CN102255654B - Light emission component testing tool and applied circuit thereof - Google Patents
Light emission component testing tool and applied circuit thereof Download PDFInfo
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- CN102255654B CN102255654B CN201110089270.0A CN201110089270A CN102255654B CN 102255654 B CN102255654 B CN 102255654B CN 201110089270 A CN201110089270 A CN 201110089270A CN 102255654 B CN102255654 B CN 102255654B
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Abstract
The invention discloses a light emission component testing tool and an applied circuit thereof, which relate to the field of light communication, in particular to a tool for testing the performance of a light emission component. The invention aims to overcome the defects of the conventional light emission component testing technology and provide a complete and independent light emission component testing tool and an applied circuit thereof. Design key points of the invention are that: the light emission component testing tool mainly comprises a microprocessor unit, a radiofrequency signal input interface unit, a light emission component driving unit and the like, wherein the microprocessor unit is used for controlling the control over the entire testing work and acquiring testing parameters; the light emission component driving unit is used for providing modulating current and a biasing voltage signal necessary for work to a tested light emission component; and the light emission component testing tool, a data acquisition, analysis and storage unit, a signal generator and a testing instrument constitute a light emission component testing circuit. The light emission component testing tool is mainly used for testing and managing the working performance and parameters of the light emission component.
Description
Technical field
The present invention relates to optical communication field, especially a kind of frock for test light emitting module performance.
Background technology
TO-CAN: the packing forms that photoelectric device is a kind of.
10G light emission component is to be applied in core telecommunication switching network, is one of Primary Component of XFP, SFP+, and the effect of this assembly is that the signal of telecommunication is converted to light signal.10G light emission component consists of TO-CAN, male part and connection soft board three parts.Debugging light emission component, makes its male part and TO-CAN reach good mated condition, and testing the parameters such as its modulation, bias current and extinction ratio is requisite link in the production application of light emission component.Consider following 3 reasons:
1. when coordinating with TO-CAN when bad, male part can produce strong light reflection, when entering the resonant cavity of laser (laser is present in male part) or superpose with utilizing emitted light, reverberation can cause that eye pattern shake change causes greatly eye pattern deteriorated, the error rate increases, Communications failure.
2. when laser is luminous, laser itself has certain impedance, connect soft board and will complete laser driver (laser driver is present in light emission component) to the connection of laser as a bridge, also to complete the function of impedance matching, if there is strong reflection of electrical signals also can affect eye pattern simultaneously.
3. the quality of smooth eye pattern is directly partly relevant to operating state (modulation, bias current), light emission component itself and the match circuit etc. of light emission component.
In debugging light emission component process, what people were concerned about the most is the light eye pattern of light emission component.
Existing manufacturer is all the test report that relies on light emission component manufacturer to provide, can only on the product circuit pcb board designing, utilize signal generator, tester directly to do the work of the extinction ratio of light emission component, luminous power, eye pattern test and debugging, not have a set of complete, light emission component assessment test platform independently.Thereby existing light emission component debugging technique can not effectively manage light emission component, when changing assessment test producer or the light emission component performance of same batch of production, can not make timely assessment when variant, detect, and impact is produced and debugged.Research and development and produce must spend a large amount of time and again to mate new laser module, and debugging efficiency is low.Lack the collection to assembly property data simultaneously, can not propose recommendation on improvement to manufacturer.Research and development department does not have module testing platform, has strengthened the difficulty of research and development.
Summary of the invention
The object of the invention is to overcome the deficiencies in the prior art, a kind of complete, independently light emission component testing tool and application circuit thereof are provided.
The technical solution used in the present invention is such: light emission component testing tool, comprises external signal interface unit, microprocessor unit, radiofrequency signal input interface unit, light emission component driver element, light emission component matching unit, test port and power supply unit;
Described power supply unit is for powering to microprocessor unit and light emission component driver element, and power supply unit also provides tested light emission component power supply by test port;
Microprocessor unit is for gathering the signal of the reflection luminous power size of tested light emission component output, according to the signal of the reflection luminous power size of tested light emission component output, adjust biasing voltage signal and modulated current control signal size, and to light transmitting driver element output offset voltage signal and modulated current control signal;
Described light emission component driver element receives the differential radio frequency signal of outside input by radiofrequency signal input interface unit, light emission component driver element is for being converted to modulated current by the radiofrequency signal of reception, according to the modulated current control signal of microprocessor unit output, adjust modulated current size, then by light emission component matching unit, modulated current is transferred to test port; The biasing voltage signal that light emission component driver element is also exported for accepting microprocessor unit, and biasing voltage signal is converted to bias current, and to test port output offset electric current, simultaneously to microprocessor unit output offset current monitoring signal;
Microprocessor unit and external signal interface unit have handshaking;
Described test port has modulated current output interface, bias current output interface, tested light emission component power supply interface and the signal receiving interface that reflects luminous power size; Test port is for exporting to tested light emission component by described modulated current and described bias current, also for giving tested light emission component power supply, and by the signal feedback of the reflection luminous power size of tested light emission component output to microprocessor unit.
