CN102105781B - 卷材检查校准系统及相关方法 - Google Patents

卷材检查校准系统及相关方法 Download PDF

Info

Publication number
CN102105781B
CN102105781B CN2009801289711A CN200980128971A CN102105781B CN 102105781 B CN102105781 B CN 102105781B CN 2009801289711 A CN2009801289711 A CN 2009801289711A CN 200980128971 A CN200980128971 A CN 200980128971A CN 102105781 B CN102105781 B CN 102105781B
Authority
CN
China
Prior art keywords
web
calibration
sensor
inspection system
cross
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2009801289711A
Other languages
English (en)
Chinese (zh)
Other versions
CN102105781A (zh
Inventor
大卫·L·霍费尔特
德里克·H·贾斯蒂斯
约翰·A·拉姆瑟恩
凯瑟琳·P·塔尔诺夫斯基
许文源
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Innovative Properties Co
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of CN102105781A publication Critical patent/CN102105781A/zh
Application granted granted Critical
Publication of CN102105781B publication Critical patent/CN102105781B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H20/00—Advancing webs
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H43/00—Use of control, checking, or safety devices, e.g. automatic devices comprising an element for sensing a variable
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H7/00—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles
    • B65H7/02—Controlling article feeding, separating, pile-advancing, or associated apparatus, to take account of incorrect feeding, absence of articles, or presence of faulty articles by feelers or detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2220/00—Function indicators
    • B65H2220/09—Function indicators indicating that several of an entity are present
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2515/00—Physical entities not provided for in groups B65H2511/00 or B65H2513/00
    • B65H2515/84—Quality; Condition, e.g. degree of wear
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2553/00—Sensing or detecting means
    • B65H2553/30—Sensing or detecting means using acoustic or ultrasonic elements
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2553/00—Sensing or detecting means
    • B65H2553/40—Sensing or detecting means using optical, e.g. photographic, elements
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2553/00—Sensing or detecting means
    • B65H2553/40—Sensing or detecting means using optical, e.g. photographic, elements
    • B65H2553/42—Cameras
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H2557/00—Means for control not provided for in groups B65H2551/00 - B65H2555/00
    • B65H2557/60—Details of processes or procedures
    • B65H2557/61—Details of processes or procedures for calibrating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Treatment Of Fiber Materials (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
CN2009801289711A 2008-06-05 2009-04-24 卷材检查校准系统及相关方法 Expired - Fee Related CN102105781B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/133,487 US7773226B2 (en) 2008-06-05 2008-06-05 Web inspection calibration system and related methods
US12/133,487 2008-06-05
PCT/US2009/041596 WO2009148720A2 (en) 2008-06-05 2009-04-24 Web inspection calibration system and related methods

Publications (2)

Publication Number Publication Date
CN102105781A CN102105781A (zh) 2011-06-22
CN102105781B true CN102105781B (zh) 2013-02-13

Family

ID=41398752

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2009801289711A Expired - Fee Related CN102105781B (zh) 2008-06-05 2009-04-24 卷材检查校准系统及相关方法

Country Status (6)

Country Link
US (2) US7773226B2 (enExample)
EP (1) EP2294388A4 (enExample)
JP (1) JP2011523056A (enExample)
KR (1) KR20110015679A (enExample)
CN (1) CN102105781B (enExample)
WO (1) WO2009148720A2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI559108B (zh) * 2014-07-22 2016-11-21 寧波弘訊科技股份有限公司 糾偏控制方法、控制器及糾偏控制系統

