CN102007367B - 幅材上的优先缺陷标记 - Google Patents

幅材上的优先缺陷标记 Download PDF

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Publication number
CN102007367B
CN102007367B CN200980113345.5A CN200980113345A CN102007367B CN 102007367 B CN102007367 B CN 102007367B CN 200980113345 A CN200980113345 A CN 200980113345A CN 102007367 B CN102007367 B CN 102007367B
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CN
China
Prior art keywords
web
mark
anomaly
product
unusual
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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CN200980113345.5A
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English (en)
Chinese (zh)
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CN102007367A (zh
Inventor
史蒂文·P·弗洛德
詹姆斯·A·马斯特曼
卡尔·J·斯凯普斯
杰森·P·史密斯
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3M Innovative Properties Co
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3M Innovative Properties Co
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Publication date
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Publication of CN102007367A publication Critical patent/CN102007367A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21G—CALENDERS; ACCESSORIES FOR PAPER-MAKING MACHINES
    • D21G9/00—Other accessories for paper-making machines
    • D21G9/0009—Paper-making control systems
    • D21G9/0045—Paper-making control systems controlling the calendering or finishing
    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21G—CALENDERS; ACCESSORIES FOR PAPER-MAKING MACHINES
    • D21G9/00—Other accessories for paper-making machines
    • D21G9/0009—Paper-making control systems
    • D21G9/0054—Paper-making control systems details of algorithms or programs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G16—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
    • G16Z—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS, NOT OTHERWISE PROVIDED FOR
    • G16Z99/00—Subject matter not provided for in other main groups of this subclass

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Software Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Treatment Of Fiber Materials (AREA)
  • General Factory Administration (AREA)
CN200980113345.5A 2008-04-17 2009-04-07 幅材上的优先缺陷标记 Expired - Fee Related CN102007367B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/104,700 US7937233B2 (en) 2008-04-17 2008-04-17 Preferential defect marking on a web
US12/104,700 2008-04-17
PCT/US2009/039720 WO2009129082A2 (en) 2008-04-17 2009-04-07 Preferential defect marking on a web

Publications (2)

Publication Number Publication Date
CN102007367A CN102007367A (zh) 2011-04-06
CN102007367B true CN102007367B (zh) 2013-03-27

Family

ID=41199647

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200980113345.5A Expired - Fee Related CN102007367B (zh) 2008-04-17 2009-04-07 幅材上的优先缺陷标记

Country Status (7)

Country Link
US (1) US7937233B2 (https=)
EP (1) EP2281172B1 (https=)
JP (1) JP2011518332A (https=)
KR (1) KR101596980B1 (https=)
CN (1) CN102007367B (https=)
TW (1) TWI479353B (https=)
WO (1) WO2009129082A2 (https=)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PT2119516E (pt) * 2008-05-14 2013-10-24 Soudronic Ag Processo para a marcação de chapas e soldadura em função de marcas de paredes laterais para recipientes fabricadas a partir de tais chapas
KR101774074B1 (ko) * 2010-03-10 2017-09-01 쓰리엠 이노베이티브 프로퍼티즈 컴파니 웨브 제조 공정에서의 응용-특정된 반복 결함 검출 시스템
JP5912125B2 (ja) * 2010-11-12 2016-04-27 スリーエム イノベイティブ プロパティズ カンパニー ウェブベース材料における不均一性の高速処理と検出
ES2400656B1 (es) * 2011-06-28 2014-06-02 Airbus Operations, S.L. Procedimiento de marcado y reconocimiento de defectos en material prepreg
CN103728305A (zh) * 2014-01-13 2014-04-16 深圳市永光神目科技有限公司 Pcba板用的检测方法
US9963827B2 (en) 2014-04-15 2018-05-08 Gpcp Ip Holdings Llc Methods and apparatuses for controlling a manufacturing line used to convert a paper web into paper products by reading marks on the paper web
US9745222B2 (en) * 2015-07-23 2017-08-29 United States Gypsum Company Apparatus and methods for producing gypsum wallboard
JP6587671B2 (ja) * 2016-12-02 2019-10-09 花王株式会社 製造ラインの制御システム、製造ラインの制御装置、及び製造ラインの制御方法
JP6930157B2 (ja) * 2017-03-16 2021-09-01 三菱ケミカル株式会社 フィルム検査システム及びフィルムの製造方法
KR102191350B1 (ko) * 2017-11-27 2020-12-15 주식회사 엘지화학 광학필름 마킹시스템
JP7481800B2 (ja) * 2018-12-17 2024-05-13 株式会社トッパンＴｏｍｏｅｇａｗａオプティカルフィルム フィルム及びマーカーの印字方法
US11878928B2 (en) 2019-02-06 2024-01-23 Corning Incorporated Methods of processing a viscous ribbon
CN109811494B (zh) * 2019-03-22 2021-11-23 山东圣梵尼服饰股份有限公司 一种面料印染用系统
TWI751643B (zh) * 2019-09-03 2022-01-01 財團法人工業技術研究院 材料屬性評級系統及方法
TWI755303B (zh) * 2021-03-18 2022-02-11 佰龍機械廠股份有限公司 基於織物布面狀態即時提示針織機狀態的圓針織機
CN113251926B (zh) * 2021-06-04 2021-09-24 山东捷瑞数字科技股份有限公司 一种不规则物体的尺寸测量方法及测量装置
US12597593B2 (en) * 2022-02-07 2026-04-07 Honeywell International Inc. Manufacturing method for traceability of battery electrodes with fiducial markers
CN114655768B (zh) * 2022-04-18 2023-11-21 深圳市佳得设备科技有限公司 一种铝塑膜分切机控制方法、系统及存储介质
CN116399873B (zh) 2023-06-07 2023-09-26 杭州百子尖科技股份有限公司 基于机器视觉的片材缺陷贴标方法、装置、设备以及介质