The supplementary technology scheme that the present invention adopts is such:
Preferably, a universal I/O port pin of microprocessor unit automatically shuts down signal input part with described light emission component driver element and is connected, and regularly turn-offs bias current and the modulated current of described light emission component driver element output in order to the swinging of signal of the reflection luminous power size in tested light emission component output;
Microprocessor unit receives the bias current monitor signal of light emission component driver element output, and adjusts biasing voltage signal size according to bias current monitor signal, stable to guarantee the bias current of light emission component driver element output.
Preferably, described power supply unit comprises whole plate power supply and 3 separate the first supplied for electronic unit, the second supplied for electronic unit and the 3rd supplied for electronic unit; The output voltage of described 3 supplied for electronic unit is obtained by justifying power distribution; Described the first supplied for electronic unit is for powering to microprocessor unit; Described the second supplied for electronic unit is for powering to light emission component driver element; Described the 3rd supplied for electronic unit is for providing tested light emission component power supply to test port.
Preferably, microprocessor unit has voltage AD sampling end, and described voltage AD sampling end gathers the 3rd supplied for electronic unit output voltage.
Preferably, also comprise potential replacement cell, potential replacement cell has voltage detecting end; Described voltage detecting end is connected with described whole plate power supply; Potential replacement cell is exported a control impuls to the reset terminal of microprocessor unit for realizing when whole plate supply voltage decline being detected.
Preferably, described external signal interface unit comprises usb interface unit and data communication unit; Described data communication unit has signal to be connected with microprocessor unit; Data communication unit is for receiving signal and the 3rd supplied for electronic unit output voltage values of the reflection luminous power size of the bias current monitor signal of microprocessor unit output, the output of tested light emission component, and the communication protocol realizing between usb signal and microprocessor unit output signal transforms, and by usb signal interface unit, the signal of described microprocessor unit output is transferred to external equipment.
Preferably, described light emission component driver element has cross point of eye pattern adjustable side.
Preferably, described light emission component matching unit comprises 4 groups of resistor-capacitor series circuits and 2 groups of impedance matching transmission lines;
Described the first resistor-capacitor series circuit and the second resistor-capacitor series circuit are connected to respectively the two ends of the first impedance matching transmission line; The equal ground connection of the other end of the first resistor-capacitor series circuit and the second resistor-capacitor series circuit; The first impedance matching transmission line is connected with modulated current positive output end with the tie point of the first resistor-capacitor series circuit; The tie point of the first impedance matching transmission line and the second resistor-capacitor series circuit is connected to test port;
Described the 3rd resistor-capacitor series circuit and the 4th resistor-capacitor series circuit are connected to respectively the two ends of the second impedance matching transmission line; The equal ground connection of the other end of the 3rd resistor-capacitor series circuit and the 4th resistor-capacitor series circuit; The second impedance matching transmission line is connected with modulated current reversed-phase output with the tie point of the 3rd resistor-capacitor series circuit; The tie point of the second impedance matching transmission line and the 4th resistor-capacitor series circuit is connected to test port.
Preferably, described impedance matching transmission line impedance size is 25 ohm.
The invention also discloses the application circuit based on above-mentioned light emission component testing tool, its technical scheme is: comprise tester, signal generator, tested light emission component, described tester is connected with tested light emission component, for testing extinction ratio, luminous power and the eye pattern of tested light emission component; It is characterized in that, also comprise data collection and analysis memory cell, light emission component testing tool;
Described data collection and analysis memory cell has signal to be connected with signal generator, for sending enabled instruction to signal generator; Data collection and analysis memory cell also has signal to be connected with tester, receives extinction ratio, luminous power and the eye pattern of the tested light emission component of tester output;
Described data collection and analysis memory cell is communicated by letter by USB interface with described light emission component testing tool, for receiving signal and the 3rd supplied for electronic unit output voltage values of the reflection luminous power size of the bias current monitor signal of light emission component testing tool output, the output of tested light emission component;
The radiofrequency signal output of described signal generator is connected with the radiofrequency signal input interface unit of light emission component testing tool;
The test port of described light emission component testing tool is exported to tested light emission component by described modulated current and described bias current, to tested light emission component power supply, and receives the signal of the reflection luminous power size of tested light emission component output.
