CN102194971B - 发光装置封装元件及其制造方法 - Google Patents
发光装置封装元件及其制造方法 Download PDFInfo
- Publication number
- CN102194971B CN102194971B CN2010102415379A CN201010241537A CN102194971B CN 102194971 B CN102194971 B CN 102194971B CN 2010102415379 A CN2010102415379 A CN 2010102415379A CN 201010241537 A CN201010241537 A CN 201010241537A CN 102194971 B CN102194971 B CN 102194971B
- Authority
- CN
- China
- Prior art keywords
- light
- emitting device
- hole
- soldered ball
- void
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims abstract description 17
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 14
- 239000000463 material Substances 0.000 claims abstract description 53
- 239000000758 substrate Substances 0.000 claims abstract description 48
- 239000011800 void material Substances 0.000 claims description 33
- 229910000679 solder Inorganic materials 0.000 claims description 28
- 238000005520 cutting process Methods 0.000 claims description 17
- 230000015572 biosynthetic process Effects 0.000 claims description 5
- 230000007547 defect Effects 0.000 abstract 1
- 229910002601 GaN Inorganic materials 0.000 description 20
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 20
- 229910052594 sapphire Inorganic materials 0.000 description 9
- 239000010980 sapphire Substances 0.000 description 9
- 241000218202 Coptis Species 0.000 description 5
- 235000002991 Coptis groenlandica Nutrition 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 239000000945 filler Substances 0.000 description 5
- 239000000741 silica gel Substances 0.000 description 5
- 229910002027 silica gel Inorganic materials 0.000 description 5
- 229960001866 silicon dioxide Drugs 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 241000724291 Tobacco streak virus Species 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 239000000203 mixture Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000004806 packaging method and process Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 230000005496 eutectics Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 150000004767 nitrides Chemical class 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004100 electronic packaging Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/17—Structure, shape, material or disposition of the bump connectors after the connecting process of a plurality of bump connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/49105—Connecting at different heights
- H01L2224/49107—Connecting at different heights on the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12041—LED
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/483—Containers
- H01L33/486—Containers adapted for surface mounting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/52—Encapsulations
- H01L33/54—Encapsulations having a particular shape
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/64—Heat extraction or cooling elements
- H01L33/642—Heat extraction or cooling elements characterized by the shape
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Led Device Packages (AREA)
- Led Devices (AREA)
Abstract
Description
Claims (10)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/715,838 | 2010-03-02 | ||
US12/715,838 US8183579B2 (en) | 2010-03-02 | 2010-03-02 | LED flip-chip package structure with dummy bumps |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102194971A CN102194971A (zh) | 2011-09-21 |
CN102194971B true CN102194971B (zh) | 2013-04-24 |
Family
ID=44530542
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2010102415379A Active CN102194971B (zh) | 2010-03-02 | 2010-07-29 | 发光装置封装元件及其制造方法 |
Country Status (3)
Country | Link |
---|---|
US (2) | US8183579B2 (zh) |
CN (1) | CN102194971B (zh) |
TW (1) | TWI430483B (zh) |
Families Citing this family (107)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8507940B2 (en) | 2010-04-05 | 2013-08-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Heat dissipation by through silicon plugs |
US8288849B2 (en) * | 2010-05-07 | 2012-10-16 | Texas Instruments Incorporated | Method for attaching wide bus memory and serial memory to a processor within a chip scale package footprint |
US8319336B2 (en) * | 2010-07-08 | 2012-11-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Reduction of etch microloading for through silicon vias |
