CN106443239A - Intelligent microwave device detecting apparatus - Google Patents
Intelligent microwave device detecting apparatus Download PDFInfo
- Publication number
- CN106443239A CN106443239A CN201610781342.0A CN201610781342A CN106443239A CN 106443239 A CN106443239 A CN 106443239A CN 201610781342 A CN201610781342 A CN 201610781342A CN 106443239 A CN106443239 A CN 106443239A
- Authority
- CN
- China
- Prior art keywords
- wire
- interface
- microwave device
- spectrum detector
- chip microcomputer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses an intelligent microwave device detecting apparatus. A check box of a system is provided with a serial communication interface, a power supply interface, a frequency synthesizer interface and a data interface. A local oscillator control plug wire is connected with the serial communication interface through a wire. A power supply current is connected with the power supply interface through a wire. A microwave device is connected with the frequency synthesizer interface through a wire. A single-chip microcomputer is connected with the data interfaces of the check box and a spectrum detector through a wire, respectively. A bid evaluation shunting plug wire and the spectrum detector are connected with the microwave device through a wire. An NC operator is directly connected with the single-chip microcomputer. The invention solves the intelligent control problem of the off-line detection of the microwave device of the equipment, avoids the potential damage to the equipment caused by the frequent disassembly during the device detection, and saves the manpower and material resources.
Description
Technical field
The present invention relates to instrument detection field, specifically refer to a kind of intelligent microwave device testing apparatus.
Background technology
As the elementary cell of electronic equipment, radio frequency and microwave device must assure that the reliable of its performance.So, unit's device
The examination of part is essential.The accuracy of test result is to judge whether qualified standard, includes using reasonably survey among these
Metering method, proper use of measurement equipment, the understanding respective parameter characteristic of components and parts simultaneously accurately judge its performance etc..Owing to position is divided
Dissipate airtight, dismounting difficulty, bring very big inconvenience to the spare part detection of the microwave device of some large-scale instrument and equipment, and frequently tear open
Unload, also damage can be caused to the electric property of the microwave device of precision instrument and system.
Content of the invention
The technical problem to be solved is to provide a kind of intelligent microwave device testing apparatus.
For solving above-mentioned technical problem, a kind of intelligent microwave device testing apparatus of the present invention, including local oscillator control plug wire,
Source current, inspection box, assessment of bids branch plug wire, spectrum detector, microwave device, single-chip microcomputer, numerical control operating device, described inspection box
On be provided with serial communication interface, power interface, frequency combine interface and data-interface, described local oscillator control plug wire passes through wire and string
Port communications interface is connected, and described source current is connected with power interface by wire, described microwave device by wire with
Frequency is combined interface and is connected, and described single-chip microcomputer is connected with inspection box, the data-interface of spectrum detector respectively by wire, described
Assessment of bids branch plug wire is connected with microwave device by wire with spectrum detector.
Described numerical control operating device is directly connected with single-chip microcomputer, and on the one hand numerical control operating device can be by digitized program control
Single-chip microcomputer processed, then single-chip microcomputer sends manipulation data and enters and check box and spectrum detector, and on the other hand single-chip microcomputer also can be by
Checking that the data that box and spectrum detector test return send to carry out showing or storing to numerical control operating device, intelligence degree is very
High.
Described spectrum detector, by detecting the radiofrequency signal in microwave device, understands its internal structure and fault
Reason.
Compared with prior art, beneficial effects of the present invention is：
A kind of intelligent microwave device testing apparatus of the present invention, it solves the Based Intelligent Control of detection under the line of equipment microwave device
Problem, it is to avoid cause potential device damage hidden danger because of frequent dismounting during units test, save the manpower and materials of detection.
Brief description
Fig. 1 is the structural representation of the present invention a kind of intelligent microwave device testing apparatus；
Fig. 2 is the structural representation of the inspection box of the present invention a kind of intelligent microwave device testing apparatus.
In figure, 1-local oscillator controls plug wire, 2-source current, and 3-checks box, 4-assessment of bids branch plug wire, 5-spectrum detector,
6-microwave device, 7-single-chip microcomputer, 8-numerical control operating device, 31-serial communication interface, 32-power interface, 33-frequency combines interface, 34-
Data-interface.
Detailed description of the invention
The present invention is further detailed explanation with detailed description of the invention below in conjunction with the accompanying drawings.