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7415881B2 (en) * 2004-08-19 2008-08-26 Fife Corporation Ultrasonic sensor system for web-guiding apparatus
DE102006014506A1 (de) * 2006-03-20 2007-09-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Detektion von Planlageabweichungen bei der Abrollung flexibler, bahnförmiger Flachformgüter
US7773226B2 (en) * 2008-06-05 2010-08-10 3M Innovative Properties Company Web inspection calibration system and related methods
EP2186624B1 (en) * 2008-11-18 2015-08-26 Tetra Laval Holdings & Finance S.A. Apparatus and method for detecting the position of application of a sealing strip onto a web of packaging material for food products
US8325225B2 (en) * 2009-03-16 2012-12-04 PT Papertech, Inc Method and apparatus for a web inspection system
US8147026B2 (en) * 2009-04-27 2012-04-03 Eastman Kodak Company Image quality matching in a mixed print engine assembly system
TWI408331B (zh) * 2009-12-17 2013-09-11 Ind Tech Res Inst 雙面光學膜片量測裝置與方法
JP2011163766A (ja) * 2010-02-04 2011-08-25 Omron Corp 画像処理方法および画像処理システム
US8762881B2 (en) * 2010-07-15 2014-06-24 Salesforce.Com, Inc. Taking screenshots of a failed application
US9172916B2 (en) 2010-12-12 2015-10-27 Event Capture Systems, Inc. Web monitoring system
US9322803B2 (en) * 2011-01-22 2016-04-26 Utc Fire & Security Corporation Detector having a single source for ionization and photo detection
DE102011106523A1 (de) 2011-07-04 2013-01-10 Giesecke & Devrient Gmbh Prüfgerät und Verfahren zur Kalibrierung eines Prüfgeräts
US8553228B2 (en) * 2011-09-30 2013-10-08 3M Innovative Properties Company Web inspection calibration system and related methods
CN102615945A (zh) * 2012-03-29 2012-08-01 吴江迈为技术有限公司 一种卷纸传片装置中保证卷纸正、反运行在相同段的方法
US8923571B2 (en) 2012-07-16 2014-12-30 Hewlett-Packard Development Company, L.P. Automated camera flat fielding and alignment
US9415963B2 (en) 2013-01-30 2016-08-16 Fife Corporation Sensor controller for interpreting natural interaction sensor for web handling
ITVR20130218A1 (it) * 2013-09-20 2015-03-21 Bema Srl Dispositivo e procedimento di controllo della qualita' di film estensibile per imballaggio
US9845574B2 (en) 2014-04-15 2017-12-19 Gpcp Ip Holdings Llc Method of marking a paper web for controlling a manufacturing line used to convert the paper web into paper products by reading marks on the paper web
CN104020177B (zh) * 2014-06-26 2016-06-15 重庆大学 连铸坯表面缺陷双ccd扫描成像检测方法
KR101733018B1 (ko) * 2015-02-25 2017-05-24 동우 화인켐 주식회사 광학 필름의 불량 검출 장치 및 방법
CN105222728A (zh) * 2015-09-14 2016-01-06 深圳市星源材质科技股份有限公司 一种锂电池隔膜表面平整度的检测装置及其方法
EP3339845A3 (en) * 2016-11-30 2018-09-12 Sumitomo Chemical Company, Ltd Defect inspection device, defect inspection method, method for producing separator roll, and separator roll
JP6575824B2 (ja) * 2017-03-22 2019-09-18 トヨタ自動車株式会社 膜厚測定方法および膜厚測定装置
SMT202500335T1 (it) 2017-09-22 2025-11-10 Lantech Com Llc Compensazione di qualità del materiale di imballaggio
CN107830814B (zh) * 2017-10-16 2020-09-11 北京科技大学 一种基于光度学的测量表面变形的方法
TWI794400B (zh) * 2018-01-31 2023-03-01 美商3M新設資產公司 用於連續移動帶材的紅外光透射檢查
MX2020010428A (es) 2018-04-04 2020-10-28 Paper Converting Machine Co Control para aparatos y metodos para desenrollar rollos principales.
EP3941867A4 (en) * 2019-03-20 2023-09-20 Lantech.Com, Llc PACKAGING MATERIAL ASSESSMENT AND DEVICE THEREFOR WITH A SPLIT TAKE-UP DRUM AND/OR SPECIFIC INCLUSION FORCE MEASUREMENT
AU2020349415B2 (en) 2019-09-19 2024-01-25 Lantech.Com, Llc Ultrasonic packaging material flaw detection with time-limited response detection
WO2021055193A1 (en) 2019-09-19 2021-03-25 Lantech.Com, Llc Packaging material grading and/or factory profiles
CN111649697B (zh) * 2020-07-03 2022-02-11 东北大学 基于线阵相机立体视觉的金属带材板形检测方法
CN114778453A (zh) * 2021-12-31 2022-07-22 南京华鼎纳米技术研究院有限公司 一种基于纸张光度的纸张修复方法
EP4397610A4 (en) * 2022-11-23 2024-11-06 Contemporary Amperex Technology (Hong Kong) Limited ROLL, METHOD AND APPARATUS FOR LOCALIZED INSPECTION, METHOD AND APPARATUS FOR TRANSPORTING COILED MATERIAL, AND DEVICE AND SUPPORT
CN118936309B (zh) * 2024-08-26 2025-12-05 西北工业大学深圳研究院 适用于卷绕系统的高反光卷材偏移量测量方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4566798A (en) * 1983-11-10 1986-01-28 Eastman Kodak Company Method for calibrating a reflectometer containing black and white references displaced from the sample position
CN1517702A (zh) * 2003-01-20 2004-08-04 ������������ʽ���� 外观检测装置以及外观检测方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3562525A (en) * 1967-06-29 1971-02-09 Minnesota Mining & Mfg X-ray fludrescence gauging employing a single x-ray source and a reference sample for comparative measurements
US3671744A (en) * 1970-10-05 1972-06-20 Minnesota Mining & Mfg Digital differential emission x-ray gauge
US5071514A (en) 1990-12-17 1991-12-10 Francis Systems, Inc. Paper weight sensor with stationary optical sensors calibrated by a scanning sensor
JP2635889B2 (ja) 1992-06-24 1997-07-30 株式会社東芝 ダイボンディング装置
JP3211389B2 (ja) * 1992-06-30 2001-09-25 株式会社島津製作所 蛍光検出型ゲル電気泳動装置
US5563809A (en) 1994-04-06 1996-10-08 Abb Industrial Systems, Inc. Measurement/control of sheet material using at least one sensor array
US5666199A (en) 1994-07-11 1997-09-09 Phillips Petroleum Company Apparatus and process for detecting the presence of gel defects in oriented sheets or films based on polarization detection
US6264533B1 (en) * 1999-05-28 2001-07-24 3M Innovative Properties Company Abrasive processing apparatus and method employing encoded abrasive product
US6813032B1 (en) * 1999-09-07 2004-11-02 Applied Materials, Inc. Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniques
US6721045B1 (en) * 1999-09-07 2004-04-13 Applied Materials, Inc. Method and apparatus to provide embedded substrate process monitoring through consolidation of multiple process inspection techniques
US6553133B1 (en) 1999-09-22 2003-04-22 U.T. Battelle, Llc Four-dimensional characterization of a sheet-forming web
US6452679B1 (en) 1999-12-29 2002-09-17 Kimberly-Clark Worldwide, Inc. Method and apparatus for controlling the manufacturing quality of a moving web
US6934028B2 (en) 2000-01-20 2005-08-23 Webview, Inc. Certification and verification management system and method for a web inspection apparatus
US6967721B2 (en) 2000-10-23 2005-11-22 Am-Vision Technologies Ltd. Method and device for non-invasively optically determining bulk density and uniformity of web configured material during in-line processing
US6850857B2 (en) 2001-07-13 2005-02-01 Honeywell International Inc. Data fusion of stationary array sensor and scanning sensor measurements
US6829516B2 (en) 2002-08-07 2004-12-07 Kimberly-Clark Worlwide, Inc. Combined information exchange systems and methods
US7697073B2 (en) * 2005-12-06 2010-04-13 Raytheon Company Image processing system with horizontal line registration for improved imaging with scene motion
US7773226B2 (en) 2008-06-05 2010-08-10 3M Innovative Properties Company Web inspection calibration system and related methods

