CN102255654A - Light emission component testing tool and applied circuit thereof - Google Patents
Light emission component testing tool and applied circuit thereof Download PDFInfo
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- CN102255654A CN102255654A CN2011100892700A CN201110089270A CN102255654A CN 102255654 A CN102255654 A CN 102255654A CN 2011100892700 A CN2011100892700 A CN 2011100892700A CN 201110089270 A CN201110089270 A CN 201110089270A CN 102255654 A CN102255654 A CN 102255654A
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Abstract
The invention discloses a light emission component testing tool and an applied circuit thereof, which relate to the field of light communication, in particular to a tool for testing the performance of a light emission component. The invention aims to overcome the defects of the conventional light emission component testing technology and provide a complete and independent light emission component testing tool and an applied circuit thereof. Design key points of the invention are that: the light emission component testing tool mainly comprises a microprocessor unit, a radiofrequency signal input interface unit, a light emission component driving unit and the like, wherein the microprocessor unit is used for controlling the control over the entire testing work and acquiring testing parameters; the light emission component driving unit is used for providing modulating current and a biasing voltage signal necessary for work to a tested light emission component; and the light emission component testing tool, a data acquisition, analysis and storage unit, a signal generator and a testing instrument constitute a light emission component testing circuit. The light emission component testing tool is mainly used for testing and managing the working performance and parameters of the light emission component.
Description
Technical field
The present invention relates to optical communication field, especially a kind of frock that is used for test light emitting module performance.
Background technology
TO-CAN: the packing forms that photoelectric device is a kind of.
The 10G light emission component is to be applied in the core telecommunication switching network, is one of Primary Component of XFP, SFP+, and the effect of this assembly is to be electrical signal conversion light signal.The 10G light emission component is by TO-CAN, male part and be connected soft board three parts and constitute.The debugging light emission component makes its male part and TO-CAN reach mated condition preferably, and testing parameters such as its modulation, bias current and extinction ratio is requisite link in the production application of light emission component.Consider following 3 reasons:
1. when cooperating with TO-CAN, male part can produce strong light reflection when bad, when entering the resonant cavity of laser (laser is present in the male part) or can cause with emission that the eye pattern shake becomes during optical superposition, reverberation causes the eye pattern deterioration greatly, the error rate increases, Communications failure.
2. when laser is luminous, laser itself has certain impedance, connect soft board and will finish the connection of laser driver (laser driver is present in the light emission component) to laser as a bridge, simultaneously also to finish the function of impedance matching, if there is strong reflection of electrical signals also can influence eye pattern.
3. the quality of light eye pattern operating state (modulation, bias current), light emission component itself direct and light emission component reaches part correlations such as match circuit.
In the debugging light emission component process, what people were concerned about the most is the light eye pattern of light emission component.
Existing manufacturer all is the test report that relies on light emission component manufacturer to provide, can only on the product circuit pcb board that designs, utilize signal generator, tester directly to do the work of the extinction ratio of light emission component, luminous power, eye pattern test and debugging, not complete, the light emission component assessment test platform independently of a cover.Thereby existing light emission component debugging technique can not effectively manage light emission component, can not make assessment timely when variant, detect when changing the assessment test producer or the light emission component performance of same batch of production, and influence produced and debugged.Research and development and produce must spend a large amount of time and to mate new laser module again, and debugging efficiency is low.Lack collection simultaneously, can not propose recommendation on improvement to manufacturer to the assembly property data.Research and development department does not have the module testing platform, has strengthened the difficulty of research and development.
Summary of the invention
The objective of the invention is to overcome the deficiencies in the prior art, a kind of complete, independently light emission component test fixture and application circuit thereof are provided.