In sum, owing to having adopted technique scheme, the invention has the beneficial effects as follows:
1, microprocessor unit, tester transfer to data collection and analysis memory cell by the bias current of the light emission component recording, back facet current signal, extinction ratio and light emission component operational voltage value, are convenient to collection, the storage and management of light emission component performance parameter.
2, light emission component testing tool adopts usb signal interface unit, SMA radio frequency connector to be connected with data collection and analysis memory cell, signal generator and tested light emission component respectively with test circuit, has good versatility.
3, the microprocessor unit in light emission component testing tool has the function that gathers light emission component operating voltage, can the service behaviour of test light emitting module under different operating voltages, thus obtain the limit range of light emission component operating voltage.
During 4, for fear of whole plate power-supply fluctuation, cause test error, the voltage reset chip in light emission component testing tool is detecting the microprocessor unit that can reset when the whole plate voltage of frock reduces, and guarantees the stable of whole operating state.
5, the collection of light emission component data is beneficial to research and development and produces the performance index of grasping light emission component, for research and development, produces and facilitates.
Accompanying drawing explanation
Examples of the present invention will be described by way of reference to the accompanying drawings, wherein:
Fig. 1 is the circuit block diagram of the light emission component testing tool in the present invention.
Fig. 2 is external signal interface unit circuit block diagram.
Fig. 3 is the connection layout of voltage reset chip and microprocessor unit.
Fig. 4 is the circuit structure that drives and mate coupling.
Fig. 5 is ONET1101L chip pin figure.
Fig. 6 is the light emission component test circuit after light emission component testing tool is connected with ancillary equipment.
Embodiment
Disclosed all features in this specification, or the step in disclosed all methods or process, except mutually exclusive feature and/or step, all can combine by any way.
Disclosed arbitrary feature in this specification (comprising any accessory claim, summary and accompanying drawing), unless narration especially all can be replaced by other equivalences or the alternative features with similar object.That is,, unless narration especially, each feature is an example in a series of equivalences or similar characteristics.
Light emission component testing tool as shown in Figure 1 comprises external signal interface unit, microprocessor unit, radiofrequency signal input interface unit, light emission component driver element, light emission component matching unit, test port and power supply unit.
Described power supply unit is for powering to microprocessor unit and light emission component driver element, and power supply unit also provides tested light emission component power supply by test port.
An electric current AD sampling end of microprocessor unit is connected to test port, for gather the signal of its luminous power size of reaction of the output of tested light emission component at test process, for example: the back facet current signal of light emission component, according to the signal of the reflection luminous power size of tested light emission component output, adjust biasing voltage signal and modulated current control signal size, described microprocessor unit is exported the signal of the reflection luminous power size of tested light emission component output by external signal interface unit;
Described light emission component driver element receives the differential radio frequency signal of outside input by radiofrequency signal input interface unit, light emission component driver element is for being converted to modulated current by the radiofrequency signal of reception, according to the modulated current control signal of microprocessor unit output, adjust modulated current size, then by light emission component matching unit, modulated current is transferred to test port; The biasing voltage signal that light emission component driver element is also exported for accepting microprocessor unit, and biasing voltage signal is converted to bias current, and to test port output offset electric current, simultaneously to microprocessor unit output offset current monitoring signal;
Microprocessor unit receives the bias current monitor signal of light emission component driver element output by another electric current AD Sampling Interface, and adjust biasing voltage signal size according to bias current monitor signal, stable to guarantee the bias current of light emission component driver element output;
Described test port has modulated current output interface, bias current output interface, tested light emission component power supply interface and the signal receiving interface that reflects luminous power size; Test port is for exporting to tested light emission component by described modulated current and described bias current, also for giving tested light emission component power supply, and by the signal feedback of the reflection luminous power size of tested light emission component output to microprocessor unit.
As Fig. 2, external signal interface unit circuit is comprised of usb interface unit and data communication unit.The effect of described external signal interface unit be make microprocessor unit can with extraneous equipment, as carried out usb signal communication with computer.Described usb interface unit is USB connector; Described data communication unit is realized by USB transducer, for microprocessor unit being transferred to the signal of external equipment, is converted to usb signal.Described USB transducer can be but be not limited to be that USB turns RS-232 transducer.
