Summary of the invention
The problem of the introducing gain media that needs to be resolved hurrily at above-mentioned silicon substrate laser, and the compatibility issue of consideration and modern microelectronics industry and each wave band adaptability widely, purpose of the present invention aims to provide adjustable silica-based little dish mixing laser of a kind of multiband and preparation method thereof.By the gain media of selection different-waveband, and the structural parameters that change little dish microcavity, regulate lasing mode wave band and position, realize that a kind of chip can be integrated, with low cost, that the multiband pattern is adjustable silica-based little dish micro-cavity laser.
The purpose of the above-mentioned silicon substrate laser of the present invention, the technical scheme of its realization is:
Multiband silicon-based microdisk mixing laser device is characterized in that: the primary structure of described laser is the little dish microcavity aggregate that is formed on the silicon base, and each little panel surface is provided with the adjustable gain media of wave band.Wherein this gain media is the thin film dielectrics that combines and be used to realize population inversion and produce light with little dish, film thickness is between 10nm~5 μ m, select for use in the selection with silicon base and combine firm gain medium material, wherein comprise the ZnO film of ultraviolet band and organic Alq film of visible light wave range at least.And the little dish microcavity on this silicon base has the volume discreteness, and its little dish diameter range is between 2 μ m~200 μ m are adjustable, and the microcavity height is between 500nm~50 μ m are adjustable.
The above-mentioned silicon substrate laser preparation method's of the present invention purpose, will realize by following processing step:
I, with the SiO that forms naturally on the silicon chip sample
2Layer pickling removed, and utilizes the SiO of thermal oxidation method in silicon chip sample superficial growth 100nm~5 μ m thickness discrete distribution
2Layer;
II, utilize photoetching development at SiO
2Laminar surface forms the disc mask, and the outer SiO of mask is removed in pickling
2
III, elder generation adopt the vertical etching method of dry method to form the cylindrical mesa of diameter 2 μ m~200 μ m, height 500nm~50 μ m, discrete volume on the silicon chip sample surface, adopt dry method or wet method anisotropic etching method with cylindrical SiO again
2Silicon etching under the table top, the only SiO of reserve part cylinder silicon support
2Disk;
IV, utilize membrane deposition method at SiO
2Disc surfaces prepares the gain media of 10nm~5 μ m;
V, utilize corrosive liquid and deionized water successively silicon chip sample to be carried out etch, cleaning step by step, remove unnecessary mask and corrosive liquid in the silicon chip sample substrate, the liquid level of wherein said corrosive liquid and deionized water does not all reach the silicon chip sample substrate and is lower than SiO
2The height of disk;
VI, the silicon chip sample after cleaning is carried out annealing in process.
Further, membrane deposition method described in the step IV comprises a kind of in PECVD, MOCVD, sputter, thermal evaporation, the spin coating at least.And the method for removing unnecessary film in the silicon chip sample substrate in the step V also comprises a kind of in wet etching, laser ablation and the focused-ion-beam lithography at least.
Implement technical scheme of the present invention, its beneficial effect is presented as:
Owing to can be used as the selection face width of gain medium material, so the present invention can realize the silicon substrate laser that multiband is integrated, by changing SiO
2The physical dimension of little dish can realize that resonance mode energy and stimulated radiation can be flux matched, realizes laser emitting; Its manufacture method is implemented simple and easy, technical maturity, and the repetition rate height effectively reduces cost of manufacture, has industrialization prospect.
Following constipation closes the embodiment accompanying drawing, the specific embodiment of the present invention is described in further detail, so that technical solution of the present invention is easier to understand, grasp.
Embodiment
The problem of the introducing gain media that needs to be resolved hurrily at silicon substrate laser, and the compatibility issue of consideration and modern microelectronics industry and each wave band adaptability widely, the invention provides a kind of practically, prepare the method for the adjustable silica-based little dish micro-cavity laser of multiband based on modern microelectronic technique methods such as photoetching, etching and thin film depositions.By the gain media of selection different-waveband, and the structural parameters that change little dish microcavity, pattern wave band and position regulated.Realize that a kind of chip can be integrated, with low cost, that the multiband pattern is adjustable silica-based little dish micro-cavity laser.