The technical solution used in the present invention is such: the light emission component test fixture comprises external signal interface unit, microprocessor unit, radiofrequency signal input interface unit, light emission component driver element, light emission component matching unit, test port and power supply unit;
Described power supply unit is used for to microprocessor unit and the power supply of light emission component driver element, and power supply unit also provides tested light emission component power supply by test port;
Microprocessor unit is used to gather the signal of the reflection luminous power size of tested light emission component output, signal according to the reflection luminous power size of tested light emission component output is adjusted biasing voltage signal and modulated current control signal size, and launches driver element output offset voltage signal and modulated current control signal to light;
Described light emission component driver element receives the differential radio frequency signal of outside input by the radiofrequency signal input interface unit, the radiofrequency signal that the light emission component driver element is used for receiving is converted to modulated current, modulated current control signal according to microprocessor unit output is adjusted the modulated current size, by the light emission component matching unit modulated current is transferred to test port again; The light emission component driver element also is used to accept the biasing voltage signal of microprocessor unit output, and biasing voltage signal is converted to bias current, and to test port output offset electric current, simultaneously to microprocessor unit output offset current monitoring signal;
Microprocessor unit and external signal interface unit have handshaking;
Described test port has modulated current output interface, bias current output interface, tested light emission component power supply interface and the signal receiving interface that reflects the luminous power size; Test port is used for described modulated current and described bias current are exported to tested light emission component, also be used for to the power supply of tested light emission component, and give microprocessor unit the signal feedback of the reflection luminous power size of tested light emission component output.
The supplementary technology scheme that the present invention adopts is such:
Preferably, a universal I/O port pin of microprocessor unit automatically shuts down signal input part with described light emission component driver element and is connected, and regularly turn-offs the bias current and the modulated current of described light emission component driver element output in order to the swinging of signal in the reflection luminous power size of tested light emission component output;
Microprocessor unit receives the bias current monitor signal of light emission component driver element output, and adjusts the biasing voltage signal size according to the bias current monitor signal, and is stable with the bias current of guaranteeing the output of light emission component driver element.
Preferably, described power supply unit comprises whole plate power supply and 3 the first separate power supply subelements, the second power supply subelement and the 3rd power supply subelements; The output voltage of described 3 power supply subelements is obtained by the justifying power distribution; The described first power supply subelement is used for powering to microprocessor unit; The described second power supply subelement is used for powering to the light emission component driver element; Described the 3rd power supply subelement is used for providing tested light emission component power supply to test port.
Preferably, microprocessor unit has voltage AD sampling end, and described voltage AD sampling end is gathered the 3rd power supply subelement output voltage.
Preferably, also comprise potential replacement cell, potential replacement cell has the voltage detecting end; Described voltage detecting end is connected with described whole plate power supply; Potential replacement cell is used to be implemented in detect exports the reset terminal of a control impuls to microprocessor unit when whole plate supply voltage descends.
Preferably, described external signal interface unit comprises usb interface unit and data communication unit; Described data communication unit has signal to be connected with microprocessor unit; The data communication unit is used to receive the signal and the 3rd power supply subelement output voltage values of the reflection luminous power size of the bias current monitor signal of microprocessor unit output, the output of tested light emission component, and realize that the communication protocol between usb signal and the microprocessor unit output signal transforms, and the signal of described microprocessor unit being exported by the usb signal interface unit is transferred to external equipment.
Preferably, described light emission component driver element has adjustable side, eye pattern crosspoint.
Preferably, described light emission component matching unit comprises 4 groups of resistor-capacitor series circuits and 2 groups of impedance matching transmission lines;
Described first resistor-capacitor series circuit and second resistor-capacitor series circuit are connected to the two ends of the first impedance matching transmission line respectively; The equal ground connection of the other end of first resistor-capacitor series circuit and second resistor-capacitor series circuit; The first impedance matching transmission line is connected with the modulated current positive output end with the tie point of first resistor-capacitor series circuit; The tie point of the first impedance matching transmission line and second resistor-capacitor series circuit is connected to test port;
Described the 3rd resistor-capacitor series circuit and the 4th resistor-capacitor series circuit are connected to the two ends of the second impedance matching transmission line respectively; The equal ground connection of the other end of the 3rd resistor-capacitor series circuit and the 4th resistor-capacitor series circuit; The second impedance matching transmission line is connected with the modulated current reversed-phase output with the tie point of the 3rd resistor-capacitor series circuit; The tie point of the second impedance matching transmission line and the 4th resistor-capacitor series circuit is connected to test port.