Described potential replacement cell can be, but not limited to adopt voltage reset chip to realize.Voltage reset chip and microprocessor unit annexation are as shown in Figure 3.The voltage detecting end of described voltage reset chip is connected with described whole plate power supply; When voltage reset chip detects when whole plate supply voltage declines, export a control impuls to the reset terminal of microprocessor unit, thereby cause that microprocessor unit produces homing action.
Fig. 4 is the circuit structure of light emission component driver element and matching unit.The modulated current of emitting module driver element output needs to export test port to crossing emitting module matching unit.Described light emission component matching unit comprises 4 groups of resistor-capacitor series circuits and 2 groups of impedance matching transmission lines; The first resistor-capacitor series circuit wherein and the second resistor-capacitor series circuit are connected to respectively the two ends of the first impedance matching transmission line; The equal ground connection of the other end of the first resistor-capacitor series circuit and the second resistor-capacitor series circuit; The first impedance matching transmission line is connected with modulated current positive output end with the tie point of the first resistor-capacitor series circuit; The tie point of the first impedance matching transmission line and the second resistor-capacitor series circuit is connected to test port;
Described the 3rd resistor-capacitor series circuit and the 4th resistor-capacitor series circuit are connected to respectively the two ends of the second impedance matching transmission line; The equal ground connection of the other end of the 3rd resistor-capacitor series circuit and the 4th resistor-capacitor series circuit; The second impedance matching transmission line is connected with modulated current reversed-phase output with the tie point of the 3rd resistor-capacitor series circuit; The tie point of the second impedance matching transmission line and the 4th resistor-capacitor series circuit is connected to test port.
As a kind of preferred version, described impedance matching transmission line impedance size is 25 ohm.
Light emission component driver element receives biasing voltage signal and the modulated current control signal of microprocessing unit output, and according to described control signal, adjusts respectively bias current and the modulated current of its output.
Described light emission component driver element can select laser diode to drive chip to realize.What the present invention selected is ONET1101L chip, sees Fig. 5.The DIN+ of ONET1101L chip, DIN-pin receive differential radio frequency signal by radiofrequency signal input interface unit, MOD+, MOD-export modulated current, BAIS pin is exported bigoted electric current to test port, MONB pin output offset current monitoring signal, microprocessor unit gathers bigoted current monitoring signal by electric current AD sampling end.
Microprocessor unit passes through 2-wire interface to ONET1101L chip output offset voltage signal and modulated current control signal after the signal of its luminous power size of reaction of the output of the tested light emission component gathering is entered to internal judgment.ONET1101L chip receives after these two signals can output corresponding bias current and modulated current to test port.
A universal I/O port pin of microprocessor unit is connected with the DIS pin of ONET1101L chip, and the swinging of signal that the reflection luminous power size of tested light emission component output detected when microprocessor unit is regularly turn-offed bias current and the modulated current of described light emission component driver element output.
Emitting module driver element to bias current size described in the bias current pilot signal sizableness of microprocessing unit feedback in 1%.
Described test port adopts polymethyl methacrylate that tested light emission component is connected with the signal receiving interface crimping of reflection luminous power size with described modulated current output interface, described bias current output interface, tested light emission component power supply interface.
Fig. 6 is shown in by light emission component test circuit after light emission component testing tool is connected with ancillary equipment.External equipment comprises data collection and analysis memory cell, signal generator, tester.
Tester is generally to adopt Infiniium DCA-J Agilent 86100C wide-band oscilloscope to complete the test that light is sent out assembly eye pattern, and test parameter comprises the important parameters such as luminous power, extinction ratio, shake, the Q factor, signal to noise ratio, rise and fall time.This instrument internal carries a canonical reference receiver through calibrating, and all test errors are all corrected, the performance parameter that therefore can accurately test tested light emission component.
The external signal interface unit of described light emission component testing tool transfers to outside data collection and analysis memory cell by the signal of the reflection luminous power size of the 3rd supplied for electronic unit output voltage (being light emission component operating voltage) collecting, bias current pilot signal, the output of tested light emission component; The radiofrequency signal input interface unit of described light emission component testing tool and the radiofrequency signal output of signal generator be connected.
Tested light emission component is connected with light emission component testing tool by test port; Tested light emission component is connect with tester and is connected by connection optical fiber simultaneously.