The primary structure of this laser is the little dish microcavity aggregate that is formed on the silicon base.High-quality-factor (10 based on little dish microcavity
8) silicon-base miniature ring core microcavity, for the design of laser provides high-quality structure of resonant cavity.And the present invention makes three elements from laser, proposes to be processed with the adjustable gain media of wave band in each little panel surface.Wherein this gain media is for combine tight and being used to the thin film dielectrics realizing population inversion and produce light with little dish.Difference according to required lasing wave band and mode position, the film thickness of this gain media is optional between 10nm~5 μ m, in gain media film selection on the same silicon chip sample, comprise the ZnO film of ultraviolet band and organic Alq film of visible light wave range at least, every can be at SiO
2The gain medium material of last deposit can be combined in SiO
2On the disk, need not consider the stress problem that produced with the monocrystalline substrate lattice mismatch, form the disk structure of resonant cavity of gain medium material naturally, thereby be implemented in the suprabasil Laser emission of silicon.And the little dish microcavity on this silicon base has the volume discreteness, and its little dish diameter range is between 2 μ m~200 μ m are adjustable, and the microcavity height is between 500nm~50 μ m are adjustable.
As shown in Figure 1, be whole preparation technology's schematic flow sheet of multiband silicon-based microdisk mixing laser device of the present invention.By shown in the figure as seen, its preparation technology is fully based on modern microelectronic technique.
Embodiment one
The HF acid of I, usefulness dilution is with the SiO on silicon chip sample 1 surface
2Layer 2a rinsing is removed;
II, utilize the SiO of the method for thermal oxidation at silicon chip sample 1 superficial growth 100nm
2Layer 2b;
III, utilize photoetching development technology, at SiO
2Layer 2b surface forms disc photoresist mask 3;
The HF acid of IV, utilization dilution is with the SiO outside the photoresist mask 3
2 Layer 2b removes, and realizes figure transfer;
V, utilize the vertical etch silicon method of dry method to carve diameter to be that 2 μ m to 200 mu m ranges do not wait, highly to be the cylindrical mesa that 500nm to 50 mu m range does not wait;
VI, utilize dry method or wet method anisotropic etching technology that most of silicon of SiO2 layer 2b below is carved to go, form ring core microcavity 5 and only reserve part support SiO
2Disk 4;
VII, utilize the thin film deposition means, as one of multiple thin film preparation processes such as PECVD, MOCVD, sputter, thermal evaporation, spin-coating method, the SiO that is preparing
2 Disk 4 surface preparation thickness are the gain media 6 of the ZnO film of ultraviolet band of 10nm discrete distribution or organic Alq film of visible light wave range etc.;
VIII, utilize one of methods such as wet etching, laser ablation, focused-ion-beam lithography that the unnecessary film of little tray bottom is removed, make the corrosive liquid height be lower than little dish height, and just do not have the silicon chip sample bottom, and removed the unnecessary film in bottom, and do not damage little dish 4 upper surface gain media films 6;
IX, use washed with de-ionized water, make the deionized water liquid level be lower than little dish height, and just do not have the silicon chip sample bottom, bottom after-etching alveolar fluid clearance;
X, utilize annealing method, improve gain medium material and SiO
2The contact performance of disc surfaces.