Preferably, described impedance matching transmission line impedance size is 25 ohm.
The invention also discloses application circuit based on above-mentioned light emission component test fixture, its technical scheme is: comprise tester, signal generator, tested light emission component, described tester is connected with tested light emission component, is used to test extinction ratio, luminous power and the eye pattern of tested light emission component; It is characterized in that, also comprise data collection and analysis memory cell, light emission component test fixture;
Described data collection and analysis memory cell has signal to be connected with signal generator, is used for sending enabled instruction to signal generator; The data collection and analysis memory cell also has signal to be connected with tester, extinction ratio, luminous power and the eye pattern of the tested light emission component of acceptance test instrument output;
Described data collection and analysis memory cell is communicated by letter by USB interface with described light emission component test fixture, is used to receive the signal and the 3rd power supply subelement output voltage values of the reflection luminous power size of the bias current monitor signal of light emission component test fixture output, the output of tested light emission component;
The radiofrequency signal output of described signal generator is connected with the radiofrequency signal input interface unit of light emission component test fixture;
The test port of described light emission component test fixture is exported to tested light emission component with described modulated current and described bias current, powers to tested light emission component, and receives the signal of the reflection luminous power size of tested light emission component output.
In sum, owing to adopted technique scheme, the invention has the beneficial effects as follows:
1, microprocessor unit, tester transfer to the data collection and analysis memory cell with bias current, back facet current signal, extinction ratio and the light emission component operational voltage value of the light emission component that records, are convenient to collection, the storage and management of light emission component performance parameter.
2, the light emission component test fixture adopts usb signal interface unit, SMA radio frequency connector to be connected with data collection and analysis memory cell, signal generator and tested light emission component respectively with test circuit, has good versatility.
3, the microprocessor unit in the light emission component test fixture has the function of gathering the light emission component operating voltage, can the service behaviour of test light emitting module under different operating voltages, thus obtain the limit range of light emission component operating voltage.
Cause test error, the voltage in the light emission component test fixture to reset chip during 4, for fear of whole plate power-supply fluctuation, guarantee the stable of whole operating state detecting the microprocessor unit that to reset when the whole plate voltage of frock reduces.
5, the collection of light emission component data is beneficial to research and development and produces the performance index of grasping light emission component, produces for research and development to facilitate.
Description of drawings
The present invention will illustrate by example and with reference to the mode of accompanying drawing, wherein:
Fig. 1 is the circuit block diagram of the light emission component test fixture among the present invention.
Fig. 2 is an external signal interface unit circuit block diagram.
Fig. 3 is the reset connection layout of chip and microprocessor unit of voltage.
Fig. 4 is the circuit structure that drives and mate coupling.
Fig. 5 is ONET1101L chip pin figure.
Fig. 6 is the light emission component test fixture and light emission component test circuit after ancillary equipment is connected.
Embodiment
Disclosed all features in this specification, or the step in disclosed all methods or the process except mutually exclusive feature and/or step, all can make up by any way.
Disclosed arbitrary feature in this specification (comprising any accessory claim, summary and accompanying drawing) is unless special narration all can be replaced by other equivalences or the alternative features with similar purpose.That is, unless special narration, each feature is an example in a series of equivalences or the similar characteristics.
Light emission component test fixture as shown in Figure 1 comprises external signal interface unit, microprocessor unit, radiofrequency signal input interface unit, light emission component driver element, light emission component matching unit, test port and power supply unit.
