JP2011518332A - ウェブ上の優先的欠陥マーキング - Google Patents

ウェブ上の優先的欠陥マーキング Download PDF

Info

Publication number
JP2011518332A
JP2011518332A JP2011505084A JP2011505084A JP2011518332A JP 2011518332 A JP2011518332 A JP 2011518332A JP 2011505084 A JP2011505084 A JP 2011505084A JP 2011505084 A JP2011505084 A JP 2011505084A JP 2011518332 A JP2011518332 A JP 2011518332A
Authority
JP
Japan
Prior art keywords
web
anomaly
mark
defect
products
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2011505084A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011518332A5 (https=
Inventor
ピー． フレーダー，スティーブン
エー． マスターマン，ジェイムズ
ジェイ． スケプス，カール
ピー． スミス，ジェイソン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Innovative Properties Co
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of JP2011518332A publication Critical patent/JP2011518332A/ja
Publication of JP2011518332A5 publication Critical patent/JP2011518332A5/ja
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21G—CALENDERS; ACCESSORIES FOR PAPER-MAKING MACHINES
    • D21G9/00—Other accessories for paper-making machines
    • D21G9/0009—Paper-making control systems
    • D21G9/0045—Paper-making control systems controlling the calendering or finishing
    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21G—CALENDERS; ACCESSORIES FOR PAPER-MAKING MACHINES
    • D21G9/00—Other accessories for paper-making machines
    • D21G9/0009—Paper-making control systems
    • D21G9/0054—Paper-making control systems details of algorithms or programs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G16—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
    • G16Z—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS, NOT OTHERWISE PROVIDED FOR
    • G16Z99/00—Subject matter not provided for in other main groups of this subclass

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Textile Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Software Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Treatment Of Fiber Materials (AREA)
  • General Factory Administration (AREA)
JP2011505084A 2008-04-17 2009-04-07 ウェブ上の優先的欠陥マーキング Ceased JP2011518332A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/104,700 US7937233B2 (en) 2008-04-17 2008-04-17 Preferential defect marking on a web
US12/104,700 2008-04-17
PCT/US2009/039720 WO2009129082A2 (en) 2008-04-17 2009-04-07 Preferential defect marking on a web

Publications (2)

Publication Number Publication Date
JP2011518332A true JP2011518332A (ja) 2011-06-23
JP2011518332A5 JP2011518332A5 (https=) 2012-05-10

Family

ID=41199647

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011505084A Ceased JP2011518332A (ja) 2008-04-17 2009-04-07 ウェブ上の優先的欠陥マーキング

Country Status (7)

Country Link
US (1) US7937233B2 (https=)
EP (1) EP2281172B1 (https=)
JP (1) JP2011518332A (https=)
KR (1) KR101596980B1 (https=)
CN (1) CN102007367B (https=)
TW (1) TWI479353B (https=)
WO (1) WO2009129082A2 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018155566A (ja) * 2017-03-16 2018-10-04 三菱ケミカル株式会社 フィルム検査システム及びフィルムの製造方法
JP2020098248A (ja) * 2018-12-17 2020-06-25 株式会社トッパンＴｏｍｏｅｇａｗａオプティカルフィルム フィルム

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PT2119516E (pt) * 2008-05-14 2013-10-24 Soudronic Ag Processo para a marcação de chapas e soldadura em função de marcas de paredes laterais para recipientes fabricadas a partir de tais chapas
KR101774074B1 (ko) * 2010-03-10 2017-09-01 쓰리엠 이노베이티브 프로퍼티즈 컴파니 웨브 제조 공정에서의 응용-특정된 반복 결함 검출 시스템
JP5912125B2 (ja) * 2010-11-12 2016-04-27 スリーエム イノベイティブ プロパティズ カンパニー ウェブベース材料における不均一性の高速処理と検出
ES2400656B1 (es) * 2011-06-28 2014-06-02 Airbus Operations, S.L. Procedimiento de marcado y reconocimiento de defectos en material prepreg
CN103728305A (zh) * 2014-01-13 2014-04-16 深圳市永光神目科技有限公司 Pcba板用的检测方法
US9963827B2 (en) 2014-04-15 2018-05-08 Gpcp Ip Holdings Llc Methods and apparatuses for controlling a manufacturing line used to convert a paper web into paper products by reading marks on the paper web
US9745222B2 (en) * 2015-07-23 2017-08-29 United States Gypsum Company Apparatus and methods for producing gypsum wallboard
JP6587671B2 (ja) * 2016-12-02 2019-10-09 花王株式会社 製造ラインの制御システム、製造ラインの制御装置、及び製造ラインの制御方法
KR102191350B1 (ko) * 2017-11-27 2020-12-15 주식회사 엘지화학 광학필름 마킹시스템
US11878928B2 (en) 2019-02-06 2024-01-23 Corning Incorporated Methods of processing a viscous ribbon
CN109811494B (zh) * 2019-03-22 2021-11-23 山东圣梵尼服饰股份有限公司 一种面料印染用系统
TWI751643B (zh) * 2019-09-03 2022-01-01 財團法人工業技術研究院 材料屬性評級系統及方法
TWI755303B (zh) * 2021-03-18 2022-02-11 佰龍機械廠股份有限公司 基於織物布面狀態即時提示針織機狀態的圓針織機
CN113251926B (zh) * 2021-06-04 2021-09-24 山东捷瑞数字科技股份有限公司 一种不规则物体的尺寸测量方法及测量装置
US12597593B2 (en) * 2022-02-07 2026-04-07 Honeywell International Inc. Manufacturing method for traceability of battery electrodes with fiducial markers
CN114655768B (zh) * 2022-04-18 2023-11-21 深圳市佳得设备科技有限公司 一种铝塑膜分切机控制方法、系统及存储介质
CN116399873B (zh) 2023-06-07 2023-09-26 杭州百子尖科技股份有限公司 基于机器视觉的片材缺陷贴标方法、装置、设备以及介质