Embodiment two
The HF acid of I, usefulness dilution is with the SiO on silicon chip sample 1 surface
2Layer 2a rinsing is removed;
II, utilize the SiO of the method for thermal oxidation at silicon chip sample 1 superficial growth 5 μ m
2Layer 2b;
III, utilize photoetching development technology, at SiO
2Layer 2b surface forms disc photoresist mask 3;
The HF acid of IV, utilization dilution is with the SiO outside the photoresist mask 3
2 Layer 2b removes, and realizes figure transfer;
V, utilize the vertical etch silicon method of dry method to carve diameter to be that 2 μ m to 200 mu m ranges do not wait, highly to be the cylindrical mesa that 500nm to 50 mu m range does not wait;
VI, utilize dry method or wet method anisotropic etching technology with SiO
2Most of silicon of layer 2b below is carved and is gone, form ring core microcavity 5 and only reserve part support SiO
2Disk 4;
VII, utilize the thin film deposition means, as one of multiple thin film preparation processes such as PECVD, MOCVD, sputter, thermal evaporation, spin-coating method, the SiO that is preparing
2 Disk 4 surface preparation thickness are the gain media 6 of the ZnO film of ultraviolet band of 5 μ m discrete distribution and organic Alq film of visible light wave range etc.;
VIII, utilize one of methods such as wet etching, laser ablation, focused-ion-beam lithography that the unnecessary film of little tray bottom is removed, make the corrosive liquid height be lower than little dish height, and just do not have the silicon chip sample bottom, and removed the unnecessary film in bottom, and do not damage little dish 4 upper surface gain media films 6;
IX, use washed with de-ionized water, make the deionized water liquid level be lower than little dish height, and just do not have the silicon chip sample bottom, bottom after-etching alveolar fluid clearance;
X, utilize annealing method, improve gain medium material and SiO
2The contact performance of disc surfaces.
Embodiment three
The HF acid of I, usefulness dilution is with the SiO on silicon chip sample 1 surface
2Layer 2a rinsing is removed;
II, utilize the SiO of the method for thermal oxidation at silicon chip sample 1 superficial growth 1 μ m
2Layer 2b;
III, utilize photoetching development technology, at SiO
2Layer 2b surface forms disc photoresist mask 3;
The HF acid of IV, utilization dilution is with the SiO outside the photoresist mask 3
2 Layer 2b removes, and realizes figure transfer;
V, to utilize the vertical etch silicon method of dry method to carve diameter be that 2 μ m, 5 μ m, 10 μ m, 50 μ m, 200 μ m do not wait, and highly is the cylindrical mesa that 500nm, 1 μ m, 5 μ m, 10 μ m, 20 μ m, 50 μ m do not wait;
VI, utilize dry method or wet method anisotropic etching technology with SiO
2Most of silicon of layer 2b below is carved and is gone, form ring core microcavity 5 and only reserve part support SiO
2Disk 4;
VII, utilize the thin film deposition means, as one of multiple thin film preparation processes such as PECVD, MOCVD, sputter, thermal evaporation, spin-coating method, the SiO that is preparing
2The gain media 6 of the ZnO film of the ultraviolet band of disk 4 surface preparation 10nm, 100nm, 500nm, 1 μ m, 5 μ m discrete distribution or organic Alq film of visible light wave range etc.;
VIII, utilize one of methods such as wet etching, laser ablation, focused-ion-beam lithography that the unnecessary film of little tray bottom is removed, make the corrosive liquid height be lower than little dish height, and just do not have the silicon chip sample bottom, and removed the unnecessary film in bottom, and do not damage little dish 4 upper surface gain media films 6;
IX, use washed with de-ionized water, make the deionized water liquid level be lower than little dish height, and just do not have the silicon chip sample bottom, bottom after-etching alveolar fluid clearance;
X, utilize annealing method, improve gain medium material and SiO
2The contact performance of disc surfaces.。
The present invention is based on the SiO of conventional microelectronic technique preparation
2Little dish structure can be in the gain medium material of a plurality of wave bands of its surface preparation, as the ZnO film of ultraviolet band, and organic Alq film of visible region etc.Thereby be implemented in the suprabasil Laser emission of silicon.The applicable gain medium material of the present invention is selected face width, can realize multiwave silicon substrate laser; By changing SiO
2The physical dimension of little dish can realize that resonance mode energy and stimulated radiation can be flux matched, realizes that laser emitting is adjustable flexibly; Its manufacture method is implemented simple and easy, technical maturity, and the repetition rate height has reduced the research and development cost of manufacture effectively, has industrialization prospect.
The specific embodiment of the present invention in sum, embodiment only as an illustration, the usefulness of outstanding feature of the present invention and effect, be not to limit diversity execution mode of the present invention with this.Therefore replace formed technical scheme based on the above-mentioned feature of the present invention through simple modification or equivalence in every case, all should be contained within the protection range of present patent application.