Described power supply unit is used for to microprocessor unit and the power supply of light emission component driver element, and power supply unit also provides tested light emission component power supply by test port.
An electric current AD sampling end of microprocessor unit is connected to test port, be used for gathering the signal of its luminous power size of reaction of the output of tested light emission component at test process, for example: the back facet current signal of light emission component, signal according to the reflection luminous power size of tested light emission component output is adjusted biasing voltage signal and modulated current control signal size, and described microprocessor unit is exported the signal of the reflection luminous power size of tested light emission component output by the external signal interface unit;
Described light emission component driver element receives the differential radio frequency signal of outside input by the radiofrequency signal input interface unit, the radiofrequency signal that the light emission component driver element is used for receiving is converted to modulated current, modulated current control signal according to microprocessor unit output is adjusted the modulated current size, by the light emission component matching unit modulated current is transferred to test port again; The light emission component driver element also is used to accept the biasing voltage signal of microprocessor unit output, and biasing voltage signal is converted to bias current, and to test port output offset electric current, simultaneously to microprocessor unit output offset current monitoring signal;
Microprocessor unit receives the bias current monitor signal of light emission component driver element output by another electric current AD sampling interface, and according to bias current monitor signal adjustment biasing voltage signal size, stable with the bias current of guaranteeing the output of light emission component driver element;
Described test port has modulated current output interface, bias current output interface, tested light emission component power supply interface and the signal receiving interface that reflects the luminous power size; Test port is used for described modulated current and described bias current are exported to tested light emission component, also be used for to the power supply of tested light emission component, and give microprocessor unit the signal feedback of the reflection luminous power size of tested light emission component output.
As Fig. 2, external signal interface unit circuit is made up of usb interface unit and data communication unit.The effect of described external signal interface unit be make microprocessor unit can with the equipment in the external world, as carrying out the usb signal communication with computer.Described usb interface unit is a USB connector; Described data communication unit realized by the USB transducer, and the conversion of signals that is used for microprocessor unit is transferred to external equipment is a usb signal.Described USB transducer can be but be not limited to be that USB changes the RS-232 transducer.
Described potential replacement cell can but be not limited to adopt the voltage chip that resets to realize.Voltage resets chip and microprocessor unit annexation as shown in Figure 3.The reset voltage detecting end of chip of described voltage is connected with described whole plate power supply; When voltage reset chip when detecting whole plate supply voltage and descending control impuls of output to the reset terminal of microprocessor unit, thereby cause that microprocessor unit produces homing action.
Fig. 4 is the circuit structure of light emission component driver element and matching unit.The modulated current of emitting module driver element output needs to export test port to crossing the emitting module matching unit.Described light emission component matching unit comprises 4 groups of resistor-capacitor series circuits and 2 groups of impedance matching transmission lines; First resistor-capacitor series circuit wherein and second resistor-capacitor series circuit are connected to the two ends of the first impedance matching transmission line respectively; The equal ground connection of the other end of first resistor-capacitor series circuit and second resistor-capacitor series circuit; The first impedance matching transmission line is connected with the modulated current positive output end with the tie point of first resistor-capacitor series circuit; The tie point of the first impedance matching transmission line and second resistor-capacitor series circuit is connected to test port;
Described the 3rd resistor-capacitor series circuit and the 4th resistor-capacitor series circuit are connected to the two ends of the second impedance matching transmission line respectively; The equal ground connection of the other end of the 3rd resistor-capacitor series circuit and the 4th resistor-capacitor series circuit; The second impedance matching transmission line is connected with the modulated current reversed-phase output with the tie point of the 3rd resistor-capacitor series circuit; The tie point of the second impedance matching transmission line and the 4th resistor-capacitor series circuit is connected to test port.
As a kind of preferred version, described impedance matching transmission line impedance size is 25 ohm.
