CN104635180A - Vacuum suction test method for electronic component - Google Patents
Vacuum suction test method for electronic component Download PDFInfo
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- CN104635180A CN104635180A CN201510060848.8A CN201510060848A CN104635180A CN 104635180 A CN104635180 A CN 104635180A CN 201510060848 A CN201510060848 A CN 201510060848A CN 104635180 A CN104635180 A CN 104635180A
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- vacuum
- light emitting
- electronic component
- test method
- emitting element
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Abstract
The invention relates to a vacuum suction test method for an electronic component. The vacuum suction test method for the electronic component is characterized in that the method comprises the following steps: 1) a light emitting element is screened by a vibration disk and enters a direct vibration rail in a pin downward way; 2) the light emitting element is transferred into a trough on a rotary table in vacuum and vacuum breaking ways; 3) materials are adsorbed on a PCB (printed circuit board) or a similar structure by vacuum, the pin of the light emitting element is contacted, the light emitting element is electrified to light, and meanwhile, a detection element detects the photoelectricity characteristics of the light emitting diode from the top. The test method can be suitable for the manufacture technology of the electronic component and has a wider test range.
Description
Technical field
The present invention relates to a kind of electronic devices and components vacuum and inhale method of testing, relate to a kind of method of testing of electronic devices and components further.
Background technology
Generally speaking, the optical parametric of electronic devices and components mainly: colour temperature, wavelength, chromaticity coordinate, luminous flux, light intensity etc.Optical parametric is the important indicator of existing band light source performance.Therefore, electronic devices and components all will be tested after formed product.
The method of testing of electronic devices and components conventional is at present that side test or probe are tested from top, bottom surface, feeding device is had to be put into vacuum slot from vibrating disk front end by mechanical arm by electronic devices and components, enter by vibrating disk screening luminescence is supine the track that directly shakes by horizontal-clamping probe light-emitting component, the pin or the probe that clamp electronic devices and components are from the side tested from top, bottom surface, and energising detects.Due to mistake light-emitting component is manufacture craft, the pin more and more less side test of material or bottom test have been difficult to.Vacuum is inhaled and is more prone to realize than the mode of lateral leads or bottom test.Which limits traditional side probe clamping and light test or bottom test.
Summary of the invention
In view of above content, be necessary to provide a kind of method of testing being suitable for the manufacture craft of light-emitting component, the invention provides a kind of electronic devices and components vacuum and inhale method of testing, wherein method step comprises:
(1) light-emitting component enters by vibrating disk screening luminescence is supine the track that directly shakes;
(2) light-emitting component is by transferring to inside the draw-in groove on rotating disk by the mode of vacuum and vacuum breaker again;
(3) by vacuum by materials adsorption on pcb board, the pin of touch luminous element, energising makes it luminous, simultaneously detecting element from its photoelectric characteristic is detected.
Be compared with the prior art, the invention has the advantages that: compared to traditional method of testing, the method for testing that vacuum is inhaled relatively is applicable to the manufacture craft of existing electronic devices and components, has wider application.
Accompanying drawing explanation
Fig. 1 is the process flow diagram of the method for testing that a kind of electronic devices and components vacuum of the present invention is inhaled.
Embodiment
The invention will be further described in conjunction with the embodiments with reference to the accompanying drawings.Refer to Fig. 1, the invention provides the method for testing that a kind of electronic devices and components vacuum is inhaled, the method step comprises:
(1) light-emitting component enters by vibrating disk screening luminescence is supine the track that directly shakes; ;
(2) light-emitting component is by transferring to inside the draw-in groove on rotating disk by the mode of vacuum and vacuum breaker again;
(3) by vacuum by materials adsorption on pcb board, the pin of touch luminous element, energising makes it luminous, simultaneously detecting element from its photoelectric characteristic is detected.
The improvement that the present invention carries out mainly for electronic devices and components method of testing, the foregoing is only present pre-ferred embodiments, non-ly therefore namely limit to the scope of the claims of the present invention, therefore the simple and easy change of such as doing by instructions of the present invention and graphic content and equivalent transformation, all should be contained in the scope of the claims of the present invention.
Claims (1)
1. the vacuum of kind of electronic devices and components inhales method of testing, it is characterized in that: described method comprises the steps:
Light-emitting component screens pin by vibrating disk and enters the track that directly shakes downwards;
(2) transfer to inside the draw-in groove on rotating disk by the mode of vacuum and vacuum breaker again;
(3) by vacuum by materials adsorption on pcb board or this structure similar, the pin of touch luminous element, energising makes it luminous, simultaneously detecting element from its photoelectric characteristic is detected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510060848.8A CN104635180A (en) | 2015-02-05 | 2015-02-05 | Vacuum suction test method for electronic component |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510060848.8A CN104635180A (en) | 2015-02-05 | 2015-02-05 | Vacuum suction test method for electronic component |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104635180A true CN104635180A (en) | 2015-05-20 |
Family
ID=53214141
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510060848.8A Pending CN104635180A (en) | 2015-02-05 | 2015-02-05 | Vacuum suction test method for electronic component |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104635180A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113125994A (en) * | 2021-05-21 | 2021-07-16 | 湖北剑威电气科技有限公司 | Automatic bulb detection machine |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102323043A (en) * | 2011-09-15 | 2012-01-18 | 深圳市华腾半导体设备有限公司 | Vertical testing scheme of light emitting diode |
| CN102435419A (en) * | 2011-09-15 | 2012-05-02 | 深圳市华腾半导体设备有限公司 | Upward pressing type light-emitting diode (LED) testing scheme |
| CN102501052A (en) * | 2011-11-11 | 2012-06-20 | 苏州晶雷光电照明科技有限公司 | LED (light-emitting diode) daylight lamp assembling equipment |
| CN102914424A (en) * | 2012-11-14 | 2013-02-06 | 深圳市华腾半导体设备有限公司 | Bottom testing method |
| CN103296147A (en) * | 2012-02-23 | 2013-09-11 | 鸿富锦精密工业（深圳）有限公司 | Mounter with LED optical detection function and mounting method thereof |
| US20130241562A1 (en) * | 2012-03-14 | 2013-09-19 | Guang hai Jin | Array test device, method for testing an organic light emitting display device, and method for manufacturing the organic light emitting display device |
-
2015
- 2015-02-05 CN CN201510060848.8A patent/CN104635180A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102323043A (en) * | 2011-09-15 | 2012-01-18 | 深圳市华腾半导体设备有限公司 | Vertical testing scheme of light emitting diode |
| CN102435419A (en) * | 2011-09-15 | 2012-05-02 | 深圳市华腾半导体设备有限公司 | Upward pressing type light-emitting diode (LED) testing scheme |
| CN102501052A (en) * | 2011-11-11 | 2012-06-20 | 苏州晶雷光电照明科技有限公司 | LED (light-emitting diode) daylight lamp assembling equipment |
| CN103296147A (en) * | 2012-02-23 | 2013-09-11 | 鸿富锦精密工业（深圳）有限公司 | Mounter with LED optical detection function and mounting method thereof |
| US20130241562A1 (en) * | 2012-03-14 | 2013-09-19 | Guang hai Jin | Array test device, method for testing an organic light emitting display device, and method for manufacturing the organic light emitting display device |
| CN102914424A (en) * | 2012-11-14 | 2013-02-06 | 深圳市华腾半导体设备有限公司 | Bottom testing method |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113125994A (en) * | 2021-05-21 | 2021-07-16 | 湖北剑威电气科技有限公司 | Automatic bulb detection machine |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20150520 |