CN102323043A - Vertical testing scheme of light emitting diode - Google Patents

Vertical testing scheme of light emitting diode Download PDF

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Publication number
CN102323043A
CN102323043A CN201110274042A CN201110274042A CN102323043A CN 102323043 A CN102323043 A CN 102323043A CN 201110274042 A CN201110274042 A CN 201110274042A CN 201110274042 A CN201110274042 A CN 201110274042A CN 102323043 A CN102323043 A CN 102323043A
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China
Prior art keywords
light emitting
emitting diode
suction nozzle
testing
vertical
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CN201110274042A
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Chinese (zh)
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CN102323043B (en
Inventor
刘骏
卓维煌
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SHENZHEN HI-TEST SEMICONDUCTOR EQUIPMENT Co Ltd
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SHENZHEN HI-TEST SEMICONDUCTOR EQUIPMENT Co Ltd
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Priority to CN2011102740420A priority Critical patent/CN102323043B/en
Publication of CN102323043A publication Critical patent/CN102323043A/en
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Abstract

The invention relates to a vertical testing scheme of a light emitting diode, which comprises the steps of: firstly, screening the light emitting diode through a vertical vibration disk to ensure that the light emitting surface of the light emitting diode upwards enters the most front end of the vibration disk; secondly, sucking the vertical light emitting diode from the most front end of the vibration disk through a feeding device, placing in a suction nozzle of a rotary working table, sucking and attaching the light emitting diode on the suction nozzle from the lateral side by the suction nozzle in vacuum; and finally, clamping a pin of the light emitting diode from the lateral surface by a horizontally clamped probe, electrifying, and detecting. The testing mode is consistent with the testing mode of other types of light emitting diodes, thus a testing device of the light emitting diode with a lateral light emitting is better exchanged with testing devices of other types of light emitting diodes.

Description

The vertical testing scheme of light emitting diode
Technical field
The present invention relates to a kind of LED test scheme, further relate to a kind of through changing the testing scheme of light emitting diode placement location.
Background technology
Several aspects important in the optical parametric of LED are exactly: luminous flux, luminescence efficiency, luminous intensity, light distribution, wavelength.Luminescence efficiency has characterized the energy conservation characteristic of light source, and this is an important indicator weighing modern light source performance.Therefore,, must test by diode before dispatching from the factory diode.
The testing scheme of existing market upside light emitting-type patch light-emitting diode all is by suction nozzle light emitting diode to be adsorbed on the disk; Then disk integral body is pressed down; The pin of light emitting diode is contacted with following probe assembly; Thereby make the light emitting diode electrified light emitting, light emitting diode is tested with the pick-up unit that install the side.
The shortcoming of existing scheme is, the patch light-emitting diode that this kind testing scheme can only the offside light emitting-type is effective, can't test for the light emitting diode that accounts for the very big top emission type of the market share.
Summary of the invention
In view of above content, be necessary to provide a kind of compatibility test scheme of testing side and top light emitting diode simultaneously.
The present invention provides a kind of led of side view type vertical testing scheme, and this scheme comprises:
At first: through upright removing from mould vibrating disc light emitting diode is screened, make side light-emitting diode (led) light-emitting area found the entering vibrating disc up foremost;
The side light-emitting diode (led) that will stand through feeding device is then put in the suction nozzle of rotation work dish from vibrating disc sucking-off foremost, and vacuum is adsorbed light emitting diode from the side by suction nozzle and is close on the suction nozzle;
Through the probe of level clamping, clamp the pin of side light-emitting diode (led) from the side at last, energising, detection.
The present invention puts into suction nozzle through side light emitting-type patch light-emitting diode is being stood; Make side light emitting-type patch light-emitting diode light emission direction up; Thereby well make it consistent, thereby the interchangeability of checkout equipment of checkout equipment and the top emission type light emitting diode of side light-emitting diode (led) is strengthened greatly with the test mode of top emission type light emitting diode.
Compared with prior art, the invention has the advantages that:
Because this kind test mode is consistent with the test mode of other types light emitting diode, so can make side light emitting-type testing apparatus and the fine exchange of other types LED test equipment.
Combine embodiment that the present invention is done further description with reference to the accompanying drawings.
Description of drawings
Fig. 1 is the process flow diagram of the vertical testing scheme of light emitting diode of the present invention.
Embodiment
See also Fig. 1, the vertical testing scheme of a kind of light emitting diode of preferred embodiment provided by the present invention, this scheme comprises:
At first: through side light emitting-type vibrating disc light emitting diode is screened, make side light-emitting diode (led) light-emitting area found the entering vibrating disc up foremost;
The side light-emitting diode (led) that will stand through feeding device is then put in the suction nozzle of rotation work dish from vibrating disc sucking-off foremost, and vacuum is adsorbed the side light-emitting diode (led) from the side by suction nozzle and is close on the suction nozzle;
Through the probe of level clamping, clamp the pin of side light-emitting diode (led) from the side at last, energising, detection.
The present invention is primarily aimed at the improvement that the LED test scheme is carried out; The above is merely preferred embodiment of the present invention; Non-so promptly limit to claim of the present invention; So the simple and easy variation and the equivalent transformation of doing with instructions of the present invention and graphic content such as all should be contained in the claim of the present invention.