US8698166B2 (en) * | 2010-07-16 | 2014-04-15 | Industrial Technology Research Institute | Light emitting chip package module and light emitting chip package structure and manufacturing method thereof |
US9070851B2 (en) * | 2010-09-24 | 2015-06-30 | Seoul Semiconductor Co., Ltd. | Wafer-level light emitting diode package and method of fabricating the same |
TWI446590B (zh) * | 2010-09-30 | 2014-07-21 | Everlight Electronics Co Ltd | 發光二極體封裝結構及其製作方法 |
US8970043B2 (en) | 2011-02-01 | 2015-03-03 | Maxim Integrated Products, Inc. | Bonded stacked wafers and methods of electroplating bonded stacked wafers |
US9653643B2 (en) * | 2012-04-09 | 2017-05-16 | Cree, Inc. | Wafer level packaging of light emitting diodes (LEDs) |
US9666764B2 (en) * | 2012-04-09 | 2017-05-30 | Cree, Inc. | Wafer level packaging of multiple light emitting diodes (LEDs) on a single carrier die |
CN102800798B (zh) * | 2011-10-26 | 2016-06-08 | 清华大学 | 一种led封装结构及其封装方法 |
JP2013105973A (ja) * | 2011-11-16 | 2013-05-30 | Seiko Epson Corp | 発光装置およびその製造方法、並びに、プロジェクター |
US9817029B2 (en) * | 2011-12-07 | 2017-11-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Test probing structure |
TWI484674B (zh) * | 2011-12-08 | 2015-05-11 | Genesis Photonics Inc | 電子元件 |
TW201324705A (zh) * | 2011-12-08 | 2013-06-16 | Genesis Photonics Inc | 電子元件 |
US8664768B2 (en) * | 2012-05-03 | 2014-03-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Interposer having a defined through via pattern |
US20130313718A1 (en) * | 2012-05-24 | 2013-11-28 | Micron Technology, Inc. | Substrates Comprising Integrated Circuitry, Methods Of Processing A Substrate Comprising Integrated Circuitry, And Methods Of Back-Side Thinning A Substrate Comprising Integrated Circuitry |
US8987884B2 (en) | 2012-08-08 | 2015-03-24 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package assembly and methods for forming the same |
KR20140130618A (ko) * | 2013-05-01 | 2014-11-11 | 서울바이오시스 주식회사 | 솔더 페이스트를 통해 접착된 발광 다이오드를 갖는 발광 다이오드 모듈 및 발광 다이오드 |
US9461190B2 (en) * | 2013-09-24 | 2016-10-04 | Optiz, Inc. | Low profile sensor package with cooling feature and method of making same |
US9406588B2 (en) | 2013-11-11 | 2016-08-02 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor package and manufacturing method thereof |
US9496297B2 (en) * | 2013-12-05 | 2016-11-15 | Optiz, Inc. | Sensor package with cooling feature and method of making same |
CN103761929A (zh) * | 2014-01-08 | 2014-04-30 | 江苏新广联绿色照明工程有限公司 | 硅基led显示屏单元板 |
EP3130012B1 (en) * | 2014-04-07 | 2021-06-09 | Lumileds LLC | Lighting device including a thermally conductive body and a semiconductor light emitting device |
US9524917B2 (en) * | 2014-04-23 | 2016-12-20 | Optiz, Inc. | Chip level heat dissipation using silicon |
CN105098025A (zh) * | 2014-05-07 | 2015-11-25 | 新世纪光电股份有限公司 | 发光装置 |
US10177032B2 (en) * | 2014-06-18 | 2019-01-08 | Taiwan Semiconductor Manufacturing Company, Ltd. | Devices, packaging devices, and methods of packaging semiconductor devices |
US9831214B2 (en) * | 2014-06-18 | 2017-11-28 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device packages, packaging methods, and packaged semiconductor devices |
JP6519311B2 (ja) * | 2014-06-27 | 2019-05-29 | 日亜化学工業株式会社 | 発光装置 |
US9431351B2 (en) | 2014-10-17 | 2016-08-30 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor package and manufacturing method of the same |
US9659863B2 (en) | 2014-12-01 | 2017-05-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor devices, multi-die packages, and methods of manufacture thereof |
KR101697603B1 (ko) | 2014-12-08 | 2017-01-19 | 삼성전자주식회사 | 반도체 패키지 |
TWI535346B (zh) * | 2014-12-10 | 2016-05-21 | 上海兆芯集成電路有限公司 | 線路基板和封裝結構 |
US9502272B2 (en) | 2014-12-29 | 2016-11-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | Devices and methods of packaging semiconductor devices |
US9601410B2 (en) | 2015-01-07 | 2017-03-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device and method |
US10319701B2 (en) | 2015-01-07 | 2019-06-11 | Taiwan Semiconductor Manufacturing Company, Ltd. | Bonded 3D integrated circuit (3DIC) structure |
US9633958B2 (en) | 2015-01-30 | 2017-04-25 | Taiwan Semiconductor Manufacturing Company, Ltd. | Bonding pad surface damage reduction in a formation of digital pattern generator |
US10163709B2 (en) | 2015-02-13 | 2018-12-25 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device and method |
KR102346798B1 (ko) | 2015-02-13 | 2022-01-05 | 삼성전자주식회사 | 반도체 발광장치 |
