CN101860666B - 像素缺陷校正装置 - Google Patents

像素缺陷校正装置 Download PDF

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Publication number
CN101860666B
CN101860666B CN2010101635954A CN201010163595A CN101860666B CN 101860666 B CN101860666 B CN 101860666B CN 2010101635954 A CN2010101635954 A CN 2010101635954A CN 201010163595 A CN201010163595 A CN 201010163595A CN 101860666 B CN101860666 B CN 101860666B
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pixel
defect
signal
correction
overcorrect
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CN101860666A (zh
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角谷彰规
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Sony Corp
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Sony Corp
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • H04N25/683—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects by defect estimation performed on the scene signal, e.g. real time or on the fly detection

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Studio Devices (AREA)
CN2010101635954A 2006-10-13 2007-10-15 像素缺陷校正装置 Expired - Fee Related CN101860666B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2006279963 2006-10-13
JP279963/06 2006-10-13
JP2007017884A JP4978214B2 (ja) 2006-10-13 2007-01-29 撮像システムおよび画素欠陥補正装置
JP017884/07 2007-01-29

Related Parent Applications (1)

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CN2007101441834A Division CN101222580B (zh) 2006-10-13 2007-10-15 成像系统及像素缺陷校正装置

Publications (2)

Publication Number Publication Date
CN101860666A CN101860666A (zh) 2010-10-13
CN101860666B true CN101860666B (zh) 2012-11-28

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CN2010101635954A Expired - Fee Related CN101860666B (zh) 2006-10-13 2007-10-15 像素缺陷校正装置
CN2010101636177A Expired - Fee Related CN101800848B (zh) 2006-10-13 2007-10-15 成像系统及像素缺陷校正装置
CN2007101441834A Expired - Fee Related CN101222580B (zh) 2006-10-13 2007-10-15 成像系统及像素缺陷校正装置

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CN2010101636177A Expired - Fee Related CN101800848B (zh) 2006-10-13 2007-10-15 成像系统及像素缺陷校正装置
CN2007101441834A Expired - Fee Related CN101222580B (zh) 2006-10-13 2007-10-15 成像系统及像素缺陷校正装置

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US (2) US7800662B2 (enExample)
JP (1) JP4978214B2 (enExample)
CN (3) CN101860666B (enExample)

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JP4978214B2 (ja) * 2006-10-13 2012-07-18 ソニー株式会社 撮像システムおよび画素欠陥補正装置
JP5272581B2 (ja) * 2008-08-25 2013-08-28 ソニー株式会社 画像処理装置、撮像装置、画像処理方法およびプログラム
CN101764926B (zh) * 2008-09-29 2012-05-30 凹凸电子（武汉）有限公司 缺陷像素检测纠正设备、系统及检测纠正缺陷像素的方法
JP5379601B2 (ja) * 2009-08-07 2013-12-25 キヤノン株式会社 欠陥画素データ補正装置、撮像装置及び欠陥画素データ補正方法
JP5521460B2 (ja) * 2009-09-18 2014-06-11 ソニー株式会社 撮像装置および方法、電子機器、並びにプログラム
JP2011097542A (ja) * 2009-11-02 2011-05-12 Sony Corp 画素欠陥検出補正装置、撮像装置、画像欠陥検出補正方法、およびプログラム
US8660335B2 (en) * 2010-03-24 2014-02-25 Varian Medical Systems, Inc. Transient pixel defect detection and correction
JP5544285B2 (ja) * 2010-12-21 2014-07-09 株式会社日立製作所 画像信号処理装置及び画像信号処理方法
JP5885464B2 (ja) * 2011-10-27 2016-03-15 キヤノン株式会社 撮像装置、その制御方法及びプログラム
CN102752625A (zh) * 2012-06-19 2012-10-24 广东欧珀移动通信有限公司 一种摄像头模组暗电流噪声的测试方法
KR102037206B1 (ko) * 2013-04-03 2019-10-29 삼성디스플레이 주식회사 유기발광 표시장치 및 그것의 검사 방법
US10048696B2 (en) 2015-12-22 2018-08-14 Uber Technologies, Inc. Intelligent lens masking system for an autonomous vehicle
US20190086767A1 (en) * 2016-03-22 2019-03-21 Mitsubishi Electric Corporation Monitoring camera
WO2019194106A1 (ja) * 2018-04-06 2019-10-10 オリンパス株式会社 画像処理装置、画像処理方法および画像処理プログラム
US11056083B2 (en) * 2018-12-11 2021-07-06 Shenzhen Torey Microelectronic Technology Co. Ltd. Display control device and image display method
US11256013B2 (en) 2019-03-27 2022-02-22 Uatc, Llc Dynamic matrix filter for vehicle image sensor
KR102790004B1 (ko) * 2020-10-12 2025-04-03 삼성전자주식회사 주파수 도메인을 이용한 이미지 센서의 검사 방법 및 이를 수행하는 검사 시스템
CN119856486A (zh) 2022-09-22 2025-04-18 三星电子株式会社 用于利用图像投影识别对象的投影设备和方法
WO2024063280A1 (ko) * 2022-09-22 2024-03-28 삼성전자 주식회사 영상 투사와 함께 객체를 인식하기 위한 프로젝팅 장치 및 방법
US12432338B1 (en) 2024-05-20 2025-09-30 Fairchild Imaging, Inc. Image sensors with dynamic pixel defect detection and correction