The light emission component driver element receives the biasing voltage signal and the modulated current control signal of microprocessing unit output, and adjusts the bias current and the modulated current of its output respectively according to described control signal.
Described light emission component driver element can select for use the laser diode chip for driving to realize.What the present invention selected for use is the ONET1101L chip, sees Fig. 5.The DIN+ of ONET1101L chip, DIN-pin receive the differential radio frequency signal by the radiofrequency signal input interface unit, MOD+, MOD-export modulated current, the BAIS pin is exported bigoted electric current to test port, MONB pin output offset current monitoring signal, microprocessor unit is gathered bigoted current monitoring signal by electric current AD sampling end.
Microprocessor unit advances after the internal judgment by the 2-wire interface ONET1101L chip output offset voltage signal and modulated current control signal the signal of its luminous power size of reaction of the output of the tested light emission component gathered.The ONET1101L chip receives behind these two signals can output corresponding bias current and modulated current to test port.
A universal I/O port pin of microprocessor unit is connected with the DIS pin of ONET1101L chip, and the swinging of signal that detects the reflection luminous power size of tested light emission component output when microprocessor unit is regularly turn-offed the bias current and the modulated current of described light emission component driver element output.
The emitting module driver element to the described bias current size of bias current pilot signal sizableness of microprocessing unit feedback in 1%.
Described test port adopts polymethyl methacrylate that tested light emission component is connected with the signal receiving interface crimping of reflection luminous power size with described modulated current output interface, described bias current output interface, tested light emission component power supply interface.
The light emission component test fixture is seen Fig. 6 with the light emission component test circuit after ancillary equipment is connected.External equipment comprises data collection and analysis memory cell, signal generator, tester.
Tester generally is to adopt Infiniium DCA-J Agilent 86100C wide-band oscilloscope to finish the test that light is sent out the assembly eye pattern, and test parameter comprises important parameters such as luminous power, extinction ratio, shake, the Q factor, signal to noise ratio, rise and fall time.This instrument internal carries a canonical reference receiver through calibrating, and all test errors all are corrected, therefore the performance parameter that can accurately test tested light emission component.
The signal of the reflection luminous power size of the 3rd power supply subelement output voltage (being the light emission component operating voltage) that the external signal interface unit of described light emission component test fixture will collect, bias current pilot signal, the output of tested light emission component transfers to outside data collection and analysis memory cell; The radiofrequency signal input interface unit of described light emission component test fixture and the radiofrequency signal output of signal generator be connected.
Tested light emission component is connected with the light emission component test fixture by test port; Tested light emission component connects with tester by connection optical fiber simultaneously and is connected.
Described data collection and analysis memory cell has signal to be connected with signal generator, is used for sending enabled instruction to signal generator; The data collection and analysis memory cell also has signal to be connected with tester, parameters such as the luminous power size of the tested light emission component of acceptance test instrument output, extinction ratio, eye pattern.
Described data collection and analysis memory cell can be by computer realization.Described light emission component test fixture is connected with described data collection and analysis memory cell by USB interface.
The present invention is not limited to aforesaid embodiment.The present invention expands to any new feature or any new combination that discloses in this manual, and the arbitrary new method that discloses or step or any new combination of process.