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5099504A (en) * 1987-03-31 1992-03-24 Adaptive Technologies, Inc. Thickness/density mesuring apparatus
EP0516913B1 (en) * 1991-02-06 1996-01-03 Valmet Paper Machinery Inc. Method and device for photoelectric identification of a material web
CN1641315A (zh) * 2004-01-16 2005-07-20 牧德科技股份有限公司 印刷电路板的盲孔质量分析方法
CN1657958A (zh) * 2004-02-16 2005-08-24 德克诺斯株式会社 基板检查装置和检查方法
CN1759644A (zh) * 2003-03-12 2006-04-12 雅马哈发动机株式会社 电子元件安装装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4134684A (en) 1977-01-18 1979-01-16 Intex Corp. Repeat defect detector system
JPH0786474B2 (ja) 1988-09-09 1995-09-20 富士写真フイルム株式会社 欠陥周期の測定方法
US5537669A (en) 1993-09-30 1996-07-16 Kla Instruments Corporation Inspection method and apparatus for the inspection of either random or repeating patterns
JP2000051937A (ja) * 1998-08-06 2000-02-22 Nkk Corp 薄鋼板への欠陥マーキング方法
JP2001347315A (ja) * 2000-04-03 2001-12-18 Nkk Corp 欠陥マーキングしたコイルの製造方法、欠陥マーキング方法及び欠陥マーキングしたコイルの作業方法
US7027934B2 (en) 2003-09-24 2006-04-11 3M Innovative Properties Company Apparatus and method for automated web inspection
KR101203325B1 (ko) 2003-12-31 2012-11-20 쓰리엠 이노베이티브 프로퍼티즈 컴파니 시트-기반 물품에 대한 재고품 제어
JP2007517232A (ja) * 2003-12-31 2007-06-28 スリーエム イノベイティブ プロパティズ カンパニー ウェブに基づく物品の歩留まりの最大化
US7623699B2 (en) 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
TWI292601B (en) * 2005-06-22 2008-01-11 United Microelectronics Corp Defect inspection device and inspecting method thereof
IL177689A0 (en) * 2005-08-26 2006-12-31 Camtek Ltd Method and system for automatic defect detection of articles in visual inspection machines
JP5248052B2 (ja) * 2006-10-11 2013-07-31 日東電工株式会社 光学フィルムを有するシート状製品の欠点検査装置、その検査データ処理装置、その切断装置及びその製造システム

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5099504A (en) * 1987-03-31 1992-03-24 Adaptive Technologies, Inc. Thickness/density mesuring apparatus
EP0516913B1 (en) * 1991-02-06 1996-01-03 Valmet Paper Machinery Inc. Method and device for photoelectric identification of a material web
CN1759644A (zh) * 2003-03-12 2006-04-12 雅马哈发动机株式会社 电子元件安装装置
CN1641315A (zh) * 2004-01-16 2005-07-20 牧德科技股份有限公司 印刷电路板的盲孔质量分析方法
CN1657958A (zh) * 2004-02-16 2005-08-24 德克诺斯株式会社 基板检查装置和检查方法

Also Published As

Publication number Publication date
EP2281172A2 (en) 2011-02-09
KR101596980B1 (ko) 2016-02-23
CN102007367A (zh) 2011-04-06
EP2281172B1 (en) 2013-08-14
WO2009129082A2 (en) 2009-10-22
KR20110006684A (ko) 2011-01-20
WO2009129082A3 (en) 2010-01-14
EP2281172A4 (en) 2011-07-13
TW201009634A (en) 2010-03-01
JP2011518332A (ja) 2011-06-23
US7937233B2 (en) 2011-05-03
TWI479353B (zh) 2015-04-01
US20090265127A1 (en) 2009-10-22

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Granted publication date: 20130327

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