US10497660B2 (en) | 2015-02-26 | 2019-12-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Interconnect structures, packaged semiconductor devices, and methods of packaging semiconductor devices |
US9786519B2 (en) | 2015-04-13 | 2017-10-10 | Taiwan Semiconductor Manufacturing Company, Ltd. | Packaged semiconductor devices and methods of packaging semiconductor devices |
US9748212B2 (en) | 2015-04-30 | 2017-08-29 | Taiwan Semiconductor Manufacturing Company, Ltd. | Shadow pad for post-passivation interconnect structures |
US10340258B2 (en) | 2015-04-30 | 2019-07-02 | Taiwan Semiconductor Manufacturing Company, Ltd. | Interconnect structures, packaged semiconductor devices, and methods of packaging semiconductor devices |
US9969614B2 (en) | 2015-05-29 | 2018-05-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | MEMS packages and methods of manufacture thereof |
KR20160145888A (ko) * | 2015-06-10 | 2016-12-21 | 삼성전자주식회사 | 발광소자 패키지 |
US9966358B2 (en) * | 2015-06-17 | 2018-05-08 | Xintec Inc. | Chip package |
US9520385B1 (en) | 2015-06-29 | 2016-12-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package structure and method for forming same |
US10170444B2 (en) | 2015-06-30 | 2019-01-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | Packages for semiconductor devices, packaged semiconductor devices, and methods of packaging semiconductor devices |
US9536865B1 (en) | 2015-07-23 | 2017-01-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Interconnection joints having variable volumes in package structures and methods of formation thereof |
US9570431B1 (en) | 2015-07-28 | 2017-02-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor wafer for integrated packages |
US9570410B1 (en) | 2015-07-31 | 2017-02-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Methods of forming connector pad structures, interconnect structures, and structures thereof |
US9691695B2 (en) | 2015-08-31 | 2017-06-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Monolithic 3D integration inter-tier vias insertion scheme and associated layout structure |
US10644229B2 (en) | 2015-09-18 | 2020-05-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Magnetoresistive random access memory cell and fabricating the same |
US10269682B2 (en) | 2015-10-09 | 2019-04-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Cooling devices, packaged semiconductor devices, and methods of packaging semiconductor devices |
KR102443033B1 (ko) | 2015-10-12 | 2022-09-16 | 삼성전자주식회사 | 발광소자 패키지 및 이를 포함하는 조명 장치 |
US20170104135A1 (en) * | 2015-10-13 | 2017-04-13 | Sensor Electronic Technology, Inc. | Light Emitting Diode Mounting Structure |
US9659878B2 (en) | 2015-10-20 | 2017-05-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Wafer level shielding in multi-stacked fan out packages and methods of forming same |
US10163856B2 (en) | 2015-10-30 | 2018-12-25 | Taiwan Semiconductor Manufacturing Company, Ltd. | Stacked integrated circuit structure and method of forming |
US9691723B2 (en) | 2015-10-30 | 2017-06-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Connector formation methods and packaged semiconductor devices |
US9911623B2 (en) | 2015-12-15 | 2018-03-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Via connection to a partially filled trench |
US9589941B1 (en) | 2016-01-15 | 2017-03-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | Multi-chip package system and methods of forming the same |
US9773757B2 (en) | 2016-01-19 | 2017-09-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Devices, packaged semiconductor devices, and semiconductor device packaging methods |
US9741669B2 (en) | 2016-01-26 | 2017-08-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | Forming large chips through stitching |
US10050018B2 (en) | 2016-02-26 | 2018-08-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | 3DIC structure and methods of forming |
US9842829B2 (en) | 2016-04-29 | 2017-12-12 | Taiwan Semiconductor Manufacturing Co., Ltd. | Chip package structure and method for forming the same |
US10147704B2 (en) | 2016-05-17 | 2018-12-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor devices and methods of manufacturing thereof |
US9859258B2 (en) | 2016-05-17 | 2018-01-02 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device and method of manufacture |
US9793246B1 (en) | 2016-05-31 | 2017-10-17 | Taiwan Semiconductor Manufacturing Co., Ltd. | Pop devices and methods of forming the same |
