CN101918858B - 辐射监测设备 - Google Patents

辐射监测设备 Download PDF

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Publication number
CN101918858B
CN101918858B CN200880107566.7A CN200880107566A CN101918858B CN 101918858 B CN101918858 B CN 101918858B CN 200880107566 A CN200880107566 A CN 200880107566A CN 101918858 B CN101918858 B CN 101918858B
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CN
China
Prior art keywords
pixel
detector
radiation
event
tot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN200880107566.7A
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English (en)
Chinese (zh)
Other versions
CN101918858A (zh
Inventor
M·坎贝尔
X·洛帕特·库迪
L·特鲁斯托斯
W·泽-温·旺
R·巴拉布里加·苏乃
G·安东
T·米歇尔
M·伯内尔
K·L·施瓦茨
U·莫伦豪尔
E·弗里奇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ion Beam Applications SA
EUROPE ORGANISATION FOR NUCLEAR
Friedrich Alexander Universitaet Erlangen Nuernberg
Original Assignee
Ion Beam Applications SA
EUROPE ORGANISATION FOR NUCLEAR
Friedrich Alexander Universitaet Erlangen Nuernberg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by Ion Beam Applications SA, EUROPE ORGANISATION FOR NUCLEAR, Friedrich Alexander Universitaet Erlangen Nuernberg filed Critical Ion Beam Applications SA
Publication of CN101918858A publication Critical patent/CN101918858A/zh
Application granted granted Critical
Publication of CN101918858B publication Critical patent/CN101918858B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/02—Dosimeters
    • G01T1/026—Semiconductor dose-rate meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/191—Photoconductor image sensors
    • H10F39/195—X-ray, gamma-ray or corpuscular radiation imagers

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Toxicology (AREA)
CN200880107566.7A 2007-08-09 2008-08-11 辐射监测设备 Expired - Fee Related CN101918858B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP07114122.0 2007-08-09
EP07114122A EP2028509A1 (en) 2007-08-09 2007-08-09 Radiation monitoring device
PCT/EP2008/060521 WO2009019318A1 (en) 2007-08-09 2008-08-11 Radiation monitoring device

Publications (2)

Publication Number Publication Date
CN101918858A CN101918858A (zh) 2010-12-15
CN101918858B true CN101918858B (zh) 2015-02-18

Family

ID=38740483

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200880107566.7A Expired - Fee Related CN101918858B (zh) 2007-08-09 2008-08-11 辐射监测设备

Country Status (5)

Country Link
US (1) US9069081B2 (enExample)
EP (2) EP2028509A1 (enExample)
JP (2) JP5860590B2 (enExample)
CN (1) CN101918858B (enExample)
WO (1) WO2009019318A1 (enExample)

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Also Published As

Publication number Publication date
CN101918858A (zh) 2010-12-15
JP2010536021A (ja) 2010-11-25
EP2028509A1 (en) 2009-02-25
US9069081B2 (en) 2015-06-30
JP2015057610A (ja) 2015-03-26
EP2183616B1 (en) 2015-01-28
EP2183616A1 (en) 2010-05-12
WO2009019318A1 (en) 2009-02-12
JP5860590B2 (ja) 2016-02-16
US20110036988A1 (en) 2011-02-17

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Granted publication date: 20150218