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4566798A (en) * 1983-11-10 1986-01-28 Eastman Kodak Company Method for calibrating a reflectometer containing black and white references displaced from the sample position
CN1517702A (zh) * 2003-01-20 2004-08-04 ������������ʽ���� 外观检测装置以及外观检测方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
JP特开平6-18416A 1994.01.25

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI559108B (zh) * 2014-07-22 2016-11-21 寧波弘訊科技股份有限公司 糾偏控制方法、控制器及糾偏控制系統

Also Published As

Publication number Publication date
KR20110015679A (ko) 2011-02-16
US20100231897A1 (en) 2010-09-16
CN102105781A (zh) 2011-06-22
US7957000B2 (en) 2011-06-07
US7773226B2 (en) 2010-08-10
EP2294388A4 (en) 2012-10-31
JP2011523056A (ja) 2011-08-04
WO2009148720A2 (en) 2009-12-10
EP2294388A2 (en) 2011-03-16
US20090303484A1 (en) 2009-12-10
WO2009148720A3 (en) 2010-03-04

Similar Documents

Publication Publication Date Title
CN102105781B (zh) 卷材检查校准系统及相关方法
CN103842800B (zh) 幅材检测校准系统及相关方法
KR102549058B1 (ko) 광학 측정 장치 및 광학 측정 방법
US7478019B2 (en) Multiple tool and structure analysis
KR101342410B1 (ko) 주기적인 회절 구조를 포함하는 층을 갖는 샘플을 측정하는시스템
Markl et al. In-line monitoring of a pharmaceutical pan coating process by optical coherence tomography
JP2007506976A5 (enExample)
JP2018205295A (ja) 光学測定装置および光学測定方法
US7869050B2 (en) Systems and methods for comparative interferogram spectrometry
KR102195132B1 (ko) 편광자 연속 회전 광량 측정 방법
de Sousa et al. Evaluating the signal processing chain employed in surface plasmon resonance biosensing
JP3106845B2 (ja) フィルムの厚さ測定装置および測定方法ならびにフィルムの製造方法
CN111912785B (zh) 一种光学常数测量方法与光学常数测量设备
US20160291633A1 (en) Integrated computational element fabrication methods and systems
TW202348958A (zh) 具有干擾特徵減輕之光學計量
US12449351B1 (en) Method of determining absorption and extinction coefficient of prism shaped material
US20140240720A1 (en) Linewidth measurement system
US20120243928A1 (en) Identifying edges of web media using textural contrast between web media and backer roll
Johnson Defect and thickness inspection system for cast thin films using machine vision and full-field transmission densitometry

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130213

Termination date: 20130424