Claims (9)
1. the light emission component test fixture is characterized in that, comprises external signal interface unit, microprocessor unit, radiofrequency signal input interface unit, light emission component driver element, light emission component matching unit, test port and power supply unit;
Described power supply unit is used for to microprocessor unit and the power supply of light emission component driver element, and power supply unit also provides tested light emission component power supply by test port;
Microprocessor unit is used to gather the signal of the reflection luminous power size of tested light emission component output, signal according to the reflection luminous power size of tested light emission component output is adjusted biasing voltage signal and modulated current control signal size, and launches driver element output offset voltage signal and modulated current control signal to light;
Described light emission component driver element receives the differential radio frequency signal of outside input by the radiofrequency signal input interface unit, the radiofrequency signal that the light emission component driver element is used for receiving is converted to modulated current, modulated current control signal according to microprocessor unit output is adjusted the modulated current size, by the light emission component matching unit modulated current is transferred to test port again; The light emission component driver element also is used to accept the biasing voltage signal of microprocessor unit output, and biasing voltage signal is converted to bias current, and to test port output offset electric current, simultaneously to microprocessor unit output offset current monitoring signal;
Microprocessor unit and external signal interface unit have handshaking;
Described test port has modulated current output interface, bias current output interface, tested light emission component power supply interface and the signal receiving interface that reflects the luminous power size; Test port is used for described modulated current and described bias current are exported to tested light emission component, also be used for to the power supply of tested light emission component, and give microprocessor unit the signal feedback of the reflection luminous power size of tested light emission component output.
2. light emission component test fixture according to claim 1, it is characterized in that, a universal I/O port pin of microprocessor unit automatically shuts down signal input part with described light emission component driver element and is connected, and regularly turn-offs the bias current and the modulated current of described light emission component driver element output in order to the swinging of signal in the reflection luminous power size of tested light emission component output;
Microprocessor unit receives the bias current monitor signal of light emission component driver element output, and adjusts the biasing voltage signal size according to the bias current monitor signal, and is stable with the bias current of guaranteeing the output of light emission component driver element.
3. light emission component test fixture according to claim 1 is characterized in that, described power supply unit comprises whole plate power supply and 3 the first separate power supply subelements, the second power supply subelement and the 3rd power supply subelements; The output voltage of described 3 power supply subelements is obtained by the justifying power distribution; The described first power supply subelement is used for powering to microprocessor unit; The described second power supply subelement is used for powering to the light emission component driver element; Described the 3rd power supply subelement is used for providing tested light emission component power supply to test port.
4. light emission component test fixture according to claim 3 is characterized in that, microprocessor unit has voltage AD sampling end, and described voltage AD sampling end is gathered the 3rd power supply subelement output voltage.
5. light emission component test fixture according to claim 3 is characterized in that, comprises that also potential replacement cell, potential replacement cell have the voltage detecting end; Described voltage detecting end is connected with described whole plate power supply; Potential replacement cell is used to be implemented in detect exports the reset terminal of a control impuls to microprocessor unit when whole plate supply voltage descends.
6. according to claim 1 or 3 described light emission component test fixtures, it is characterized in that described external signal interface unit comprises usb interface unit and data communication unit; Described data communication unit has signal to be connected with microprocessor unit; The data communication unit is used to receive the signal and the 3rd power supply subelement output voltage values of the reflection luminous power size of the bias current monitor signal of microprocessor unit output, the output of tested light emission component, and realize that the communication protocol between usb signal and the microprocessor unit output signal transforms, and the signal of described microprocessor unit being exported by the usb signal interface unit is transferred to external equipment.
7. light emission component test fixture according to claim 1 is characterized in that, described light emission component matching unit comprises 4 groups of resistor-capacitor series circuits and 2 groups of impedance matching transmission lines;
Described first resistor-capacitor series circuit and second resistor-capacitor series circuit are connected to the two ends of the first impedance matching transmission line respectively; The equal ground connection of the other end of first resistor-capacitor series circuit and second resistor-capacitor series circuit; The first impedance matching transmission line is connected with the modulated current positive output end with the tie point of first resistor-capacitor series circuit; The tie point of the first impedance matching transmission line and second resistor-capacitor series circuit is connected to test port;
Described the 3rd resistor-capacitor series circuit and the 4th resistor-capacitor series circuit are connected to the two ends of the second impedance matching transmission line respectively; The equal ground connection of the other end of the 3rd resistor-capacitor series circuit and the 4th resistor-capacitor series circuit; The second impedance matching transmission line is connected with the modulated current reversed-phase output with the tie point of the 3rd resistor-capacitor series circuit; The tie point of the second impedance matching transmission line and the 4th resistor-capacitor series circuit is connected to test port.