Claims (1)

1. vertical testing scheme of light emitting diode, this scheme comprises:
At first: through upright removing from mould vibrating disc light emitting diode is screened, make lumination of light emitting diode face up upright entering vibrating disc foremost;
The light emitting diode that will stand through feeding device is then put in the suction nozzle of rotation work dish from vibrating disc sucking-off foremost, and vacuum is adsorbed light emitting diode from the side by suction nozzle and is close on the suction nozzle;
Through the probe of level clamping, clamp the pin of light emitting diode from the side at last, energising, detection.
CN2011102740420A 2011-09-15 2011-09-15 Vertical testing scheme of light emitting diode Active CN102323043B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011102740420A CN102323043B (en) 2011-09-15 2011-09-15 Vertical testing scheme of light emitting diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2011102740420A CN102323043B (en) 2011-09-15 2011-09-15 Vertical testing scheme of light emitting diode

Publications (2)

Publication Number Publication Date
CN102323043A true CN102323043A (en) 2012-01-18
CN102323043B CN102323043B (en) 2013-08-14

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102914424A (en) * 2012-11-14 2013-02-06 深圳市华腾半导体设备有限公司 Bottom testing method
CN103245901A (en) * 2013-04-26 2013-08-14 东莞市福地电子材料有限公司 LED flip-chip testing machine and testing method
CN103983350A (en) * 2014-05-13 2014-08-13 保定维特瑞交通设施工程有限责任公司 Device for testing luminous intensity changes of parallel optical axis of traffic display unit
CN104635180A (en) * 2015-02-05 2015-05-20 深圳市华腾半导体设备有限公司 Vacuum suction test method for electronic component
CN110189669A (en) * 2019-06-12 2019-08-30 深圳市华星光电半导体显示技术有限公司 A kind of lighting test jig and test method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI236530B (en) * 2004-07-29 2005-07-21 Chroma Ate Inc Automatic optical characteristics testing apparatus and method for light emitting device
CN201713110U (en) * 2010-05-27 2011-01-19 广州敏瑞汽车零部件有限公司 Rivet conveyer
JP2011033508A (en) * 2009-08-03 2011-02-17 Showa Denko Kk Device and method of measuring characteristic of measured object, program and light-emitting body
CN201886118U (en) * 2010-06-01 2011-06-29 展晶科技(深圳)有限公司 Light-emitting diode (LED) test jig
CN102118960A (en) * 2010-12-27 2011-07-06 东莞市新泽谷机械有限公司 Irregular component plug-in machine

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI236530B (en) * 2004-07-29 2005-07-21 Chroma Ate Inc Automatic optical characteristics testing apparatus and method for light emitting device
JP2011033508A (en) * 2009-08-03 2011-02-17 Showa Denko Kk Device and method of measuring characteristic of measured object, program and light-emitting body
CN201713110U (en) * 2010-05-27 2011-01-19 广州敏瑞汽车零部件有限公司 Rivet conveyer
CN201886118U (en) * 2010-06-01 2011-06-29 展晶科技(深圳)有限公司 Light-emitting diode (LED) test jig
CN102118960A (en) * 2010-12-27 2011-07-06 东莞市新泽谷机械有限公司 Irregular component plug-in machine

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102914424A (en) * 2012-11-14 2013-02-06 深圳市华腾半导体设备有限公司 Bottom testing method
CN103245901A (en) * 2013-04-26 2013-08-14 东莞市福地电子材料有限公司 LED flip-chip testing machine and testing method
CN103983350A (en) * 2014-05-13 2014-08-13 保定维特瑞交通设施工程有限责任公司 Device for testing luminous intensity changes of parallel optical axis of traffic display unit
CN103983350B (en) * 2014-05-13 2016-06-01 保定维特瑞交通设施工程有限责任公司 The device of test traffic display unit parallel optical axis luminous intensity variations
CN104635180A (en) * 2015-02-05 2015-05-20 深圳市华腾半导体设备有限公司 Vacuum suction test method for electronic component
CN110189669A (en) * 2019-06-12 2019-08-30 深圳市华星光电半导体显示技术有限公司 A kind of lighting test jig and test method
CN110189669B (en) * 2019-06-12 2022-07-12 深圳市华星光电半导体显示技术有限公司 Lighting test fixture and test method

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