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CN1719878A (zh) * 2004-07-07 2006-01-11 索尼公司 图像摄取装置和信号处理方法

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US7009644B1 (en) * 1999-12-15 2006-03-07 Logitech Europe S.A. Dynamic anomalous pixel detection and correction
US6795118B1 (en) * 2000-10-18 2004-09-21 Micron Technology, Inc. Testing of solid-state image sensors
US7365783B2 (en) * 2001-03-16 2008-04-29 Olympus Corporation Image pickup apparatus which stores initial defect data concerning image pickup device and data on later developed defects
JP4468613B2 (ja) * 2001-06-25 2010-05-26 オリンパス株式会社 撮像装置及び撮像方法
US7202894B2 (en) * 2002-06-04 2007-04-10 Micron Technology, Inc. Method and apparatus for real time identification and correction of pixel defects for image sensor arrays
CN1666501A (zh) * 2002-07-01 2005-09-07 皇家飞利浦电子股份有限公司 缺陷图像采样的错误图像采样数据的检测设备和方法
US7301571B2 (en) * 2003-01-17 2007-11-27 Fujifilm Corporation Method and imaging apparatus for correcting defective pixel of solid-state image sensor, and method for creating pixel information
JP2006060550A (ja) * 2004-08-20 2006-03-02 Canon Inc 白キズ検出回路
JP4287356B2 (ja) * 2004-11-12 2009-07-01 株式会社日立製作所 画像処理方法及び装置
JP4457874B2 (ja) * 2004-12-06 2010-04-28 ソニー株式会社 映像信号処理装置及び方法
JP2007006024A (ja) * 2005-06-22 2007-01-11 Fujifilm Holdings Corp 撮像装置
JP2007295312A (ja) * 2006-04-25 2007-11-08 Olympus Imaging Corp デジタルカメラ
JP4978214B2 (ja) * 2006-10-13 2012-07-18 ソニー株式会社 撮像システムおよび画素欠陥補正装置

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Publication number Priority date Publication date Assignee Title
CN1719878A (zh) * 2004-07-07 2006-01-11 索尼公司 图像摄取装置和信号处理方法

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Also Published As

Publication number Publication date
US8325253B2 (en) 2012-12-04
CN101222580B (zh) 2010-11-03
CN101800848B (zh) 2012-11-28
US7800662B2 (en) 2010-09-21
CN101800848A (zh) 2010-08-11
JP4978214B2 (ja) 2012-07-18
US20080106619A1 (en) 2008-05-08
CN101860666A (zh) 2010-10-13
US20100315518A1 (en) 2010-12-16
JP2008118609A (ja) 2008-05-22
CN101222580A (zh) 2008-07-16

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