US9881903B2 (en) | 2016-05-31 | 2018-01-30 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package-on-package structure with epoxy flux residue |
US9875982B2 (en) | 2016-06-01 | 2018-01-23 | Taiwan Semiconductor Manufacturing Company Ltd | Semiconductor device and manufacturing method thereof |
US10050024B2 (en) | 2016-06-17 | 2018-08-14 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor package and manufacturing method of the same |
US10475769B2 (en) | 2016-06-23 | 2019-11-12 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor package and manufacturing method of the same |
US10229901B2 (en) | 2016-06-27 | 2019-03-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Immersion interconnections for semiconductor devices and methods of manufacture thereof |
US10115675B2 (en) | 2016-06-28 | 2018-10-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | Packaged semiconductor device and method of fabricating a packaged semiconductor device |
US9941186B2 (en) | 2016-06-30 | 2018-04-10 | Taiwan Semiconductor Manufacturing Company Ltd. | Method for manufacturing semiconductor structure |
US10685911B2 (en) | 2016-06-30 | 2020-06-16 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor package and manufacturing method of the same |
US10163805B2 (en) | 2016-07-01 | 2018-12-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | Package structure and method for forming the same |
US9966360B2 (en) | 2016-07-05 | 2018-05-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor package and manufacturing method thereof |
US9893046B2 (en) | 2016-07-08 | 2018-02-13 | Taiwan Semiconductor Manufacturing Co., Ltd. | Thinning process using metal-assisted chemical etching |
US9875972B1 (en) | 2016-07-14 | 2018-01-23 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor device structure and method for forming the same |
US9870975B1 (en) | 2016-07-14 | 2018-01-16 | Taiwan Semiconductor Manufacturing Co., Ltd. | Chip package with thermal dissipation structure and method for forming the same |
US10332841B2 (en) | 2016-07-20 | 2019-06-25 | Taiwan Semiconductor Manufacturing Company, Ltd. | System on integrated chips and methods of forming the same |
US10269732B2 (en) | 2016-07-20 | 2019-04-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Info package with integrated antennas or inductors |
US10157885B2 (en) | 2016-07-29 | 2018-12-18 | Taiwan Semiconductor Manufacturing Co., Ltd. | Package structure having magnetic bonding between substrates |
US10720360B2 (en) | 2016-07-29 | 2020-07-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor die singulation and structures formed thereby |
KR102553630B1 (ko) | 2016-08-11 | 2023-07-10 | 삼성전자주식회사 | 발광소자 패키지 및 이를 이용한 디스플레이 장치 |
US10120971B2 (en) | 2016-08-30 | 2018-11-06 | Taiwan Semiconductor Manufacturing Co., Ltd. | Integrated fan-out package and layout method thereof |
US10535632B2 (en) | 2016-09-02 | 2020-01-14 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor package structure and method of manufacturing the same |
US10049981B2 (en) | 2016-09-08 | 2018-08-14 | Taiwan Semiconductor Manufacturing Company Ltd. | Through via structure, semiconductor device and manufacturing method thereof |
US9996725B2 (en) | 2016-11-03 | 2018-06-12 | Optiz, Inc. | Under screen sensor assembly |
US10170429B2 (en) | 2016-11-28 | 2019-01-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method for forming package structure including intermetallic compound |
US10153218B2 (en) | 2016-11-29 | 2018-12-11 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor structure and manufacturing method thereof |
US10153320B2 (en) | 2016-11-29 | 2018-12-11 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor device and method of forming the same |
DE102017122325A1 (de) * | 2017-09-26 | 2019-03-28 | Osram Opto Semiconductors Gmbh | Strahlungsemittierendes Halbleiterbauelement und Verfahren zur Herstellung von strahlungsemittierenden Halbleiterbauelementen |
KR20190135285A (ko) * | 2018-05-28 | 2019-12-06 | 주식회사 루멘스 | 마이크로 엘이디 모듈 및 그 제조방법 |
US10692799B2 (en) * | 2018-06-01 | 2020-06-23 | Innolux Corporation | Semiconductor electronic device |
US10879183B2 (en) | 2018-06-22 | 2020-12-29 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device and method of manufacture |
US11914141B1 (en) | 2018-08-23 | 2024-02-27 | Apple Inc. | Electronic device with protected light sources |