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000051937A (ja) * 1998-08-06 2000-02-22 Nkk Corp 薄鋼板への欠陥マーキング方法
JP2001347315A (ja) * 2000-04-03 2001-12-18 Nkk Corp 欠陥マーキングしたコイルの製造方法、欠陥マーキング方法及び欠陥マーキングしたコイルの作業方法
JP2007517232A (ja) * 2003-12-31 2007-06-28 スリーエム イノベイティブ プロパティズ カンパニー ウェブに基づく物品の歩留まりの最大化
JP2008116437A (ja) * 2006-10-11 2008-05-22 Nitto Denko Corp 光学フィルムを有するシート状製品の欠点検査装置、その検査データ処理装置、その切断装置及びその製造システム

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4134684A (en) 1977-01-18 1979-01-16 Intex Corp. Repeat defect detector system
US5099504A (en) 1987-03-31 1992-03-24 Adaptive Technologies, Inc. Thickness/density mesuring apparatus
JPH0786474B2 (ja) 1988-09-09 1995-09-20 富士写真フイルム株式会社 欠陥周期の測定方法
FI88828C (fi) 1991-02-06 1993-07-12 Valmet Paper Machinery Inc Foerfarande och anordning vid fotoelektrisk identifiering av en materialbana
US5537669A (en) 1993-09-30 1996-07-16 Kla Instruments Corporation Inspection method and apparatus for the inspection of either random or repeating patterns
JP4372439B2 (ja) * 2003-03-12 2009-11-25 ヤマハ発動機株式会社 電子部品実装装置
US7027934B2 (en) 2003-09-24 2006-04-11 3M Innovative Properties Company Apparatus and method for automated web inspection
KR101203325B1 (ko) 2003-12-31 2012-11-20 쓰리엠 이노베이티브 프로퍼티즈 컴파니 시트-기반 물품에 대한 재고품 제어
CN1278100C (zh) * 2004-01-16 2006-10-04 牧德科技股份有限公司 印刷电路板的盲孔质量分析方法
JP3976740B2 (ja) * 2004-02-16 2007-09-19 テクノス株式会社 基板検査装置及び検査方法
US7623699B2 (en) 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
TWI292601B (en) * 2005-06-22 2008-01-11 United Microelectronics Corp Defect inspection device and inspecting method thereof
IL177689A0 (en) * 2005-08-26 2006-12-31 Camtek Ltd Method and system for automatic defect detection of articles in visual inspection machines

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000051937A (ja) * 1998-08-06 2000-02-22 Nkk Corp 薄鋼板への欠陥マーキング方法
JP2001347315A (ja) * 2000-04-03 2001-12-18 Nkk Corp 欠陥マーキングしたコイルの製造方法、欠陥マーキング方法及び欠陥マーキングしたコイルの作業方法
JP2007517232A (ja) * 2003-12-31 2007-06-28 スリーエム イノベイティブ プロパティズ カンパニー ウェブに基づく物品の歩留まりの最大化
JP2008116437A (ja) * 2006-10-11 2008-05-22 Nitto Denko Corp 光学フィルムを有するシート状製品の欠点検査装置、その検査データ処理装置、その切断装置及びその製造システム

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018155566A (ja) * 2017-03-16 2018-10-04 三菱ケミカル株式会社 フィルム検査システム及びフィルムの製造方法
JP2020098248A (ja) * 2018-12-17 2020-06-25 株式会社トッパンＴｏｍｏｅｇａｗａオプティカルフィルム フィルム
JP7481800B2 (ja) 2018-12-17 2024-05-13 株式会社トッパンＴｏｍｏｅｇａｗａオプティカルフィルム フィルム及びマーカーの印字方法

Also Published As

Publication number Publication date
EP2281172A2 (en) 2011-02-09
KR101596980B1 (ko) 2016-02-23
CN102007367B (zh) 2013-03-27
CN102007367A (zh) 2011-04-06
EP2281172B1 (en) 2013-08-14
WO2009129082A2 (en) 2009-10-22
KR20110006684A (ko) 2011-01-20
WO2009129082A3 (en) 2010-01-14
EP2281172A4 (en) 2011-07-13
TW201009634A (en) 2010-03-01
US7937233B2 (en) 2011-05-03
TWI479353B (zh) 2015-04-01
US20090265127A1 (en) 2009-10-22

Similar Documents

Publication Publication Date Title
JP2011518332A (ja) ウェブ上の優先的欠陥マーキング
JP5647192B2 (ja) 材料のウェブ上の欠陥の自動マーキング用装置および方法
JP5965038B2 (ja) ウェブ製造プロセスにおける用途固有の繰り返し欠陥検出
US7797133B2 (en) Multi-roller registered repeat defect detection of a web process line
JP2007517232A (ja) ウェブに基づく物品の歩留まりの最大化
JP2007523810A (ja) ウェブに基づく物品の在庫管理
CN104094103B (zh) 保持幅材产品的空间同步数据的对准

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120313

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20120313

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20130220

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130305

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20131119

A045 Written measure of dismissal of application [lapsed due to lack of payment]

Free format text: JAPANESE INTERMEDIATE CODE: A045

Effective date: 20140325