8. light emission component test fixture according to claim 7 is characterized in that, described impedance matching transmission line impedance size is 25 ohm.
9. based on the application circuit of any described light emission component test fixture of claim 1 ~ 8, comprise tester, signal generator, tested light emission component, described tester is connected with tested light emission component, is used to test extinction ratio, luminous power and the eye pattern of tested light emission component; It is characterized in that, also comprise data collection and analysis memory cell, light emission component test fixture;
Described data collection and analysis memory cell has signal to be connected with signal generator, is used for sending enabled instruction to signal generator; The data collection and analysis memory cell also has signal to be connected with tester, extinction ratio, luminous power and the eye pattern of the tested light emission component of acceptance test instrument output;
Described data collection and analysis memory cell is communicated by letter by USB interface with described light emission component test fixture, is used to receive the signal and the 3rd power supply subelement output voltage values of the reflection luminous power size of the bias current monitor signal of light emission component test fixture output, the output of tested light emission component;
The radiofrequency signal output of described signal generator is connected with the radiofrequency signal input interface unit of light emission component test fixture;
The test port of described light emission component test fixture is exported to tested light emission component with described modulated current and described bias current, powers to tested light emission component, and receives the signal of the reflection luminous power size of tested light emission component output.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104280209A (en) * | 2013-07-11 | 2015-01-14 | 武汉亿科思德科技有限公司 | Optical sub-module detecting machine and detecting method |
| CN109633410A (en) * | 2018-12-21 | 2019-04-16 | 杭州彬腾科技有限公司 | The automatic detecting tool of switching value module |
| CN114938243A (en) * | 2022-07-22 | 2022-08-23 | 深圳市亿联无限科技有限公司 | Method and system for debugging BOSA (business-oriented architecture), debugging instrument and debugging method |
| CN117579153A (en) * | 2024-01-17 | 2024-02-20 | 深圳市迅特通信技术股份有限公司 | Optical interconnection channel TDR low-cost testing device, method and system |
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| CN201541263U (en) * | 2009-11-04 | 2010-08-04 | 中兴通讯股份有限公司 | SFP optical port test assembly |
| CN202019357U (en) * | 2011-04-11 | 2011-10-26 | 成都新易盛通信技术有限公司 | Light emission component testing tool and application circuit thereof |
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| US7471897B1 (en) * | 2004-07-16 | 2008-12-30 | Cisco Technology, Inc. | Electrically looped back, fault emulating transceiver module |
| CN201541263U (en) * | 2009-11-04 | 2010-08-04 | 中兴通讯股份有限公司 | SFP optical port test assembly |
| CN202019357U (en) * | 2011-04-11 | 2011-10-26 | 成都新易盛通信技术有限公司 | Light emission component testing tool and application circuit thereof |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104280209A (en) * | 2013-07-11 | 2015-01-14 | 武汉亿科思德科技有限公司 | Optical sub-module detecting machine and detecting method |
| CN109633410A (en) * | 2018-12-21 | 2019-04-16 | 杭州彬腾科技有限公司 | The automatic detecting tool of switching value module |
| CN114938243A (en) * | 2022-07-22 | 2022-08-23 | 深圳市亿联无限科技有限公司 | Method and system for debugging BOSA (business-oriented architecture), debugging instrument and debugging method |
| CN117579153A (en) * | 2024-01-17 | 2024-02-20 | 深圳市迅特通信技术股份有限公司 | Optical interconnection channel TDR low-cost testing device, method and system |
| CN117579153B (en) * | 2024-01-17 | 2024-04-19 | 深圳市迅特通信技术股份有限公司 | Optical interconnection channel TDR low-cost testing device, method and system |
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|---|---|
| CN102255654B (en) | 2014-03-19 |
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