CN102402031A - 测试系统 - Google Patents
测试系统 Download PDFInfo
- Publication number
- CN102402031A CN102402031A CN2011104182471A CN201110418247A CN102402031A CN 102402031 A CN102402031 A CN 102402031A CN 2011104182471 A CN2011104182471 A CN 2011104182471A CN 201110418247 A CN201110418247 A CN 201110418247A CN 102402031 A CN102402031 A CN 102402031A
- Authority
- CN
- China
- Prior art keywords
- electrode
- thin film
- film transistor
- detection welding
- tft
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07385—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using switching of signals between probe tips and test bed, i.e. the standard contact matrix which in its turn connects to the tester
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Liquid Crystal (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Thin Film Transistor (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
Claims (8)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201110418247.1A CN102402031B (zh) | 2011-12-14 | 2011-12-14 | 测试系统 |
US13/381,071 US9293073B2 (en) | 2011-12-14 | 2011-12-16 | Testing system |
PCT/CN2011/084100 WO2013086729A1 (zh) | 2011-12-14 | 2011-12-16 | 测试系统 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201110418247.1A CN102402031B (zh) | 2011-12-14 | 2011-12-14 | 测试系统 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102402031A true CN102402031A (zh) | 2012-04-04 |
CN102402031B CN102402031B (zh) | 2014-01-22 |
Family
ID=45884398
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201110418247.1A Active CN102402031B (zh) | 2011-12-14 | 2011-12-14 | 测试系统 |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN102402031B (zh) |
WO (1) | WO2013086729A1 (zh) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104656969A (zh) * | 2013-11-19 | 2015-05-27 | 恒颢科技股份有限公司 | 触控基板 |
CN105609023A (zh) * | 2015-12-31 | 2016-05-25 | 京东方科技集团股份有限公司 | 一种测试元件组、阵列基板、检测设备及检测方法 |
CN106154095A (zh) * | 2015-03-31 | 2016-11-23 | 上海和辉光电有限公司 | 接触式ltps的检测方法以及用于该方法的焊盘结构 |
CN106405965A (zh) * | 2016-10-26 | 2017-02-15 | 京东方科技集团股份有限公司 | 阵列基板和阵列基板的测试方法、显示装置 |
CN109166507A (zh) * | 2018-11-01 | 2019-01-08 | 京东方科技集团股份有限公司 | 测试元件组、电学性能测试方法、阵列基板、显示装置 |
CN112540198A (zh) * | 2020-05-29 | 2021-03-23 | 友达光电股份有限公司 | 测试电极组及测试系统 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080048709A1 (en) * | 2006-07-28 | 2008-02-28 | Hong Woo Lee | Module and method for detecting defect of thin film transistor substrate |
CN102109688A (zh) * | 2009-12-29 | 2011-06-29 | 上海天马微电子有限公司 | 液晶显示面板、阵列基板及驱动线线缺陷检测方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR0182184B1 (en) * | 1996-04-24 | 1999-04-15 | Samsung Electronics Co Ltd | Disconnection/short test apparatus and its method of signal line using metrix |
CN100390551C (zh) * | 2003-09-27 | 2008-05-28 | 统宝光电股份有限公司 | 平面显示器的测试装置及其操作方法 |
TWI333094B (en) * | 2005-02-25 | 2010-11-11 | Au Optronics Corp | System and method for display testing |
KR101129618B1 (ko) * | 2005-07-19 | 2012-03-27 | 삼성전자주식회사 | 액정 표시 패널 및 이의 검사 방법과 이의 제조방법 |
CN101303462A (zh) * | 2008-07-04 | 2008-11-12 | 友达光电股份有限公司 | 液晶显示面板的检测电路与方法 |
CN100585854C (zh) * | 2008-09-12 | 2010-01-27 | 友达光电股份有限公司 | 显示面板及其测试系统 |
CN101572045B (zh) * | 2009-06-01 | 2011-01-05 | 深圳华映显示科技有限公司 | 一种平面显示器及其测试方法 |
-
2011
- 2011-12-14 CN CN201110418247.1A patent/CN102402031B/zh active Active
- 2011-12-16 WO PCT/CN2011/084100 patent/WO2013086729A1/zh active Application Filing
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080048709A1 (en) * | 2006-07-28 | 2008-02-28 | Hong Woo Lee | Module and method for detecting defect of thin film transistor substrate |
CN102109688A (zh) * | 2009-12-29 | 2011-06-29 | 上海天马微电子有限公司 | 液晶显示面板、阵列基板及驱动线线缺陷检测方法 |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104656969A (zh) * | 2013-11-19 | 2015-05-27 | 恒颢科技股份有限公司 | 触控基板 |
CN106154095A (zh) * | 2015-03-31 | 2016-11-23 | 上海和辉光电有限公司 | 接触式ltps的检测方法以及用于该方法的焊盘结构 |
CN105609023A (zh) * | 2015-12-31 | 2016-05-25 | 京东方科技集团股份有限公司 | 一种测试元件组、阵列基板、检测设备及检测方法 |
CN106405965A (zh) * | 2016-10-26 | 2017-02-15 | 京东方科技集团股份有限公司 | 阵列基板和阵列基板的测试方法、显示装置 |
CN109166507A (zh) * | 2018-11-01 | 2019-01-08 | 京东方科技集团股份有限公司 | 测试元件组、电学性能测试方法、阵列基板、显示装置 |
CN112540198A (zh) * | 2020-05-29 | 2021-03-23 | 友达光电股份有限公司 | 测试电极组及测试系统 |
TWI747303B (zh) * | 2020-05-29 | 2021-11-21 | 友達光電股份有限公司 | 測試電極組及測試系統 |
CN112540198B (zh) * | 2020-05-29 | 2023-01-20 | 友达光电股份有限公司 | 测试电极组及测试系统 |
Also Published As
Publication number | Publication date |
---|---|
CN102402031B (zh) | 2014-01-22 |
WO2013086729A1 (zh) | 2013-06-20 |
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C06 | Publication | ||
PB01 | Publication | ||
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: Test system for PHS device transmitting and receiving call Effective date of registration: 20190426 Granted publication date: 20140122 Pledgee: Bank of Beijing Limited by Share Ltd Shenzhen branch Pledgor: Shenzhen Huaxing Optoelectronic Technology Co., Ltd. Registration number: 2019440020032 |
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PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20201016 Granted publication date: 20140122 Pledgee: Bank of Beijing Limited by Share Ltd. Shenzhen branch Pledgor: Shenzhen China Star Optoelectronics Technology Co.,Ltd. Registration number: 2019440020032 |
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PC01 | Cancellation of the registration of the contract for pledge of patent right |