Described data collection and analysis memory cell has signal to be connected with signal generator, for sending enabled instruction to signal generator; Data collection and analysis memory cell also has signal to be connected with tester, the parameters such as the luminous power size of the tested light emission component of reception tester output, extinction ratio, eye pattern.
Described data collection and analysis memory cell can be by computer realization.Described light emission component testing tool is connected with described data collection and analysis memory cell by USB interface.
The present invention is not limited to aforesaid embodiment.The present invention expands to any new feature or any new combination disclosing in this manual, and the arbitrary new method disclosing or step or any new combination of process.
Claims (9)
1. light emission component testing tool, is characterized in that, comprises external signal interface unit, microprocessor unit, radiofrequency signal input interface unit, light emission component driver element, light emission component matching unit, test port and power supply unit;
Described power supply unit is for powering to microprocessor unit and light emission component driver element, and power supply unit also provides tested light emission component power supply by test port;
Microprocessor unit is for gathering the signal of the reflection luminous power size of tested light emission component output, according to the signal of the reflection luminous power size of tested light emission component output, adjust biasing voltage signal and modulated current control signal size, and to light transmitting driver element output offset voltage signal and modulated current control signal;
Described light emission component driver element receives the differential radio frequency signal of outside input by radiofrequency signal input interface unit, light emission component driver element is for being converted to modulated current by the radiofrequency signal of reception, according to the modulated current control signal of microprocessor unit output, adjust modulated current size, then by light emission component matching unit, modulated current is transferred to test port; The biasing voltage signal that light emission component driver element is also exported for accepting microprocessor unit, and biasing voltage signal is converted to bias current, and to test port output offset electric current, simultaneously to microprocessor unit output offset current monitoring signal;
Microprocessor unit and external signal interface unit have handshaking;
Described test port has modulated current output interface, bias current output interface, tested light emission component power supply interface and the signal receiving interface that reflects luminous power size; Test port is for exporting to tested light emission component by described modulated current and described bias current, also for giving tested light emission component power supply, and by the signal feedback of the reflection luminous power size of tested light emission component output to microprocessor unit.
2. light emission component testing tool according to claim 1, it is characterized in that, a universal I/O port pin of microprocessor unit automatically shuts down signal input part with described light emission component driver element and is connected, and regularly turn-offs bias current and the modulated current of described light emission component driver element output in order to the swinging of signal of the reflection luminous power size in tested light emission component output;
Microprocessor unit receives the bias current monitor signal of light emission component driver element output, and adjusts biasing voltage signal size according to bias current monitor signal, stable to guarantee the bias current of light emission component driver element output.
3. light emission component testing tool according to claim 1, is characterized in that, described power supply unit comprises whole plate power supply and 3 separate the first supplied for electronic unit, the second supplied for electronic unit and the 3rd supplied for electronic unit; The output voltage of described 3 supplied for electronic unit is obtained by justifying power distribution; Described the first supplied for electronic unit is for powering to microprocessor unit; Described the second supplied for electronic unit is for powering to light emission component driver element; Described the 3rd supplied for electronic unit is for providing tested light emission component power supply to test port.
4. light emission component testing tool according to claim 3, is characterized in that, microprocessor unit has voltage AD sampling end, and described voltage AD sampling end gathers the 3rd supplied for electronic unit output voltage.
5. light emission component testing tool according to claim 3, is characterized in that, also comprises that potential replacement cell, potential replacement cell have voltage detecting end; Described voltage detecting end is connected with described whole plate power supply; Potential replacement cell is exported a control impuls to the reset terminal of microprocessor unit for realizing when whole plate supply voltage decline being detected.
6. light emission component testing tool according to claim 4, is characterized in that, described external signal interface unit comprises usb interface unit and data communication unit; Described data communication unit has signal to be connected with microprocessor unit; Data communication unit is for receiving signal and the 3rd supplied for electronic unit output voltage values of the reflection luminous power size of the bias current monitor signal of microprocessor unit output, the output of tested light emission component, and the communication protocol realizing between usb signal and microprocessor unit output signal transforms, and by usb signal interface unit, the signal of described microprocessor unit output is transferred to external equipment.