As it is shown in figure 1, a kind of intelligent microwave device testing apparatus, including the 2nd, local oscillator control plug wire the 1st, source current checks
Box the 3rd, assessment of bids branch plug wire the 4th, spectrum detector the 5th, microwave device the 6th, single-chip microcomputer the 7th, numerical control operating device 8, described inspection box 3 is arranged
Having serial communication interface the 31st, power interface the 32nd, frequency to combine interface 33 and data-interface 34, described local oscillator control plug wire 1 passes through wire
Being connected with serial communication interface 31, described source current 2 is connected with power interface 32 by wire, described microwave device 6
Combining interface 33 by wire and frequency to be connected, described single-chip microcomputer 7 is by the wire data with inspection box the 3rd, spectrum detector 5 respectively
Interface 34 is connected, and described assessment of bids branch plug wire 4 is connected with microwave device 6 by wire with spectrum detector 5.
Described numerical control operating device 8 is direct to be connected with single-chip microcomputer 7, and on the one hand numerical control operating device 8 can be by digitized journey
Sequence control single chip computer 7, then single-chip microcomputer 7 sends manipulation data and enters inspection box 3 and spectrum detector 5, on the other hand single-chip microcomputer 7
The data transmission that inspection box 3 and spectrum detector 5 also can be tested return carries out showing or storing to numerical control operating device 8,
Intelligence degree is very high.
Described spectrum detector 5, by detecting the radiofrequency signal in microwave device 6, understands its internal structure and event
Barrier reason.
Claims (2)
1. an intelligent microwave device testing apparatus, including local oscillator control plug wire（1）, source current（2）, check box（3）, comment
Mark branch plug wire（4）, spectrum detector（5）, it is characterised in that：Described local oscillator controls plug wire（1）By wire and serial communication
Interface（31）It is connected, described source current（2）By wire and power interface（32）It is connected, described microwave device（6）Logical
Cross wire and combine interface with frequency（33）It is connected, described single-chip microcomputer（7）By wire respectively with check box（3）, spectrum detector（5）
Data-interface（34）It is connected, described assessment of bids branch plug wire（4）And spectrum detector（5）By wire and microwave device（6）
It is connected, described numerical control operating device（8）Directly and single-chip microcomputer（7）It is connected.
2. intelligent microwave device testing apparatus according to claim 1, it is characterised in that：Described inspection box（3）On set
There is serial communication interface（31）, power interface（32）, frequency combine interface（33）, data-interface（34）.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610781342.0A CN106443239A (en) | 2016-08-31 | 2016-08-31 | Intelligent microwave device detecting apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610781342.0A CN106443239A (en) | 2016-08-31 | 2016-08-31 | Intelligent microwave device detecting apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106443239A true CN106443239A (en) | 2017-02-22 |
Family
ID=58091908
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610781342.0A Pending CN106443239A (en) | 2016-08-31 | 2016-08-31 | Intelligent microwave device detecting apparatus |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106443239A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070247179A1 (en) * | 2006-04-25 | 2007-10-25 | M/A Com, Inc. | Surface mount component RF test fixture |
| TWM340456U (en) * | 2008-02-20 | 2008-09-11 | Microelectronics Tech Inc | Microwave device testing apparatus and adjustable mechanism thereof |
| CN201196681Y (en) * | 2008-04-03 | 2009-02-18 | 北京航空航天大学 | Bidirectional ranging and time comparison processing terminal |
| CN102495353A (en) * | 2011-12-27 | 2012-06-13 | 重庆西南集成电路设计有限责任公司 | Radio frequency integrated circuit test system and control method thereof |
| CN202522639U (en) * | 2012-02-10 | 2012-11-07 | 中国人民解放军63680部队 | Detection device for high frequency microwave components |
| CN205450151U (en) * | 2016-03-18 | 2016-08-10 | 成都纺织高等专科学校 | A precision test frock for extra small microwave device capability test |
-
2016
- 2016-08-31 CN CN201610781342.0A patent/CN106443239A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070247179A1 (en) * | 2006-04-25 | 2007-10-25 | M/A Com, Inc. | Surface mount component RF test fixture |
| TWM340456U (en) * | 2008-02-20 | 2008-09-11 | Microelectronics Tech Inc | Microwave device testing apparatus and adjustable mechanism thereof |
| CN201196681Y (en) * | 2008-04-03 | 2009-02-18 | 北京航空航天大学 | Bidirectional ranging and time comparison processing terminal |
| CN102495353A (en) * | 2011-12-27 | 2012-06-13 | 重庆西南集成电路设计有限责任公司 | Radio frequency integrated circuit test system and control method thereof |
| CN202522639U (en) * | 2012-02-10 | 2012-11-07 | 中国人民解放军63680部队 | Detection device for high frequency microwave components |
| CN205450151U (en) * | 2016-03-18 | 2016-08-10 | 成都纺织高等专科学校 | A precision test frock for extra small microwave device capability test |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170222 |