency power parameters of wireless communication terminal |
| CN109781179A (en) * | 2019-01-25 | 2019-05-21 | 云南保利天同仪器有限公司 | Multi-channel multi-parameter sensor detecting system and its detection method |
| CN109781179B (en) * | 2019-01-25 | 2022-05-17 | 海底鹰深海科技股份有限公司 | Multi-channel multi-parameter sensor detection system and detection method thereof |
| CN109709474A (en) * | 2019-02-28 | 2019-05-03 | 西安太乙电子有限公司 | A kind of radio frequency mixed signal integrated circuit test system and test method |
| CN110806710A (en) * | 2019-11-20 | 2020-02-18 | 瑞玛思特(北京)科技有限公司 | Measurement and control system and method based on fusion of multiple sensors |
| CN110806710B (en) * | 2019-11-20 | 2021-07-20 | 瑞玛思特(北京)科技有限公司 | Measurement and control system and method based on fusion of multiple sensors |
| CN111521924A (en) * | 2020-04-29 | 2020-08-11 | 西安博瑞集信电子科技有限公司 | Automatic testing method for small portable detachable chip product |
| CN113746527A (en) * | 2021-08-04 | 2021-12-03 | 上海卫星工程研究所 | Intensive satellite multi-channel complex radio frequency link conditioning control device and method |
| CN114088991A (en) * | 2021-11-08 | 2022-02-25 | 广东乐心医疗电子股份有限公司 | Circuit board testing method, device and system |
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