7. light emission component testing tool according to claim 1, is characterized in that, described light emission component matching unit comprises 4 groups of resistor-capacitor series circuits and 2 groups of impedance matching transmission lines;
The first resistor-capacitor series circuit and the second resistor-capacitor series circuit are connected to respectively the two ends of the first impedance matching transmission line; The equal ground connection of the other end of the first resistor-capacitor series circuit and the second resistor-capacitor series circuit; The first impedance matching transmission line is connected with modulated current positive output end with the tie point of the first resistor-capacitor series circuit; The tie point of the first impedance matching transmission line and the second resistor-capacitor series circuit is connected to test port;
The 3rd resistor-capacitor series circuit and the 4th resistor-capacitor series circuit are connected to respectively the two ends of the second impedance matching transmission line; The equal ground connection of the other end of the 3rd resistor-capacitor series circuit and the 4th resistor-capacitor series circuit; The second impedance matching transmission line is connected with modulated current reversed-phase output with the tie point of the 3rd resistor-capacitor series circuit; The tie point of the second impedance matching transmission line and the 4th resistor-capacitor series circuit is connected to test port.
8. light emission component testing tool according to claim 7, is characterized in that, described impedance matching transmission line impedance size is 25 ohm.
9. the application circuit of the light emission component testing tool based on described in claim 1 ~ 8 any one, comprise tester, signal generator, tested light emission component, described tester is connected with tested light emission component, for testing extinction ratio, luminous power and the eye pattern of tested light emission component; It is characterized in that, also comprise data collection and analysis memory cell, light emission component testing tool;
Described data collection and analysis memory cell has signal to be connected with signal generator, for sending enabled instruction to signal generator; Data collection and analysis memory cell also has signal to be connected with tester, receives extinction ratio, luminous power and the eye pattern of the tested light emission component of tester output;
Described data collection and analysis memory cell is communicated by letter by USB interface with described light emission component testing tool, for receiving signal and the tested light emission component operational voltage value of the reflection luminous power size of the bias current monitor signal of light emission component testing tool output, the output of tested light emission component;
The radiofrequency signal output of described signal generator is connected with the radiofrequency signal input interface unit of light emission component testing tool;
The test port of described light emission component testing tool is exported to tested light emission component by described modulated current and described bias current, to tested light emission component power supply, and receives the signal of the reflection luminous power size of tested light emission component output.
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| CN104280209A (en) * | 2013-07-11 | 2015-01-14 | 武汉亿科思德科技有限公司 | Optical sub-module detecting machine and detecting method |
| CN109633410A (en) * | 2018-12-21 | 2019-04-16 | 杭州彬腾科技有限公司 | The automatic detecting tool of switching value module |
| CN114938243B (en) * | 2022-07-22 | 2023-04-25 | 深圳市亿联无限科技有限公司 | BOSA debugging method, system, debugger and debugging method |
| CN117579153B (en) * | 2024-01-17 | 2024-04-19 | 深圳市迅特通信技术股份有限公司 | Optical interconnection channel TDR low-cost testing device, method and system |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7471897B1 (en) * | 2004-07-16 | 2008-12-30 | Cisco Technology, Inc. | Electrically looped back, fault emulating transceiver module |
| CN201541263U (en) * | 2009-11-04 | 2010-08-04 | 中兴通讯股份有限公司 | SFP optical port test assembly |
| CN202019357U (en) * | 2011-04-11 | 2011-10-26 | 成都新易盛通信技术有限公司 | Light emission component testing tool and application circuit thereof |
-
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7471897B1 (en) * | 2004-07-16 | 2008-12-30 | Cisco Technology, Inc. | Electrically looped back, fault emulating transceiver module |
| CN201541263U (en) * | 2009-11-04 | 2010-08-04 | 中兴通讯股份有限公司 | SFP optical port test assembly |
| CN202019357U (en) * | 2011-04-11 | 2011-10-26 | 成都新易盛通信技术有限公司 | Light emission component testing tool and application circuit thereof |
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Address after: Hite Industrial Park No. 21 High-tech Zone Gaopeng road in Chengdu city of Sichuan province 610041 No. 2 Building 5 floor Applicant after: Eoptolink Technology Inc., Ltd. Address before: 610041 Sichuan province Chengdu city Chengdu high tech Zone Gaopeng Road No. 21, Industrial Park No. 2 Building 5 floor Applicant before: Eoptolink Technology Inc. |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20161027 Address after: 610000 Sichuan city of Chengdu province Shuangliu County Xing Zhen Wu Lian Street No. 127 Patentee after: SICHUAN XINYISHENG COMMUNICATIONS TECHNOLOGY CO., LTD. Address before: Hite Industrial Park No. 21 High-tech Zone Gaopeng road in Chengdu city of Sichuan province 610041 No. 2 Building 5 floor Patentee before: Eoptolink Technology Inc., Ltd. |