WO2020054592A1 (ja) * | 2018-09-13 | 2020-03-19 | パナソニックIpマネジメント株式会社 | 半導体発光素子及び半導体発光装置 |
US11172142B2 (en) | 2018-09-25 | 2021-11-09 | Taiwan Semiconductor Manufacturing Co., Ltd. | Image sensor for sensing LED light with reduced flickering |
US11201122B2 (en) | 2018-09-27 | 2021-12-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of fabricating semiconductor device with reduced warpage and better trench filling performance |
US11508876B2 (en) * | 2018-12-31 | 2022-11-22 | Seoul Viosys Co., Ltd. | Light emitting device package and display device having the same |
CN110246953B (zh) * | 2019-07-26 | 2023-08-18 | 厦门乾照半导体科技有限公司 | 一种Micro-LED芯片、显示设备及Micro-LED芯片的制作方法 |
US11133304B2 (en) | 2019-11-27 | 2021-09-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | Packaging scheme involving metal-insulator-metal capacitor |
US11527463B2 (en) * | 2020-05-27 | 2022-12-13 | Intel Corporation | Hybrid ball grid array package for high speed interconnects |
KR102709409B1 (ko) | 2020-10-13 | 2024-09-24 | 삼성전자주식회사 | 반도체 칩, 적층 반도체 칩 구조체, 및 이를 포함하는 반도체 패키지 |
US11869816B2 (en) | 2021-07-26 | 2024-01-09 | Excellence Opto. Inc. | LED package with multiple test pads and parallel circuit elements |
EP4125126A1 (en) | 2021-07-28 | 2023-02-01 | Excellence Opto. Inc. | Led package with multiple test pads and parallel circuit elements |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101267011A (zh) * | 2007-03-13 | 2008-09-17 | 夏普株式会社 | 半导体发光装置、半导体发光装置用多引线框架 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040188696A1 (en) | 2003-03-28 | 2004-09-30 | Gelcore, Llc | LED power package |
TWI294694B (en) | 2005-06-14 | 2008-03-11 | Ind Tech Res Inst | Led wafer-level chip scale packaging |
US7842542B2 (en) * | 2008-07-14 | 2010-11-30 | Stats Chippac, Ltd. | Embedded semiconductor die package and method of making the same using metal frame carrier |
US8168470B2 (en) * | 2008-12-08 | 2012-05-01 | Stats Chippac, Ltd. | Semiconductor device and method of forming vertical interconnect structure in substrate for IPD and baseband circuit separated by high-resistivity molding compound |
-
2010
- 2010-03-02 US US12/715,838 patent/US8183579B2/en active Active
- 2010-07-21 TW TW099123934A patent/TWI430483B/zh active
- 2010-07-29 CN CN2010102415379A patent/CN102194971B/zh active Active
-
2012
- 2012-05-17 US US13/474,282 patent/US8399269B2/en active Active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101267011A (zh) * | 2007-03-13 | 2008-09-17 | 夏普株式会社 | 半导体发光装置、半导体发光装置用多引线框架 |
Also Published As
Publication number | Publication date |
---|---|
CN102194971A (zh) | 2011-09-21 |
US20120225509A1 (en) | 2012-09-06 |
TWI430483B (zh) | 2014-03-11 |
US8183579B2 (en) | 2012-05-22 |
US8399269B2 (en) | 2013-03-19 |
TW201131828A (en) | 2011-09-16 |
US20110215360A1 (en) | 2011-09-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102194971B (zh) | 发光装置封装元件及其制造方法 | |
US8183578B2 (en) | Double flip-chip LED package components | |
US8735934B2 (en) | Semiconductor light-emitting apparatus and method of fabricating the same | |
JP5112049B2 (ja) | サブマウントを置かないフリップチップ発光ダイオード素子 | |
US7683396B2 (en) | High power light emitting device assembly utilizing ESD protective means sandwiched between dual sub-mounts | |
US9362474B2 (en) | Vertical LED chip package on TSV carrier | |
CN101621101A (zh) | 发光二极管及其制造方法 | |
US10304998B2 (en) | Light emitting diode chip and light emitting device having the same | |
US9293663B1 (en) | Light-emitting unit and semiconductor light-emitting device | |
CN102194972B (zh) | 发光装置封装元件 | |
TWI395346B (zh) | 發光元件的封裝結構 | |
JP2007335462A (ja) | 半導体複合素子およびその製造方法 | |
TWI393273B (zh) | 發光二極體組件之製造方法 | |
CN207977346U (zh) | 一种led器件及照明装置 | |
TW202407998A (zh) | 用於多晶片發光裝置的晶圓級製造 | |
CN110021688A (zh) | 一种led器件及其制造方法 | |
GB2551154A (en) | Light-emitting diode package and method of manufacture | |
KR20140023553A (ko) | 발광 소자 패키지 및 이의 제조 방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160504 Address after: Hsinchu City, Taiwan, China Patentee after: EPISTAR Corp. Address before: Hsinchu City, Taiwan, China Patentee before: Yuanxin Optoelectronics Co.,Ltd. Effective date of registration: 20160504 Address after: Hsinchu City, Taiwan, China Patentee after: Yuanxin Optoelectronics Co.,Ltd. Address before: Hsinchu City, Taiwan, China Patentee before: Taiwan Semiconductor Manufacturing Co.,Ltd. |