CN101957256B - 透镜检查装置 - Google Patents

透镜检查装置 Download PDF

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Publication number
CN101957256B
CN101957256B CN2010102258081A CN201010225808A CN101957256B CN 101957256 B CN101957256 B CN 101957256B CN 2010102258081 A CN2010102258081 A CN 2010102258081A CN 201010225808 A CN201010225808 A CN 201010225808A CN 101957256 B CN101957256 B CN 101957256B
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CN
China
Prior art keywords
lens
inspection
detecting device
pallet
screen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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CN2010102258081A
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English (en)
Chinese (zh)
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CN101957256A (zh
Inventor
金大凤
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Individual
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Individual
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Publication of CN101957256B publication Critical patent/CN101957256B/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583—Lenses
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S362/00—Illumination
    • Y10S362/80—Light emitting diode

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
CN2010102258081A 2009-07-15 2010-07-12 透镜检查装置 Expired - Fee Related CN101957256B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020090064309A KR100924117B1 (ko) 2009-07-15 2009-07-15 렌즈 검사 장치
KR10-2009-0064309 2009-07-15

Publications (2)

Publication Number Publication Date
CN101957256A CN101957256A (zh) 2011-01-26
CN101957256B true CN101957256B (zh) 2012-10-10

Family

ID=41562561

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010102258081A Expired - Fee Related CN101957256B (zh) 2009-07-15 2010-07-12 透镜检查装置

Country Status (2)

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KR (1) KR100924117B1 (ko)
CN (1) CN101957256B (ko)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101192331B1 (ko) 2012-08-23 2012-10-17 함상민 에어리어 카메라를 이용한 렌즈의 비전 검사장치 및 검사방법
KR101427534B1 (ko) 2013-08-19 2014-08-07 박용준 렌즈 검사 장치
KR101467927B1 (ko) 2013-09-05 2014-12-02 주식회사 세코닉스 광각렌즈 테스트 장치
CN103611688B (zh) * 2013-10-28 2016-05-11 临海市锦铮机械有限公司 镜片自动分检机
KR101587560B1 (ko) * 2014-03-27 2016-01-21 주식회사 나오텍 차량용 광각 렌즈 모듈의 검사 장치
KR101626089B1 (ko) 2014-04-17 2016-05-31 주식회사 퓨런티어 렌즈 틸트 보정 장치 및 렌즈 틸트 보정 방법
KR20160149883A (ko) 2015-06-19 2016-12-28 티클로버(주) 렌즈 결함 검사 장치
KR101867589B1 (ko) 2017-12-27 2018-06-15 주식회사 세코닉스 투명체 검사장치
CN109916279B (zh) * 2019-03-04 2020-09-22 Oppo广东移动通信有限公司 终端盖板的平整度检测方法、装置、测试机台及存储介质
CN112090785A (zh) * 2020-08-27 2020-12-18 宁波丞达精机有限公司 一种光学镜头分选设备
CN111929039A (zh) * 2020-09-18 2020-11-13 宁波丞达精机有限公司 一种光学镜头mtf检测机构

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1401982A (zh) * 2001-08-22 2003-03-12 精工爱普生株式会社 透镜检查装置及检查片
JP2008128770A (ja) * 2006-11-20 2008-06-05 Olympus Corp レンズ性能検査装置及びレンズ性能検査方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09133514A (ja) * 1995-11-10 1997-05-20 Hitachi Koki Co Ltd 画像測定装置
JPH11304652A (ja) 1998-04-17 1999-11-05 Asahi Optical Co Ltd レンズ検査装置
JP2002048677A (ja) 2000-08-01 2002-02-15 Olympus Optical Co Ltd カメラのレンズ性能評価装置
JP2004101213A (ja) 2002-09-05 2004-04-02 Canon Inc 光学系のｍｔｆを測定する装置及び方法
JP2006145849A (ja) * 2004-11-19 2006-06-08 Inter Action Corp 検査用光学装置及び当該光学装置を備えた検査装置
CN101191995A (zh) * 2006-11-27 2008-06-04 鸿富锦精密工业（深圳）有限公司 光学镜头测试装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1401982A (zh) * 2001-08-22 2003-03-12 精工爱普生株式会社 透镜检查装置及检查片
JP2008128770A (ja) * 2006-11-20 2008-06-05 Olympus Corp レンズ性能検査装置及びレンズ性能検査方法

Also Published As

Publication number Publication date
CN101957256A (zh) 2011-01-26
KR100924117B1 (ko) 2009-10-29

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